Feedback current regulation circuit and feedback current regulation method of chip

Abstract

The present application discloses a feedback current regulation circuit and feedback current regulation method for a chip, belonging to the field of circuit technology. The first input terminal of the negative feedback circuit is connected to the reference voltage, the output terminal is connected to the input terminal of the feedback regulation module, the output terminal of the feedback regulation module is connected to the input terminal of the conversion module and the first input terminal of the amplification module, the output terminal of the conversion module is connected to the second input terminal of the amplification module and the second input terminal of the negative feedback circuit, and the output terminal of the amplification module is connected to the measurement terminal; the negative feedback circuit outputs a regulation voltage to the feedback regulation module according to the reference voltage and the feedback voltage; the feedback regulation module outputs a feedback current under the control of the regulation voltage; the conversion module converts the feedback current into a feedback voltage and outputs it to the amplification module and the negative feedback circuit; the amplification module optimizes the voltage drop of the feedback voltage and outputs it to adjust the reference voltage according to the voltage drop, and finally achieves the purpose of regulating the feedback current by the reference voltage. The present application can reduce measurement complexity and improve measurement accuracy.

Description

Technical Field

[0001] The present application relates to the field of circuit technology, and in particular to a feedback current regulation circuit and a feedback current regulation method for a chip. Background Art

[0002] In the application of analog and mixed-signal chips, the feedback pin current is often a key parameter in the circuit regulation, control or feedback mechanism, and plays a decisive role in the normal working state of the chip. In order to ensure that the system-level circuit has consistent performance on different chips, the feedback current must be maintained within a stable and consistent target range on all chips. The feedback current regulation of the chip is usually achieved by adjusting the internal reference voltage. In traditional testing methods, in order to ensure the performance consistency of the chip in actual applications, the test equipment needs to directly measure the feedback current of its feedback pin when the chip is in normal working condition to determine whether the feedback current reaches the target current value. When the test results deviate from the design requirements, the test equipment will fine-tune the reference voltage or current inside the chip by sending adjustment instructions to the chip (such as adjusting the TRIM programming command). However, there are the following disadvantages during adjustment:

[0003] (1) Long adjustment time and high time cost

[0004] Each feedback current measurement must be performed while the chip is operating normally, while adjustment commands often need to be executed in test mode. This forces the test system to frequently switch between operating and test modes throughout the entire process, increasing operational complexity and the difficulty of controlling timing. The negative feedback circuit within the chip has a certain dynamic response process. After each adjustment of the reference parameters, the entire system needs time to recover to the new stable operating state before a valid feedback current measurement can be obtained.

[0005] (2) Limited test accuracy leads to TRIM misjudgment

[0006] The accuracy of the test signal directly affects the final result. For example, noise in the chip's operating environment can cause measurement signal fluctuations, especially when measuring low current or low voltage. Noise interference can obscure the actual test data, leading to misjudgment. Summary of the Invention

[0007] This application provides a chip feedback current regulation circuit and feedback current regulation method, which are used to solve the problems of long feedback current regulation time, limited measurement accuracy, and easy misjudgment. The technical solution is as follows:

[0008] According to a first aspect of the present application, a feedback current regulation circuit of a chip is provided, wherein the feedback current regulation circuit includes a chip, a feedback regulation module, a conversion module, and an amplification module;

[0009] The first input terminal of the negative feedback circuit in the chip is connected to the reference voltage, the output terminal of the negative feedback circuit is connected to the input terminal of the feedback regulation module, the output terminal of the feedback regulation module is respectively connected to the input terminal of the conversion module and the first input terminal of the amplification module, the output terminal of the conversion module is respectively connected to the second input terminal of the amplification module and the second input terminal of the negative feedback circuit, and the output terminal of the amplification module is connected to the measurement terminal;

[0010] The negative feedback circuit is used to output a regulated voltage to the feedback regulation module based on the reference voltage and the feedback voltage; the feedback regulation module is used to output a feedback current to the conversion module under the control of the regulated voltage; the conversion module is used to convert the feedback current into a feedback voltage and output it to the amplification module and the negative feedback circuit respectively; the amplification module is used to optimize the voltage drop of the feedback voltage and then output it, so as to adjust the reference voltage according to the voltage drop, and adjust the feedback current by the reference voltage until the final output voltage drop reaches the target voltage drop value and then stops adjusting to determine that the feedback current has been adjusted to the target current value.

[0011] In a possible implementation, the feedback regulation module includes an NMOS tube, a first resistor and a current mirror;

[0012] The gate of the NMOS tube serves as the input end of the feedback regulation module;

[0013] The drain of the NMOS tube is connected to the input end of the current mirror;

[0014] The output end of the current mirror serves as the output end of the feedback regulation module;

[0015] The source of the NMOS transistor is connected to the first end of the first resistor, and the second end of the first resistor is grounded.

[0016] In a possible implementation, the current mirror module includes a first PMOS transistor and a second PMOS transistor;

[0017] The drain and gate of the first PMOS transistor are connected to the gate of the second PMOS transistor and serve as the input end of the current mirror;

[0018] The source of the first PMOS transistor and the source of the second PMOS transistor are respectively connected to a power supply voltage;

[0019] The drain of the second PMOS tube serves as the output end of the current mirror.

[0020] In one possible implementation,

[0021] The NMOS tube is used to convert the regulated voltage into a regulated current;

[0022] The current mirror is used to replicate the regulation current and output the obtained feedback current to the conversion module.

[0023] In a possible implementation, the conversion module includes a second resistor;

[0024] The first end of the second resistor serves as the input end of the conversion module;

[0025] The second end of the second resistor serves as the output end of the conversion module.

[0026] In a possible implementation, the amplification module includes a first operational amplifier;

[0027] The positive input terminal of the first operational amplifier serves as the first input terminal of the amplification module;

[0028] The inverting input terminal of the first operational amplifier serves as the second input terminal of the amplifying module;

[0029] The output end of the first operational amplifier serves as the output end of the amplifying module.

[0030] In a possible implementation, the feedback current regulation circuit further includes a diode;

[0031] The anode of the diode is connected to the output end of the conversion module;

[0032] The cathode of the diode is connected to the negative input terminal of the negative feedback circuit.

[0033] In a possible implementation, the negative feedback circuit is further configured to output a regulated voltage to the feedback regulation module again according to the regulated reference voltage and the last feedback voltage.

[0034] In a possible implementation, the negative feedback circuit includes a second operational amplifier, a capacitor, and a processing module;

[0035] The positive input terminal of the second operational amplifier serves as the first input terminal of the negative feedback circuit;

[0036] The negative input terminal of the second operational amplifier serves as the second input terminal of the negative feedback circuit;

[0037] The output end of the second operational amplifier is connected to the first end of the capacitor and the first end of the processing module respectively, and the second end of the capacitor is grounded;

[0038] The second end of the processing module serves as the output end of the negative feedback circuit.

[0039] According to a second aspect of the present application, a method for regulating feedback current of a chip is provided, the method comprising:

[0040] The negative feedback circuit outputs a regulation voltage to the feedback regulation module according to the reference voltage and the feedback voltage;

[0041] The feedback regulation module outputs a feedback current to the conversion module under the control of the regulation voltage;

[0042] The conversion module converts the feedback current into a feedback voltage and outputs the voltage to the amplification module and the negative feedback circuit respectively;

[0043] The amplification module optimizes the voltage drop of the feedback voltage and outputs it so as to adjust the reference voltage according to the voltage drop, and adjust the feedback current by the reference voltage until the voltage drop of the final output reaches the target voltage drop value and then stops adjusting, thereby determining that the feedback current has been adjusted to the target current value.

[0044] The beneficial effects of the technical solution provided by this application include at least:

[0045] The feedback regulation module, conversion module and amplification module form a negative feedback loop connected to the chip. The output signal (voltage drop) measured by the negative feedback loop is used to adjust the reference voltage, and then the feedback current is adjusted by the reference voltage. The feedback current can be adjusted without switching back and forth between the working mode and the test mode, which simplifies the operation complexity and control timing difficulty. In addition, a negative feedback loop is used to replace the negative feedback circuit inside the chip to provide feedback voltage to the feedback end of the chip, so that the voltage at the feedback end is quickly stabilized. There is no need to wait for the negative feedback circuit to return to a stable state. The reference voltage can be quickly adjusted according to the measured output signal, which reduces the time consumption for adjusting the reference voltage and feedback current.

[0046] By converting the feedback current into the feedback voltage through the conversion module and then measuring it, the measurement complexity can be reduced compared to the complexity brought by directly measuring the current.

[0047] The first operational amplifier is a differential operational amplifier, which can reduce common-mode interference and thus improve measurement accuracy. The first operational amplifier does not measure the voltage value of the second resistor, but measures the voltage drop across the second resistor. Since the voltage drop is smaller than the voltage value, the measurement error can be reduced by reducing the range used during measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0049] Figure 1 It is a structural block diagram of a feedback current regulation circuit of a chip in the related art;

[0050] Figure 2 This is a structural block diagram of a feedback current regulation circuit of a chip provided by one embodiment of the present application;

[0051] Figure 3 This is a circuit diagram of a feedback current regulation circuit of a chip provided by one embodiment of the present application;

[0052] Figure 4 This is a flow chart of a chip feedback current regulation method provided by an embodiment of the present application. DETAILED DESCRIPTION

[0053] In order to make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the implementation methods of the present application will be further described in detail below with reference to the accompanying drawings.

[0054] like Figure 1 As shown, a negative feedback circuit is provided in the chip, which includes at least a second operational amplifier, a capacitor and a processing module. The negative input terminal of the second operational amplifier is connected to the feedback terminal RFB of the chip, the positive input terminal of the second operational amplifier is connected to the reference voltage VREF, the output terminal of the second operational amplifier is connected to the first terminal of the capacitor and the input terminal of the processing module, the second terminal of the capacitor is grounded, and the output terminal of the processing module is connected to the adjustment terminal SW of the chip.

[0055] The processing module may include a third operational amplifier, a frequency control unit, a switching logic unit, and a driver. The frequency control unit is connected to the positive input of the third operational amplifier and serves as the input of the processing module. The output of the frequency control unit is connected to the first input of the switching logic unit. The output of the third operational amplifier is connected to the second input of the switching logic unit. The output of the switching logic unit is connected to the input of the driver. The output of the driver is connected to the negative input of the third operational amplifier and serves as the output of the processing module.

[0056] In the related art, the second operational amplifier compares the feedback voltage and the reference voltage, and the processing module processes the comparison result and outputs an output signal to compare whether the output signal is equal to the preset value. If the output signal is not equal to the preset value, the reference voltage needs to be adjusted and the output signal continues to be measured; if the output signal is equal to the preset value, it is determined that the reference voltage has been adjusted.

[0057] In related technologies, in order to achieve chip consistency, it is necessary to measure the output voltage when the chip is in normal working state and further adjust the internal reference voltage. Therefore, each time the reference voltage is adjusted, the test mode will be exited and the test will be performed after entering the normal working state. It takes a long time for the negative feedback circuit inside the chip to establish a steady state. This repeated switching between the test mode and the normal working state consumes a lot of time.

[0058] To solve this problem, the present application constructs a negative feedback loop outside the chip, so that the internal reference can be adjusted in the test mode and then measured directly, thereby avoiding repeated switching between the working mode and the test mode and improving the test efficiency.

[0059] like Figure 2 , which shows a block diagram of a feedback current regulation circuit of a chip provided by an embodiment of the present application. The feedback current regulation circuit of the chip may include a chip 210, a feedback regulation module 220, a conversion module 230 and an amplification module 240.

[0060] The first input terminal of the negative feedback circuit in the chip 210 is connected to the reference voltage VREF, the output terminal of the negative feedback circuit is connected to the input terminal of the feedback regulation module 220, the output terminal of the feedback regulation module 220 is respectively connected to the input terminal of the conversion module 230 and the first input terminal of the amplification module 240, the output terminal of the conversion module 230 is respectively connected to the second input terminal of the amplification module 240 and the second input terminal of the negative feedback circuit, and the output terminal of the amplification module 240 is connected to the measurement terminal.

[0061] Among them, the first input terminal of the negative feedback circuit is Figure 1 The positive input terminal of the second operational amplifier in the negative feedback circuit is Figure 3 The feedback terminal RFB in the negative feedback circuit is Figure 3 The regulating terminal SW in.

[0062] The negative feedback circuit is used to output a regulated voltage VSW to the feedback regulation module 220 based on the reference voltage VREF and the feedback voltage VRFB; the feedback regulation module 220 is used to output a feedback current IRFB to the conversion module 230 under the control of the regulated voltage VSW; the conversion module 230 is used to convert the feedback current IRFB into the feedback voltage VRFB and output it to the amplification module 240 and the negative feedback circuit respectively; the amplification module 240 is used to optimize the voltage drop of the feedback voltage VRFB and then output it, so as to adjust the reference voltage VREF according to the voltage drop, and adjust the feedback current IRFB through the reference voltage VREF until the final output voltage drop reaches the target voltage drop value and then stops adjusting, thereby determining that the feedback current IRFB has been adjusted to the target current value.

[0063] In this embodiment, an external negative feedback loop is used to replace the negative feedback circuit inside the chip to provide a feedback voltage to the feedback terminal RFB of the chip, so that the voltage of the feedback terminal RFB is quickly stabilized. There is no need to wait for the negative feedback circuit to return to a stable state. The reference voltage can be quickly adjusted according to the measured output signal, thereby reducing the time consumption of adjusting the reference voltage feedback current.

[0064] In this embodiment, the feedback current IRFB is converted into the feedback voltage VRFB by the conversion module 230 and then measured. Compared with the complexity brought by direct current measurement, the measurement complexity can be reduced.

[0065] The structures of the negative feedback circuit, the feedback adjustment module 220 , the conversion module 230 and the amplification module 240 in the chip 210 are described below respectively.

[0066] (1) Negative feedback circuit

[0067] In this embodiment, the negative feedback circuit includes a second operational amplifier, a capacitor, and a processing module; the positive input terminal of the second operational amplifier serves as the first input terminal of the negative feedback circuit; the negative input terminal of the second operational amplifier serves as the second input terminal of the negative feedback circuit; the output terminal of the second operational amplifier is connected to the first terminal of the capacitor and the first terminal of the processing module respectively, and the second terminal of the capacitor is grounded; the second terminal of the processing module serves as the output terminal of the negative feedback circuit. The structure of the processing module is as follows: Figure 1 shown.

[0068] The negative feedback circuit is further configured to output the regulated voltage VSW to the feedback regulation module 220 again according to the regulated reference voltage and the last feedback voltage.

[0069] (2) Feedback Regulation Module 220

[0070] In this embodiment, the feedback regulation module 220 includes an N-type metal-oxide-semiconductor (NMOS) transistor MN1, a first resistor R2, and a current mirror; the gate of the NMOS transistor MN1 serves as the input end of the feedback regulation module 220; the drain of the NMOS transistor MN1 is connected to the input end of the current mirror; the output end of the current mirror serves as the output end of the feedback regulation module 220; the source of the NMOS transistor MN1 is connected to the first end of the first resistor R2, and the second end of the first resistor R2 is grounded.

[0071] That is, the gate of the NMOS transistor MN1 is connected to the regulating terminal SW of the chip 210. The regulating voltage VSW output by the chip 210 controls the conduction state of the NMOS transistor MN1 and converts the regulating voltage VSW into a regulating current ISW. The current mirror is used to replicate the regulating current ISW and output the resulting feedback current IRFB to the conversion module 230. The feedback current IRFB is equal to the drain current.

[0072] In this embodiment, the current mirror module includes a first P-type metal-oxide-semiconductor (PMOS) transistor and a second PMOS transistor; the drain and gate of the first PMOS transistor are connected to the gate of the second PMOS transistor and serve as the input end of the current mirror; the source of the first PMOS transistor and the source of the second PMOS transistor are respectively connected to the power supply voltage VCC; and the drain of the second PMOS transistor serves as the output end of the current mirror.

[0073] (3) Conversion module 230

[0074] In this embodiment, the conversion module 230 includes a second resistor R1 ; a first end of the second resistor R1 serves as an input end of the conversion module 230 ; and a second end of the second resistor R1 serves as an output end of the conversion module 230 .

[0075] The second resistor R1 has a relatively high precision (±0.1%) and can convert the feedback current IRFB into the feedback voltage VRFB, thus avoiding the complexity caused by directly measuring the current.

[0076] (4) Amplification module 240

[0077] In this embodiment, the amplification module 240 includes a first operational amplifier OP; the positive input terminal of the first operational amplifier OP serves as the first input terminal of the amplification module 240; the negative input terminal of the first operational amplifier OP serves as the second input terminal of the amplification module 240; and the output terminal of the first operational amplifier OP serves as the output terminal of the amplification module 240.

[0078] The first operational amplifier OP is a differential operational amplifier, which can reduce common-mode interference and thus improve measurement accuracy.

[0079] When measuring voltage using a test device, the higher the range, the greater the corresponding measurement error. In this embodiment, the voltage value of the second resistor R1 is not measured, but the voltage drop across the second resistor R1 is measured. Because the voltage drop is smaller than the voltage value, the measurement error can be reduced by reducing the range used during measurement.

[0080] For example, the voltage value of the second resistor R1 is 4-5V, which needs to be measured using a 10V range; while the voltage drop of the second resistor R1 is about 1V, which needs to be measured using a 2V range, which can reduce the measurement error.

[0081] Optionally, the feedback current regulation circuit further includes a diode D1; the anode of diode D1 is connected to the output terminal of conversion module 230; and the cathode of diode D2 is connected to the negative input terminal of the negative feedback circuit. Diode D1 can prevent the guarantee current from flowing from conversion module 230 to feedback terminal RFB, thereby preventing current reverse flow.

[0082] In this embodiment, a target voltage drop value can be set in advance. When the reference voltage is trimmed, the feedback current regulation circuit will output a corresponding voltage drop based on the reference voltage and compare the voltage drop with the target voltage drop value. If the voltage drop is equal to the target voltage drop value, the reference voltage trimmed at this time will be used as the final reference voltage, and it will be determined that the feedback current has reached the target current value, and the trimming process will be ended. If the voltage drop is not equal to the target voltage drop value, the reference voltage will be adjusted, and the adjusted reference voltage will be used for measurement again to achieve the purpose of adjusting the feedback current. The adjustment will be stopped until the output voltage drop is equal to the target voltage drop value, and the reference voltage trimmed at this time will be used as the final reference voltage, and it will be determined that the feedback current has reached the target current value, and the trimming process will be ended.

[0083] To summarize, the feedback current regulation circuit of the chip provided in the embodiment of the present application comprises a feedback regulation module, a conversion module and an amplification module to form a negative feedback loop connected to the chip, and uses the output signal (voltage drop) measured by the negative feedback loop to adjust the reference voltage, and then uses the reference voltage to adjust the feedback current. The feedback current can be adjusted without switching back and forth between the working mode and the test mode, which simplifies the operation complexity and the difficulty of control timing. Moreover, a negative feedback loop is used to replace the negative feedback circuit inside the chip to provide a feedback voltage to the feedback end of the chip, so that the voltage at the feedback end can be quickly stabilized. There is no need to wait for the negative feedback circuit to return to a stable state. The reference voltage can be quickly adjusted according to the measured output signal, which reduces the time consumption for adjusting the reference voltage and feedback current.

[0084] By converting the feedback current into the feedback voltage through the conversion module and then measuring it, the measurement complexity can be reduced compared to the complexity brought by directly measuring the current.

[0085] The first operational amplifier is a differential operational amplifier, which can reduce common-mode interference and thus improve measurement accuracy. The first operational amplifier does not measure the voltage value of the second resistor, but measures the voltage drop across the second resistor. Since the voltage drop is smaller than the voltage value, the measurement error can be reduced by reducing the range used during measurement.

[0086] like Figure 4 , which shows a flow chart of a feedback current regulation method for a chip provided by an embodiment of the present application. The feedback current regulation method for the chip includes:

[0087] Step 401: The negative feedback circuit outputs a regulation voltage to a feedback regulation module according to a reference voltage and a feedback voltage.

[0088] The positive input terminal of the second operational amplifier in the negative feedback circuit inputs the reference voltage VREF, and the negative input terminal of the second operational amplifier outputs the feedback voltage VRFB. After the second operational amplifier processes the reference voltage VREF and the feedback voltage VRFB, the processing result is output to the processing module; the processing module processes the processing result to obtain the regulation voltage VSW.

[0089] Step 402: The feedback regulation module outputs a feedback current to the conversion module under the control of the regulation voltage.

[0090] The feedback regulation module includes an NMOS transistor MN1 and a current mirror. The gate of the NMOS transistor MN1 is connected to the chip's regulation terminal SW. The chip's output regulation voltage VSW controls the conduction state of the NMOS transistor MN1 and converts the regulation voltage VSW into a regulation current ISW. The current mirror replicates the regulation current ISW and outputs the resulting feedback current IRFB to the conversion module. The feedback current IRFB is equal to the drain current.

[0091] In step 403 , the conversion module converts the feedback current into a feedback voltage and outputs the voltage to the amplification module and the negative feedback circuit respectively.

[0092] The conversion module includes a second resistor, wherein the second resistor has a relatively high precision (±0.1%) and can convert the feedback current IRFB into the feedback voltage VRFB, thereby avoiding the complexity caused by directly measuring the current.

[0093] In step 404, the amplification module optimizes the voltage drop of the feedback voltage and outputs it so as to adjust the reference voltage according to the voltage drop, and adjust the feedback current through the reference voltage until the final output voltage drop reaches the target voltage drop value and stops adjusting to determine that the feedback current has been adjusted to the target current value.

[0094] The first operational amplifier OP is a differential operational amplifier, which can reduce common-mode interference and thus improve measurement accuracy.

[0095] When measuring voltage using a test device, the higher the range, the greater the corresponding measurement error. In this embodiment, the voltage value of the second resistor R1 is not measured, but the voltage drop across the second resistor R1 is measured. Because the voltage drop is smaller than the voltage value, the measurement error can be reduced by reducing the range used during measurement.

[0096] For example, the voltage value of the second resistor R1 is 4-5V, which needs to be measured using a 10V range; while the voltage drop of the second resistor R1 is about 1V, which needs to be measured using a 2V range, which can reduce the measurement error.

[0097] In this embodiment, a target voltage drop value can be set in advance. When the reference voltage is trimmed, the feedback current regulation circuit will output a corresponding voltage drop based on the reference voltage and compare the voltage drop with the target voltage drop value. If the voltage drop is equal to the target voltage drop value, the reference voltage trimmed at this time will be used as the final reference voltage, and it will be determined that the feedback current has reached the target current value, and the trimming process will be ended. If the voltage drop is not equal to the target voltage drop value, the reference voltage will be adjusted, and the adjusted reference voltage will be used for measurement again to achieve the purpose of adjusting the feedback current. The adjustment will be stopped until the output voltage drop is equal to the target voltage drop value, and the reference voltage trimmed at this time will be used as the final reference voltage, and it will be determined that the feedback current has reached the target current value, and the trimming process will be ended.

[0098] In summary, the feedback current regulation method of the chip provided in the embodiment of the present application combines the feedback regulation module, the conversion module and the amplification module into a negative feedback loop connected to the chip, uses the output signal (voltage drop) measured by the negative feedback loop to adjust the reference voltage, and then uses the reference voltage to adjust the feedback current. The feedback current can be adjusted without switching back and forth between the working mode and the test mode, which simplifies the operation complexity and control timing difficulty; and, a negative feedback loop is used to replace the negative feedback circuit inside the chip to provide a feedback voltage to the feedback end of the chip, so that the voltage at the feedback end is quickly stabilized. There is no need to wait for the negative feedback circuit to return to a stable state. The reference voltage can be quickly adjusted according to the measured output signal, which reduces the time consumption of adjusting the reference voltage and reference current.

[0099] By converting the feedback current into the feedback voltage through the conversion module and then measuring it, the measurement complexity can be reduced compared to the complexity brought by directly measuring the current.

[0100] The first operational amplifier is a differential operational amplifier, which can reduce common-mode interference and thus improve measurement accuracy. The first operational amplifier does not measure the voltage value of the second resistor, but measures the voltage drop across the second resistor. Since the voltage drop is smaller than the voltage value, the measurement error can be reduced by reducing the range used during measurement.

[0101] Those skilled in the art will understand that all or part of the steps to implement the above embodiments may be accomplished by hardware, or by a program to instruct the relevant hardware, and the program may be stored in a computer-readable storage medium, which may be a read-only memory, a disk, or an optical disk, etc.

[0102] The above description is not intended to limit the embodiments of the present application. Any adjustments, equivalent replacements, improvements, etc. made within the spirit and principles of the embodiments of the present application should be included in the scope of protection of the embodiments of the present application.

Claims

1. A chip feedback current regulation circuit, characterized in that: The feedback current regulation circuit includes a chip, a feedback regulation module, a conversion module and an amplification module; The first input terminal of the negative feedback circuit in the chip is connected to the reference voltage, the output terminal of the negative feedback circuit is connected to the input terminal of the feedback regulation module, the output terminal of the feedback regulation module is respectively connected to the input terminal of the conversion module and the first input terminal of the amplification module, the output terminal of the conversion module is respectively connected to the second input terminal of the amplification module and the second input terminal of the negative feedback circuit, and the output terminal of the amplification module is connected to the measurement terminal; The negative feedback circuit is used to output a regulated voltage to the feedback regulation module according to the reference voltage and the feedback voltage; The feedback regulation module is used to output a feedback current to the conversion module under the control of the regulation voltage; the conversion module is used to convert the feedback current into a feedback voltage and output it to the amplification module and the negative feedback circuit respectively; The amplification module is used to optimize the voltage drop of the feedback voltage and then output it, so as to adjust the reference voltage according to the voltage drop, and adjust the feedback current by the reference voltage until the voltage drop of the final output reaches the target voltage drop value and then stop adjusting, thereby determining that the feedback current has been adjusted to the target current value; The feedback regulation module includes an NMOS transistor, a first resistor, and a current mirror; the gate of the NMOS transistor serves as the input end of the feedback regulation module; the drain of the NMOS transistor is connected to the input end of the current mirror; the output end of the current mirror serves as the output end of the feedback regulation module; the source of the NMOS transistor is connected to the first end of the first resistor, and the second end of the first resistor is grounded; The negative feedback circuit includes a second operational amplifier, a capacitor and a processing module; the positive input terminal of the second operational amplifier serves as the first input terminal of the negative feedback circuit; the negative input terminal of the second operational amplifier serves as the second input terminal of the negative feedback circuit; the output terminal of the second operational amplifier is respectively connected to the first terminal of the capacitor and the first terminal of the processing module, and the second terminal of the capacitor is grounded; the second terminal of the processing module serves as the output terminal of the negative feedback circuit.

2. The chip feedback current regulation circuit according to claim 1, characterized in that: The current mirror module includes a first PMOS tube and a second PMOS tube; The drain and gate of the first PMOS transistor are connected to the gate of the second PMOS transistor to serve as the input end of the current mirror; The source of the first PMOS transistor and the source of the second PMOS transistor are respectively connected to a power supply voltage; The drain of the second PMOS tube serves as the output end of the current mirror.

3. The chip feedback current regulation circuit according to claim 1, characterized in that: The NMOS tube is used to convert the regulated voltage into a regulated current; The current mirror is used to replicate the regulation current and output the obtained feedback current to the conversion module.

4. The chip feedback current regulation circuit according to claim 1, characterized in that: The conversion module includes a second resistor; The first end of the second resistor serves as the input end of the conversion module; The second end of the second resistor serves as the output end of the conversion module.

5. The chip feedback current regulation circuit according to claim 1, characterized in that: The amplification module includes a first operational amplifier; The positive input terminal of the first operational amplifier serves as the first input terminal of the amplification module; The inverting input terminal of the first operational amplifier serves as the second input terminal of the amplifying module; The output end of the first operational amplifier serves as the output end of the amplifying module.

6. The chip feedback current regulation circuit according to claim 1, characterized in that: The feedback current regulating circuit further includes a diode; The anode of the diode is connected to the output end of the conversion module; The cathode of the diode is connected to the negative input terminal of the negative feedback circuit.

7. The chip feedback current regulation circuit according to claim 1, characterized in that: The negative feedback circuit is further configured to output a regulation voltage to the feedback regulation module again according to the regulated reference voltage and the last feedback voltage.

8. A chip feedback current regulation method, characterized in that: Used in the feedback current regulation circuit according to any one of claims 1 to 7, the method comprising: The negative feedback circuit outputs a regulation voltage to the feedback regulation module according to the reference voltage and the feedback voltage; The feedback regulation module outputs a feedback current to the conversion module under the control of the regulation voltage; The conversion module converts the feedback current into a feedback voltage and outputs the voltage to the amplification module and the negative feedback circuit respectively; The amplification module optimizes the voltage drop of the feedback voltage and outputs it so as to adjust the reference voltage according to the voltage drop, and adjust the feedback current by the reference voltage until the voltage drop of the final output reaches the target voltage drop value and then stops adjusting, thereby determining that the feedback current has been adjusted to the target current value.

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