A device for manufacturing a tuning fork probe and a method of operating the same

By combining a multidimensional displacement platform and a shearing needle assembly, precise alignment and high-quality shearing of the TF-AFM probe are achieved, solving the problems of consistency and low yield in existing methods, and making it suitable for TF-AFM systems in extreme environments.

CN120629647BActive Publication Date: 2025-11-11CHINA JILIANG UNIV
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Patent Information

Application Number
CN202511113853.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-08-11
Publication Date
2025-11-11
Estimated Expiration
2045-08-11

AI Technical Summary

Technical Problem

Existing TF-AFM probe preparation methods suffer from poor consistency, low yield, and low efficiency. Furthermore, manual operation can easily lead to probe damage and inaccurate positioning, making it difficult to operate stably in extreme environments.

Method used

By employing a multi-dimensional displacement platform and a shearing assembly, precise alignment and high-quality shearing of the probe and quartz tuning fork are achieved. Through the technical approach of "positioning first and then shearing", combined with the miniaturized design of the shearing assembly, thermal damage and positioning errors in traditional methods are avoided.

Benefits of technology

It improves the accuracy and success rate of probe preparation, reduces the difficulty of operation, ensures the integrity and consistency of probes, and is suitable for stable operation in extreme environments.

✦ Generated by Eureka AI based on patent content.

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Abstract

This invention discloses a device for preparing a tuning fork probe and its operating method. The device includes a limiting base plate, a tuning fork clamping assembly, a multi-dimensional displacement platform, a right-angle fixing plate, a probe clamping adjustment assembly, and a needle-cutting assembly. The tuning fork clamping assembly and the multi-dimensional displacement platform are mounted on the limiting base plate, the right-angle fixing plate is fixed to the top of the multi-dimensional displacement platform, and the probe clamping adjustment assembly and the needle-cutting assembly are both mounted on the back of the right-angle fixing plate. The operating method includes tuning fork clamping, alignment and bonding of the probe with the end face of the tuning fork arm, and cutting off the excess part of the probe. The core of this invention lies in the introduction of a compact and highly controllable needle-cutting assembly. The blade can stably enter the gap between the two arms of the quartz tuning fork and achieve precise cutting without disturbing the bonded needle tip, effectively avoiding the damage caused by traditional manual cutting or laser needle cutting methods. This device effectively improves the preparation efficiency and product consistency of the tuning fork probe.
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Description

Technical Field

[0001] This invention relates to the field of scanning probe microscope probe preparation technology, and in particular to a preparation apparatus and operation method for a tuning fork probe. Background Technology

[0002] Atomic force microscopy (AFM) is a scanning probe microscopy technique that uses van der Waals forces between a probe and a sample surface to create images. It is widely used in many fields such as materials science, life sciences, and nanofabrication.

[0003] Traditional atomic force microscopy (AFM) typically employs a microcantilever beam structure as the probe carrier, requiring displacement detection via laser reflection and photodetectors. However, in extreme experimental environments such as low temperatures, strong magnetic fields, and ultra-high vacuum, the performance limitations of optical components and the difficulty in optical path layout make stable operation of traditional optical lever-type AFMs challenging. To overcome this problem, tuning fork atomic force microscopy (TF-AFM) was proposed and has been extensively studied. TF-AFM utilizes a piezoelectric quartz tuning fork as the vibration sensing element, fixing a metal probe to the end of the tuning fork arm. When the probe approaches the sample surface, the interaction force between it and the sample causes changes in the tuning fork's vibration characteristics, such as amplitude, frequency, or phase. These changes in interaction force can be accurately detected via electrical signals, achieving highly sensitive imaging and measurement.

[0004] TF-AFM probes typically employ a combination of a quartz tuning fork and a probe. The quartz tuning fork is made of piezoelectric material, while the probe is usually made of fine metal wire, such as gold, platinum-iridium, or tungsten, with typical dimensions of 0.1 mm–0.3 mm in diameter and 1–2 mm in length.

[0005] The commonly used TF-AFM probe fabrication method typically includes the following steps: first, fabricating a metal tip with a nano-tip; then, cutting it into short segments of 1–2 mm; and finally, bonding the short tips to the end of a quartz tuning fork. However, this process presents significant technical challenges. On one hand, the cut tips are extremely short, typically less than 2 mm, making them difficult to grasp with tweezers and precisely place in a specific position. On the other hand, the cross-section of the quartz tuning fork arms is typically about 0.3 mm × 0.6 mm, with a distance of about 0.3 mm between the two arms, resulting in a very small effective bonding surface at the ends. Furthermore, the short tips are highly susceptible to displacement, slippage, or damage from tweezers due to mishandling during the process. In addition, to ensure a high-quality resonant response in TF-AFM, the probe bonding position and bonding quality must be highly precise; otherwise, it will significantly affect the resonant frequency, Q-factor, and probe sensitivity to force signals, and may even cause the system to malfunction.

[0006] More seriously, the manual bonding process carries the risk of damage to the probe and tuning fork. The needle tip requires nanometer-level precision; during needle tip clamping and gluing, a safe distance must be maintained, and the tip must not be covered or touched. Furthermore, because the tuning fork arm is extremely thin, it is easily broken with the slightest carelessness; and when manually handling, bonding, and cutting the metal needle tip, even slight hand tremors can easily deform the tip's shape, thus damaging the probe.

[0007] In summary, although TF-AFM has unique advantages in cutting-edge scientific research, existing artificial preparation methods suffer from poor consistency, low yield, and low efficiency, severely restricting the performance and application of TF-AFM systems. Therefore, there is an urgent need for a simple and highly controllable device and method for preparing tuning fork probes to achieve precise control of probe length, reduce reliance on manual experience, and improve the preparation efficiency, consistency, and yield of tuning fork probes. Summary of the Invention

[0008] This invention relates to a device and method for preparing a tuning fork probe, specifically a method and device for preparing a tuning fork probe based on a "positioning first, then cutting" technique. The method involves using a high-precision multi-dimensional displacement platform to precisely align the long needle tip with the end face of the quartz tuning fork arm after the needle tip is prepared, then bonding and fixing it at the target position. Finally, a specially designed needle-cutting assembly is used to cut off the excess portion of the long needle tip, ultimately obtaining a tuning fork probe with a complete structure and high consistency.

[0009] The core innovation of this invention lies in the introduction of a needle-cutting assembly capable of entering the gap between the two arms of a quartz tuning fork for precise cutting of the needle tip. This needle-cutting assembly possesses key features such as miniaturization and anti-vibration, enabling high-quality cutting without disturbing the needle tip position, thus avoiding problems such as thermal damage, stress impact, or positioning errors that occur in traditional laser melting or manual needle cutting processes.

[0010] To achieve the above objectives, the present invention adopts the following technical solution:

[0011] A device for preparing a tuning fork probe includes a limiting base plate, a tuning fork clamping assembly, a probe clamping and adjusting assembly, a shearing needle assembly, a right-angle fixing plate, and a multi-dimensional displacement platform. The shearing needle assembly includes an outer frame, a left blade clamping mechanism, a right blade clamping mechanism, a left fine-tuning threaded pair, a right fine-tuning threaded pair, a blade clamping mechanism return spring, a left blade, and a right blade. The left and right fine-tuning threaded pairs are coaxially arranged on both sides of the outer frame in the horizontal direction, respectively driving the left and right blade clamping mechanisms to move towards the center. The blade clamping mechanism return spring is located between the left and right blade clamping mechanisms, providing a return force in opposite directions. The left and right blades are respectively embedded in the blade grooves of the left and right blade clamping mechanisms and locked in place, so that the two blades are arranged opposite each other on the same shearing reference plane.

[0012] Furthermore, the tuning fork clamping assembly and the multi-dimensional displacement platform are fixedly mounted on the limiting base plate; the right-angle fixing plate is fixedly mounted on the top of the multi-dimensional displacement platform; the probe clamping and adjusting assembly is fixedly mounted on the right side of the back of the right-angle fixing plate; and the shearing needle assembly is fixedly mounted on the top of the back of the right-angle fixing plate.

[0013] Furthermore, the shearing needle assembly also includes a first limiting rod and a second limiting rod, both of which are fixed on the outer frame and pass through the left blade clamping mechanism and the right blade clamping mechanism, restricting their movement direction.

[0014] Furthermore, the probe clamping and adjusting assembly includes a probe slider base, a probe slider, a fine-tuning threaded pair, a probe sleeve, a probe, and a probe slider return spring. The probe sleeve is placed on the side of the probe slider, the probe is placed in the probe sleeve, the probe slider is placed inside the probe slider base, the fine-tuning threaded pair is installed on the right side of the probe slider base, and a probe slider return spring is provided between the probe slider base and the probe slider. The fine-tuning threaded pair and the probe slider return spring drive the probe slider to move back and forth along the Y-axis direction.

[0015] Furthermore, the tuning fork clamping assembly includes a tuning fork clamping base, a front tuning fork clamping plate, and a rear tuning fork clamping plate. The front and rear tuning fork clamping plates are provided with slots and rectangular protrusions that match the shape of the quartz tuning fork for quick clamping and replacement of the tuning fork.

[0016] Furthermore, the probe is placed in the probe sleeve and moves along the Y-axis with the probe slider under the combined drive of the fine-tuning thread pair and the probe slider reset spring.

[0017] Furthermore, an operating method, applied in the aforementioned tuning fork probe preparation apparatus, includes the following steps:

[0018] S1. Place the quartz tuning fork in the tuning fork clamping assembly. The front clamping plate and the rear clamping plate of the tuning fork are fixed and clamped by studs and springs.

[0019] S2. Adjust the multi-dimensional displacement platform, align the left and right blades in the shearing needle assembly with the gaps between the two arms of the quartz tuning fork, and keep the displacement of the multi-dimensional displacement platform in the Y-axis direction unchanged.

[0020] S3. Place the probe in the probe sleeve and adjust the Z-axis and X-axis knobs of the multi-dimensional displacement platform so that the probe and the two tuning fork arms of the quartz tuning fork are in horizontal contact.

[0021] S4. Adjust the fine-tuning threaded knob in the probe clamping adjustment assembly to adjust the length of the probe tip extending out of the end face of the quartz tuning fork arm, then apply glue and wait for it to solidify and bond.

[0022] S5. Adjust the left and right fine-tuning threaded joint knobs in the needle assembly in the forward direction to control the left and right blades to smoothly advance into the gap between the two arms of the quartz tuning fork until the probe is cut off. Adjust the left and right fine-tuning threaded joints in the reverse direction to retract the blades, so that the left and right blades move away from the gap between the two arms of the quartz tuning fork, thus completing the preparation of the tuning fork probe.

[0023] The beneficial effects of this invention are as follows:

[0024] This invention integrates a multi-dimensional displacement platform, a probe clamping and adjustment component, and a tuning fork clamping component, enabling precise micron-level spatial alignment between the needle tip and the end face of the tuning fork arm, significantly improving the control accuracy of the bonding position.

[0025] This invention adopts a "positioning first, then cutting" technical approach, aligning and bonding the probe before it is cut off, avoiding problems such as clamping difficulties, inconvenient operation, and damage risks caused by the probe tip being too short, thus improving operational efficiency and success rate.

[0026] This invention innovates the design of the cutting needle assembly, achieving high-quality cutting. The cutting needle assembly adopts a symmetrical blade clamping mechanism, combined with a fine-tuning threaded pair and a limiting round rod, to form a stable and parallel cutting reference plane. This structure can smoothly enter the gap between the two arms of a quartz tuning fork, accurately cutting off the excess part of the needle tip, avoiding the needle tip deviation, damage, or problems that are easily caused by traditional manual cutting methods, ensuring that the probe cutting surface is neat and does not disturb the adhesive fixing area.

[0027] In summary, this invention systematically solves the technical bottlenecks in the preparation of traditional tuning fork probes, such as difficulty in positioning, bonding, and cutting, from the aspects of structural design, functional implementation, and operation process. It has significant practical value and prospects for widespread application. Attached Figure Description

[0028] Figure 1This is a three-dimensional schematic diagram of the structure of the preparation device for the tuning fork probe of the present invention;

[0029] Figure 2 This is a three-dimensional schematic diagram of the quartz tuning fork structure used in this invention;

[0030] Figure 3 This is a three-dimensional schematic diagram of the structure of the tuning fork clamping assembly in this invention;

[0031] Figure 4 This is a three-dimensional schematic diagram of the front clamping plate structure of the tuning fork in this invention;

[0032] Figure 5 This is a schematic diagram of the rear clamping plate structure of the tuning fork in this invention;

[0033] Figure 6 This is a three-dimensional schematic diagram of the probe clamping and adjusting assembly in this invention;

[0034] Figure 7 This is a three-dimensional schematic diagram of the shear needle assembly in this invention;

[0035] Figure 8 This is a three-dimensional schematic diagram of the blade clamping mechanism in this invention;

[0036] Figure 9 This is a schematic diagram showing the alignment of the blade with the gaps between the two arms of the quartz tuning fork.

[0037] Figure 10 This is a schematic diagram of a tuning fork probe preparation device without the shearing needle assembly;

[0038] Figure 11 This is a schematic diagram of the bonding structure of the tuning fork probe;

[0039] Figure 12 This is a schematic diagram of the shearing needle assembly during the cutting process;

[0040] Figure 13 This is a schematic diagram of the shearing needle assembly during retraction.

[0041] Explanation of reference numerals in the attached drawings: 1. Limiting base plate; 2. Tuning fork clamping assembly; 3. Probe clamping adjustment assembly; 4. Cutting needle assembly; 5. Right-angle fixing plate; 6. Multi-dimensional displacement platform; 201. Tuning fork clamping base; 202. Tuning fork front clamping plate; 203. Tuning fork rear clamping plate; 301. Probe slider base; 302. Probe slider; 303. Fine-tuning threaded pair; 304. Probe sleeve; 305. Probe slider return spring; 306. Outer frame; 401. Left blade clamping mechanism; 402. Right blade clamping mechanism; 403. First limiting round rod; 404. Second limiting round rod; 405. Left fine-tuning threaded pair; 406. Right fine-tuning threaded pair; 407. Blade clamping mechanism return spring; 408. Left blade; 409. Right blade; 410. Blade groove; 411. Detailed Implementation

[0042] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0043] like Figure 1 As shown, a device for preparing a tuning fork probe includes a limiting base plate 1, a tuning fork clamping assembly 2, a probe clamping adjustment assembly 3, a needle-cutting assembly 4, a right-angle fixing plate 5, and a multi-dimensional displacement platform 6. The multi-dimensional displacement platform 6 includes a Y-axis displacement platform 6A, an X-axis displacement platform 6B, a Z-axis displacement platform 6C, an R-axis rotational fine-tuning displacement stage 6D, a first connecting plate 6E, and a second connecting plate 6F. The Y-axis displacement platform 6A, X-axis displacement platform 6B, Z-axis displacement platform 6C, and R-axis rotational fine-tuning displacement platform 6D are interconnected and fixed to the limiting base plate 1 via the first connecting plate 6E, the second connecting plate 6F, and screws. The right-angle fixing plate 5 is mounted and fixed to the top of the Y-axis displacement platform 6A. The probe clamping adjustment assembly 3 is mounted and fixed to the right side of the back of the right-angle fixing plate 5. The needle-cutting assembly 4 is mounted and fixed to the top of the back of the right-angle fixing plate 5. The tuning fork clamping assembly 2 is placed to the right of the probe clamping adjustment assembly 3 and the needle-cutting assembly 4 and fixed to the limiting base plate 1 via studs.

[0044] like Figure 2 As shown, a quartz tuning fork can be obtained by removing the cylindrical shell from a commercially available through-hole cylindrical crystal oscillator. The overall structure consists of the upper part of the left tuning fork arm 7A and the right tuning fork arm 7B, and the lower part of the tuning fork pin 7C. The gap between the two tuning fork arms is about 0.3mm.

[0045] like Figure 3 , Figure 4 and Figure 5 As shown, the tuning fork clamping assembly includes a tuning fork clamping base 201, a front tuning fork clamping plate 202, and a rear tuning fork clamping plate 203. The front tuning fork clamping plate 202 is mounted on the top of the tuning fork clamping base 201. The upper half of the front tuning fork clamping plate 202 has a first slot 202A with the same shape as the upper half of the quartz tuning fork. The lower half of the front tuning fork clamping plate 202 has a second slot 202B for placing the tuning fork pin 7C. The upper half of the rear tuning fork clamping plate 202 has a rectangular protrusion 203A. The lower half of the rear tuning fork clamping plate 203 has a third slot 203B for placing the tuning fork pin 7C. The first slot 202A, the second slot 202B, the third slot 203B, and the rectangular protrusion in the front clamping plate 202 and the rear clamping plate 203 define the position of the quartz tuning fork. The pre-tightening of the spring and the double-ended studs allows the front clamping plate 202 and the rear clamping plate 203 to clamp the quartz tuning fork, which facilitates the clamping of the quartz tuning fork while ensuring that the height of the end face of the quartz tuning fork arm is consistent each time.

[0046] like Figure 6 As shown, the probe clamping and adjusting assembly 3 includes a probe slider base 301, a probe slider 302, a fine-tuning threaded pair 303, a probe sleeve 304, a probe 305, and a probe slider return spring 306. The probe sleeve 304 is placed in the circular hole 302A on the side of the probe slider, and the probe 305 is inserted into the probe sleeve 304. The width of the probe slider 302 is slightly smaller than the width of the limiting groove 301B of the probe slider base. The bottom of the probe slider base 301 is provided with a threaded hole 301C, which can be used to install a pre-tightening stud to adjust the positive pressure between the probe slider 302 and the probe slider base 301. The probe slider return spring 306 is placed between the probe slider base 301 and the probe slider 302. When the spring force of the probe slider return spring 306 between the probe slider and the probe slider base 301 is greater than the maximum static friction force between the probe slider 302 and the probe slider base 301, the probe slider 302 can be reset. The fine-tuning threaded pair 303 is fixed through the circular hole 301A on the right side of the probe slider base and abuts against the circular groove 302B on the right side of the probe slider. Adjusting the fine-tuning threaded pair 303 in the positive direction pushes the probe slider 302 to move in the positive direction of the Y-axis. Adjusting the threaded pair 303 in the reverse direction causes the probe slider return spring 306 to rebound to both sides. The resulting spring force pushes the probe slider 302 to move in the negative direction of the Y-axis, thereby realizing the adjustment of the length of the probe tip extending out of the quartz tuning fork arm.

[0047] like Figure 7 As shown, the shearing needle assembly 4 includes an outer frame 401, a left blade clamping mechanism 402, a right blade clamping mechanism 403, a first limiting rod 404, a second limiting rod 405, a left fine-tuning threaded pair 406, a right fine-tuning threaded pair 407, a blade clamping mechanism return spring 408, a left blade 409, and a right blade 410. The first limiting rod 404 and the second limiting rod 405 are both fixed to the outer frame 401 and pass through the left blade clamping mechanism 402 and the right blade clamping mechanism 403, restricting their movement direction. The left fine-tuning threaded pair 406 and the right fine-tuning threaded pair 407 are coaxially arranged on both sides of the outer frame 401 in the horizontal direction. The ends of the screws of the left fine-tuning threaded pair 406 and the right fine-tuning threaded pair 407 respectively contact the side circular grooves 401A and 401B of the left and right blade clamping mechanisms. The left blade 409 and the right blade 410 are respectively embedded in the blade grooves 411 of the left blade clamping mechanism 402 and the right blade clamping mechanism 403, and are locked and fixed by screws, so that the two blades are arranged opposite to each other on the same shearing reference plane. The blade clamping mechanism return spring 408 is placed between the left blade clamping mechanism 402 and the right blade clamping mechanism 403, providing a return force in opposite directions. Adjusting the left fine-tuning threaded pair 406 and the right fine-tuning threaded pair 407, in conjunction with the compression and rebound of the blade clamping mechanism return spring 408, realizes the tool advance and retraction operations.

[0048] like Figure 8As shown, the connecting holes for the left blade clamping mechanism 402, the right blade clamping mechanism 403, and the first limiting round rod 404 and the second limiting round rod 405 are the first V-shaped round hole 403A and the second V-shaped round hole 403B. The first grommet screw 403C and the second grommet screw 403D are locked and fixed from the side. The first limiting round rod 404 and the second limiting round rod 405 are tightly fitted with the two straight edges of the first V-shaped round hole 403A and the second V-shaped round hole 403B, so that the left blade clamping mechanism... 402. The right blade clamping mechanism 403 is located on the same reference plane. The width of the blade groove 411 is slightly larger than the blade thickness. The blade is locked by screws through the first threaded hole 403F and the second threaded hole 403G on the side, so that the left blade 409 and the right blade 410 are located on the same shearing reference plane and always cut along the reference plane. A circular groove 403E for placing the blade clamping mechanism return spring 408 is provided between the first V-shaped circular hole 403A and the second V-shaped circular hole 403B.

[0049] The following is a detailed implementation method of the operation of the tuning fork probe preparation device of the present invention:

[0050] This invention proposes an operating method, comprising the following steps:

[0051] S1. Place the quartz tuning fork in the tuning fork clamping assembly 2. The front clamping plate 202 and the rear clamping plate 203 of the tuning fork are fixed and clamped to the quartz tuning fork 7 by studs and springs.

[0052] S2. Adjust the multi-dimensional displacement platform 6, align the left blade 409 and right blade 410 in the shearing needle assembly 4 with the gap 7D between the two arms of the quartz tuning fork, and keep the displacement of the multi-dimensional displacement platform in the Y-axis direction unchanged.

[0053] S3. Place the probe 305 in the probe sleeve 304 and adjust the Z-axis and X-axis knobs of the multi-dimensional displacement platform 6 so that the probe 305 and the two tuning fork arm end faces of the quartz tuning fork 7 are kept in horizontal contact.

[0054] S4. Adjust the knob of the fine-tuning thread pair 303 in the probe clamping adjustment assembly 3 to adjust the length of the probe tip (tip 305A) extending out of the tuning fork arm end face, then apply glue and wait for it to air dry;

[0055] S5. Adjust the left and right fine-tuning threaded joints 406 and 407 knobs in the needle-cutting assembly 4 in the forward direction to control the left blade 409 and right blade 410 to smoothly advance into the gap 7D between the two arms of the quartz tuning fork until the probe is cut off. Adjust the left and right fine-tuning threaded joints 406 and 407 in the reverse direction to retract the blades, so that the left blade 409 and right blade 410 move away from the gap 7D between the two arms of the quartz tuning fork, thus completing the preparation of the tuning fork probe.

[0056] The specific operating method is as follows:

[0057] like Figure 9 As shown, before aligning and bonding the quartz tuning fork 7 and the probe 305, adjust the Y-axis, X-axis, Z-axis and R-axis knobs of the multi-dimensional displacement platform 6 so that the left blade 409 and the right blade 410 are aligned with the gap between the two arms of the quartz tuning fork, keeping the displacement of the multi-dimensional displacement platform in the Y-axis direction unchanged.

[0058] like Figures 10-11 As shown, the specific operation process for aligning and bonding the quartz tuning fork with the probe is as follows: Place the probe 305 in the probe sleeve 304, observe the relative position of the probe 305 and the quartz tuning fork 7, adjust the Z-axis displacement platform 6C so that the end faces of the two tuning fork arms of the probe 305 and the quartz tuning fork 7 are basically at the same height, adjust the X-axis displacement platform 6B so that the probe 305 is within the effective bonding range of the tuning fork arm end faces, adjust the Z-axis displacement platform 6C again so that the probe 305 is completely attached to the end face of the left tuning fork arm 7A and the end face of the right tuning fork arm 7B, adjust the knob of the fine-tuning thread pair 303 to control the length of the probe tip extending out of the tuning fork arm end face, and then apply glue. After the glue dries, the alignment and bonding process of the quartz tuning fork and the probe 305 is completed.

[0059] like Figures 12-13 As shown, the specific operation process for removing the excess part of the probe is as follows: After completing the alignment and bonding operation between the quartz tuning fork and the probe, the left blade 409 and the right blade 410 are still aligned with the gap 7D between the two arms of the quartz tuning fork. There is no need to adjust the multi-dimensional displacement platform again. Adjust the left fine-tuning thread pair 406 knob and the right fine-tuning thread pair 407 knob in the positive direction. The left blade clamping mechanism 402 and the right blade clamping mechanism 403, along with the left blade 409 and the right blade 410, advance into the gap 7D between the two arms of the quartz tuning fork. The blade clamping mechanism return spring 408 is compressed until the probe 305 is cut at the gap between the two arms of the quartz tuning fork. The left fine-tuning thread pair 406 and the right fine-tuning thread pair 407 knobs are adjusted in the opposite direction. The blade clamping mechanism return spring 408 springs back to both sides, pushing the left blade clamping mechanism 402 and the right blade clamping mechanism 403 to retract the blades to both sides. The left blade 409 and the right blade 410 move away from the gap between the two arms of the quartz tuning fork and the probe, completing the cutting operation of the excess part of the probe.

[0060] The accompanying drawings in this application are for illustrative purposes only. The dimensions and shapes of the components shown are not actual limitations but are merely schematic representations. In actual implementation, the components can be reasonably configured and adjusted according to specific needs and actual conditions.

[0061] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A device for preparing a tuning fork probe, comprising a limiting base plate (1), a tuning fork clamping assembly (2), a probe clamping and adjusting assembly (3), a scissor assembly (4), a right-angle fixing plate (5), and a multi-dimensional displacement platform (6), characterized in that, The shearing needle assembly (4) includes an outer frame (401), a left blade clamping mechanism (402), a right blade clamping mechanism (403), a left fine-tuning threaded pair (406), a right fine-tuning threaded pair (407), a blade clamping mechanism return spring (408), a left blade (409), and a right blade (410). The left fine-tuning threaded pair (406) and the right fine-tuning threaded pair (407) are coaxially arranged on both sides of the outer frame (401) in the horizontal direction, respectively driving the left blade clamping mechanism. (402) and the right blade clamping mechanism (403) move toward the center. The blade clamping mechanism return spring (408) is located between the left blade clamping mechanism (402) and the right blade clamping mechanism (403) and provides a return force in opposite directions. The left blade (409) and the right blade (410) are respectively embedded in the blade grooves of the left blade clamping mechanism (402) and the right blade clamping mechanism (403) and locked and fixed so that the two blades are arranged opposite each other on the same shearing reference plane. The tuning fork clamping assembly (2) and the multi-dimensional displacement platform (6) are fixedly installed on the limiting base plate (1); the right-angle fixing plate (5) is fixedly installed on the top of the multi-dimensional displacement platform (6); the probe clamping adjustment assembly (3) is fixedly installed on the right side of the back of the right-angle fixing plate (5); the shearing needle assembly (4) is fixedly installed on the top of the back of the right-angle fixing plate (5); The probe clamping and adjusting assembly (3) includes a probe slider base (301), a probe slider (302), a fine-tuning threaded pair (303), a probe sleeve (304), a probe (305), and a probe slider return spring (306). The probe sleeve (304) is placed on the side of the probe slider (302), the probe (305) is placed in the probe sleeve (304), the probe slider (302) is placed inside the probe slider base (301), the fine-tuning threaded pair (303) is installed on the right side of the probe slider base (301), and a probe slider return spring (306) is provided between the probe slider base (301) and the probe slider (302). The fine-tuning threaded pair (303) and the probe slider return spring (306) drive the probe slider (302) to move back and forth along the Y-axis. Place the probe (305) in the probe sleeve (304) and adjust the Z-axis and X-axis knobs of the multi-dimensional displacement platform (6) so that the probe (305) and the two tuning fork arms end faces of the quartz tuning fork (7) remain in horizontal contact. Adjust the knob of the fine-tuning thread pair (303) in the probe clamping adjustment assembly (3) to adjust the length of the probe tip (305) extending out of the end face of the quartz tuning fork arm, then apply glue and wait for it to solidify and bond. Control the left blade (409) and right blade (410) to smoothly advance into the gap (7D) between the two arms of the quartz tuning fork until the probe is cut off.

2. The apparatus for preparing a tuning fork probe according to claim 1, characterized in that, The shearing needle assembly (4) also includes a first limiting rod (404) and a second limiting rod (405). The first limiting rod (404) and the second limiting rod (405) are both fixed on the outer frame (401) and pass through the left blade clamping mechanism (402) and the right blade clamping mechanism (403) to restrict their movement direction.

3. The apparatus for preparing a tuning fork probe according to claim 1, characterized in that, The tuning fork clamping assembly (2) includes a tuning fork clamping base (201), a tuning fork front clamping plate (202) and a tuning fork rear clamping plate (203). The tuning fork front clamping plate (202) and the tuning fork rear clamping plate (203) are respectively provided with slots and rectangular protrusions that match the shape of the quartz tuning fork, for quick clamping and replacement of the tuning fork.

4. An operating method, employing the apparatus for preparing a tuning fork probe as described in any one of claims 1-3, characterized in that, Includes the following steps: S1. Place the quartz tuning fork in the tuning fork clamping assembly (2). The front clamping plate (202) and the rear clamping plate (203) of the tuning fork are fixed and clamped to the quartz tuning fork (7) by studs and springs. S2. Adjust the multi-dimensional displacement platform (6) and align the left blade (409) and right blade (410) in the shearing needle assembly (4) with the gap (7D) between the two arms of the quartz tuning fork, keeping the displacement of the multi-dimensional displacement platform in the Y-axis direction unchanged. S3. Place the probe (305) in the probe sleeve (304) and adjust the Z-axis and X-axis knobs of the multi-dimensional displacement platform (6) so that the probe (305) and the two tuning fork arms of the quartz tuning fork (7) are in horizontal contact. S4. Adjust the knob of the fine-tuning thread pair (303) in the probe clamping adjustment assembly (3) to adjust the length of the probe tip (305) extending out of the end face of the quartz tuning fork arm, and then apply glue and wait for it to solidify and bond. S5. Adjust the left and right fine-tuning threaded pairs (406 and 407) knobs in the needle-cutting assembly (4) in the forward direction to control the left blade (409) and right blade (410) to smoothly advance into the gap (7D) between the two arms of the quartz tuning fork until the probe is cut off. Adjust the left and right fine-tuning threaded pairs (406 and 407) in the reverse direction to retract the blades. The left blade (409) and right blade (410) move away from the gap (7D) between the two arms of the quartz tuning fork, thus completing the preparation of the tuning fork probe.

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