Semiconductor packaging test carrier

Abstract

The invention discloses a semiconductor packaging test carrier which comprises a workbench, a sliding block is arranged at the top end of the workbench, an outer strip-shaped shell is fixedly installed on one side of the sliding block, an inner strip-shaped shell is fixedly installed at one end of the sliding block and located on the same side of the outer strip-shaped shell, and an empty groove is formed in the middle of the inner strip-shaped shell and the outer strip-shaped shell. A sliding plate is arranged at the bottom end of the workbench, an air pipe is fixedly installed at one end of the sliding plate, and the other end of the air pipe is in through connection with the air holes; by mounting and limiting the filter plate, the filter plate in an unlocked state is embedded and positioned with an empty groove through an embedding rod, then an adjusting rod is rotated to drive a limiting ring block to be staggered to realize preliminary fixation, and finally a pull rod is loosened, and a first reset spring is utilized to push a first limiting block to be inserted into a limiting hole to lock an angle, so that an air hole can be protected; meanwhile, it is guaranteed that the structure is stable when the air holes are cleaned, and the service life of equipment is prolonged.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor packaging, and in particular to a semiconductor packaging test carrier. Background Art

[0002] Semiconductor packaging and testing refers to the process of processing the tested wafers into independent chips according to the product model and functional requirements. The packaging process is as follows: the wafers from the front-end process of the wafer are cut into small chips through the dicing process, and then the cut chips are glued to the small islands of the corresponding substrate frame. Ultra-fine metal wires or conductive resins are used to connect the bonding pads of the chips to the corresponding pins of the substrate to form the required circuit. The independent chips are then encapsulated and protected with a plastic shell. After plastic sealing, a series of operations are required, such as post-curing, cutting and forming, electroplating, and printing.

[0003] According to the announcement number CN115389913B, a semiconductor chip integrated packaging and testing device is disclosed, which relates to the field of semiconductor packaging technology, specifically a semiconductor chip integrated packaging and testing device; it includes: a display device; the display device is used to display semiconductor chip test parameters; a test module; the test module is used to test the semiconductor chip; a controller; the controller is used to control the automatic operation of the present invention; the semiconductor chip integrated packaging and testing device also includes a workbench; the workbench is fixed to the ground by supporting legs, and the workbench is used to support the display device; an inner bar shell; the inner bar shells are arranged on the workbench in parallel with each other, and the sides of the two inner bar shells away from each other are open; the present invention clamps the pins through two conductive bags for electrical testing. Compared with the press-type electrical test, the present application causes less damage to the semiconductor chip during the packaging and testing process, and the present application can also be applied to the testing of semiconductor chips of different specifications and models.

[0004] The above-mentioned device can cause less damage to the semiconductor chip during the test through two conductive bags. According to the instructions and drawings, impurities in the middle of the conductive bag can be washed away through the air holes on the top of the workbench. However, during the test, when impurities enter the inside of the air holes, the air holes will be blocked, making it impossible to clean them normally. Summary of the Invention

[0005] The purpose of the present invention is to solve the problem that the above-mentioned device can cause less damage to semiconductor chips during testing through two conductive bags. According to the description and the accompanying drawings, impurities in the middle of the conductive bags can be washed away through the air holes on the top of the workbench. However, during the test, when impurities enter the inside of the air holes, they will cause the air holes to be blocked, resulting in the inability to perform normal cleaning. A semiconductor packaging test carrier is provided.

[0006] The top end of the sliding panel also is provided with an inserting mechanism, and the sliding panel also is provided with an inserting mechanism, and the guide frame is provided with an inserting mechanism, and the guide frame is provided with an inserting mechanism.

[0007] As a further solution of the present invention: the workbench and the top of the filter plate are both provided with an arc-shaped cavity, and limiting holes are evenly provided inside the arc-shaped cavity. The adjusting rod passes through the bottom of the arc-shaped groove and is provided with a sliding groove, and the sliding groove is slidably connected to a limiting block 1, and the limiting block 1 is adapted to the limiting hole.

[0008] As a further solution of the present invention: a return spring is symmetrically fixedly installed inside the sliding groove, a pull rod is slidably connected to the top of the adjusting rod, and the pull rod passes through the sliding groove and is fixedly installed with a limit block.

[0009] As a further solution of the present invention: the top end of the inner strip shell is rotatably connected to the upper cover, one end of the inner strip shell is fixedly installed with a mounting block 2, one end of the mounting block 2 is rotatably connected to a rotating shaft, and the rotating shaft passes through the mounting block 2 and is fixedly installed with the upper cover, and a limiting groove is evenly arranged around the outer periphery of the rotating shaft, the top end of the mounting block 2 is rotatably connected to a connecting plate 1, the top end of the mounting block 2 is provided with a cavity, the bottom end of the mounting block 2 is fixedly installed with a rotating block rotatably connected to the cavity, the bottom end of the connecting plate 1 is fixedly installed with a limiting block 2, and the limiting block 2 is adapted to the limiting groove.

[0010] As a further solution of the present invention: a connecting plate 2 is fixedly installed at one end of the connecting plate 1, and a sliding rod is fixedly installed at the bottom end of the connecting plate 2. A sliding sleeve is fixedly installed at the top end of the mounting block 2, and the sliding sleeve is slidably connected to the sliding rod.

[0011] As a further solution of the present invention: a sliding cavity is provided inside the sliding sleeve, and a second reset spring is fixedly installed inside the sliding cavity, and the top end of the second reset spring is fixedly installed to the bottom end of the sliding rod.

[0012] As a further solution of the present invention: a limiting rod is inserted into one end of the sliding sleeve, a limiting slot is provided on the sliding rod, and the limiting slot is adapted to the limiting rod.

[0013] As a further solution of the present invention: a rotating motor is fixedly installed on the top of the workbench, and a threaded rod is fixedly installed on the output shaft of the rotating motor, and the threaded rod is threadedly connected to the slider.

[0014] As a further solution of the present invention: a display device is fixedly installed on the top of the workbench, and a test module is fixedly installed on the top of the workbench.

[0015] As a further solution of the present invention: the bottom end of the workbench is fixedly mounted with supporting legs, and the supporting legs are symmetrically fixedly mounted on the bottom end of the workbench.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] The present invention limits the installation of the filter plate. First, the filter plate in the unlocked state is locked and positioned with the empty groove through the locking rod. Then, the adjusting rod is rotated to drive the limiting ring block to intersect to achieve preliminary fixation. Finally, the pull rod is released, and the reset spring is used to push the limiting block to insert into the limiting hole to lock the angle. This can protect the air hole and prevent impurities and dust from entering. At the same time, it ensures that the structure is stable when the air hole is clean, thereby extending the service life of the equipment.

[0018] In the present invention, the upper cover rotates by relying on the rotating shaft and the second mounting block to rotate and connect. The limit groove and the second limit block cooperate to limit the rotation angle. The second connecting plate is pressed down, and the sliding rod compresses the second reset spring to make the second limit block disengage from the limit groove. The upper cover can rotate freely. After releasing, the spring pushes the second limit block to re-engage the limit groove to lock the angle. In addition, the limit rod is inserted into the sliding rod slot to further reinforce it and realize multi-angle positioning. The double locking ensures the stability of the upper cover and avoids accidental rotation to meet the needs of different test scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0020] Figure 2 This invention Figure 1 Schematic diagram of the local enlarged structure at A in the middle;

[0021] Figure 3 It is a side structural schematic diagram of the workbench in the present invention;

[0022] Figure 4 It is a partial cross-sectional structural diagram of the workbench and the empty slot in the present invention;

[0023] Figure 5 Schematic diagram of the cross-sectional structure of the adjusting rod in the present invention;

[0024] Figure 6 It is a partial structural diagram of the installation block 2 in the present invention;

[0025] Figure 7 It is a schematic diagram of the partial cross-sectional structure of the mounting block 2 in the present invention.

[0026] Figure: 1, workbench; 2, support leg; 3, slide plate; 4, air pipe; 5, empty slot; 6, air hole; 7, outer strip shell; 8, inner strip shell; 9, slide block; 10, threaded rod; 11, rotating motor; 12, upper cover; 13, filter plate; 14, embedded rod; 15, mounting block 1; 16, limit ring block; 17, arc groove; 18, adjustment rod; 19, arc cavity; 20, limit hole; 21, slide groove ; 22. Limit block 1; 23. Reset spring 1; 24. Pull rod; 25. Mounting block 2; 26. Rotating shaft; 27. Limit groove; 28. Connecting plate 1; 29. ​​Cavity; 30. Rotating block; 31. Limit block 2; 32. Connecting plate 2; 33. Sliding sleeve; 34. Sliding cavity; 35. Reset spring 2; 36. Sliding rod; 37. Limiting rod; 38. Display device; 39. Test module. DETAILED DESCRIPTION

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0028] In the description of the present invention, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are only used for descriptive purposes and should not be understood as indicating or implying relative importance. In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", and "set" should be understood in a broad sense, for example, they can be fixedly connected, detachably connected, or connected in one piece; they can be mechanically connected or electrically connected; they can be directly connected, or indirectly connected through an intermediate medium, or they can be internal connections between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. The following describes an embodiment of the present invention based on its overall structure.

[0029] Reference Figures 1 to 7 In an embodiment of the present invention, a semiconductor packaging test carrier includes a workbench 1, a slider 9 is provided at the top of the workbench 1, an outer bar shell 7 is fixedly installed on one side of the slider 9, an inner bar shell 8 is fixedly installed on one end of the slider 9 and on the same side as the outer bar shell 7, an empty groove 5 is opened in the middle of the inner bar shell 8 and the outer bar shell 7, and air holes 6 are evenly opened inside the empty groove 5, a slide plate 3 is provided at the bottom of the workbench 1, and an air pipe 4 is fixedly installed at one end of the slide plate 3, and the other end of the air pipe 4 is connected to the air hole 6. Through connection, a filter plate 13 for filtering impurities and dust is provided inside the empty groove 5, and the bottom end of the filter plate 13 is symmetrically and evenly fixed with an embedding rod 14 that is embedded in the empty groove 5. The workbench 1 and the top of the filter plate 13 are fixedly installed with a mounting block 15, and the inner side of the mounting block 15 is rotatably connected to a limiting ring block 16. An arc groove 17 is provided at one end of the mounting block 15, and an adjusting rod 18 is fixedly installed at one end of the limiting ring block 16, and the adjusting rod 18 is adapted to the arc groove 17.

[0030] The above scheme is adopted: a filter plate 13 (model GLB-20, polyester fiber non-woven fabric) is installed in the empty groove 5, and 4 groups of embedded rods 14 (ABS plastic) are evenly distributed on the bottom to cooperate with the blind holes in the bottom of the groove. The filter plate 13 is fixed to the mounting block 15 (Q235 steel die-casting) at the top of the workbench 1 by bolts, and a limiting ring block 16 (brass H62) is provided on the inside. The arc groove 17 at one end of the mounting block and the adjusting rod 18 (stainless steel 304 round rod) constitute an angle limiting mechanism. When the adjusting rod 18 is at the bottom of the arc groove 17, the limiting ring block 16 forms a vertical constraint on the filter plate 15 to prevent it from loosening due to vibration. The adjusting rod 18 can be unlocked by rotating it to the top of the arc groove 17, thereby realizing rapid disassembly of the filter plate.

[0031] Reference Figures 1 to 7 , the workbench 1 and the filter plate 13 are both provided with an arc-shaped cavity 19 at the top, and the arc-shaped cavity 19 is evenly provided with a limit hole 20, the adjusting rod 18 passes through the arc-shaped groove 17 and is provided with a chute 21 at the bottom, and the chute 21 is slidably connected to the limit block 1 22, the limit block 1 22 is adapted to the limit hole 20, and a return spring 1 23 is symmetrically fixedly installed inside the chute 21, and the top of the adjusting rod 18 is slidably connected to the pull rod 24, and the pull rod 24 passes through the chute 21 and is fixedly installed with the limit block 1 22;

[0032] The above scheme is adopted: multiple groups of limit holes 20 are evenly distributed in the arc-shaped cavity 19 at the top of the workbench 1 and the filter plate 13, and a positioning system is formed with the limit block 22 (45# steel) in the slide groove 21 at the bottom end of the adjusting rod 18. The limit block 22 is provided with pre-tightening force by the reset spring 23 (made of stainless steel 304) to ensure that it cooperates with the limit hole. During operation, the pull rod 24 (stainless steel round rod with anti-slip grooves on the end) is pulled to drive the limit block 22 to compress the reset spring 23 and disengage from the limit hole 20. After rotating the adjusting rod 18 to the target angle, release the pull rod 24, and the reset spring 23 is reset to achieve automatic locking.

[0033] Reference Figures 1 to 7 , the top of the inner strip shell 8 is rotatably connected to the upper cover 12, and one end of the inner strip shell 8 is fixedly installed with a mounting block 25, one end of the mounting block 25 is rotatably connected to a rotating shaft 26, and the rotating shaft 26 passes through the mounting block 25 and is fixedly installed with the upper cover 12, and a limiting groove 27 is uniformly arranged around the outer periphery of the rotating shaft 26. The top of the mounting block 25 is rotatably connected to a connecting plate 28, and a cavity 29 is opened at the top of the mounting block 25. A rotating block 30 rotatably connected to the cavity 29 is fixedly installed at the bottom of the mounting block 25, and the connecting plate 1 A second limiting block 31 is fixedly mounted on the bottom end of the mounting block 28, and the second limiting block 31 is adapted to the limiting groove 27. A second connecting plate 32 is fixedly mounted on one end of the connecting plate 1 28, and a sliding rod 36 is fixedly mounted on the bottom end of the connecting plate 22. A sliding sleeve 33 is fixedly mounted on the top end of the mounting block 25, and the sliding sleeve 33 is slidably connected to the sliding rod 36. A sliding cavity 34 is defined inside the sliding sleeve 33, and a second return spring 35 is fixedly mounted inside the sliding cavity 34, and the top end of the second return spring 35 is fixedly mounted to the bottom end of the sliding rod 36.

[0034] The above scheme is adopted: the upper cover 12 at the top of the inner strip shell 8 is hinged to the second mounting block 25 (aluminum alloy ADC12) through a rotating shaft 26 (45# steel), and multiple groups of limit grooves 27 (trapezoidal cross-section) are evenly distributed on the outer circumference of the shaft. The connecting plate 1 28 (Q235 cold-rolled steel plate) is rotatably connected to the top of the second mounting block 25 through a pin shaft, and the second limit block 31 (nylon PA66) at the bottom forms a limit fit with the limit groove 27. The rotating block 30 (POM polyoxymethylene) in the cavity 29 is rotatably connected to the second mounting block 25 through a deep groove ball bearing, which is connected. The connecting plate 1 28 provides a rotation fulcrum, the connecting plate 2 32 (stainless steel 304) is connected to the sliding rod 36 (stainless steel round rod), and forms a sliding pair with the sliding sleeve 33 (brass H59). The internal return spring 2 35 (spring steel 65Mn) provides preload force. During operation, the connecting plate 2 32 is pulled up to compress the return spring 2 35 to make the limit block 2 31 disengage from the limit groove 27, and the upper cover 12 is rotated to any angle. After releasing, the return spring 2 35 is reset and locked. This structure realizes multi-angle positioning of the upper cover 12, which is convenient for observation and detection at multiple angles.

[0035] Reference Figures 1 to 7, one end of the sliding sleeve 33 is connected to the limit rod 37, the sliding rod 36 is provided with a limit slot, and the limit slot is adapted to the limit rod 37;

[0036] The above solution is adopted: a limit rod 37 (stainless steel 304, with rounded head) is provided at one end of the sliding sleeve 33 (model HT-06, brass H59 material), which constitutes a locking mechanism with the limit slot on the surface of the sliding rod 36 (model HD-08). The limit rod 37 is radially fixed to the sliding sleeve 33, and the end is provided with anti-slip knurling. When the sliding rod 36 is reset, the limit slot is coaxially aligned with the limit rod 37, and the limit rod 37 is inserted to achieve locking to prevent accidental opening. When unlocking, the limit rod 37 is pulled out, and the connecting plate 2 32 can be pressed, and the limit block 2 31 can be re-extracted from the limit slot 27 of the rotating shaft 26.

[0037] Reference Figures 1 to 7 A rotating motor 11 is fixedly mounted on the top of the workbench 1, and a threaded rod 10 is fixedly mounted on the output shaft of the rotating motor 11, and the threaded rod 10 is threadedly connected to the slider 9. A display device 38 is fixedly mounted on the top of the workbench 1, and a test module 39 is fixedly mounted on the top of the workbench 1. A support leg 2 is fixedly mounted on the bottom of the workbench 1, and the support leg 2 is symmetrically fixedly mounted on the bottom of the workbench 1;

[0038] The above solution is adopted: the rotating motor 11, the display device 38 and the test module 39 are all prior arts cited from the comparative documents and are not described in detail in this application.

[0039] When the filter plate 13 is installed, the filter plate 13 and the limit ring block 16 at the top of the workbench 1 are in the unlocked state. At this time, the filter plate 13 is engaged with the inner part of the empty groove 5 through the engaging rod 14 at the bottom end, and the filter plate position is initially positioned and fixed. The working table 1 and the inner adjusting rod 18 of the mounting block 15 at the top of the filter plate 13 drive the limit ring block 16 to rotate on the inner side of the mounting block 15. When a part of the limit ring block 16 at the bottom end of the filter plate 13 rotates to the top of the workbench 1 and a part of the limit ring block 16 at the top of the workbench 1 rotates to the top of the filter plate 13, the preliminary fixation of the filter plate 13 and the workbench 1 is completed. Then, the pull rod 24 is released, and the elastic potential energy stored in the return spring 23 is released, and the limit block 22 automatically slides out of the slide groove 21 and is inserted into the limit hole 20 to complete the limit, realizing angle locking, and the filter plate 13 can be quickly disassembled and installed. The second limit block 31 is disengaged from the limit groove 27, and the upper cover 12 can be freely rotated to any angle; after releasing the return spring 35, the limit block 31 is pushed into the corresponding limit groove 27 to lock the angle. At the same time, the limit rod 37 is inserted into the limit slot of the sliding rod 36 to further fix the position of the upper cover 12 and prevent accidental rotation.

[0040] The above is only a preferred specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any technician familiar with this technical field, within the technical scope disclosed by the present invention, who makes equivalent replacements or changes based on the technical solutions and inventive concepts of the present invention, should be covered by the scope of protection of the present invention.

Claims

1. A semiconductor packaging test carrier, comprising a workbench (1), a slider (9) is provided at the top of the workbench (1), an outer strip shell (7) is fixedly installed on one side of the slider (9), an inner strip shell (8) is fixedly installed on one end of the slider (9) and located on the same side as the outer strip shell (7), a hollow groove (5) is provided in the middle of the inner strip shell (8) and the outer strip shell (7), and air holes (6) are uniformly provided inside the hollow groove (5), a slide plate (3) is provided at the bottom end of the workbench (1), and an air pipe (4) is fixedly installed on one end of the slide plate (3), and the other end of the air pipe (4) is connected to the air hole (6), characterized in that A filter plate (13) for filtering impurities and dust is provided inside the empty slot (5), and an engaging rod (14) is symmetrically and evenly fixedly installed on the bottom end of the filter plate (13) and is engaged with the inside of the empty slot (5). A mounting block (15) is fixedly installed on the top of the workbench (1) and the filter plate (13), and a limiting ring block (16) is rotatably connected to the inner side of the mounting block (15). An arc groove (17) is provided at one end of the mounting block (15), and an adjusting rod (18) is fixedly installed at one end of the limiting ring block (16), and the adjusting rod (18) is adapted to the arc groove (17).

2. The semiconductor packaging test carrier according to claim 1, characterized in that: The top of the workbench (1) and the filter plate (13) are both provided with an arc-shaped cavity (19), and the interior of the arc-shaped cavity (19) is evenly provided with a limit hole (20), the adjusting rod (18) passes through the arc-shaped groove (17), and the bottom end is provided with a slide groove (21), and the interior of the slide groove (21) is slidably connected to a limit block (22), and the limit block (22) is adapted to the limit hole (20).

3. The semiconductor packaging test carrier according to claim 2, characterized in that: A return spring (23) is symmetrically fixedly installed inside the sliding groove (21), and a pull rod (24) is slidably connected to the top of the adjusting rod (18), and the pull rod (24) passes through the sliding groove (21) and is fixedly installed with a limit block (22).

4. The semiconductor packaging test carrier according to claim 3, characterized in that: The top of the inner strip shell (8) is rotatably connected to the upper cover (12), and one end of the inner strip shell (8) is fixedly installed with a second mounting block (25). One end of the second mounting block (25) is rotatably connected to a rotating shaft (26), and the rotating shaft (26) passes through the second mounting block (25) and is fixedly installed with the upper cover (12). The outer periphery of the rotating shaft (26) is evenly surrounded by a limiting groove (27). The top of the second mounting block (25) is rotatably connected to a connecting plate (28), and a cavity (29) is provided at the top of the second mounting block (25). The bottom end of the second mounting block (25) is fixedly installed with a rotating block (30) rotatably connected to the cavity (29), and the bottom end of the connecting plate (28) is fixedly installed with a second limiting block (31), and the second limiting block (31) is adapted to the limiting groove (27).

5. The semiconductor packaging test carrier according to claim 4, characterized in that: One end of the connecting plate 1 (28) is fixedly mounted with the connecting plate 2 (32), and the bottom end of the connecting plate 2 (32) is fixedly mounted with a sliding rod (36), and the top end of the mounting block 2 (25) is fixedly mounted with a sliding sleeve (33), and the sliding sleeve (33) is slidably connected to the sliding rod (36).

6. The semiconductor packaging test carrier according to claim 5, characterized in that: The sliding sleeve (33) is provided with a sliding cavity (34) inside, and a second return spring (35) is fixedly installed inside the sliding cavity (34), and the top end of the second return spring (35) is fixedly installed with the bottom end of the sliding rod (36).

7. The semiconductor packaging test carrier according to claim 6, characterized in that: One end of the sliding sleeve (33) is plugged with a limiting rod (37), and the sliding rod (36) is provided with a limiting slot, and the limiting slot is adapted to the limiting rod (37).

8. The semiconductor packaging test carrier according to claim 7, characterized in that: A rotating motor (11) is fixedly mounted on the top of the workbench (1), and a threaded rod (10) is fixedly mounted on the output shaft of the rotating motor (11), and the threaded rod (10) is threadedly connected to the slider (9).

9. The semiconductor packaging test carrier according to claim 8, characterized in that: A display device (38) is fixedly mounted on the top of the workbench (1), and a test module (39) is fixedly mounted on the top of the workbench (1).

10. The semiconductor packaging test carrier according to claim 9, characterized in that: The bottom end of the workbench (1) is fixedly mounted with supporting legs (2), and the supporting legs (2) are symmetrically fixedly mounted on the bottom end of the workbench (1).

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