Battery management systems, diagnostic methods, battery devices and electrical equipment
By incorporating sampling auxiliary components and detection circuits within the sampling chip and utilizing control components for software diagnostics, the problems of high hardware complexity and inflexible diagnostic logic in the sampling chip are solved, enabling efficient and safe battery status acquisition and diagnostics for the battery management system.
Patent Information
- Application Number
- CN202511046143.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-29
- Publication Date
- 2025-11-14
- Estimated Expiration
- 2045-07-29
AI Technical Summary
In the prior art, the sampling chip in the battery management system has high hardware complexity and cost, and the diagnostic logic is deeply bound to the hardware structure, which lacks flexibility and increases the difficulty of development and maintenance. At the same time, the redundant hardware structure leads to insufficient overall reliability and safety of the battery management system.
By setting up a sampling auxiliary component and a first detection circuit inside the sampling chip, and using a control component to implement a software diagnostic strategy, some redundant hardware is replaced, reducing hardware complexity and cost. Furthermore, by analyzing the cell status information to diagnose the sampling path, the flexibility and reliability of the diagnostic logic are improved.
It reduces the hardware complexity and cost of the sampling chip, improves the implementation flexibility of the diagnostic logic, facilitates rapid updates to the diagnostic logic, enhances the overall reliability and safety of the battery management system, and meets functional safety level requirements.
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Figure CN120565882B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of battery technology, and in particular to battery management systems, diagnostic methods, battery devices, and electrical equipment. Background Technology
[0002] This section is intended to provide background or context for embodiments of this application. The description herein is not intended to imply that it is prior art simply because it is included in this section.
[0003] New energy batteries are being used more and more widely in daily life and industry. For example, new energy vehicles equipped with batteries are already widely used. In addition, batteries are being used more and more in the field of energy storage.
[0004] In battery devices, the Battery Management System (BMS) plays a crucial role. One of its core functions is to accurately collect state information such as cell voltage and temperature through sampling chips to ensure the safe and stable operation of the battery. To meet functional safety standards (such as ASIL C / D), related technologies typically use sampling chips to sample the state information of the cells and employ redundant hardware structures to diagnose the failure modes of the sampling chips, thereby improving sampling reliability. However, this redundant hardware structure leads to high overall hardware complexity and cost for the sampling chips. Furthermore, the diagnostic logic of the sampling chips is deeply tied to the hardware structure, lacking flexibility and increasing the overall development and maintenance difficulty of the BMS. Summary of the Invention
[0005] In view of this, the embodiments of this application aim to provide a battery management system, diagnostic method, battery device, and electrical equipment that can reduce the hardware complexity and cost of sampling chips, improve the implementation flexibility of diagnostic logic, facilitate rapid updates to diagnostic logic, reduce the overall development and maintenance difficulty of the BMS, and ensure that the BMS has a functional safety level corresponding to the diagnostic scheme using redundant hardware.
[0006] The technical solution of this application embodiment is implemented as follows:
[0007] This application provides a battery management system, including:
[0008] At least one sampling chip, each sampling chip including a sampling circuit, a sampling auxiliary component and a first detection circuit; the sampling circuit has at least one sampling path, and the at least one sampling path corresponds one-to-one with at least one cell in the battery device, for collecting the status information of the corresponding cell respectively; the sampling auxiliary component is used to assist the operation of the sampling circuit, and the first detection circuit is used to diagnose the sampling auxiliary component;
[0009] The control component, which communicates with the sampling chip, is used to acquire the status information of each battery cell. If the diagnostic results of the sampling auxiliary component indicate that the sampling auxiliary component has not failed, the control component diagnoses the sampling path corresponding to each battery cell based on the status information of each battery cell.
[0010] In the battery management system of this application embodiment, a sampling auxiliary component and a first detection circuit are set inside the sampling chip to diagnose the sampling auxiliary component. Simultaneously, if the diagnostic result of the sampling auxiliary component indicates that it has not failed, the control component diagnoses the sampling path based on the collected cell status information. Thus, compared to the related technologies that rely on redundant hardware structures to diagnose sampling chip failure modes, this application embodiment replaces some redundant hardware in the sampling chip with a software diagnostic strategy implemented by the control component. This reduces the hardware complexity and cost of the sampling chip, improves the flexibility of the diagnostic logic implementation, facilitates rapid updates to the diagnostic logic, reduces the overall development and maintenance difficulty of the BMS, and ensures that the BMS has a functional safety level corresponding to the diagnostic scheme using redundant hardware. Furthermore, since the sampling auxiliary component is used to assist the operation of the sampling circuit, its failure is a common cause of failure affecting all sampling paths, potentially impacting the sampling reliability of each sampling path in the sampling circuit. Therefore, by using a first detection circuit set inside the chip to diagnose the sampling auxiliary component in hardware, the reliability and safety of diagnosing common cause failures in each sampling path can be effectively improved, thereby enhancing the overall reliability and safety of the BMS. Furthermore, subsequent sampling path diagnostics will only continue if the sampling auxiliary component fails. This reduces the interference of sampling auxiliary component failure on sampling path diagnostics and improves the reliability of sampling path diagnostics.
[0011] In some embodiments, the sampling assistance component includes at least one of the following:
[0012] A voltage regulator is used to stabilize the supply voltage of the sampling chip within the target voltage range.
[0013] A reference voltage source is used to provide a reference voltage for the analog-to-digital converter in the sampling circuit. The analog-to-digital converter is used to convert the analog signal corresponding to the received cell status information into a digital signal to obtain the cell status information.
[0014] A clock source is used to provide a clock signal for the sampling circuit.
[0015] In the above embodiments, the sampling auxiliary components include a voltage regulator for stabilizing the supply voltage of the sampling chip within a target voltage range, a reference voltage source for providing a reference voltage to the analog-to-digital converter in the sampling circuit, and / or a clock source for providing a clock signal to the sampling circuit. Since the voltage regulator, reference voltage source, and / or clock source are core supporting components of the sampling circuit, used to assist in the stable operation of the sampling circuit, the failure of the voltage regulator, reference voltage source, and / or clock source will directly affect the accuracy of the sampled data. Therefore, integrating diagnostic capabilities for the voltage regulator, reference voltage source, and / or clock source within the sampling chip can effectively improve the reliability and safety of the entire system.
[0016] In some embodiments, the sampling chip also includes a status register;
[0017] The first detection circuit is used to write the diagnostic results of the sampling auxiliary component into the status register;
[0018] The control component is used to read the diagnostic results of the sampling auxiliary component from the status register.
[0019] In the above embodiments, by setting a status register in the sampling chip to store the diagnostic results of the sampling auxiliary component, the control component can efficiently read the diagnostic results of the sampling auxiliary component without directly exposing the internal hardware status of the sampling chip, thereby improving the security of the system.
[0020] In some embodiments, the sampling chip further includes:
[0021] The second detection circuit is used to diagnose the first detection circuit;
[0022] The control component is used to acquire the diagnostic results of the first detection circuit. If the diagnostic results of the first detection circuit indicate that the first detection circuit has not failed, the control component reads the diagnostic results of the sampling auxiliary component from the status register.
[0023] In the above embodiments, a second detection circuit is introduced to diagnose the first detection circuit itself. If the diagnosis result of the first detection circuit indicates that the first detection circuit has not failed, the diagnosis result of the sampling auxiliary component is read from the status register. This reduces false positives or false negatives caused by faults in the detection circuit itself, thereby further enhancing the overall diagnostic coverage and robustness of the system.
[0024] In some embodiments, the control component is used for at least one of the following:
[0025] Based on the difference in the state information of the two cells at the same sampling time point, determine whether the sampling path corresponding to the two cells is invalid.
[0026] Based on the changes in the state information of the same cell at at least two sampling time points, determine whether the sampling path corresponding to the cell has failed.
[0027] In the above embodiments, the sampling path corresponding to the two cells is determined to be invalid based on the difference in state information between the two cells at the same sampling time point, and / or the sampling path corresponding to the cell is determined to be invalid based on the change in state information of the same cell at at least two sampling time points. In this way, abnormal sampling paths can be identified by analyzing the differences in sampling data of multiple cells at the same time, and / or the data changes of a single cell at different times, without relying on redundant hardware structures.
[0028] In some embodiments, the cell status information includes the cell's sampling voltage, and the sampling path includes a voltage sampling path, which is used to collect the sampling voltage of the corresponding cell.
[0029] The control component is used for at least one of the following:
[0030] If the absolute value of the difference between the sampled voltages of two cells at the same sampling time point exceeds the target voltage difference threshold, then it is determined that at least one of the voltage sampling paths corresponding to the two cells has failed, and / or at least one of the two cells has an abnormal voltage.
[0031] If the rate of change of the sampled voltage of the same cell exceeds the first rate of change threshold at at least two sampling time points, it is determined that the voltage sampling path corresponding to the cell is invalid and / or the voltage of the cell is abnormal.
[0032] In the above embodiments, on the one hand, if the absolute value of the difference between the sampled voltages of two cells at the same sampling time point exceeds the target voltage difference threshold, it is determined that at least one of the voltage sampling paths corresponding to the two cells is faulty, and / or the voltage of at least one of the two cells is abnormal. In this way, by setting a reasonable target voltage difference threshold, it is possible to accurately determine whether the voltage sampling path of the cell is faulty, and / or whether the voltage of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency. On the other hand, if the rate of change of the sampled voltage of the same cell at at least two sampling time points exceeds the first rate of change threshold, it is determined that the voltage sampling path corresponding to the cell is faulty, and / or the voltage of the cell is abnormal. In this way, by setting a reasonable first rate of change threshold, it is possible to accurately determine whether the voltage sampling path is faulty, and / or whether the voltage of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency.
[0033] In some embodiments, the cell status information includes the cell's sampling temperature, and the sampling path includes a temperature sampling path, which is used to collect the sampling temperature of the corresponding cell.
[0034] The control component is used for at least one of the following:
[0035] If the absolute value of the difference between the sampled temperatures of two cells at the same sampling time point exceeds the target temperature difference threshold, then it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty, and / or at least one of the two cells has an abnormal temperature.
[0036] If the rate of change of the sampled temperature of the same cell exceeds the second rate of change threshold at at least two sampling time points, it is determined that the temperature sampling path corresponding to the cell is invalid and / or the temperature of the cell is abnormal.
[0037] In the above embodiments, on the one hand, if the absolute value of the difference between the sampled temperatures of two cells at the same sampling time point exceeds the target temperature difference threshold, it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty, and / or the temperature of at least one of the two cells is abnormal. In this way, by setting a reasonable target temperature difference threshold, it is possible to accurately determine whether the temperature sampling path of the cell is faulty, and / or whether the temperature of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency. On the other hand, if the rate of change of the sampled temperature of the same cell at at least two sampling time points exceeds the second rate of change threshold, it is determined that the temperature sampling path corresponding to the cell is faulty, and / or the temperature of the cell is abnormal. In this way, by setting a reasonable second rate of change threshold, it is possible to accurately determine whether the temperature sampling path is faulty, and / or whether the temperature of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency.
[0038] In some embodiments, the sampling chip also includes a configuration register;
[0039] The control component is used to write configuration information into the configuration register after the sampling chip is powered on, so that the sampling chip can operate based on the configuration information;
[0040] The control component is also used to read back the configuration information written to the configuration register and to diagnose the configuration register based on the written and read-back configuration information.
[0041] In the above embodiments, by performing consistency verification on the write and readback operations of the configuration register, it is possible to detect whether the configuration register is working properly, reduce the impact of configuration register failure on subsequent sampling, improve sampling accuracy, and reduce misdiagnosis or missed diagnosis of sampling auxiliary component failure and / or sampling path failure due to configuration register failure.
[0042] In some embodiments, the battery management system further includes:
[0043] A communication component is located between the sampling chip and the control component;
[0044] The control component is used to acquire the status information of each battery cell from the sampling chip through the communication component, and to diagnose the communication component based on the acquired status information of each battery cell. If the diagnosis result of the communication component indicates that the communication component has not failed, the control component diagnoses the sampling path corresponding to each battery cell based on the status information of each battery cell.
[0045] In the above embodiments, by adding a diagnostic mechanism to the communication link, failures of communication components, such as communication interruptions or data errors, can be identified. Only when the communication components are functioning correctly can the sampling path corresponding to each battery cell be diagnosed based on the status information of each cell. This improves the integrity and reliability of the sampling data obtained by the control component, thereby increasing the accuracy of sampling path diagnosis and enhancing the overall system safety performance.
[0046] This application provides a diagnostic method applied to a control component in a battery management system. The battery management system further includes at least one sampling chip communicatively connected to the control component. Each sampling chip includes a sampling circuit, a sampling auxiliary component, and a first detection circuit. The sampling circuit has at least one sampling path, and the at least one sampling path corresponds one-to-one with at least one battery cell in the battery device, used to collect the status information of the corresponding battery cell. The sampling auxiliary component is used to assist the operation of the sampling circuit.
[0047] The diagnostic method includes:
[0048] The first detection circuit is controlled to diagnose the sampling auxiliary component and obtain the diagnostic results of the sampling auxiliary component;
[0049] Acquire the status information of each battery cell;
[0050] If the diagnostic results of the sampling auxiliary component indicate that the sampling auxiliary component has not failed, the sampling path corresponding to each cell is diagnosed based on the status information of each cell.
[0051] This application provides a battery device, including at least one battery cell and the battery management system described in the above embodiments.
[0052] This application provides an electrical device that includes the battery device described in the above embodiments. Attached Figure Description
[0053] Figure 1 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 1 ;
[0054] Figure 2 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 2 ;
[0055] Figure 3 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 3 ;
[0056] Figure 4 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 4 ;
[0057] Figure 5 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 5 ;
[0058] Figure 6 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 6 ;
[0059] Figure 7 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 7 ;
[0060] Figure 8 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 8 ;
[0061] Figure 9 A schematic diagram of the implementation process of a diagnostic method provided in this application embodiment. Figure 1 ;
[0062] Figure 10 A schematic diagram of the composition structure of a battery management system provided in this application embodiment. Figure 9 ;
[0063] Figure 11 A schematic diagram of the implementation process of a diagnostic method provided in this application embodiment. Figure 2 ;
[0064] Figure 12 This is a schematic diagram of the composition structure of a battery device provided in an embodiment of this application;
[0065] Figure 13 This is a schematic diagram of the composition structure of an electrical device provided in an embodiment of this application. Detailed Implementation
[0066] It should be noted that, unless otherwise specified, the embodiments and technical features in the embodiments of this application can be combined with each other, and the detailed descriptions in the specific implementation should be understood as explanations of the purpose of this application and should not be regarded as undue limitations on this application.
[0067] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having” and any variations thereof are intended to cover non-exclusive inclusion.
[0068] In the description of the embodiments of this application, technical terms such as "first," "second," and "third" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.
[0069] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0070] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects are in an "or" relationship.
[0071] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application according to the specific circumstances.
[0072] In the description of the embodiments of this application, unless otherwise expressly specified and limited, the technical term "contact" should be interpreted broadly, and can be direct contact, contact through an intermediate medium layer, contact between two contacting parties with substantially no interaction force, or contact between two contacting parties with interaction force.
[0073] With the development of clean energy, more and more devices are using electricity as their driving force, leading to the rapid development of power batteries, such as lithium-ion batteries, which can store large amounts of electrical energy and can be repeatedly charged and discharged. These power batteries are not only used in energy storage systems such as hydropower, thermal power, wind power, and solar power plants, but also widely used in electric vehicles such as electric bicycles, electric motorcycles, and electric cars, as well as in aerospace and other fields. As the application areas of power batteries continue to expand, the market demand is also constantly increasing.
[0074] In this embodiment, the battery device can be manufactured from battery cells and / or battery modules. A battery cell refers to a single battery cell, which is the basic unit capable of converting chemical energy into electrical energy. It can be used to manufacture battery modules or battery devices to supply power to electrical devices. A single battery cell can be a primary battery or a secondary battery. A secondary battery is a battery cell that can be recharged after discharge to reactivate its active materials and continue to be used. Battery cells can be lithium-ion batteries, sodium-ion batteries, sodium-lithium-ion batteries, lithium metal batteries, sodium metal batteries, lithium-sulfur batteries, magnesium-ion batteries, nickel-metal hydride batteries, nickel-cadmium batteries, or lead-acid batteries, etc., and this embodiment is not limited to these types. A single battery cell can be cylindrical, cuboid, or other shapes.
[0075] A battery cell includes an electrode assembly, which comprises a positive electrode, a negative electrode, and a separator. During the charging and discharging process of the battery cell, active ions (such as lithium ions) repeatedly insert and extract between the positive and negative electrodes. The separator is positioned between the positive and negative electrodes to prevent short circuits while allowing active ions to pass through.
[0076] In some embodiments, the separator is a separator membrane. This application does not impose any particular limitation on the type of separator membrane; any known porous separator membrane with good chemical and mechanical stability can be selected.
[0077] As an example, the main material of the separator can be selected from at least one of glass fiber, non-woven fabric, polyethylene, polypropylene, polyvinylidene fluoride, and ceramic. The separator can be a single-layer film or a multi-layer composite film, without particular limitation. When the separator is a multi-layer composite film, the materials of each layer can be the same or different, without particular limitation. The separator can be a separate component located between the positive and negative electrodes, or it can be attached to the surfaces of the positive and negative electrodes.
[0078] In some embodiments, the separator is a solid electrolyte. The solid electrolyte is disposed between the positive and negative electrodes, serving both to transport ions and to isolate the positive and negative electrodes.
[0079] In some embodiments, the battery cell also includes an electrolyte, which acts as a conductor of ions between the positive and negative electrodes. This application does not impose specific limitations on the type of electrolyte; it can be selected according to requirements. The electrolyte can be liquid, gel, or solid.
[0080] Liquid electrolytes include electrolyte salts and solvents.
[0081] In some embodiments, the electrolyte salt may be selected from at least one of lithium hexafluorophosphate, lithium tetrafluoroborate, lithium perchlorate, lithium hexafluoroarsenate, lithium bis(fluorosulfonyl)imide, lithium bis(trifluoromethanesulfonyl)imide, lithium trifluoromethanesulfonate, lithium difluorophosphate, lithium difluorooxalate borate, lithium dioxalate borate, lithium difluorodioxalate phosphate, and lithium tetrafluorooxalate phosphate.
[0082] In some embodiments, the solvent may be selected from at least one of ethylene carbonate, propylene carbonate, methyl ethyl carbonate, diethyl carbonate, dimethyl carbonate, dipropyl carbonate, methyl propyl carbonate, ethyl propyl carbonate, butyl carbonate, fluoroethylene carbonate, methyl formate, methyl acetate, ethyl acetate, propyl acetate, methyl propionate, ethyl propionate, propyl propionate, methyl butyrate, ethyl butyrate, 1,4-butyrolactone, sulfolane, dimethyl sulfone, methyl ethyl sulfone, and diethyl sulfone. The solvent may also be an ether solvent. Ether solvents may include one or more of ethylene glycol dimethyl ether, ethylene glycol diethyl ether, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, 1,3-dioxolane, tetrahydrofuran, methyl tetrahydrofuran, diphenyl ether, and crown ethers.
[0083] Among them, the gel electrolyte includes a polymer as the electrolyte backbone network, combined with an ionic liquid - lithium salt.
[0084] Solid electrolytes include polymer solid electrolytes, inorganic solid electrolytes, and composite solid electrolytes.
[0085] In some implementations, the electrode assembly is a wound structure. The positive and negative electrode sheets are wound into a wound structure.
[0086] In some implementations, the electrode assembly is a stacked structure.
[0087] In battery devices, the Battery Management System (BMS) plays a crucial role. One of its core functions is to accurately collect state information such as cell voltage and temperature through sampling chips to ensure the safe and stable operation of the battery. To meet functional safety standards (such as ASIL C / D), BMS technologies typically employ sampling chips to sample the cell's state information and use redundant hardware structures to diagnose failure modes of the sampling chips, thereby improving sampling reliability. For example, the sampling chip may be configured with a main sampling path containing a primary analog-to-digital converter (ADC) and a secondary sampling path containing an auxiliary ADC. The primary and secondary ADCs corresponding to the cell are sampled simultaneously, and the output results are compared using an internal comparator to determine if any sampling path failures exist. Furthermore, to meet functional safety requirements, redundant multiplexers (MUX) or filters may be integrated to further enhance the completeness of the hardware diagnostic mechanism.
[0088] However, in the BMS of the aforementioned related technologies, the presence of redundant ADCs, comparators and other diagnostic circuits inside the sampling chip results in a high overall hardware cost for the sampling chip.
[0089] Furthermore, the design of the sampling chips in the aforementioned technologies is highly dependent on specific chip architectures, with significant differences in redundancy configurations and diagnostic logic between sampling chips from different manufacturers. Therefore, the diagnostic logic is deeply tied to the hardware architecture, lacking flexibility, and optimizing the diagnostic strategy may require hardware redesign. In addition, when replacing sampling chips from different manufacturers, the software control strategy also needs to be adjusted accordingly, increasing the overall development and maintenance difficulty of the BMS.
[0090] In view of this, embodiments of this application provide a battery management system, such as... Figure 1 As shown, the battery management system 10 includes:
[0091] At least one sampling chip 11 is provided, and each sampling chip 11 includes a sampling circuit 111, a sampling auxiliary component 112, and a first detection circuit 113. The sampling circuit 111 has at least one sampling path, and the at least one sampling path corresponds one-to-one with at least one battery cell 20 in the battery device, and is used to collect the status information of the corresponding battery cell 20 respectively. The sampling auxiliary component 112 is used to assist the operation of the sampling circuit 111, and the first detection circuit 113 is used to diagnose the sampling auxiliary component 112.
[0092] The control component 12 is communicatively connected to the sampling chip 11 and is used to acquire the status information of each battery cell 20. If the diagnostic result of the sampling auxiliary component 112 indicates that the sampling auxiliary component 112 has not failed, the control component 12 diagnoses the sampling path corresponding to each battery cell 20 based on the status information of each battery cell 20.
[0093] Here, the battery management system 10 can be applied to any suitable battery device. It collects status information such as voltage, current, and / or temperature of each cell 20 in the battery device through the sampling chip 11 to meet the management requirements for safety and stability during battery operation. For example, the battery device may include, but is not limited to, power battery devices and / or energy storage battery devices, etc., and this embodiment does not limit this.
[0094] The battery cell 20 can be in any suitable form, and this application embodiment does not limit it. For example, the battery cell 20 can be at least one of the following: prismatic battery cell, cylindrical battery cell, blade battery cell, and pouch battery cell.
[0095] In some implementations, the status information of the cell 20 may include, but is not limited to, at least one of voltage, temperature, current, etc.
[0096] In some implementations, the sampling chip 11 may include, but is not limited to, an analog front-end (AFE) chip, also known as a battery sampling chip, which can be used to collect state information such as cell voltage, and / or current, and / or temperature. The AFE is an analog circuit module in the battery management system used to collect state information such as cell voltage and temperature. It typically includes components such as an ADC, filter, and voltage regulator, and is the core hardware unit for realizing battery state information acquisition. The ADC is used to convert analog signals (such as cell voltage, current, or temperature) into digital signals for processing and analysis by the control components. It is understood that, as an important component of the sampling path, the operating state of the ADC directly affects the accuracy of the sampled data.
[0097] In some implementations, at least one sampling path in the sampling circuit 111 is used to be connected one-to-one with at least one cell 20 in the battery device to collect the voltage and / or current of the corresponding cell 20 respectively.
[0098] In some embodiments, each N cells 20 in the battery device is provided with one or more temperature sensors, and at least one sampling path in the sampling circuit 111 is used to connect one-to-one with at least one temperature sensor in the battery device to collect the temperature of the corresponding N cells 20 respectively. Here, N is a positive integer and N is not greater than the total number of cells in the battery device.
[0099] In some implementations, the battery management system 10 may include a plurality of sampling chips 11, and each sampling chip 11 may have a sampling circuit 111 having a sampling path for collecting the status information of a cell 20 in the battery device.
[0100] In some embodiments, the battery management system 10 may include multiple sampling chips 11, and the sampling circuit 111 in each sampling chip 11 may have multiple sampling paths, which correspond one-to-one with multiple battery cells 20 in the battery device, and are used to collect the status information of the multiple battery cells 20.
[0101] In some embodiments, the battery management system 10 may include a sampling chip 11, the sampling circuit 111 in the sampling chip 11 may have multiple sampling paths, each of which corresponds to a cell 20 in the battery device, for collecting the status information of each cell 20.
[0102] It is understandable that the sampling path refers to the signal transmission path for collecting cell status information. Failure of the sampling path may lead to distortion or loss of sampling data, thereby affecting the battery management system's judgment of the battery status.
[0103] In some implementations, each sampling path in the sampling circuit is set independently, and each sampling path includes an ADC. Each ADC is used to receive the analog signal corresponding to the status information of the battery cell and convert the received analog signal into a digital signal to obtain the status information of the battery cell.
[0104] In some implementations, multiple sampling paths in the sampling circuit can share a single ADC. During each sampling period, multiple sampling paths can be selected separately by a multiplexer to input the analog signals corresponding to the state information of the respective cells into the ADC, thereby obtaining the state information of each cell.
[0105] The sampling auxiliary component 112 refers to a hardware module within the sampling chip 11 that assists the sampling circuit 111 in its normal operation. It is an important part of the sampling chip 11 in ensuring sampling accuracy and stability. For example, the sampling auxiliary component 112 may include, but is not limited to, at least one of a voltage regulator, a reference voltage source, and a clock source. The voltage regulator can provide a stable power supply to the sampling chip, the reference voltage source can provide a reference voltage for the ADC in the sampling chip, and the clock source can provide a clock signal to the sampling chip.
[0106] The first detection circuit 113 refers to a diagnostic circuit located inside the sampling chip 11, used to perform periodic diagnostics on the sampling auxiliary components 112 (such as a voltage regulator, a reference voltage source, a clock source, etc.). For example, the first detection circuit 113 may include, but is not limited to, a power supply detection circuit for diagnosing the voltage regulator, a reference source detection circuit for diagnosing the reference voltage source, and / or a clock detection circuit for diagnosing the clock source.
[0107] In some implementations, the control component 12 is the main control unit in the battery management system, responsible for coordinating the work of each sampling chip, acquiring the state information of the battery cells, and diagnosing the sampling path based on the state information. In implementation, the control component 12 can employ any suitable software diagnostic strategy to diagnose the sampling path corresponding to each battery cell 20 based on the state information of each battery cell 20; this application embodiment does not limit this approach. For example, the changes in the state information of a single battery cell 20 at multiple consecutive sampling time points can be analyzed from a time perspective. If the change in the state information of a single battery cell 20 at multiple consecutive sampling time points exceeds a set change threshold, and / or the change rate of a single battery cell 20 at multiple consecutive sampling time points exceeds a set change rate threshold, then the sampling path corresponding to that battery cell 20 is determined to be faulty. As another example, the differences in the state information of two battery cells 20 at the same sampling time point can be analyzed. If the degree of difference between the state information of the two battery cells 20 at the same sampling time point is higher than a preset degree threshold, then the sampling path corresponding to at least one of the two battery cells 20 is determined to be faulty.
[0108] In the battery management system of this application embodiment, a sampling auxiliary component and a first detection circuit are set inside the sampling chip to diagnose the sampling auxiliary component. Simultaneously, a control component diagnoses the sampling path based on the collected cell status information. Compared to related technologies that rely on redundant hardware structures to diagnose sampling chip failure modes, this application embodiment replaces some redundant hardware in the sampling chip with a software diagnostic strategy implemented by the control component. This reduces the hardware complexity and cost of the sampling chip, improves the flexibility of the diagnostic logic implementation, facilitates rapid updates to the diagnostic logic, reduces the overall development and maintenance difficulty of the BMS, and ensures that the BMS possesses the functional safety level corresponding to diagnostic schemes using redundant hardware. Furthermore, since the sampling auxiliary component assists the operation of the sampling circuit, its failure is a common cause of failure affecting all sampling paths, potentially impacting the sampling reliability of each sampling path in the sampling circuit. Therefore, by using a first detection circuit set inside the chip to diagnose the sampling auxiliary component in hardware, the reliability and safety of diagnosing common cause failures in each sampling path can be effectively improved, thereby enhancing the overall reliability and safety of the BMS. Furthermore, subsequent sampling path diagnostics will only continue if the sampling auxiliary component fails. This reduces the interference of sampling auxiliary component failure on sampling path diagnostics and improves the reliability of sampling path diagnostics.
[0109] In some embodiments, such as Figure 2 As shown, the sampling auxiliary component 112 includes at least one of the following:
[0110] Voltage regulator 112a is used to stabilize the power supply voltage of sampling chip 11 within the target voltage range;
[0111] The reference voltage source 112b is used to provide a reference voltage for the ADC in the sampling circuit 111. The ADC is used to convert the analog electrical signal corresponding to the received cell status information into a digital electrical signal to obtain the cell status information.
[0112] Clock source 112c is used to provide clock signals for sampling circuit 111.
[0113] Here, the target voltage range is the operating voltage range that supports the stable operation of the sampling chip 11. In implementation, those skilled in the art can design a suitable target voltage range according to the actual application scenario; this application embodiment does not limit this.
[0114] A voltage regulator is an electronic component that maintains a stable output voltage level when the input voltage fluctuates. In this embodiment, the voltage regulator 112a is integrated inside the sampling chip 11 to provide a stable power supply for the sampling chip 11. Since cell voltage acquisition requires high power supply stability, unstable power supply voltage may lead to sampling errors, thus affecting the accuracy of the entire BMS system. Therefore, by setting the voltage regulator 112a, the sampling chip 11 can always be in an optimal operating state, preventing data distortion or misjudgment due to power fluctuations. This improves the reliability of the sampling chip 11, thereby meeting the functional safety requirements of Automotive Safety Integrity Level (ASIL) C / D.
[0115] In some embodiments, the voltage regulator 112a can output a supply voltage to the sampling chip 11 by taking the voltage of the highest potential cell (i.e., the highest-potential cell) among at least one cell connected to the sampling chip 11 as input.
[0116] In some embodiments, the voltage regulator 112a may include a boost circuit and / or a buck circuit. When the input voltage is within the target voltage range, the voltage regulator 112a can directly output the input voltage; when the input voltage is below the lower limit of the target voltage range, the boost circuit can increase the input voltage to the target voltage range before outputting; when the input voltage is above the upper limit of the target voltage range, the buck circuit can decrease the input voltage to the target voltage range before outputting.
[0117] The reference voltage source 112b is a component that provides a reference voltage (also known as a reference voltage) for the ADC. The ADC completes the digitization process by comparing the input analog signal with this reference voltage. In this embodiment, the reference voltage source 112b can provide the ADC with a precise reference voltage as a reference value, enabling the analog signal to be accurately converted into a digital signal, thereby ensuring the accuracy of the acquisition of state information such as the cell's voltage, current, and / or temperature. If the reference voltage is unstable or inaccurate, it will directly lead to data distortion in the ADC output, thus affecting the BMS's judgment of the battery state. Therefore, by using a high-precision reference voltage source, the sampling accuracy of the ADC can be improved, thereby enhancing the overall performance and safety of the sampling chip 11.
[0118] An analog-to-digital converter (ADC) is a device that converts continuous voltage signals from sensors or other analog signal sources into discrete digital signals. In this embodiment, the ADC can convert analog signals such as voltage, current, and / or temperature of the battery cell 20 into digital signals for subsequent digital processing and transmission. Since the conversion accuracy of the ADC directly affects the BMS's judgment of the battery state, it is crucial to use a high-quality ADC and a matching reference voltage source 112b in the sampling chip 11. By using the reference voltage source 112b in conjunction with the ADC, the digitization process of the battery cell state information can be ensured to have high accuracy and consistency, thereby improving the overall system reliability.
[0119] A clock source is a component that provides the time reference signal (i.e., clock signal) required for the synchronized operation of various circuit modules in the sampling chip. In some implementations, clock source 112c can be used to control the sampling rate of the ADC, the duty cycle of the filter, and the operating rhythm of other related circuits in the sampling circuit 111. The stability of the clock signal directly affects the collaborative working effect between the modules in the sampling chip 11. For example, if the frequency of the clock signal is unstable, it may cause ADC sampling time deviation, resulting in data distortion or loss. Therefore, by setting a stable and high-precision clock source, the synchronization and accuracy of the modules in the sampling chip 11 can be ensured, thereby improving the overall system response speed and data acquisition quality. This optimizes the working efficiency of the sampling chip 11, improves the consistency of the sampled data, and thus better supports the functional safety requirements of the BMS.
[0120] It is understandable that there is a close collaborative relationship between the voltage regulator 112a, the reference voltage source 112b, and the clock source 112c. The voltage regulator ensures that the ADC and other circuit modules receive a stable power supply, thus providing a fundamental guarantee for the normal operation of the reference voltage source and the clock source; the reference voltage source provides the ADC with a precise reference voltage to ensure the accuracy of the analog-to-digital conversion results; and the clock source provides a synchronization signal for the entire sampling process, enabling each module to operate at a unified pace and preventing data errors caused by timing discrepancies. Together, these three components ensure that the sampling chip 11 maintains high-precision and high-stability data acquisition capabilities even under complex operating conditions.
[0121] In the above embodiments, the sampling auxiliary components include a voltage regulator for stabilizing the supply voltage of the sampling chip within a target voltage range, a reference voltage source for providing a reference voltage to the analog-to-digital converter in the sampling circuit, and / or a clock source for providing a clock signal to the sampling circuit. Since the voltage regulator, reference voltage source, and / or clock source are core supporting components of the sampling circuit, used to assist in the stable operation of the sampling circuit, the failure of the voltage regulator, reference voltage source, and / or clock source will directly affect the accuracy of the sampled data. Therefore, integrating diagnostic capabilities for the voltage regulator, reference voltage source, and / or clock source within the sampling chip can effectively improve the reliability and safety of the entire system.
[0122] In some embodiments, such as Figure 3 As shown, the sampling chip 11 also includes a status register 114;
[0123] The first detection circuit 113 is used to write the diagnostic results of the sampling auxiliary component 112 into the status register 114;
[0124] The control component 12 is used to read the diagnostic results of the sampling auxiliary component 112 from the status register 114. If the diagnostic results of the sampling auxiliary component 112 indicate that the sampling auxiliary component 112 has not failed, the control component 12 diagnoses the sampling path corresponding to each cell 20 based on the status information of each cell 20.
[0125] Here, the status register 114 is configured to receive and store the diagnostic results of the first detection circuit 113 after diagnosing the sampling auxiliary component 112. This status register 114 is located inside the sampling chip 11, has read and write capabilities, and can be accessed by the control component 12. By writing the diagnostic results of the sampling auxiliary component 112 into the status register 114, long-term recording and rapid querying of the status of the sampling auxiliary component 112 can be achieved, enabling centralized management of the diagnostic information of the sampling auxiliary component and improving the maintainability and diagnostic efficiency of the system.
[0126] The first detection circuit 113 is a hardware module used to perform diagnostic tasks of the sampling auxiliary component 112.
[0127] In some implementations, the first detection circuit 113 can periodically diagnose the sampling auxiliary component 112 when the system is powered on or during system operation, checking whether the sampling auxiliary component 112 is working properly, obtaining the diagnostic result of the sampling auxiliary component 112, and outputting the diagnostic result in the form of a digital signal. This diagnostic result can characterize whether the sampling auxiliary component 112 has failed. The diagnostic result of the sampling auxiliary component 112 is then written to the status register 114 for subsequent processing. The inputs of the first detection circuit 113 may include parameters such as the voltage, current, and temperature of the sampling auxiliary component 112, and the output is a logical judgment result, such as not failed (i.e., normal) or failed (i.e., abnormal).
[0128] In some implementations, the diagnostic results of the sampling auxiliary component 112 may include the diagnostic results of at least one hardware module or functional unit in the sampling auxiliary component 112. The status register 114 may include at least one flag bit, each flag bit corresponding to a hardware module or functional unit in the sampling auxiliary component 112, used to indicate whether the hardware module or functional unit has failed. The first detection circuit 113 can write the diagnostic results of each hardware module or functional unit in the sampling auxiliary component 112 into the corresponding flag bit. For example, when the sampling auxiliary component 112 includes a voltage regulator 112a, a reference voltage source 112b, and a clock source 112c, the status register 114 may include a voltage regulator fault flag, a reference voltage source fault flag, a clock source abnormal flag, etc. The first detection circuit 113 can write the diagnostic results corresponding to the voltage regulator 112a, the reference voltage source 112b, and the clock source 112c into the corresponding flag bits. These flag bits can be read by the control component 12 through software to trigger the corresponding fault handling mechanism.
[0129] Understandably, the control component 12 first reads the diagnostic results of the sampling auxiliary component 112 written by the first detection circuit 113 from the status register 114 to determine whether the sampling auxiliary component 112 has failed. If the sampling auxiliary component 112 has not failed, the control component 12 continues to use the status information (such as voltage and temperature) of each cell 20 to further diagnose the corresponding sampling path, thereby improving the safety of the entire sampling link.
[0130] In some implementations, if the diagnostic results of the sampling auxiliary component 112 indicate that the sampling auxiliary component 112 has failed, the control component 12 may output first fault information indicating that the sampling auxiliary component 112 in the sampling chip 11 has failed.
[0131] In the above embodiments, by setting a status register in the sampling chip to store the diagnostic results of the sampling auxiliary component, the control component can efficiently read the diagnostic results of the sampling auxiliary component without directly exposing the internal hardware status of the sampling chip, thereby improving the security of the system.
[0132] In some embodiments, such as Figure 4 As shown, the sampling chip 11 also includes:
[0133] The second detection circuit 115 is used to diagnose the first detection circuit 113.
[0134] The control component 12 is used to acquire the diagnostic results of the first detection circuit 113. If the diagnostic results of the first detection circuit 113 indicate that the first detection circuit 113 has not failed, the control component 12 reads the diagnostic results of the sampling auxiliary component 112 from the status register 114.
[0135] The second detection circuit 115 can be an auxiliary circuit, independent of the first detection circuit 113, located inside the sampling chip 11, capable of diagnosing the first detection circuit 113. For example, the second detection circuit 115 can periodically diagnose the first detection circuit 113 when the system is powered on or during system operation, checking whether the first detection circuit 113 is working properly, obtaining the diagnostic result of the first detection circuit 113, and outputting the diagnostic result in the form of a digital signal. This diagnostic result can characterize whether the first detection circuit 113 has failed.
[0136] In some implementations, the second detection circuit 115 typically integrates modules such as a comparator, a counter, and / or a status flag, which can determine whether the first detection circuit 113 has failed by comparing its output with a preset threshold or reference value.
[0137] In some implementations, the diagnostic result can be data generated by the second detection circuit 115, reflecting whether the current operating state of the first detection circuit 113 is normal. For example, after the second detection circuit 115 completes a diagnosis of the first detection circuit 113, it writes the diagnostic result as a digital signal to a specific location in the status register 114. The control component 12 can read the diagnostic result of the first detection circuit 113 from the status register 114. If the detection result shows that the first detection circuit is in a normal state (i.e., not failed), the control component 12 can continue to read the diagnostic results of other related components, such as the diagnostic results of the sampling auxiliary component 112, from the status register 114 to further confirm the health status of the entire sampling chip 11.
[0138] In some embodiments, the second detection circuit 115 may include a Built-in Self-Test (BIST) circuit for the sampling chip 11. For example, the sampling auxiliary component 112 includes a voltage regulator 112a, and the first detection circuit 113 includes a power supply detection circuit for diagnosing the voltage regulator; the BIST circuit can be used to diagnose the power supply detection circuit. As another example, the sampling auxiliary component 112 includes a reference voltage source 112b, and the first detection circuit 113 includes a reference source detection circuit for diagnosing the reference voltage source; the BIST circuit can be used to diagnose the reference source detection circuit.
[0139] In the above embodiments, a second detection circuit is introduced to diagnose the first detection circuit itself. If the diagnosis result of the first detection circuit indicates that the first detection circuit has not failed, the diagnosis result of the sampling auxiliary component is read from the status register. This reduces false positives or false negatives caused by faults in the detection circuit itself, thereby further enhancing the overall diagnostic coverage and robustness of the system.
[0140] In some embodiments, the control component 12 is used for at least one of the following steps S101 and S102:
[0141] Step S101: Based on the difference between the state information of the two cells 20 at the same sampling time point, determine whether the sampling path corresponding to the two cells 20 is invalid.
[0142] Here, the same sampling time point refers to the time point at which the sampling chip 11 simultaneously collects the status information of multiple battery cells within a set sampling period. Since the sampling chip 11 has multi-channel (i.e., sampling path) synchronous sampling capability, it can acquire data from multiple battery cells at a single sampling time point. By comparing the status information of two battery cells at the same sampling time point, it is possible to determine whether there is an abnormal deviation, thereby inferring whether there is a sampling path fault. For example, if the absolute value of the voltage difference between two battery cells exceeds the target voltage difference threshold (e.g., 100mV), it indicates that the voltage difference between the two battery cells is outside the reasonable range, and the sampling path corresponding to one of the battery cells may be faulty and have failed.
[0143] In some implementations, for sampling paths that may be faulty, the control component 12 can mark the sampling path as suspicious and proceed to the next diagnostic step. This diagnostic method can quickly identify single points of failure in the sampling path, reducing false positives or false negatives caused by sampling errors.
[0144] Step S102: Based on the changes in the state information of the same cell 20 at at least two sampling time points, determine whether the sampling path corresponding to the cell 20 is invalid.
[0145] The state information of the same cell 20 at different sampling time points refers to the state information (such as voltage, current, and / or temperature data) collected at multiple time points for the cell 20. By analyzing the changing trends of the state information of the same cell 20 at at least two sampling time points, it can be determined whether there are abnormal fluctuations in the collected state information of the cell. For example, if the cell voltage changes drastically in a short period of time (e.g., dV / dt exceeds ±10mV / ms), this may indicate an abnormality in the cell, or it may be caused by filter failure, ADC conversion error, or other hardware problems in the sampling circuit.
[0146] This method effectively detects potential slow failures or intermittent faults in the sampling path by continuously monitoring the sampling data of the same cell at different times. Compared with methods relying on redundant hardware structures, this method has higher sensitivity and robustness. This enhances the ability to detect faults in the sampling path, thereby improving system stability and safety, and ultimately meeting ASIL C / D level functional safety requirements.
[0147] In the above embodiments, the sampling path corresponding to the two cells is determined to be invalid based on the difference in state information between the two cells at the same sampling time point, and / or the sampling path corresponding to the cell is determined to be invalid based on the change in state information of the same cell at at least two sampling time points. In this way, abnormal sampling paths can be identified by analyzing the differences in sampling data of multiple cells at the same time, and / or the data changes of a single cell at different times, without relying on redundant hardware structures.
[0148] In some embodiments, the state information of the battery cell 20 includes the sampled voltage of the battery cell 20, such as... Figure 5 As shown, the sampling path includes voltage sampling path S1, which is used to collect the sampling voltage of the corresponding cell 20.
[0149] Control component 12 is used for at least one of the following:
[0150] If the absolute value of the difference between the sampled voltages of the two cells 20 at the same sampling time point exceeds the target voltage difference threshold, then it is determined that at least one of the voltage sampling paths S1 corresponding to the two cells 20 has failed, and / or the voltage of at least one of the two cells 20 is abnormal.
[0151] If the rate of change of the sampled voltage of the same cell 20 at at least two sampling time points exceeds the first rate of change threshold, then it is determined that the voltage sampling path S1 corresponding to the cell 20 is invalid and / or the voltage of the cell 20 is abnormal.
[0152] Here, the sampling voltage refers to the voltage value across the battery cell collected by the sampling chip at a certain sampling time point. The rate of change of the sampling voltage refers to the ratio of the amplitude of the change in the sampling voltage of the battery cell 20 between two or more consecutive sampling times to the time interval, and is usually expressed as the amount of voltage change per unit time.
[0153] The target differential pressure threshold and the first rate of change threshold can both be preset by those skilled in the art based on the actual application scenario, or they can be determined based on learning from historical data. This application embodiment does not limit this.
[0154] In some implementations, the target voltage difference threshold can be a pre-set maximum allowable voltage difference value, used to determine whether there is an abnormal voltage deviation between the two cells 20. For example, in a battery pack, the voltage of different cells 20 may fluctuate slightly due to manufacturing differences or different degrees of aging. However, if the voltage difference between the two cells 20 exceeds the target voltage difference threshold at the same sampling time point, it may mean that at least one of the cells 20 is faulty, or that there is an error or open circuit problem in the voltage sampling path corresponding to at least one cell 20.
[0155] In some implementations, the difference between the sampled voltages of any two cells 20 at the same sampling time point can be analyzed to determine whether the absolute value of the difference exceeds the target voltage difference threshold. Alternatively, the difference between the sampled voltages of two adjacent cells 20 at the same sampling time point can be analyzed to determine whether the absolute value of the difference exceeds the target voltage difference threshold. This application does not limit this.
[0156] In some implementations, the first rate of change threshold can be a safety boundary value set based on the expected characteristics of cell voltage change. If the rate of change of the sampled voltage exceeds this first rate of change threshold, the cell voltage change is considered abnormal. For example, when the cell voltage changes drastically within a short period, it may be due to faults such as drift in the sampling circuit, noise interference, or internal short circuits within the cell. By calculating the rate of change of the sampled voltage at multiple sampling times and comparing it with the first rate of change threshold, the stability of the sampling path and the health status of the cell can be further verified.
[0157] In the above embodiments, on the one hand, if the absolute value of the difference between the sampled voltages of two cells at the same sampling time point exceeds the target voltage difference threshold, it is determined that at least one of the voltage sampling paths corresponding to the two cells is faulty, and / or the voltage of at least one of the two cells is abnormal. In this way, by setting a reasonable target voltage difference threshold, it is possible to accurately determine whether the voltage sampling path of the cell is faulty, and / or whether the voltage of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency. On the other hand, if the rate of change of the sampled voltage of the same cell at at least two sampling time points exceeds the first rate of change threshold, it is determined that the voltage sampling path corresponding to the cell is faulty, and / or the voltage of the cell is abnormal. In this way, by setting a reasonable first rate of change threshold, it is possible to accurately determine whether the voltage sampling path is faulty, and / or whether the voltage of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency.
[0158] In some embodiments, the state information of the cell 20 includes the sampled temperature of the cell 20, such as... Figure 6 As shown, the sampling path includes temperature sampling path S2, which is used to collect the sampling temperature of the corresponding cell 20.
[0159] Control component 12 is used for at least one of the following:
[0160] If the absolute value of the difference between the sampled temperatures of the two cells 20 at the same sampling time point exceeds the target temperature difference threshold, then it is determined that at least one of the temperature sampling paths S2 corresponding to the two cells 20 has failed, and / or at least one of the two cells 20 has an abnormal temperature.
[0161] If the rate of change of the sampled temperature of the same cell 20 exceeds the second rate of change threshold at at least two sampling time points, it is determined that the temperature sampling path S2 corresponding to the cell 20 is invalid and / or the temperature of the cell 20 is abnormal.
[0162] Here, the target temperature difference threshold and the second rate of change threshold can both be preset by those skilled in the art based on the actual application scenario, or they can be determined based on learning from historical data. This application embodiment does not limit this.
[0163] In some implementations, see also Figure 6 Each N cells in the battery device is equipped with one or more temperature sensors, such as negative temperature coefficient (NTC) thermistors. Figure 6(Refered as NTC) At least one temperature sampling path S2 in the sampling circuit 111 is used to connect one-to-one with at least one temperature sensor NTC in the battery device to collect the temperature of the corresponding N cells 20 respectively. Wherein, TSREF is a pull-up power supply, which can be provided by the sampling chip 11, and R is the corresponding pull-up resistor.
[0164] It is understandable that when the system collects temperature data from two battery cells at a certain sampling moment, if these two cells are in similar operating environments (such as being located within the same battery module), their temperatures should theoretically be similar. If, at this point, the absolute value of the temperature difference exceeds the set target temperature difference threshold, it indicates a possible fault in the temperature sampling path or an abnormal temperature within the battery cell itself.
[0165] In some implementations, the target temperature difference threshold can be a reasonable temperature difference threshold set according to the characteristics of the battery cell, environmental conditions, and system safety requirements, used to determine whether there is an abnormal temperature difference between two battery cells. For example, under normal operating conditions, the temperature difference between adjacent battery cells should not exceed ±2°C. If the actual measured temperature difference exceeds this range, it may mean that there is a fault in the temperature sampling path of a certain battery cell, or that the battery cell itself has experienced thermal runaway or other abnormal conditions.
[0166] In some embodiments, the difference between the sampling temperatures of any two cells 20 at the same sampling time point can be analyzed to determine whether the absolute value of the difference exceeds the target temperature difference threshold. Alternatively, the difference between the sampling temperatures of two adjacent cells 20 at the same sampling time point can be analyzed to determine whether the absolute value of the difference exceeds the target temperature difference threshold. This application does not limit this aspect.
[0167] When the system continuously collects temperature data of a certain cell 20, if the temperature change rate (i.e., the amount of temperature change per unit time) of the cell 20 exceeds the set second change rate threshold, it may indicate that there is a problem with the temperature sampling path of the cell, or that the cell itself has abnormal temperature fluctuations.
[0168] In some implementations, the second rate of change threshold is a safety upper limit set according to the normal operating characteristics of the battery cell. For example, if the temperature change rate of the battery cell is usually no more than 0.1°C / second, i.e. the second rate of change threshold is 0.1°C / second, and the system detects that the temperature of the battery cell rises or falls rapidly in a short period of time, exceeding the second rate of change threshold, it may indicate that there is a fault in the temperature sampling path corresponding to the battery cell or that the battery cell is experiencing abnormal operating conditions.
[0169] In the above embodiments, on the one hand, if the absolute value of the difference between the sampled temperatures of two cells at the same sampling time point exceeds the target temperature difference threshold, it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty, and / or the temperature of at least one of the two cells is abnormal. In this way, by setting a reasonable target temperature difference threshold, it is possible to accurately determine whether the temperature sampling path of the cell is faulty, and / or whether the temperature of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency. On the other hand, if the rate of change of the sampled temperature of the same cell at at least two sampling time points exceeds the second rate of change threshold, it is determined that the temperature sampling path corresponding to the cell is faulty, and / or the temperature of the cell is abnormal. In this way, by setting a reasonable second rate of change threshold, it is possible to accurately determine whether the temperature sampling path is faulty, and / or whether the temperature of the cell is abnormal, reducing misjudgments and improving diagnostic efficiency.
[0170] In some embodiments, such as Figure 7 As shown, the sampling chip 11 also includes a configuration register 116.
[0171] The control component 12 is used to write configuration information into the configuration register 116 after the sampling chip 11 is powered on, so that the sampling chip 11 can operate based on the configuration information;
[0172] The control component 12 is also used to read back the configuration information written to the configuration register 116, and to diagnose the configuration register 116 based on the written configuration information and the read-back configuration information.
[0173] Here, the configuration information may include parameters required for the operation of the sampling chip 11. After the sampling chip 11 is powered on and initialized, the control component 12 writes the configuration information into the configuration register. The sampling chip 11 can read the written configuration information from the configuration register 116 to enter the running state based on the configuration information.
[0174] The configuration information can be determined based on system security and functional requirements, and this application embodiment does not limit this. By writing the configuration information into the configuration register, compatibility between different sampling chips 11 can be achieved without changing the hardware design.
[0175] In some implementations, the configuration information may include, but is not limited to, the operating mode of the sampling chip 11, hardware protection thresholds, and enable configurations. For example, the operating mode of the sampling chip 11 may include, but is not limited to, ADC resolution, sampling rate, and / or selected sampling channels, etc.; the hardware protection thresholds may include, but are not limited to, power supply overvoltage thresholds, and / or power supply undervoltage thresholds, etc.; and the enable configurations may include the enable states of regulators, reference voltage sources, filters, and / or clock sources, etc.
[0176] After writing the configuration information to the configuration register 116, the control component 12 can also read back the written configuration information. By writing the configuration information and then reading it back, the control component 12 can confirm whether the configuration register 116 can correctly store and output data, thereby determining whether there is a hardware failure problem. If the written configuration information and the read-back configuration information are consistent, it indicates that the configuration register 116 is functioning normally; if they are inconsistent, it indicates that the configuration register 116 may be faulty, such as a damaged memory cell, abnormal bus communication, or control logic error.
[0177] It is understood that configuration register failures include, but are not limited to, communication failures between the control component and the configuration register, hardware failures of the configuration register itself, and / or failures of the configuration information stored in the configuration register.
[0178] In some implementations, if the configuration information written and the configuration information read back are inconsistent, it can be determined that the configuration register 116 is faulty. The control component 12 can trigger the corresponding fault handling mechanism, such as recording a fault log, lighting up a fault indicator light, or entering a safe state.
[0179] In the above embodiments, by performing consistency verification on the write and readback operations of the configuration register, it is possible to detect whether the configuration register is working properly, reduce the impact of configuration register failure on subsequent sampling, improve sampling accuracy, and reduce misdiagnosis or missed diagnosis of sampling auxiliary component failure and / or sampling path failure due to configuration register failure.
[0180] In some implementations, the control component 12 is also used to diagnose the sampling path corresponding to each battery cell 20 based on the status information of each battery cell 20, provided that the diagnostic result of the configuration register 116 indicates that the configuration register 116 is not faulty. This allows for validity verification of the configuration register of the sampling chip during the power-on initialization phase, ensuring that subsequent diagnosis of the sampling path is based on reliability. This reduces the risk of misdiagnosis or missed diagnosis of sampling path failure due to configuration register failure, thereby improving the overall reliability of the system.
[0181] In some embodiments, such as Figure 8 As shown, the battery management system 10 also includes:
[0182] Communication component 13 is disposed between sampling chip 11 and control component 12;
[0183] The control component 12 is used to obtain the status information of each cell 20 collected from the sampling chip 11 through the communication component 13, and to diagnose the communication component 13 based on the obtained status information of each cell 20. If the diagnosis result of the communication component 13 indicates that the communication component 13 has not failed, the control component 12 is used to diagnose the sampling path corresponding to each cell based on the status information of each cell 20.
[0184] Here, the communication component 13 is an intermediate module connecting the sampling chip 11 and the control component 12, and its function is to transmit data between the two.
[0185] In some embodiments, the communication component 13 may include an isolation communication chip for implementing high- and low-voltage isolated communication between the sampling chip 11 and the control component 12. The isolation communication component may achieve high- and low-voltage isolation using capacitors and / or transformers, etc.
[0186] Diagnostic methods for communication component 13 can be used to determine whether there are any hardware or software-level anomalies in communication component 13 by comparing communication response time, checking data packet integrity, and / or verifying protocol consistency.
[0187] In some implementations, the control component 12 can read the cell status information collected from the sampling chip 11 via the communication component 13 and perform communication integrity verification on the read status information. For example, it can verify whether errors occurred in the status information data during transmission by calculating the Cyclic Redundancy Check (CRC) code or checksum of the acquired status information data. Alternatively, it can check whether the data frame format meets expectations, such as whether fields like address ID and length are correct, to ensure the reliability of the communication link. Furthermore, it can detect whether the communication response time of the sampled data does not exceed a preset duration.
[0188] In the above embodiments, by adding a diagnostic mechanism to the communication link, failures of communication components, such as communication interruptions or data errors, can be identified. Only when the communication components are functioning correctly can the sampling path corresponding to each battery cell be diagnosed based on the status information of each cell. This improves the integrity and reliability of the sampling data obtained by the control component, thereby increasing the accuracy of sampling path diagnosis and enhancing the overall system safety performance.
[0189] In some embodiments, the control component 12 is further configured to diagnose whether the status information of each cell 20 exceeds the target limit range, and if the status information of the cell 20 exceeds the target limit range, determine that the sampling path corresponding to the cell 20 is invalid or the status of the cell 20 is abnormal.
[0190] Here, the target limiting range refers to the range of values for the cell's safe operating status information. For example, the status information includes the sampling voltage, and the target limiting range can be a set safe voltage range (e.g., 0V~5V). When the sampling voltage of a cell exceeds this safe voltage range, the control component 12 can mark the cell's sampling voltage as abnormal. Similarly, the status information includes the sampling temperature, and the target limiting range can be a set safe temperature range. When the sampling temperature of a cell exceeds this safe temperature range, the control component 12 can mark the cell's sampling temperature as abnormal.
[0191] It is understandable that when the battery cell is operating normally, the status information of the battery cell will not exceed the target limit range. If the status information of the battery cell obtained by the control component 12 exceeds the target limit range, it may be that the sampling path corresponding to the battery cell is invalid, resulting in abnormal status information, or it may be that the status of the battery cell itself is abnormal.
[0192] This application provides a diagnostic method applied to a control component 12 in a battery management system 10. The battery management system 10 further includes at least one sampling chip 11 communicatively connected to the control component 12. Each sampling chip 11 includes a sampling circuit 111, a sampling auxiliary component 112, and a first detection circuit 113. The sampling circuit 111 has at least one sampling path, and the at least one sampling path corresponds one-to-one with at least one cell 20 in the battery device, for collecting the status information of the corresponding cell 20 respectively. The sampling auxiliary component 112 is used to assist the operation of the sampling circuit 111.
[0193] like Figure 9 As shown, the diagnostic method includes the following steps S201 to S203:
[0194] Step S201: Control the first detection circuit to diagnose the sampling auxiliary component and obtain the diagnostic results of the sampling auxiliary component.
[0195] Step S202: Obtain the status information of each battery cell;
[0196] Step S203: If the diagnostic results of the sampling auxiliary component indicate that the sampling auxiliary component has not failed, the sampling path corresponding to each cell is diagnosed based on the status information of each cell.
[0197] In this embodiment, a sampling auxiliary component and a first detection circuit are set inside the sampling chip to diagnose the sampling auxiliary component. Simultaneously, a control component diagnoses the sampling path based on the collected cell status information. Compared to related technologies that rely on redundant hardware structures to diagnose sampling chip failure modes, this embodiment replaces some redundant hardware in the sampling chip with a software diagnostic strategy implemented by the control component. This reduces the hardware complexity and cost of the sampling chip, improves the flexibility of the diagnostic logic implementation, facilitates rapid updates to the diagnostic logic, reduces the overall development and maintenance difficulty of the BMS, and ensures that the BMS possesses the functional safety level corresponding to diagnostic schemes using redundant hardware. Furthermore, since the sampling auxiliary component assists the operation of the sampling circuit, its failure is a common cause of failure affecting all sampling paths, potentially impacting the sampling reliability of each sampling path in the sampling circuit. Therefore, by using a first detection circuit set inside the chip to diagnose the sampling auxiliary component in hardware, the reliability and safety of diagnosing common cause failures in each sampling path can be effectively improved, thereby enhancing the overall reliability and safety of the BMS. Furthermore, subsequent sampling path diagnostics will only continue if the sampling auxiliary component fails. This reduces the interference of sampling auxiliary component failure on sampling path diagnostics and improves the reliability of sampling path diagnostics.
[0198] In some embodiments, the sampling assistance component includes at least one of the following:
[0199] A voltage regulator is used to stabilize the power supply voltage of the sampling chip within the target voltage range;
[0200] A reference voltage source is used to provide a reference voltage for the analog-to-digital converter in the sampling circuit. The analog-to-digital converter is used to convert the analog signal corresponding to the received state information of the battery cell into a digital signal to obtain the state information of the battery cell.
[0201] A clock source is used to provide a clock signal for the sampling circuit.
[0202] In some embodiments, the sampling chip further includes a status register; the first detection circuit is used to write the diagnostic result of the sampling auxiliary component into the status register; the above step S203 may include the following step S211:
[0203] Step S211: Read the diagnostic results of the sampling auxiliary component from the status register.
[0204] In some embodiments, the sampling chip further includes: a second detection circuit for diagnosing the first detection circuit; the diagnostic method further includes the following step S221:
[0205] Step S221: Obtain the diagnostic result of the first detection circuit. If the diagnostic result of the first detection circuit indicates that the first detection circuit has not failed, read the diagnostic result of the sampling auxiliary component from the status register.
[0206] In some embodiments, step S203 may include at least one of steps S231 and S232:
[0207] Step S231: Based on the difference between the state information of the two cells at the same sampling time point, determine whether the sampling path corresponding to the two cells is invalid;
[0208] Step S232: Based on the changes in the state information of the same cell at at least two sampling time points, determine whether the sampling path corresponding to the cell is invalid.
[0209] In some embodiments, the cell status information includes the cell's sampling voltage, and the sampling path includes a voltage sampling path, which is used to collect the sampling voltage of the corresponding cell.
[0210] Step S231 above may include the following step S241:
[0211] Step S241: If the absolute value of the difference between the sampled voltages of the two cells at the same sampling time point exceeds the target voltage difference threshold, then it is determined that at least one of the voltage sampling paths corresponding to the two cells is faulty and / or the voltage of at least one of the two cells is abnormal.
[0212] Step S232 above may include the following step S242:
[0213] Step S242: If the rate of change of the sampled voltage of the same cell at at least two sampling time points exceeds the first rate of change threshold, then it is determined that the voltage sampling path corresponding to the cell is invalid and / or the voltage of the cell is abnormal.
[0214] In some embodiments, the cell status information includes the cell's sampling temperature, and the sampling path includes a temperature sampling path, which is used to collect the sampling temperature of the corresponding cell.
[0215] Step S231 above may include the following step S251:
[0216] Step S251: If the absolute value of the difference between the sampled temperatures of the two cells at the same sampling time point exceeds the target temperature difference threshold, then it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty and / or the temperature of at least one of the two cells is abnormal.
[0217] Step S232 above may include the following step S252:
[0218] Step S252: If the rate of change of the sampled temperature of the same cell exceeds the second rate of change threshold at at least two sampling time points, then it is determined that the temperature sampling path corresponding to the cell is invalid and / or the temperature of the cell is abnormal.
[0219] In some embodiments, the sampling chip further includes a configuration register; the diagnostic method further includes the following steps S261 and S262:
[0220] Step S261: After the sampling chip is powered on, write configuration information into the configuration register so that the sampling chip can operate based on the configuration information;
[0221] Step S262: Read back the configuration information written to the configuration register, and diagnose the configuration register based on the written configuration information and the read-back configuration information.
[0222] In some embodiments, the battery management system further includes a communication component disposed between the sampling chip and the control component; step S103 may include the following step S171:
[0223] Step S171: Obtain the status information of each battery cell from the sampling chip through the communication component, and diagnose the communication component based on the obtained status information of each battery cell. If the diagnosis result of the communication component indicates that the communication component has not failed, diagnose the sampling path corresponding to each battery cell based on the status information of each battery cell.
[0224] The following describes the application of the battery management system and diagnostic method provided in the embodiments of this application in real-world scenarios.
[0225] Taking automotive electronics as an example, the current automotive electronics field typically uses AFE (Automatic Front-End) for sampling cell voltage and cell / module temperature. In order to meet the functional safety standards (such as ASIL C / D) for preventing thermal runaway caused by battery overvoltage or undervoltage at the BMS level, AFE usually uses redundant ADCs for sampling. That is, the main ADC and another redundant auxiliary ADC are used together to collect cell voltage or cell temperature. The AFE chip compares the voltage or temperature values sampled by the main ADC and the auxiliary ADC to confirm whether the ADC sampling path has failed, so as to avoid inaccurate voltage or temperature acquisition due to AFE sampling failure.
[0226] In some related technical solutions, in addition to redundant ADCs, redundant MUXs or filters are often required. Each AFE manufacturer's safety mechanism relies entirely on its own chip architecture, and the diagnostic solutions will differ depending on the form of redundancy. Therefore, the following drawbacks exist:
[0227] 1) High hardware cost: Redundant ADC design and additional internal diagnostic circuits, such as comparators, increase hardware cost;
[0228] 2) Poor flexibility: Hardware diagnostic logic usually follows the internal architecture. If a problem is found in the diagnostic logic, the hardware may need to be redesigned.
[0229] 3) Difficult to maintain and update: Software strategies change with hardware architecture, and the software development cycle is long when switching between different manufacturers' AFEs.
[0230] In view of this, embodiments of this application provide a BMS that meets ASIL D safety standards and a corresponding software-based diagnostic solution based on a single ADC hardware architecture. By integrating a first detection circuit into the AFE and having the control component execute a multi-dimensional diagnostic process, comprehensive monitoring of the configuration register, sampling auxiliary components, sampling paths, and communication links is achieved. This solution can cover single-point failures of each critical path within the AFE without relying on redundant hardware, thereby significantly reducing hardware complexity and improving system flexibility and maintenance efficiency while meeting ASIL D safety standards.
[0231] In this embodiment, on the one hand, the key hardware monitoring within the AFE chip is retained, namely the hardware monitoring circuits used to detect common-cause failures affecting the entire AFE sampling loop (corresponding to the first detection circuit and / or the second detection circuit in the aforementioned embodiments), such as power supply detection circuits, reference source detection circuits, clock detection circuits, and internal self-test circuits that perform power-on self-tests on the power supply detection circuit, reference source detection circuit, and clock detection circuit; on the other hand, software algorithms replace the redundant hardware structures in related technologies to diagnose the sampling path and can detect failures of communication components and configuration registers. Thus, through a hybrid diagnostic architecture combining key hardware monitoring within the AFE and software strategies, it can be ensured that each single-point failure of the AFE can be diagnosed, reducing hardware complexity while ensuring the ability to detect multiple failure modes to meet ASIL D. By changing some hardware diagnostic logic to software diagnostics, it is possible to quickly adjust diagnostic logic, thresholds, etc., through code updates, ensuring compatibility with AFE chips from different manufacturers and reducing the software development cycle.
[0232] Figure 10 A schematic diagram of the composition architecture of a battery management system provided in this application embodiment. Figure 9 ,like Figure 10As shown, the battery device includes multiple cells (such as cell 21, ..., cell 2(n-1), cell 2n, where n is an integer greater than 1). The negative terminal of cell 21 is connected to the V0 pin of the AFE, and the positive terminal of cell 21 is connected to the V1 pin of the AFE. The negative terminal of cell 2(n-1) is connected to the Vn-2 pin of the AFE, and the positive terminal of cell 2(n-1) is connected to the Vn-1 pin of the AFE. The negative terminal of cell 2n is connected to the Vn-1 pin of the AFE, and the positive terminal of cell 2n is connected to the Vn pin of the AFE, and so on. The Vn and Vn-1 pins of the AFE are connected to an internal independent level conversion module LS. The positive and negative voltage signals of each cell are converted into differential voltages by the level conversion module LS and input to the input port of the corresponding ADC. Each ADC is connected to a filter FIL at the back end. The sampled data, after analog-to-digital conversion and filtering, is sent to the data register 117 and then to the isolation communication chip 131 via the digital control unit 118 (which includes a communication control module). It is then sent to the microcontroller unit (MCU) 121 (corresponding to the control component in the aforementioned embodiment) for diagnosis.
[0233] See also Figure 10 The AFE also integrates a regulator 112a, a reference voltage source 112b, and a clock source 112c. The regulator 112a regulates the module voltage (i.e., the AFE's supply voltage) to a low voltage (within the target voltage range described in the previous embodiments) for use by internal digital or analog circuits. The AFE can have one or more regulators; this embodiment does not impose any limitations. The reference voltage source 112b provides a reference voltage to the ADC for high-precision sampling. The clock source 112c provides a clock for ADC sampling and chip state switching. In addition to the basic functional circuits, the AFE also integrates a first detection circuit 113 for periodic monitoring and diagnostics of the regulator 112a, reference voltage source 112b, and clock source 112c. Furthermore, the AFE may also integrate a BIST circuit 1151 for power-on self-testing of the first detection circuit 113 to verify its accuracy.
[0234] Figure 11 A schematic diagram of the implementation process of a diagnostic method provided in this application embodiment. Figure 2 This method can be executed by a control component (such as an MCU) in the battery management system, such as... Figure 11 As shown, the diagnostic method includes the following steps S301 to S314:
[0235] Step S301: After the AFE is powered on and initialized, configuration information is written into the AFE's configuration register, and the written configuration information is read back. Based on the written configuration information and the read-back configuration information, the configuration register is diagnosed.
[0236] If the configuration register fails, proceed to step S302; if the configuration register is not failed, proceed to step S303.
[0237] Here, the failure of the configuration register includes, but is not limited to, communication failure between the control component and the configuration register, hardware failure of the configuration register itself, and / or failure of the configuration information stored in the configuration register.
[0238] For example, the configuration register can be checked for consistency between the written configuration information and the read-back configuration information. If the written and read-back configuration information are consistent, the configuration is successful, meaning the configuration register is not invalid. If the written and read-back configuration information are inconsistent, the configuration is unsuccessful, meaning the configuration register is invalid (e.g., the configuration information has been tampered with due to electromagnetic interference or memory failure).
[0239] Step S302: Report a configuration register fault and / or a first communication fault;
[0240] The first communication failure can characterize a communication failure between the control component and the configuration register.
[0241] In some implementations, since configuration register failures and communication failures can cause overall AFE malfunctions, making the sampling data of each cell unreliable, the control component can control the battery device to enter a safe state, such as disconnecting the high-voltage relay of the battery device and stopping the output voltage, in the event of a configuration register failure, a first communication failure, and / or a second communication failure as described below.
[0242] Step S303: Use the BIST circuit to perform a self-test on the internal hardware security mechanism of the AFE;
[0243] Here, the BIST circuit can be used to diagnose the first detection circuit inside the AFE.
[0244] If the first detection circuit fails, proceed to step S304; if the first detection circuit does not fail, proceed to step S305.
[0245] For example, an incorrect power supply can be injected into the voltage regulator to test whether the power detection circuit's diagnostic functions for the voltage regulator (such as over / under voltage detection) are working properly, thereby confirming whether the power detection circuit has failed.
[0246] Step S304: Report a minor hardware fault in the AFE.
[0247] Among them, minor hardware faults in AFE indicate a fault in the first detection circuit in AFE.
[0248] In some implementations, since minor hardware failures of the AFE only indicate abnormalities in the internal diagnostic function of the AFE and do not affect sampling, the control component can control the malfunction indicator lamp to illuminate or reduce the output power of the battery device in the event of a minor hardware failure of the AFE, so as to remind the user (e.g., the driver) to perform timely maintenance.
[0249] Step S305: Periodically read the internal hardware diagnostic results of the AFE;
[0250] If the internal hardware diagnostic result indicates that the sampling auxiliary component has failed, proceed to step S306; if the internal hardware diagnostic result indicates that the sampling auxiliary component has not failed, proceed to step S307.
[0251] Here, the internal hardware diagnostic results of the AFE refer to the diagnostic results output by the first detection circuit after diagnosing the sampling auxiliary components such as the voltage regulator, reference voltage source, and clock source.
[0252] In some implementations, the first detection circuit can write the diagnostic results of the sampling auxiliary component into the status register inside the AFE, and the control component can read the diagnostic results from the status register. For example, the diagnostic results may include fault flag bits corresponding to the regulator, reference voltage source, clock source, etc., including flag bits indicating whether the power supply is over- or under-voltage, flag bits indicating whether the reference voltage source is malfunctioning, and flag bits indicating whether the clock source is abnormal.
[0253] Step S306: Report a serious hardware failure of the AFE;
[0254] Among them, severe hardware failure in AFE indicates a failure of the sampling auxiliary component in AFE.
[0255] In some implementations, since a serious hardware failure of the AFE means that the normal operation of the AFE cannot be guaranteed and all sampling data collected by the AFE is unreliable, the control component can control the battery device to enter a safe state, such as disconnecting the high-voltage relay of the battery device, in the event of a serious hardware failure of the AFE.
[0256] Step S307: Periodically acquire AFE sampling data;
[0257] The control component can activate the ADC to collect the status information of each cell through multiple sampling paths, and read the original sampling data from the data register and store it in the buffer.
[0258] Step S308: Verify the communication integrity of the collected cell status information;
[0259] If the communication integrity verification fails, proceed to step S309; if the communication integrity verification passes, proceed to step S310.
[0260] Step S309: Report the second communication failure;
[0261] The second communication fault can characterize the communication failure between the control component and the AFE.
[0262] Step S310: Perform over-limit diagnosis on the collected cell status information;
[0263] Here, over-limit diagnosis refers to diagnosing whether the status information of each cell exceeds the target limit.
[0264] In cases where the status information of at least one battery cell exceeds the target limit, step S311 can also be executed.
[0265] Step S311: Report a cell status information exceeding the limit fault;
[0266] In some implementations, a cell status information over-limit fault can indicate which cell's sampling path is abnormal, so the control component can still obtain sampling data from other sampling paths normally. In this case, the control component can delay disconnecting the high-voltage relay of the battery device or reduce the output power of the battery device to remind the user to perform timely maintenance.
[0267] Step S312: Diagnose the sampling path corresponding to each cell based on the status information of each cell;
[0268] In some implementations, the voltage sampling path corresponding to each cell can be diagnosed by comparing the difference between the sampled voltages of adjacent cells at the same sampling time point. For example, if the difference between the sampled voltages of adjacent cells at the same sampling time point exceeds a target voltage difference threshold, it is determined that at least one of the voltage sampling paths corresponding to the two cells is faulty, and / or the voltage of at least one of the two cells is abnormal, and the sampled voltages corresponding to the two cells are marked as abnormal data.
[0269] In some implementations, the temperature sampling path corresponding to each cell can be diagnosed by comparing the difference between the sampled temperatures of any two cells in the battery device at the same sampling time point. For example, if the difference between the sampled temperatures of two cells at the same sampling time point exceeds a target temperature difference threshold, it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty, and / or the temperature of at least one of the two cells is abnormal, and the sampled temperatures corresponding to the two cells are marked as abnormal data.
[0270] In some implementations, the voltage sampling path corresponding to each cell can be diagnosed by analyzing the rate of change of the sampled voltage of the same cell at at least two sampling time points. For example, if the rate of change of the sampled voltage of the same cell at at least two sampling time points exceeds a first rate of change threshold, it is determined that there is a failure in the voltage sampling path corresponding to that cell, and / or that the voltage of that cell is abnormal, and the sampled voltage corresponding to that cell is marked as abnormal data (such as transient failure data).
[0271] In some implementations, the temperature sampling path corresponding to each cell can be diagnosed by analyzing the rate of change of the sampled temperature of the same cell at at least two sampling time points. For example, if the rate of change of the sampled temperature of the same cell at at least two sampling time points exceeds a second rate of change threshold, it is determined that there is a failure in the temperature sampling path corresponding to that cell, and / or that the temperature of that cell is abnormal, and the sampled temperature corresponding to that cell is marked as abnormal data (such as transient failure data).
[0272] In some implementations, if the sampling path corresponding to the battery cell fails, the control component can also execute step S313.
[0273] Step S313: Report a cell abnormality or an abnormality in the sampling path corresponding to the cell.
[0274] In some implementations, if a cell malfunction or a corresponding sampling path malfunction is detected, the control component can disconnect the high-voltage relay of the battery device and control the battery device to enter a safe state.
[0275] Step S314: Clear the data register.
[0276] This includes clearing or resetting the data register to its default value.
[0277] In some implementations, after step S314 is completed, steps S305 to S314 can be repeated.
[0278] The diagnostic method in this application embodiment can realize full-process verification from fault diagnosis to fault handling, and can cover all single-point failures of AFE, so as to achieve the functional safety requirements of ASIL C / D.
[0279] This application provides a battery device, such as... Figure 12 As shown, the battery device 30 includes at least one battery cell 20 and the battery management system 10 described in the above embodiments.
[0280] This application provides an embodiment of an electrical device, such as... Figure 13 As shown, the electrical device 40 includes the battery device 30 described in the above embodiments.
[0281] Here, electrical equipment can be any electrical equipment, including but not limited to automobiles, airplanes, electric bicycles, electric motorcycles, electric boats, and / or ships.
[0282] It should be noted that the descriptions of the various embodiments above tend to emphasize the differences between them, while their similarities or commonalities can be referenced interchangeably. The descriptions of the diagnostic method embodiments, battery device embodiments, and electrical equipment embodiments above are similar to the descriptions of the battery management system embodiments above, and have similar beneficial effects. For any technical details not disclosed in the diagnostic method embodiments, battery device embodiments, and electrical equipment embodiments of this application, please refer to the description of the battery management system embodiments of this application for understanding.
[0283] It should be understood that in the description of this application, the reference to terms such as "in one embodiment," "in some embodiments," "in other embodiments," "yet another embodiment," "in some implementations," "in other implementations," or "exemplary," etc., refers to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the embodiments of this application. In this application, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Furthermore, without contradiction, those skilled in the art can combine the different embodiments or examples described in this application, as well as the features of the different embodiments or examples.
[0284] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0285] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and devices can be implemented in other ways. The apparatus and device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components may be combined, or integrated into another system, or some features may be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.
[0286] The above are merely exemplary embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application are included within the protection scope of this application.
Claims
1. A battery management system, characterized in that, include: At least one sampling chip, each of the sampling chips including a sampling circuit, a sampling auxiliary component and a first detection circuit; The sampling circuit has at least one sampling path, which corresponds one-to-one with at least one cell in the battery device, and is used to collect the status information of the corresponding cell respectively; the sampling auxiliary component is used to assist the operation of the sampling circuit, and the first detection circuit is used to diagnose the sampling auxiliary component; A control component, communicatively connected to the sampling chip, is used to acquire the status information of each of the battery cells. If the diagnostic result of the sampling auxiliary component indicates that the sampling auxiliary component has not failed, the control component diagnoses the sampling path corresponding to each of the battery cells based on the status information of each of the battery cells.
2. The battery management system according to claim 1, characterized in that, The sampling assistance component includes at least one of the following: A voltage regulator is used to stabilize the power supply voltage of the sampling chip within the target voltage range; A reference voltage source is used to provide a reference voltage for the analog-to-digital converter in the sampling circuit. The analog-to-digital converter is used to convert the analog signal corresponding to the received state information of the battery cell into a digital signal to obtain the state information of the battery cell. A clock source is used to provide a clock signal for the sampling circuit.
3. The battery management system according to claim 1, characterized in that, The sampling chip also includes a status register; The first detection circuit is used to write the diagnostic result of the sampling auxiliary component into the status register; The control component is used to read the diagnostic results of the sampling auxiliary component from the status register.
4. The battery management system according to claim 3, characterized in that, The sampling chip also includes: The second detection circuit is used to diagnose the first detection circuit; The control component is used to acquire the diagnostic result of the first detection circuit, and if the diagnostic result of the first detection circuit indicates that the first detection circuit has not failed, it reads the diagnostic result of the sampling auxiliary component from the status register.
5. The battery management system according to claim 1, characterized in that, The control component is used for at least one of the following: Based on the difference in the state information of the two cells at the same sampling time point, it is determined whether the sampling path corresponding to the two cells is invalid. Based on the changes in the state information of the same cell at at least two sampling time points, it is determined whether the sampling path corresponding to the cell has failed.
6. The battery management system according to claim 5, characterized in that, The status information of the battery cell includes the sampled voltage of the battery cell, and the sampling path includes a voltage sampling path, which is used to collect the sampled voltage of the corresponding battery cell; The control component is used for at least one of the following: If the absolute value of the difference between the sampled voltages of two cells at the same sampling time point exceeds the target voltage difference threshold, then it is determined that at least one of the voltage sampling paths corresponding to the two cells is faulty, and / or the voltage of at least one of the two cells is abnormal. If the rate of change of the sampled voltage of the same cell exceeds a first rate of change threshold at at least two sampling time points, then it is determined that the voltage sampling path corresponding to the cell is invalid and / or the voltage of the cell is abnormal.
7. The battery management system according to claim 5, characterized in that, The status information of the battery cell includes the sampling temperature of the battery cell, and the sampling path includes a temperature sampling path, which is used to collect the sampling temperature of the corresponding battery cell. The control component is used for at least one of the following: If the absolute value of the difference between the sampled temperatures of two cells at the same sampling time point exceeds the target temperature difference threshold, then it is determined that at least one of the temperature sampling paths corresponding to the two cells is faulty, and / or the temperature of at least one of the two cells is abnormal. If the rate of change of the sampled temperature of the same cell exceeds the second rate of change threshold at at least two sampling time points, it is determined that the temperature sampling path corresponding to the cell is invalid and / or the temperature of the cell is abnormal.
8. The battery management system according to any one of claims 1 to 7, characterized in that, The sampling chip also includes a configuration register; The control component is used to write configuration information into the configuration register after the sampling chip is powered on, so that the sampling chip operates based on the configuration information; The control component is also used to read back the configuration information written to the configuration register, and to diagnose the configuration register based on the written configuration information and the read-back configuration information.
9. The battery management system according to any one of claims 1 to 7, characterized in that, The battery management system also includes: A communication component is disposed between the sampling chip and the control component; The control component is used to acquire the status information of each of the battery cells from the sampling chip through the communication component, and to diagnose the communication component based on the acquired status information of each of the battery cells. If the diagnosis result of the communication component indicates that the communication component has not failed, the control component is used to diagnose the sampling path corresponding to each of the battery cells based on the status information of each of the battery cells.
10. A diagnostic method, characterized in that, A control component is applied in a battery management system, the battery management system further includes at least one sampling chip that is communicatively connected to the control component, each sampling chip including a sampling circuit, a sampling auxiliary component and a first detection circuit; the sampling circuit has at least one sampling path, the at least one sampling path corresponding one-to-one with at least one cell in the battery device, for collecting the state information of the corresponding cell respectively; The sampling auxiliary component is used to assist the operation of the sampling circuit; The diagnostic method includes: The first detection circuit is controlled to diagnose the sampling auxiliary component and obtain the diagnostic results of the sampling auxiliary component. Acquire the status information of each of the battery cells; If the diagnostic results of the sampling auxiliary component indicate that the sampling auxiliary component has not failed, the sampling path corresponding to each of the battery cells is diagnosed based on the status information of each battery cell.
11. A battery device, characterized in that, It includes at least one battery cell and a battery management system as described in any one of claims 1 to 9.
12. An electrical appliance, characterized in that, The electrical equipment includes the battery device as described in claim 11.
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