Equipment testing method, device and equipment

Abstract

The invention provides an equipment test method, device and equipment, and the method comprises the steps: determining a test group which comprises a plurality of power supply equipment, at least one power consumption equipment group and a dummy load; generating test configuration information according to the active power of each power supply device and the power consumption power of each power consumption device group; and controlling the plurality of power supply devices to supply power to at least one power consumption device group according to the test configuration information to obtain a power supply test result corresponding to the test group. And the testing efficiency of testing the power system is improved.

Description

Technical Field

[0001] The present application relates to the field of computers, and in particular to a device testing method, apparatus, and equipment. Background Art

[0002] When the computer room building is delivered, the power system in the computer room needs to be tested. The power system may include multiple power supply devices and multiple power consumption devices.

[0003] In related technologies, when testing power supply equipment in a power system, individual tests are typically performed on each power supply device individually. When testing power consumption devices, various tests are typically performed on multiple power consumption devices using mains power. However, in these methods, each power supply device is tested individually before multiple power consumption devices are tested, resulting in low power system testing efficiency. Summary of the Invention

[0004] Various aspects of the present application provide a device testing method, apparatus, and equipment to improve the testing efficiency of a power system.

[0005] In a first aspect, an embodiment of the present application provides a device testing method, comprising:

[0006] Determining a test group, wherein the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load;

[0007] Generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group;

[0008] According to the test configuration information, the multiple power supply devices are controlled to supply power to the at least one power consuming device group, and a power supply test result corresponding to the test group is obtained.

[0009] In a possible implementation, generating test configuration information based on the active power of each power supply device and the power consumption of each power consuming device group includes:

[0010] For any power supply device, determine the reactive power of the power supply device according to the active power of the power supply device;

[0011] Determining target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group;

[0012] The test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load.

[0013] In a possible implementation, determining the reactive power of the power supply device according to the active power of the power supply device includes:

[0014] determining a first preset ratio;

[0015] The product of the active power and the first preset ratio is determined as the reactive power.

[0016] In one possible implementation, determining the target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consuming device group includes:

[0017] Determine the total active power based on the active power of each power supply device;

[0018] Determine the total power consumption based on the power consumption of each power-consuming device group;

[0019] The load active power and the load reactive power of the dummy load are determined according to the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

[0020] In a possible implementation manner, determining the load active power and the load reactive power of the dummy load according to the total active power and the total power consumption includes:

[0021] Determine the difference between the total active power and the total power consumption as the load active power;

[0022] Determine the product of the total active power and the first preset ratio as the first reactive power;

[0023] multiplying the total power consumption by a second preset ratio to determine the second reactive power;

[0024] The difference between the first reactive power and the second reactive power is determined as the load reactive power.

[0025] In one possible implementation, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; and according to the test configuration information, controlling the multiple power supply devices to supply power to the multiple power consuming device groups, and obtaining power supply test results corresponding to the test groups, includes:

[0026] Performing parameter configuration on the dummy load according to the target operating parameters;

[0027] For any power supply device, configure parameters of the power supply device according to the reactive power of the power supply device;

[0028] Sending a startup instruction to the devices in the test group, where the startup instruction is used to start the devices in the test group;

[0029] Obtaining operation information of each device in the test group, and determining the power supply test result according to the operation information.

[0030] In a possible implementation, configuring parameters of the dummy load according to the target operating parameters includes:

[0031] A first configuration instruction is sent to the dummy load, where the first configuration instruction includes the target operating parameter, and the first configuration instruction is used to instruct the dummy load to set an operating parameter to the target operating parameter.

[0032] In a possible implementation, configuring parameters of the power supply device according to the reactive power of the power supply device includes:

[0033] A second configuration instruction is sent to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.

[0034] In a possible implementation, the test group further includes a rectifier device corresponding to each power-consuming device group; and determining the test group includes:

[0035] Determine a power supply device set and a power consumption device group set;

[0036] determining the plurality of power-consuming device groups in the power-consuming device group set, wherein similarity between the plurality of power-consuming device groups is greater than or equal to a preset threshold;

[0037] determining a first number of power supply devices according to a maximum processing power of a rectifier device corresponding to each power consumption device group in the plurality of power consumption device groups and an active power of each power supply device;

[0038] A first number of power supply devices in the power supply device set is determined as the multiple power supply devices.

[0039] In a second aspect, an embodiment of the present application provides a device testing apparatus, comprising: a determination module, a generation module, and a control module, wherein:

[0040] The determining module is used to determine a test group, wherein the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load;

[0041] The generating module is used to generate test configuration information according to the active power of each power supply device and the power consumption of each power consumption device group;

[0042] The control module is configured to control the plurality of power supply devices to supply power to the at least one power consuming device group according to the test configuration information, and obtain a power supply test result corresponding to the test group.

[0043] In a possible implementation, the generating module is specifically configured to:

[0044] For any power supply device, determine the reactive power of the power supply device according to the active power of the power supply device;

[0045] Determining target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group;

[0046] The test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load.

[0047] In a possible implementation, the generating module is specifically configured to:

[0048] determining a first preset ratio;

[0049] The product of the active power and the first preset ratio is determined as the reactive power.

[0050] In a possible implementation, the generating module is specifically configured to:

[0051] Determine the total active power based on the active power of each power supply device;

[0052] Determine the total power consumption based on the power consumption of each power-consuming device group;

[0053] The load active power and the load reactive power of the dummy load are determined according to the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

[0054] In a possible implementation, the generating module is specifically configured to:

[0055] Determine the difference between the total active power and the total power consumption as the load active power;

[0056] Determine the product of the total active power and the first preset ratio as the first reactive power;

[0057] multiplying the total power consumption by a second preset ratio to determine the second reactive power;

[0058] The difference between the first reactive power and the second reactive power is determined as the load reactive power.

[0059] In a possible implementation manner, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; and the control module is specifically configured to:

[0060] Performing parameter configuration on the dummy load according to the target operating parameters;

[0061] For any power supply device, configure parameters of the power supply device according to the reactive power of the power supply device;

[0062] Sending a startup instruction to the devices in the test group, where the startup instruction is used to start the devices in the test group;

[0063] Obtaining operation information of each device in the test group, and determining the power supply test result according to the operation information.

[0064] In a possible implementation, the control module is specifically configured to:

[0065] A first configuration instruction is sent to the dummy load, where the first configuration instruction includes the target operating parameter, and the first configuration instruction is used to instruct the dummy load to set an operating parameter to the target operating parameter.

[0066] In a possible implementation, the control module is specifically configured to:

[0067] A second configuration instruction is sent to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.

[0068] In a possible implementation, the test group further includes a rectifier device corresponding to each power-consuming device group; and the determination module is specifically configured to:

[0069] Determine a power supply device set and a power consumption device group set;

[0070] determining the plurality of power-consuming device groups in the power-consuming device group set, wherein similarity between the plurality of power-consuming device groups is greater than or equal to a preset threshold;

[0071] determining a first number of power supply devices according to a maximum processing power of a rectifier device corresponding to each power consumption device group in the plurality of power consumption device groups and an active power of each power supply device;

[0072] A first number of power supply devices in the power supply device set is determined as the multiple power supply devices.

[0073] In a third aspect, an embodiment of the present application provides a testing device, comprising: a memory and a processor;

[0074] The memory stores computer-executable instructions;

[0075] The processor executes the computer-executable instructions stored in the memory, so that the processor performs the method according to any one of the first aspects.

[0076] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, which are used to implement the method described in any one of the first aspects when the computer-executable instructions are executed by a processor.

[0077] In a fifth aspect, an embodiment of the present application provides a computer program product, including a computer program, which implements the method shown in any one of the first aspects when executed by a processor.

[0078] The embodiments of the present application provide a device testing method, apparatus, and equipment. The testing equipment can determine a test group and generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group. Furthermore, based on the test configuration information, multiple power supply devices can be controlled to supply power to at least one power consumption device group, thereby obtaining a power supply test result corresponding to the test group. Because multiple power supply devices and multiple power consumption devices in a power system can be divided into multiple test groups, and test configuration information is determined and tested according to the test groups, the efficiency of testing the power system is improved compared to the related art of testing each power supply device one by one and then testing multiple power consumption devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0079] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0080] Figure 1 A schematic diagram of a scenario provided for an exemplary embodiment of the present application;

[0081] Figure 2 A flowchart of a device testing method provided by an exemplary embodiment of the present application;

[0082] Figure 3 A schematic diagram of a test group provided for an exemplary embodiment of the present application;

[0083] Figure 4 A flowchart of another device testing method provided by an exemplary embodiment of the present application;

[0084] Figure 5 A schematic diagram of another test group provided for an exemplary embodiment of the present application;

[0085] Figure 6 A schematic diagram of the overall testing steps provided in the embodiments of the present application;

[0086] Figure 7A schematic diagram of a pre-test verification process provided in an embodiment of the present application;

[0087] Figure 8 A schematic diagram of a flow chart for adjusting the load of a rectifier device provided in an embodiment of the present application;

[0088] Figure 9 A schematic diagram of the structure of a device testing apparatus is provided for an embodiment of the present application;

[0089] Figure 10 A schematic structural diagram of a testing device provided as an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0090] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards, and provide corresponding operation entrances for users to choose to authorize or refuse.

[0091] To make the purpose, technical solutions, and advantages of this application more clear, the technical solutions of this application will be clearly and completely described below in conjunction with the specific embodiments of this application and the corresponding drawings. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0092] Figure 1 This is a schematic diagram of a scenario provided by an exemplary embodiment of this application. Figure 1 The computer room building is equipped with a power system, which may include multiple power supply devices, multiple dummy loads, and multiple power-consuming equipment groups.

[0093] For example, the multiple power supply devices may be power supply device 1, power supply device 2, ..., power supply device N; the multiple dummy loads may be dummy load 1, dummy load 2, ..., dummy load K; and the multiple power consumption device groups may be power consumption device group 1, power consumption device group 2, ..., power consumption device group M. N, K, and M are integers greater than or equal to 1.

[0094] A dummy load is an electronic load device that is mainly used to provide a stable load in the power system to test and measure the performance and characteristics of other equipment.

[0095] In the power system, the multiple power supply devices can supply power to multiple dummy loads and multiple power consumption device groups. During testing, the relevant parameters of the power supply devices and the dummy loads can be adjusted to ensure the smooth operation of the power system, thereby testing each device in the power system.

[0096] In related technologies, when testing power supply equipment in a power system, individual tests are typically performed on each power supply device individually. When testing power consumption devices, multiple power consumption devices are typically tested using mains power. However, in these methods, each power supply device is tested individually before multiple power consumption devices are tested, resulting in low power system testing efficiency.

[0097] In an embodiment of the present application, a test group can be determined, which may include multiple power supply devices, at least one power consumption device group, and a dummy load. Test configuration information can be generated based on the active power of each power supply device and the power consumption of each power consumption device group. Then, based on the test configuration information, multiple power supply devices can be controlled to supply power to at least one power consumption device group, thereby obtaining a power supply test result corresponding to the test group. Because multiple power supply devices and multiple power consumption devices in the power system can be divided into multiple test groups, test configuration information can be determined and tested according to the test groups. Compared with the related art of testing each power supply device one by one and then testing multiple power consumption devices, the test efficiency of the power system is improved.

[0098] In order to facilitate understanding of the technical solution of the present application, the device testing method in the related art is first described below.

[0099] Assume that the power system of a computer building includes 13 power supply devices, 10 computer rooms, and corresponding rectifier equipment for each computer room. Each computer room may include multiple cabinets, air conditioners, lighting, and other equipment. The HVAC system may also include equipment such as air conditioners and lighting.

[0100] In the prior art, each of the 13 power supply devices is tested at full load, followed by a reactive power test. Multiple power supply devices are then tested in parallel with load. The rectifier equipment and cabinets in the computer room are then fully loaded using the mains power supply, and finally the HVAC system is tested. Therefore, in the prior art, testing the power system in the computer room is time-consuming and inefficient.

[0101] In the technical solution of the present application, multiple devices in the power system can be divided into multiple test groups. According to the test groups, multiple devices in the test group can be jointly tested, that is, multiple devices in the test group can be tested at the same time. Compared with the existing technology of testing one by one, the test period is shortened, the test efficiency is improved, and the power resources required for full-load testing of rectifier equipment and cabinets in the computer room using AC power supply are saved.

[0102] The comparison between the existing technology and this solution can be shown in Table 1:

[0103] Table 1

[0104]

[0105]

[0106] The technical solutions shown in this application are described in detail below through specific embodiments. It should be noted that the following embodiments can exist independently or in combination with each other, and the same or similar contents will not be repeated in different embodiments.

[0107] Figure 2 This is a flow chart of a device testing method provided by an exemplary embodiment of the present application. Figure 2 , the method may include:

[0108] S201. Determine a test group.

[0109] The execution subject of the embodiments of the present application may be a test device, or a device testing device provided within the test device. The device testing device may be implemented using software or a combination of software and hardware. The device testing device may be a processor within the test device. For ease of understanding, the following description uses the test device as an example execution subject.

[0110] The test group may include multiple power supply devices, at least one power consumption device group, and a dummy load, wherein the performance specifications of the multiple power supply devices may be the same.

[0111] Alternatively, the power supply device may be a diesel generator.

[0112] Since a computer room building may include multiple computer rooms, each computer room may include multiple cabinets and other equipment. A power-consuming device group refers to all power-consuming devices in a computer room.

[0113] Next, combine Figure 3 , describe the test group.

[0114] Figure 3 A schematic diagram of a test group provided by an exemplary embodiment of the present application. Figure 3 Test Group 1 can include three power supply devices, two power consumption device groups, and one dummy load. The three power supply devices can be diesel generator 1, diesel generator 2, and diesel generator 3; the two power consumption device groups can be computer room 1 and computer room 2. Test Group 1 can include two power sources: one for the three diesel generators and the other for the mains.

[0115] Test Group 1 mainly involves three types of loads, including variable loads (mainly power loads, carried by the mains), steady-state loads (mainly loads of power-consuming equipment groups, carried by power supply equipment), and regulating loads (mainly dummy loads, carried by power supply equipment).

[0116] S202: Generate test configuration information according to the active power of each power supply device and the power consumption of each power consumption device group.

[0117] For any power supply device, the power of the power supply device may include active power (Active Power) and reactive power (Reactive Power).

[0118] Active power refers to the actual effective power output by the power supply equipment, used to carry the electrical load. The unit of active power can be expressed in kilowatts (kW).

[0119] Reactive power refers to the non-actual power output by power supply equipment. It is mainly used to maintain voltage stability and reactive power balance in the power system. The unit of reactive power can be expressed in kilovar (kvar).

[0120] In actual operation, there's a certain relationship between the active and reactive power of power supply equipment, known as the power factor. The power factor is the ratio of active power to apparent power, where apparent power is the square root of the sum of the squares of active and reactive power. Power factor values ​​range between 0 and 1, with values ​​closer to 1 indicating higher power efficiency.

[0121] The power consumption of a consumer group refers to its active power. For any consumer group, the power of the consumer group can include both active power and reactive power. The active power of a consumer group is the sum of the active power of all the consumer groups within that group; the reactive power of a consumer group is the sum of the reactive power of all the consumer groups within that group.

[0122] In an optional embodiment, test configuration information can be generated based on the active power of each power supply device and the power consumption of each power consuming device group in the following manner: for any power supply device, the reactive power of the power supply device is determined based on the active power of the power supply device; the target operating parameters of the dummy load are determined based on the active power of each power supply device and the power consumption of each power consuming device group; and the test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load.

[0123] Optionally, the test configuration information may include reactive power and target operating parameters of the dummy load of each power supply device.

[0124] Optionally, the target operating parameters of the dummy load may include load active power and load reactive power of the dummy load.

[0125] For example, if test group 1 is Figure 3 As shown, the power supply equipment is a diesel generator. If the active power of diesel generators 1, 2, and 3 is all 1800 kW, the reactive power 1 of diesel generator 1 can be determined based on 1800 kW, assuming the reactive power 1 of diesel generator 1 is 590 kvar. Similarly, the reactive power of diesel generators 2 and 3 can be determined to be 590 kvar. If the power consumption equipment group is a computer room, and the power consumption of computer rooms 1 and 2 is both 2400 kW, the target operating parameters of dummy load 1 can be determined based on the active power of 1800 kW of the three diesel generators and the power consumption of computer rooms 1 and 2, which is 2400 kW. Assume that the target operating parameters of dummy load 1 include a load active power of 3000 kW and a load reactive power of 1073 kvar. It can be determined that the test configuration information 1 of the test group 1 may include: the reactive power of diesel generator 1, diesel generator 2 and diesel generator 3 is 590Kvar, and the load active power of dummy load 1 is 3000KW and the load reactive power is 1073Kvar.

[0126] S203 : Control multiple power supply devices to supply power to at least one power consuming device group according to the test configuration information, and obtain a power supply test result corresponding to the test group.

[0127] Since the test configuration information includes the target operating parameters of the reactive power and dummy load of each power supply device, the reactive power of each power supply device in the test group and the operating parameters of the dummy load can be adjusted according to the test configuration information to control multiple power supply devices to supply power to at least one power consuming device group, so that the test group operates stably and the power supply test results corresponding to the test group can be obtained.

[0128] For example, if test group 1 is Figure 3As shown in , if the test configuration information 1 can include: the reactive power of diesel generator 1, diesel generator 2 and diesel generator 3 is 590Kvar, and the load active power of dummy load 1 is 3000KW and the load reactive power is 1073Kvar, then the reactive power of diesel generator 1, diesel generator 2 and diesel generator 3 can be adjusted to 590Kvar, the load active power of dummy load 1 can be adjusted to 3000KW and the load reactive power can be adjusted to 1073Kvar, so that the test group 1 can operate stably, and then the power supply test results corresponding to the three diesel generators can be obtained.

[0129] In an embodiment of the present application, a test group can be determined, and test configuration information can be generated based on the active power of each power supply device and the power consumption of each power consumption device group. Furthermore, based on the test configuration information, multiple power supply devices can be controlled to supply power to at least one power consumption device group, thereby obtaining power supply test results corresponding to the test group. Because the multiple power supply devices and multiple power consumption devices in the power system can be divided into multiple test groups, and test configuration information is determined and tested according to the test groups, the efficiency of testing the power system is improved compared to the related art of testing each power supply device individually and then testing multiple power consumption devices.

[0130] Below, in Figure 2 Based on the embodiment shown, combined Figure 4 , further detailed description of the above equipment testing method.

[0131] Figure 4 This is a flow chart of another device testing method provided by an exemplary embodiment of the present application. Figure 4 , the method may include:

[0132] S401. Determine a test group.

[0133] The test group may include multiple power supply devices, at least one power consumption device group, and a dummy load. Optionally, it may also include a rectifier device corresponding to each power consumption device group.

[0134] Rectifiers can be used to convert AC power into DC power. For example, the rectifier can be a Panamax system. The Panamax system can include a transformer, a rectifier cabinet, and an AC cabinet.

[0135] In an optional embodiment, the test group can be determined in the following manner: determining a set of power supply devices and a set of power consumption device groups; determining multiple power consumption device groups in the set of power consumption device groups; determining a first number of power supply devices based on the maximum processing power of the rectifier devices corresponding to each power consumption device group in the multiple power consumption device groups and the active power of each power supply device; and determining the first number of power supply devices in the set of power supply devices as multiple power supply devices.

[0136] The power supply equipment set may include all power supply equipment in the power system. For example, if there are 13 diesel generators, the power supply equipment set may include the 13 diesel generators.

[0137] The power consuming device group set may include all power consuming device groups in the power system. For example, if the power system includes 10 power consuming device groups, the power consuming device set includes the 10 power consuming device groups.

[0138] The similarity between the plurality of power-consuming device groups being greater than or equal to a preset threshold value means that the specifications of the plurality of power-consuming device groups are substantially the same. For example, the active power of the plurality of power-consuming device groups may all be 2400KW.

[0139] For any power-consuming device group, the power-consuming device group may have a corresponding rectifier device.

[0140] Optionally, if the active power of the power supply equipment in the test group is represented by P, the first number of the power supply equipment is represented by n, the maximum processing power of the rectifier equipment is represented by P1, and the second number of the rectifier equipment is represented by m, the first number n can be calculated by the following formula (1):

[0141]

[0142] in, Indicates a round-up operation.

[0143] For example, if the power consumption device group set includes 10 power consumption device groups, assuming that two power consumption device groups are determined in the power consumption device group set, namely computer room 1 and computer room 2. If computer room 1 corresponds to rectifier device 1, and computer room 2 corresponds to rectifier device 2, if the maximum processing power P1 of rectifier device 1 and rectifier device 2 are both 2600KW, and if the active power P of the diesel generator is 1800KW, then the first number of diesel generators can be determined by formula (1) as Then, three power supply devices can be identified in the power supply device set, assuming they are diesel generator 1, diesel generator 2 and diesel generator 3. Then test group 1 can be as follows: Figure 5 shown.

[0144] Figure 5 Schematic diagram of another test group provided for an exemplary embodiment of the present application. Figure 5Test Group 1 can include three power supply devices, one dummy load, two power consumption groups, and the corresponding rectifier devices for the two power consumption groups. The three power supply devices can be diesel generator 1, diesel generator 2, and diesel generator 3; the two power consumption groups can be computer room 1 and computer room 2; computer room 1 has corresponding rectifier device 1, and computer room 2 has corresponding rectifier device 2. Test Group 1 can include two power supplies: one for the three diesel generators and the other for the mains.

[0145] S402 : For any power supply device, determine the reactive power of the power supply device according to the active power of the power supply device.

[0146] In an optional embodiment, the reactive power of the power supply device can be determined based on the active power of the power supply device in the following manner: determining a first preset ratio; and determining the product of the active power and the first preset ratio as the reactive power.

[0147] Optionally, the first preset ratio may be a manually preset constant. The first preset ratio may be represented by a. For example, the first preset ratio a may be 0.328.

[0148] If the active power of the power supply device is represented by P and the first preset ratio is a, then the reactive power of the power supply device is Q=P*a.

[0149] For example, if the power supply device is a diesel generator, if the active power P of the diesel generator is 1800KW, and the first preset ratio a is 0.328, then the reactive power Q of the diesel generator can be determined to be 1800*0.328=590Kvar.

[0150] S403: Determine target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group.

[0151] In an optional embodiment, the target operating parameters of the dummy load can be determined based on the active power of each power supply device and the power consumption of each power consumption device group in the following manner: determine the total active power based on the active power of each power supply device; determine the total power consumption based on the power consumption of each power consumption device group; determine the load active power and load reactive power of the dummy load based on the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

[0152] For example, if test group 1 is Figure 5As shown, test group 1 includes three diesel generators, each with an active power P of 1800 kW. The total active power can be determined as 1800 kW * 3 = 5400 kW. If there are two power-consuming device groups, each with a power consumption of 2400 kW, the total power consumption can be determined as 2400 kW * 2 = 4800 kW.

[0153] Optionally, the load active power and load reactive power of the dummy load can be determined based on the total active power and the total power consumption in the following manner: the difference between the total active power and the total power consumption is determined as the load active power; the product of the total active power and the first preset ratio is determined as the first reactive power; the product of the total power consumption and the second preset ratio is determined as the second reactive power; and the difference between the first reactive power and the second reactive power is determined as the load reactive power.

[0154] The first reactive power is the total reactive power of the multiple power supply devices in the test group.

[0155] The second reactive power is the total reactive power of the plurality of power consumer groups in the test group.

[0156] Optionally, the second preset ratio may be manually preset. The second preset ratio may be represented by b. For example, the second preset ratio may be 0.291.

[0157] For example, if test group 1 is Figure 5 As shown, the total active power is 5400 kW and the total power consumption is 4800 kW. Therefore, the load active power can be determined to be 5400-4800 = 600 kW, the first reactive power is 5400*0.328 = 1771 kvar, and the second reactive power is 4800*0.291 = 1397 kvar. The difference of 374 kvar between the first reactive power of 1771 kvar and the second reactive power of 1397 kvar can be determined as the load reactive power. The target operating parameters of dummy load 1 in test group 1 can be determined to include a load active power of 600 kW and a load reactive power of 374 kvar.

[0158] S404: Determine that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load.

[0159] For example, if test group 1 is Figure 5 As shown, it can be determined that the test configuration information 1 of the test group 1 may include that the reactive power Q of each diesel generator is 590Kvar, and the load active power of the dummy load 1 is 600KW and the load reactive power is 374Kvar.

[0160] Optionally, the test equipment may be provided with a dynamic ring platform, in which the maximum processing power of the rectifier device and the power consumption of the power-consuming device group may be set, and the test configuration information is calculated through steps S402 and S403.

[0161] Optionally, according to the active power of each power supply device and the power consumption of each power consumption device group, the following parameters can be obtained, as shown in Table 2:

[0162] Table 2

[0163]

[0164] The apparent power is equal to the square root of the sum of the squares of the active power and the reactive power.

[0165] Power factor is equal to the ratio of real power to apparent power.

[0166] S405: Configure parameters of the dummy load according to the target operating parameters.

[0167] In an optional embodiment, the parameters of the dummy load may be configured according to the target operating parameters in the following manner: a first configuration instruction is sent to the dummy load.

[0168] The first configuration instruction may include a target operating parameter, and the first configuration instruction may be used to instruct the dummy load to set the operating parameter to the target operating parameter.

[0169] For example, if test group 1 is Figure 5 As shown, the target operating parameters of dummy load 1 include a load active power of 600 kW and a load reactive power of 374 kvar. A first configuration instruction may be sent to dummy load 1. The first configuration instruction may include a load active power of 600 kW and a load reactive power of 374 kvar. Based on the first configuration instruction, dummy load 1 may set the load active power to 600 kW and the load reactive power to 374 kvar.

[0170] S406 : For any power supply device, configure parameters of the power supply device according to the reactive power of the power supply device.

[0171] In an optional embodiment, the parameters of the power supply device may be configured according to the reactive power of the power supply device in the following manner: a second configuration instruction is sent to the power supply device.

[0172] The second configuration instruction may include reactive power, and the second configuration instruction may be used to instruct the power supply device to set reactive power.

[0173] For example, if test group 1 is Figure 5As shown, the power supply equipment is a diesel generator. For any diesel generator, a second configuration instruction can be sent to the diesel generator. The second configuration instruction may include a reactive power of 590Kvar. The diesel generator can set the reactive power to 590Kvar according to the second configuration instruction.

[0174] S407: Send a startup instruction to the devices in the test group.

[0175] The start command can be used to start the devices in the test group.

[0176] Optionally, the test device may send a start instruction to the devices in the test group in response to a start operation by a staff member.

[0177] For example, if test group 1 is Figure 5 As shown, the test device can send a start instruction to each device in the test group 1 in response to the start operation of the staff, so as to start the devices in the test group 1.

[0178] Since the parameters of the power supply equipment and dummy load in the test group have been configured according to the test configuration information, and the load of the test group has been reasonably allocated, in the technical solution of the present application, after starting each device in the test group, multiple power supply devices, multiple rectifier devices, and dummy loads in the test group can be jointly tested. The operation of multiple power supply devices together can simultaneously meet the full load test conditions of the power supply equipment stand-alone, the reactive function test conditions of the power supply equipment, and the parallel load test conditions of the power supply equipment; and the operation of the rectifier equipment and the power consumption equipment group can meet the full load test conditions of the rectifier equipment and the full load test conditions of the power consumption equipment group. Therefore, after each device in the test group is started, the five tests can be carried out at the same time, shortening the test period and saving power resources.

[0179] S408: Obtain operation information of each device in the test group, and determine the power supply test result according to the operation information.

[0180] Optionally, the test equipment can obtain the operating information of each device in the test group in real time through the dynamic environment platform, and determine the power supply test result based on the operating information.

[0181] Optionally, the operation information may include operating parameters such as voltage and power of each device in the test group during operation.

[0182] The power supply test result may include test results of multiple devices in the test group, and the test result may include whether the test is normal or abnormal.

[0183] If the operating information of each device in the test group is within the corresponding reasonable range, it can be determined that the test results of each device in the test group are normal; if the operating information of a device in the test group exceeds the corresponding reasonable range, it can be determined that the test result of the device is abnormal.

[0184] It should be emphasized that in the technical solution of the present application, multiple power supply devices can be connected in parallel and tested jointly with rectifier devices and power-consuming equipment groups. This is different from the independent testing in related technologies, and full-link testing is achieved. Because it involves full-link testing, the power supply equipment can be configured with parameters such as active power and reactive power to achieve joint testing of active power and reactive power of the power supply equipment. Compared with the scenario of only testing active power, it is more perfect and improves the reliability of the test. It can also realize pressure testing of rectifier equipment, testing of HVAC system, and joint testing of supporting weak current system, which can shorten the test period to the maximum extent and achieve fast and stable testing.

[0185] In an embodiment of the present application, a testing device can determine a test group. For any power supply device, the reactive power of the power supply device can be determined based on the active power of the power supply device. Furthermore, the target operating parameters of the dummy load can be determined based on the active power of each power supply device and the power consumption of each power consumption device group. Furthermore, test configuration information can be determined, including the reactive power of each power supply device and the target operating parameters of the dummy load. The testing device can configure the dummy load parameters based on the target operating parameters and, for any power supply device, configure the power supply device parameters based on the reactive power of the power supply device. The testing device can send a startup command to the devices in the test group, obtain operating information for each device in the test group, and determine power supply test results based on the operating information. Because multiple power supply devices and multiple power consumption devices in the power system can be divided into multiple test groups, test configuration information can be determined based on the test groups, and multiple devices in the test groups can be jointly tested. This improves the efficiency of testing the power system compared to related techniques that test each power supply device individually and then test multiple power consumption devices.

[0186] Next, combine Figure 6 , the overall test steps for testing the power system are explained.

[0187] Figure 6 Schematic diagram of the overall test steps provided for the embodiment of this application. Figure 6 The overall test steps for testing the power system may include pre-test verification, determining and configuring test configuration information, parallel operation, rectifier equipment load adjustment, and normal load testing.

[0188] Before implementing the technical solution of this application, a pre-test verification is required.

[0189] Next, combine Figure 7 , explains the pre-test verification.

[0190] Figure 7 This is a flow chart of a pre-test verification process provided by the embodiment of this application. Figure 7 , pre-test verification includes electrical verification, HVAC verification, and weak current verification.

[0191] Optionally, you can first perform an electrical calibration. If the calibration fails, you need to re-calibrate until the calibration succeeds. If the calibration succeeds, you can proceed to the next calibration, the HVAC calibration. For the HVAC calibration, if the calibration fails, you need to re-calibrate until the calibration succeeds. If the calibration succeeds, you can proceed to the next calibration, the weak current calibration. If the calibration fails, you need to re-calibrate until the calibration succeeds. If the calibration succeeds, you can end the pre-test calibration.

[0192] Optionally, electrical verification may include the following:

[0193] 1. The electrical link equipment such as dummy load, medium voltage cabinet, power supply equipment, rectifier equipment, and terminal cabinet has completed startup and debugging.

[0194] 2. The feeder cabinet and the incoming line cabinet of the power supply equipment have been set with formal fixed values, and the relay protection test has been verified and passed.

[0195] 3. The single-machine process inspection, alarm function, and sudden increase or decrease performance of the power supply equipment have been tested and passed.

[0196] 4. The power supply equipment logic, mains logic, and five-choose-two logic have been verified.

[0197] 5. The battery switch box in the computer room has been disconnected.

[0198] Optionally, HVAC verification may include the following:

[0199] 1. The environment of high-configuration equipment room, computer room and power distribution room has been kept clean and meets the standards.

[0200] 2. HVAC equipment such as air conditioners, chillers, and water pumps have been started up and debugged.

[0201] 3. The air conditioners, chillers and water pumps have all completed individual machine process inspections and functional tests.

[0202] 4. The filters at the terminal and cold station have been cleaned at least twice.

[0203] Optionally, the weak current check may include the following:

[0204] 1. The test logic of the medium voltage cabinet feeder test position is completed.

[0205] 2. The dynamic ring data has the function of real-time viewing and can store the test data.

[0206] 3. The dynamic environment platform has the function of implementing data recording, and the alarm information has been verified.

[0207] The power system can only be tested if all the above pre-checks are met.

[0208] It should be noted that according to the technical solution of this application, after determining the test configuration information and configuring the parameters of the power supply equipment and dummy load, the staff can also perform parallel operations on the power system. In parallel operations, the corresponding staff are required to perform corresponding actions in different areas according to the Standard Operation Procedure (SOP), and each area has a clear test operation SOP.

[0209] Optionally, parallel operations may include the following:

[0210] 1. Testing SOP for high-voltage distribution rooms and power supply equipment areas:

[0211] 1. The mains busbar is out of service and one mains power supply is cut off.

[0212] 2. Start three power supply devices, connect them to the bus section of the power supply equipment, and connect them to the mains power.

[0213] 3. Start the power-consuming device group for loading.

[0214] 4. While the power-consuming equipment group is being loaded, manually put the dummy load into the test bus section medium-voltage cabinet and energize the dummy load.

[0215] 5. After the load of the power-consuming equipment group is stable and the rectifier equipment is fully loaded, configure the parameters of the dummy load according to the test configuration information.

[0216] 6. Start recording test data through the power quality meter.

[0217] 2. Power-consuming equipment group test SOP:

[0218] 1. Remove the battery switch box under the rectifier cabinet in advance.

[0219] 2. Test and check the load, and adjust the load in advance.

[0220] 3. Complete the corresponding column loading work, and fine-tune the corresponding load of the column head cabinet and rectifier cabinet.

[0221] 3. Fake load control SOP:

[0222] 1. After the power-consuming equipment group is loaded and stabilized, power compensation is performed for the insufficient part.

[0223] 4. Monitoring Center:

[0224] 1. Pay attention to the load changes of each node and perform inter-packet power compensation.

[0225] 2. Issuance of instructions for high-power distribution rooms, power-consuming equipment groups, and centralized loads.

[0226] After the multiple power supply devices in the test group are connected in parallel, the power can be delivered to the medium voltage-low voltage system. Since in the technical solution of this application, multiple power supply devices and rectifier devices are tested together, it is also necessary to adjust the load of the rectifier device. Figure 8 The load adjustment process of the rectifier equipment is explained.

[0227] Figure 8 This is a flow chart of the load adjustment process for the rectifier equipment provided in the embodiment of the present application. Figure 8 ,include:

[0228] S801. Determine the capacity of each rectifier device.

[0229] Alternatively, the capacity of the rectifier device may be represented by the maximum processing power.

[0230] For example, the capacity of the rectifier device 1 and the rectifier device 2 may both be 2600 kW.

[0231] S802: Determine the power transmission capacity of each power supply device.

[0232] Optionally, the power transmission capacity of the power supply equipment may be represented by active power.

[0233] For example, the active power of the three diesel generators in test group 1 can all be 1800KW.

[0234] S803: Determine the load of each power-consuming device group.

[0235] Optionally, the load of the power-consuming device group may be represented by power consumption.

[0236] For example, it can be determined that the loads of computer room 1 and computer room 2 in test group 1 are both 2400KW.

[0237] S804. Match the power factor.

[0238] For example, the power factors of the three diesel generators in test group 1 may be matched to 0.95; and the power factor of the power-consuming equipment group may be matched to 0.96.

[0239] S805. Start the test.

[0240] After adjusting the load on the rectifier equipment so that the circuit can operate stably, the test can be started.

[0241] Figure 9 The present invention provides a schematic diagram of a device testing apparatus. Figure 9 The device testing apparatus 10 includes: a determination module 11, a generation module 12 and a control module 13, wherein:

[0242] The determining module 11 is used to determine a test group, wherein the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load;

[0243] The generating module 12 is used to generate test configuration information according to the active power of each power supply device and the power consumption of each power consumption device group;

[0244] The control module 13 is configured to control the plurality of power supply devices to supply power to the at least one power consuming device group according to the test configuration information, and obtain a power supply test result corresponding to the test group.

[0245] The equipment testing device provided in the embodiment of the present application can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0246] In a possible implementation, the generating module 12 is specifically configured to:

[0247] For any power supply device, determine the reactive power of the power supply device according to the active power of the power supply device;

[0248] Determining target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group;

[0249] The test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load.

[0250] In a possible implementation, the generating module 12 is specifically configured to:

[0251] determining a first preset ratio;

[0252] The product of the active power and the first preset ratio is determined as the reactive power.

[0253] In a possible implementation, the generating module 12 is specifically configured to:

[0254] Determine the total active power based on the active power of each power supply device;

[0255] Determine the total power consumption based on the power consumption of each power-consuming device group;

[0256] The load active power and the load reactive power of the dummy load are determined according to the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

[0257] In a possible implementation, the generating module 12 is specifically configured to:

[0258] Determine the difference between the total active power and the total power consumption as the load active power;

[0259] Determine the product of the total active power and the first preset ratio as the first reactive power;

[0260] multiplying the total power consumption by a second preset ratio to determine the second reactive power;

[0261] The difference between the first reactive power and the second reactive power is determined as the load reactive power.

[0262] In a possible implementation manner, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; the control module 13 is specifically configured to:

[0263] Performing parameter configuration on the dummy load according to the target operating parameters;

[0264] For any power supply device, configure parameters of the power supply device according to the reactive power of the power supply device;

[0265] Sending a startup instruction to the devices in the test group, where the startup instruction is used to start the devices in the test group;

[0266] Obtaining operation information of each device in the test group, and determining the power supply test result according to the operation information.

[0267] In a possible implementation, the control module 13 is specifically configured to:

[0268] A first configuration instruction is sent to the dummy load, where the first configuration instruction includes the target operating parameter, and the first configuration instruction is used to instruct the dummy load to set an operating parameter to the target operating parameter.

[0269] In a possible implementation, the control module 13 is specifically configured to:

[0270] A second configuration instruction is sent to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.

[0271] In a possible implementation, the test group further includes a rectifier device corresponding to each power-consuming device group; and the determining module 11 is specifically configured to:

[0272] Determine a power supply device set and a power consumption device group set;

[0273] determining the plurality of power-consuming device groups in the power-consuming device group set, wherein similarity between the plurality of power-consuming device groups is greater than or equal to a preset threshold;

[0274] determining a first number of power supply devices according to a maximum processing power of a rectifier device corresponding to each power consumption device group in the plurality of power consumption device groups and an active power of each power supply device;

[0275] A first number of power supply devices in the power supply device set is determined as the multiple power supply devices.

[0276] The equipment testing device provided in the embodiment of the present application can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar and will not be repeated here.

[0277] The exemplary embodiment of the present application provides a structural diagram of a testing device, see Figure 10 The test device 20 may include a processor 21 and a memory 22. Exemplarily, the processor 21 and the memory 22 are interconnected via a bus 23.

[0278] The memory 22 stores computer-executable instructions;

[0279] The processor 21 executes the computer-executable instructions stored in the memory 22 , so that the processor 21 performs the method shown in the above method embodiment.

[0280] Accordingly, an embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the method described in the above method embodiment.

[0281] Accordingly, an embodiment of the present application may also provide a computer program product, including a computer program, which, when executed by a processor, may implement the method shown in the above method embodiment.

[0282] It will be understood by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0283] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0284] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0285] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0286] In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0287] Memory may include non-permanent storage in a computer-readable medium, random access memory (RAM) and / or non-volatile memory in the form of read-only memory (ROM) or flash RAM. Memory is an example of a computer-readable medium.

[0288] Computer-readable media includes permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. The information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include transitory computer-readable media (transitory media), such as modulated data signals and carrier waves.

[0289] It should also be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, commodity, or apparatus that includes a series of elements includes not only those elements but also other elements not explicitly listed, or includes elements inherent to such process, method, commodity, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not exclude the presence of other identical elements in the process, method, commodity, or apparatus that includes the element.

[0290] The foregoing is merely an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should all be included within the scope of the claims of the present application.

Claims

1. A device testing method, characterized in that: include: Determining a test group, wherein the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load; Generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group; According to the test configuration information, the multiple power supply devices are controlled to supply power to the at least one power consuming device group, and a power supply test result corresponding to the test group is obtained.

2. The method according to claim 1, characterized in that Generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group, including: For any power supply device, determine the reactive power of the power supply device according to the active power of the power supply device; Determining target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group; The test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load.

3. The method according to claim 2, characterized in that Determining the reactive power of the power supply device according to the active power of the power supply device includes: determining a first preset ratio; The product of the active power and the first preset ratio is determined as the reactive power.

4. The method according to claim 2 or 3, characterized in that Determining target operating parameters of the dummy load according to the active power of each power supply device and the power consumption of each power consumption device group includes: Determine the total active power based on the active power of each power supply device; Determine the total power consumption based on the power consumption of each power-consuming device group; The load active power and the load reactive power of the dummy load are determined according to the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

5. The method according to claim 4, characterized in that Determining the load active power and the load reactive power of the dummy load according to the total active power and the total power consumption includes: Determine the difference between the total active power and the total power consumption as the load active power; Determine the product of the total active power and the first preset ratio as the first reactive power; multiplying the total power consumption by a second preset ratio to determine the second reactive power; The difference between the first reactive power and the second reactive power is determined as the load reactive power.

6. The method according to any one of claims 1 to 5, characterized in that The test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; and according to the test configuration information, controlling the multiple power supply devices to supply power to the multiple power consuming device groups to obtain power supply test results corresponding to the test groups, including: Performing parameter configuration on the dummy load according to the target operating parameters; For any power supply device, configure parameters of the power supply device according to the reactive power of the power supply device; Sending a startup instruction to the devices in the test group, where the startup instruction is used to start the devices in the test group; Obtaining operation information of each device in the test group, and determining the power supply test result according to the operation information.

7. The method according to claim 6, characterized in that Configuring parameters of the dummy load according to the target operating parameters includes: A first configuration instruction is sent to the dummy load, where the first configuration instruction includes the target operating parameter, and the first configuration instruction is used to instruct the dummy load to set an operating parameter to the target operating parameter.

8. The method according to claim 6, characterized in that Configuring parameters of the power supply device according to the reactive power of the power supply device includes: A second configuration instruction is sent to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.

9. The method according to any one of claims 1 to 8, characterized in that The test group also includes a rectifier device corresponding to each power-consuming device group; determining the test group includes: Determine a power supply device set and a power consumption device group set; determining the plurality of power-consuming device groups in the power-consuming device group set, wherein similarity between the plurality of power-consuming device groups is greater than or equal to a preset threshold; determining a first number of power supply devices according to a maximum processing power of a rectifier device corresponding to each power consumption device group in the plurality of power consumption device groups and an active power of each power supply device; A first number of power supply devices in the power supply device set is determined as the multiple power supply devices.

10. A device testing apparatus, characterized in that: include: Determination module, generation module, control module, among which, The determining module is used to determine a test group, wherein the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load; The generating module is used to generate test configuration information according to the active power of each power supply device and the power consumption of each power consumption device group; The control module is configured to control the plurality of power supply devices to supply power to the at least one power consuming device group according to the test configuration information, and obtain a power supply test result corresponding to the test group.

11. A testing device, characterized in that: include: at least one processor; as well as a memory communicatively coupled to the at least one processor; The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the testing device to perform the method according to any one of claims 1 to 9.

12. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, and when a processor executes the computer-executable instructions, the method according to any one of claims 1 to 9 is implemented.

13. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the method according to any one of claims 1 to 9 is implemented.

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