IC omission detection system

Abstract

The invention provides an IC omission detection system which adopts an X-ray machine to detect tray IC chip omission, adopts a distance detection sensor to detect tray deformation and warping, and adopts a visual detection system to distinguish different specifications and models, so that the labor cost is saved, and meanwhile, the detection accuracy and the production efficiency are improved. The system comprises an upper computer; a PLC control system; the feeding control system, the discharging control system, the X-ray machine detection system, the warping detection system and the visual detection system are arranged at the tail end; the PLC control system has communication and logic processing functions and is responsible for receiving and processing data obtained by the feeding control system, the discharging control system, the X-ray machine detection system, the warping detection system and the visual detection system and transmitting the processed data to the upper computer, and the upper computer is connected with the PLC control system through a communication protocol.

Description

Technical Field

[0001] The present invention relates to the technical field of tray IC detection, and in particular to an IC missing detection system. Background Art

[0002] In the production process of integrated circuits, empty trays are used to place IC chips. Before placing the chips, it is crucial to confirm whether there are any IC chips missing from the tray, whether the tray is warped or deformed, and to distinguish the specifications and models of the trays.

[0003] At present, the existing IC omission detection method is manual selection, which has low detection efficiency and low detection accuracy, and cannot distinguish warped pallets. In order to solve the above problems, it is urgent to develop an IC omission detection system for pallets to improve detection accuracy and production efficiency. Summary of the Invention

[0004] In response to the above problems, the present invention provides an IC omission detection system, which uses an X-ray machine to detect IC chip omissions on the tray, a distance detection sensor to detect tray deformation and warping, and a visual inspection system to distinguish different specifications and models, saving labor costs while improving detection accuracy and production efficiency.

[0005] An IC missing detection system, characterized in that it comprises:

[0006] Host computer;

[0007] PLC control system;

[0008] And the end loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system;

[0009] The PLC control system has communication and logic processing functions, and is responsible for receiving and processing data from the loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system, and transmitting the processed data to the host computer, which is connected to the PLC control system through a communication protocol;

[0010] The loading control system is used to grab the pallets placed at the loading position and place them at the buffer position and the dispensing position, and to separate the stacked pallets at the dispensing position and transfer them to the next process;

[0011] The unloading control system is used to transfer the pallets inspected by the X-ray inspection system and the visual inspection system and stack them at the NG stacking position, the OK stacking position, and the warped stacking position, and to grab the pallets at the NG stacking position, the OK stacking position, and the warped stacking position and place them at the unloading OK buffer position, the unloading OK unloading position, the unloading NG unloading position, and the unloading warped position;

[0012] The X-ray detection system is used to emit X-rays to collect image information of the pallet when the material passes through;

[0013] The warping detection system is used to determine whether the pallet is warped or deformed;

[0014] The visual inspection system is used to analyze visual inspection images and obtain results.

[0015] It is further characterized by:

[0016] The host computer is a touch control all-in-one computer, which has the functions of start-stop control, manual operation, servo teaching, and recording equipment operation logs, alarms and historical data;

[0017] The feeding control system is used to control the feeding machine, which includes the feeding X-axis servo motor position control, the feeding Y-axis servo motor position control, the Z-axis stepper motor position control, the clamping and loosening of the feeding gripper cylinder, the feeding and dividing and pushing cylinder control. The feeding machine is equipped with 3 feeding positions, 5 buffer positions, and a dividing position. The feeding control system is used to grab the pallets placed on the feeding position and place them on the buffer position and the dividing position, and to separate the pallets stacked on the dividing position and transfer them to the next process.

[0018] The blanking control system is used to control the blanking machine, which includes the blanking X-axis servo motor position control, the blanking Y-axis servo motor position control, the blanking Z-axis stepper motor position control, the grabbing and releasing control of the blanking gripper cylinder, the conveying servo position control and the stacking cylinder control. It controls the blanking machine to convey and stack the pallets inspected by the X-ray inspection system and the visual inspection system at the NG stacking position, the OK stacking position and the warped stacking position, and to grab and place the pallets at the NG stacking position, the OK stacking position and the warped stacking position at the blanking OK buffer position, the blanking OK blanking position, the blanking NG blanking position and the blanking warping position.

[0019] The X-ray machine detection system consists of a belt conveyor system, an X-ray machine image acquisition system, and an X-ray machine image detection software. The belt conveyor system starts to rotate after receiving the transmission instruction sent by the PLC control system. The sensor in the X-ray machine image acquisition system emits X-rays to collect image information of the pallet when detecting the material passing through. The X-ray machine detection software is installed on the X-ray machine detection industrial computer. The software has the functions of pallet model creation, AI image processing algorithm, X-ray machine running speed and direction setting, and data communication. The X-ray machine detection software compares and analyzes the pallet model with the image information collected by the X-ray machine. When a pallet with a missing IC chip is detected, the light and buzzer alarm are output, and the signal is sent to the PLC control system; when a pallet without a missing IC chip is detected, it continues to be conveyed to the unloading machine;

[0020] The warpage detection system includes a warpage detection platform and a distance detection sensor. The warpage detection platform is used to position the pallet. The distance detection sensor is used to detect the distance between the pallet and the sensor at different positions to determine whether the pallet is warped or deformed.

[0021] The visual inspection system includes an image acquisition system, an image detection system, and visual inspection software. The image acquisition system includes a dedicated light source, an industrial camera, and an optical lens. The image acquisition system is used to acquire visual inspection images. The image detection system is composed of an image processing algorithm and an image detection algorithm, which are used to analyze visual inspection images and obtain results. The visual inspection software is installed on a visual inspection industrial computer. The visual inspection software has the functions of creating pallet templates, setting camera parameters, software algorithm processing, and data communication. The visual inspection software includes character detection and appearance detection. Character detection is used to confirm the correctness of the pallet character name, and appearance detection is used to determine the pallet shape and determine the specifications and models of the pallet. The visual inspection system sends the detection results to the PLC control system via Modbus communication.

[0022] The entire system integrates a fault self-diagnosis and alarm mechanism, which monitors the operating status of each detection system and control component in real time. Once an abnormality or fault is detected, an alarm signal is immediately triggered and detailed fault information is displayed through the human-machine interface, allowing operators to quickly locate the problem and take appropriate measures. At the same time, the entire system can also automatically record fault history, providing a basis for subsequent fault analysis and system optimization.

[0023] According to actual needs, users can easily change the detection standards, control logic and system workflow by adjusting software parameters or configuration files to adapt to the detection needs of IC chips of different models and specifications;

[0024] The system supports remote access and configuration, allowing technicians to monitor and adjust the system anytime and anywhere, improving maintenance efficiency and system response speed.

[0025] Compared with the existing technology, the present invention provides an IC missing detection system with the following beneficial effects:

[0026] 1. To further improve detection accuracy and efficiency, this system introduces a deep learning algorithm into the X-ray detection system. By training on a large amount of sample data, the algorithm can automatically identify and distinguish different types of IC chips and their defect characteristics, effectively reducing the false detection rate and missed detection rate. At the same time, the deep learning algorithm also has the ability to self-learn and optimize. As the detection data continues to accumulate, its detection performance will continue to improve. It replaces the original manual visual inspection, which not only reduces labor costs, but also greatly improves production efficiency and detection accuracy, reducing trial and error costs in subsequent production links.

[0027] 2. Considering the complexity and diversity of actual production environments, this IC omission detection system was designed with full consideration given to system stability and reliability. All key components are made of high-quality, highly reliable hardware and have undergone rigorous testing and screening. In addition, the system adopts multiple backup and redundancy designs to ensure that the system can continue to operate normally and complete the detection task even if a single component fails. At the same time, the system also has a comprehensive data backup and recovery mechanism, effectively protecting the integrity and security of the test data.

[0028] 3. Finally, this IC omission detection system also provides rich data analysis and reporting functions. The system can automatically collect and organize test data and generate detailed test reports, including key information such as test time, test quantity, pass rate, defect type and distribution. The report not only helps users fully understand the quality status of the production line, but also provides strong data support for subsequent process improvement and quality control. At the same time, the system also supports exporting reports into multiple formats, making it convenient for users to view and share them on different platforms. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 Schematic diagram of the framework of the IC missing detection system of the present invention;

[0030] Figure 2 This is a schematic structural diagram of the feeding control system of the IC missing detection system of the present invention;

[0031] Figure 3 A schematic diagram of the structure of an X-ray detection system of an IC missing detection system of the present invention;

[0032] Figure 4 This is a schematic structural diagram of the blanking control system of the IC missing detection system of the present invention;

[0033] The reference numerals are as follows:

[0034] 2-1 loading X-axis servo, 2-2 loading Z-axis stepper, 2-3 loading Y-axis servo, 2-4 loading assembly, 2-5 loading buffer position, 2-6 loading position; 2-4 loading assembly includes loading gripper cylinder, material distribution cylinder, conveyor belt and material distribution position;

[0035] 3-1 X-ray machine inspection system feed port, 3-2 X-ray machine inspection system X-ray generator, 3-3 X-ray machine inspection system discharge port;

[0036] 4-1 unloading Y-axis servo, 4-2 warping detection system, 4-3 stacking station assembly, 4-4 unloading conveying servo, 4-5 stacking cylinder, 4-6 unloading X-axis servo, 4-7 unloading and picking station assembly, 4-8 unloading Z-axis stepper motor, 4-9 unloading conveyor belt, 4-10 visual inspection system; among them, 4-3 stacking station assembly is from left to right OK stacking position, NG stacking position, and warping stacking position, and 4-7 unloading and picking station assembly is from left to right OK unloading and picking position 1, OK unloading and picking position 2, OK unloading and picking position 3, NG unloading and picking position, and warping position. DETAILED DESCRIPTION

[0037] An IC missing detection system, see Figures 1-4 , which includes host computer, PLC control system, loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system;

[0038] The PLC control system has communication and logic processing functions. It is responsible for receiving and processing data from the loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system, and transmitting the processed data to the host computer. The host computer is connected to the PLC control system through a communication protocol.

[0039] Specifically, the host computer and the PLC control system communicate through Modbus TCP, the PLC control system communicates with the loading control system, unloading control system and visual inspection system through Modbus TCP, and the X-ray inspection system and warpage detection system exchange information with the PLC control system through I / O signals.

[0040] The upper computer is equipped with a touch control all-in-one machine, which provides an intuitive operation interface. The touch control all-in-one machine is equipped with start-stop control, manual operation, servo teaching, and the function of recording equipment operation logs, alarms and historical data, making it easy for operators to monitor the system operation status and make manual intervention or adjustments when necessary.

[0041] The feeding control system is used to control the feeding machine, including the feeding X-axis servo motor position control, the feeding Y-axis servo motor position control, the Z-axis stepper motor position control, the clamping and loosening of the feeding gripper cylinder, the feeding and separating and pushing cylinder control. The feeding machine is equipped with 3 feeding positions, 5 buffer positions, and a separating position. The feeding control system is used to grab the pallets placed on the feeding position and place them on the buffer position and the separating position, and to separate the stacked pallets on the separating position and transfer them to the next process.

[0042] The specific operating steps of the feeding control system are as follows:

[0043] S1. The operator places the stacked pallets on the loading machine at loading positions 1-6 and presses the loading button after placement.

[0044] S2. The PLC control system confirms that there is material at the loading position through the material detection sensor, and confirms that the loading is complete after the loading button is manually pressed. The PLC control system controls the X-axis servo motor 2-1 and the Y-axis servo motor 2-3 to move to the loading position 2-6, then the Z-axis stepper motor 2-2 descends to a predetermined height, the loading gripper cylinder in the loading assembly 2-4 clamps the pallet, and then the Z-axis stepper motor rises to the preset height;

[0045] S3. The PLC control system operates based on the feedback from the material detection sensors at buffer positions 2-5 and the feed position of loading assembly 2-4. If the feed position of loading assembly 2-4 does not detect a pallet, the PLC control system controls the X-axis and Y-axis servos to move above the feed position, lowers the Z-axis stepper motor to a preset position, and releases the pallet. The Z-axis, X-axis, and Y-axis motors then return to their home positions in sequence. If a pallet is detected at the feed position, the loading control system controls the servo and gripper to place the pallet in buffer position 2-5, after which the motor and cylinder return to their home positions.

[0046] S4. The system records the location of the tray and updates the inventory status to prepare for the subsequent IC chip placement or testing process;

[0047] S5. After the material level sensor detects the presence of material, the material dividing cylinder is activated to separate the stacked pallets into single pieces and drop them onto the conveyor belt below. The conveyor belt transports the pallets to the discharge port of the loader. After the material detection sensor at the discharge port detects that material has left, the material dividing cylinder is activated again and enters the next cycle operation process.

[0048] The X-ray machine detection system consists of a belt conveyor system, an X-ray machine image acquisition system, and an X-ray machine image detection software. The belt conveyor system starts to rotate after receiving the transmission instruction sent by the PLC control system. The sensor in the X-ray machine image acquisition system emits X-rays to collect image information of the pallet when it detects the material passing through. The X-ray machine detection software is installed on the X-ray machine detection industrial computer. The software has the functions of pallet model creation, AI image processing algorithm, X-ray machine running speed and direction setting, and data communication. The X-ray machine detection software compares and analyzes the image information collected by the X-ray machine by establishing a pallet model. When a pallet with a missing IC chip is detected, it outputs a light and buzzer alarm, and sends a signal to the PLC control system; when a pallet without a missing IC chip is detected, Then it continues to be transported to the unloading machine; in a specific embodiment, the X-ray machine detection system includes an X-ray machine detection system feed port 3-1, an X-ray machine detection system feed port 3-3 and a conveyor belt therebetween, the conveyor belt is used to adjust the running speed and running direction, the X-ray machine detection system X-ray ray generator 3-2 generates X-rays, and the conveyor belt transmits the incoming material of the loading control system to the X-ray machine ray generator. When the X-ray machine detects that there is material passing through, it emits X-rays. The X-ray machine image acquisition system collects the image of the tray under X-ray, and the X-ray machine detection software uses the AI ​​image processing algorithm to distinguish the tray with missing chips, and outputs the alarm information and sends it to the PLC control system through the I / O signal for the next step of processing. If there is no missing chip, it continues to be transported to the unloading control system;

[0049] The blanking control system is used to control the blanking machine, which includes the blanking X-axis servo motor position control, the blanking Y-axis servo motor position control, the blanking Z-axis stepper motor position control, the grabbing and releasing control of the blanking gripper cylinder, the conveying servo position control and the stacking cylinder control. It controls the blanking machine to convey the pallets inspected by the X-ray inspection system and the visual inspection system and stack them at the NG stacking position, the OK stacking position and the warped stacking position, and to grab the pallets at the NG stacking position, the OK stacking position and the warped stacking position and place them at the blanking OK buffer position, the blanking OK blanking position, the blanking NG blanking position and the blanking warping position.

[0050] During specific implementation, the unloading conveyor belt 4-9 is responsible for conveying the incoming materials from the X-ray machine to the bottom of the camera of the visual inspection system 4-10. The visual inspection system classifies the pallets by model and transmits the detection results to the PLC control system through the Modbus TCP communication protocol. The warping detection system 4-2 detects the flatness of the pallet through the distance detection sensor. If the distance detection value exceeds the set value, it is judged as warping. If the detection value is within the set value range, it is judged as qualified. The unloading conveyor servo 4-4 conveys the incoming materials from the unloading conveyor belt 4-9 to the warping detection station, OK stacking position, NG stacking position, and warping stacking position. The stacking cylinder 4-5 moves up and down to stack the incoming materials of the conveying servo in the corresponding position; the Y-axis servo motor 4-1, the X-axis servo motor 4-6, the Z-axis stepper motor servo 4-8 and the stepper motor cooperate with each other to grab the neatly stacked materials in each stacking station of the stacking station assembly 4-3 and place them in the corresponding station of the unloading and picking station assembly 4-7.

[0051] The warpage detection system includes a warpage detection platform and a distance detection sensor. The warpage detection platform is used to locate the pallet, and the distance detection sensor is used to detect the distance between the pallet and the sensor at different positions to determine whether the pallet is warped or deformed.

[0052] The visual inspection system includes an image acquisition system, an image detection system and visual inspection software. The image acquisition system includes a dedicated light source, an industrial camera and an optical lens. The image acquisition system is used to acquire visual inspection images. The image detection system consists of an image processing algorithm and an image detection algorithm, which are used to analyze visual inspection images and obtain results. The visual inspection software is installed on a visual inspection industrial computer. The visual inspection software has the functions of creating pallet templates, setting camera parameters, software algorithm processing and data communication. The visual inspection software includes character detection and appearance detection. Character detection is used to confirm the correctness of the pallet character name, and appearance detection is used to judge the pallet shape and determine the specifications and models of the pallet. The visual inspection system sends the detection results to the PLC control system via Modbus communication.

[0053] Throughout the entire process, the PLC control system ensures the accuracy and reliability of each operation by real-time monitoring of sensor feedback signals. At the same time, the touch control all-in-one machine provides an intuitive operation interface, allowing operators to easily monitor the system's operating status and perform manual intervention or adjustments when necessary.

[0054] The entire system integrates a fault self-diagnosis and alarm mechanism, which monitors the operating status of each detection system and control component in real time. Once an abnormality or fault is detected, an alarm signal is immediately triggered and detailed fault information is displayed through the human-machine interface, allowing operators to quickly locate the problem and take appropriate measures. At the same time, the entire system can also automatically record fault history, providing a basis for subsequent fault analysis and system optimization.

[0055] Users can easily change the detection standards, control logic and system workflow by adjusting software parameters or configuration files according to actual needs to adapt to the detection needs of IC chips of different models and specifications;

[0056] The system supports remote access and configuration, allowing technicians to monitor and adjust the system anytime and anywhere, improving maintenance efficiency and system response speed.

[0057] Compared with the existing technology, the present invention provides an IC missing detection system with the following beneficial effects:

[0058] 1. To further improve detection accuracy and efficiency, this system introduces a deep learning algorithm into the X-ray detection system. By training on a large amount of sample data, the algorithm can automatically identify and distinguish different types of IC chips and their defect characteristics, effectively reducing the false detection rate and missed detection rate. At the same time, the deep learning algorithm also has the ability to self-learn and optimize. As the detection data continues to accumulate, its detection performance will continue to improve. It replaces the original manual visual inspection, which not only reduces labor costs, but also greatly improves production efficiency and detection accuracy, reducing trial and error costs in subsequent production links.

[0059] 2. Considering the complexity and diversity of actual production environments, this IC omission detection system was designed with full consideration given to system stability and reliability. All key components are made of high-quality, highly reliable hardware and have undergone rigorous testing and screening. In addition, the system adopts multiple backup and redundancy designs to ensure that the system can continue to operate normally and complete the detection task even if a single component fails. At the same time, the system also has a comprehensive data backup and recovery mechanism, effectively protecting the integrity and security of the test data.

[0060] 3. Finally, this IC omission detection system also provides rich data analysis and reporting functions. The system can automatically collect and organize test data and generate detailed test reports, including key information such as test time, test quantity, pass rate, defect type and distribution. The report not only helps users fully understand the quality status of the production line, but also provides strong data support for subsequent process improvement and quality control. At the same time, the system also supports exporting reports into multiple formats, making it convenient for users to view and share them on different platforms.

[0061] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be included therein. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

[0062] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.

Claims

1. An IC missing detection system, characterized in that: It includes: Host computer; PLC control system; And the end loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system; The PLC control system has communication and logic processing functions, and is responsible for receiving and processing data from the loading control system, unloading control system, X-ray detection system, warpage detection system, and visual inspection system, and transmitting the processed data to the host computer, which is connected to the PLC control system through a communication protocol; The loading control system is used to grab the pallets placed at the loading position and place them at the buffer position and the dispensing position, and to separate the stacked pallets at the dispensing position and transfer them to the next process; The unloading control system is used to transfer the pallets inspected by the X-ray inspection system and the visual inspection system and stack them at the NG stacking position, the OK stacking position, and the warped stacking position, and to grab the pallets at the NG stacking position, the OK stacking position, and the warped stacking position and place them at the unloading OK buffer position, the unloading OK unloading position, the unloading NG unloading position, and the unloading warped position; The X-ray detection system is used to emit X-rays to collect image information of the pallet when the material passes through; The warping detection system is used to determine whether the pallet is warped or deformed; The visual inspection system is used to analyze visual inspection images and obtain results.

2. The IC missing detection system according to claim 1, wherein: The host computer is a touch control all-in-one computer, which has the functions of start and stop control, manual operation, servo teaching, and recording equipment operation logs, alarms and historical data.

3. The IC missing detection system according to claim 1, wherein: The feeding control system is used to control the feeding machine, which includes the feeding X-axis servo motor position control, the feeding Y-axis servo motor position control, the Z-axis stepper motor position control, the clamping and loosening of the feeding gripper cylinder, the feeding and dividing and pushing cylinder control. The feeding machine is provided with 3 feeding positions, 5 buffer positions, and one dividing position. The feeding control system is used to grab the pallet placed on the feeding position and place it on the buffer position and the dividing position, and to separate the stacked pallets at the dividing position and transfer them to the next process.

4. The IC missing detection system according to claim 1, wherein: The blanking control system is used to control the blanking machine, which includes the blanking X-axis servo motor position control, the blanking Y-axis servo motor position control, the blanking Z-axis stepper motor position control, the grabbing and releasing control of the blanking gripper cylinder, the conveying servo position control and the stacking cylinder control. It controls the blanking machine to convey the pallets inspected by the X-ray inspection system and the visual inspection system and stack them at the NG stacking position, the OK stacking position and the warped stacking position, and to grab the pallets at the NG stacking position, the OK stacking position and the warped stacking position and place them at the blanking OK cache position, the blanking OK blanking position, the blanking NG blanking position and the blanking warping position.

5. The IC missing detection system according to claim 1, wherein: The X-ray machine detection system consists of a belt conveyor system, an X-ray machine image acquisition system, and an X-ray machine image detection software. The belt conveyor system starts to rotate after receiving the transmission instruction sent by the PLC control system. The sensor in the X-ray machine image acquisition system emits X-rays to collect image information of the pallet when detecting the passage of materials. The X-ray machine detection software is installed on the X-ray machine detection industrial computer. The software has the functions of pallet model creation, AI image processing algorithm, X-ray machine operation speed and direction setting, and data communication. The X-ray machine detection software compares and analyzes the image information collected by the X-ray machine by establishing a pallet model. When a pallet with a missing IC chip is detected, it outputs a light and buzzer alarm, and sends a signal to the PLC control system; when a pallet without a missing IC chip is detected, it continues to be transmitted to the unloading machine.

6. The IC missing detection system according to claim 1, wherein: The warping detection system includes a warping detection platform and a distance detection sensor. The warping detection platform is used to position the pallet, and the distance detection sensor is used to detect the distance between different positions of the pallet and the sensor to determine whether the pallet is warped or deformed.

7. The IC missing detection system according to claim 1, wherein: The visual inspection system includes an image acquisition system, an image detection system and visual inspection software. The image acquisition system includes a dedicated light source, an industrial camera, and an optical lens. The image acquisition system is used to acquire visual inspection images. The image detection system is composed of an image processing algorithm and an image detection algorithm, and is used to analyze visual inspection images and obtain results. The visual inspection software is installed on a visual inspection industrial computer. The visual inspection software has the functions of pallet template creation, camera parameter setting, software algorithm processing, and data communication. The visual inspection software includes character detection and appearance detection. Character detection is used to confirm the correctness of the pallet character name, and appearance detection is used to judge the pallet shape and determine the specifications and models of the pallet. The visual inspection system sends the detection results to the PLC control system via Modbus communication.

8. The IC missing detection system according to claim 1, wherein: The entire system integrates a fault self-diagnosis and alarm mechanism, which monitors the operating status of each detection system and control component in real time. Once an abnormality or fault is detected, an alarm signal is immediately triggered and specific fault information is displayed through the human-machine interface, allowing operators to quickly locate the problem and take appropriate measures. At the same time, the entire system can also automatically record the fault history, providing a basis for subsequent fault analysis and system optimization.

9. The IC missing detection system according to claim 1, wherein: Based on actual needs, users can easily change the detection standards, control logic and system workflow by adjusting software parameters or configuration files to adapt to the detection needs of IC chips of different models and specifications.

10. The IC missing detection system according to claim 1, wherein: The system supports remote access and configuration, allowing technicians to monitor and adjust the system anytime and anywhere.

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