System and method for detecting electrical connection of electronic equipment

Abstract

The invention relates to the technical field of nondestructive testing of electrical connection of electronic equipment, in particular to a system and method for detecting electrical connection of the electronic equipment, and the system comprises a signal generator, a coupling device, a signal receiver and a bearing device; wherein the bearing device is used for bearing to-be-tested electronic equipment and is in insulated connection with the electronic equipment; the signal generator is used for transmitting a fundamental wave signal with a preset frequency, the coupling device is used for receiving the fundamental wave signal and coupling the fundamental wave signal to electronic equipment, and the signal receiver is used for receiving a radio frequency signal formed after the fundamental wave signal passes through the electronic equipment and outputting the radio frequency signal. The radio-frequency signal is used for detecting the electric connection of the electronic equipment and the electric connection reliability of the electronic equipment. The electronic equipment to be detected does not need to be provided with a connection point, the system is wider in application range, the electrical connection reliability of the electronic equipment can be detected, the electronic equipment with the electrical connection quality not reaching the standard is prevented from entering a downstream production line or entering the market, and therefore the product yield is improved.

Description

Technical Field

[0001] The present application relates to the technical field of electronic device electrical connection detection, and in particular to a system and method for detecting the electrical connection of an electronic device. Background Art

[0002] Currently, network analyzers are mainly used to detect whether the electrical connections of electronic devices or electronic device components are normal. The detection process includes: adsorbing the magnetic needle of a Pog-pin magnetic probe to the connection point of the electronic device to be tested, such as a pad point, and connecting the other end to the network analyzer. The waveform signal of the electronic device to be tested or the electronic device component can be transmitted to the network analyzer through the magnetic needle adsorbed on the connection point of the electronic device to be tested. The network analyzer generates a detection waveform. By comparing the detection waveform with the standard waveform, it can be determined whether the electrical connection at the connection point in the electronic device to be tested is normal. However, the above waveform detection method has the following problems:

[0003] 1) The above waveform detection method requires that the electronic device under test has a test connection point;

[0004] 2) The above-mentioned waveform detection method is a passive test, which can only detect whether the electrical connection of the electronic device is normal, but cannot detect the dynamic damage of the electronic device, that is, it cannot detect the reliability of the electrical connection of the electronic device. When the electrical connection quality of the connection point is poor, it is easy to cause the electrical signal of the electronic device to be affected by external force, thereby affecting the product yield and further affecting the use of the product. Summary of the Invention

[0005] Embodiments of the present application provide a system and method for detecting electrical connections of electronic devices, so as to detect electrical connections of electronic devices without setting test connection points on the electronic devices to be tested, and to check the reliability of the electrical connections.

[0006] In a first aspect, the present application provides a system for detecting electrical connections of electronic devices, the system comprising a signal generator, a coupling device, a signal receiver, and a carrying device; wherein the carrying device is used to carry the electronic device to be tested and is insulated from the electronic device; the signal generator is used to transmit a fundamental wave signal of a preset frequency, the coupling device couples the fundamental wave signal to the electronic device to be tested, and the signal receiver is used to receive a radio frequency signal formed after the fundamental wave signal passes through the electronic device, and output the radio frequency signal, and the radio frequency signal is used to detect the electrical connection of the electronic device and the reliability of its electrical connection.

[0007] Thus, in the system for detecting the electrical connection of electronic equipment provided by the present application, no structural connection is required between the signal generator, the coupling device, the signal receiver and the electronic equipment. Therefore, the electronic equipment to be tested can detect the electrical connection of the electronic equipment without setting a test connection point, making the application scope of the system more extensive. Moreover, in the present application, a fundamental wave signal is emitted by a signal generator, and the fundamental wave signal is coupled to the electronic equipment to form a radio frequency signal. The radio frequency signal can not only detect whether the electrical connection of the electronic equipment is normal, but also detect the reliability of the electrical connection of the electronic equipment, thereby preventing electronic equipment with substandard electrical connection quality from flowing into downstream production lines or entering the market, thereby improving product yield. In addition, the insulating connection between the carrier device and the electronic equipment can also avoid interference with the reliability of the electrical connection of the electronic equipment.

[0008] For example, the electronic device to be tested may be a mobile phone, a computer, or a base station component, an electronic component of a car, or other components with communication functions.

[0009] Exemplarily, the fundamental wave signal may be an acoustic wave signal, an electromagnetic wave signal, etc. Optionally, when the fundamental wave signal is an electromagnetic wave signal, the electromagnetic wave signal forms a radio frequency signal after passing through an electronic device. When structural nonlinearity or material nonlinearity exists in the electronic device, the electromagnetic wave signal forms radio frequency signals such as harmonics or stray waves after passing through the electronic device. By comparing the waveform of the radio frequency signal in the form of harmonics or stray waves with a preset waveform, the electrical connection of the electronic device and its reliability can be tested.

[0010] The coupling device may include a coupling plate, an antenna, or other device capable of coupling the RF signal to the electronic device, and the specific device may be selected based on the type of fundamental wave signal. Optionally, the RF signal formed after the fundamental wave signal passes through the electronic device may be coupled to the signal receiver through the coupling device.

[0011] In one possible embodiment, the system may further include a display device for displaying the radio frequency signal output by the signal receiver, so that an observer can determine whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the waveform of the displayed radio frequency signal. The display device can be integrated into the signal receiver or separately provided in the system for detecting the electrical connection of the electronic device. By providing the display device, the management personnel can intuitively see the waveform properties of the radio frequency signal output by the system for detecting the electrical connection of the electronic device after detecting the electronic device, thereby being able to judge whether the electrical connection of the electronic device is normal and the quality of the electrical connection based on human experience.

[0012] In another possible embodiment, the system may further include a processor configured to obtain the RF signal output by the signal receiver, compare the waveform of the RF signal with a preset waveform, and determine, based on the comparison result, whether the electrical connection of the electronic device is normal and the reliability of the electrical connection. By providing this processor, there is no need for human intervention to determine whether the electrical connection of the electronic device is normal and the quality of the electrical connection based on the waveform of the output and displayed RF signal, thereby avoiding waste of manpower and errors in subjective judgment, and further improving the efficiency and quality of electronic device detection.

[0013] Specifically, the preset waveform may be a waveform of a radio frequency signal formed after the fundamental wave signal passes through a standard sample, and the standard sample may refer to a sample with normal or nearly normal electrical connection.

[0014] In one optional approach, the signal generator, coupling device, and signal receiver can all be RF-connected to the processor. The processor can also be responsible for controlling the operation of other components, such as controlling the signal generator to transmit a fundamental signal of a preset frequency, controlling the signal receiver to collect and output RF signals, and controlling the frequency selection of the signal controller. It is understood that the processor is a device that stores a corresponding control program, such as a signal processor or a central control unit.

[0015] In one possible implementation, the waveform of the radio frequency signal is compared with a preset waveform to determine whether the electrical connection of the electronic device is normal and the reliability of its electrical connection based on the comparison result. Specifically, when the amplitude of the radio frequency signal is less than or equal to the preset value, it can be determined that the electrical connection of the electronic device to be tested is normal and the reliability of the electrical connection meets the preset requirements; when there is a problem of structural nonlinearity or material nonlinearity in the electronic device, the fundamental wave signal will form harmonics or stray radio frequency signals after passing through the electronic device. Therefore, the amplitude of the output radio frequency signal will usually be greater than the amplitude of the standard sample. At this time, it can be determined that the electrical connection reliability of the electronic device does not meet the preset requirements.

[0016] In one possible embodiment, the system may further include a first signal controller configured to perform at least one of the following processing on the fundamental wave signal before transmitting it to the coupling device: amplification, filtering, RF signal control, and interference noise suppression. Amplifying the fundamental wave signal increases its power, thereby enabling it to be effectively transmitted to the electronic device under test. Filtering the fundamental wave signal removes noise from the fundamental wave signal, thereby increasing its purity and improving its transmission quality and reception performance.

[0017] In one possible embodiment, the system may further include a second signal controller configured to perform at least one of the following processing steps on the RF signal formed after the fundamental signal passes through the electronic device, and then transmit the result to the signal receiver: filtering or bandpass processing. Filtering the RF signal removes noise and extracts useful signals, thereby improving the accuracy and efficiency of subsequent processing and analysis. Bandpass processing can also reduce the proportion of spurious signals in the RF signal, thereby improving the receiving sensitivity of the RF signal.

[0018] The signal controller can be a radio frequency control box, a low-noise amplifier, or a signal processor. By performing the aforementioned preprocessing on the fundamental wave signal, the signal controller can improve the coupling efficiency between the fundamental wave signal and the electronic device, thereby enhancing detection sensitivity and accuracy. Optionally, the first and second signal controllers can be two independent devices or integrated into the same device.

[0019] In a possible embodiment, the system may further include a pressure unit, which is used to apply a preset pressure to at least one part to be tested of the electronic device, so that the peak value of the radio frequency signal formed after the fundamental wave signal passes through the at least one part to be tested of the electronic device fluctuates. By comparing the fluctuation range of the radio frequency signal peak value with the preset range, and determining the reliability of the electrical connection of the electronic device under the preset pressure based on the comparison result, it is possible to promptly detect products with poor electrical connections, avoid the above-mentioned electronic devices from flowing into downstream production lines, and thereby improve product yield.

[0020] Among them, the parts to be tested may be parts that have a relatively important impact on the reliability of the electrical connection of the electronic device, such as riveted points, spot welding parts, and hard connection parts of metal structural parts in the electronic device. When the above parts have structural nonlinearity or material nonlinearity, passive intermodulation occurs when the fundamental signal passes through the above parts, generating radio frequency signals such as harmonics or stray waves. When the above parts are subjected to a preset pressure, the peak value of the harmonic or stray wave will fluctuate. By comparing the fluctuation range of the peak value with the preset range, the reliability of the electrical connection of the electronic device under the preset pressure can be judged.

[0021] It is understandable that the preset pressure can be the pressure value that the electronic device may withstand under actual working conditions, so as to simulate the electrical connection situation of the electronic device during actual use, thereby predicting the reliability of the electrical connection of the electronic device.

[0022] Optionally, the pressure unit may also apply dynamic pressure to the tested part of the electronic device to detect the electrical connection of the tested part under different pressure values, and determine the stability of the electrical connection of the electronic device based on the fluctuation of the radio frequency signal.

[0023] In one possible embodiment, the pressure unit may include, but is not limited to, at least one of a vibration table and a pressure gauge. The pressure gauge includes a sensor and at least one pressurizing unit connected to the sensor. The pressurizing unit is used to apply a preset pressure to at least one test site. The sensor is used to monitor the actual pressure experienced by the at least one test site. The actual pressure is used to detect whether the pressurizing unit has applied the preset pressure to the at least one test site, thereby reducing detection errors. The vibration table can be an instrument that vibrates electronic equipment to simulate the environment in which the electronic equipment may be transported or in other working conditions.

[0024] In a second aspect, the present application further provides a method for detecting electrical connection of an electronic device, the method comprising the following steps:

[0025] The RF signal formed after the fundamental wave signal passes through the electronic device under test is collected. The fundamental wave signal is the signal emitted by the signal generator and coupled to the electronic device. The waveform of the RF signal is compared with a preset waveform, and based on the comparison result, the normality and reliability of the electronic device's electrical connection are determined. The preset waveform is the waveform of the RF signal formed after the fundamental wave signal passes through a standard sample. The standard sample refers to a sample with normal electrical connection. It is understood that the standard sample can be a non-destructive sample of the electronic device or a sample with minor defects, and the specific selection can be based on actual needs.

[0026] It can be seen that the method in the present application transmits a fundamental wave signal and couples the fundamental wave signal to an electronic device to form a radio frequency signal, and then compares the waveform of the radio frequency signal with a preset waveform. Based on the comparison result, it can be determined whether the electrical connection of the electronic device is normal and the reliability of its electrical connection.

[0027] In one possible embodiment, comparing the waveform of the radio frequency signal with a preset waveform, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result, includes:

[0028] The amplitude of the radio frequency signal is compared with a preset threshold value, and whether the electrical connection of the electronic device is normal and the reliability of the electrical connection are determined based on the comparison result; wherein the threshold value is the amplitude of the radio frequency signal formed after the fundamental wave signal passes through the standard sample. Specifically, when the amplitude of the radio frequency signal is less than or equal to the preset threshold value, it can be determined that the electrical connection of the electronic device is normal and the reliability of the electrical connection meets the preset requirements; when there is a problem of structural nonlinearity or material nonlinearity in the electronic device, the fundamental wave signal will form a harmonic or spurious radio frequency signal after passing through the electronic device. Therefore, if the amplitude of the radio frequency signal is greater than the preset threshold value, it can be determined that the electrical connection quality of the electronic device does not meet the preset requirements.

[0029] In another possible embodiment, comparing the waveform of the radio frequency signal with a preset waveform, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result, includes:

[0030] The fluctuation range of the peak value of the radio frequency signal is compared with a preset range, and the reliability of the electrical connection of the electronic device under the action of a preset pressure is determined based on the comparison result, wherein the preset pressure is applied to at least one part of the electronic device to be tested; the preset range is the fluctuation range of the peak value of the radio frequency signal formed after the fundamental wave signal passes through the standard sample when the preset pressure is applied to the standard sample.

[0031] Among them, the part to be tested may be a part that has a relatively important impact on the reliability of the electrical connection of the electronic device, such as the riveted points, spot welding parts, and hard connection parts of metal structural parts. The connection interface of the above-mentioned part to be tested is a rough interface at the microscopic level, that is, the connection interface is a micro-convex contact. When the current passes through the connection interface, contact impedance is generated. Under the action of a preset pressure, the contact area of ​​the micro-convex changes, thereby causing the current density to change, and then causing the fluctuation of the radio frequency signal (harmonic or stray signal). Therefore, by comparing the fluctuation range of the peak value of the radio frequency signal with the preset range, and determining the reliability of the electrical connection of the electronic device under the preset pressure based on the comparison result. Specifically, when the fluctuation range of the peak value of the radio frequency signal is less than or equal to the preset range, it can be determined that the electrical connection reliability of the electronic device under the preset pressure meets the preset requirements; when the fluctuation range of the peak value of the radio frequency signal is greater than the preset range, it can be determined that the electrical connection reliability of the electronic device does not meet the preset requirements.

[0032] It is understood that the preset pressure can be a pressure value that the electronic device may withstand under actual operating conditions, thereby simulating the electrical connection conditions of the electronic device during actual use, thereby predicting the reliability of the electronic device's electrical connection. Optionally, dynamic pressure can be applied to the test area to test the stability of its electrical connection under different pressure values.

[0033] In a possible embodiment, when the number of parts to be tested is at least two and the fluctuation range of the peak value of the radio frequency signal is greater than a preset range, that is, when the electrical connection reliability of the electronic device does not meet the preset requirements, a preset pressure is applied to two or more parts to be tested in sequence, and the fluctuation range of the corresponding radio frequency signal peak value is obtained; the fluctuation range is compared with the preset range to judge the electrical connection reliability of the two or more parts to be tested respectively, thereby finding out which part or parts to be tested cause the electrical connection reliability of the electronic device to fail to meet the preset requirements, thereby facilitating subsequent targeted improvements to the structure of the electronic device.

[0034] For example, the frequency of the fundamental wave signal can be 0.1 GHz to 10 GHz. Within this range, the fundamental wave signal can be coupled to the electronic device, thereby improving the detection sensitivity of the RF signal. The power of the fundamental wave signal can be greater than or equal to 1 W. Within this range, the fundamental wave signal can be coupled to the electronic device, thereby improving the detection sensitivity of the RF signal.

[0035] In a possible embodiment, the modulation mode of the fundamental wave signal transmitted by the signal generator includes Quadrature Phase Shift Keying (QPSK), Quadrature Amplitude Modulation (QAM), etc.

[0036] For the beneficial effects that can be achieved by each possible implementation method in the above second aspect, please refer to the description of the beneficial effects that can be achieved by the corresponding optional implementation method in the above first aspect, and the repetitions will not be discussed here. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A schematic diagram of an existing waveform detection method for detecting a device under test;

[0038] Figure 2 This is a schematic diagram of the architecture of a system for detecting electrical connections of electronic devices provided by the present application;

[0039] Figure 3 This is a schematic structural diagram of an integrated arrangement of a signal control component, a coupling device, and a carrying device according to an embodiment of the present application;

[0040] Figure 4 This is a schematic structural diagram of a system for detecting electrical connections of an electronic device according to an embodiment of the present application;

[0041] Figure 5 for Figure 4 Cross-section at AA in the middle;

[0042] Figure 6 This is a schematic diagram of performing electrical connection detection on at least one tested portion of an electronic device according to an embodiment of the present application;

[0043] Figure 7 A side view of a system for detecting electrical connections of an electronic device according to an embodiment of the present application;

[0044] Figure 8 for Figure 7 The enlarged view of point B in FIG.

[0045] Figure 9 This is a flow chart of a method for detecting electrical connection of an electronic device according to an embodiment of the present application.

[0046] Reference numerals:

[0047] 10-Device under test; 20-Vector network analyzer; 21-Pog-pin magnetic probe;

[0048] 100-signal generator; 200-coupling device; 300-signal receiver; 400-housing; 410-support plate; 500-electronic device; 510-part to be measured; 600-carrying device; 700-signal control component; 710-first signal controller; 720-second signal controller; 800-pressure unit; 810-pressure gauge; 811-pressurizing part; 812-sensor; 813-first driving member; 814-second driving member; 900-display device. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical solutions and advantages of this application clearer, this application will be further described in detail below with reference to the accompanying drawings.

[0050] The terms used in the following embodiments are only for the purpose of describing specific embodiments and are not intended to limit the present application. As used in the specification and appended claims of this application, the singular expressions "a", "an", "above", "the", and "this" are intended to also include expressions such as "one or more", unless the context clearly indicates otherwise.

[0051] References to "one embodiment" or "some embodiments" in this specification mean that a particular feature, structure, or characteristic described in conjunction with that embodiment is included in one or more embodiments of the present application. Thus, phrases such as "in one embodiment," "in some embodiments," "in other embodiments," and "in yet other embodiments" appearing in various places in this specification do not necessarily refer to the same embodiment, but rather mean "one or more but not all embodiments," unless otherwise specifically emphasized. The terms "including," "comprising," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.

[0052] During factory inspection of electronic devices (such as mobile phones and tablets) or their structural components, it is necessary to verify the electrical connections and their reliability. This allows for the timely detection of defective products with abnormal electrical connections or those that fail to meet pre-set reliability requirements, allowing these defective products to be intercepted before shipment, effectively improving production yield. Currently, waveform testing of electronic devices is primarily performed using vector network analyzers to determine whether the electrical connections are functioning properly.

[0053] Figure 1This is a schematic diagram of the existing waveform detection method for detecting the device under test, refer to Figure 1 The vector network analyzer 20 is adsorbed on the test connection point of the device under test (DUT) 10, such as the pad point, through the Pog-pin magnetic probe 21. The existing signal in the circuit of the DUT 10 is transmitted to the vector network analyzer 20 through the Pog-pin magnetic probe 21. The vector network analyzer 20 performs necessary processing on the received signal to generate a detection waveform. By comparing the detection waveform with the standard waveform, it is determined whether the electrical connection of the DUT 10 is normal.

[0054] When the device under test is subjected to external force or vibration, the Pog-pin magnetic probe may have poor overlap problems, and poor contact will interfere with the result judgment. Therefore, the above waveform detection method can only detect static damage to the device under test, and cannot detect the reliability of the electrical connection and the quality of the electrical connection when the device under test is subjected to external force or vibration. In addition, the device under test needs to reserve a test connection point to connect the Pog-pin probe, and the detection conditions are restricted.

[0055] In view of this, embodiments of the present application provide a system for detecting the electrical connection of an electronic device, thereby enabling electrical connection detection of the electronic device without requiring a test connection point to be set up on the electronic device under test, and also enabling inspection of the reliability of the electrical connection. The system can perform electrical connection detection on the entire electronic device or on only some of the electronic device's structural components.

[0056] Figure 2 This is a schematic diagram of the architecture of a system for detecting electrical connections of electronic devices provided by this application, with reference to Figure 2 The system includes a signal generator 100, a coupling device 200, a signal receiver 300 and a carrying device 600; wherein the carrying device 600 is used to carry the electronic device 500 to be tested and is insulated from the electronic device 500; the signal generator 100 is used to transmit a fundamental wave signal of a preset frequency, the coupling device 200 is used to receive the fundamental wave signal and couple the fundamental wave signal to the electronic device 500, and the signal receiver 300 is used to receive the radio frequency signal formed after the fundamental wave signal passes through the electronic device 500, and output the radio frequency signal, and the radio frequency signal is used to detect the electrical connection of the electronic device 500 and its electrical connection reliability.

[0057] When using the above system to test the electrical connection of electronic device 500, no connection is required between signal generator 100, signal receiver 300, coupling device 200, and electronic device 500. As long as signal transmission can be achieved, coupling device 200 can couple the fundamental wave signal to electronic device 500. Therefore, electronic device 500 does not need to set a test connection point to test the electrical connection of electronic device 500, making the system more applicable. Compared with existing vector network analyzers that can only detect whether the electrical connection of electronic device 500 is normal, this system transmits a fundamental wave signal of a preset frequency to electronic device 500, causing electronic device 500 to generate a radio frequency signal. By analyzing the waveform of the radio frequency signal, it can not only detect whether the electrical connection of electronic device 500 is normal, but also test the reliability of the electrical connection of electronic device 500. This prevents electronic devices 500 with abnormal electrical connections or whose electrical connection reliability does not meet the preset requirements from entering downstream production lines or entering the market, thereby improving product yield.

[0058] The fundamental wave signal transmitted by the signal generator 100 may be modulated using a variety of modulation schemes, including Quadrature Phase Shift Keying (QPSK) and Quadrature Amplitude Modulation (QAM). The signal generator 100 and the signal receiver 300 may be independent devices or integrated into a single device, such as a signal transceiver assembly.

[0059] Optionally, the fundamental wave signal emitted by the signal generator 100 can be a high-frequency radio frequency signal to improve detection sensitivity. For example, the frequency of the fundamental wave signal emitted by the signal generator 100 can be 0.1 GHz-10 GHz. Within the above range, it helps the fundamental wave signal to couple to the electronic device and improve the detection sensitivity of the radio frequency signal. Examples of the frequency of the fundamental wave signal are 0.1 GHz, 1 GHz, 3 GHz, 5 GHz, 7 GHz, 10 GHz, or any other value between 0.1 GHz and 10 GHz. Exemplarily, the power of the fundamental wave signal is greater than or equal to 1 W. Within the above range, it helps the fundamental wave signal to couple to the electronic device 500 and improve the detection sensitivity of the radio frequency signal. The power of the fundamental wave signal can be 1 W, 3 W, 5 W, 9 W, 15 W, 30 W, etc.

[0060] Continue to refer to Figure 2The system may further include a first signal controller 710, which is configured to amplify, filter, control the RF signal, and suppress interference noise on the fundamental wave signal before transmitting it to the coupling device 200. Amplifying the fundamental wave signal can increase the power of the fundamental wave signal, thereby enabling the fundamental wave signal to be effectively transmitted to the electronic device under test 500. Filtering the fundamental wave signal can remove noise from the fundamental wave signal to improve the purity of the fundamental wave signal, thereby improving the transmission quality and reception performance of the fundamental wave signal.

[0061] The system may also include a second signal controller 720, which is configured to filter and perform bandpass processing on the RF signal formed after the fundamental signal passes through the electronic device 500, and then transmit the signal to the signal receiver 300. Filtering the RF signal removes noise from the RF signal and extracts useful signals, thereby improving the accuracy and efficiency of subsequent processing and analysis. Bandpass processing can reduce the proportion of other spurious signals in the RF signal, thereby improving the signal's receiving sensitivity.

[0062] The first signal controller 710 and the second signal controller 720 may be two independent devices, or they may be integrated into the same device, which may be referred to as a signal control component 700. For example, the signal control component 700 may be a radio frequency control box, a low noise amplifier, or a radio frequency signal processor.

[0063] It is understood that the coupling device 200 is not limited in this application, as long as it can transmit the fundamental wave signal to the electronic device 500. For example, the coupling device 200 can be a coupling plate or an antenna. Optionally, the RF signal generated by the fundamental wave signal passing through the electronic device 500 can be transmitted to the signal receiver 300 via the coupling device 200.

[0064] The function of the carrier 600 is, on the one hand, to limit the position of the electronic device 500 under test to prevent it from being displaced by external forces and affecting the test results; on the other hand, it provides insulation protection to prevent the electrical connection reliability of the electronic device 500 from being affected by surrounding components. The shape of the carrier 600 is designed based on the electronic device 500 under test, as long as it can limit the position of the electronic device 500. Furthermore, this application does not specify the material of the carrier 600; as long as at least the surface portion of the carrier 600 is made of an insulating material to insulate the electronic device 500 from other surrounding components, it is sufficient.

[0065] For example, the electronic device to be tested is a mobile phone case. Figure 3This is a schematic diagram of the structure of the integrated arrangement of the signal control component, the coupling device and the carrying device according to an embodiment of the present application, with reference to Figure 3 The carrier device 600 is a groove designed according to the shape of the mobile phone case to be tested, which serves to limit the position of the mobile phone case and prevent it from being displaced when subjected to external forces during the test process, thereby affecting the test results. In addition, the carrier device 600 can be disposed on the surface of one side of the coupling device 200 to facilitate the coupling device 200 to couple the fundamental wave signal to the electronic device 500. Optionally, to ensure insulation between the electronic device 500 and the coupling device 200, the carrier device 600 is made of an insulating material, such as plastic, ceramic, or glass.

[0066] It is understandable that there is no need for structural connection between the signal generator 100, the signal receiver 300, the coupling device 200, the first signal controller 710 and the second signal controller 720 and the electronic device 500 in the present application. Therefore, the relative positions of the above components are not limited in the present application. The above components can be arranged in a dispersed manner or in an integrated manner, and can be flexibly arranged according to the size, position, etc. of the electronic device to be tested and other components, as long as the radio frequency connection can be achieved.

[0067] above Figure 2 The various components in the can be integrated into a device framework, such as Figure 4 and Figure 5 As shown, Figure 2 The components shown in the figure are concentrated on the internal structure of the device. Figure 4 As shown, the device has a housing 400, Figure 2 The various components shown in the figure can be arranged inside the housing 400. The housing is used to Figure 2 The various components in it play a protective role, and they can also be beautiful and easy to move. Figure 5 for Figure 4 The cross-sectional view at AA in the middle is as follows: Figure 5 As shown, the first signal controller 710 and the second signal controller 720 (i.e., the signal control assembly 700), the signal generator 100, and the signal receiver 300 are all disposed on the support plate 410 within the housing 400, and the coupling device 200 is disposed on a surface of the signal control assembly 700 facing away from the support plate 410. The integration of these components within the housing 400 not only facilitates transportation but also shortens the signal transmission distance between the components.

[0068] As an optional embodiment, the system may also include a display device, which is used to display the radio frequency signal output by the signal receiver, so that the observer can determine whether the electrical connection of the electronic device is normal and the reliability of its electrical connection based on the waveform of the displayed radio frequency signal, such as the amplitude of the radio frequency signal, the fluctuation range of the peak value of the radio frequency signal, etc. The display device can be integrated into the signal receiver, or it can be separately provided in the system for detecting the electrical connection of the electronic device. By providing the display device, the management personnel can intuitively see the waveform properties of the radio frequency signal output by the system for detecting the electrical connection of the electronic device after detecting the electronic device, so that they can judge whether the electrical connection of the electronic device is normal and the quality of the electrical connection, etc., based on human experience. Figure 4 and Figure 5 As shown, including Figure 2 A display device 900 may be provided in each component of the detection device shown. The display device 900 is equivalent to a display screen that can display the radio frequency signal received by the signal receiver 300 inside the detection device for analysis and use by management personnel or maintenance personnel.

[0069] As another optional embodiment, the system may further include a processor configured to obtain the RF signal output by the signal receiver 300, compare the waveform of the RF signal with a preset waveform, and determine, based on the comparison result, whether the electrical connection of the electronic device 500 is normal and the reliability of the electrical connection. The preset waveform may be the waveform of the RF signal formed after the fundamental wave signal passes through a standard sample. The standard sample may refer to a sample with normal or nearly normal electrical connection, and the specific design is based on actual needs. For example, if the electronic device to be tested is a mobile phone case made of aluminum alloy, the standard sample may be a non-destructive aluminum alloy block.

[0070] Optionally, the signal generator 100, the coupling device 200, and the signal receiver 300 can all be electrically connected to the processor. The processor can be responsible for controlling the operation of other devices, such as controlling the signal generator 100 to transmit a fundamental signal of a preset frequency, controlling the signal receiver 300 to collect and store stray signals, and controlling the frequency selection of the signal control component 700. Figure 4 and Figure 5 As shown, the processor can be integrated into the display device 900 and the judgment result can be directly displayed through the display device 900.

[0071] It is understood that the processor can be a device storing a corresponding control program, such as a signal processor or a central control unit. By providing a processor, it is possible to directly display whether the reliability of the electronic device's electrical connection meets preset requirements, eliminating the need for manual judgment of whether the electronic device's electrical connection is normal and the quality of the electrical connection based on the waveform of the output and displayed RF signal. This can avoid waste of manpower and errors caused by human subjective judgment, thereby improving the efficiency and quality of electronic device testing.

[0072] Among them, the waveform of the radio frequency signal is compared with a preset waveform to determine whether the electrical connection of the electronic device is normal and the reliability of its electrical connection based on the comparison result. Specifically, when the amplitude of the radio frequency signal is less than or equal to the preset value, it is determined that the electrical connection of the electronic device to be tested is normal and the reliability of the electrical connection meets the preset requirements; when there is a problem of structural nonlinearity or material nonlinearity in the electronic device, the fundamental wave signal will form harmonics or stray radio frequency signals after passing through the electronic device. Therefore, the amplitude of the output radio frequency signal will usually be greater than the amplitude of the standard sample. At this time, it can be determined that the reliability of the electrical connection of the electronic device does not meet the preset requirements.

[0073] Please refer to Figure 5 and Figure 6 As shown, the system may further include a pressure unit 800, which is used to apply a preset pressure to at least one test portion 510 of the electronic device 500, so as to cause the peak value of the radio frequency signal formed after the fundamental wave signal passes through the at least one test portion 510 of the electronic device 500 to fluctuate. Subsequently, the fluctuation range of the radio frequency signal peak value can be compared with the preset range, and the reliability of the electrical connection of the electronic device 500 under the preset pressure can be determined based on the comparison result, so that the electronic device 500 with abnormal electrical connection or whose electrical connection reliability does not meet the preset requirements can be discovered in time, so as to prevent the above-mentioned electronic device 500 from flowing into the downstream production line, thereby improving the product yield.

[0074] It is understandable that when the pressure unit 800 applies a preset pressure to the electronic device 500, the supporting device 600 can limit the electronic device 500 to prevent it from displacing under the preset pressure, resulting in the actual pressure on at least one measured part 510 being inconsistent with the preset pressure.

[0075] Among them, the parts to be tested may be parts that have a relatively important impact on the reliability of the electrical connections of electronic equipment, such as riveted points, spot welding parts, and hard connection parts of metal structural parts. When the above parts have structural nonlinearity or material nonlinearity, passive intermodulation will occur when the fundamental signal passes through the above parts, generating radio frequency signals such as harmonics or stray waves. When the above parts are subjected to preset pressure, the peak value of the radio frequency signal will fluctuate.

[0076] As an optional embodiment, the pressure applied by the pressure unit 800 can be constant or variable, i.e., dynamic pressure. The magnitude of the pressure and whether dynamic pressure is applied can be designed based on actual needs. For example, the pressure conditions to which electronic devices are subjected under actual operating conditions can be simulated, thereby enabling the reliability of the electrical connections of electronic devices after they enter the market.

[0077] The pressure unit 800 includes but is not limited to at least one of a vibration table and a pressure gauge. The following is a specific description using a pressure gauge as an example. Figure 7 This is a side view of a system for detecting electrical connections of electronic devices according to an embodiment of the present application. Figure 8 for Figure 7 Please refer to the enlarged view of point B in Figures 5 to 8 The pressure gauge 810 includes a sensor 812 and at least one pressurizing unit 811 connected to the sensor 812. The pressurizing unit 811 is used to apply a preset pressure to at least one test site 510 of the electronic device 500. The sensor 812 is used to monitor the actual pressure applied to the at least one test site 510. The actual pressure is used to detect whether the pressurizing unit 811 has applied the preset pressure to the at least one test site 510, thereby reducing detection errors. It is understood that the pressure gauge 810 can apply pressure to two or more test sites 510 simultaneously to improve detection efficiency.

[0078] Optionally, the pressure gauge 810 also includes a driving assembly connected to the pressurizing part 811, and the driving assembly includes a first driving member 813 and a second driving member 814. The first driving member 813 is used to drive the pressurizing part 811 to move in the horizontal direction, and the second driving member 814 is used to drive the pressurizing part 811 to move in the vertical direction, thereby adjusting the position of the pressurizing part 811 so that the pressurizing part 811 is aligned with the part to be tested and applies a preset pressure to at least one part to be tested 510. Among them, the structures of the first driving member 813 and the second driving member 814 can both be existing slide rail and slider assemblies. For example, the first driving member 813 includes a slide rail extending in the horizontal direction and a slider slidably connected to the slide rail. The slider is transmission-connected to the pressurizing part 811, thereby driving the pressurizing part 811 to move in the horizontal direction. For the specific structure of the second driving member 814, please refer to the structure of the first driving member 813, which will not be repeated here.

[0079] As another optional embodiment, the pressure unit 800 can also be a vibration table. The specific structure of the vibration table is not limited in this application. It only needs to vibrate the electronic device to be tested to simulate the stress conditions of the electronic device during transportation or other working conditions.

[0080] Optionally, the processor may be electrically connected to the pressure unit, thereby controlling the pressure unit to apply a preset pressure to the electronic device to be tested, and regulating the magnitude of the actual pressure, etc. Specifically, when the pressure unit is a pressure gauge, the processor may control the pressurizing portion to apply a preset pressure to at least one part to be tested, and the sensor monitors the actual pressure borne by at least one part to be tested, and converts the pressure signal into an electrical signal, which is then transmitted to the processor. The processor displays the waveform of the received electrical signal on a display device, so that an observer can monitor the actual pressure value applied to at least one part to be tested in real time through the display device, thereby adjusting the pressure gauge to avoid the possibility that the part to be tested is not subjected to force or the actual pressure is inconsistent with the preset pressure, thereby reducing detection errors.

[0081] Please refer to Figures 2 to 8 The working process of the system for detecting the electrical connection of an electronic device in this application is described in detail as follows:

[0082] The control signal generator 100 transmits a fundamental wave signal of a preset frequency. The fundamental wave signal is processed by the first signal controller 710, for example, to amplify the power of the fundamental wave signal. The processed fundamental wave signal is then transmitted to the electronic device 500 via the coupling device 200. The pressure unit 800 is used to apply a preset pressure to at least one test portion 510 of the electronic device 500. The fundamental wave signal is converted into a radio frequency signal by the electronic device 500. The radio frequency signal is processed by the second signal controller 720, for example, to filter out interference signals such as the fundamental wave signal. The processed radio frequency signal is then coupled to the signal receiver 300 via the coupling device 200. Under the action of the preset pressure, the peak value of the radio frequency signal fluctuates. The processor can compare the fluctuation range of the peak value of the radio frequency signal with a preset range and determine the reliability of the electrical connection of the electronic device 500 under the preset pressure based on the comparison result.

[0083] Based on the same technical concept, the present application also provides a method for detecting electrical connection of an electronic device. Figure 9 This is a flowchart of a method for detecting electrical connection of an electronic device according to an embodiment of the present application, referring to Figure 9 , Figure 9 The method shown is implemented based on the above-mentioned structural diagrams. Therefore, when referring to the method steps, you can also refer to the relevant descriptions of the above-mentioned structural diagrams for easier understanding. The method includes the following steps:

[0084] S1: The signal receiver collects the RF signal formed after the fundamental wave signal passes through the electronic device under test, wherein the fundamental wave signal is the signal emitted by the signal generator and coupled to the electronic device;

[0085] S2: The signal receiver sends the radio frequency signal to the processor. The processor compares the waveform of the radio frequency signal with a preset waveform and determines whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result.

[0086] The preset waveform can be the waveform of the RF signal formed after the fundamental wave signal passes through a standard sample. The standard sample generally refers to a sample with normal electrical connections. It is understood that the standard sample can be a non-destructive sample of the electronic device or a sample with slight defects, and the specific selection can be based on actual needs.

[0087] It can be seen that the method in the present application transmits a fundamental wave signal and couples the fundamental wave signal to an electronic device to form a radio frequency signal, and then compares the waveform of the radio frequency signal with a preset waveform. Based on the comparison result, it can not only determine whether the electrical connection of the electronic device is normal, but also judge the reliability of its electrical connection, thereby preventing electronic devices with substandard electrical connection quality from flowing into downstream production lines or entering the market, thereby improving product yield.

[0088] Among them, nonlinear structural or material parts in electronic devices, such as metal connection points, and other damaged parts can generate passive intermodulation, thereby generating harmonics or spurious signals. Therefore, the method of this application can detect whether the electrical connection of electronic devices is normal and the reliability of the electrical connection by comparing the waveform of the RF signal with a preset waveform.

[0089] In the embodiments of the present application, the fundamental wave signal can be a high-frequency, high-power fundamental wave signal to improve the sensitivity and accuracy of detection. When the fundamental wave signal is transmitted to the electronic device, passive intermodulation occurs at the joints of the metal structural parts and other damaged areas in the electronic device, generating higher-order harmonics. The real-time fluctuation of the harmonics can be used to determine the connection reliability of the electronic device under external force.

[0090] The present application does not limit the specific method of comparing the waveform of the RF signal with the preset waveform in step S2, as long as the comparison result can be used to determine whether the electrical connection of the electronic device is normal and the reliability of the electrical connection.

[0091] For example, refer to Figure 9 In step S2, one possible implementation method of comparing the waveform of the radio frequency signal with the preset waveform specifically includes:

[0092] S2-1: The processor compares the amplitude of the radio frequency signal with a preset threshold value, and determines whether the electrical connection of the electronic device is normal and the reliability of the electrical connection according to the comparison result.

[0093] Among them, the threshold is the amplitude of the radio frequency signal formed after the fundamental wave signal passes through the standard sample. Specifically, when the amplitude of the radio frequency signal is less than or equal to the preset threshold, it is determined that the electrical connection of the electronic device is normal and the reliability of the electrical connection meets the preset requirements; when there is structural nonlinearity or material nonlinearity in the electronic device, the fundamental wave signal forms harmonics or spurious signals after passing through the electronic device. Therefore, if the amplitude of the radio frequency signal is greater than the preset threshold, the electrical connection quality of the electronic device does not meet the preset requirements.

[0094] For example, continue to refer to Figure 9 Another possible implementation of comparing the waveform of the radio frequency signal with the preset waveform in step S2 specifically includes:

[0095] S2-2: The processor compares the fluctuation range of the peak value of the radio frequency signal with a preset range, and determines the reliability of the electrical connection of the electronic device under the action of a preset pressure based on the comparison result, wherein the preset pressure is applied to at least one part to be tested of the electronic device.

[0096] The preset range is the fluctuation range of the peak value of the RF signal formed after the fundamental wave signal passes through the standard sample when a preset pressure is applied to the standard sample. Specifically, when the fluctuation range of the peak value of the RF signal is less than or equal to the preset range, it can be determined that the electrical connection reliability of the electronic device under the preset pressure meets the preset requirements; when the fluctuation range of the peak value of the RF signal is greater than the preset range, it can be determined that the electrical connection reliability of the electronic device does not meet the preset requirements.

[0097] It can be understood that the part to be tested of the electronic device is usually the part that has a relatively important impact on the reliability of the electrical connection of the electronic device, such as the overlapping point of the metal structural parts in the electronic device. The connection interface of the overlapping point is a rough interface at the microscopic level, that is, the connection interface is a micro-convex contact. When the current passes through the connection interface, contact impedance is generated. Under the action of the preset pressure, the contact area of ​​the micro-convex changes, thereby causing the current density to change, and then causing fluctuations in the passive intermodulation products (harmonics or stray signals). Therefore, by analyzing its fluctuations, the reliability and stability of the electrical connection can be effectively judged.

[0098] Among them, the overlapping points of metal structural parts can be the connection points of electrical connection methods such as spot welding, riveting, interference fit, and locking screws. Through energy coupling, the passive intermodulation characteristics generated by coupling energy between metal and metal contact points are utilized to dynamically detect the electrical connection of electronic equipment and the reliability of grounding, so as to effectively ensure that the product's overall antenna performance and electromagnetic interference indicators meet the requirements.

[0099] The preset pressure applied to the at least one tested part of the electronic device may be a constant pressure or a dynamic pressure. For example, dynamic pressure is applied to the at least one tested part to detect the stability of the electrical connection under different pressure values.

[0100] When actually testing the electrical connection of an electronic device, the electronic device usually has two or more parts to be tested, and a preset pressure can be applied to the two or more parts to be tested at the same time. As long as the fluctuation range of the peak value of the radio frequency signal is greater than the preset range, it can be determined that the electrical connection reliability of the electronic device does not meet the preset requirements, thereby effectively improving the detection efficiency. In order to further determine which specific one or several parts of the two or more parts to be tested cause the electrical connection reliability of the electronic device to fail to meet the preset requirements, the preset pressure can also be applied to the above-mentioned parts to be tested in turn, and the fluctuation range of the peak value of the corresponding radio frequency signal is compared with the preset range one by one by the processor, and the reliability of the electrical connection of the above-mentioned parts to be tested under the preset pressure is determined in turn according to the comparison results, thereby screening out the specific parts that cause the electrical connection reliability of the electronic device to fail to meet the preset requirements, and then facilitating the subsequent targeted improvement of the electrical connection quality of the above-mentioned parts.

[0101] The system and method for detecting electrical connections of electronic devices in the present application will be further described in detail below with reference to specific embodiments and comparative examples.

[0102] Example 1

[0103] This embodiment provides a system and method for detecting electrical connections of electronic devices. Figures 4 to 8 The system includes a housing 400, a signal generator 100 arranged in the housing 400, a coupling device 200, a signal receiver 300, a carrying device 600, a signal control component 700, a pressure unit 800, a display device 900 and a processor; wherein the signal control component 700 is a radio frequency control box, the coupling device 200 can be a coupling plate, the pressure unit 800 can be a pressure gauge 810, the processor can be integrated on the display device 900, the signal generator 100 and the signal receiver 300 can be integrated to form a signal transceiver component, the signal transceiver component, the coupling plate, the signal control component 700, and the pressure gauge 810 can all be arranged on the support plate 410 in the housing 400, the carrying device 600 is arranged on the surface of the coupling plate away from the support plate 410, the electronic device 500 to be tested can be a mobile phone or other device, and the carrying device 600 can be a plastic groove designed according to the shape of the electronic device to be tested, such as a mobile phone.

[0104] When the above system tests the electrical connection of a mobile phone, the processor can control the signal generator 100 to transmit a fundamental wave signal in the required operating frequency band. The fundamental wave signal is amplified and modulated by the RF control box and then transmitted to the coupling plate. The amplified and modulated fundamental wave signal is then coupled to the electronic device 500 via the coupling plate. The pressure gauge 810 applies dynamic pressure to four test locations 510 of the electronic device 500. The test locations 510 can be welding points on the mobile phone. The pressure gauge 810 includes a pressurizing portion 811 and a first driving member 813 and a second driving member 814 connected to the pressurizing portion 811. The pressurizing portion 811 is aligned with the welding points under the drive of the first and second driving members 813 and 814. The pressurizing portion 811 applies a preset pressure to the welding points. The supporting device 600 both limits the mobile phone and insulates the mobile phone from the coupling plate, thereby preventing interference with the test results.

[0105] After passing through the mobile phone, the fundamental wave signal forms an RF signal. The RF control box performs bandpass processing and filtering on the RF signal. The processed RF signal is then transmitted to the signal receiver 300 via the coupling plate. The signal receiver 300 receives the RF signal and transmits it to the processor. The processor compares the fluctuation range of the RF signal's peak value with a preset range and, based on the comparison result, determines whether the tested mobile phone's electrical connection is normal and its reliability under dynamic pressure. The preset range is the fluctuation range of the RF signal's peak value formed after the fundamental wave signal passes through a nondestructive mobile phone with a normal electrical connection when a preset pressure is applied to the nondestructive mobile phone.

[0106] Among them, when a mobile phone coupled with fundamental signal energy is subjected to a preset pressure and there is structural nonlinearity or material nonlinearity at the welding point resulting in unreliable electrical connection, passive intermodulation will occur, generating higher harmonics. If the fluctuation range of the peak value of the higher harmonics is greater than the preset range, it means that the electrical connection reliability of the mobile phone under test does not meet the preset requirements.

[0107] Example 2

[0108] This embodiment provides a system and method for detecting electrical connections of electronic devices. For the specific structure of the system and the specific steps of the method in Example 2, please refer to the above-mentioned Example 1. The difference is that the pressure unit 800 in Example 2 is a vibration table. The mobile phone to be tested vibrates at a frequency of 2 kHz under the action of the vibration table, and can also vibrate at a variable frequency. The other specific structures and method steps are the same as those in Example 1, and the repeated parts are not discussed here.

[0109] Obviously, those skilled in the art may make various changes and modifications to the present application without departing from the scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include these modifications and variations.

Claims

1. A system for detecting electrical connections of electronic equipment, characterized in that: It includes a signal generator, a coupling device, a signal receiver and a carrying device; The carrying device is used to carry the electronic device to be tested and is insulated from the electronic device; The signal generator is used to transmit a fundamental wave signal of a preset frequency; The coupling device is used to receive the fundamental wave signal and couple the fundamental wave signal to the electronic device; The signal receiver is used to receive the radio frequency signal formed after the fundamental wave signal passes through the electronic device, and output the radio frequency signal, wherein the radio frequency signal is used to detect the electrical connection of the electronic device and the reliability of the electrical connection.

2. The system according to claim 1, wherein Also includes: The display device is used to display the radio frequency signal output by the signal receiver, so that an observer can determine whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the waveform of the displayed radio frequency signal.

3. The system according to claim 1, wherein: Also includes: a processor, configured to obtain the radio frequency signal output by the signal receiver, compare a waveform of the radio frequency signal with a preset waveform, and determine whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result; The preset waveform is the waveform of the radio frequency signal formed after the fundamental wave signal passes through a standard sample, and the standard sample refers to a sample with normal electrical connection.

4. The system according to any one of claims 1 to 3, wherein: Also includes: The first signal controller is configured to perform at least one of the following processing steps on the fundamental wave signal transmitted by the signal generator and transmit the fundamental wave signal to the coupling device: Amplification processing, filtering processing, RF signal control, interference noise suppression.

5. The system according to any one of claims 1 to 4, wherein: Also includes: The second signal controller is configured to perform at least one of the following processing steps on the radio frequency signal formed after the fundamental wave signal passes through the electronic device, and then transmit the processed signal to the signal receiver: Filtering processing, bandpass processing.

6. The system according to any one of claims 1 to 5, wherein: Also includes: The pressure unit is used to apply a preset pressure to at least one part to be tested of the electronic device, so that the peak value of the radio frequency signal formed after the fundamental wave signal passes through the at least one part to be tested of the electronic device fluctuates.

7. The system according to claim 6, wherein: The pressure unit includes at least one of a vibration table and a pressure gauge.

8. The system according to claim 6, wherein: The pressure gauge includes a sensor and at least one pressurizing part connected to the sensor; The pressurizing portion is used to apply a preset pressure to the at least one part to be tested; The sensor is used to monitor the actual pressure borne by the at least one part to be measured, and the actual pressure is used to detect whether the pressurizing part applies the preset pressure to the at least one part to be measured.

9. The system according to any one of claims 1 to 8, wherein: The coupling device includes a coupling plate or an antenna.

10. A method for detecting electrical connection of an electronic device, characterized in that: include: Collecting a radio frequency signal formed after a fundamental wave signal passes through the electronic device to be tested, wherein the fundamental wave signal is a signal emitted by a signal generator and coupled to the electronic device; Comparing the waveform of the radio frequency signal with a preset waveform, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result; The preset waveform is the waveform of the radio frequency signal formed after the fundamental wave signal passes through a standard sample, and the standard sample refers to a sample with normal electrical connection.

11. The method according to claim 10, wherein Comparing the waveform of the radio frequency signal with a preset waveform, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection according to the comparison result, including: Comparing the amplitude of the radio frequency signal with a preset threshold value, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection based on the comparison result; The threshold value is the amplitude of the radio frequency signal formed after the fundamental wave signal passes through the standard sample, and the standard sample refers to a sample with normal electrical connection.

12. The method according to claim 11, wherein Comparing the amplitude of the radio frequency signal with a preset threshold, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection according to the comparison result, including: When the amplitude of the radio frequency signal is less than or equal to the preset threshold, it is determined that the electrical connection of the electronic device is normal and the reliability of the electrical connection meets the preset requirement.

13. The method according to claim 10, wherein Comparing the waveform of the radio frequency signal with a preset waveform, and determining whether the electrical connection of the electronic device is normal and the reliability of the electrical connection according to the comparison result, including: comparing a fluctuation range of a peak value of the radio frequency signal with a preset range, and determining reliability of electrical connection of the electronic device under a preset pressure based on the comparison result, wherein the preset pressure is applied to at least one part of the electronic device to be tested; The preset range is the fluctuation range of the peak value of the radio frequency signal formed after the fundamental wave signal passes through the standard sample when the preset pressure is applied to the standard sample. The standard sample refers to a sample with normal electrical connection.

14. The method according to claim 13, wherein Comparing the fluctuation range of the peak value of the radio frequency signal with a preset range, and determining the reliability of the electrical connection of the electronic device under the preset pressure according to the comparison result, includes: When the fluctuation range of the peak value of the radio frequency signal is less than or equal to the preset range, it is determined that the electrical connection reliability of the electronic device under the preset pressure meets the preset requirement.

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