Projection measurement device and method suitable for three-dimensional reconstruction of mirror surface and diffuse reflection surface

Abstract

The invention provides a projection measurement device and method suitable for three-dimensional reconstruction of a mirror surface and a diffuse reflection surface. The projection measurement device comprises a projection system, an image acquisition camera system and a computer control system, the projection system is used for projecting coding pattern information to the to-be-detected surface; the image acquisition camera system is used for acquiring pattern information which is projected by the projection system and is reflected by the surface to be measured; and the computer control system is used for calibrating imaging parameters of the image acquisition camera system, acquiring the pattern information of the to-be-measured surface acquired by the image acquisition camera system, and generating the surface shape of the to-be-measured surface based on the imaging parameters and the acquired pattern information of the to-be-measured surface. The projection system adopts the partial projection system, so that the projection depth of field completely covers the complex to-be-measured surface, and meanwhile, the specular reflection light formed in the specular reflection area of the to-be-measured surface does not enter the view field of the image acquisition camera system as far as possible in a partial-axis projection mode, so that the overexposure phenomenon is effectively avoided.

Description

Technical Field

[0001] The present invention belongs to the technical field of precision visual measurement, and in particular relates to a projection measurement device and method suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces. Background Art

[0002] Fringe projection measurement is a technology that enables non-contact surface measurement of free-form surfaces with large apertures and a wide dynamic range. Fringe projection measurement methods are primarily categorized as monocular or binocular, depending on the number of cameras in the system.

[0003] Its working principle is as follows: first, through system calibration, the distribution of the incident light corresponding to the pixel in the camera imaging system in the spatial coordinate system is determined; then, the structured light coding information is projected onto the surface of the object to be measured through the projection system. This coding information is modulated by the surface to be measured and reflected to the camera, and the camera collects the deformed structured light coding pattern; then, combined with the decoding algorithm, the spatial correspondence between the incident light corresponding to the camera pixel and the outgoing light of the projection system pixel is established; finally, based on this correspondence, the three-dimensional surface shape information of the surface of the object to be measured is calculated.

[0004] However, due to the limited grayscale dynamic range of the camera, when there is a mirror reflection area on the surface of the object to be measured and the light of the projection system is directly reflected to the camera in a mirror reflection manner, this area will be overexposed in the camera imaging, resulting in the failure to obtain the encoded information, thereby affecting the accuracy of the measurement results.

[0005] In order to solve the overexposure problem caused by mirror reflection, existing technical solutions include: Zhang S and Yau ST proposed a high dynamic range scanning technology in the document "High dynamic range scanning technique" (Optical Engineering, 2009, 48(3):033604-033604-7), which uses a camera to collect multiple sets of coding patterns at different exposure times to expand the dynamic range. However, this method requires multiple acquisitions, resulting in a long measurement time. Ding Yi et al. disclosed a stripe projection measurement method based on one camera and two projection systems in patent CN105588518B, which uses multiple projection systems to project coding information from different angles to avoid the measurement blind spot caused by the overexposure phenomenon formed by a single projection system in the mirror reflection area. However, since this method needs to project coding information from different angles, it is necessary to add multiple projection systems, which not only increases the measurement time, but also makes the system structure complex and large in size.

[0006] CN111982026A discloses a method for using a polarization projector and a polarization camera in fringe projection measurement. This method aims to use polarization technology to separate specular and diffuse reflection components, thereby effectively suppressing specular reflection from highly reflective surfaces. However, this method has poor adaptability when processing reflective materials such as metals, where the reflected light contains non-polarized components, and is unable to completely filter out polarized light reflected from surfaces such as metals. Furthermore, the introduction of polarization devices significantly increases the overall cost of the system.

[0007] To avoid overexposure caused by specular reflections on the surface of the object being measured—that is, the resulting bright areas in the camera image of the coded pattern projected by the projection system—the projection system is often tilted relative to the camera's optical axis to minimize the amount of high-intensity reflected light from the specular reflections. However, the fundamental reason this method hasn't yet become a publicly known algorithm is that, to maintain fringe projection measurement accuracy, the surface of the object being measured must be within the depth of field of the camera and projector as much as possible.

[0008] Whether the camera or projector is tilted, some areas of the surface to be measured will not be completely within the depth of field, thus affecting the imaging quality. Taking the tilted projection system as an example, Figure 1 The figure shows a schematic diagram of fringe projection measurement using a non-short-throw, non-off-axis projection system. The depth of field of this type of non-short-throw projection system extends primarily along its optical axis, making it difficult to fully cover the highly undulating and complex surfaces of the measured object. As a result, portions of the coded pattern information received by the camera appear out of focus or blurred, seriously affecting the robustness of the measurement system and the accuracy of surface reconstruction.

[0009] The above-mentioned existing fringe projection measurement method has the following shortcomings and limitations when performing three-dimensional measurement of the surface of an object containing a specular reflection area: Some methods require the use of a camera to capture coding patterns under multiple sets of different exposure conditions, or use multiple sets of grayscale stripes for projection, which results in a complex coding pattern acquisition process, a large amount of computational complexity in the decoding algorithm, and a long overall measurement cycle, making it difficult to meet the needs of high-efficiency measurement; the mirror reflection suppression method based on polarization separation has poor adaptability to the surfaces of highly reflective materials such as metal, and cannot effectively separate the mirror component, resulting in large measurement errors; the solution of using multiple projectors to project coding information from different angles to avoid overexposure, although it reduces the impact of mirror reflection to a certain extent, due to the complex system configuration, the equipment volume increases, and multiple projections increase the measurement time cost, affecting the compactness and practicality of the system; using a traditional non-off-axis projector to obliquely project coding information will cause the surface to be measured to not be fully covered by the projector's depth of field, thereby affecting the accuracy of the measurement. Summary of the Invention

[0010] The purpose of the present invention is to overcome the deficiencies of the prior art and to provide a projection measurement device and method suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces.

[0011] The present invention is achieved through the following technical solutions: A projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces, the device comprising a projection system, an image acquisition camera system and a computer control system; The projection system is used to project the coded pattern information onto the surface to be measured. The projection system adopts an off-axis projection system. The off-axis projection system means that the projection area of the projection system is offset from the central axis of the projection system itself, and the clearest imaging plane of the projection depth of the projection system is perpendicular to the central axis of the projection system itself; The image acquisition camera system is located on the side of the projection system and is used to acquire pattern information projected by the projection system and reflected by the surface to be measured; The computer control system is connected to the projection system and the image acquisition camera system respectively through data links, and is used to control the operation of the projection system and the image acquisition camera system, obtain pattern information of the surface to be measured collected by the image acquisition camera system, and calculate and generate the surface shape of the surface to be measured based on the collected pattern information of the surface to be measured.

[0012] In the above technical solution, the image acquisition camera system consists of an industrial camera and an 8 mm focal length industrial lens.

[0013] In the above technical solution, the off-axis projection system is preferably a short-throw projection system or an ultra-short-throw projection system. The short-throw projection system refers to a projection system with a projection ratio greater than or equal to 0.6 and less than 1.0, and the ultra-short-throw projection system refers to a projection system with a projection ratio less than 0.6.

[0014] In the above technical solution, the off-axis projection system may be a Scheimpflug-based projection system.

[0015] In the above technical solution, the projection technology used by the projection system may be CRT projection, LCD projection, DLP projection or LCOS projection.

[0016] In the above technical solution, the coded pattern information projected by the projection system includes: Gray code, phase-shifted sinusoidal grating pattern, binary fringe coding, color fringe coding, phase coding plus Gray code mixture, single-frame composite coding, temporal coding or spatial coding.

[0017] In the above technical solution, the pattern information reflected by the surface to be measured is collected by the image acquisition camera system, and the mapping relationship between the pattern information reflected by the surface to be measured and the coded pattern information projected by the projection system is obtained through a decoding algorithm. The decoding algorithm includes a Gray code decoding algorithm, a phase shift algorithm and a phase unwrapping algorithm, a color channel separation and decoding algorithm, or a Fourier phase unwrapping algorithm.

[0018] In the above technical solution, the number of image acquisition camera systems is one or more.

[0019] In the above technical solution, there are two image acquisition camera systems, which are arranged side by side and located on the side of the projection system.

[0020] In the above technical solution, when the number of image acquisition camera systems is one, the measurement method of the projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces is performed according to the following steps: Step S1, calibrating the imaging parameters of the image acquisition camera system, calibrating the geometric relationship between the image acquisition camera system and the projection system, and calibrating the projection parameters of the projection system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3, calculating and generating the shape of the surface to be measured based on the imaging parameters of the image acquisition camera system, the geometric relationship between the image acquisition camera system and the projection system, the projection parameters of the calibrated projection system, and the pattern information of the surface to be measured acquired by the image acquisition camera system.

[0021] In the above technical solution, when the number of image acquisition camera systems is two, the measurement method of the projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces is performed according to the following steps: Step S1, calibrating imaging parameters of the first image acquisition camera system and the second image acquisition camera system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the first image acquisition camera system and the second image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3 , calculating and generating the shape of the surface to be measured based on the imaging parameters of the first image acquisition camera system and the second image acquisition camera system and the pattern information reflected by the surface to be measured acquired by the first image acquisition camera system and the second image acquisition camera system.

[0022] Furthermore, when the number of image acquisition camera systems is 2, the control computer control system projects a set of phase-shifted fringes on the projection system, and obtains the light incident on the first image acquisition camera system by diffuse reflection of point Si on the surface to be measured through the corresponding time phase unwrapping algorithm. and the light from the second image acquisition camera system , where i is the number of characteristic points of the sinusoidal phase-shifted coding pattern projected by the projection system; the incident light and The best approximate intersection point of is taken as point Si on the surface to be measured, and all projected coding pattern feature points are traversed to obtain a point set S={S1,S2,...,SN} on the surface to be measured, which is used to characterize the surface shape distribution of the surface to be measured.

[0023] The advantages and beneficial effects of the present invention are: The projection measurement device and method of the present invention introduces a short-focus off-axis projection system into the traditional fringe projection measurement system, so that the projection depth of the projection system completely covers the complex surface to be measured. At the same time, through the off-axis projection method, the mirror reflection light formed by the mirror reflection area of the surface to be measured will not enter the field of view of the image acquisition camera system as much as possible, while the diffuse reflection light of the surface to be measured will fully enter the field of view of the image acquisition camera system, thereby effectively avoiding overexposure and improving the measurement stability and accuracy of the system under complex surface conditions containing mirrors, diffuse reflections or both. Furthermore, because the off-axis projection system adopted by the present invention has a compact optical path design, compared with Figure 1 The existing measurement device based on the non-short-throw and non-off-axis projection system shown in the figure significantly reduces the space occupied by the entire system, thereby improving the integration and flexibility of the measurement system. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a schematic diagram of fringe projection measurement based on a traditional non-short-focus and non-off-axis projection system; Figure 2 This is a schematic structural diagram of the projection measurement device provided in Example 1 of the present application; Figure 3 This is a schematic structural diagram of a projection measurement device provided in Example 2 of the present application; Figure 4 This is a schematic diagram of the surface shape measurement results of a HUD lens in Example 2 of the present application.

[0025] For ordinary technicians in this field, other relevant drawings can be obtained based on the above drawings without any creative work. DETAILED DESCRIPTION

[0026] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the technical solutions of the present invention are further described below with reference to specific embodiments.

[0027] Example 1 See attached Figure 2 This embodiment provides a projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces. The device includes a projection system, an image acquisition camera system, and a computer control system.

[0028] The projection system is used to project the coded pattern information onto the surface to be measured. In the present invention, the projection system adopts an off-axis projection system. The off-axis projection system specifically means that the projection area of the projection system (i.e., the irradiation area of the outgoing light of the projection system) is offset from the central axis of the projection system itself. Figure 2 , exemplarily, the projection area of the projection system is located above the central axis of the projection system itself; and the clearest imaging plane of the projection depth of field of the projection system is perpendicular to the central axis of the projection system itself; in addition, preferably, the projection system can be a short-throw projection system or an ultra-short-throw projection system, the short-throw projection system refers to a projection system with a projection ratio greater than or equal to 0.6 and less than 1.0, and the ultra-short-throw projection system refers to a projection system with a projection ratio less than 0.6; the projection system can also be a Scheimpflug-based projection system.

[0029] The off-axis projection system used in the present invention can make the projection depth of the projection system completely cover the complex surface to be measured. At the same time, through the off-axis projection method, the mirror reflection light formed by the mirror reflection area of the surface to be measured will not enter the field of view of the image acquisition camera system as much as possible, while the diffuse reflection light of the surface to be measured will fully enter the field of view of the image acquisition camera system, thereby effectively avoiding overexposure. Furthermore, because the off-axis projection system used in the present invention has a compact optical path design, compared with Figure 1 The existing measurement device based on the non-short-throw and non-off-axis projection system shown in the figure significantly reduces the space occupied by the entire system, thereby improving the integration and flexibility of the measurement system.

[0030] The image acquisition camera system is located on the side of the projection system and is used to collect pattern information projected by the projection system and reflected by the surface to be measured. Preferably, the image acquisition camera system consists of an industrial camera and an 8 mm focal length industrial lens.

[0031] The computer control system is connected to the projection system and the image acquisition camera system respectively through data links, and is used to control the operation of the projection system and the image acquisition camera system, obtain pattern information of the surface to be measured collected by the image acquisition camera system, and calculate and generate the surface shape of the surface to be measured based on the collected pattern information of the surface to be measured.

[0032] Specifically, the measurement method of the projection measurement device provided in this embodiment, which is applicable to the three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces, is performed according to the following steps: Step S1, calibrating the imaging parameters of the image acquisition camera system, calibrating the geometric relationship between the image acquisition camera system and the projection system, and calibrating the projection parameters of the projection system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3, calculating and generating the shape of the surface to be measured based on the imaging parameters of the image acquisition camera system, the geometric relationship between the image acquisition camera system and the projection system, the projection parameters of the calibrated projection system, and the pattern information of the surface to be measured acquired by the image acquisition camera system.

[0033] Example 2 On the basis of the first embodiment, the number of image acquisition camera systems in the projection measurement device can be multiple. This embodiment takes two as an example. Figure 3 , specific instructions.

[0034] This embodiment provides a projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces. The device includes a projection system 3, a first image acquisition camera system 1, a second image acquisition camera system 2, and a computer control system 4.

[0035] The projection system 3 is used to project the coded pattern information onto the surface to be measured. The projection system adopts an off-axis projection system. The off-axis projection system specifically means that the projection area of the projection system (i.e., the irradiation area of the outgoing light of the projection system) is offset from the central axis of the projection system itself. Figure 3 Exemplarily, the projection area of the projection system is located above the central axis of the projection system itself; and the clearest imaging plane of the projection depth of field of the projection system is perpendicular to the central axis of the projection system itself; in addition, preferably, the projection ratio of the projection system is 0.15-0.25, and more preferably, the projection ratio is 0.18.

[0036] The first image acquisition camera system 1 and the second image acquisition camera system 2 are arranged side by side, located to the side of the projection system 3, and are used to capture pattern information projected by the projection system and reflected by the surface to be measured. Preferably, the first image acquisition camera system 1 and the second image acquisition camera system 2 are both composed of industrial cameras and 8 mm focal length industrial lenses.

[0037] The computer control system 4 is connected to the projection system 3 and the first image acquisition camera system 1 and the second image acquisition camera system 2 through data links respectively, and is used to control the operation of the projection system and the first image acquisition camera system 1 and the second image acquisition camera system 2, obtain the pattern information reflected by the surface to be measured captured by the first image acquisition camera system 1 and the second image acquisition camera system 2, and calculate and generate the surface shape of the surface to be measured based on the pattern information reflected by the surface to be measured captured by the first image acquisition camera system 1 and the second image acquisition camera system 2.

[0038] The measurement method of the projection measurement device provided in this embodiment, which is applicable to three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces, is performed according to the following steps: Step S1, calibrating imaging parameters of the first image acquisition camera system and the second image acquisition camera system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the first image acquisition camera system and the second image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3 , calculating and generating the shape of the surface to be measured based on the imaging parameters of the first image acquisition camera system and the second image acquisition camera system and the pattern information reflected by the surface to be measured acquired by the first image acquisition camera system and the second image acquisition camera system.

[0039] Furthermore, the imaging parameters of the first image acquisition camera system 1 and the second image acquisition camera system 2 are calibrated using the existing Zhang calibration method, thereby obtaining the incident light of the first image acquisition camera system 1. , the incident light of the second image acquisition camera system 2 The relative position relationship of . The range of i is the number of characteristic points (pixel points) of the sinusoidal phase-shifted coding pattern projected by the projection system 3.

[0040] Furthermore, the prior art "Huntley JM, Saldner H. Temporal phase-unwrapping algorithm for automated interferogram analysis[J]. Applied Optics,1993, 32(17): 3047-3052." is used to control the computer control system 4 to project a set of phase-shifted fringes on the projection system 3, and obtain the light diffusely reflected by a certain point Si of the surface to be measured (in this embodiment, the surface to be measured is the head-up display HUD reflective lens 5) and incident on the first image acquisition camera system 1 through the corresponding temporal phase unwrapping algorithm. and the light of the second image acquisition camera system 2 .

[0041] Furthermore, due to the calibration residual and measurement noise, the incident light and The best approximate intersection point of two lines is used as the surface point Si on the surface to be measured. The best approximate intersection point of two lines in space can be solved by using the existing algorithm "Malik AS, Choi T S. Finding best focused points using intersection of two lines[C] / / 2008 15th IEEE International Conference on Image Processing. IEEE, 2008:1952-1955."

[0042] Furthermore, all projected coding pattern feature points are traversed to obtain a point set S={S1, S2, ..., SN} on the head-up display HUD reflective lens 5 to be tested, which is used to characterize the surface shape distribution of the head-up display HUD reflective lens 5 to be tested. Figure 4 This is the surface error measurement result of the head-up display HUD reflective lens 5 to be tested.

[0043] For ease of explanation, spatial relative terms such as "upper", "lower", "left", and "right" are used in the embodiments to illustrate the relationship between one element or feature shown in the figures and another element or feature. It should be understood that, in addition to the orientation shown in the figures, spatial terms are intended to include different orientations of the device in use or operation. For example, if the device in the figure is inverted, the element described as being "under" other elements or features will be positioned "above" other elements or features. Therefore, the exemplary term "under" can include both upper and lower orientations. The device can be positioned in other ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used here can be interpreted accordingly.

[0044] Moreover, relational terms such as “first” and “second” are merely used to distinguish one component from another having the same name, but do not necessarily require or imply any actual relationship or order between these components.

[0045] The above is an exemplary description of the present invention. It should be noted that, without departing from the core of the present invention, any simple deformation, modification or other equivalent replacement that can be made by other skilled in the art without expending creative labor falls within the scope of protection of the present invention.

Claims

1. A projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces, characterized by: The device includes a projection system, an image acquisition camera system and a computer control system; The projection system is used to project the coded pattern information onto the surface to be measured. The projection system adopts an off-axis projection system. The off-axis projection system means that the projection area of the projection system is offset from the central axis of the projection system itself, and the clearest imaging plane of the projection depth of the projection system is perpendicular to the central axis of the projection system itself; The image acquisition camera system is located on the side of the projection system and is used to acquire pattern information projected by the projection system and reflected by the surface to be measured; The computer control system is connected to the projection system and the image acquisition camera system respectively through data links, and is used to control the operation of the projection system and the image acquisition camera system, obtain pattern information of the surface to be measured collected by the image acquisition camera system, and calculate and generate the surface shape of the surface to be measured based on the collected pattern information of the surface to be measured.

2. The projection measurement device for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The off-axis projection system is a short-throw projection system or an ultra-short-throw projection system. The short-throw projection system refers to a projection system with a projection ratio greater than or equal to 0.6 and less than 1.0, and the ultra-short-throw projection system refers to a projection system with a projection ratio less than 0.

6.

3. The projection measurement device for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The off-axis projection system is based on the Scheimpflug projection system.

4. The projection measurement device for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The projection technology used by the projection system is CRT projection, LCD projection, DLP projection or LCOS projection.

5. The projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The coded pattern information projected by the projection system includes: Gray code, phase-shifted sinusoidal grating pattern, binary fringe coding, color fringe coding, phase coding plus Gray code mixture, single-frame composite coding, temporal coding or spatial coding.

6. The projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The pattern information reflected by the surface to be measured is collected by the image acquisition camera system, and a decoding algorithm is used to obtain a mapping relationship between the pattern information reflected by the surface to be measured and the coded pattern information projected by the projection system; the decoding algorithm includes a Gray code decoding algorithm, a phase shift algorithm and a phase unwrapping algorithm, a color channel separation and decoding algorithm, or a Fourier phase unwrapping algorithm.

7. The projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: The number of the image acquisition camera system is one or more.

8. The projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: There are two image acquisition camera systems, which are arranged side by side and located on the side of the projection system.

9. The measurement method of the projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: When the number of image acquisition camera systems is one, the measurement method is performed as follows: Step S1, calibrating the imaging parameters of the image acquisition camera system, calibrating the geometric relationship between the image acquisition camera system and the projection system, and calibrating the projection parameters of the projection system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3, calculating and generating the shape of the surface to be measured based on the imaging parameters of the image acquisition camera system, the geometric relationship between the image acquisition camera system and the projection system, the projection parameters of the calibrated projection system, and the pattern information of the surface to be measured acquired by the image acquisition camera system.

10. The measurement method of the projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 1, characterized in that: When there are two image acquisition camera systems, the measurement method is performed as follows: Step S1, calibrating imaging parameters of the first image acquisition camera system and the second image acquisition camera system; Step S2, controlling the projection system to project coded pattern information onto the surface to be measured, and controlling the first image acquisition camera system and the second image acquisition camera system to acquire pattern information reflected by the surface to be measured; Step S3 , calculating and generating the shape of the surface to be measured based on the imaging parameters of the first image acquisition camera system and the second image acquisition camera system and the pattern information reflected by the surface to be measured acquired by the first image acquisition camera system and the second image acquisition camera system.

11. The measurement method of the projection measurement device suitable for three-dimensional reconstruction of mirror surfaces and diffuse reflection surfaces according to claim 10, characterized in that: The computer control system projects a set of phase-shifted fringes on the projection system, and obtains the light incident on the first image acquisition camera system through diffuse reflection of point Si on the surface to be measured through the corresponding time phase unwrapping algorithm. and the light from the second image acquisition camera system , where i is the number of characteristic points of the sinusoidal phase-shifted coding pattern projected by the projection system; the incident light and The best approximate intersection point of is taken as point Si on the surface to be measured, and all projected coding pattern feature points are traversed to obtain a point set S={S1,S2,...,SN} on the surface to be measured, which is used to characterize the surface shape distribution of the surface to be measured.

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