Detection method for checking abnormal work of lamp

Abstract

The invention relates to the technical field of electronic circuit detection, in particular to a detection method for checking abnormal work of a lamp, which comprises the following steps: acquiring the consistency of a lighting state and voltage, extracting abnormal response, checking power supply connection and checking non-response, monitoring and controlling the relationship between output and current action starting, and analyzing response continuity. And detecting branch voltage difference change and direction, monitoring voltage jump and current response starting point performance, extracting response data, and obtaining a classification result. According to the invention, through cooperative detection of voltage and current response behaviors, in combination with path voltage difference direction change and time sequence characteristics, a load abnormal response section is identified step by step, the abnormal state identification capability is enhanced, an action time sequence cross validation mode is adopted to replace a traditional static judgment process, misjudgment interference is reduced, and manual intervention requirements are reduced; therefore, the detection process is more continuous, the related operation is universal, the method can be suitable for various lamp structures, the troubleshooting precision is improved, and the execution cost is controlled at the same time.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic circuit detection, and in particular to a detection method for troubleshooting abnormal operation of a lamp. Background Art

[0002] The field of electronic circuit detection technology includes the detection and fault analysis of various electronic equipment circuit status. Its core content is to determine whether the performance of components in the circuit is normal, whether the circuit connection is complete, whether the energy transmission is stable, etc. by collecting and analyzing electrical parameters such as voltage, current, and resistance. This technical field is widely used in multiple scenarios such as lighting systems, household appliances, and industrial control equipment. It cooperates with different detection methods such as static voltage testing, current fluctuation monitoring, open and short circuit identification, and electrical signal timing analysis to achieve the location and status identification of circuit faults. With the development of functional safety design concepts, electronic circuit detection technology has gradually integrated automated control, multi-channel detection, signal redundancy identification and other means to improve the reliability of equipment operation and the efficiency of the detection process.

[0003] Among them, a detection method for troubleshooting abnormal operation of lamps refers to a technical method that determines the working status and fault type of the lamp by collecting voltage and current data at both ends of the lamp and combining it with clear electrical parameter judgment criteria. This detection method covers real-time sampling of the lamp power input, drive circuit output, and lamp bead circuit on-off status, and identifies different sources of abnormalities such as lamp bead damage, open power circuit, and driver board failure based on specific judgment criteria such as whether the voltage is in the operating range, whether there is a sudden change in the current, and whether the electric power fluctuates abnormally. At the same time, this method can adopt a unified detection process for functional safety lamps and non-functional safety lamps, and through logical judgment of electrical signals at key nodes, it reduces manual participation and realizes automatic identification and classification of abnormal problems in lamps. The detection process is usually completed by configuring high-precision sampling circuits and preset judgment logic circuits, without relying on external manual judgment conditions.

[0004] Existing technologies primarily rely on static sampling of values like voltage and current, focusing anomaly detection on whether parameters meet preset ranges. This fails to establish a chained response process between behavioral logic and electrical structure, resulting in a lack of temporal boundaries between different anomalies. Lamp lighting status is not considered a trigger for dynamic detection, and there is a lack of interactive response analysis between the control and load sides, making it difficult to isolate and identify some control signal anomalies. A mechanism is not established to correlate signal transitions with action responses, and fragmented response information during voltage fluctuations is often treated as noise and eliminated, obscuring potential load-side anomalies. Path judgment lacks trend support, with branch fluctuations only compared to thresholds without identifying their directional characteristics, making it impossible to establish a linkage judgment relationship with the main path behavior. Continuity and response delay in load action are not evaluated as separate parameters, making it difficult to identify response-missing faults in the presence of output transitions. These deficiencies often result in fuzzy attribution of anomaly identification results, affecting the accuracy of fault classification and limiting the application of fault data structures in subsequent diagnosis, early warning, and classification tasks. Summary of the Invention

[0005] The purpose of the present invention is to solve the shortcomings of the prior art and to propose a detection method for troubleshooting abnormal operation of a lamp.

[0006] In order to achieve the above object, the present invention adopts the following technical solution: a detection method for troubleshooting abnormal operation of a lamp, comprising the following steps: S1: Obtain the lighting status of the lamp after power is applied, read the voltage value across the lamp, compare the consistency between the voltage status and the lighting performance, extract the abnormal response, and obtain the power supply and light efficiency mismatch record; S2: Based on the power supply and light efficiency mismatch record, check the connection status of the main power supply line and the input terminal of the driver board, verify the looseness, oxidation or ablation of the contacts, and troubleshoot the non-response situation to obtain the conclusion of driver function failure identification; S3: Based on the above-mentioned conclusion of identification of driving function failure, read the on-off state of the enable pin of the driving chip, detect the level jump performance of the chip at the control signal output end, monitor the load side current response action and start time, analyze the continuity of the chip control output response, and obtain the PWM dimming signal interruption flag; S4: Based on the PWM dimming signal interruption flag, detecting the voltage difference change between adjacent branches of the main path, comparing the time relationship between the direction change and the electrical characteristics of the main path, recording the corresponding performance state, and obtaining a correction record of the main path reference state; S5: Based on the main path reference state correction record, monitor the voltage jump starting point and amplitude, collect the lamp load side current response starting point and action performance, extract the response data, and obtain the load response missing classification result.

[0007] The power supply light effect mismatch record includes the voltage holding value, the mismatch between the voltage existence state and the lighting state, and the state of no light output after power-on. The driving function failure identification conclusion includes the connection path integrity, the lack of driving response, and the input end without a load start signal. The PWM dimming signal interruption flag includes the enable pin action frequency, the output level change hysteresis, and the load current response loss. The main path reference state correction record includes the main path voltage value adjustment interval, the branch directional change sequence, and the pressure difference behavior segment division. The load response loss classification result includes the no response interval, jump mismatch behavior, and action delay characteristics.

[0008] As a further solution of the present invention, the specific steps of S1 are: S101: Obtaining the switch response state of the lamp after it is powered on, detecting the corresponding changes in the light source state and the switch operation time period during the lighting operation of the lamp, reading the change amplitude and fluctuation trend of the voltage value at both ends of the lamp, and obtaining the power-on lighting response change performance; S102: Based on the power-on lighting response change performance, monitor the continuous change trend of the voltage value of the lamp during the switching cycle, analyze whether the light source state of the lamp remains extinguished when the power is on, mark the action performance of no light emission during the power-on period, and obtain the power-on non-lighting response behavior characteristics; S103: Based on the power-on non-lighting response behavior characteristics, compare the voltage status during the power-on period of the lamp and the non-lighting action of the light source, filter out the segment sequences in which the power supply status persists but does not cause the light source to act, and obtain the power supply and light effect mismatch record.

[0009] As a further solution of the present invention, the specific steps of S2 are: S201: Based on the power supply and light efficiency mismatch records, detect the connection status of the main power supply circuit of the lamp and the input terminal of the driver board, verify the signs of falling off and loose screws in the port wiring structure, analyze the continuity performance of the conductive path of the connection part, and obtain the contact conduction performance result; S202: Based on the contact conduction performance result, calculating the power supply level offset amplitude in adjacent time periods before and after the drive input terminal voltage changes, analyzing the impact of the contact conduction state on the input voltage continuity, and obtaining an input voltage stability index; S203: Based on the input voltage stability index, monitor the response action of the lamp under power-on conditions and the load startup behavior, compare the action performance when there is no power-on response under normal connection conditions, and obtain a conclusion on the identification of driving function failure.

[0010] As a further solution of the present invention, the calculation formula for the power supply level offset amplitude in adjacent time periods before and after the driving input terminal voltage changes is specifically: ; in, Represents the power supply level offset amplitude in the adjacent time periods before and after the drive input voltage changes. Represents the voltage change after The voltage value of the subsample, Represents the voltage before the change The voltage value of the subsample, Representative The contact resistance value corresponding to the sampling time is Representative The standard resistance value of each connection point is Represents the number of sampling points in the selected time period.

[0011] As a further solution of the present invention, the specific steps of S3 are: S301: Based on the driving function failure identification conclusion, read the on-off state of the driver chip enable pin, detect the pin conduction performance and intermittent change during the application of the control signal, analyze the on-off alternating cycle behavior, and obtain the enable pin cycle response amount; S302: calling the enable pin periodic response amount, detecting the level jump performance of the chip output terminal within the response period, calculating the ratio of the jump start time to the synchronization point of the periodic response, and obtaining the output level synchronization matching rate; S303: Based on the output level synchronization matching rate, monitor the time relationship between the starting time segment of the load side current action and the output level jump starting position, analyze the coordination between the two in the response timing, and obtain the PWM dimming signal interruption flag.

[0012] As a further solution of the present invention, the calculation formula for the ratio of the jump start time to the synchronization point of the periodic response is specifically: ; in Represents the ratio of the jump start time to the synchronization point of the cycle response, Represents the total number of valid level transitions within the response cycle. Represents the sequence number of the current jump sample, Representative The actual time when the jump occurs, Representative The theoretical synchronization time point of the sub-cycle response, Representative The time difference between the jump and the corresponding theoretical cycle response time, Representative The amplitude fluctuation factor corresponding to the jump.

[0013] As a further solution of the present invention, the specific steps of S4 are: S401: Based on the PWM dimming signal interruption flag, detecting voltage change data of a branch adjacent to the main path, monitoring the change trajectory of the branch voltage value during continuous fluctuation, extracting the start and end times and span of the interval in which the voltage value change direction lies, and obtaining the branch voltage value direction change interval value; S402: Calling the branch pressure value direction change interval value, calculating the distribution density of the value within the main path judgment period, and comparing the amplitude relationship with the fluctuation amount of the main path periodic pressure value change to obtain the pressure difference distribution amplitude value; S403: Based on the pressure difference distribution amplitude value, identify the electrical behavior section in the main path that overlaps with the branch pressure value fluctuation area, extract the electrical change sequence in the section, and obtain the main path reference state correction record.

[0014] As a further solution of the present invention, the calculation formula for the distribution density of the values within the main path judgment period is specifically: ; in, The representative branch number is The distribution density of the pressure value in the main path judgment period, Representative branch The pressure value data within the k-th pressure value direction change interval, Representative branch The arithmetic mean of the pressure values in the entire main path judgment cycle, Representative branch In the The number of pressure value jumps within the pressure value direction change range, Representative branch No. The disturbance response coefficient of the interval, Representative branch The corresponding pressure measurement drift correction factor, Representative branch No. The time span of the pressure value change range, Representative branch The total time span of the pressure value direction change within the main path judgment period, The index number representing the pressure value change range. Represents the branch number, Represents the total number of pressure value direction change intervals within the main path judgment period.

[0015] As a further solution of the present invention, the specific steps of S5 are: S501: Based on the main path reference state correction record, connect the power supply and monitor the output terminal voltage jump, identify the starting jump time position and voltage amplitude change behavior within the voltage fluctuation segment, mark the signal change pattern of the continuous change area, and obtain the voltage jump feature combination; S502: calling the voltage jump feature combination, detecting the current response behavior of the lamp load end, verifying the continuity of the current action starting point and the continuation state, tracking the state change path of the current signal during the jump period, and obtaining a current response delay structure group; S503: Based on the current response delay structure group, track the connection performance of the current response action after the voltage jump, identify the current response time interval that does not continuously follow the voltage action, extract the sequential response characteristics of the electrical behavior in the interval, and obtain the load response missing classification result.

[0016] Compared with the prior art, the advantages and positive effects of the present invention are: In the present invention, through the coordinated detection of voltage and current response behaviors, combined with the change in the direction of path pressure difference and time series characteristics, the abnormal load response section is gradually identified, the abnormal state recognition capability is enhanced, and the action timing cross-validation method is adopted to replace the traditional static judgment process, thereby reducing the interference of false judgments and compressing the need for manual intervention, making the detection process more continuous. The operations involved are universal and can be applied to a variety of lamp structures, thereby improving the accuracy of fault detection and controlling the execution cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the main steps of the present invention. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0019] In the description of the present invention, it should be understood that the terms "length," "width," "up," "down," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inside," "outside," and the like, indicating positions or relationships, are based on the positions or relationships shown in the accompanying drawings and are intended only to facilitate the description of the present invention and simplify the description. They do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limiting the present invention. Furthermore, in the description of the present invention, "plurality" means two or more, unless otherwise expressly and specifically defined.

[0020] See also Figure 1The present invention provides a technical solution: a detection method for troubleshooting abnormal operation of a lamp, comprising the following steps: S1: Obtain the initial state performance of the lamp after power is turned on, perform switching actions and monitor the lighting status of the lamp, read the continuous voltage stability performance of the two ends of the lamp, compare whether the voltage at both ends is consistent with the lighting status, analyze whether there is an abnormal operating state of power on but not lighting, and obtain the power supply and light efficiency mismatch record; S2: Based on the power supply and light efficiency mismatch records, check whether the main power supply line of the lamp is reliably connected to the connection point of the driver board input terminal, monitor whether there are signs of looseness, oxidation or ablation on the port, and analyze whether the lamp still does not respond when there are no connection abnormalities, so as to obtain the conclusion of driver function failure identification; S3: Based on the conclusion of the driver function failure identification, read the on / off signal status of the driver chip enable pin, detect the jump level of the chip output after the control signal is applied, monitor the time relationship between the load side current response action and output change, analyze the consistency of the control action and the load electrical performance signal response, and obtain the PWM dimming signal interruption flag; S4: Based on the PWM dimming signal interruption flag, the voltage change behavior in the circuit branch adjacent to the main path is detected, the direction of the voltage difference trend during the main path judgment period is analyzed, and the time position of the branch voltage value and the main path electrical characteristics are compared to adjust the main path judgment reference state to obtain the main path reference state correction record; S5: Based on the main path reference state correction record, connect the power supply and monitor the starting time and amplitude of the output voltage jump. Synchronously detect the starting position and continuity of the current change at the lamp load end. Extract the signal response time points and corresponding action results at both ends to obtain the load response missing classification result.

[0021] The power supply light efficiency mismatch record includes the voltage holding value, the mismatch between the voltage existence state and the lighting state, and the no light output state after power-on. The driver function failure identification conclusion includes the connection path integrity, the lack of driver response, and the no load start signal at the input end. The PWM dimming signal interruption mark includes the enable pin action frequency, the output level change lag, and the load current response loss. The main path reference state correction record includes the main path voltage value adjustment interval, the branch directional change sequence, and the pressure difference behavior segment division. The load response loss classification results include the no response interval, jump mismatch behavior, and action delay characteristics.

[0022] The specific steps of S1 are: S101: Obtaining the switch response state of the lamp after it is powered on, detecting the corresponding changes in the light source state and the switch operation time period during the lighting operation of the lamp, reading the change amplitude and fluctuation trend of the voltage value at both ends of the lamp, and obtaining the power-on lighting response change performance; First, the starting time point of the switch on-off signal is identified based on the moment of power-on, and this time point is marked as the initial position of the switch action. According to the on-off cycle of the power control signal, the lighting behavior of the light source is associated with the time period, and the time point when the light source first emits light is recorded. The interval between this time point and the power-on time point is divided into time series. When the interval time exceeds 200ms, it needs to be registered as a response lag behavior. Then the state of the light emission during the lighting process is identified, and the light emission state is divided into three types: stable light emission, flickering light emission and no light emission. They are classified according to the set judgment interval. Stable light emission is defined as a brightness change of no more than 15% within 500ms, flickering light emission is a brightness fluctuation of more than 20% within 200ms, and no light emission is a brightness less than 5% and lasts for more than 400ms. At this time, it is judged that the light source response is stable, the response fluctuates or the response fails, and then the lamp is read within the response cycle. The voltage data at both ends is sampled every 10ms, resulting in 50 sets of continuous sampling values. A sliding window is then used to calculate fluctuation trends for five adjacent sets of data, with upper and lower voltage limits set at 115V and 245V, respectively. If any two consecutive sets of sampling values within three windows fall outside these ranges, the voltage fluctuation is flagged as abnormal. Further analysis of the voltage sampling range is performed to determine the maximum interval between the peak and valley voltage values, which serves as a reference for the voltage fluctuation amplitude. Excessive amplitude fluctuation is defined when this amplitude exceeds 40V. For example, if an LED lamp exhibits no brightness after 0.2 seconds of power-on, the test results show that the voltage across the lamp transiently rises from 118V to 248V within the sampling period and then briefly falls back. This behavior corresponds to a situation where power is present but the lighting response is offset. Data sampling and state analysis reveal the change in the lighting response during power-on.

[0023] S102: Based on the lighting response change performance when powered on, monitor the continuous change trend of the voltage value of the lamp during the switching cycle, analyze whether the light source of the lamp remains off when powered on, mark the action performance that does not emit light during the power-on period, and obtain the power-on non-lighting response behavior characteristics; First, the voltage changes in the entire switching cycle after the lamp is powered on are continuously recorded. The sampling period is set to 10ms, the acquisition period length is 500ms, and a total of 50 groups of voltage value data are obtained. The voltage change trend curve of the complete cycle is constructed based on this. During the execution process, the three adjacent groups of data are compared with the linear increasing and decreasing trends. If the three groups of data show a monotonically increasing trend and the overall value remains between 125V and 235V, it is marked as the voltage rising stage. If the subsequent three groups of data show a decreasing trend and are finally lower than 115V, it is marked as the falling stage. If the fluctuation between the data is within ±3V, it is judged to be a stable stage. Combined with the power-on lighting response change performance in the previous stage, it is extracted whether the light source generates brightness output within the stable voltage range. If there is no continuous brightness change action, the light source state continuously extinguishes judgment logic is entered. In this logic, set The light source brightness threshold is set to 10cd. If the brightness is lower than this value for four consecutive sampling periods and no single brightness change exceeds 2cd, this stage is marked as light source off behavior. Combined with the previously recorded power-on start time point and compared with the start time point of this stage, if the interval between the two is greater than 200ms, the corresponding duration of this segment of behavior is further recorded. For example: after a lamp is powered on, the voltage remains stable at around 220V, the brightness does not exceed 5cd within 500ms, the light source brightness fluctuation is less than 1.5cd, and there is no sudden rise. This phenomenon meets the conditions for maintaining the off state. Subsequently, this continuous behavior is marked as a non-luminous state, and the time period in which no luminous action occurs in the power-on behavior is archived and numbered, and associated with the subsequent response time period to establish a logical mapping of the lamp not lighting up during the power-on cycle, and finally obtain the power-on non-lighting response behavior characteristics.

[0024] S103: Based on the power-on non-lighting response behavior characteristics, the voltage status during the power-on period of the lamp is compared with the non-lighting action of the light source, and a sequence of segments in which the power supply status persists but does not cause the light source to operate is screened out to obtain a power supply-light efficiency mismatch record; Call the previously confirmed power-on state record and lamp response data, extract the voltage section at both ends of the lamp within the switch action interval, and compare it with the luminous behavior of the light source in this period to construct a time correspondence curve between the voltage and the luminous state. Then monitor the feedback signal value of the light source light sensor in this time interval, and extract frame by frame whether the light value is stable at the environmental baseline level under the condition of continuous voltage value. If the voltage is maintained between the upper limit of 20V and the lower limit of 16V of the preset working range threshold in a certain period of time, and the light feedback value is always lower than the illumination reference value of 30lx, it means that in this time segment If the light source does not light up, the behavior is further judged by the length of the segment, and the short-term disturbance interval of less than 1 second is screened out. Only the time period with stable voltage and continuous no light-emitting action is retained to constitute the effective response segment. Then, according to the above conditions, all power-on period data are traversed to extract all time segment sequences that meet the conditions. Each segment needs to be compared with the actual switch action sequence to exclude the non-response behavior of the light source caused by non-control instructions. Finally, the proposed segments are organized into a sequence structure and numbered and archived for subsequent path judgment and electrical logic retrieval to obtain the power supply and light efficiency mismatch record.

[0025] The specific steps of S2 are: S201: Based on the power supply and light efficiency mismatch records, the connection status of the main power supply circuit of the lamp and the input terminal of the driver board is detected, the signs of falling off and the looseness of the screws in the port wiring structure are verified, and the continuity performance of the conductive path of the connection part is analyzed to obtain the contact conduction performance results; First, the physical location and construction of each connection point in the power supply path must be clarified. The inspector should disconnect the power supply, open the lamp housing, confirm the direction of the main power supply cable and its terminal connection structure, check the fastening method of the access terminals, connectors or crimping points one by one, and use a pull test to determine whether the connector has a tendency to loosen or fall off. If the connector is detached or obviously loose under light pulling conditions, it is considered that there is a structural connection abnormality. Then use a torque screwdriver to perform a reverse rotation test on the screw-fixed connection, record its initial torque value, and compare it with the connection fastening standard value recommended in the product manual. If the measured torque is 20% or more lower than the recommended value, it is judged to be a loose screw state. Then use an electric pen or multimeter to test the input terminal terminal and the driver terminal. The voltage conduction between the power input pins of the board is measured point by point, and two rounds of measurements are performed when the lamp is powered on and off to confirm whether there is intermittent contact or high impedance in the conduction state. If the voltage intermittently jumps or remains zero during the conduction test, it is necessary to further check the thickness of the oxide layer at the wire connection position. The wire sheath can be peeled off and the surface color of the copper core can be visually inspected. If it is grayish white or black, oxidation is determined. After the above tests are completed, a number mapping relationship table is established for all connection points, and the corresponding abnormal items of each connection point are recorded. The conduction path status distribution table of the connection parts is formed by merging according to the abnormal type, so as to form a centralized evaluation of the contact conduction status in the entire main power supply path, and finally obtain the contact conduction performance results.

[0026] S202: Based on the contact conduction performance results, the power supply level offset amplitude in adjacent time periods before and after the drive input terminal voltage changes is calculated, and the degree of influence of the contact conduction state on the input voltage continuity is analyzed to obtain an input voltage stability index; The calculation formula for the power supply level offset amplitude in the adjacent time periods before and after the drive input voltage changes is: ; in, Represents the power supply level offset amplitude in the adjacent time periods before and after the drive input voltage changes. Represents the voltage change after The voltage value of the subsample, Represents the voltage before the change The voltage value of the subsample, Representative The contact resistance value corresponding to the sampling time is Representative The standard resistance value of each connection point is Represents the number of sampling points in the selected time period; Assumptions: The monitoring sampling frequency was 50 Hz, and 5 data points were collected before and after the voltage change; correspond ; Among the actually measured voltage values, the five sampling points before the voltage changes are: 、 、 、 、 ; The voltage after the change is: 、 、 、 、 ; 、 、 、 、 ; Standard resistance value to Both are set to 0.40 ohms, corresponding to the manufacturing specification value of the terminal.

[0027] Calculate item by item based on the above sampling values: The numerator is: ; The denominator is: ; Substituting into the formula we get: ; The results show that at the input end of the driver board, under the background of unstable contact point conduction, the voltage level offset in the two time periods before and after the change is 218.4 volts. This value represents the voltage jump amplitude caused by the contact resistance within the fluctuation range of 220 volts in the standard power supply area. The larger the value, the more obvious the difference in the power supply level of the input voltage in adjacent segments. This result is directly used to subsequently judge the input voltage stability index and promote the identification and judgment of the drive function.

[0028] S203: Based on the input voltage stability indicator, monitor the response of the lamp under power-on conditions and the load startup behavior, and compare the behavior when the lamp is connected normally and does not respond to power-on, to obtain a conclusion that the driving function has failed; First, a high-frequency data acquisition device is configured to collect the voltage at both ends of the lamp power supply lead. After the power is turned on, a sampling period is set and the instantaneous voltage value in each period is recorded. The difference between the maximum and minimum values in the voltage sequence is no more than 3V as the basis for stability judgment. After the sample voltage sequence is stable, its corresponding time interval is recorded. In the corresponding interval, the light source response behavior and electrical output characteristics of the lamp are synchronously collected to obtain the starting action state of the load current and the position of the current rising edge. It is judged whether the light source has a lighting start signal response under the condition of stable voltage. If no light source current rising response is detected or the current value is below the preset 100mA action threshold, it is judged that It is determined that the load startup is not triggered. Under the premise that the connection structure verification has been completed and the voltage is continuously stable, this state is recorded as a no-response situation. Then, a matching judgment is made on the current signal waveform in this state. By comparing whether the baseline stable state of the load-end current is sustained when the voltage is continuously input, if the current curve fluctuation does not exceed 5mA in the current three consecutive cycles, it is confirmed as a no-response behavior. Then, compared with the previous connection status judgment record, this behavior is classified as an abnormal segment in which no startup signal response is generated under the condition that there is no abnormality in the connection status. Finally, this abnormal segment is mapped as a typical feature of the abnormal drive output path, and the conclusion of drive function failure identification is obtained.

[0029] The specific steps of S3 are: S301: Based on the conclusion of the driver function failure identification, read the on-off state of the driver chip enable pin, detect the pin conduction performance and intermittent changes during the application of the control signal, analyze the on-off alternating cycle behavior, and obtain the enable pin cycle response amount; After connecting to the detection device, read the initial level of the pin at the start of power-on, and record the level state changes at each time point during the application of the control signal through continuous sampling. Set the sampling period to 2ms, and record a total of 500 points during the effective period of the control signal. Extract the sections where the conduction state is high and the non-conduction state is low. According to the order in which the level state changes occur, establish a logic sequence corresponding to the level changes on the time axis. For each switch from high level to low level, record a conduction interruption. For each jump from low level to high level, record a re-conduction action. Count whether the time interval between each pair of conduction and interruption is between 5ms and 50ms. The alternating process that meets this interval is regarded as a For a valid cycle, if there are multiple consecutive high-level segments in the sequence without a low-level transition, this segment is not counted in the cycle statistics. At the same time, if there is a continuous low-level segment for more than 100ms without switching to a high level, it is also regarded as a failed segment and not counted. For example, when the input control signal continuously changes the enable pin level in the sequence of high-low-high-low-high-low-high-low-high for 3000ms, corresponding to on-off, on-off, on-off, on-on, on-off, off-off, on-off, on-off, and on, a total of five complete on-off alternating cycles are identified. Among them, the 5th and 6th segments are continuously on without switching and are not treated as valid cycles. Finally, the number of valid on-cycle cycles is five. This method completes the cycle response behavior identification and obtains the enable pin cycle response quantity.

[0030] S302: Calling the enable pin cycle response quantity, detecting the level jump performance of the chip output terminal within the response cycle, calculating the ratio of the jump start time to the synchronization point of the cycle response, and obtaining the output level synchronization matching rate; The calculation formula for the ratio of the jump start time to the synchronization point of the periodic response is: ; in Represents the ratio of the jump start time to the synchronization point of the cycle response, Represents the total number of valid level transitions within the response cycle. Represents the sequence number of the current jump sample, Representative The actual time when the jump occurs, Representative The theoretical synchronization time point of the sub-cycle response, Representative The time difference between the jump and the corresponding theoretical cycle response time, Representative The amplitude fluctuation factor corresponding to the jump.

[0031] Assumptions: ; µs, µs, µs, µs, µs; µs; , , , , ; µs, µs; To prevent small terms with zero denominator; , , , , ; (when ) juxtaposition ; have to: , and the rest are similar, namely: , ,

[0032] Substitute into the first calculation: ; The calculation method for the remaining items is the same, and we can get them one by one: ; ; ; ; The sum is: ; The results show that the average matching offset ratio between the transition start time and the periodic response synchronization point is 0.00126, indicating the overall synchronization error of the transition timing fluctuation within the response period. This value can be used as a threshold to determine the synchronization performance level of level transitions, and is used in the synchronization control module's internal clock fine-tuning decision or hardware resampling trigger judgment logic.

[0033] S303: Based on the output level synchronization matching rate, monitor the time relationship between the start time segment of the load-side current action and the output level jump start position, analyze the coordination between the two in the response timing, and obtain a PWM dimming signal interruption flag; The time point sequence of the output level jump is read, and the corresponding jump starting position timestamp is recorded. The continuous sampling method of the load side current is adopted. A preset detection window is set after each output level change event is triggered. The current signal curve in the detection window is collected, and the starting position of the current action is extracted and time-marked. By comparing the time difference between the starting time of the current action and the starting time of the jump, it is determined whether it is within the synchronous response range. The absolute value of each group of time differences is compared with the set synchronization tolerance value. If the time difference is less than or equal to the tolerance value, it is marked as a synchronous matching item. If it exceeds, it is recorded as a non-synchronous action. The number of synchronous items and total action items during the entire detection period is counted, and the synchronous matching rate is calculated and output to the cache list. When the matching rate is lower than the minimum set threshold range for three consecutive detection cycles, the current dimming process is marked as a synchronous interruption phenomenon, which is then used as a reference for determining the interruption of the PWM dimming signal to obtain the PWM dimming signal interruption identifier.

[0034] The specific steps of S4 are: S401: Based on the PWM dimming signal interruption flag, detect voltage change data of the branch adjacent to the main path, monitor the change trajectory of the branch voltage value during the continuous fluctuation process, extract the start and end time and span of the interval in which the voltage value change direction lies, and obtain the branch voltage value direction change interval value; In the scenario where the dimming signal is interrupted, the voltage channels of the main path and the adjacent branches are called, and two groups of adjacent branches connected in parallel with the physical structure of the main path are selected as the detection objects. The voltage sampling data sequence of each branch after the line is energized is read in turn. The sampling time interval is set to 1ms to meet the requirement of capturing continuous fluctuations. A continuous voltage change curve is constructed for each group of branch voltage sampling values in the sampling order. The continuous rising or falling bands in the curve are judged, and the first and last sampling moments of such bands are extracted as the start and end time points. The band change span is obtained by the time difference between the last moment and the first moment. The corresponding calculated values are as follows: start time t1=100ms, end time t2= 130ms, then the band span is 30ms. This judgment standard is applied to the construction of multiple bands for each branch, and its voltage change direction (rising or falling), start and end time and span are recorded in turn. If the absolute value of the voltage difference before and after the band is greater than the set voltage fluctuation recognition threshold ΔUh, the current band is confirmed and recorded as a valid change segment. The voltage fluctuation recognition threshold is set with reference to the stable fluctuation tolerance of the branch voltage under normal working conditions, such as ±0.2V. A complete direction change interval list is generated for each branch. Each record in the list contains the branch number, change direction, start time, end time and span value, and the branch voltage direction change interval value is obtained.

[0035] S402: Call the branch pressure value direction change interval value, calculate the distribution density of the value within the main path judgment period, and compare the amplitude relationship with the fluctuation amount of the main path periodic pressure value change to obtain the pressure difference distribution amplitude value; The calculation formula for the distribution density of the value within the main path judgment period is: ; in, The representative branch number is The distribution density of the pressure value in the main path judgment period, Representative branch The pressure value data within the k-th pressure value direction change interval, Representative branch The arithmetic mean of the pressure values in the entire main path judgment cycle, Representative branch In the The number of pressure value jumps within the pressure value direction change range, Representative branch No. The disturbance response coefficient of the interval, Representative branch The corresponding pressure measurement drift correction factor, Representative branch No. The time span of the pressure value change range, Representative branch The total time span of the pressure value direction change within the main path judgment period, The index number representing the pressure value change range. Represents the branch number, Represents the total number of pressure value direction change intervals within the main path judgment period; Assumptions: The reasonable range of is 0.1 to 1.2, and it increases with the increase of the system load disturbance amplitude; The range is 0.01 to 0.05 MPa, which is mainly adjusted dynamically with the sensor temperature drift and aging cycle; Calculation process and examples: The monitoring data are as follows: Pressure values between the 1st and 3rd intervals: 2.4MPa, 3.2MPa, 2.7MPa; Number of jumps: 3, 2, 4; Interval time: 5s, 6s, 7s; Amplitude response: , , ; Drift correction factor: ; Average pressure value: ; Total judgment cycle time: ; Each calculation expands: Item 1: ; Item 2: ; Item 3: ; Summary: ; The result shows that the pressure fluctuation degree of branch s per unit time in the current main path judgment cycle is 0.0326MPa / s, reflecting the synergistic strength of its pressure difference concentration distribution and disturbance frequency. The subsequent control module will use this result to dynamically adjust the path switching sensitivity threshold to ensure stable switching response of the electro-hydraulic system.

[0036] S403: Based on the pressure difference distribution amplitude value, identify the electrical behavior section in the main path that overlaps with the branch pressure fluctuation, extract the electrical change sequence within the section, and obtain the main path reference state correction record; Retrieve the voltage continuous sampling sequence of the main path, and combine it with the previously extracted voltage direction change interval list of the adjacent branch, read the start and end time periods of each branch change interval in turn, extract the voltage change data of the corresponding time period from the main path voltage sequence with each segment as the boundary, set such segments as the main path overlap candidate segments, and then calculate the total voltage change amplitude of the main path in this time period. For example, the change value is 1.4V, and then perform difference processing with the corresponding branch voltage fluctuation amplitude. If the difference is within 2V, it is judged that there may be electrical behavior synchronization between the two, and the main path segment is included in the electrical overlap segment category. Then, extract the voltage change data in the segment for each candidate segment. The voltage change sequence, load-side current response sequence, and power sampling data are collected, and the variation range of each parameter within the time period is calculated item by item. For example, if the voltage drops from 234V to 230V, the current rises from 0.12A to 0.18A, and the power increases from 28W to 35W, the change direction between consecutive sampling points is compared, and the voltage drop trend and the synchronous current increase trend are recorded. Such performance is marked as an "enhanced conduction response segment" and this mark is attached to the basic parameters of the overlapping segment. Finally, the start and end time information, electrical parameter change values, and trend identifiers are integrated to generate segment data in the main path that changes synchronously with the branch voltage fluctuations, and obtain the main path baseline state correction record.

[0037] The specific steps of S5 are: S501: Based on the main path reference state correction record, connect the power supply and monitor the output voltage jump situation, identify the starting jump time position and voltage amplitude change behavior within the voltage fluctuation segment, mark the signal change pattern in the continuous change area, and obtain the voltage jump feature combination; First, after connecting to the power supply, it is necessary to synchronously start monitoring the voltage change trend of the output end. At the initial time point of power-on, the sampling frequency is set to 100 times per second to ensure that the complete voltage time series is obtained. The detection time is set to 30 seconds. During the acquisition process, the voltage value of each sampling point is read and stored in the time series array V(t). Then, the segments with a median change of more than 1.5V in the voltage sequence are screened as candidate jump intervals. For example, if the voltage value at the 230th sampling point jumps from 223.6V to 226.1V and keeps changing, it can be determined that point 230 is the jump starting point. This segment is continued to be tracked as a first-level jump segment, and the difference between the maximum and minimum voltages in the subsequent 10 sampling points is calculated. If it exceeds 2.5V, the upper limit of the jump segment is further extended, and the candidate jump segment is classified according to the jump rise or fall trend. If the change is a continuous rise, it is recorded as an "increase type", if it is a decrease, it is recorded as a "decrease type", and if it fluctuates alternately up and down, it is recorded as an "oscillation type". Then, the span length of each type of jump segment is counted separately. For example, the starting point is t=2.3s and the end point is t=4.6s, then the duration of this segment is 2.3 seconds. Then, the rate information of the voltage change in this segment is extracted, that is, the voltage change within every 100ms. If the average change rate is 0.25V / 100ms and the direction is consistent, it is marked as a "stable trend segment". If the rate fluctuation is greater than 0.6V / 100ms, it is marked as a "mutation trend segment". Finally, according to the manifestation of different jump segments in the voltage curve, the time span, maximum voltage, minimum voltage, change trend direction, change rate and other contents are combined to obtain the voltage jump feature combination.

[0038] S502: Invoke the voltage jump feature combination to detect the current response behavior of the lamp load end, verify the continuity of the current action starting point and the continuation state, track the state change path of the current signal during the jump period, and obtain the current response delay structure group; First, read the extracted start and end time points and voltage amplitude change data of each jump segment, set the sampling frequency of the monitoring current to 100 times per second, establish the time series I (t) of the current load current, set the current analysis window for the starting time point of each voltage jump segment, and the window length is initially set to 500 milliseconds, and dynamically adjusted with the voltage jump segment. During the sampling process, the current changes within 100 milliseconds after the start of the jump are recorded in real time to determine whether the current has a rapid rise from 0A. If the current value increases from 0A to more than 0.15A and continues for more than three sampling points, it is recorded as the starting point of the current response. If the current continues to rise after the start or maintains a stable range, the current holding segment is extracted, and the current amplitude value and the corresponding time span in the holding segment are recorded. For example, if the current increases from 0 .18A continues to 0.24A and is maintained for more than 0.6 seconds, this is recorded as a stable continuation segment. Then, the current waveform is analyzed to see whether there is a sudden drop or discontinuity during the entire jump period. If the current suddenly drops below 0.05A or returns to zero during the original continuous rising trend and does not recover within 150 milliseconds, it is recorded as an interruption segment. The current response trajectory corresponding to each jump feature is compared, and data is extracted according to the starting delay, stable segment, abnormal interruption, etc. If the voltage jump start time is t=2.5 seconds and the current response starting time is t=2.61 seconds, the current delay is 110 milliseconds. If the delay range is concentrated between 100 and 200 milliseconds, it is defined as a first-level delay structure. If it exceeds 250 milliseconds, it is classified as a second-level delay structure, resulting in a current response delay structure group.

[0039] S503: Based on the current response delay structure group, tracking the connection performance of the current response action after the voltage jump, identifying the current response time interval that does not continuously follow the voltage action, extracting the sequential response characteristics of the electrical behavior in the interval, and obtaining the load response missing classification result; First, a response detection window of 0 to 500 milliseconds is set after each voltage starting point, and the sections where the current signal is interrupted, delayed or missing are extracted. The current amplitude change sequence I(t) within the time range is obtained by sampling. If the current value in the detection window is continuously 0 or the fluctuation does not exceed 0.03A, it is judged as a discontinuous follow-up response. In the prototype tested in April 2020, the voltage rose from 115V to 140V but the current did not start within 100 milliseconds, forming the first type of missing behavior. Each type of missing response action is then numbered in the order of occurrence, and its occurrence location, duration, and related events before and after are recorded. For example, if there are three consecutive voltage jumps in a set of data but only one corresponds to the start of current, and there is no starting action in the remaining two times, then the non-response time period is extracted, and the voltage action and load action timestamp are combined to identify Is there an avoidance zone between current responses, that is, the current remains at a low value when the voltage suddenly changes? This situation frequently occurred in a group of high-voltage LED modules in May 2020. When the voltage suddenly rose from 180V to 210V, the current response was delayed to 600 milliseconds before starting, which is a case of significant delayed response. At the same time, the current behavior characteristics in the delay segment are collected to determine whether there is an electrical discontinuity problem caused by external load interference. If spike changes or noise interference are found in the current at the interruption of the previous and next waveforms, it can be further inferred that there is signal reflection in the controller feedback path. In the full sample, it is divided according to the three standards of missing response duration greater than 200 milliseconds, current amplitude less than 0.05A, and waveform without startup boundary. Finally, the abnormal response performance of different loads is classified into three types of missing types: no response, delayed response, and weak response, and the load response missing classification result is obtained.

[0040] The above are merely preferred embodiments of the present invention and do not limit the present invention in any other form. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes and apply it to other fields. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall still fall within the scope of protection of the technical solution of the present invention.

Claims

1. A detection method for troubleshooting abnormal operation of a lamp, characterized in that: The following steps are involved: S1: Obtain the lighting status of the lamp after power is applied, read the voltage value across the lamp, compare the consistency between the voltage status and the lighting performance, extract the abnormal response, and obtain the power supply and light efficiency mismatch record; S2: Based on the power supply and light efficiency mismatch record, check the connection status of the main power supply line and the input terminal of the driver board, verify the looseness, oxidation or ablation of the contacts, and troubleshoot the non-response situation to obtain the conclusion of driver function failure identification; S3: Based on the above-mentioned conclusion of identification of driving function failure, read the on-off state of the enable pin of the driving chip, detect the level jump performance of the chip at the control signal output end, monitor the load side current response action and start time, analyze the continuity of the chip control output response, and obtain the PWM dimming signal interruption flag; S4: Based on the PWM dimming signal interruption flag, detecting the voltage difference change between adjacent branches of the main path, comparing the time relationship between the direction change and the electrical characteristics of the main path, recording the corresponding performance state, and obtaining a correction record of the main path reference state; S5: Based on the main path reference state correction record, monitor the voltage jump starting point and amplitude, collect the lamp load side current response starting point and action performance, extract the response data, and obtain the load response missing classification result.

2. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The power supply light effect mismatch record includes the voltage holding value, the mismatch between the voltage existence state and the lighting state, and the state of no light output after power-on. The driving function failure identification conclusion includes the connection path integrity, the lack of driving response, and the input end without a load start signal. The PWM dimming signal interruption flag includes the enable pin action frequency, the output level change hysteresis, and the load current response loss. The main path reference state correction record includes the main path voltage value adjustment interval, the branch directional change sequence, and the pressure difference behavior segment division. The load response loss classification result includes the no response interval, jump mismatch behavior, and action delay characteristics.

3. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The specific steps of S1 are: S101: Obtaining the switch response state of the lamp after it is powered on, detecting the corresponding changes in the light source state and the switch operation time period during the lighting operation of the lamp, reading the change amplitude and fluctuation trend of the voltage value at both ends of the lamp, and obtaining the power-on lighting response change performance; S102: Based on the power-on lighting response change performance, monitor the continuous change trend of the voltage value of the lamp during the switching cycle, analyze whether the light source state of the lamp remains extinguished when the power is on, mark the action performance of no light emission during the power-on period, and obtain the power-on non-lighting response behavior characteristics; S103: Based on the power-on non-lighting response behavior characteristics, compare the voltage status during the power-on period of the lamp and the non-lighting action of the light source, filter out the segment sequences in which the power supply status persists but does not cause the light source to act, and obtain the power supply and light effect mismatch record.

4. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The specific steps of S2 are: S201: Based on the power supply and light efficiency mismatch records, detect the connection status of the main power supply circuit of the lamp and the input terminal of the driver board, verify the signs of falling off and loose screws in the port wiring structure, analyze the continuity performance of the conductive path of the connection part, and obtain the contact conduction performance result; S202: Based on the contact conduction performance result, calculating the power supply level offset amplitude in adjacent time periods before and after the drive input terminal voltage changes, analyzing the impact of the contact conduction state on the input voltage continuity, and obtaining an input voltage stability index; S203: Based on the input voltage stability index, monitor the response action of the lamp under power-on conditions and the load startup behavior, compare the action performance when there is no power-on response under normal connection conditions, and obtain a conclusion on the identification of driving function failure.

5. The method for detecting abnormal operation of a lamp according to claim 4, characterized in that: The calculation formula for the power supply level offset amplitude in adjacent time periods before and after the driving input terminal voltage changes is specifically: ； in, Represents the power supply level offset amplitude in the adjacent time periods before and after the drive input voltage changes. Represents the voltage change after The voltage value of the subsample, Represents the voltage before the change The voltage value of the subsample, Representative The contact resistance value corresponding to the sampling time is Representative The standard resistance value of each connection point is Represents the number of sampling points in the selected time period.

6. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The specific steps of S3 are: S301: Based on the driving function failure identification conclusion, read the on-off state of the driver chip enable pin, detect the pin conduction performance and intermittent change during the application of the control signal, analyze the on-off alternating cycle behavior, and obtain the enable pin cycle response amount; S302: calling the enable pin periodic response amount, detecting the level jump performance of the chip output terminal within the response period, calculating the ratio of the jump start time to the synchronization point of the periodic response, and obtaining the output level synchronization matching rate; S303: Based on the output level synchronization matching rate, monitor the time relationship between the starting time segment of the load side current action and the output level jump starting position, analyze the coordination between the two in the response timing, and obtain the PWM dimming signal interruption flag.

7. The method for detecting abnormal operation of a lamp according to claim 6, characterized in that: The calculation formula for the ratio of the jump start time to the synchronization point of the periodic response is specifically: ； in Represents the ratio of the jump start time to the synchronization point of the cycle response, Represents the total number of valid level transitions within the response cycle. Represents the sequence number of the current jump sample, Representative The actual time when the jump occurs, Representative The theoretical synchronization time point of the sub-cycle response, Representative The time difference between the jump and the corresponding theoretical cycle response time, Representative The amplitude fluctuation factor corresponding to the jump.

8. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The specific steps of S4 are: S401: Based on the PWM dimming signal interruption flag, detecting voltage change data of a branch adjacent to the main path, monitoring the change trajectory of the branch voltage value during continuous fluctuation, extracting the start and end times and span of the interval in which the voltage value change direction lies, and obtaining the branch voltage value direction change interval value; S402: Calling the branch pressure value direction change interval value, calculating the distribution density of the value within the main path judgment period, and comparing the amplitude relationship with the fluctuation amount of the main path periodic pressure value change to obtain the pressure difference distribution amplitude value; S403: Based on the pressure difference distribution amplitude value, identify the electrical behavior section in the main path that overlaps with the branch pressure value fluctuation area, extract the electrical change sequence in the section, and obtain the main path reference state correction record.

9. The method for detecting abnormal operation of a lamp according to claim 8, characterized in that: The calculation formula for the distribution density of the value within the main path judgment period is specifically: ； in, The representative branch number is The distribution density of the pressure value in the main path judgment period, Representative branch The pressure value data within the k-th pressure value direction change interval, Representative branch The arithmetic mean of the pressure values in the entire main path judgment cycle, Representative branch In the The number of pressure value jumps within the pressure value direction change range, Representative branch No. The disturbance response coefficient of the interval, Representative branch The corresponding pressure measurement drift correction factor, Representative branch No. The time span of the pressure value change range, Representative branch The total time span of the pressure value direction change within the main path judgment period, The index number representing the pressure value change range. Represents the branch number, Represents the total number of pressure value direction change intervals within the main path judgment period.

10. The method for detecting abnormal operation of a lamp according to claim 1, characterized in that: The specific steps of S5 are: S501: Based on the main path reference state correction record, connect the power supply and monitor the output terminal voltage jump, identify the starting jump time position and voltage amplitude change behavior within the voltage fluctuation segment, mark the signal change pattern of the continuous change area, and obtain the voltage jump feature combination; S502: calling the voltage jump feature combination, detecting the current response behavior of the lamp load end, verifying the continuity of the current action starting point and the continuation state, tracking the state change path of the current signal during the jump period, and obtaining a current response delay structure group; S503: Based on the current response delay structure group, track the connection performance of the current response action after the voltage jump, identify the current response time interval that does not continuously follow the voltage action, extract the sequential response characteristics of the electrical behavior in the interval, and obtain the load response missing classification result.

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