Adjustable test probe structure

Abstract

An adjustable test probe structure disclosed by the present invention comprises a probe fixing seat and a probe assembly, the probe fixing seat is internally provided with a probe mounting hole, the probe assembly comprises a probe seat, a movable probe and an elastic member, the probe seat is fixedly inserted in the probe mounting hole of the probe fixing seat, and the movable probe is fixedly inserted in the probe mounting hole of the probe fixing seat. One end of the probe seat can be connected and conducted with a communication line, one end of the movable probe can be inserted into the probe seat in a sliding mode by a set distance, the movable probe is kept conducted with the probe seat, and the other end of the movable probe extends out of the outer side of the other end of the probe seat to form a test contact end. The elastic piece is installed on the probe seat and provides elastic holding force towards the direction of the other end of the probe seat for the movable probe. The signal transmission device can be suitable for signal transmission data of conductors in various tested products, trepanning of the conductors is avoided, the signal transmission stability of the tested products is guaranteed, and the accuracy of test data is guaranteed.

Description

Technical Field

[0001] The present invention relates to a test probe, in particular to an adjustable test probe structure. Background Art

[0002] During the production process of many electronic products, signal detection is required on conductors embedded in plastic casings. Currently, the method for testing conductors in such electronic products is as follows: a communication line is drawn from the testing equipment, and a probe with a pointed tip is installed at the end of the communication line. Test openings are designed in both the plastic casing and the conductor of the product to be tested. The probe tip is then inserted through the opening in the plastic casing into the opening in the conductor, with the side wall of the probe tip in close contact with the inner surface of the conductor opening to achieve conduction. This type of test can weaken the conductor strength of the product to be tested, affecting signal transmission within the product to be tested. Summary of the Invention

[0003] In order to overcome the above-mentioned defects, the present invention provides an adjustable test probe structure. When the adjustable test probe structure performs signal detection on a product to be tested, it is not necessary to open a hole on the conductor, thereby ensuring the signal transmission stability of the electronic product.

[0004] The present invention adopts the following technical solution to solve its technical problems: an adjustable test probe structure, including a probe fixing seat and a probe assembly, a probe mounting hole is provided in the probe fixing seat, and the probe assembly includes a probe seat, a movable probe and an elastic member, the probe seat is fixedly inserted in the probe mounting hole of the probe fixing seat, one end of the probe seat can be connected to the communication line, one end of the movable probe can be slid a set distance and inserted in the probe seat, and the movable probe maintains conduction with the probe seat, and the other end of the movable probe extends outward from the other end of the probe seat to form a test contact end, and the elastic member is installed on the probe seat and provides the movable probe with an elastic retaining force toward the other end of the probe seat.

[0005] As a further improvement of the present invention, one end of the probe fixing seat forms a gripping operating end, and the other end of the probe fixing seat is provided with a mushroom head coaxial with the probe mounting hole, and the mushroom head can be tightly inserted into the needle insertion hole on the plastic shell of the product to be tested.

[0006] As a further improvement of the present invention, the probe seat is a tubular structure, a fixed probe is fixedly inserted in one end of the probe seat, the elastic part is a spring, the spring is inserted in the probe seat, and the two ends of the spring are elastically retractable and respectively press against the fixed probe and one end face of the movable probe.

[0007] As a further improvement of the present invention, a guide socket is formed in the fixed probe, a guide column with a reduced diameter is formed at one end of the movable probe, and an extended section with a reduced diameter is formed at the other end of the movable probe. The middle section of the movable probe can be in sliding contact with the inner wall of the probe seat, and the spring sleeve is arranged on the outside of the guide column of the movable probe, and the guide column of the movable probe can be slidably inserted into the guide socket of the fixed probe. The spring clamp is arranged between the end face of the fixed probe facing the movable probe and the end surface of the middle section of the movable probe. An inward convex stop ring is formed on the inner side surface of the probe seat, or the probe mounting hole is a T-shaped hole with an inner diameter at one end larger than the inner diameter of the other end. The probe seat is fixedly inserted into the end with a larger diameter of the probe mounting hole, and the other surface of the middle section of the movable probe is stopped on the inward convex stop ring or the step surface between the two ends of the probe mounting hole.

[0008] As a further improvement of the present invention, a probe contact with an outwardly expanded diameter is formed at the other end of the movable probe.

[0009] As a further improvement of the present invention, the communication line is directly connected to one end of the probe seat, and the communication line extends to the outside of the probe fixing seat through one end of the probe mounting hole to be connected to the test equipment.

[0010] As a further improvement of the present invention, a wiring cavity is further formed in the probe fixing seat, and a wire entry hole connected to the wiring cavity is further provided on the side wall of the probe fixing seat. One end of the probe seat extends into the wiring cavity, and a conductive plate is also fixedly installed in the wiring cavity. An elastic clip is also provided in the wiring cavity, and one end of the elastic clip is fixedly installed in the wiring cavity, and the other end of the elastic clip can elastically clamp the communication line entering through the wire entry hole with the conductive plate, thereby realizing conduction between the conductive plate and the communication line, and one end of the probe seat is connected and conducted to at least one of the conductive plate and the elastic clip.

[0011] As a further improvement of the present invention, a wiring operation handle is installed on the probe fixing seat so as to be able to move within a certain range. One end of the wiring operation handle extends into the wiring cavity and is connected to the other end of the elastic clip. The other end of the wiring operation handle is exposed on the surface of the probe fixing seat to form an operating end. Pressing the operating end of the wiring operation handle can drive the other end of the elastic clip to move so that it overcomes its own elastic force and moves away from the conductive plate to release the communication line.

[0012] As a further improvement of the present invention, the operating end of the wiring operating handle is connected to the outer side surface of the probe fixing seat through an elastically deformable connecting piece. The connecting piece provides the wiring operating handle with an elastic reset force to keep the other end of the elastic clip clamping the communication line. Pressing the operating end of the wiring operating handle can simultaneously drive the connecting piece and the elastic clip to deform.

[0013] As a further improvement of the present invention, the conductive plate is an L-shaped structure, and the outer side surface of the conductive plate is fixedly positioned in close contact with the inner wall of the wiring cavity. The inner side surface of one side wall of the L-shaped structure of the conductive plate forms a conductive contact surface, and the other side wall of the L-shaped structure of the conductive plate forms a two-branch structure with an opening in the middle. Concave arc surfaces are also formed on the opposite side walls of the two branch structures. One end of the probe seat can be tightly clamped between the concave arc surfaces of the two branch structures on the other side wall of the L-shaped structure of the conductive plate. A support plate parallel to the other side wall of the L-shaped structure of the conductive plate is formed on one side wall of the L-shaped structure of the conductive plate by bending. One end of the elastic clip is the fixed end of the U-shaped structure, and the other end of the elastic clip is The U-shaped structure at one end of the elastic clip is fixed in place by the outer surface of the U-shaped structure and the outer surface of the U-shaped structure at one end of the elastic clip is fixed in place.

[0014] The beneficial effects of the present invention are: the present invention designs the test probe into a structure that can be elastically extended and retracted. When performing signal detection on the product to be tested, the movable probe only needs to be inserted into the opening of the plastic shell of the product to be tested. The movable probe is in close contact with the conductor surface in the plastic shell of the product to be tested to achieve electrical conduction. This structure can be applicable to signal transmission data of conductors in various products to be tested, avoids opening holes in the conductor, and ensures the signal transmission stability of the product to be tested. The present invention also provides a mushroom head on the probe fixing seat. During detection, the mushroom head on the probe fixing seat is inserted into the opening of the plastic shell of the product to be tested to achieve fixed positioning of the probe fixing seat and the plastic shell of the product to be tested, ensuring that the movable probe is in stable and close contact with the conductor surface in the plastic shell of the product to be tested during testing, thereby ensuring accurate test data. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a three-dimensional diagram of the first structure of the present invention;

[0016] Figure 2 This is a front view of the first structure of the present invention;

[0017] Figure 3 for Figure 2 Middle AA section view;

[0018] Figure 4 This is a top view of the first structure of the present invention;

[0019] Figure 5This is a state diagram before detection using the probe of the first structure of the present invention;

[0020] Figure 6 This is a state diagram when the probe of the first structure of the present invention is used for detection;

[0021] Figure 7 This is a perspective view of the second structure of the present invention;

[0022] Figure 8 This is a front view of the second structure of the present invention;

[0023] Figure 9 for Figure 8 Middle BB section view;

[0024] Figure 10 A top view of the second structure of the present invention;

[0025] Figure 11 This is a state diagram before detection using the probe of the second structure of the present invention;

[0026] Figure 12 This is a state diagram when the probe of the second structure of the present invention is used for detection;

[0027] Figure 13 A three-dimensional image of the product being tested;

[0028] Figure 14 The main view of the product being tested;

[0029] Figure 15 for Figure 14 Middle CC section view;

[0030] Figure 16 A top view of the product being tested;

[0031] Figure 17 A perspective view of a first probe holder of the present invention;

[0032] Figure 18 A perspective view of a probe base of a first probe assembly of the present invention;

[0033] Figure 19 A three-dimensional diagram of the elastic retractable probe in the first probe assembly of the present invention;

[0034] Figure 20 A perspective view of a second probe holder of the present invention;

[0035] Figure 21 This is a front view of a second probe holder of the present invention;

[0036] Figure 22A perspective view of a wiring operation handle on a second probe fixing base of the present invention;

[0037] Figure 23 This is a front view of the wiring operation handle on the second probe fixing base of the present invention;

[0038] Figure 24 A three-dimensional diagram of an elastic clip in a second probe fixing seat of the present invention;

[0039] Figure 25 A perspective view of a conductive plate in a second probe holder of the present invention;

[0040] Figure 26 This is a three-dimensional diagram of a second probe assembly of the present invention. DETAILED DESCRIPTION

[0041] Embodiment: An adjustable test probe structure includes a probe fixing seat 1 and a probe assembly, wherein the probe fixing seat 1 is provided with a probe mounting hole 2, and the probe assembly includes a probe seat 3, a movable probe 4 and an elastic member, the probe seat 3 is fixedly inserted in the probe mounting hole 2 of the probe fixing seat 1, one end of the probe seat 3 can be connected to the communication line 5, one end of the movable probe 4 can be slid a set distance and inserted in the probe seat 3, and the movable probe 4 maintains conduction with the probe seat 3, and the other end of the movable probe 4 extends outward from the other end of the probe seat 3 to form a test contact end, and the elastic member is installed on the probe seat 3 and provides the movable probe 4 with an elastic retaining force toward the other end of the probe seat 3.

[0042] During the test, after the movable probe 4 is inserted into the pin insertion hole 8 of the plastic shell of the product under test, the test contact end of the movable probe 4 is tightly attached to the conductor surface inside the plastic shell of the product under test, forming a conductive loop, thereby realizing the test of the signal transmission data of the product under test, wherein the end face of the test contact end of the movable probe 4 is optimally formed into a convex spherical test contact surface.

[0043] One end of the probe holder 1 forms a gripping end, while the other end is provided with a mushroom head 6 coaxial with the probe mounting hole 2. This mushroom head 6 can be snugly inserted into a needle insertion hole 8 on the plastic housing of the product under test 7. During testing, the mushroom head 6 of the test probe structure is inserted into the needle insertion hole 8 on the plastic housing of the product under test, effectively positioning the product under test and the probe holder 1, ensuring stable contact between the movable probe 4 and the conductor inside the product under test during testing.

[0044] The probe base 3 is a tubular structure, with a fixed probe 9 fixedly inserted into one end of the probe base 3. A spring 10 is an elastic member inserted into the probe base 3. The spring 10's elastic ends respectively press against the fixed probe 9 and one end of the movable probe 4. The spring 10 provides elastic force to the movable probe 4, creating contact pressure between the movable probe 4 and the surface of the product being tested.

[0045] A guide socket is formed in the fixed probe 9, a guide column 11 with a reduced diameter is formed at one end of the movable probe 4, and an extended section 12 with a reduced diameter is formed at the other end of the movable probe 4. The middle section 13 of the movable probe can be in sliding contact and conduction with the inner wall of the probe seat 3, and the spring 10 is sleeved on the outside of the guide column 11 of the movable probe 4, and the guide column 11 of the movable probe 4 can be slidably inserted into the guide socket of the fixed probe 9, and the spring 10 is clamped between the end face of the fixed probe 9 facing the movable probe 4 and one end surface of the middle section 13 of the movable probe. An inward convex stop ring is formed on the inner side surface of the probe seat 3, or the probe mounting hole 2 is a T-shaped hole with an inner diameter at one end larger than the inner diameter of the other end. The probe seat 3 is fixedly inserted into the end with a larger diameter of the probe mounting hole 2, and the other surface of the middle section 13 of the movable probe is stopped on the inward convex stop ring or the step surface between the two ends of the probe mounting hole 2.

[0046] The guide column 11 at one end of the movable probe 4 slides in the guide socket of the fixed probe 9 to realize the telescopic guidance of the movable probe 4. At the same time, one end of the movable probe 4 is in contact with the fixed probe 9 and is connected, and the middle of the movable probe 4 is in contact with the probe seat 3 and is connected. At the same time, the movable probe 4 is also connected with the fixed probe 9 through the spring 10. This structure ensures the stable conduction between the movable probe 4 and the probe seat 3, and ensures that the detection signal transmission is stable and continuous.

[0047] The other end of the movable probe 4 is formed with a probe contact 14 with an expanded diameter. The probe contact 14 is used to contact the conductor of the tested product. At the same time, the probe contact head can also be blocked outside the probe fixing base 1 to prevent the movable probe 4 from being compressed and shrinking and seriously damaging the spring 10.

[0048] The communication line 5 is directly connected to one end of the probe base 3 , and extends through one end of the probe mounting hole 2 to the outside of the probe fixing base 1 to connect with the test equipment.

[0049] A wiring cavity 15 is also formed in the probe fixing seat 1, and an inlet hole 16 connected to the wiring cavity 15 is also provided on the side wall of the probe fixing seat 1. One end of the probe seat 3 extends into the wiring cavity 15, and a conductive plate 17 is also fixedly installed in the wiring cavity 15. An elastic clip 18 is also provided in the wiring cavity 15. One end of the elastic clip 18 is fixedly installed in the wiring cavity 15, and the other end of the elastic clip 18 can elastically clamp the communication line 5 entering through the inlet hole 16 with the conductive plate 17, thereby achieving conduction between the conductive plate 17 and the communication line 5. One end of the probe seat 3 is connected to at least one of the conductive plate 17 and the elastic clip 18. This structure electrically connects the probe seat 3 to the conductive plate 17 or the elastic clip 18 in the wiring cavity 15. After the wire of the communication line 5 enters through the wire entry hole 16, it is clamped between the conductive plate 17 and the elastic clip 18 to achieve conduction with the probe seat 3. This structure allows the entire test probe to be connected to different test equipment for line testing, thereby realizing sharing of various test equipment.

[0050] The probe holder 1 is also provided with a wiring operation handle 19 that can move within a certain range. One end of the wiring operation handle 19 extends into the wiring cavity 15 and is connected to the other end of the elastic clip 18. The other end of the wiring operation handle 19 is exposed on the surface of the probe holder 1 to form an operation end. Pressing the operation end of the wiring operation handle 19 can drive the other end of the elastic clip 18 to move away from the conductive plate 17, overcoming its own elastic force and releasing the communication line 5. By pressing the wiring operation handle 19, the elastic clip 18 is moved to clamp, withdraw, and advance the line. One end of the wiring operation handle 19 can be provided with a slot or a socket, and a protrusion is provided on the side wall of the other end of the elastic clip 18. The protrusion is inserted into the slot or socket at one end of the wiring operation handle 19. The operation handle can be rotatably or slidably mounted on the probe holder 1. Pressing the operation handle to rotate or slide it drives the other end of the elastic clip 18 to swing.

[0051] The operating end of the wiring operating handle 19 is connected to the outer side surface of the probe fixing seat 1 through an elastically deformable connecting piece 20. The connecting piece 20 provides the wiring operating handle 19 with an elastic reset force to keep the other end of the elastic clip 18 clamping the communication line 5. Pressing the operating end of the wiring operating handle 19 can simultaneously drive the connecting piece 20 and the elastic clip 18 to deform.

[0052] The wiring operation handle 19 is connected to the probe fixing seat 1 by a connecting piece 20 that can be highly elastically deformed, which can prevent the wiring handle from falling off. At the same time, it also provides the wiring operation handle 19 with a reset elastic force, so that it can be quickly reset after the external force is lost, reducing the burden on the elastic clip 18. In addition, a limiting structure can also be set on the probe fixing seat 1 to limit the movement range of the operation handle to prevent the wiring operation handle 19 from falling off. These are equivalent replacement structures that can be easily thought of by technical personnel in this field based on this patent, and fall within the scope of protection of this patent.

[0053] The conductive plate 17 is an L-shaped structure, and the outer side surface of the conductive plate 17 is fixedly positioned close to the inner wall of the wiring cavity 15. The inner side surface of one side wall of the L-shaped structure of the conductive plate 17 forms a conductive contact surface 21, and the other side wall of the L-shaped structure of the conductive plate 17 forms a two-branch structure 22 with a middle opening. The two branch structures 22 are also respectively formed with concave arc surfaces 23 on the opposite side walls. One end of the probe seat 3 can be tightly clamped between the concave arc surfaces 23 of the two branch structures 22 on the other side wall of the L-shaped structure of the conductive plate 17. A support plate 24 parallel to the other side wall of the L-shaped structure of the conductive plate 17 is also formed on one side wall of the L-shaped structure of the conductive plate 17 by bending. One end of the elastic clip 18 is the fixed end of the U-shaped structure, and the other end of the elastic clip 18 is a fixed end from the U-shaped structure. A cantilever structure is formed by arc bending on one side wall, and an avoidance hollow structure 25 is formed on the bottom surface of the U-shaped structure at one end of the elastic clip 18. One side wall of the L-shaped structure of the conductive plate 17 can extend into the inner side of the U-shaped structure of the elastic clip 18 through the avoidance hollow structure 25, and the bottom surface of the U-shaped structure at one end of the elastic clip 18 is stopped on the upper side of the support plate 24 on the one side wall of the L-shaped structure of the conductive plate 17. The root of one side wall of the U-shaped structure at one end of the elastic clip 18 extends toward the outside of the U-shaped structure to form a plug-in piece 26, and the plug-in piece 26 can be inserted into the plug-in slot in the wiring cavity 15 for positioning. The end parts and outer surfaces of the two side walls of the U-shaped structure at one end of the elastic clip 18 are tightly attached to the inner side of the wiring cavity 15 and are fixed in position.

[0054] After the probe seat 3 is inserted into the wiring cavity 15, it is inserted into the clamping space formed by the concave arc surface 23 of the two-branch structure 22 on the other side wall of the conductive plate 17, and is clamped between the two-branch structure 22 on the other side wall of the conductive plate 17, forming a fixed connection and conduction with the conductive plate 17. This structure can adjust the length of the probe seat 3 extending outward from the probe fixing seat 1 as needed to meet different test space requirements.

Claims

1. An adjustable test probe structure, comprising a probe holder (1) and a probe assembly, wherein the probe holder is provided with a probe mounting hole (2), characterized in that: The probe assembly comprises a probe seat (3), a movable probe (4) and an elastic member, wherein the probe seat is fixedly inserted into the probe mounting hole of the probe fixing seat, one end of the probe seat can be connected to the communication line (5) for conduction, one end of the movable probe can be slidably inserted into the probe seat at a set distance, and the movable probe and the probe seat maintain conduction, and the other end of the movable probe extends outward from the other end of the probe seat to form a test contact end, and the elastic member is installed on the probe seat and provides the movable probe with an elastic retaining force toward the other end of the probe seat.

2. The adjustable test probe structure according to claim 1, characterized in that: One end of the probe fixing seat forms a gripping operation end, and the other end of the probe fixing seat is provided with a mushroom head (6) coaxial with the probe mounting hole, and the mushroom head can be tightly inserted into the needle insertion hole (8) on the plastic shell of the product to be tested (7).

3. The adjustable test probe structure according to claim 1, wherein: The probe seat is a tubular structure, and a fixed probe (9) is fixedly inserted in one end of the probe seat. The elastic member is a spring (10), and the spring is inserted in the probe seat. The elastically retractable two ends of the spring respectively press against the fixed probe and one end surface of the movable probe.

4. The adjustable test probe structure according to claim 3, characterized in that: A guide socket is formed in the fixed probe, a guide column (11) with a reduced diameter is formed at one end of the movable probe, and a protruding section (12) with a reduced diameter is formed at the other end of the movable probe. The middle section (13) of the movable probe can be in sliding contact with the inner wall of the probe seat, and the spring is sleeved on the outside of the guide column of the movable probe. The guide column of the movable probe can be slidably inserted into the guide socket of the fixed probe. The spring clip is arranged between the end face of the fixed probe facing the movable probe and the end surface of the middle section of the movable probe. An inner convex stop ring is formed on the inner side surface of the probe seat, or the probe mounting hole is a T-shaped hole with an inner diameter at one end larger than the inner diameter at the other end. The probe seat is fixedly inserted into the end with a larger diameter of the probe mounting hole, and the other surface of the middle section of the movable probe is stopped on the inner convex stop ring or the step surface between the two ends of the probe mounting hole.

5. The adjustable test probe structure according to claim 1, wherein: The end portion of the other end of the movable probe is formed with a probe contact (14) with an expanded diameter.

6. The adjustable test probe structure according to claim 1, wherein: The communication line is directly connected to one end of the probe seat, and extends out of the probe fixing seat through one end of the probe mounting hole to connect with the test equipment.

7. The adjustable test probe structure according to claim 1, wherein: A wiring cavity (15) is also formed in the probe fixing seat, and a wire entry hole (16) communicating with the wiring cavity is also provided on the side wall of the probe fixing seat. One end of the probe seat extends into the wiring cavity, and a conductive plate (17) is also fixedly installed in the wiring cavity. An elastic clip (18) is also provided in the wiring cavity, and one end of the elastic clip is fixedly installed in the wiring cavity, and the other end of the elastic clip can elastically clamp the communication line entering through the wire entry hole with the conductive plate, thereby realizing conduction between the conductive plate and the communication line, and one end of the probe seat is connected and conducted with at least one of the conductive plate and the elastic clip.

8. The adjustable test probe structure according to claim 7, characterized in that: The probe fixing seat is also provided with a wiring operation handle (19) which can move within a certain range. One end of the wiring operation handle extends into the wiring cavity and is connected to the other end of the elastic clip. The other end of the wiring operation handle is exposed on the surface of the probe fixing seat to form an operation end. Pressing the operation end of the wiring operation handle can drive the other end of the elastic clip to move so that it overcomes its own elastic force and moves away from the conductive plate to release the communication line.

9. The adjustable test probe structure according to claim 8, characterized in that: The operating end of the wiring operating handle is connected to the outer side of the probe fixing seat through an elastically deformable connecting piece (20), and the connecting piece provides the wiring operating handle with an elastic reset force to keep the other end of the elastic clip clamping the communication line. Pressing the operating end of the wiring operating handle can simultaneously drive the connecting piece and the elastic clip to deform.

10. The adjustable test probe structure according to claim 7, wherein: The conductive plate is an L-shaped structure, and the outer side surface of the conductive plate is fixedly positioned against the inner side wall of the wiring cavity. The inner side surface of one side wall of the conductive plate L-shaped structure forms a conductive contact surface (21), and the other side wall of the conductive plate L-shaped structure forms a two-branch structure (22) with a middle opening. Concave arc surfaces (23) are also formed on the opposite side walls of the two branch structures. One end of the probe seat can be tightly clamped between the concave arc surfaces of the two branch structures on the other side wall of the conductive plate L-shaped structure. A support plate (24) parallel to the other side wall of the conductive plate L-shaped structure is also formed on one side wall of the conductive plate L-shaped structure by bending. One end of the elastic clip is the fixed end of the U-shaped structure, and the other end of the elastic clip is a fixed end extending from the U-shaped structure. A cantilever structure is formed on one side wall by arc bending, and an avoidance hollow structure (25) is formed on the bottom surface of the U-shaped structure at one end of the elastic clip. One side wall of the L-shaped structure of the conductive plate can extend into the inner side of the U-shaped structure of the elastic clip through the avoidance hollow structure, and the bottom surface of the U-shaped structure at one end of the elastic clip is stopped on the upper side of the support plate on one side wall of the L-shaped structure of the conductive plate. The root of one side wall of the U-shaped structure at one end of the elastic clip extends toward the outside of the U-shaped structure to form a plug-in piece (26), and the plug-in piece can be inserted into the plug-in slot in the wiring cavity for positioning. The end portions and outer surfaces of the two side walls of the U-shaped structure at one end of the elastic clip are tightly attached to the inner side of the wiring cavity and are fixed in position.

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