Single-particle failure test system and test method for power device

Abstract

The invention discloses a single-particle failure test system and test method of a power device, relates to the technical field of single-particle effect mechanism research and test, and aims to solve the problem of low accuracy of single-particle failure test of the power device in the prior art. The system comprises a single-particle failure test unit, an electromagnetic radiation monitoring unit and an upper computer. The single-particle failure test unit is connected with an upper computer, and the electromagnetic radiation monitoring unit is connected with the upper computer; a single-particle failure test unit is used for carrying out single-particle failure test at least including an electrical characteristic test and an electromagnetic radiation test on a to-be-tested power device, an electromagnetic radiation monitoring unit is used for monitoring an electromagnetic radiation signal emitted by the to-be-tested power device, and finally an upper computer is used for determining a single-particle failure mechanism of the to-be-tested power device. Therefore, the single-particle failure test can be extended to the potential damage test from the electrical characteristic test, and the single-particle failure test accuracy of the power device is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of single particle effect mechanism research and testing, and in particular to a single particle failure testing system and testing method for a power device. Background Art

[0002] Semiconductor materials are functional materials with electrical conductivity between conductors (such as copper) and insulators (such as rubber). Their electrical properties can be controlled through doping, temperature, or electric fields, making them the core foundation of the modern electronics industry. With the rapid development of commercial aerospace, the demand for rapid testing, evaluation, and selection of radiation-resistant components has become increasingly urgent. However, existing single-particle failure testing methods mainly focus on single-particle failure testing and evaluation of semiconductor power devices. The assessment of potential single-particle damage is still at the research level, and there are no applicable test systems. This makes it impossible to conduct a more comprehensive evaluation of single-particle failure testing of power devices, resulting in an inability to more accurately assess the service life of power devices, which also hinders the development of commercial aerospace.

[0003] In view of this, there is an urgent need to design a more advanced single event failure test evaluation system and method to solve the problem of low accuracy of single event failure testing of power devices in the existing technology. Summary of the Invention

[0004] The purpose of the present invention is to provide a single-particle failure test system and test method for power devices. Based on the failure mechanism of single particles of semiconductor power devices, a system for single-particle failure test of semiconductor power devices is prepared. In this test system, a method of coordinated monitoring of electrical characteristics and electromagnetic fields can be used to perform single-particle testing of semiconductor power devices, expanding the scope of single-particle testing from radiation failure testing to single-particle potential damage failure testing, broadening the scope of single-particle failure testing of power devices, thereby more accurately evaluating the single-particle failure mechanism of power devices and improving the accuracy of single-particle failure testing of power devices; solving the problem of low accuracy of single-particle failure testing of power devices in the prior art.

[0005] In order to achieve the above object, the present invention provides the following technical solutions:

[0006] In a first aspect, the present invention provides a single event failure test system for power devices, which may at least include:

[0007] Single event failure test unit, electromagnetic radiation monitoring unit and host computer;

[0008] The single event failure test unit is connected to the host computer, and the electromagnetic radiation monitoring unit is connected to the host computer;

[0009] The single event failure test unit is used to perform a single event failure test on the power device to be tested; the single event failure test at least includes an electrical characteristic test and an electromagnetic radiation test;

[0010] The electromagnetic radiation monitoring unit is used to monitor the electromagnetic radiation signal emitted by the power device to be tested;

[0011] The host computer is used to determine the single event failure mechanism of the power device to be tested.

[0012] Preferably, the single event failure test unit may include at least an irradiation unit and a test unit;

[0013] The irradiation unit is located directly above the test unit and is spaced apart from the test unit based on a first distance; the test unit is connected to the host computer;

[0014] The irradiation unit is used to provide a radiation environment for the testing unit;

[0015] The testing unit is used to perform a single event failure test on the power device to be tested.

[0016] Preferably, the test unit may include at least a power device subunit to be tested, a power device control subunit to be tested, and a WiFi module;

[0017] The power device under test subunit is connected to the power device under test control subunit, and the power device under test control subunit is connected to the WiFi module;

[0018] The power device under test subunit is used to place the power device under test and is electrically connected to the power device under test;

[0019] The power device under test control subunit is used to provide a test bias for the power device under test in the power device under test subunit and detect electrical characteristic data of the power device under test;

[0020] The WiFi module is used to send and receive the electrical characteristic data.

[0021] Preferably, the electromagnetic radiation monitoring unit may include at least: an electromagnetic radiation signal receiving unit and an electromagnetic radiation signal preprocessing unit;

[0022] The electromagnetic radiation signal receiving unit is located on one side of the test unit and is spaced apart from the single event failure test unit based on a second distance; one end of the electromagnetic radiation signal preprocessing unit is connected to the electromagnetic radiation signal receiving unit, and the other end of the electromagnetic radiation signal preprocessing unit is connected to the host computer;

[0023] The electromagnetic radiation signal receiving unit is used to receive and send the electromagnetic radiation signal emitted by the power device under test;

[0024] The electromagnetic radiation signal preprocessing unit is used to perform data preprocessing on the electromagnetic radiation signal.

[0025] Preferably, the electromagnetic radiation signal receiving unit may at least include a signal receiving antenna; and the electromagnetic radiation signal preprocessing unit may at least include an oscilloscope.

[0026] Preferably, the power device under test subunit of the single event failure test unit may include a plurality of test interfaces; and the plurality of test interfaces are used to connect to a plurality of power devices under test.

[0027] In a second aspect, the present invention provides a single-event failure test method for a power device. The test method is applied to a single-event failure test system for a power device. The system may include at least a single-event failure test unit, an electromagnetic radiation monitoring unit, and a host computer. The method may include:

[0028] Using the host computer to send a test instruction to the single event failure test unit; the test instruction at least includes an electrical characteristic test instruction and an electromagnetic radiation test instruction for the power device to be tested;

[0029] Based on the electrical characteristic test instruction, using the single event failure test unit to perform an electrical characteristic test on the power device to be tested in the single event failure test unit to obtain electrical characteristic test data for the power device to be tested;

[0030] Based on the electromagnetic radiation test instruction, using the single event failure test unit to perform an electromagnetic radiation test on the power device under test in the single event failure test unit, and using the electromagnetic radiation monitoring unit to obtain an electromagnetic radiation signal emitted by the power device under test during the electromagnetic radiation test to obtain electromagnetic radiation data;

[0031] Based on the electrical characteristic test data and the electromagnetic radiation data, the host computer is used to determine the single event failure mechanism of the power device to be tested.

[0032] Preferably, the electromagnetic radiation monitoring unit may include at least an electromagnetic radiation signal receiving unit and an electromagnetic radiation signal preprocessing unit;

[0033] The step of performing an electromagnetic radiation test on the power device under test in the single event failure test unit by using the single event failure test unit based on the electromagnetic radiation test instruction, and acquiring an electromagnetic radiation signal emitted by the power device under test during the electromagnetic radiation test by using the electromagnetic radiation monitoring unit to obtain electromagnetic radiation data may include:

[0034] Based on the electromagnetic radiation test instruction, using the single event failure test unit to apply a square wave signal of a preset frequency to the power device under test in the single event failure test unit, so that the power device under test emits a target electromagnetic radiation signal during frequent switching;

[0035] Utilizing the electromagnetic radiation signal receiving unit to receive the target electromagnetic radiation signal, and sending the target electromagnetic radiation signal to the electromagnetic radiation signal preprocessing unit;

[0036] The electromagnetic radiation signal preprocessing unit is used to perform data preprocessing on the target electromagnetic radiation signal to obtain the electromagnetic radiation data.

[0037] Preferably, the single event failure test unit may include at least an irradiation unit and a test unit;

[0038] The step of performing an electrical characteristic test on the power device to be tested in the single event failure test unit by using the single event failure test unit based on the electrical characteristic test instruction to obtain electrical characteristic test data for the power device to be tested may include:

[0039] Based on the irradiation unit, providing a radiation environment for the test unit according to a preset irradiation intensity;

[0040] Based on the electrical characteristic test instruction, the test unit is used to provide a test bias for the power device to be tested in the test unit to obtain electrical characteristic test data for the power device to be tested.

[0041] Preferably, the test unit may include at least a power device subunit to be tested, a power device control subunit to be tested, and a WiFi module;

[0042] The step of providing a test bias for the power device to be tested in the test unit by using the test unit based on the electrical characteristic test instruction to obtain electrical characteristic test data for the power device to be tested may include:

[0043] Based on the electrical characteristic test instruction, using the power device under test control subunit to provide a test bias for the power device under test in the power device under test subunit, and monitoring the electrical characteristic changes of the power device under test to obtain the electrical characteristic test data;

[0044] The electrical characteristic test data is sent to a host computer using the WiFi module.

[0045] Compared with the prior art, the present invention provides a single-particle failure test system for power devices, which comprises at least a single-particle failure test unit, an electromagnetic radiation monitoring unit, and a host computer; the single-particle failure test unit is connected to the host computer, and the electromagnetic radiation monitoring unit is connected to the host computer; the single-particle failure test unit is used to perform a single-particle failure test on the power device to be tested; the single-particle failure test includes at least an electrical characteristics test and an electromagnetic radiation test; the electromagnetic radiation monitoring unit is used to monitor the electromagnetic radiation signal emitted by the power device to be tested; and the host computer is used to determine the single-particle failure mechanism of the power device to be tested. Based on this, a single-particle failure test unit can be used to perform a single-particle failure test on the power device to be tested, which includes at least an electrical characteristic test and an electromagnetic radiation test, and the electromagnetic radiation monitoring unit can be used to monitor the electromagnetic radiation signal emitted by the power device to be tested; finally, the host computer is used to determine the single-particle failure mechanism of the power device to be tested based on the electrical characteristic test data and the electromagnetic radiation test data; the test range of the single-particle failure test is extended from the single-particle radiation failure test to the single-particle potential damage test, so that the single-particle failure mechanism of the power device can be determined more accurately, thereby improving the accuracy of the single-particle failure test of the power device. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0047] Figure 1 A schematic diagram of the main structure of a single event failure test system for power devices provided by the present invention;

[0048] Figure 2 A schematic diagram of the main process of a single-particle failure testing method for a power device provided by the present invention.

[0049] Figure 1: 10-single particle failure test unit, 20-electromagnetic radiation monitoring unit, 30-host computer, 12-irradiation unit, 11-test unit, 111-power device subunit to be tested, 1110-power device to be tested, 112-power device control subunit to be tested, 113-WiFi module, 21-electromagnetic radiation signal receiving unit, 22-electromagnetic radiation signal preprocessing unit. DETAILED DESCRIPTION

[0050] To facilitate a clear description of the technical solutions of the embodiments of the present invention, the embodiments of the present invention use terms such as "first" and "second" to distinguish between identical or similar items with substantially the same functions and effects. For example, the first threshold and the second threshold are merely used to distinguish between different thresholds and do not limit their order of precedence. Those skilled in the art will understand that terms such as "first" and "second" do not limit the quantity or execution order, and that terms such as "first" and "second" do not necessarily define differences.

[0051] It should be noted that, in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present invention should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0052] In the present invention, "at least one" refers to one or more, and "more" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: the existence of A alone, the existence of A and B at the same time, and the existence of B alone, where A and B can be singular or plural. The character " / " generally indicates that the associated objects in the preceding time are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can represent: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b, c can be single or multiple.

[0053] First, the main English abbreviations involved in this invention are explained as follows:

[0054]

[0055] Currently, a new generation of power semiconductors is rapidly developing. Silicon carbide (SiC) and gallium nitride (GaN), for example, are widely used in technologies such as electric vehicles and fast-charging. Silicon carbide (SiC) is a wide-bandgap semiconductor material with a bandgap of approximately 3.2 eV. Its excellent electrical and thermal conductivity and chemical stability make it widely used in high-temperature, high-frequency, and high-power applications. Compared with traditional silicon MOSFETs, SiC MOSFETs have higher critical breakdown electric field strength, lower on-resistance, and faster switching speeds, demonstrating significant advantages in new energy vehicles, high-power motor drives, inverters, and high-frequency switching power supplies. However, in extreme radiation environments (such as deep space exploration missions), SiC power devices can be affected by single-particle radiation, causing single-event gate breakdown (SEGR) and single-event burnout (SEB), seriously threatening the normal operation of spacecraft on orbit. At the same time, for the case of low drain voltage, although single-particle incident will not cause extreme phenomena such as SEGR or SEB, it will also cause defect accumulation in the insulating layer of the SiC device, causing single-particle potential damage to the device and affecting the device's on-orbit working life.

[0056] In the existing technology, for single-event effects (SEE) testing of power devices, such as SiC MOSFET devices, the test process is as follows: first, the radiation dose received by the device in the space environment is calculated, and the radiation test ion dose and linear energy transfer (LET) are determined based on the calculation results. Then, based on the calculated parameters, the device is subjected to heavy ion irradiation and electrical characteristics testing. The test results are comprehensively analyzed and calculated to finally determine whether the SiC MOSFET device's SEE resistance meets the mission requirements. Because this technology mainly focuses on single-event failure testing of SiC MOSFET power devices and does not provide a method for evaluating potential single-event damage, the accuracy of single-event failure testing of power devices is low. As a result, a more comprehensive evaluation of single-event failure testing of power devices cannot be performed, and thus a more accurate evaluation of the service life of power devices cannot be made. In addition, this technology currently only remains at the method level and has not formed an applicable test system.

[0057] In view of this, the present invention provides a single-particle failure test system and test method for power devices. Based on the failure mechanism of single particles in semiconductor power devices, a system for single-particle failure testing of semiconductor power devices is prepared, which can coordinately monitor the electrical characteristics and electromagnetic fields of power devices respectively, expand the scope of single-particle failure testing from radiation failure testing to single-particle potential damage failure testing, and broaden the scope of single-particle failure testing of power devices; can more accurately evaluate the single-particle failure mechanism of power devices, and improve the accuracy of single-particle failure testing of power devices; solve the problem of low accuracy of single-particle failure testing of power devices in the prior art.

[0058] Next, the technical solution of the present invention is described in detail with reference to the accompanying drawings. It should be noted that the single-particle failure test system and test method for power devices provided by the present invention can be applied to single-particle failure tests of semiconductor power devices made of different types of semiconductor materials, such as silicon carbide (SiC), gallium nitride (GaN), etc.; in the embodiments of the present invention, silicon carbide (SiC) is used as an example to describe the solution of the present application in detail.

[0059] See also Figure 1 , Figure 1 This is a schematic diagram of the main structure of a single event failure test system for power devices provided by the present invention.

[0060] exist Figure 1 In the embodiment, the single event failure test system may include at least: a single event failure test unit 10, an electromagnetic radiation monitoring unit 20 and a host computer 30.

[0061] The single-particle failure test unit 10 is connected to the host computer 30, and the electromagnetic radiation monitoring unit 20 is connected to the host computer 30; in an optional example, the single-particle failure test unit 10 can be connected to the host computer 30, and the electromagnetic radiation monitoring unit 20 can be connected to the host computer 30 by wireless communication or wired communication; in actual application, it can be selected according to actual conditions; in the present invention, it is preferred to connect the single-particle failure test unit 10 to the host computer 30 by wireless communication, and connect the electromagnetic radiation monitoring unit 20 to the host computer 30 by wired communication; thereby realizing data transmission between the single-particle failure test unit 10 and the electromagnetic radiation monitoring unit 20 and the host computer 30 respectively.

[0062] Specifically, the single-particle failure test unit 10 can be used to perform a single-particle failure test on the power device 1110 to be tested; wherein the single-particle failure test includes at least an electrical characteristic test and an electromagnetic radiation test; the electromagnetic radiation monitoring unit 20 is used to monitor the electromagnetic radiation signal emitted by the power device 1110 to be tested; and the host computer 30 is used to determine the single-particle failure mechanism of the power device 1110 to be tested.

[0063] Based on this, the present invention provides a single-particle failure test system for a power device, which can use a single-particle failure test unit 10 to perform a single-particle failure test on a power device to be tested 1110 according to a test instruction sent by a host computer 30, and send electrical characteristic test data during the test process to the host computer 30; the electromagnetic radiation monitoring unit 20 is used to monitor the electromagnetic radiation signal emitted outward by the power device to be tested 1110 during the single-particle failure test, that is, to monitor the electromagnetic radiation signal emitted outward by the power device to be tested 1110 during the single-particle potential damage failure test, and convert the electromagnetic radiation signal into electromagnetic radiation test data and send it to the host computer 30; finally, the host computer 30 is used to determine the single-particle failure mechanism of the power device to be tested 1110 based on the received electrical characteristic test data and electromagnetic radiation test data; thereby, the test range of the single-particle failure test is extended from the single-particle radiation failure test to the single-particle potential damage test, the single-particle failure mechanism of the power device can be determined more accurately, and the accuracy of the single-particle failure test of the power device is improved; and the problem of low accuracy of the single-particle failure test of the power device in the prior art is solved.

[0064] Preferably, the single event failure testing unit 10 includes at least an irradiation unit 12 and a testing unit 11 .

[0065] Specifically, the irradiation unit 12 can be located directly above the test unit 11 and spaced apart from the test unit 11 based on a first distance; the test unit 11 is connected to the host computer 30. The irradiation unit 12 is used to provide a radiation environment for the test unit 11; the test unit 11 is used to perform a single-event failure test on the power device under test 1110. The first distance can be determined based on experiments, and the irradiation unit can efficiently provide an irradiation environment for the test unit based on this distance. Based on this, the host computer can issue test instructions based on test requirements, including electrical characteristics test instructions and electromagnetic radiation test instructions, and the test unit can perform a single-event failure test on the power device under test based on the test instructions.

[0066] In practical applications, of course, the irradiation unit 12 can also be connected to the host computer 30 , so that the host computer can be used to set and control the irradiation unit 12 to provide an irradiation environment for the test unit 11 according to the user's irradiation requirements.

[0067] Preferably, the testing unit 11 may include at least a power device under test subunit 111 , a power device under test control subunit 112 and a WiFi module 113 .

[0068] Specifically, the power device under test subunit 111 can be connected to the power device under test control subunit 112, and the power device under test control subunit 112 can be connected to the WiFi module 113; thus, the power device under test subunit 111 can be used to place the power device under test 1110, and the power device under test subunit 111 can be electrically connected to the power device under test 1110; wherein the power devices under test 1110 can be N power devices under test, where N is greater than or equal to 1. The power device under test control subunit 112 can also be used to provide test bias for the N power devices under test in the power device under test subunit 111 and detect electrical characteristic data of the N power devices under test; wherein the control signal of the power device under test control subunit 112 is the control signal sent by the host computer. The WiFi module can also be used to receive and transmit electrical characteristic data, thereby receiving the electrical characteristic data sent by the power device under test control subunit and sending the electrical characteristic data to the host computer.

[0069] In practical applications, when the power device sub-unit to be tested of the single-particle failure test unit includes N power devices to be tested, the power device sub-unit to be tested must include multiple test interfaces, and the multiple test interfaces can be connected to the multiple power devices to be tested; thereby, the power device control sub-unit to be tested can be used to test the multiple power devices to be tested, including synchronous testing or one-by-one testing.

[0070] Preferably, the electromagnetic radiation monitoring unit 20 may at least include: an electromagnetic radiation signal receiving unit 21 and an electromagnetic radiation signal preprocessing unit 22 .

[0071] Specifically, the electromagnetic radiation signal receiving unit 21 can be set on one side of the test unit and spaced apart from the single-particle failure test unit 10 based on the second distance; one end of the electromagnetic radiation signal preprocessing unit 22 is connected to the electromagnetic radiation signal receiving unit 21, and the other end of the electromagnetic radiation signal preprocessing unit 22 is connected to the host computer 30; thereby, the electromagnetic radiation signal receiving unit can be used to receive and transmit the electromagnetic radiation signal emitted by the power device to be tested, and send the electromagnetic radiation signal to the electromagnetic radiation signal preprocessing unit; and the electromagnetic radiation signal preprocessing unit can be used to perform data preprocessing on the electromagnetic radiation signal, and the electromagnetic radiation test data obtained after processing is sent to the host computer.

[0072] Optionally, the electromagnetic radiation signal receiving unit 21 may at least include a signal receiving antenna, a signal receiver or a signal receiving module, etc.; the electromagnetic radiation signal preprocessing unit 22 may at least include an oscilloscope, a mixed signal oscilloscope or a spectrum analyzer, etc. Figure 1 In the description, the electromagnetic radiation signal receiving unit is taken as a receiving antenna, and the electromagnetic radiation signal preprocessing unit is taken as an oscilloscope.

[0073] In the second aspect, the present invention provides a single event failure test method for a power device, please refer to Figure 2 , Figure 2 This figure illustrates the main flow of a single-event failure testing method for power devices provided by the present invention. This testing method is applied to a single-event failure testing system for power devices. The system comprises at least a single-event failure testing unit 10, an electromagnetic radiation monitoring unit 20, and a host computer 30. The method is executed by a server or terminal equipped with the single-event failure testing method provided by the present invention, such as a detection service test platform, a test system, or a small portable test device.

[0074] exist Figure 2 Methods may include:

[0075] Step 210: Utilize the host computer to send a test instruction to the single event failure test unit; the test instruction at least includes an electrical characteristic test instruction and an electromagnetic radiation test instruction for the power device to be tested.

[0076] In step 210, the host computer can be used to send test instructions to the single-particle failure test unit respectively, that is, to send electrical characteristic test instructions and electrical characteristic test instructions for performing single-particle failure tests on the power device to be tested respectively; wherein, the electrical characteristic test instructions are test instructions for performing failure tests in extreme radiation environments. In extreme radiation environments, power devices may have problems such as single-particle gate breakdown (SEGR) or single-particle burnout (SEB). These problems will directly cause significant changes in the electrical characteristic data of the power device. Therefore, the electrical characteristic test can be used to analyze whether the power device has a single-particle extreme failure. The electromagnetic radiation test instruction is used to perform single particle potential damage test on power devices. When the drain voltage is low, although the single particle incident will not cause extreme phenomena such as SEGR or SEB, it will also cause defect accumulation in the insulating layer of the SiC device, causing the device to suffer single particle potential damage, affecting the device's on-orbit working life; research has found that the single particle potential damage analysis shows that for the potential damage caused by a single particle, the potential damage degree of the device can be monitored by monitoring the electromagnetic signal leaked from the device; therefore, the electromagnetic radiation data emitted by the device under test during frequent switching can be used to analyze whether the power device has suffered single particle potential damage failure; thereby better and more comprehensive single particle failure testing of the power device can be performed, which helps to improve the stability of the power module.

[0077] Step 220: Based on the electrical characteristic test instruction, use the single event failure test unit to perform an electrical characteristic test on the power device to be tested in the single event failure test unit to obtain electrical characteristic test data for the power device to be tested.

[0078] In step 220, based on the electrical characteristic test instruction, the single event failure test unit can be used to perform an electrical characteristic test on the power device under test in the single event failure test unit. Of course, when performing the electrical characteristic test, it is necessary to use the irradiation unit in the single event failure test unit to generate a corresponding radiation environment, and perform the electrical characteristic test in the radiation environment to obtain electrical characteristic test data of the power device under test. In actual applications, the power device under test in the single event failure test unit can be a power device located on a circuit board under test, and the circuit board under test can be replaceable. During test preparation, the circuit board under test can be placed on a substrate in the single event failure test unit, and the substrate can also be heated to change the temperature of the circuit board to improve test efficiency. After obtaining the electrical characteristic test data of the power device under test, the electrical characteristic test data is sent to the host computer.

[0079] Step 230: Based on the electromagnetic radiation test instruction, use the single-particle failure test unit to perform an electromagnetic radiation test on the power device to be tested in the single-particle failure test unit, and use the electromagnetic radiation monitoring unit to obtain the electromagnetic radiation signal emitted by the power device to be tested during the electromagnetic radiation test to obtain electromagnetic radiation data.

[0080] In step 230, upon receiving the electromagnetic radiation test instruction, the single-event failure test unit first shuts down the irradiation unit and then performs the electromagnetic radiation test. During the electromagnetic radiation test, a control circuit first applies a square wave signal of a target frequency to the gate of the power device under test, causing the device to emit electromagnetic radiation during frequent switching. Simultaneously, an electromagnetic radiation monitoring unit acquires the electromagnetic radiation signal emitted by the device under test during the electromagnetic radiation test and performs data preprocessing on the signal to obtain electromagnetic radiation data. Finally, the electromagnetic radiation data is transmitted to the host computer. The target frequency is determined based on the operating frequency of the power device, preferably the rated frequency.

[0081] Step 240: Based on the electrical characteristic test data and the electromagnetic radiation data, use the host computer to determine the single event failure mechanism of the power device to be tested.

[0082] In step 240, the host computer analyzes the data based on the electrical characteristic test data sent by the single-particle failure test unit and the electromagnetic radiation data sent by the electromagnetic radiation monitoring unit using its own pre-stored power device single-particle effect analysis algorithm, and finally outputs the test data for display to the user; for example, the SiC MOSFET single-particle effect analysis algorithm is used for processing.

[0083] In summary, the present invention provides a single-particle failure test method for a power device, which uses a host computer to send a test instruction including at least an electrical characteristic test instruction and an electromagnetic radiation test instruction for the power device to be tested to a single-particle failure test unit; first, the single-particle failure test unit is used to perform an electrical characteristic test on the power device to be tested in the single-particle failure test unit to obtain electrical characteristic test data for the power device to be tested; then, the single-particle failure test unit is used to perform an electromagnetic radiation test on the power device to be tested in the single-particle failure test unit, and an electromagnetic radiation monitoring unit is used to obtain an electromagnetic radiation signal emitted by the power device to be tested during the electromagnetic radiation test to obtain electromagnetic radiation data; finally, the host computer is used to determine the single-particle failure mechanism of the power device to be tested based on the electrical characteristic test data and the electromagnetic radiation data; based on this, the present invention realizes comprehensive testing of single-particle extreme failures and single-particle potential damage failures, comprehensively covers single-particle failure modes of power devices, and improves the accuracy of single-particle failure testing of power devices; in particular, the accuracy of single-particle failure testing of SiC power devices plays a promoting role in the further application of SiC power devices in commercial aerospace, deep space exploration and other fields.

[0084] Preferably, in step 220, the single event failure test unit may include at least an irradiation unit and a test unit; based on the electrical characteristic test instruction, using the single event failure test unit to perform an electrical characteristic test on the power device under test in the single event failure test unit to obtain electrical characteristic test data for the power device under test, which may include: based on the irradiation unit, providing a radiation environment for the test unit according to a preset irradiation intensity; based on the electrical characteristic test instruction, using the test unit to provide a test bias for the power device under test in the test unit to obtain electrical characteristic test data for the power device under test. It should be noted that the irradiation unit can provide irradiation with variable intensity, and the specific intensity value of the irradiation intensity can be determined based on the irradiation performance of the circuit board under test (the power device under test).

[0085] Furthermore, the test unit may include at least a power device sub-unit to be tested, a power device control sub-unit to be tested, and a WiFi module; based on the electrical characteristic test instruction, the test unit is used to provide a test bias for the power device to be tested in the test unit to obtain electrical characteristic test data for the power device to be tested, which may include: based on the electrical characteristic test instruction, the power device control sub-unit to be tested is used to provide a test bias for the power device to be tested in the power device sub-unit to be tested, and monitor the electrical characteristic changes of the power device to be tested to obtain electrical characteristic test data; and the electrical characteristic test data is sent to the host computer using the WiFi module.

[0086] Based on this, when conducting electrical characteristic tests, the irradiation unit can be used to generate a corresponding radiation environment according to the irradiation requirements set by the user, and provide a radiation environment for the power device sub-unit to be tested (circuit board to be tested) placed on the substrate, and the substrate can be used to heat the power device sub-unit to be tested to change the test temperature; then, the power device control sub-unit to be tested is used to provide a test bias for the power device to be tested in the power device sub-unit to be tested based on the control information sent by the host computer, and monitor the changes in the electrical characteristics of the power device to be tested to obtain electrical characteristic test data; such as electrical characteristic data such as current, voltage, and gate voltage bias; finally, the WiFi module connected to the power device control sub-unit to be tested is used to communicate with the host computer, and the electrical characteristic test data is sent to the host computer for the host computer to perform data analysis.

[0087] In practical applications, the power device under test subunit may be composed of several SiC MOSFET power devices under test and corresponding circuits, or may be composed of several GaN MOSFET power devices under test and corresponding circuits.

[0088] Preferably, in step 230, the electromagnetic radiation monitoring unit may at least include an electromagnetic radiation signal receiving unit and an electromagnetic radiation signal preprocessing unit; based on the electromagnetic radiation test instruction, the single particle failure test unit is used to perform an electromagnetic radiation test on the power device to be tested in the single particle failure test unit, and the electromagnetic radiation monitoring unit is used to obtain the electromagnetic radiation signal emitted by the power device to be tested during the electromagnetic radiation test to obtain electromagnetic radiation data, which may include: based on the electromagnetic radiation test instruction, the single particle failure test unit is used to apply a square wave signal of a preset frequency to the power device to be tested in the single particle failure test unit, so that the power device to be tested emits a target electromagnetic radiation signal during frequent switching; the electromagnetic radiation signal receiving unit is used to receive the target electromagnetic radiation signal, and the target electromagnetic radiation signal is sent to the electromagnetic radiation signal preprocessing unit; the electromagnetic radiation signal preprocessing unit is used to perform data preprocessing on the target electromagnetic radiation signal to obtain electromagnetic radiation data.

[0089] In practical applications, the electromagnetic radiation signal receiving unit is preferably an antenna, and the electromagnetic radiation signal preprocessing unit is preferably an oscilloscope; of course, it can also be the signal receiving device and data preprocessing device shown in the first aspect. Based on this, the power device under test control subunit in the single-particle failure test unit can be used to apply a square wave signal of a certain frequency to the gate of the power device under test in the power device under test subunit based on the control information sent by the host computer, so that the power device under test emits electromagnetic radiation outward during the frequent switching process, and is received by the electromagnetic radiation signal receiving unit (antenna), processed by the (electromagnetic radiation signal preprocessing) oscilloscope and sent to the host computer, so that the test results of the potential damage of the power device are obtained by analyzing the program for judging the potential damage of the power device and displayed to the user.

[0090] Based on this, the present invention provides a single-particle failure test method for power devices, which is applied to a single-particle failure test system for power devices constructed based on the failure mechanism of power devices. It can not only test the instantaneous single-particle failure of the device and evaluate the single-particle sensitivity of the device, but also test the single-particle potential damage; the scope of the device single-particle effect test is further expanded to potential damage, which improves the accuracy of the single-particle failure test of the power device, is conducive to in-depth research on the single-particle failure mechanism of power devices such as SiC or GaN, promotes the application of power devices in the aerospace field, and at the same time reduces the error of ground simulation tests, optimizes the effect of device evaluation, and can provide more comprehensive data support for the anti-single-particle reinforcement design of power devices.

[0091] Although the present invention is described herein in conjunction with various embodiments, in the process of implementing the claimed invention, those skilled in the art can understand and implement other variations of the disclosed embodiments by reviewing the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "an" does not exclude multiple situations. A single processor or other unit can implement several functions listed in the claims. Certain measures are recorded in different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

[0092] Although the present invention has been described with reference to specific features and embodiments thereof, it will be apparent that various modifications and combinations may be made thereto without departing from the spirit and scope of the invention. Accordingly, this specification and drawings are merely illustrative of the invention as defined by the appended claims and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the invention. It will be apparent that various modifications and variations may be made to the present invention by those skilled in the art without departing from the spirit and scope of the invention. Thus, the present invention is intended to include such modifications and variations as fall within the scope of the claims of the present invention and their equivalents.

Claims

1. A single event failure test system for power devices, characterized in that: At least: Single event failure test unit, electromagnetic radiation monitoring unit and host computer; The single event failure test unit is connected to the host computer, and the electromagnetic radiation monitoring unit is connected to the host computer; The single event failure test unit is used to perform a single event failure test on the power device to be tested; the single event failure test at least includes an electrical characteristic test and an electromagnetic radiation test; The electromagnetic radiation monitoring unit is used to monitor the electromagnetic radiation signal emitted by the power device to be tested; The host computer is used to determine the single event failure mechanism of the power device to be tested.

2. The test system according to claim 1, wherein: The single event failure test unit at least includes an irradiation unit and a test unit; The irradiation unit is located directly above the test unit and is spaced apart from the test unit based on a first distance; the test unit is connected to the host computer; The irradiation unit is used to provide a radiation environment for the testing unit; The testing unit is used to perform a single event failure test on the power device to be tested.

3. The test system according to claim 2, wherein: The test unit at least includes a power device subunit to be tested, a power device control subunit to be tested and a WiFi module; The power device under test subunit is connected to the power device under test control subunit, and the power device under test control subunit is connected to the WiFi module; The power device under test subunit is used to place the power device under test and is electrically connected to the power device under test; The power device under test control subunit is used to provide a test bias for the power device under test in the power device under test subunit and detect electrical characteristic data of the power device under test; The WiFi module is used to send and receive the electrical characteristic data.

4. The test system according to claim 1, wherein: The electromagnetic radiation monitoring unit at least includes: an electromagnetic radiation signal receiving unit and an electromagnetic radiation signal preprocessing unit; The electromagnetic radiation signal receiving unit is located on one side of the test unit and is spaced apart from the single event failure test unit based on a second distance; one end of the electromagnetic radiation signal preprocessing unit is connected to the electromagnetic radiation signal receiving unit, and the other end of the electromagnetic radiation signal preprocessing unit is connected to the host computer; The electromagnetic radiation signal receiving unit is used to receive and send the electromagnetic radiation signal emitted by the power device under test; The electromagnetic radiation signal preprocessing unit is used to perform data preprocessing on the electromagnetic radiation signal.

5. The test system according to claim 4, wherein: The electromagnetic radiation signal receiving unit at least includes a signal receiving antenna; the electromagnetic radiation signal preprocessing unit at least includes an oscilloscope.

6. The test system according to any one of claims 1 to 5, characterized in that: The power device subunit to be tested of the single event failure test unit includes a plurality of test interfaces; The multiple test interfaces are used to connect to multiple power devices to be tested.

7. A single event failure test method for a power device, characterized in that: The test method is applied to a single event failure test system for power devices, the system comprising at least a single event failure test unit, an electromagnetic radiation monitoring unit, and a host computer; the method comprises: Using the host computer to send a test instruction to the single event failure test unit; the test instruction at least includes an electrical characteristic test instruction and an electromagnetic radiation test instruction for the power device to be tested; Based on the electrical characteristic test instruction, using the single event failure test unit to perform an electrical characteristic test on the power device to be tested in the single event failure test unit to obtain electrical characteristic test data for the power device to be tested; Based on the electromagnetic radiation test instruction, using the single event failure test unit to perform an electromagnetic radiation test on the power device under test in the single event failure test unit, and using the electromagnetic radiation monitoring unit to obtain an electromagnetic radiation signal emitted by the power device under test during the electromagnetic radiation test to obtain electromagnetic radiation data; Based on the electrical characteristic test data and the electromagnetic radiation data, the host computer is used to determine the single event failure mechanism of the power device to be tested.

8. The testing method according to claim 7, wherein: The electromagnetic radiation monitoring unit at least includes an electromagnetic radiation signal receiving unit and an electromagnetic radiation signal preprocessing unit; The method includes: performing an electromagnetic radiation test on a power device under test in the single event failure test unit by using the single event failure test unit based on the electromagnetic radiation test instruction; and acquiring an electromagnetic radiation signal emitted by the power device under test during the electromagnetic radiation test by using the electromagnetic radiation monitoring unit to obtain electromagnetic radiation data. Based on the electromagnetic radiation test instruction, using the single event failure test unit to apply a square wave signal of a preset frequency to the power device under test in the single event failure test unit, so that the power device under test emits a target electromagnetic radiation signal during frequent switching; Utilizing the electromagnetic radiation signal receiving unit to receive the target electromagnetic radiation signal, and sending the target electromagnetic radiation signal to the electromagnetic radiation signal preprocessing unit; The electromagnetic radiation signal preprocessing unit is used to perform data preprocessing on the target electromagnetic radiation signal to obtain the electromagnetic radiation data.

9. The testing method according to claim 7, wherein: The single event failure test unit at least includes an irradiation unit and a test unit; The step of performing an electrical characteristic test on a power device to be tested in the single event failure test unit by using the single event failure test unit based on the electrical characteristic test instruction to obtain electrical characteristic test data for the power device to be tested includes: Based on the irradiation unit, providing a radiation environment for the test unit according to a preset irradiation intensity; Based on the electrical characteristic test instruction, the test unit is used to provide a test bias for the power device to be tested in the test unit to obtain electrical characteristic test data for the power device to be tested.

10. The testing method according to claim 9, wherein: The test unit at least includes a power device subunit to be tested, a power device control subunit to be tested and a WiFi module; The step of providing a test bias for the power device to be tested in the test unit by using the test unit based on the electrical characteristic test instruction to obtain electrical characteristic test data for the power device to be tested includes: Based on the electrical characteristic test instruction, using the power device under test control subunit to provide a test bias for the power device under test in the power device under test subunit, and monitoring the electrical characteristic changes of the power device under test to obtain the electrical characteristic test data; The electrical characteristic test data is sent to a host computer using the WiFi module.

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