Temperature compensation method, device and equipment of photoelectric measurement system and storage medium

Abstract

The invention discloses a temperature compensation method, device and equipment of a photoelectric measurement system and a storage medium. The temperature compensation method comprises the steps that n temperature sensors are arranged in a key temperature-sensitive area of the photoelectric measurement system; the method comprises the following steps: redundantly collecting temperature sensor calibration data sets under m different temperature working conditions; calculating calibration temperature excursion deviations under m different temperature working conditions through the function relation; in the working process of the photoelectric measurement system, collecting a real-time data set of the temperature sensor; according to the real-time data set of the temperature sensor, p optimal neighbor calibration temperature drift deviations are found from the m calibration temperature drift deviations under different temperature working conditions through an optimal neighbor algorithm; and performing weighted average processing on the p optimal neighbor calibration temperature drift deviations to obtain a final to-be-compensated temperature drift deviation. The temperature compensation of the photoelectric measurement system can be effectively realized, the accuracy is good, and the precision is high.

Description

Technical Field

[0001] The present invention belongs to the technical field of temperature compensation, and in particular relates to a temperature compensation method, device, equipment and storage medium for a photoelectric measurement system. Background Art

[0002] In the actual operation of photoelectric measurement systems, the impact of ambient temperature fluctuations on measurement accuracy is a critical issue that needs to be addressed. Optical components within the system, such as light-emitting devices, lenses, and prisms, as well as mechanical materials such as optical path components and system components, expand and contract due to ambient temperature fluctuations, causing micro-deformations. This micro-deformation can cause micro-displacements in the optical path, resulting in cumulative system errors resulting from the accumulation of individual errors.

[0003] For most photoelectric measurement systems, the final measurement results often exhibit nonlinear drift with temperature. Because the direction and magnitude of individual errors vary, the cumulative effect varies not only between systems but also at different temperature points within the same system, potentially leading to poor repeatability. This significantly impacts measurement accuracy and reliability.

[0004] Currently, a common approach to temperature compensation in photoelectric measurement systems is to integrate temperature sensors around the control chip. Some control chips are also equipped with temperature sensors themselves. The temperature sensor readings are used for a priori fitting to calculate the required compensation value. However, this compensation method has many drawbacks:

[0005] First, the readings from the temperature sensor cannot accurately reflect the actual temperatures of the optical components and key structural parts that produce thermal deformation.

[0006] Second, the nonlinear nature of the system error requires a higher order of fitting and can only meet a small range of working conditions.

[0007] Third, the readings of a single temperature sensor are often difficult to match with the photoelectric measurement results, resulting in poor repeatability and an inability to effectively meet the needs of high-precision measurements. Summary of the Invention

[0008] In order to solve the above technical problems, the present invention proposes a temperature compensation method, device, equipment and storage medium for a photoelectric measurement system.

[0009] In order to achieve the above object, the technical solution of the present invention is as follows:

[0010] In a first aspect, the present invention discloses a temperature compensation method for a photoelectric measurement system, comprising:

[0011] Step S1: Arrange n temperature sensors in the key temperature-sensitive area of ​​the photoelectric measurement system, where n≥2;

[0012] Step S2: Redundantly collect temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n;

[0013] Step S3: Calculate the calibration temperature drift deviation under m different temperature conditions using the following functional relationship;

[0014]

[0015] Where: k = 1, 2, ..., m;

[0016] Step S4: During the operation of the photoelectric measurement system, collect the real-time data set of the temperature sensor

[0017] Step S5: According to the real-time data of the temperature sensor The calibration temperature drift deviations of p best neighbors are found from the calibration temperature drift deviations of m different temperature conditions by the best nearest neighbor algorithm;

[0018] Step S6: performing weighted averaging processing on the calibrated temperature drift deviations of the p best neighbors to obtain the final temperature drift deviation to be compensated.

[0019] On the basis of the above technical solution, the following improvements can be made:

[0020] As a preferred solution, step S5 includes:

[0021] Step S5.1: Calculate the temperature sensor real-time data set using the following formula: and m types of temperature sensor calibration data sets The Euclidean distance between:

[0022]

[0023] Where: k = 1, 2, ..., m;

[0024] Real-time data group With the kth calibration data set The Euclidean distance between

[0025] The temperature value collected by the i-th temperature sensor in the real-time data group;

[0026] The temperature value collected by the i-th temperature sensor in the k-th calibration data set;

[0027] Step S5.2: Traverse the m Euclidean distances and find the p smallest Euclidean distances;

[0028] Step S5.3: Based on the p smallest Euclidean distances, find the corresponding calibration data set and calibration temperature drift deviation.

[0029] As a preferred solution, step S6 obtains the final temperature drift deviation to be compensated by the following formula: ;

[0030]

[0031] in:

[0032] is the jth smallest Euclidean distance;

[0033] is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

[0034] As a preferred solution, in step S1, the temperature sensor is arranged at a thermal deformation sensitive position of the optical element and / or optical path structural component.

[0035] In a second aspect, the present invention discloses a temperature compensation device for a photoelectric measurement system, comprising:

[0036] An arrangement module, used for arranging n temperature sensors in a key temperature-sensitive area of ​​the photoelectric measurement system, where n is greater than or equal to 2;

[0037] Calibration acquisition module, used for redundant acquisition of temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n;

[0038] The temperature drift calibration module is used to calculate the calibration temperature drift deviation under m different temperature conditions through the following functional relationship;

[0039]

[0040] Where: k = 1, 2, ..., m;

[0041] Real-time acquisition module, used to collect real-time data of temperature sensor during the operation of photoelectric measurement system

[0042] Search module for real-time data from temperature sensor The calibration temperature drift deviations of p best neighbors are found from the calibration temperature drift deviations of m different temperature conditions by the best nearest neighbor algorithm;

[0043] The processing module is used to perform weighted average processing on the calibrated temperature drift deviations of the p best neighbors to obtain the final temperature drift deviation to be compensated.

[0044] As a preferred solution, the search module includes:

[0045] The distance calculation unit is used to calculate the temperature sensor real-time data group using the following formula and m types of temperature sensor calibration data sets The Euclidean distance between:

[0046]

[0047] Where: k = 1, 2, ..., m;

[0048] Real-time data group With the kth calibration data set The Euclidean distance between

[0049] The temperature value collected by the i-th temperature sensor in the real-time data group;

[0050] The temperature value collected by the i-th temperature sensor in the k-th calibration data set;

[0051] The traversal unit is used to traverse m Euclidean distances and find the p smallest Euclidean distances;

[0052] The search unit is used to find the corresponding calibration data group and calibration temperature drift deviation based on the p smallest Euclidean distances.

[0053] As a preferred solution, the processing module obtains the final temperature drift deviation to be compensated by the following formula:

[0054] in:

[0055] is the jth smallest Euclidean distance;

[0056] is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

[0057] As a preferred solution, the arrangement module is used to arrange the temperature sensor at a thermal deformation sensitive position of the optical element and / or the optical path structural component.

[0058] In a third aspect, the present invention discloses a computing device, comprising:

[0059] one or more processors;

[0060] Memory;

[0061] and one or more programs, wherein the one or more programs are stored in a memory and configured to be executed by one or more processors, and the one or more programs include instructions for any of the above-mentioned temperature compensation methods for a photoelectric measurement system.

[0062] In a fourth aspect, the present invention discloses a storage medium storing one or more computer-readable programs, wherein the one or more programs include instructions suitable for being loaded by a memory and executing any of the above-mentioned temperature compensation methods for a photoelectric measurement system.

[0063] The present invention discloses a temperature compensation method, device, equipment and storage medium for a photoelectric measurement system, which has the following beneficial effects:

[0064] First, the present invention directly arranges multiple temperature sensors (n≥2) in the key temperature-sensitive area of ​​the photoelectric measurement system to capture the temperature state of the actual deformation source in real time. Compared with the traditional single temperature sensor, it can more comprehensively and accurately obtain the temperature information of each optical component and key structural part that produces thermal deformation, solving the problem of mismatch between the reading of a single temperature sensor and the actual temperature, and effectively improving the accuracy of temperature data acquisition.

[0065] Second, this invention utilizes a weighted average best-nearest neighbor algorithm, fully accounting for the nonlinear nature of system errors. By using redundant calibration and the best-nearest neighbor algorithm, it avoids the limitations of traditional fitting methods, which require high fitting orders due to nonlinear system errors and are only applicable to a narrow range of operating conditions. It can adapt to a wider operating temperature range, significantly improving the accuracy and effectiveness of temperature compensation.

[0066] Third, the present invention effectively improves the repeatability of temperature compensation, significantly enhances the consistency between the temperature sensor readings and the photoelectric measurement results, improves the overall measurement accuracy and reliability of the photoelectric measurement system, and provides a strong guarantee for the stable and accurate operation of the photoelectric measurement system in complex temperature environments. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0068] Figure 1 This is a flow chart of a temperature compensation method for a photoelectric measurement system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0069] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0070] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0071] The use of ordinal numbers "first," "second," "third," etc. to describe common objects merely indicates that different instances of similar objects are involved and is not intended to imply that the objects so described must have a given order in time, space, ranking, or in any other manner.

[0072] In addition, the expression of “comprising” an element is an “open” expression, which merely means that corresponding components or steps exist, and should not be interpreted as excluding additional components or steps.

[0073] In order to achieve the purpose of the present invention, some embodiments of the temperature compensation method of the photoelectric measurement system, such as Figure 1 As shown, the temperature compensation method includes:

[0074] Step S101: Arrange n temperature sensors in the key temperature-sensitive area of ​​the photoelectric measurement system, where n≥2;

[0075] Step S102: Redundantly collect temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n;

[0076] Step S103: Calculate the calibration temperature drift deviation under m different temperature conditions using the following functional relationship, as shown in Table 1;

[0077]

[0078] Where: k = 1, 2, ..., m;

[0079] Step S104: During the operation of the photoelectric measurement system, real-time data sets of the temperature sensor are collected.

[0080] Step S105: According to the real-time data set of the temperature sensor Using the best nearest neighbor algorithm, find p (e.g., 3) best nearest neighbor calibration temperature drift deviations from the calibration temperature drift deviations of m different temperature conditions;

[0081] Step S106: performing weighted averaging processing on the calibrated temperature drift deviations of the p best neighbors to obtain a final temperature drift deviation to be compensated.

[0082] It is worth noting that in step S101 , the temperature sensors are arranged at different thermal deformation sensitive positions of the optical element and / or the optical path structural component.

[0083] The temperature sensor may be, but is not limited to, a chip temperature difference resistor or a sensor for optical temperature measurement.

[0084] Table 1: Calibration data sets and calibration temperature drift deviations under m different temperature conditions

[0085]

[0086] Furthermore, the above step S105 includes:

[0087] Step S105.1: Calculate the temperature sensor real-time data set using the following formula: and m types of temperature sensor calibration data sets The Euclidean distance between:

[0088]

[0089] Where: k = 1, 2, ..., m;

[0090] Real-time data group With the kth calibration data set The Euclidean distance between

[0091] The temperature value collected by the i-th temperature sensor in the real-time data group;

[0092] The temperature value collected by the i-th temperature sensor in the k-th calibration data set;

[0093] Step S105.2: Traverse the m Euclidean distances and find the p smallest Euclidean distances;

[0094] Step S105.3: Based on the p smallest Euclidean distances, find the corresponding calibration data set and calibration temperature drift deviation.

[0095] Furthermore, the above step S106 obtains the final temperature drift deviation to be compensated by the following formula: ;

[0096]

[0097] in:

[0098] is the jth smallest Euclidean distance;

[0099] is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

[0100] When p=3, we get and but

[0101] In some other embodiments, the present invention discloses a temperature compensation device for a photoelectric measurement system, comprising:

[0102] An arrangement module, used for arranging n temperature sensors in a key temperature-sensitive area of ​​the photoelectric measurement system, where n is greater than or equal to 2;

[0103] Calibration acquisition module, used for redundant acquisition of temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n;

[0104] The temperature drift calibration module is used to calculate the calibration temperature drift deviation under m different temperature conditions through the following functional relationship;

[0105]

[0106] Where: k = 1, 2, ..., m;

[0107] Real-time acquisition module, used to collect real-time data of temperature sensor during the operation of photoelectric measurement system

[0108] Search module for real-time data from temperature sensor The calibration temperature drift deviations of p best neighbors are found from the calibration temperature drift deviations of m different temperature conditions by the best nearest neighbor algorithm;

[0109] The processing module is used to perform weighted average processing on the calibrated temperature drift deviations of the p best neighbors to obtain the final temperature drift deviation to be compensated.

[0110] Furthermore, the search module includes:

[0111] The distance calculation unit is used to calculate the temperature sensor real-time data group using the following formula and m types of temperature sensor calibration data sets The Euclidean distance between:

[0112]

[0113] Where: k = 1, 2, ..., m;

[0114] Real-time data group With the kth calibration data set The Euclidean distance between

[0115] The temperature value collected by the i-th temperature sensor in the real-time data group;

[0116] The temperature value collected by the i-th temperature sensor in the k-th calibration data set;

[0117] The traversal unit is used to traverse m Euclidean distances and find the p smallest Euclidean distances;

[0118] The search unit is used to find the corresponding calibration data group and calibration temperature drift deviation based on the p smallest Euclidean distances.

[0119] Furthermore, the above processing module obtains the final temperature drift deviation to be compensated by the following formula:

[0120] in:

[0121] is the jth smallest Euclidean distance;

[0122] is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

[0123] Furthermore, the arrangement module is used to arrange the temperature sensor at a position sensitive to thermal deformation of the optical element and / or optical path structure.

[0124] Furthermore, it should be noted that: when the temperature compensation device of the photoelectric measurement system provided in the above embodiment performs temperature compensation, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the temperature compensation device of the photoelectric measurement system is divided into different functional modules to complete all or part of the functions described above.

[0125] In addition, the temperature compensation device of the photoelectric measurement system provided in the above embodiment and the temperature compensation method of the photoelectric measurement system are of the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.

[0126] In some other embodiments, the present invention discloses a computing device comprising:

[0127] one or more processors;

[0128] Memory;

[0129] and one or more programs, wherein the one or more programs are stored in a memory and configured to be executed by one or more processors, and the one or more programs include instructions for any of the above-mentioned temperature compensation methods for a photoelectric measurement system.

[0130] In some other embodiments, the present invention discloses a storage medium storing one or more computer-readable programs, wherein the one or more programs include instructions suitable for being loaded by a memory and executing any of the above-mentioned temperature compensation methods for a photoelectric measurement system.

[0131] The present invention discloses a temperature compensation method, device, equipment and storage medium for a photoelectric measurement system, which has the following beneficial effects:

[0132] First, the present invention directly arranges multiple temperature sensors (n≥2) in the key temperature-sensitive area of ​​the photoelectric measurement system to capture the temperature state of the actual deformation source in real time. Compared with the traditional single temperature sensor, it can more comprehensively and accurately obtain the temperature information of each optical component and key structural part that produces thermal deformation, solving the problem of mismatch between the reading of a single temperature sensor and the actual temperature, and effectively improving the accuracy of temperature data acquisition.

[0133] Second, this invention utilizes a weighted average best-nearest neighbor algorithm, fully accounting for the nonlinear nature of system errors. By using redundant calibration and the best-nearest neighbor algorithm, it avoids the limitations of traditional fitting methods, which require high fitting orders due to nonlinear system errors and are only applicable to a narrow range of operating conditions. It can adapt to a wider operating temperature range, significantly improving the accuracy and effectiveness of temperature compensation.

[0134] Third, the present invention effectively improves the repeatability of temperature compensation, significantly enhances the consistency between the temperature sensor readings and the photoelectric measurement results, improves the overall measurement accuracy and reliability of the photoelectric measurement system, and provides a strong guarantee for the stable and accurate operation of the photoelectric measurement system in complex temperature environments.

[0135] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which shall fall within the scope of the present invention to be protected. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A temperature compensation method for a photoelectric measurement system, characterized in that: include: Step S1: Arrange n temperature sensors in the key temperature-sensitive area of ​​the photoelectric measurement system, where n≥2; Step S2: Redundantly collect temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n; Step S3: Calculate the calibration temperature drift deviation under m different temperature conditions using the following functional relationship; Where: k = 1, 2, ..., m; Step S4: During the operation of the photoelectric measurement system, collect the real-time data set of the temperature sensor Step S5: According to the real-time data of the temperature sensor The calibration temperature drift deviations of p best neighbors are found from the calibration temperature drift deviations of m different temperature conditions by the best nearest neighbor algorithm; Step S6: performing weighted averaging processing on the calibrated temperature drift deviations of the p best neighbors to obtain the final temperature drift deviation to be compensated.

2. The temperature compensation method according to claim 1, wherein: The step S5 comprises: Step S5.1: Calculate the temperature sensor real-time data set using the following formula: and m types of temperature sensor calibration data sets The Euclidean distance between: Where: k = 1, 2, ..., m; Real-time data group With the kth calibration data set The Euclidean distance between The temperature value collected by the i-th temperature sensor in the real-time data group; The temperature value collected by the i-th temperature sensor in the k-th calibration data set; Step S5.2: Traverse the m Euclidean distances and find the p smallest Euclidean distances; Step S5.3: Based on the p smallest Euclidean distances, find the corresponding calibration data set and calibration temperature drift deviation.

3. The temperature compensation method according to claim 1, wherein: In step S6, the final temperature drift deviation to be compensated is obtained by the following formula in: is the jth smallest Euclidean distance; is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

4. The temperature compensation method according to claim 1, wherein: In step S1, the temperature sensor is arranged at a thermal deformation sensitive position of the optical element and / or the optical path structural component.

5. A temperature compensation device for a photoelectric measurement system, characterized in that: include: An arrangement module, used for arranging n temperature sensors in a key temperature-sensitive area of ​​the photoelectric measurement system, where n is greater than or equal to 2; Calibration acquisition module, used for redundant acquisition of temperature sensor calibration data sets under m different temperature conditions Where: k=1,2,...,m and m>>n; The temperature drift calibration module is used to calculate the calibration temperature drift deviation under m different temperature conditions through the following functional relationship; Where: k = 1, 2, ..., m; Real-time acquisition module, used to collect real-time data of temperature sensor during the operation of photoelectric measurement system Search module for real-time data from temperature sensor The calibration temperature drift deviations of p best neighbors are found from the calibration temperature drift deviations of m different temperature conditions by the best nearest neighbor algorithm; The processing module is used to perform weighted average processing on the calibrated temperature drift deviations of the p best neighbors to obtain the final temperature drift deviation to be compensated.

6. The temperature compensation device according to claim 5, characterized in that: The search module includes: The distance calculation unit is used to calculate the temperature sensor real-time data group using the following formula and m types of temperature sensor calibration data sets The Euclidean distance between: Where: k = 1, 2, ..., m; Real-time data group With the kth calibration data set The Euclidean distance between The temperature value collected by the i-th temperature sensor in the real-time data group; The temperature value collected by the i-th temperature sensor in the k-th calibration data set; The traversal unit is used to traverse m Euclidean distances and find the p smallest Euclidean distances; The search unit is used to find the corresponding calibration data group and calibration temperature drift deviation based on the p smallest Euclidean distances.

7. The temperature compensation device according to claim 5, characterized in that: The processing module obtains the final temperature drift deviation to be compensated by the following formula in: is the jth smallest Euclidean distance; is the calibration temperature drift deviation corresponding to the jth smallest Euclidean distance.

8. The temperature compensation device according to claim 5, characterized in that: The arrangement module is used to arrange the temperature sensor at a thermal deformation sensitive position of the optical element and / or the optical path structural component.

9. A computing device, characterized in that include: one or more processors; Memory; and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by one or more processors, and the one or more programs include instructions for the temperature compensation method of the photoelectric measurement system according to any one of claims 1 to 4.

10. A storage medium, characterized in that The storage medium stores one or more computer-readable programs, and the one or more programs include instructions, and the instructions are suitable for being loaded by the memory and executing the temperature compensation method for the photoelectric measurement system according to any one of claims 1 to 4.

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