Josephson junction array magnetic flux freezing monitoring method, system, equipment and medium

Abstract

The invention discloses a Josephson junction array magnetic flux freezing monitoring method, system and device and a medium, and belongs to the technical field of power equipment monitoring. The method comprises the following steps: dividing a Josephson junction array to be subjected to magnetic flux freezing monitoring, and carrying out bias test on each Josephson sub-junction array to determine an abnormal Josephson sub-junction array; parallelization testing is achieved by conducting bias testing after division, and low monitoring efficiency caused by serial point-by-point testing is avoided. The method comprises the following steps: firstly, extracting a Josephson sub-junction array, then applying excitation current to the abnormal Josephson sub-junction array, determining a critical current interval and a current-voltage relation curve, then obtaining a more accurate critical current value through a current convergence seeking method, then extracting to obtain a step interval, and finally realizing accurate monitoring of Josephson junction array magnetic flux freezing by combining a threshold judgment method. The technical problem of low efficiency and accuracy of Josephson junction array magnetic flux freezing monitoring in the prior art can be solved, and the efficiency and accuracy of Josephson junction array magnetic flux freezing monitoring are improved.

Description

Technical Field

[0001] The present invention belongs to the technical field of power equipment monitoring, and in particular relates to a Josephson array flux freezing monitoring method, system, equipment and medium. Background Art

[0002] In current power systems, Josephson junction arrays (JNAs) are quantum devices composed of multiple Josephson junctions connected in series or parallel using superconducting materials. They are commonly used for high-precision signal generation and calibration, energy conversion, and storage optimization, making them a crucial component of electronic devices such as high-frequency inverters and rectifiers. The magnetic flux freezing phenomenon in JNAs occurs when, under low-temperature conditions, the superconducting current path within a Josephson junction becomes partially frozen and unable to release due to flux quantization or external magnetic field interference. This phenomenon can affect the quantum properties and practical performance of the Josephson junction, thereby impacting the normal operation of power devices.

[0003] Currently, monitoring of flux freezing in Josephson arrays typically involves performing point-by-point bias testing on each sub-array, analyzing the morphological changes of the quantum voltage steps in its current-voltage characteristic curve to determine its operating status. However, this serial testing process is time-consuming in large-scale array systems, particularly in systems containing thousands to tens of thousands of arrays, severely impacting monitoring efficiency. Furthermore, visual evaluation of the morphological changes of the quantum voltage steps in the current-voltage characteristic curve is typically performed, which is susceptible to interference from factors such as measurement noise and baseline drift, resulting in low accuracy and efficiency in monitoring flux freezing in Josephson arrays. Therefore, there is an urgent need for a method, system, device, and medium for monitoring flux freezing in Josephson arrays to address the shortcomings of existing technologies. Summary of the Invention

[0004] The present invention aims to provide a method, system, device and medium for monitoring the magnetic flux freezing of a Josephson junction array, so as to solve the technical problem of low efficiency and accuracy of the existing technology for monitoring the magnetic flux freezing of a Josephson junction array. By dividing the Josephson junction array and performing convergence value search on the critical current interval, the magnetic flux freezing monitoring of the Josephson junction array is realized by judging the threshold value of the step interval, thereby improving the efficiency and accuracy of the magnetic flux freezing monitoring of the Josephson junction array.

[0005] In order to solve the above technical problems, an embodiment of the present invention provides a Josephson array flux freezing monitoring method, comprising:

[0006] Dividing the Josephson array to be monitored for flux freezing to obtain a number of Josephson sub-arrays, and performing a bias test on each of the Josephson sub-arrays to identify abnormal Josephson sub-arrays;

[0007] applying an excitation current to the abnormal Josephson subjunction array to determine a critical current range and a current-voltage relationship curve of the abnormal Josephson subjunction array;

[0008] Performing convergence and value search on the critical current interval according to a preset current convergence and value search method to obtain the critical current value of the abnormal Josephson sub-junction array;

[0009] A step interval is obtained according to the critical current value and the current-voltage relationship curve, and the step interval is judged based on a preset threshold judgment method to obtain a magnetic flux freezing monitoring result of the Josephson array.

[0010] It can be understood that, compared with the prior art, the present invention divides the Josephson junction array to be monitored for flux freezing to obtain several Josephson sub-junction arrays, and performs a bias test on each Josephson sub-junction array to determine abnormal Josephson sub-junction arrays; by performing the bias test after the division, parallel testing is achieved, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array; then, an excitation current is applied to the abnormal Josephson sub-junction array to determine the critical current interval and the current-voltage relationship curve, and then a more accurate critical current value is obtained by the current convergence value method, and then the step interval is extracted, and then the threshold judgment method is combined to achieve accurate monitoring of the Josephson junction array flux freezing. The critical current value is calculated by the current convergence value method, which can quickly locate the step interval, and the threshold judgment method can achieve standardized analysis of the step interval, avoiding inaccurate visual analysis caused by interference from factors such as measurement noise and baseline drift. The combination of the current convergence value method and the threshold judgment method can quickly and accurately monitor the flux freezing phenomenon of the Josephson junction array, thereby improving the efficiency and accuracy of the Josephson junction array flux freezing monitoring.

[0011] As a preferred solution, the Josephson array to be monitored for flux freezing is divided to obtain a number of Josephson sub-arrays, and a bias test is performed on each of the Josephson sub-arrays to determine abnormal Josephson sub-arrays, including:

[0012] The Josephson array to be monitored for flux freezing is divided into several Josephson sub-arrays;

[0013] Applying a bias current to each of the Josephson sub-junction arrays to obtain a bias output voltage of each of the Josephson sub-junction arrays;

[0014] determining a bias output voltage threshold of each of the Josephson subjunction arrays according to the number of Josephson junctions in each of the Josephson subjunction arrays;

[0015] The bias output voltage threshold and the bias output voltage of each of the Josephson sub-junction arrays are compared, and the abnormal Josephson sub-junction array is determined according to the comparison result.

[0016] This preferred solution achieves parallel testing by dividing the Josephson junction array and comparing the thresholds of the bias test, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array; by utilizing the characteristic that the problematic junctions in the Josephson junction array account for a low proportion of division and bias testing, the problematic abnormal Josephson sub-junction array can be quickly located, thereby improving the efficiency of the Josephson junction array flux freezing monitoring.

[0017] As a preferred solution, the step of applying an excitation current to the abnormal Josephson subjunction array to determine a critical current range and a current-voltage relationship curve of the abnormal Josephson subjunction array includes:

[0018] Get the excitation current starting value, excitation current ending value and excitation current step value;

[0019] applying an excitation current having a magnitude of a starting excitation current value to the abnormal Josephson subjunction array, gradually increasing the excitation current by the excitation current step value, measuring a current value and a voltage value of each Josephson junction in the abnormal Josephson subjunction array until the magnitude of the excitation current reaches the excitation current termination value, and obtaining current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0020] A voltage mutation threshold is obtained, and the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array are determined by combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array.

[0021] This preferred solution combines excitation current step scanning with voltage mutation detection to quickly capture a larger critical current range. By dynamically adjusting the magnitude of the excitation current, it can more comprehensively cover the operating range of the abnormal Josephson junction array, thereby obtaining a more accurate critical current range and a more comprehensive and accurate current-voltage relationship curve, thereby achieving comprehensive detection of the abnormal Josephson junction array and improving the efficiency and accuracy of subsequent Josephson junction array flux freezing monitoring.

[0022] As a preferred solution, the step of obtaining the voltage mutation threshold and combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to determine the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array includes:

[0023] Fitting the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to obtain a current-voltage relationship curve of each Josephson junction in the abnormal Josephson subjunction array;

[0024] Calculating a voltage change of each Josephson junction in the abnormal Josephson subjunction array based on voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0025] obtaining a voltage mutation threshold, and when the voltage variation is greater than the voltage mutation threshold, using a current interval corresponding to the voltage variation as a critical current interval of the abnormal Josephson subjunction array;

[0026] The current-voltage relationship curves of all Josephson junctions are used as the current-voltage relationship curves of the abnormal Josephson sub-junction array.

[0027] This preferred solution can accurately divide the critical current interval through the voltage mutation threshold and the voltage change, and make judgments based on the quantified voltage change, avoiding the interference of human subjective factors in the determination of the critical current interval, improving the accuracy and objectivity of the critical current interval, and thus improving the efficiency and accuracy of subsequent Josephson array flux freezing monitoring.

[0028] As a preferred solution, the convergence and value search of the critical current interval according to a preset current convergence and value search method to obtain the critical current value of the abnormal Josephson sub-junction array specifically includes:

[0029] The critical current interval includes: an initial critical current upper limit value and an initial critical current lower limit value;

[0030] Obtaining a critical convergence parameter, and obtaining an initial critical voltage absolute difference and an initial critical voltage arithmetic mean based on the initial critical current upper limit and the initial critical current lower limit;

[0031] When the absolute difference of the initial critical voltage is greater than the critical convergence parameter, comparing the absolute difference of the initial critical voltage with the arithmetic mean of the initial critical voltage;

[0032] The initial critical current upper limit value or the initial critical current lower limit value is updated according to the comparison result, and the initial critical voltage absolute difference value and the initial critical voltage arithmetic mean value are updated until the initial critical voltage absolute difference value is less than the critical convergence parameter, completing the updating of the initial critical current upper limit value and the initial critical current lower limit value to obtain the critical current upper limit value and the critical current lower limit value;

[0033] Based on the upper limit value of the critical current and the lower limit value of the critical current, the critical current value of the abnormal Josephson sub-array is obtained.

[0034] This preferred solution uses the current convergence value search method to converge the critical current interval, which can efficiently and accurately determine the critical current value, avoid blindly searching for a suitable critical current within the critical current interval, improve the efficiency and accuracy of obtaining the critical current value, and provide an accurate current basis for subsequent extraction of the step interval of the current-voltage relationship curve and flux freezing judgment, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0035] As a preferred solution, the updating of the initial critical current upper limit or the initial critical current lower limit according to the comparison result, and then updating the initial critical voltage absolute difference and the initial critical voltage arithmetic mean, includes:

[0036] Obtaining an initial critical current arithmetic mean value according to the initial critical current upper limit value and the initial critical current lower limit value;

[0037] If the comparison result shows that the initial critical voltage absolute difference is greater than the initial critical voltage arithmetic mean, the initial critical current arithmetic mean is used as the initial critical current upper limit to update the initial critical current upper limit, and then update the initial critical current arithmetic mean, the initial critical voltage absolute difference, and the initial critical voltage arithmetic mean;

[0038] If the comparison result is that the absolute difference of the initial critical voltage is less than the arithmetic mean of the initial critical voltage, the arithmetic mean of the initial critical current is used as the lower limit of the initial critical current to update the lower limit of the initial critical current, and then the arithmetic mean of the initial critical current, the absolute difference of the initial critical voltage and the arithmetic mean of the initial critical voltage are updated.

[0039] This preferred solution dynamically updates the initial critical current upper limit and the initial critical current lower limit, which not only can quickly converge the critical current range, thereby obtaining the critical current value more quickly, but also can avoid falling into local extreme values, ensuring that the critical current value obtained by convergence is more accurate, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0040] As a preferred solution, obtaining a step interval based on the critical current value and the current-voltage relationship curve, and judging the step interval based on a preset threshold judgment method to obtain a magnetic flux freezing monitoring result of the Josephson array includes:

[0041] Using the critical current value as a segmented inflection point, performing segmented fitting on the current-voltage relationship curves of all Josephson junctions to obtain a first current-voltage relationship curve, and extracting a step interval of the first current-voltage relationship curve;

[0042] Calculating a step slope and a voltage fluctuation amplitude value based on the step interval, and calculating a standardized deviation between the voltage fluctuation amplitude value and the step slope;

[0043] When the standardized deviation is not within the preset voltage deviation threshold range, it is determined that the Josephson array has flux freezing; when the standardized deviation is within the preset voltage deviation threshold range, it is determined that the Josephson array does not have flux freezing.

[0044] This preferred solution can obtain a more accurate step interval through the critical current value, and then the step slope and voltage fluctuation amplitude value, combined with the voltage deviation threshold to realize the monitoring of the Josephson junction array flux freezing. The judgment method based on quantitative calculation and preset threshold avoids the subjectivity and instability of visual analysis, can more objectively and accurately identify the flux freezing phenomenon, and improves the accuracy of the Josephson junction array flux freezing monitoring.

[0045] Accordingly, an embodiment of the present invention provides a Josephson array flux freezing monitoring system, comprising: a bias test module, a critical current interval acquisition module, a critical current interval convergence value seeking module, and a step interval judgment module;

[0046] The bias test module is used to divide the Josephson array to be monitored for flux freezing into a plurality of Josephson sub-arrays, and perform a bias test on each of the Josephson sub-arrays to identify abnormal Josephson sub-arrays.

[0047] The critical current interval acquisition module is used to apply an excitation current to the abnormal Josephson subjunction array to determine the critical current interval and the current-voltage relationship curve of the abnormal Josephson subjunction array;

[0048] The critical current interval convergence value finding module is used to perform convergence value finding on the critical current interval according to a preset current convergence value finding method to obtain the critical current value of the abnormal Josephson sub-junction array;

[0049] The step interval judgment module is used to obtain a step interval according to the critical current value and the current-voltage relationship curve, and judge the step interval based on a preset threshold judgment method to obtain a magnetic flux freezing monitoring result of the Josephson array.

[0050] It can be understood that, compared with the prior art, the present system divides the Josephson array to be monitored for flux freezing to obtain several Josephson sub-arrays, and performs a bias test on each Josephson sub-array to determine abnormal Josephson sub-arrays; by performing the bias test after the division, parallel testing is achieved, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array; then, an excitation current is applied to the abnormal Josephson sub-array to determine the critical current interval and the current-voltage relationship curve, and then a more accurate critical current value is obtained by the current convergence value method, and then the step interval is extracted, and then the threshold judgment method is combined to achieve accurate monitoring of the Josephson array flux freezing. The critical current value is calculated by the current convergence value method, which can quickly locate the step interval, and the threshold judgment method can achieve standardized analysis of the step interval, avoiding the inaccurate visual analysis caused by interference from factors such as measurement noise and baseline drift. The combination of the current convergence value method and the threshold judgment method can quickly and accurately monitor the flux freezing phenomenon of the Josephson array, thereby improving the efficiency and accuracy of the Josephson array flux freezing monitoring.

[0051] Accordingly, an embodiment of the present invention provides a terminal device, including:

[0052] one or more processors;

[0053] a memory, coupled to the processor, for storing one or more programs;

[0054] When the one or more programs are executed by the one or more processors, the one or more processors implement the Josephson array flux freezing monitoring method as described above.

[0055] Accordingly, an embodiment of the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program is executed by a processor to implement the above-mentioned method for monitoring magnetic flux freezing of a Josephson array. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] Figure 1 A flowchart of a method for monitoring magnetic flux freezing in a Josephson array provided by an embodiment of the present invention;

[0057] Figure 2 A schematic diagram of Josephson array division provided by an embodiment of the present invention;

[0058] Figure 3 A schematic diagram of a current-voltage relationship curve provided by an embodiment of the present invention;

[0059] Figure 4 A schematic structural diagram of a Josephson array flux freezing monitoring system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0060] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0061] Example 1

[0062] To solve the technical problem of low efficiency and accuracy of the existing technology for monitoring the magnetic flux freezing of the Josephson array, please refer to Figure 1 , Figure 1 A flowchart of a method for monitoring magnetic flux freezing of a Josephson array provided by an embodiment of the present invention includes steps S101 to S104.

[0063] Step S101: dividing the Josephson array to be monitored for flux freezing to obtain a number of Josephson sub-arrays, and performing a bias test on each of the Josephson sub-arrays to determine abnormal Josephson sub-arrays.

[0064] In this embodiment, the Josephson array to be monitored for flux freezing is divided into a plurality of Josephson sub-arrays, and a bias test is performed on each of the Josephson sub-arrays to determine abnormal Josephson sub-arrays, including:

[0065] The Josephson array to be monitored for flux freezing is divided into several Josephson sub-arrays;

[0066] Applying a bias current to each of the Josephson sub-junction arrays to obtain a bias output voltage of each of the Josephson sub-junction arrays;

[0067] determining a bias output voltage threshold of each of the Josephson subjunction arrays according to the number of Josephson junctions in each of the Josephson subjunction arrays;

[0068] The bias output voltage threshold and the bias output voltage of each of the Josephson sub-junction arrays are compared, and the abnormal Josephson sub-junction array is determined according to the comparison result.

[0069] This embodiment achieves parallel testing by dividing the Josephson junction array and comparing the thresholds of the bias test, thereby avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array. By utilizing the characteristic that the proportion of problematic junctions in the Josephson junction array is relatively low for division and bias testing, problematic abnormal Josephson sub-junction arrays can be quickly located, thereby improving the efficiency of Josephson junction array flux freezing monitoring.

[0070] In an optional embodiment, the minimum resolution and the number of divisions are first obtained. In this embodiment, the minimum resolution N is set to 4, and the number of divisions is ternary. Then, the number of divisions is calculated based on the minimum resolution and the number of divisions, such as 3*4=12,3 2 *4=36…3 o *4, o is the number of the oth division, and different numbers of divisions can be obtained by analogy. The final number of the array that does not meet the number requirement of the division is called a redundant sub-array, which is a type of Josephson sub-array. After unification, the Josephson array is divided from small to large according to the number of these divisions;

[0071] For further information, please refer to Figure 2 , Figure 2 A Josephson array division diagram provided by an embodiment of the present invention is shown in FIG. Figure 2 As shown, Figure 2 The NIST2V chip is shown. According to the number of divisions calculated above, the number of Josephson junctions in each Josephson sub-junction array is 4, 12, 36, 108, etc.; therefore, Figure 2 The NIST2V chip shown can be divided into 20 segments with a total of 61204 Josephson junctions. The number of Josephson junctions in each segment is: 2916, 108, 36, 972, 12, 4, 324, 8742, 8744, 8744, 8744, 8744, 324, 4, 12, 972, 36, 108, 2916;

[0072] A bias current is then applied to each Josephson junction array, and the Josephson junction array will output a corresponding bias output voltage. Since the bias output voltage of each Josephson junction is constant, its bias output voltage threshold can be determined based on the number of Josephson junctions in each Josephson junction array. When the bias output voltage is greater than the bias output voltage threshold, it is considered that the Josephson junction array has a bias output voltage distortion and is identified as an abnormal Josephson junction array.

[0073] Step S102: applying an excitation current to the abnormal Josephson sub-junction array to determine a critical current range and a current-voltage relationship curve of the abnormal Josephson sub-junction array.

[0074] In this embodiment, applying an excitation current to the abnormal Josephson subjunction array to determine a critical current range and a current-voltage relationship curve of the abnormal Josephson subjunction array includes:

[0075] Get the excitation current starting value, excitation current ending value and excitation current step value;

[0076] applying an excitation current having a magnitude of a starting excitation current value to the abnormal Josephson subjunction array, gradually increasing the excitation current by the excitation current step value, measuring a current value and a voltage value of each Josephson junction in the abnormal Josephson subjunction array until the magnitude of the excitation current reaches the excitation current termination value, and obtaining current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0077] A voltage mutation threshold is obtained, and the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array are determined by combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array.

[0078] This embodiment combines excitation current step scanning with voltage mutation detection to quickly capture a larger critical current range. By dynamically adjusting the magnitude of the excitation current, the operating range of the abnormal Josephson junction array can be more comprehensively covered, thereby obtaining a more accurate critical current range and a more comprehensive and accurate current-voltage relationship curve, thereby achieving comprehensive detection of the abnormal Josephson junction array and improving the efficiency and accuracy of subsequent Josephson junction array flux freezing monitoring.

[0079] In this embodiment, the step of obtaining the voltage mutation threshold and combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to determine the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array includes:

[0080] Fitting the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to obtain a current-voltage relationship curve of each Josephson junction in the abnormal Josephson subjunction array;

[0081] Calculating a voltage change of each Josephson junction in the abnormal Josephson subjunction array based on voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0082] obtaining a voltage mutation threshold, and when the voltage variation is greater than the voltage mutation threshold, using a current interval corresponding to the voltage variation as a critical current interval of the abnormal Josephson subjunction array;

[0083] The current-voltage relationship curves of all Josephson junctions are used as the current-voltage relationship curves of the abnormal Josephson sub-junction array.

[0084] This embodiment can accurately divide the critical current interval through the voltage mutation threshold and the voltage change, and make judgments based on the quantified voltage change, thereby avoiding the interference of human subjective factors in the determination of the critical current interval, improving the accuracy and objectivity of the critical current interval, and thus improving the efficiency and accuracy of subsequent Josephson array flux freezing monitoring.

[0085] In an optional embodiment, an excitation current starting value I1, an excitation current ending value I1, and an excitation current step value ΔI are obtained; the excitation current is represented by I; then, an excitation current having a magnitude of the excitation current starting value is applied to the abnormal Josephson subjunction array, i.e., the excitation current is initially set to be I=I1, and then the magnitude of the excitation current I is gradually increased according to the excitation current step value ΔI until the magnitude of the excitation current reaches the excitation current ending value, i.e., I=I2; while applying the excitation current, a current value and a voltage value of each Josephson junction in the abnormal Josephson subjunction array are measured to obtain current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0086] Please refer to Figure 3 , Figure 3 A schematic diagram of a current-voltage relationship curve provided by an embodiment of the present invention is shown. The current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array are then fitted to obtain the current-voltage relationship curve of each Josephson junction in the abnormal Josephson subjunction array, that is, the following is obtained: Figure 3 In the current-voltage relationship curve shown, the horizontal axis is the current symbol and the vertical axis is the voltage symbol; I1 and I2 correspond to the starting value I1 and the ending value I1 of the excitation current respectively;

[0087] Then set the voltage mutation threshold to V 异常 Based on the voltage data of each Josephson junction in the abnormal Josephson subjunction array, the voltage change of the adjacent current points of each Josephson junction in the abnormal Josephson subjunction array is calculated. Specifically, the voltage change is recorded as ΔV = |V(i+1)-V(i)|, where adjacent current points refer to two adjacent current measurement points in the Josephson junction, which can also be understood as voltage measurement points; V(i) represents the i-th current measurement point; when ΔV>V 异常 When ΔV=|V(i+1)-V(i)|, it is determined that the abnormal Josephson subjunction array has entered the voltage mutation region. The current-voltage relationship curve is queried and the current interval [I(i), I(i+1)] corresponding to the voltage change ΔV=|V(i+1)-V(i)| is taken as the critical current interval of the abnormal Josephson subjunction array.

[0088] It should be noted that due to the continuous occurrence of ΔV>V in the Josephson junction 异常 The situation is rare, so this optional embodiment will be the first time that ΔV>V 异常 The voltage change ΔV = |V(i+1)-V(i)| and the current interval [I(i), I(i+1)] corresponding to it are taken as the critical current interval of the abnormal Josephson array.

[0089] In an optional embodiment, the voltage mutation threshold is V 异常, its specific value can be adjusted according to monitoring requirements. In this embodiment, 5% of the platform voltage value of the Josephson junction is used as the voltage mutation threshold. The platform voltage value of the Josephson junction can be calculated by the following formula:

[0090]

[0091] In the above formula, n is the number, indicating the nth Josephson junction, N is the total number of Josephson junctions, f is the microwave source frequency of the Josephson junction, h is the Planck constant, and e is the basic charge (1.602176634×10 -19 C); K j is the Josephson constant;

[0092] The above-mentioned calculation formula for the platform voltage value of the Josephson junction is only one of the calculation methods provided in this embodiment. Other corresponding calculation formulas for the platform voltage value of the Josephson junction can also be directly applied to this embodiment.

[0093] Step S103: performing convergence and value search on the critical current interval according to a preset current convergence and value search method to obtain a critical current value of the abnormal Josephson sub-array.

[0094] In this embodiment, the convergence and value search of the critical current interval according to the preset current convergence and value search method to obtain the critical current value of the abnormal Josephson sub-array specifically includes:

[0095] The critical current interval includes: an initial critical current upper limit value and an initial critical current lower limit value;

[0096] Obtaining a critical convergence parameter, and obtaining an initial critical voltage absolute difference and an initial critical voltage arithmetic mean based on the initial critical current upper limit and the initial critical current lower limit;

[0097] When the absolute difference of the initial critical voltage is greater than the critical convergence parameter, comparing the absolute difference of the initial critical voltage with the arithmetic mean of the initial critical voltage;

[0098] The initial critical current upper limit value or the initial critical current lower limit value is updated according to the comparison result, and the initial critical voltage absolute difference value and the initial critical voltage arithmetic mean value are updated until the initial critical voltage absolute difference value is less than the critical convergence parameter, completing the updating of the initial critical current upper limit value and the initial critical current lower limit value to obtain the critical current upper limit value and the critical current lower limit value;

[0099] Based on the upper limit value of the critical current and the lower limit value of the critical current, the critical current value of the abnormal Josephson sub-array is obtained.

[0100] This embodiment uses the current convergence value search method to converge the critical current interval, which can efficiently and accurately determine the critical current value, avoid blindly searching for a suitable critical current within the critical current interval, improve the efficiency and accuracy of obtaining the critical current value, and provide an accurate current basis for subsequent extraction of the step interval of the current-voltage relationship curve and flux freezing judgment, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0101] In this embodiment, the updating of the initial critical current upper limit or the initial critical current lower limit according to the comparison result, and further updating of the initial critical voltage absolute difference and the initial critical voltage arithmetic mean, includes:

[0102] Obtaining an initial critical current arithmetic mean value according to the initial critical current upper limit value and the initial critical current lower limit value;

[0103] If the comparison result shows that the initial critical voltage absolute difference is greater than the initial critical voltage arithmetic mean, the initial critical current arithmetic mean is used as the initial critical current upper limit to update the initial critical current upper limit, and then update the initial critical current arithmetic mean, the initial critical voltage absolute difference, and the initial critical voltage arithmetic mean;

[0104] If the comparison result is that the absolute difference of the initial critical voltage is less than the arithmetic mean of the initial critical voltage, the arithmetic mean of the initial critical current is used as the lower limit of the initial critical current to update the lower limit of the initial critical current, and then the arithmetic mean of the initial critical current, the absolute difference of the initial critical voltage and the arithmetic mean of the initial critical voltage are updated.

[0105] This embodiment dynamically updates the initial critical current upper limit and the initial critical current lower limit, which not only can quickly converge the critical current range, thereby obtaining the critical current value more quickly, but also can avoid falling into local extreme values, ensuring that the critical current value obtained by convergence is more accurate, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0106] In an optional embodiment, the critical current interval is recorded as [I low ,I high ], that is, the initial critical current upper limit is I high , its value is I(i+1), the initial critical current lower limit is I low , whose value is I(i); the critical convergence parameter is ε; the arithmetic mean of the initial critical current is

[0107] Then based on the initial critical current upper limit I high and the initial critical current lower limit I low, query the current-voltage relationship curve, and obtain the voltage interval corresponding to the critical current interval as the critical voltage interval The value of is V(i+1), The value is V(i); then calculate the absolute difference of the initial critical voltage and the arithmetic mean of the initial critical voltage

[0108] When the absolute difference of the initial critical voltage is greater than the critical convergence parameter, that is, Compare the absolute difference of the initial threshold voltage and the arithmetic mean of the initial critical voltage If the absolute difference of the initial critical voltage is greater than the arithmetic mean of the initial critical voltage, that is, Then the arithmetic mean of the initial critical current is As the initial critical current upper limit I high , that is, Thus, the initial critical current upper limit value I is updated high The size of the initial critical voltage is then recalculated to calculate the arithmetic mean value. Initial threshold voltage absolute difference and the arithmetic mean of the initial critical voltage (i.e. based on the updated initial critical current upper limit I high , and obtain a new one from the current-voltage relationship curve Then recalculate the initial critical voltage absolute difference and the arithmetic mean of the initial critical voltage ); If the absolute difference of the initial critical voltage Less than the arithmetic mean of the initial critical voltage Then the arithmetic mean of the initial critical current is As the initial critical current lower limit value I low ,Right now Thus, the initial critical current lower limit value I is updated low The size of the initial critical voltage is then recalculated to calculate the arithmetic mean value. Initial threshold voltage absolute difference and the arithmetic mean of the initial critical voltage (i.e. based on the updated initial critical current lower limit value I low , and obtain a new one from the current-voltage relationship curve Then recalculate the initial critical voltage absolute difference and the arithmetic mean of the initial critical voltage ); until the absolute difference of the initial critical voltage is less than the critical convergence parameter, that is, The initial critical current lower limit Ilow and the initial critical current upper limit I high After summing and taking the average value, the critical current value is obtained

[0109] Step S104: obtaining a step interval according to the critical current value and the current-voltage relationship curve, and judging the step interval based on a preset threshold judgment method to obtain a flux freezing monitoring result of the Josephson array.

[0110] In this embodiment, the step interval is obtained according to the critical current value and the current-voltage relationship curve, and the step interval is judged based on a preset threshold judgment method to obtain the magnetic flux freezing monitoring result of the Josephson array, including:

[0111] Using the critical current value as a segmented inflection point, performing segmented fitting on the current-voltage relationship curves of all Josephson junctions to obtain a first current-voltage relationship curve, and extracting a step interval of the first current-voltage relationship curve;

[0112] Calculating a step slope and a voltage fluctuation amplitude value based on the step interval, and calculating a standardized deviation between the voltage fluctuation amplitude value and the step slope;

[0113] When the standardized deviation is not within the preset voltage deviation threshold range, it is determined that the Josephson array has flux freezing; when the standardized deviation is within the preset voltage deviation threshold range, it is determined that the Josephson array does not have flux freezing.

[0114] In an optional embodiment, the critical current value is used as a segmented inflection point, and the current-voltage relationship curves of all Josephson junctions are segmentedly fitted to obtain a first current-voltage relationship curve (the vertical axis is voltage, whose unit symbol is V, and the horizontal axis is current, whose unit symbol is I), and the voltage platform interval of the step of the first current-voltage relationship curve is extracted and recorded as the step interval;

[0115] Then calculate the step slope of the step interval (i.e. ) and voltage fluctuation amplitude v V (Since there are multiple voltage values ​​in the step interval, there are corresponding multiple voltage fluctuation amplitudes), and then calculate the step slope and voltage fluctuation amplitude σ V The preset voltage deviation thresholds are set to α and β; wherein α is set to 0.001 and β is set to 3; when the standardized deviation is within the range of α and β, that is, less than or equal to β and greater than or equal to α, it is determined that the Josephson array does not have flux freezing; when the standardized deviation is not within the range of α and β, that is, greater than β or less than α, it is determined that the Josephson array has flux freezing.

[0116] It should be noted that the segmented fitting of the current-voltage relationship curves of all Josephson junctions is a common technique used by those skilled in the art and will not be elaborated on in this embodiment. The extraction of the voltage platform interval of the steps through the current-voltage relationship curve is a common technique used by those skilled in the art and will not be elaborated on in this embodiment. V , the standard deviation of multiple voltage values ​​in the step interval can be used as the voltage fluctuation amplitude σ V value.

[0117] Standard Deviation (SD) is a core indicator in statistics for measuring the degree of data dispersion. It indicates the average degree of deviation of each value in a data set from the mean. The standardized deviation of step slope and voltage fluctuation amplitude is a relatively common calculation for technicians in this field, and will not be elaborated in detail in this embodiment.

[0118] It should be noted that the specific value of the voltage deviation threshold can be adjusted according to actual needs. The setting of α to 0.001 and β to 3 in this embodiment is only for example description. The value of the voltage deviation threshold can also be determined when a bias current is applied to each of the Josephson sub-junction arrays. Specifically, when the bias output voltage of the Josephson sub-junction array is greater than the bias output voltage threshold for the first time, based on the integral of the bias output voltage and the bias current at this time, that is, Then set the value of α to 5%; and β is set to 3 according to the 3σ principle. The 3σ principle (three times the standard deviation criterion) is an empirical rule in statistics based on the normal distribution.

[0119] This embodiment can obtain a more accurate step interval through the critical current value, and then the step slope and several voltage fluctuation amplitude values, combined with the voltage deviation threshold to realize the monitoring of the Josephson junction array flux freezing. The judgment method based on quantitative calculation and preset threshold avoids the subjectivity and instability of visual analysis, can more objectively and accurately identify the flux freezing phenomenon, and improves the accuracy of the Josephson junction array flux freezing monitoring.

[0120] This embodiment divides the Josephson array to be monitored for flux freezing into several Josephson sub-arrays, and performs a bias test on each Josephson sub-array to identify abnormal Josephson sub-arrays. By performing the bias test after the division, parallel testing is achieved, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array. Then, an excitation current is applied to the abnormal Josephson sub-array to determine the critical current range and the current-voltage relationship curve. Then, a more accurate critical current value is obtained by using a current convergence value search method, and a step range is extracted. Then, a threshold judgment method is combined to achieve accurate monitoring of the Josephson array's flux freezing. The current convergence value search method is used to calculate the critical current value, which can quickly locate the step range. The threshold judgment method can achieve standardized analysis of the step range, avoiding inaccurate visual analysis caused by interference from factors such as measurement noise and baseline drift. The combination of the current convergence value search method and the threshold judgment method can quickly and accurately monitor the Josephson array's flux freezing phenomenon, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0121] Example 2

[0122] Please refer to Figure 4 , Figure 4 A schematic structural diagram of a Josephson array flux freezing monitoring system provided by an embodiment of the present invention includes: a bias test module 201, a critical current interval acquisition module 202, a critical current interval convergence value search module 203, and a step interval judgment module 204;

[0123] The bias test module 201 is used to divide the Josephson array to be monitored for flux freezing into several Josephson sub-arrays, and perform a bias test on each of the Josephson sub-arrays to identify abnormal Josephson sub-arrays.

[0124] In this embodiment, the bias test module 201 includes: a bias test unit;

[0125] The bias test unit is used to divide the Josephson array to be monitored for flux freezing to obtain a plurality of Josephson sub-arrays;

[0126] Applying a bias current to each of the Josephson sub-junction arrays to obtain a bias output voltage of each of the Josephson sub-junction arrays;

[0127] determining a bias output voltage threshold of each of the Josephson subjunction arrays according to the number of Josephson junctions in each of the Josephson subjunction arrays;

[0128] The bias output voltage threshold and the bias output voltage of each of the Josephson sub-junction arrays are compared, and the abnormal Josephson sub-junction array is determined according to the comparison result.

[0129] The critical current interval acquisition module 202 is used to apply an excitation current to the abnormal Josephson sub-junction array to determine the critical current interval and the current-voltage relationship curve of the abnormal Josephson sub-junction array.

[0130] In this embodiment, the critical current interval acquisition module 202 includes: a critical current interval acquisition unit;

[0131] The critical current interval acquisition unit is used to obtain the excitation current starting value, the excitation current ending value and the excitation current step value;

[0132] applying an excitation current having a magnitude of a starting excitation current value to the abnormal Josephson subjunction array, gradually increasing the excitation current by the excitation current step value, measuring a current value and a voltage value of each Josephson junction in the abnormal Josephson subjunction array until the magnitude of the excitation current reaches the excitation current termination value, and obtaining current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0133] A voltage mutation threshold is obtained, and the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array are determined by combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array.

[0134] In this embodiment, the critical current interval acquisition unit includes: a critical current interval acquisition subunit;

[0135] The critical current interval acquisition subunit is used to fit the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to obtain a current-voltage relationship curve of each Josephson junction in the abnormal Josephson subjunction array;

[0136] Calculating a voltage change of each Josephson junction in the abnormal Josephson subjunction array based on voltage data of each Josephson junction in the abnormal Josephson subjunction array;

[0137] obtaining a voltage mutation threshold, and when the voltage variation is greater than the voltage mutation threshold, using a current interval corresponding to the voltage variation as a critical current interval of the abnormal Josephson subjunction array;

[0138] The current-voltage relationship curves of all Josephson junctions are used as the current-voltage relationship curves of the abnormal Josephson sub-junction array.

[0139] The critical current interval convergence value seeking module 203 is used to perform convergence value seeking on the critical current interval according to a preset current convergence value seeking method to obtain the critical current value of the abnormal Josephson sub-array.

[0140] In this embodiment, the critical current interval convergence value seeking module 203 includes: a critical current interval convergence value seeking unit;

[0141] In the critical current interval convergence value-seeking unit, the critical current interval includes: an initial critical current upper limit value and an initial critical current lower limit value;

[0142] The critical current interval convergence value seeking unit is used to obtain a critical convergence parameter, and obtain an initial critical voltage absolute difference and an initial critical voltage arithmetic mean based on the initial critical current upper limit and the initial critical current lower limit;

[0143] When the absolute difference of the initial critical voltage is greater than the critical convergence parameter, comparing the absolute difference of the initial critical voltage with the arithmetic mean of the initial critical voltage;

[0144] The initial critical current upper limit value or the initial critical current lower limit value is updated according to the comparison result, and the initial critical voltage absolute difference value and the initial critical voltage arithmetic mean value are updated until the initial critical voltage absolute difference value is less than the critical convergence parameter, completing the updating of the initial critical current upper limit value and the initial critical current lower limit value to obtain the critical current upper limit value and the critical current lower limit value;

[0145] Based on the upper limit value of the critical current and the lower limit value of the critical current, the critical current value of the abnormal Josephson sub-array is obtained.

[0146] In this embodiment, the critical current interval convergence value seeking unit includes: a critical current interval convergence value seeking subunit;

[0147] The critical current interval convergence value-finding subunit is used to obtain the initial critical current arithmetic mean value according to the initial critical current upper limit value and the initial critical current lower limit value;

[0148] If the comparison result shows that the initial critical voltage absolute difference is greater than the initial critical voltage arithmetic mean, the initial critical current arithmetic mean is used as the initial critical current upper limit to update the initial critical current upper limit, and then update the initial critical current arithmetic mean, the initial critical voltage absolute difference, and the initial critical voltage arithmetic mean;

[0149] If the comparison result is that the absolute difference of the initial critical voltage is less than the arithmetic mean of the initial critical voltage, the arithmetic mean of the initial critical current is used as the lower limit of the initial critical current to update the lower limit of the initial critical current, and then the arithmetic mean of the initial critical current, the absolute difference of the initial critical voltage and the arithmetic mean of the initial critical voltage are updated.

[0150] The step interval judgment module 204 is used to obtain a step interval according to the critical current value and the current-voltage relationship curve, and judge the step interval based on a preset threshold judgment method to obtain a magnetic flux freezing monitoring result of the Josephson array.

[0151] In this embodiment, the step interval determination module 204 includes: a step interval determination unit;

[0152] The step interval judgment unit is used to use the critical current value as a segmented inflection point to perform segmented fitting on the current-voltage relationship curves of all Josephson junctions to obtain a first current-voltage relationship curve, and extract the step interval of the first current-voltage relationship curve;

[0153] Calculating a step slope and a voltage fluctuation amplitude value based on the step interval, and calculating a standardized deviation between the voltage fluctuation amplitude value and the step slope;

[0154] When the standardized deviation is not within the preset voltage deviation threshold range, it is determined that the Josephson array has flux freezing; when the standardized deviation is within the preset voltage deviation threshold range, it is determined that the Josephson array does not have flux freezing.

[0155] This embodiment divides the Josephson array to be monitored for flux freezing into several Josephson sub-arrays, and performs a bias test on each Josephson sub-array to identify abnormal Josephson sub-arrays. By performing the bias test after the division, parallel testing is achieved, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array. Then, an excitation current is applied to the abnormal Josephson sub-array to determine the critical current range and the current-voltage relationship curve. Then, a more accurate critical current value is obtained by using a current convergence value search method, and a step range is extracted. Then, a threshold judgment method is combined to achieve accurate monitoring of the Josephson array's flux freezing. The current convergence value search method is used to calculate the critical current value, which can quickly locate the step range. The threshold judgment method can achieve standardized analysis of the step range, avoiding inaccurate visual analysis caused by interference from factors such as measurement noise and baseline drift. The combination of the current convergence value search method and the threshold judgment method can quickly and accurately monitor the Josephson array's flux freezing phenomenon, thereby improving the efficiency and accuracy of Josephson array flux freezing monitoring.

[0156] Example 3

[0157] Based on the above-mentioned embodiment of a Josephson junction array flux freezing monitoring method, embodiment three of the present invention provides a terminal device, which includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, a Josephson junction array flux freezing monitoring method of an embodiment of the present invention is implemented.

[0158] For example, in this embodiment, the computer program may be divided into one or more modules, which are stored in the memory and executed by the processor to implement the present invention. The one or more module elements may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0159] The terminal device may be a computing device such as a desktop computer, a notebook computer, a PDA, a cloud server, etc. The terminal device may include, but is not limited to, a processor and a memory.

[0160] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, connecting various parts of the entire terminal device using various interfaces and lines.

[0161] Based on the above method embodiments, an embodiment of the present invention provides a computer-readable storage medium, including a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to execute a Josephson array flux freezing monitoring method described in any one of the above method embodiments of the present invention.

[0162] Wherein, the module / unit integrated in the device / terminal equipment, if implemented in the form of a software functional unit and sold or used as an independent product, can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the process in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and when the computer program is executed by the processor, it can implement the steps of the above-mentioned various method embodiments. Wherein, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc.

[0163] In summary, the embodiment of the present invention divides the Josephson junction array to be monitored for flux freezing to obtain several Josephson sub-junction arrays, and performs a bias test on each Josephson sub-junction array to determine abnormal Josephson sub-junction arrays. By performing the bias test after the division, parallel testing is achieved, avoiding the low monitoring efficiency caused by serial point-by-point testing of the entire array. Then, an excitation current is applied to the abnormal Josephson sub-junction array to determine the critical current interval and the current-voltage relationship curve. Then, a more accurate critical current value is obtained by the current convergence value search method, and the step interval is extracted. Then, the threshold judgment method is combined to achieve accurate monitoring of the Josephson junction array flux freezing. The critical current value is calculated by the current convergence value search method, which can quickly locate the step interval. The threshold judgment method can achieve standardized analysis of the step interval, avoiding inaccurate visual analysis caused by interference from factors such as measurement noise and baseline drift. The combination of the current convergence value search method and the threshold judgment method can quickly and accurately monitor the flux freezing phenomenon of the Josephson junction array, thereby improving the efficiency and accuracy of Josephson junction array flux freezing monitoring.

[0164] The specific embodiments described above further illustrate the objectives, technical solutions, and beneficial effects of the present invention. It should be understood that the above descriptions are merely specific embodiments of the present invention and are not intended to limit the scope of protection of the present invention. In particular, it should be noted that any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included within the scope of protection of the present invention for those skilled in the art.

Claims

1. A Josephson array flux freezing monitoring method, characterized in that: include: Dividing the Josephson array to be monitored for flux freezing to obtain a number of Josephson sub-arrays, and performing a bias test on each of the Josephson sub-arrays to identify abnormal Josephson sub-arrays; applying an excitation current to the abnormal Josephson subjunction array to determine a critical current range and a current-voltage relationship curve of the abnormal Josephson subjunction array; Performing convergence and value search on the critical current interval according to a preset current convergence and value search method to obtain the critical current value of the abnormal Josephson sub-junction array; A step interval is obtained according to the critical current value and the current-voltage relationship curve, and the step interval is judged based on a preset threshold judgment method to obtain a flux freezing monitoring result of the Josephson array.

2. A Josephson array flux freezing monitoring method according to claim 1, characterized in that: The Josephson array to be monitored for flux freezing is divided to obtain a plurality of Josephson sub-arrays, and a bias test is performed on each of the Josephson sub-arrays to determine abnormal Josephson sub-arrays, including: The Josephson array to be monitored for flux freezing is divided into several Josephson sub-arrays; Applying a bias current to each of the Josephson sub-junction arrays to obtain a bias output voltage of each of the Josephson sub-junction arrays; determining a bias output voltage threshold of each of the Josephson subjunction arrays according to the number of Josephson junctions in each of the Josephson subjunction arrays; The bias output voltage threshold and the bias output voltage of each of the Josephson sub-junction arrays are compared, and the abnormal Josephson sub-junction array is determined according to the comparison result.

3. The method for monitoring magnetic flux freezing of a Josephson array according to claim 1, wherein: The step of applying an excitation current to the abnormal Josephson subjunction array and determining a critical current range and a current-voltage relationship curve of the abnormal Josephson subjunction array includes: Get the excitation current starting value, excitation current ending value and excitation current step value; applying an excitation current having a magnitude of a starting excitation current value to the abnormal Josephson subjunction array, gradually increasing the excitation current by the excitation current step value, measuring a current value and a voltage value of each Josephson junction in the abnormal Josephson subjunction array until the magnitude of the excitation current reaches the excitation current termination value, and obtaining current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array; A voltage mutation threshold is obtained, and the critical current range and current-voltage relationship curve of the abnormal Josephson subjunction array are determined by combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array.

4. A Josephson array flux freezing monitoring method according to claim 3, characterized in that: The step of obtaining the voltage mutation threshold and combining the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to determine the critical current range and the current-voltage relationship curve of the abnormal Josephson subjunction array includes: Fitting the current data and voltage data of each Josephson junction in the abnormal Josephson subjunction array to obtain a current-voltage relationship curve of each Josephson junction in the abnormal Josephson subjunction array; Calculating a voltage change of each Josephson junction in the abnormal Josephson subjunction array based on voltage data of each Josephson junction in the abnormal Josephson subjunction array; obtaining a voltage mutation threshold, and when the voltage variation is greater than the voltage mutation threshold, using a current interval corresponding to the voltage variation as a critical current interval of the abnormal Josephson subjunction array; The current-voltage relationship curves of all Josephson junctions are used as the current-voltage relationship curves of the abnormal Josephson sub-junction array.

5. A Josephson array flux freezing monitoring method according to any one of claims 1 to 4, characterized in that: The method of performing convergence and value search on the critical current interval according to a preset current convergence and value search method to obtain the critical current value of the abnormal Josephson array specifically includes: The critical current interval includes: an initial critical current upper limit value and an initial critical current lower limit value; Obtaining a critical convergence parameter, and obtaining an initial critical voltage absolute difference and an initial critical voltage arithmetic mean based on the initial critical current upper limit and the initial critical current lower limit; When the absolute difference of the initial critical voltage is greater than the critical convergence parameter, comparing the absolute difference of the initial critical voltage with the arithmetic mean of the initial critical voltage; The initial critical current upper limit value or the initial critical current lower limit value is updated according to the comparison result, and the initial critical voltage absolute difference value and the initial critical voltage arithmetic mean value are updated until the initial critical voltage absolute difference value is less than the critical convergence parameter, completing the updating of the initial critical current upper limit value and the initial critical current lower limit value to obtain the critical current upper limit value and the critical current lower limit value; Based on the upper limit value of the critical current and the lower limit value of the critical current, the critical current value of the abnormal Josephson sub-array is obtained.

6. A Josephson array flux freezing monitoring method according to claim 5, characterized in that: The updating of the initial critical current upper limit or the initial critical current lower limit according to the comparison result, and then updating the initial critical voltage absolute difference and the initial critical voltage arithmetic mean, includes: Obtaining an initial critical current arithmetic mean value according to the initial critical current upper limit value and the initial critical current lower limit value; If the comparison result shows that the initial critical voltage absolute difference is greater than the initial critical voltage arithmetic mean, the initial critical current arithmetic mean is used as the initial critical current upper limit to update the initial critical current upper limit, and then update the initial critical current arithmetic mean, the initial critical voltage absolute difference, and the initial critical voltage arithmetic mean; If the comparison result is that the absolute difference of the initial critical voltage is less than the arithmetic mean of the initial critical voltage, the arithmetic mean of the initial critical current is used as the lower limit of the initial critical current to update the lower limit of the initial critical current, and then the arithmetic mean of the initial critical current, the absolute difference of the initial critical voltage and the arithmetic mean of the initial critical voltage are updated.

7. A Josephson array flux freezing monitoring method according to claim 4, characterized in that: The step interval is obtained according to the critical current value and the current-voltage relationship curve, and the step interval is judged based on a preset threshold judgment method to obtain the magnetic flux freezing monitoring result of the Josephson array, including: Using the critical current value as a segmented inflection point, performing segmented fitting on the current-voltage relationship curves of all Josephson junctions to obtain a first current-voltage relationship curve, and extracting a step interval of the first current-voltage relationship curve; Calculating a step slope and a voltage fluctuation amplitude value based on the step interval, and calculating a standardized deviation between the voltage fluctuation amplitude value and the step slope; When the standardized deviation is not within the preset voltage deviation threshold range, it is determined that the Josephson array has flux freezing; when the standardized deviation is within the preset voltage deviation threshold range, it is determined that the Josephson array does not have flux freezing.

8. A Josephson array flux freezing monitoring system, characterized in that: include: Bias test module, critical current interval acquisition module, critical current interval convergence value search module and step interval judgment module; The bias test module is used to divide the Josephson array to be monitored for flux freezing into a plurality of Josephson sub-arrays, and perform a bias test on each of the Josephson sub-arrays to identify abnormal Josephson sub-arrays. The critical current interval acquisition module is used to apply an excitation current to the abnormal Josephson subjunction array to determine the critical current interval and the current-voltage relationship curve of the abnormal Josephson subjunction array; The critical current interval convergence value finding module is used to perform convergence value finding on the critical current interval according to a preset current convergence value finding method to obtain the critical current value of the abnormal Josephson sub-junction array; The step interval judgment module is used to extract the step interval of the current-voltage relationship curve according to the critical current value, and judge the step interval based on a preset threshold judgment method to obtain the flux freezing monitoring result of the Josephson array.

9. A terminal device, characterized in that: include: one or more processors; a memory, coupled to the processor, for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the Josephson array flux freezing monitoring method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: The computer program is executed by a processor to implement a Josephson array flux freezing monitoring method according to any one of claims 1 to 7.

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