A probe sediment thickness measurement system and equipment based on electro-variable slope correction

Abstract

This invention belongs to the field of probe test data processing, and provides a probe sediment thickness measurement system and equipment based on electro-variable slope correction. During probe extension, current and displacement are simultaneously collected within a sliding time window. The current is normalized according to the baseline to obtain the current propulsion distribution, and then compared point-by-point with the displacement normalization sequence to obtain the electro-variable entropy gradient. The information difference between the current slope distribution and the historical slope distribution is continuously calculated to generate the electro-variable slope correction interval and its punctuation points, and the motor PWM duty cycle is automatically controlled accordingly for speed adjustment; automatic full speed when resistance is extremely low, and immediate speed reduction when resistance suddenly increases. After bottoming out, the sediment thickness is output based on the effective probe displacement and the real-time inclination angle cosine correction. This scheme can counteract baseline drift, achieve millimeter-level accuracy and second-level bottoming out determination, improve measurement efficiency, reduce probe wear, and is suitable for sediment detection in deep, large-diameter, and high-salinity marine pile holes.

Description

Technical Field

[0001] This invention belongs to the field of probe testing and data processing, specifically relating to a probe sediment thickness measurement system and equipment based on electro-variable slope correction. Background Art

[0002] Drilled piles are core load-bearing components in projects such as bridge piers, super high-rise buildings, offshore wind turbines, and deep-water wharves. These pile foundations often have large diameters, deep depths, and high load-bearing requirements. After drilling, the construction unit must confirm whether the thickness of the sediment at the bottom of the hole meets the design and specification requirements before pouring concrete: it should generally not exceed 3 cm, or not exceed 10% of the pile diameter. If the determination is incorrect, it may cause concrete backflow and strength reduction, or even lead to insufficient bearing capacity at the pile tip, resulting in pile settlement, uneven displacement of pile groups, or even structural risks.

[0003] Currently, manual measuring rods and penetrometers are simple to operate and have almost zero equipment cost, but they rely on workers' touch or hearing to determine the bottom contact point. In situations with large borehole diameters, high mud concentrations, or high underwater flow velocities, it is difficult to visually detect the moment of bottom contact; deep-hole and offshore platform construction also poses personal safety hazards. Field comparisons show that the variance of repeated measurements of the same pile hole using manual measuring rods can be as high as 5 centimeters. Acoustic, ultrasonic, or optical ranging methods detect the bottom position of the borehole through acoustic echoes or laser beams, achieving millimeter-level accuracy in the laboratory, but they suffer from excessive attenuation in high-viscosity mud, resulting in distorted reflected signals; coupled with irregular borehole walls, rebar cage scattering, and bubble interference, their field usability is significantly reduced. The equipment is expensive and requires professional personnel for calibration, limiting its widespread adoption.

[0004] Fixed threshold current probes in most commercial devices employ a strategy of active probe extension and retraction with a sudden increase in motor current. The probe extends at a constant speed, with the motor current rising slowly as it penetrates loose sediment and then surging upon encountering a dense bearing layer. For example, patent document CN118654620A describes a system for measuring sediment thickness, using the difference between the baseline current and a fixed value as the bottom-reaching threshold. Changes in mud density or temperature cause the baseline to shift upwards or downwards, making the fixed difference unsuitable and increasing the false alarm rate. To prevent overshoot, the probe extension speed is set relatively slowly; however, if the speed is forcibly increased, the high inertia will cause the probe to penetrate the bearing layer by 1 to 2 millimeters. The equipment typically only uses a cosine adjustment to compensate for tilt errors once at the end of the test, without adjusting the speed during the process, making it difficult to handle the dynamic changes in sediment layer thickness, density, and borehole wall friction with depth.

[0005] Some manufacturers incorporate dual-axis inclinometers into the probes, using vertical projection to correct for one-time deduction errors after measurement. Patent document CN112833745A discloses a large-range multi-probe sediment thickness detection device. While this design compensates for probe skew, the probe extension process remains uniform, failing to suppress probe skew growth in real time; errors still exceed 1 cm when encountering inclined borehole walls or eccentric reinforcing cages. Fixed current thresholds prevent automatic tracking of baseline drift caused by mud concentration, temperature, and motor aging. The extension speed and current slope are tied to the same time scale; when speed changes, the current-time slope no longer reflects the true resistance. Gear switching uses hard threshold switching, resulting in impact and overshoot due to high motor inertia; time is also wasted in loose sediment areas. Existing systems rarely use information theory metrics to determine the difference between the current resistance distribution and historical distribution, leading to lag in response to sudden environmental changes or abnormal oscillations. Overall, manual setting of thresholds and motor PWM is required, with up to 30% of borehole measurement time spent on temporary parameter adjustments and repeated trials. Summary of the Invention

[0006] The purpose of this invention is to propose a probe sediment thickness measurement system and equipment based on electro-variable slope correction, so as to solve one or more technical problems existing in the prior art, and at least provide a beneficial option or create conditions.

[0007] To achieve the above objectives, according to one aspect of the present invention, a probe sediment thickness measurement system based on electro-variable slope correction is provided. The system includes a processor, a memory, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the probe sediment thickness measurement method based on electro-variable slope correction. The system can run on computing devices such as desktop computers, laptops, handheld computers, and cloud data centers. The runnable system may include, but is not limited to, processors, memory, and server clusters. The processor executing the computer program can run in the following system units:

[0008] The baseline acquisition unit is used to detect the inclination angle of the probe in real time when the probe is lowered to the mud section above the bottom of the pile hole, and to sample the current data of the probe within the initial time window to obtain the mean value and standard deviation of the current baseline when the inclination angle is not greater than the preset limit.

[0009] The distribution measurement unit is used to slide a time window during the probe extension process to collect the probe's displacement and current data, obtain the current and displacement data within the sliding time window, and record the probe's tilt angle. Specifically, the current data within the sliding time window is compared with the mean and standard deviation of the current baseline to obtain the current propulsion distribution corresponding to the sliding time window. The current propulsion distribution corresponding to the sliding time window is compared with the distribution of the displacement data within the sliding time window to generate the electrovariance gradient spectrum corresponding to the sliding time window.

[0010] The data control unit is used to calculate the electro-entropy correction interval and its punctuation mark corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to the previous time window. The speed of probe extension is controlled by the electro-entropy correction interval and its punctuation mark.

[0011] The bottom-out monitoring unit is used to monitor the current data in the sliding time window. When the value of the current data continuously exceeds the current change judgment threshold and lasts for no less than a preset duration, it is determined that the probe has bottomed out, and the total duration of the current sliding time window is recorded. The current change judgment threshold is a threshold generated based on the mean value of the current baseline and the standard deviation of the current baseline.

[0012] The measurement correction unit is used to calculate the base thickness by combining the total duration of the current sliding time window with the speed at which the probe extends within the sliding time window. If the maximum tilt angle recorded in the sliding time window is greater than the preset limit, the final sediment thickness is generated by combining the base thickness with the cosine value of the maximum tilt angle of the probe.

[0013] Furthermore, the sampling duration and sampling frequency of the initial time window and the time window in the sliding time window are consistent. The time window contains multiple different sampling times, and data is sampled at each sampling time.

[0014] Furthermore, there is no overlap between the initial time window and the time windows in the sliding time window.

[0015] Furthermore, in the baseline acquisition unit, the processing steps for obtaining the mean current baseline and the standard deviation of the current baseline from the current data of the sampling probe within the initial time window specifically include: acquiring the current value at each sampling time within the initial time window, calculating the arithmetic mean of the current values ​​at each sampling time as the mean current baseline, and calculating the standard deviation of the current values ​​at each sampling time as the standard deviation of the current baseline.

[0016] Furthermore, in the distribution calculation unit, the processing steps for obtaining the current propagation distribution corresponding to the sliding time window by comparing the current data in the sliding time window with the mean and standard deviation of the current baseline respectively include:

[0017] The difference between the current baseline at each sampling moment in the sliding time window is obtained by subtracting the mean of the current baseline from the current value at each sampling moment in the sliding time window. The difference between the current baseline at each sampling moment in the sliding time window is compared with the standard deviation of the current baseline to obtain the current advance ratio at each sampling moment in the sliding time window. The current advance ratio at each sampling moment in the sliding time window constitutes the current advance distribution corresponding to the sliding time window.

[0018] Furthermore, in the distribution measurement unit, the specific steps for generating the electrovariance gradient spectrum corresponding to the sliding time window by comparing the current propagation distribution corresponding to the sliding time window with the distribution of displacement data within the sliding time window are as follows:

[0019] The distribution of displacement data in the sliding time window is an array composed of normalized values ​​of instantaneous displacement at each sampling moment in the sliding time window. The ratio obtained by comparing the values ​​of the current propagation distribution corresponding to the sliding time window and the distribution of displacement data in the sliding time window after aligning them according to the sampling moment is the current-displacement slope at each sampling moment in the sliding time window. The array composed of the current-displacement slope at each sampling moment in the sliding time window is the electro-entropy gradient spectrum corresponding to the sliding time window.

[0020] Furthermore, in the data control unit, the specific processing steps for calculating the electro-entropy correction interval and its punctuation points corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to previous time windows include:

[0021] The reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows is used as the feedforward electro-entropy slope, and the reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window is used as the feedback electro-entropy slope.

[0022] The upper limit of the interval is the maximum value between the feedforward slope and the feedback slope, and the lower limit of the interval is the minimum value between the feedforward slope and the feedback slope. The slope correction interval is formed by these two values.

[0023] The information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows, minus the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window, and the reciprocal of the absolute value of the difference obtained by subtracting the difference is the punctuation of the electro-entropy slope correction interval.

[0024] Furthermore, in the data control unit, the probe extension speed is controlled using the electro-variable slope correction interval and its punctuation marks, specifically as follows:

[0025] Determine whether the punctuation mark of the electrical slope correction interval falls within the electrical slope correction interval. If so, adjust the probe extension speed with the value of the punctuation mark of the electrical slope correction interval as the weight.

[0026] If the punctuation mark of the electrical slope correction interval does not fall within the electrical slope correction interval, determine whether the punctuation mark of the electrical slope correction interval is less than the lower limit of the electrical slope correction interval. If so, adjust the probe extension speed with the value of the lower limit of the electrical slope correction interval as the weight.

[0027] Furthermore, the data control unit also includes the step of: when the punctuation mark of the electrical slope correction interval is greater than the upper limit of the electrical slope correction interval, the adjustment probe extends at full speed.

[0028] Correspondingly, the present invention also provides an electronic device, a readable storage medium, and a computer program product:

[0029] An electronic device includes: at least one processor; and a memory communicatively connected to the at least one processor; the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to run the system units of the probe sediment thickness measurement system based on electro-variable slope correction.

[0030] A non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause the computer to perform the probe sediment thickness measurement method based on electrovariable slope correction and the methods for each step therein.

[0031] A computer program product includes a computer program that, when executed by a processor, implements the probe sediment thickness calculation method based on electro-variable slope correction and the methods for each step therein.

[0032] The beneficial effects of this invention are as follows: This invention provides a method, system, and equipment for measuring probe sediment thickness based on electro-variable slope correction. During probe extension, current and displacement are simultaneously collected within a sliding time window. The current is normalized according to the baseline to obtain the current propulsion distribution, and then compared point-by-point with the displacement normalization sequence to obtain the electro-variable entropy gradient. The information difference between the current slope distribution and the historical slope distribution is continuously calculated to generate the electro-variable slope correction interval and its punctuation points, and the motor PWM duty cycle is automatically controlled accordingly for speed adjustment; automatic full speed when resistance is extremely low, and immediate speed reduction when resistance suddenly increases. After bottoming out, the sediment thickness is output based on the effective probe displacement and the real-time inclination angle cosine correction. This scheme can counteract baseline drift, achieve millimeter-level accuracy and second-level bottoming out determination, improve measurement efficiency, reduce probe wear, and is suitable for sediment detection in deep, large-diameter, and high-salinity marine pile holes.

[0033] The technical solution described in this invention uses the electro-slope correction interval corresponding to the time window and its punctuation points to construct a probe testing self-expansion interval for adjusting the probe's extension speed, resulting in sensitive and stable thickness measurement calculations. Within the interval, speed is adjusted linearly with weights, leading to smooth speed changes; outside the interval, when resistance is extremely low, full speed is allowed, further improving efficiency. This not only prevents misjudgments during drastic changes in mud conditions but also accelerates passage in low-resistance sections, ultimately shortening the average measurement time, converging measurement errors, and significantly reducing probe wear. Attached Figure Description

[0034] The above and other features of the present invention will become more apparent from the detailed description of the embodiments shown in conjunction with the accompanying drawings. In the accompanying drawings, the same reference numerals denote the same or similar elements. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without any creative effort. In the drawings:

[0035] Figure 1 The flowchart shown is a method for calculating probe sediment thickness based on electro-variable slope correction.

[0036] Figure 2 The figure shows the system structure of the probe sediment thickness measurement system based on electro-variable slope correction. Detailed Implementation

[0037] The following will provide a clear and complete description of the concept, specific structure, and technical effects of the present invention in conjunction with the embodiments and accompanying drawings, so as to fully understand the purpose, solution, and effects of the present invention. It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other.

[0038] In the description of this invention, "several" means one or more, "more than" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0039] like Figure 1 The diagram shows a flowchart of the probe sediment thickness calculation method based on electro-variable slope correction according to the present invention. The following is a summary of the method. Figure 1 This invention describes a method, system, and device for measuring probe sediment thickness based on electro-variable slope correction according to embodiments of the present invention.

[0040] This invention proposes a probe sediment thickness calculation method based on electro-variable slope correction. The method is applied to the probe sediment thickness calculation system based on electro-variable slope correction, and specifically includes the following steps:

[0041] When the probe is lowered to the mud section above the bottom of the pile hole, the inclination angle of the probe is detected in real time. If the inclination angle is not greater than the preset limit, the current data of the probe is sampled within the initial time window to obtain the mean value of the current baseline and the standard deviation of the current baseline.

[0042] Initiate probe extension, and during the probe extension process, slide a time window to collect probe displacement and current data. Obtain the current and displacement data within the sliding time window and record the probe's tilt angle.

[0043] Within the sliding time window, the electro-entropy gradient spectrum corresponding to the current time window is calculated relative to the electro-entropy gradient spectrum corresponding to its previous time windows to obtain the electro-slope correction interval and its electro-slope correction interval marker. The electro-slope correction interval and its electro-slope correction interval marker are used to control the probe extension speed.

[0044] Monitor the current data in the sliding time window. When the value of the current data continuously exceeds the current change judgment threshold and lasts for no less than a preset duration, it is determined that the force-bearing layer interface is triggered. Record the total duration of the current sliding time window. The current change judgment threshold is a threshold generated based on the mean value of the current baseline and the standard deviation of the current baseline.

[0045] The base thickness is calculated by combining the total duration of the current sliding time window with the probe extension speed within the sliding time window. If the maximum tilt angle recorded in the sliding time window is greater than the preset limit, the final sediment thickness is generated by combining the base thickness with the cosine value of the maximum tilt angle of the probe.

[0046] Specifically, the current data in the sliding time window is compared with the mean and standard deviation of the current baseline to obtain the current propagation distribution corresponding to the sliding time window. The current propagation distribution corresponding to the sliding time window is compared with the distribution of the displacement data in the sliding time window to generate the electro-entropy gradient spectrum corresponding to the sliding time window.

[0047] In some embodiments, an active probe can be used. The probe housing is integrally formed of stainless steel with an outer diameter of 60 mm and a hard alloy coating. The smart sensor connected to the probe may include a Hall current sensor with a differential current of up to 5A and a sampling frequency of approximately 1 kHz, a dual-axis MEMS tilt sensor with a sampling frequency of approximately 1 kHz, and a low-speed gyroscope with a frequency of approximately 200 Hz for temperature drift compensation. The active probe is also connected to a drive mechanism, which can use a 24V brushless DC motor driven by a lead screw with a pitch of approximately 2 mm via a 1:50 precision reduction gearbox. In the drive mechanism, the MCU can be configured to have three fixed PWM duty cycles: 100% for full speed, 65% for speed within the range, and 35% for speed below the lower limit of the range, corresponding to probe extension linear speeds of approximately 12 mm / s, 8 mm / s, and 4 mm / s, respectively. In one embodiment, the upper limit, median, and lower limit of the electro-variable slope correction range can be compared with the fixed PWM duty cycle of the MCU, arranged in numerical order, and then paired sequentially to control the probe speed. The numerical signal controlling the probe's speed is uploaded and recorded wirelessly via an accelerometer. Optionally, the drive mechanism may include an auxiliary unit, and the probe head may integrate a 2.5MHz miniature ultrasonic transducer for secondary verification of the bearing layer's contact with the bottom.

[0048] The total effective extension time of the probe is statistically analyzed, and the base thickness is calculated as the velocity-weighted average of the total effective extension time within each time window. Alternatively, the probe extension displacement within each time window is calculated by integrating the time and velocity of each sampling point in the event within each time window, and the probe extension displacements within each time window are summed to obtain the preliminary thickness.

[0049] The maximum inclination angle recorded in each time window within this testing period is taken. If the recorded maximum inclination angle is greater than the threshold, the final thickness is obtained by multiplying the preliminary thickness by the cosine of the recorded maximum inclination angle, and this final thickness is used as the output sediment thickness. If the recorded maximum inclination angle is not greater than the threshold, the preliminary thickness is directly output. The MCU writes the final thickness and uploads it to the cloud or cluster via a 4G module.

[0050] The implementation can be applied to test objects including, but not limited to, 1500mm bored piles, where the bearing layer of the pile hole is designed to be located approximately 1.2m below the bottom of the hole and below the sediment layer. For the current and displacement data within the sliding time window, the current value can be the current consumed by the probe drive motor to overcome the sediment resistance during probe extension, measured in mA but to be dimensionless later. This can be obtained by, for example, a Hall current sensor at 1kHz sampling. The displacement data can be the instantaneous displacement of the probe extension, measured in mm but to be dimensionless later. This can be provided in real-time by, for example, a lead screw rotation-pulse counting or a magnetic scale. If the motor runs at a constant duty cycle, the instantaneous displacement can be approximated by multiplying the time difference between the current timestamp and the previous bottom-confirmation timestamp by the set speed for that segment. Then, by pairing these two synchronous sampling sequences—current and displacement values—a set of continuous sampling data points is obtained.

[0051] The initial time window and the time window in the sliding time window have the same sampling duration and sampling frequency. The time window contains multiple different sampling times, and data is sampled at each sampling time.

[0052] In some embodiments, the probe is lowered to 0.5m above the bottom of the hole, and the tilt angle is monitored in real time. When the tilt angle is less than or equal to 4 degrees and the cable tension is stable, the posture is considered qualified. The probe is held at this position for approximately 3 seconds, and several consecutive samples are taken to obtain the current sequence. The baseline mean and standard deviation are then calculated. The preset mutation threshold is initially set to the baseline mean plus approximately 4 times the standard deviation. The initial probe extension speed can be set to, for example, 2mm / s, below the lower limit of the electro-variable slope correction interval.

[0053] There is no overlap between the initial time window and the time windows in the sliding time window.

[0054] In some embodiments, the MCU slides in 10ms time windows, sampling data at 5 sampling points within the current time window during the sliding process. Preferably, the probe advances rapidly in the loose sediment section using a fast setting; as the sediment density increases, it automatically switches to a medium or slow setting to prevent impact overshoot. If the current first exceeds the sudden change threshold and remains above it for 50ms, it is considered to have bottomed out, and the calibration phase begins immediately.

[0055] Specifically, the method for obtaining the mean and standard deviation of the current baseline from the current data of the sampling probe within the initial time window is as follows: obtain the current value at each sampling time within the initial time window, calculate the arithmetic mean of the current values ​​at each sampling time as the mean of the current baseline, and calculate the standard deviation of the current values ​​at each sampling time as the standard deviation of the current baseline.

[0056] The method for obtaining the current propagation distribution corresponding to the sliding time window by comparing the current data in the sliding time window with the mean and standard deviation of the current baseline is as follows:

[0057] The difference between the current baseline at each sampling moment in the sliding time window is obtained by subtracting the mean of the current baseline from the current value at each sampling moment in the sliding time window. The difference between the current baseline at each sampling moment in the sliding time window is compared with the standard deviation of the current baseline to obtain the current advance ratio at each sampling moment in the sliding time window. The current advance ratio at each sampling moment in the sliding time window constitutes the current advance distribution corresponding to the sliding time window.

[0058] In some embodiments, when the current baseline difference at each sampling time in the sliding time window is compared with the current baseline standard deviation, an activation function or similar method can be used to preprocess the current baseline difference and the current baseline standard deviation at each sampling time before comparison.

[0059] Compared to traditional micro-accelerometers used for sediment thickness, which typically only take a single average value of a current sequence before measurement and then treat a certain amount above that value as increased resistance, current technology ignores the overall variance changes caused by motor zero-point drift, sensor temperature drift, and sudden changes in mud viscosity. As a result, when the mud specific gravity increases, the overall current baseline rises, the fixed threshold is easily triggered, and the false positive rate is high; when the environment becomes extremely stable, even a small amount of noise exceeds the threshold, leading to even more false alarms.

[0060] This invention simultaneously calculates the mean and standard deviation within the initial time window and normalizes all subsequent currents. Regardless of changes in mud concentration, temperature, or motor aging, the standard deviation always corresponds to the same small normal distribution probability, thus maintaining a stable threshold confidence level. This invention uses an array of normalized values ​​from each sampling point to obtain the current propulsion distribution, which can accurately describe the probability curve of current increment within a window of the smart sensor. This ensures that signals from any wellbore and any sensor are brought to the same probability space, making this method both threshold sensitive and stable. Even with large fluctuations in the standard deviation, the distribution pattern of the current propulsion distribution corresponding to the sliding time window remains comparable. Because each number is in units of the baseline standard deviation, these numbers can be compared horizontally regardless of mud viscosity.

[0061] Specifically, the method for generating the electrovariant entropy gradient spectrum corresponding to the sliding time window by comparing the current propagation distribution corresponding to the sliding time window with the displacement data distribution within the sliding time window is as follows:

[0062] The distribution of displacement data within the sliding time window is an array composed of normalized values ​​of instantaneous displacement at each sampling moment within the sliding time window. The ratio obtained by comparing the values ​​in the current propagation distribution corresponding to the sliding time window and the displacement data distribution within the sliding time window after aligning them according to the sampling moment is the current-displacement slope at each sampling moment within the sliding time window. The array composed of the current-displacement slopes at each sampling moment within the sliding time window is the electro-entropy gradient spectrum corresponding to the sliding time window. In this embodiment, the distribution array obtained by comparing the current propagation distribution within the sliding window with the normalized displacement sequence is the electro-entropy gradient spectrum described in this invention. This distribution array can be used to measure the change in normalized current entropy increase relative to the displacement gradient, hence it corresponds to the entropy gradient mechanism. The spectrum emphasizes its array shape; this spectrum reflects the normalized slope characteristics of the probe's current resistance field and is the core metric for the system's adaptive speed regulation.

[0063] In long spiral drilling or eccentric hole formation scenarios, the hole wall often exhibits extremely fine spiral textures, causing alternating radial friction pulses during probe descent. Simultaneously, if the bottom sediment layer contains a thin layer of coarse particles, it can cause intermittent high-frequency sawtooth-like motions in the motor load. Traditional current-time thresholds or unidirectional displacement corrections can only detect low-frequency steps and cannot distinguish between these two high-frequency, superimposed fine-texture interferences, easily misinterpreting them as equipment vibration noise and thus missing localized thick sediment or gravel layers. Generally, if the slope is determined using a current-time curve, adjusting the probe extension speed compresses or stretches the time axis, distorting the slope dimension. This results in a steeper slope at higher speeds, leading to false stops. This invention divides the current propulsion distribution point-by-point with the normalized displacement sequence within the same window, generating an electrovariable entropy gradient. If the probe extends quickly, the displacement increment is large, the denominator is large, and the slope is diluted; conversely, if the probe extends slowly, the denominator is small, and the slope is amplified. Thus, the slope array truly reflects the resistance gradient itself, unaffected by the probe extension speed. The described electrovariance gradient spectrum can form a fine-textured curve that is extremely sensitive to high-frequency interlaced resistance. The spiral friction exhibits a periodic sawtooth cluster, while the coarse-grained interlayer exhibits a single-peak protrusion; the two morphologies are completely different. This effectively solves the problem of distortion caused by the superposition of spiral friction interlayers, a problem that has been almost unexplored in the industry, and significantly improves the accuracy and construction efficiency of sediment thickness measurement under extremely complex pore wall conditions.

[0064] The method for calculating the electro-entropy correction interval and its punctuation marks for the current time window by combining the forward and backward feeds of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectra corresponding to previous time windows is as follows:

[0065] The reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows is used as the feedforward electro-entropy slope, and the reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window is used as the feedback electro-entropy slope.

[0066] The upper limit of the interval is the maximum value between the feedforward slope and the feedback slope, and the lower limit of the interval is the minimum value between the feedforward slope and the feedback slope. The slope correction interval is formed by these two values.

[0067] The information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows, minus the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window, and the reciprocal of the absolute value of the difference obtained by subtracting the difference is the punctuation of the electro-entropy slope correction interval.

[0068] In some embodiments, the information difference represents the difference between two distribution information. Preferably, KL divergence can be used as one of the methods for calculating the information difference, such as calculating the KL divergence of the electrovariable entropy gradient spectrum corresponding to the previous time window relative to the electrovariable entropy gradient spectrum corresponding to the current time window as its information difference.

[0069] Most commercially available probe testing instruments use a fixed dual threshold to switch between three speed levels. However, under different mud conditions, the dual threshold switching is either too low, leading to frequent speed jumps, or too high, resulting in sluggishness. This invention calculates the KL divergence for the current window slope distribution and the historical window slope distribution. The feedforward information difference determines how much the new resistance has increased, and the feedback information difference determines how much the resistance has recovered. The reciprocals of the two are taken, with the larger one recorded as the upper limit of the interval and the smaller one as the lower limit. The reciprocal of the absolute value of the difference is used to define the punctuation of the electro-variable slope correction interval, which intuitively reflects the current resistance deviation. The KL divergence measures the information entropy difference between two distributions; the larger the reciprocal, the more similar the distributions are, indicating a stable environment.

[0070] The slope array of the current window and the slope arrays of several past windows are used to perform information difference calculations, using KL divergence to compare the differences between the two distributions. A larger information difference indicates a greater difference in distributions; a larger reciprocal indicates closer distributions. The larger of the reciprocal of the current relative to the historical data and the historical reciprocal relative to the current data is used as the upper limit of the interval, and the smaller as the lower limit, forming the electro-variable slope correction interval. The reciprocal of the absolute value of the difference between these two information differences is used as the interval marker, describing the deviation of the current resistance from the historical resistance. If the current resistance changes significantly, the information difference is large, the reciprocal is small, the interval is automatically narrowed, and the system becomes more sensitive to this, slowing down earlier. If the environment is stable, the information difference is small, the reciprocal is large, the interval is widened, the system tolerates greater speed fluctuations, and efficiency is improved.

[0071] Specifically, the probe extension speed is controlled using the aforementioned electro-variable slope correction interval and its punctuation marks, as follows:

[0072] Determine whether the punctuation mark of the electrical slope correction interval falls within the electrical slope correction interval. If so, adjust the probe extension speed with the value of the punctuation mark of the electrical slope correction interval as the weight.

[0073] If the punctuation mark of the electrical slope correction interval does not fall within the electrical slope correction interval, determine whether the punctuation mark of the electrical slope correction interval is less than the lower limit of the electrical slope correction interval. If so, adjust the probe extension speed with the value of the lower limit of the electrical slope correction interval as the weight.

[0074] In existing technologies, the hard switching from high speed to low speed causes an additional 1-2mm undershoot due to motor inertia. Even slight fluctuations in loose sediment can force a speed reduction, resulting in efficiency loss. This invention performs a linear proportional mapping between the upper and lower limits of the interval markers obtained in the previous step, yielding weight values ​​between 0 and 1. These weight values ​​are then mapped to the pulse width modulation duty cycle of the drive motor, varying linearly from a minimum of 35% to a maximum of 100%. Therefore, as long as the markers move smoothly within the interval, the needle extension speed will also increase or decrease smoothly, instead of the discrete fast, medium, and slow three-speed jumps. Here, speed is treated as a continuous function, meaning lower acceleration and less mechanical impact, effectively reducing overshoot. This also allows for the addition of clamping logic outside the interval, using the lowest speed when below the lower limit and the highest speed when above the upper limit.

[0075] Specifically, when the punctuation mark of the electro-variable slope correction interval is greater than the upper limit of the electro-variable slope correction interval, the adjustment probe extends at full speed.

[0076] In some embodiments, earlier systems, even when detecting extremely low resistance, still limited the PWM to 65-80%, essentially wasting time running idle. In this invention, however, if the interval marker is already high enough to exceed the upper limit of the interval, it proves that the resistance is extremely low and the environment is extremely stable. The controller can then directly give the motor a 100% duty cycle, allowing the probe to extend at its physical limit speed. While theoretically increasing the probe's kinetic energy when moving at full speed through a thick layer of loose sediment, the resistance is still far below the motor's rated capacity. The kinetic energy can be quickly and linearly dissipated by the interval contraction mechanism before hard contact. Generally, within thick sections of loose sediment, resistance is roughly proportional to speed. In fact, as long as the total resistance is far below the motor's rated load, running at full speed will not damage the equipment; on the contrary, it can significantly shorten the ineffective travel time.

[0077] The probe sediment thickness measurement system based on electro-variable slope correction runs on any computing device, such as a desktop computer, laptop computer, handheld computer, or cloud data center. The computing device includes a processor, a memory, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, it implements the steps in the probe sediment thickness measurement method based on electro-variable slope correction. The runnable system may include, but is not limited to, processors, memory, and server clusters.

[0078] The embodiments of the present invention provide a probe sediment thickness measurement system based on electro-variable slope correction, such as... Figure 2 As shown, the probe sediment thickness measurement system based on electro-variable slope correction in this embodiment includes: a processor, a memory, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps in the above-described embodiment of the probe sediment thickness measurement method based on electro-variable slope correction. The processor executes the computer program in the following system units:

[0079] The baseline acquisition unit is used to detect the inclination angle of the probe in real time when the probe is lowered to the mud section above the bottom of the pile hole, and to sample the current data of the probe within the initial time window to obtain the mean value and standard deviation of the current baseline when the inclination angle is not greater than the preset limit.

[0080] The distribution measurement unit is used to slide a time window during the probe extension process to collect the probe's displacement and current data, obtain the current and displacement data within the sliding time window, and record the probe's tilt angle. Specifically, the current data within the sliding time window is compared with the mean and standard deviation of the current baseline to obtain the current propulsion distribution corresponding to the sliding time window. The current propulsion distribution corresponding to the sliding time window is compared with the distribution of the displacement data within the sliding time window to generate the electrovariance gradient spectrum corresponding to the sliding time window.

[0081] The data control unit is used to calculate the electro-entropy correction interval and its punctuation mark corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to the previous time window. The speed of probe extension is controlled by the electro-entropy correction interval and its punctuation mark.

[0082] The bottom-out monitoring unit is used to monitor the current data in the sliding time window. When the value of the current data continuously exceeds the current change judgment threshold and lasts for no less than a preset duration, it is determined that the probe has bottomed out, and the total duration of the current sliding time window is recorded. The current change judgment threshold is a threshold generated based on the mean value of the current baseline and the standard deviation of the current baseline.

[0083] The measurement correction unit is used to calculate the base thickness by combining the total duration of the current sliding time window with the speed at which the probe extends within the sliding time window. If the maximum tilt angle recorded in the sliding time window is greater than the preset limit, the final sediment thickness is generated by combining the base thickness with the cosine value of the maximum tilt angle of the probe.

[0084] In this embodiment, the probe sediment thickness measurement system based on electro-slope correction can be written in a lightweight interpreted language, such as, but not limited to, C++, or Python 3.11. The core algorithms are all encapsulated as independent modules, and at runtime, they only rely on commonly used open-source libraries such as, but not limited to, NumPy, SciPy, and / or PySerial. This facilitates direct deployment on laptops, Windows engineering tablets, or ARM-based single-board computers such as Raspberry Pi 4B, allowing for OTA upgrades without additional compilation. For hardware interfaces, the probe housing has a 7-pin waterproof aviation socket at the rear, including a 24V DC power supply line between two pins; a two-pin RS-485 differential signal line for uploading data from the current, displacement, and tilt sensors; and a three-pin PWM control line for controlling direction, duty cycle, and enable, directly connecting to the brushless motor driver. Electronic devices, including but not limited to tablets or single-board computers, can form a full-duplex bus with the probe via USB-RS-485 adapters, with a maximum baud rate of 921,600 bps, ensuring complete 1kHz sampling and feedback. The MCU, such as the STM32H7, synchronously samples the current, motor encoder pulses, and MEMS tilt angle at a frequency of 1kHz within the probe, and packages these three 16-bit data streams into fixed-length frames. These frames are then sent to the external electronic device's serial port buffer via RS-485 hardware DMA. The backend uses an asynchronous I / O thread to parse the frame header, verify the CRC, and map the real-time data into a circular buffer for the algorithm module to use. When control commands are sent down, the host computer algorithm updates the PWM duty cycle result every 10ms and writes it to the RS-485 bus via speed command frames. Upon receiving the frame, the MCU directly refreshes the on-chip timer PWM output, driving the brushless motor to change its duty cycle, and simultaneously updates the direction pins to achieve retraction or extension. When the system backend detects a bottoming-out determination and a successful reverse calibration event, it immediately freezes the circular buffer, calculates the final thickness, and can call the ReportLab library to generate a PDF. The PDF is saved locally and pushed to the project cloud server via MQTT using a 4G LTE module for remote viewing by the supervisor and the client.

[0085] In the actual operation of the electronic device, the connection probe is inserted into the aviation plug, and the software automatically recognizes the serial port USB-RS-485; when the device is powered on, the GUI displays baseline acquisition in progress, with a 3-second countdown, and the uplink sensor is sent to the system backend; the probe automatically extends, and the GUI displays the real-time change of the PWM slider, with the downlink PWM sent to the MCU; when it automatically bottoms out, the system's GUI pop-up window can display messages such as "Bottom out confirmed, retraction calibration completed," and uplink angle, speed, and time data are generated into a report PDF named with a timestamp and automatically uploaded to the LTE network.

[0086] Furthermore, the sampling duration and sampling frequency of the initial time window and the time window in the sliding time window are consistent. The time window contains multiple different sampling times, and data is sampled at each sampling time.

[0087] Furthermore, there is no overlap between the initial time window and the time windows in the sliding time window.

[0088] Furthermore, in the baseline acquisition unit, the processing steps for obtaining the mean current baseline and the standard deviation of the current baseline from the current data of the sampling probe within the initial time window specifically include: acquiring the current value at each sampling time within the initial time window, calculating the arithmetic mean of the current values ​​at each sampling time as the mean current baseline, and calculating the standard deviation of the current values ​​at each sampling time as the standard deviation of the current baseline.

[0089] Furthermore, in the distribution calculation unit, the processing steps for obtaining the current propagation distribution corresponding to the sliding time window by comparing the current data in the sliding time window with the mean and standard deviation of the current baseline respectively include:

[0090] The difference between the current baseline at each sampling moment in the sliding time window is obtained by subtracting the mean of the current baseline from the current value at each sampling moment in the sliding time window. The difference between the current baseline at each sampling moment in the sliding time window is compared with the standard deviation of the current baseline to obtain the current advance ratio at each sampling moment in the sliding time window. The current advance ratio at each sampling moment in the sliding time window constitutes the current advance distribution corresponding to the sliding time window.

[0091] Furthermore, in the distribution measurement unit, the specific steps for generating the electrovariance gradient spectrum corresponding to the sliding time window by comparing the current propagation distribution corresponding to the sliding time window with the distribution of displacement data within the sliding time window are as follows:

[0092] The distribution of displacement data in the sliding time window is an array composed of normalized values ​​of instantaneous displacement at each sampling moment in the sliding time window. The ratio obtained by comparing the values ​​of the current propagation distribution corresponding to the sliding time window and the distribution of displacement data in the sliding time window after aligning them according to the sampling moment is the current-displacement slope at each sampling moment in the sliding time window. The array composed of the current-displacement slope at each sampling moment in the sliding time window is the electro-entropy gradient spectrum corresponding to the sliding time window.

[0093] Furthermore, in the data control unit, the specific processing steps for calculating the electro-entropy correction interval and its punctuation points corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to previous time windows include:

[0094] The reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows is used as the feedforward electro-entropy slope, and the reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window is used as the feedback electro-entropy slope.

[0095] The upper limit of the interval is the maximum value between the feedforward slope and the feedback slope, and the lower limit of the interval is the minimum value between the feedforward slope and the feedback slope. The slope correction interval is formed by these two values.

[0096] The information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows, minus the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window, and the reciprocal of the absolute value of the difference obtained by subtracting the difference is the punctuation of the electro-entropy slope correction interval.

[0097] Furthermore, in the data control unit, the probe extension speed is controlled using the electro-variable slope correction interval and its punctuation marks, specifically as follows:

[0098] Determine whether the punctuation mark of the electrical slope correction interval falls within the electrical slope correction interval. If so, adjust the probe extension speed with the value of the punctuation mark of the electrical slope correction interval as the weight.

[0099] If the punctuation mark of the electrical slope correction interval does not fall within the electrical slope correction interval, determine whether the punctuation mark of the electrical slope correction interval is less than the lower limit of the electrical slope correction interval. If so, adjust the probe extension speed with the value of the lower limit of the electrical slope correction interval as the weight.

[0100] Furthermore, the data control unit also includes the step of: when the punctuation mark of the electrical slope correction interval is greater than the upper limit of the electrical slope correction interval, the adjustment probe extends at full speed.

[0101] In order to better unify the linear relationship and probabilistic connection between physical quantities with different units of measurement, dimensionless processing can be performed on different physical quantities.

[0102] Preferably, all undefined variables in this invention, if not explicitly defined, can be manually set thresholds.

[0103] The probe sediment thickness measurement system based on electro-slope correction can run on computing devices such as desktop computers, laptops, handheld computers, and cloud data centers. The system includes, but is not limited to, a processor and memory. Those skilled in the art will understand that the examples described are merely illustrations of the probe sediment thickness measurement method, system, and device based on electro-slope correction, and do not constitute a limitation on the method, system, and device. It may include more or fewer components, or a combination of certain components, or different components. For example, the probe sediment thickness measurement system based on electro-slope correction may also include input / output devices, network access devices, buses, etc.

[0104] The present invention also provides an electronic device, a readable storage medium, and a computer program product:

[0105] An electronic device includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the probe sediment thickness measurement method based on electro-variable slope correction and the methods for each step therein, the device comprising the following functional modules:

[0106] The baseline acquisition module is used to detect the inclination angle of the probe in real time when the probe is lowered to the mud section above the bottom of the pile hole, and to sample the current data of the probe within the initial time window to obtain the mean value and standard deviation of the current baseline when the inclination angle is not greater than the preset limit.

[0107] The distribution calculation module is used to slide a time window during the probe extension process to collect the probe's displacement and current data, obtain the current and displacement data within the sliding time window, and record the probe's tilt angle. Specifically, the current data within the sliding time window is compared with the mean and standard deviation of the current baseline to obtain the current propulsion distribution corresponding to the sliding time window. The current propulsion distribution corresponding to the sliding time window is compared with the distribution of the displacement data within the sliding time window to generate the electrovariance gradient spectrum corresponding to the sliding time window.

[0108] The data control module is used to calculate the electro-entropy correction interval and its punctuation mark corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to the previous time window. The speed of probe extension is controlled by the electro-entropy correction interval and its punctuation mark.

[0109] The bottom-out monitoring module is used to monitor the current data in the sliding time window. When the value of the current data continuously exceeds the current change judgment threshold and lasts for no less than a preset duration, it is determined that the probe has bottomed out, and the total duration of the current sliding time window is recorded. The current change judgment threshold is a threshold generated based on the mean value of the current baseline and the standard deviation of the current baseline.

[0110] The measurement correction module is used to calculate the base thickness by combining the total duration of the current sliding time window with the probe extension speed within the sliding time window. If the maximum tilt angle recorded in the sliding time window is greater than the preset limit, the final sediment thickness is generated by combining the base thickness with the cosine value of the maximum tilt angle of the probe.

[0111] A non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause the computer to perform the probe sediment thickness measurement method based on electrovariable slope correction and the methods for each step therein.

[0112] A computer program product includes a computer program that, when executed by a processor, implements the probe sediment thickness calculation method based on electro-variable slope correction and the methods for each step therein.

[0113] The term "electronic device" is intended to refer to various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic devices can also refer to various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0114] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0115] The program code used to implement the methods of the present invention can be written in any combination of one or more programming languages. This program code can be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing device, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code can be executed entirely on the machine, partially on the machine, as a standalone software package partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0116] In the context of this invention, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. Machine-readable media can include, but are not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0117] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0118] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with embodiments of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0119] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other.

[0120] The processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete component gate circuits, transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor. This processor is the control center of the probe sediment thickness measurement system based on electro-variable slope correction, connecting various sub-regions of the system via various interfaces and lines.

[0121] The memory can be used to store the computer program and / or modules. The processor, by running or executing the computer program and / or modules stored in the memory and calling the data stored in the memory, realizes various functions of the probe sediment thickness measurement method, system, and device based on electro-slope correction. The memory may mainly include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a function (such as sound playback function, image playback function, etc.), etc.; the data storage area may store data created based on the use of the mobile phone (such as audio data, phonebook, etc.). In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as hard disk, memory, plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0122] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this invention can be achieved, and this is not limited herein.

[0123] This invention provides a method, system, and device for measuring probe sediment thickness based on electro-variable slope correction. During probe extension, current and displacement are simultaneously acquired within a sliding time window. The current is normalized to a baseline to obtain the current propulsion distribution, which is then compared point-by-point with the displacement normalization sequence to derive the electro-variable entropy gradient. The information difference between the current slope distribution and historical slope distributions is continuously calculated to generate electro-variable slope correction intervals and their markers. Based on this, the motor's PWM duty cycle is automatically controlled for speed adjustment; automatic full speed is achieved when resistance is minimal, and speed is reduced immediately when resistance suddenly increases. After bottoming out, the sediment thickness is output based on the effective probe displacement and the cosine of the real-time tilt angle. This scheme can counteract baseline drift, achieving millimeter-level accuracy and second-level bottoming out determination, improving measurement efficiency, reducing probe wear, and is suitable for sediment detection in deep, large-diameter, and high-salinity marine pile holes.

[0124] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A probe sediment thickness measurement system based on electro-variable slope correction, the system running on any computing device such as a desktop computer, laptop computer, or cloud data center, the computing device including a processor, a memory, and a computer program stored in the memory and running on the processor, characterized in that, The processor executes the computer program in the following system units: The baseline acquisition unit is used to sample the probe current data within the initial time window when the probe is lowered to the mud section above the bottom of the pile hole to obtain the mean current baseline and the standard deviation of the current baseline. The distribution measurement unit is used to slide a time window during the probe extension process to collect the displacement data and current data of the probe and record the tilt angle of the probe. The current data in the sliding time window is compared with the mean and standard deviation of the current baseline to obtain the current propulsion distribution corresponding to the sliding time window. The current propulsion distribution corresponding to the sliding time window is compared with the distribution of the displacement data in the sliding time window to generate the electrovariance gradient spectrum corresponding to the sliding time window. The data control unit is used to calculate the electro-entropy correction interval and its punctuation mark corresponding to the current time window by combining the feedforward and feedback of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to the previous time window. The speed of probe extension is controlled by the electro-entropy correction interval and its punctuation mark. The bottoming-out monitoring unit is used to monitor the current data in the sliding time window. When the current data exceeds the current change judgment threshold and continues for no less than a preset duration, the total duration of the current sliding time window is recorded. The current change judgment threshold is a threshold generated based on the mean current baseline and the standard deviation of the current baseline. The measurement correction unit is used to calculate the base thickness by combining the total duration of the current sliding time window with the speed at which the probe extends within the sliding time window. If the maximum tilt angle recorded in the sliding time window is greater than a preset limit, the final sediment thickness is generated by combining the base thickness with the cosine value of the maximum tilt angle of the probe. In the data control unit, the specific processing steps for calculating the electro-entropy correction interval and its punctuation points for the current time window by combining the forward and backward feeds of the electro-entropy gradient spectrum corresponding to the current time window with the electro-entropy gradient spectrum corresponding to previous time windows include: The reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows is used as the feedforward electro-entropy slope, and the reciprocal of the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window is used as the feedback electro-entropy slope. The upper limit of the interval is the maximum value between the feedforward slope and the feedback slope, and the lower limit of the interval is the minimum value between the feedforward slope and the feedback slope. The slope correction interval is formed by these two values. The information difference between the electro-entropy gradient spectrum corresponding to the current time window and the electro-entropy gradient spectrum corresponding to previous time windows, minus the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window, and the reciprocal of the absolute value of the difference obtained by subtracting the information difference between the electro-entropy gradient spectrum corresponding to previous time windows and the electro-entropy gradient spectrum corresponding to the current time window, is the punctuation of the electro-entropy slope correction interval. In the data control unit, the probe extension speed is controlled using the electro-variable slope correction interval and its punctuation marks, specifically as follows: Determine whether the punctuation mark of the electrical slope correction interval falls within the electrical slope correction interval. If so, adjust the probe extension speed with the value of the punctuation mark of the electrical slope correction interval as the weight. If the punctuation mark of the electrical slope correction interval does not fall within the electrical slope correction interval, determine whether the punctuation mark of the electrical slope correction interval is less than the lower limit of the electrical slope correction interval. If so, adjust the probe extension speed with the value of the lower limit of the electrical slope correction interval as the weight.

2. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 1, characterized in that, in, The initial time window and the time window in the sliding time window have the same sampling duration and sampling frequency. The time window contains multiple different sampling times, and data is sampled at each sampling time.

3. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 2, characterized in that, in, There is no overlap between the initial time window and the time windows in the sliding time window.

4. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 1, characterized in that, In the baseline acquisition unit, the processing steps for obtaining the mean current baseline and the standard deviation of the current baseline from the current data of the sampling probe within the initial time window specifically include: acquiring the current value at each sampling time within the initial time window, calculating the arithmetic mean of the current values ​​at each sampling time as the mean current baseline, and calculating the standard deviation of the current values ​​at each sampling time as the standard deviation of the current baseline.

5. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 4, characterized in that, In the distribution measurement unit, the processing steps for obtaining the current propagation distribution corresponding to the sliding time window by comparing the current data in the sliding time window with the mean and standard deviation of the current baseline respectively include: The difference between the current baseline at each sampling moment in the sliding time window is obtained by subtracting the mean of the current baseline from the current value at each sampling moment in the sliding time window. The difference between the current baseline at each sampling moment in the sliding time window is compared with the standard deviation of the current baseline to obtain the current advance ratio at each sampling moment in the sliding time window. The current advance ratio at each sampling moment in the sliding time window constitutes the current advance distribution corresponding to the sliding time window.

6. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 4, characterized in that, In the distribution measurement unit, the specific steps for generating the electro-entropy gradient spectrum corresponding to the sliding time window by comparing the current propagation distribution corresponding to the sliding time window with the distribution of displacement data within the sliding time window are as follows: The distribution of displacement data in the sliding time window is an array composed of normalized values ​​of instantaneous displacement at each sampling moment in the sliding time window. The ratio obtained by comparing the values ​​of the current propagation distribution corresponding to the sliding time window and the distribution of displacement data in the sliding time window after aligning them according to the sampling moment is the current-displacement slope at each sampling moment in the sliding time window. The array composed of the current-displacement slope at each sampling moment in the sliding time window is the electro-entropy gradient spectrum corresponding to the sliding time window.

7. The probe sediment thickness measurement system based on electro-variable slope correction according to claim 1, characterized in that, in, The data control unit also includes the step of: when the punctuation mark of the electro-variable slope correction interval is greater than the upper limit of the electro-variable slope correction interval, the adjustment probe extends at full speed.

8. An electronic device, characterized in that, include: At least one processor; and a memory communicatively connected to the at least one processor; The memory stores instructions that can be executed by the at least one processor, which, when executed by the at least one processor, enables the at least one processor to execute the system units of the probe sediment thickness measurement system based on electro-variable slope correction as described in any one of claims 1 to 6.

Images