KRG system instrument channel test method, computer storage medium and control equipment

Abstract

The invention relates to a KRG system instrument channel test method, a computer storage medium and control equipment. The method comprises the following steps: S10, acquiring test parameters of a to-be-tested instrument channel; s20, a ramp voltage signal is output to a processing calculation module of a to-be-tested instrument channel according to the test parameters and a preset linear formula; s30, acquiring an output end signal of a threshold trigger corresponding to the to-be-tested instrument channel; s40, judging whether the signal at the output end of the threshold trigger jumps or not; s50, when the output end signal jumps, the voltage value of the ramp voltage signal at the jumping moment is recorded as the action voltage; and S60, judging whether the instrument channel to be tested is qualified or not according to the action voltage. According to the invention, the instrument channel to be tested can obtain the ramp voltage signal required by the test through the software program, then the instrument channel is tested, and the method has the advantages of small manual operation amount, low human error risk and high test accuracy.

Description

Technical Field

[0001] The present invention relates to the technical field of nuclear power plant instruments, and in particular to a KRG system instrument channel test method, a computer storage medium and a control device. Background Art

[0002] The KRG system (centralized control analog system) is a critical component of the generalized reactor protection system. Its failure poses a direct threat to the safety and normal operation of the nuclear power plant. Therefore, the KRG system's safety-level process instrumentation channels (referred to as instrumentation channels) require periodic T1 testing. Traditionally, this testing involves manually injecting a step signal (a step signal suddenly jumps from one value to another at a certain moment) into the KRG system's instrumentation channels to provide the voltage signal necessary for the threshold trigger to make a judgment. The operator then uses a readback instrument (such as an oscilloscope) to monitor the threshold trigger's input voltage, record the triggering moment, and determine whether the instrumentation channel is functioning properly based on the input voltage at that moment. However, this test method has the disadvantages of large amount of manual operation, long time consumption, high risk of human error, and improper selection of the test value of the step signal, which will cause the size of the step signal that triggers the action of the threshold trigger to deviate from the actual limit of the threshold trigger, resulting in reduced test accuracy. In addition, due to the large number of instrument channels that need to be tested in nuclear power plants, it leads to a huge waste of human resources. Secondly, the intervention of the readback instrument is equivalent to connecting a shunt load to the input end of the threshold trigger, which will actually affect the accuracy of the voltage signal of the input threshold trigger, thereby affecting the test results. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a KRG system instrument channel test method, computer storage medium and control equipment.

[0004] The technical solution adopted by the present invention to solve the technical problem is to provide a KRG system instrument channel test method, including:

[0005] S10, obtaining test parameters of the instrument channel to be tested; wherein the test parameters include an initial value and a slope;

[0006] S20. Outputting a ramp voltage signal to a processing and calculation module of the instrument channel to be tested according to the test parameters and a preset linear formula; wherein the preset linear formula is expressed as: U=kt+b, where U represents the magnitude of the ramp voltage signal, k represents the slope, t represents time, and b represents the initial value;

[0007] S30, obtaining an output signal of a threshold trigger corresponding to the channel of the instrument to be tested;

[0008] S40, determining whether a signal jump occurs at the output terminal signal of the threshold trigger;

[0009] S50, when a signal jump occurs at the output terminal signal, recording the voltage value of the ramp voltage signal at the time of the jump as the action voltage;

[0010] S60: Determine whether the instrument channel to be tested is qualified according to the action voltage.

[0011] Preferably, in S60, the step of judging whether the channel of the instrument to be tested is qualified according to the action voltage includes:

[0012] It is determined whether the action voltage is within a preset voltage range. If so, it is determined that the instrument channel to be tested is qualified; otherwise, it is determined that the instrument channel to be tested is unqualified.

[0013] Preferably, in said S10, said test parameters further include expected values ​​and positive and negative deviation values;

[0014] In the S60, it further includes: determining a preset voltage range corresponding to the channel of the instrument to be tested according to the expected value and the positive and negative deviation values.

[0015] Preferably, in said S10, the test parameter of the instrument channel to be tested further includes the resistance value of the standard resistor in the instrument channel to be tested;

[0016] In the S20, it also includes: inputting a ramp current signal to the channel of the instrument to be tested based on the resistance value of the standard resistor and the preset linear formula to form the ramp voltage signal input to the processing and calculation module.

[0017] Preferably, the ramp current signal expression is: I=(kt+b) / R, where I represents the ramp current signal, and R represents the resistance value of the standard resistor of the instrument channel to be tested.

[0018] Preferably, before S10, the method further includes:

[0019] S01. Obtain a test plan list; wherein the test plan list includes a plurality of instrument channels and a plurality of test parameters corresponding to the plurality of instrument channels;

[0020] S02, defining one of the instrument channels that has not been tested in the test plan list as the instrument channel to be tested;

[0021] After the S60, the following steps are also included:

[0022] S70, determining whether all instrument channels in the test plan list have been tested, if so, executing S80, otherwise returning to S02;

[0023] S80: Issue a test result based on the determination results of all instrument channels in the test plan list.

[0024] Preferably, in S40, the step of determining whether a signal jump occurs at the output terminal signal of the threshold trigger includes:

[0025] Determine whether the output end signal of the threshold trigger switches from a low level to a high level or from a high level to a low level. When the output end signal of the threshold trigger switches from a low level to a high level or from a high level to a low level, it is determined that a signal jump occurs in the output end signal of the threshold trigger.

[0026] Preferably, in S01, the step of obtaining the test parameters of the instrument channel to be tested includes:

[0027] Obtain the test plan list from the preset server or formulate the test plan list according to the obtained formulation instructions.

[0028] In addition, the present invention also provides a computer storage medium storing a computer program, which implements the steps of the KRG system instrument channel test method described above when the computer program is executed.

[0029] In addition, the present invention also provides a control device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the KRG system instrument channel test method described above are implemented.

[0030] By implementing the technical solution of the present invention, the operation of the analog output module is controlled by a software program, so that the instrument channel to be tested can obtain the ramp voltage signal required for the test, and then the instrument channel can be tested. This not only reduces the manual operation workload of the staff and reduces the risk of human error, but also the ramp voltage signal has the characteristic of linear change compared to the step signal, which can make the action voltage as close as possible to the actual limit value of the threshold trigger of the instrument channel to be tested, and avoid the negative impact brought by the intervention of the readback instrument, thereby significantly improving the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0032] Figure 1 This is a flowchart of a KRG system instrument channel test method according to one embodiment of the present invention;

[0033] Figure 2 is a flowchart of a KRG system instrument channel test method according to another embodiment of the present invention;

[0034] Figure 3 It is a circuit structure block diagram of a control device in one embodiment of the present invention. DETAILED DESCRIPTION

[0035] In order to have a clearer understanding of the technical features, purposes and effects of the present invention, specific embodiments of the present invention are now described in detail with reference to the accompanying drawings.

[0036] It should be noted that the flowcharts shown in the accompanying drawings are for illustrative purposes only and do not necessarily include all content and operations / steps, nor must they be executed in the order described. For example, some operations / steps may be decomposed, while others may be combined or partially combined. Therefore, the actual execution order may vary depending on the actual situation.

[0037] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically separate entities. That is, these functional entities may be implemented in software, in one or more hardware modules or integrated circuits, or in different networks and / or processor devices and / or microcontroller devices.

[0038] Figure 1 This is a flowchart of a KRG system instrument channel test method according to one embodiment of the present invention. This KRG system instrument channel test method is used for control equipment in a KRG system instrument channel test device. The KRG system instrument channel test device also includes an analog output module and a signal matrix module. This KRG system instrument channel test method can efficiently and accurately test the quality of KRG system instrument channels.

[0039] See Figure 1 The KRG system instrument channel test method may include step S10, step S20, step S30, step S40, step S50 and step S60.

[0040] Step S10 includes: obtaining test parameters of the instrument channel to be tested, wherein the test parameters may include at least one of an initial value, a slope, an expected value, a positive or negative deviation value, and a resistance value of a standard resistor in the instrument channel to be tested.

[0041] It should be noted that since the resistance values ​​of the standard resistors in different instrument channels may vary, and the resistance values ​​of the standard resistors affect the conversion ratio between the current analog signal and the voltage analog signal, it is necessary to obtain the standard resistor corresponding to each instrument channel. In addition, the standard resistor for each instrument channel can be obtained from the manufacturer's specification sheet. Taking into account the effects of component aging, wire resistance, etc., personnel can also use an ohmmeter to measure the actual resistance between the instrument channel inlet and the processing and calculation module of the measuring instrument to determine the measured actual resistance as the standard resistance of the measuring instrument.

[0042] Step S20 includes: outputting a ramp voltage signal to a processing and calculation module of the instrument channel to be tested according to the test parameters and a preset linear formula. The preset linear formula can be expressed as: U = kt + b, where U represents the magnitude of the ramp voltage signal, k represents the slope, t represents the time, and b represents the initial value.

[0043] The purpose of this step is to control the operation of the analog output module according to the test parameters so that the processing and calculation module of the instrument channel to be tested can obtain the ramp voltage signal.

[0044] It should be noted that the slope can be positive or negative. When the threshold trigger of the instrument channel to be tested is a high threshold trigger (a high threshold trigger refers to a threshold trigger that is triggered when its input voltage increases to a value greater than a reference value), the slope corresponds to a positive number. Furthermore, the initial value of the test parameter of the instrument channel to be tested is a value less than the threshold trigger reference value of the instrument channel to be tested, which can be 20% to 50% of the threshold trigger reference value. Of course, the staff can customize the initial value according to actual conditions. When the threshold trigger of the instrument channel to be tested is a low threshold trigger (a low threshold trigger refers to a threshold trigger that is triggered when its input voltage decreases to a value less than a reference value), the slope corresponds to a negative number. Furthermore, the initial value of the test parameter of the instrument channel to be tested is a value greater than the threshold trigger reference value of the instrument channel to be tested, which can be 150% to 180% of the threshold trigger reference value. Of course, the staff can customize the initial value according to actual conditions.

[0045] In addition, it should be noted that the smaller the absolute value of the slope, the slower the increase or decrease speed of the ramp voltage signal. The smaller the absolute value of the slope, the more conducive it is to improving the linearity of the ramp voltage signal, which is beneficial to improving the accuracy of the test. However, the test time consumed is relatively long. Therefore, the slope is usually set by the staff according to actual needs. For example, when the first period of the test is rushed, the absolute value of the slope is usually appropriately increased.

[0046] In one embodiment, the processing and calculation module of the instrument channel to be tested can obtain a ramp voltage signal by performing the following steps: a ramp current signal is input to the instrument channel to be tested based on the resistance value of the standard resistor and a preset linear formula to form a ramp voltage signal input to the processing and calculation module. It can be understood that by converting the preset linear formula based on Ohm's law, the ramp current signal expression can be obtained: I = U / R = (kt + b) / R, where I represents the ramp current signal and R represents the resistance value of the standard resistor of the instrument channel to be tested. Accordingly, in this embodiment, the analog output module can be an existing adjustable current source, and the control device can control the output current of the adjustable current source to make it consistent with the changes in the ramp current signal expression. It can be understood that the advantage of this embodiment is that the standard resistor of the instrument channel to be tested is also involved in the test work, which is closer to the actual working environment of the instrument channel to be tested, helping to improve the comprehensiveness and confidence of the test. Of course, it is also possible to directly input a voltage signal that conforms to the preset linear formula to the processing and calculation module through an existing adjustable voltage source, but this is not conducive to improving the confidence of the test.

[0047] In one embodiment, the current variation range of the ramp current signal may be 4 mA to 20 mA.

[0048] Step S30 includes obtaining the output signal of the threshold trigger corresponding to the instrument channel to be tested. In this step, the output signal of the threshold trigger can be monitored in real time using an existing voltage transformer or voltage measurement module to determine whether the output signal of the threshold trigger has experienced a signal jump in subsequent steps.

[0049] Step S40 includes determining whether a signal transition occurs at the output of the threshold trigger. This step directly detects the output of the threshold trigger to determine whether the trigger has triggered. This eliminates the need to connect a readback instrument to the input of the threshold trigger, thus avoiding the negative impact of such a device and significantly improving test accuracy.

[0050] In step S40, whether the output terminal signal has jumped can be determined by executing the following steps: whether the output terminal signal of the threshold trigger switches from a low level to a high level or from a high level to a low level, and when the output terminal signal of the threshold trigger switches from a low level to a high level or from a high level to a low level, it is determined that the output terminal signal of the threshold trigger has jumped. Specifically, when the threshold trigger is a high threshold trigger, if the output terminal signal of the threshold trigger switches from a low level to a high level, it can be determined that the threshold trigger has jumped. When the threshold trigger is a low threshold trigger, if the output terminal signal of the threshold trigger switches from a high level to a low level, it is determined that the threshold trigger has jumped.

[0051] Step S50 includes: when the output terminal signal undergoes a signal jump, recording the voltage value of the ramp voltage signal at the time of the jump as the action voltage. It should be noted that when the output terminal signal undergoes a signal jump, it is equivalent to the threshold trigger triggering the protection action.

[0052] After the threshold trigger is triggered, whether the test signal (the test signal is a ramp voltage signal or a ramp current signal) subsequently injected into the instrument channel changes has no effect on the test, but the continuous increase of the test signal may damage the hardware of the instrument channel. In order to avoid damage to related hardware, in one embodiment, step S50 may also include: when a signal jump occurs in the output end signal, the output can control the analog output module to stop outputting the test signal. Stop injection instruction.

[0053] Step S60 includes: judging whether the instrument channel to be tested is qualified according to the action voltage.

[0054] In one embodiment, whether the instrument channel to be tested is qualified can be determined by executing the following steps: judging whether the action voltage is within a preset voltage range, if so, the instrument channel to be tested is judged to be qualified, otherwise, the instrument channel to be tested is judged to be unqualified.

[0055] Furthermore, the preset voltage range corresponding to the instrument channel under test can be determined based on the expected value and the positive and negative deviation values. Specifically, the expected value is generally consistent with the predetermined reference value of the threshold trigger of the instrument channel under test, while the positive and negative deviation values ​​indicate the voltage value by which the expected value is allowed to deviate upward or downward. In other words, the difference between the expected value and the positive and negative deviation values ​​can be determined as the lower limit of the preset voltage range, and the sum of the expected value and the positive and negative deviation values ​​can be determined as the upper limit of the preset voltage range.

[0056] In addition, positive and negative deviation values ​​and expected values ​​are usually set adaptively by staff based on actual conditions.

[0057] Figure 2 This is a flowchart of the KRG system instrument channel test method in another embodiment of the present invention. Figure 2 , Figure 2 The embodiment shown is Figure 1 The difference between the illustrated embodiment and the embodiment is that step S01 and step S02 are further included before step S10 , and step S70 and step S80 are further included after step S60 . Figure 2 The embodiment shown is Figure 1 The same parts of the embodiments can be referred to above and will not be repeated here. Since each KRG cabinet in a nuclear power plant includes a large number of instrument channels, if one test is carried out one by one, the efficiency is low. Figure 2 The illustrated embodiment is capable of automatically and sequentially testing the functionality of multiple instrument channels.

[0058] Step S01 includes: obtaining a test plan list, wherein the test plan list may include a plurality of instrument channels and a plurality of test parameters corresponding to the plurality of instrument channels.

[0059] In one embodiment, the test plan list can be obtained in the following manner: the test plan list is obtained from a preset server. Specifically, the server is used to store historical test plan lists, historical test results, and historical operation records of staff.

[0060] In another embodiment, the test plan list can be obtained by formulating the test plan list according to the obtained formulation instructions. Specifically, the staff can input the formulation instructions by operating a human-computer interaction module (such as a mouse, keyboard, touch screen, etc.), and the formulation instructions can formulate the specific content of the test plan list, including the number of instrument channels to be tested, and the test parameters corresponding to each instrument channel, including the initial value, slope, expected value, and other parameters.

[0061] Furthermore, step S01 may also include: performing editing operations on the test plan list according to the acquired editing instructions. The editing operations may include editing the test plan list, adding a test plan list, editing the test plan list, exporting historical test results, etc. Specifically, editing the test plan list may include deleting instrument channels, adding instrument channels, and modifying the test parameters of any instrument channel. Specifically, the staff may input the editing instructions by operating the human-computer interaction module.

[0062] Step S02 includes: defining one of the instrument channels in the test plan list that has not been tested as the instrument channel to be tested.

[0063] Furthermore, in one embodiment, step S02 may further include: after determining the instrument channel to be tested, outputting a switching signal to a signal matrix module that enables connection between the analog output module and the instrument channel to be tested. The signal matrix module is configured to electrically connect the analog output module to multiple instrument channels. In this embodiment, the signal matrix module may be an existing signal switching matrix that can receive a single input signal and, based on the switching signal, output the input signal through one of multiple output ports of the signal switching matrix.

[0064] Step S70 includes: determining whether all instrument channels in the test plan list have been tested, and if so, executing step S80, otherwise returning to step S02.

[0065] Step S80 includes issuing test results based on the determination results for all instrument channels in the test plan list. In this step, the test results can be displayed via a human-computer interaction module. Furthermore, the test results for each instrument channel can be displayed using different indicators, such as "√" and "X" icons to indicate whether the instrument channel passes or fails; alternatively, a yellow or highlighted indicator indicates a failed instrument channel, while a low-light green indicator indicates a passed instrument channel.

[0066] Since there may be a situation where the threshold trigger cannot be triggered normally due to a hardware failure such as a threshold trigger or a calculation processing module, in one embodiment, step S40 may further include: in the process of determining whether a signal jump occurs at the output end signal of the threshold trigger, it is also determined whether the ramp current signal exceeds a set limit range. When the ramp current signal exceeds the set limit range, the output end signal of the threshold trigger still does not undergo a signal jump, then the stop injection instruction is output (instructing the ramp current signal to stop injection immediately), and it is determined that the channel of the instrument to be tested is unqualified, and then the process jumps to step S70.

[0067] It can be understood that the technical solution of the present invention controls the operation of the analog output module through a software program, so that the instrument channel to be tested can obtain the ramp voltage signal required for the test, and then test the instrument channel. This not only reduces the manual operation of the staff and reduces the risk of human error, but also the ramp voltage signal has the characteristic of linear change compared to the step signal, which can make the action voltage as close as possible to the actual limit of the threshold trigger of the instrument channel to be tested, thereby improving the test accuracy, and avoiding the negative impact brought about by the intervention of the readback instrument, further improving the test accuracy, saving a lot of test costs for nuclear power managers, improving test efficiency, shortening the test cycle, reducing economic losses caused by test downtime, and improving the economic benefits of nuclear power plants. It plays a positive role.

[0068] The present invention also provides a computer storage medium storing a computer program, which implements the steps of the KRG system instrument channel test method provided in an embodiment of the present invention when the computer program is run.

[0069] Figure 3 This is a circuit block diagram of a control device in one embodiment of the present invention. Figure 3 The control device may include a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the KRG system instrument channel test method provided by the embodiment of the present invention are implemented.

[0070] The present invention also provides a KRG system instrument channel test device, which includes an analog output module and a control device provided by an embodiment of the present invention.

[0071] In one embodiment, the KRG system instrument channel test device may further include a signal matrix module, which is electrically connected to the analog output module. The signal matrix module may be electrically connected to multiple instrument channels. The control device also controls the operation of the signal matrix module according to the test process, so that the instrument channel to be tested is connected to the analog output module, so that the instrument channel to be tested obtains the test signal output by the analog output module.

[0072] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. Reference can be made to the common and similar parts between the various embodiments. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method description.

[0073] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0074] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0075] It can be understood that the above embodiments only express the preferred implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the patent scope of the present invention. It should be pointed out that for ordinary technicians in this field, without departing from the concept of the present invention, the above technical features can be freely combined, and several deformations and improvements can be made, all of which fall within the scope of protection of the present invention. Therefore, all equivalent changes and modifications made to the scope of the claims of the present invention should fall within the scope of coverage of the claims of the present invention.

Claims

1. A KRG system instrument channel test method, characterized in that: include: S10, obtaining test parameters of the instrument channel to be tested; wherein the test parameters include an initial value and a slope; S20. Outputting a ramp voltage signal to a processing and calculation module of the instrument channel to be tested according to the test parameters and a preset linear formula; wherein the preset linear formula is expressed as: U=kt+b, where U represents the magnitude of the ramp voltage signal, k represents the slope, t represents time, and b represents the initial value; S30, obtaining an output signal of a threshold trigger corresponding to the channel of the instrument to be tested; S40, determining whether a signal jump occurs at the output terminal signal of the threshold trigger; S50, when a signal jump occurs at the output terminal signal, recording the voltage value of the ramp voltage signal at the time of the jump as the action voltage; S60: Determine whether the instrument channel to be tested is qualified according to the action voltage.

2. The KRG system instrument channel test method according to claim 1, characterized in that: In S60, the step of judging whether the channel of the instrument to be tested is qualified according to the action voltage includes: It is determined whether the action voltage is within a preset voltage range. If so, it is determined that the instrument channel to be tested is qualified; otherwise, it is determined that the instrument channel to be tested is unqualified.

3. The KRG system instrument channel test method according to claim 2, characterized in that: In said S10, said test parameters further include expected values ​​and positive and negative deviation values; In the S60, it further includes: determining a preset voltage range corresponding to the channel of the instrument to be tested according to the expected value and the positive and negative deviation values.

4. The KRG system instrument channel test method according to claim 1, characterized in that: In the S10, the test parameters of the instrument channel to be tested further include the resistance value of the standard resistor in the instrument channel to be tested; In the S20, it also includes: inputting a ramp current signal to the channel of the instrument to be tested based on the resistance value of the standard resistor and the preset linear formula to form the ramp voltage signal input to the processing and calculation module.

5. The KRG system instrument channel test method according to claim 4, characterized in that: The ramp current signal expression is: I=(kt+b) / R, where I represents the ramp current signal, and R represents the resistance value of the standard resistor of the instrument channel to be tested.

6. The KRG system instrument channel test method according to any one of claims 1 to 5, characterized in that: Before S10, the method further includes: S01. Obtain a test plan list; wherein the test plan list includes a plurality of instrument channels and a plurality of test parameters corresponding to the plurality of instrument channels; S02. Determine one of the instrument channels that has not been tested in the test plan list as the instrument channel to be tested; After the S60, the following steps are also included: S70, determining whether all instrument channels in the test plan list have been tested, if so, executing S80, otherwise returning to S02; S80: Issue a test result based on the determination results of all instrument channels in the test plan list.

7. The KRG system instrument channel test method according to claim 6, characterized in that: In S40, the step of determining whether a signal jump occurs at the output terminal signal of the threshold trigger includes: Determine whether the output end signal of the threshold trigger switches from a low level to a high level or from a high level to a low level. When the output end signal of the threshold trigger switches from a low level to a high level or from a high level to a low level, it is determined that a signal jump occurs in the output end signal of the threshold trigger.

8. The KRG system instrument channel test method according to claim 6, characterized in that: In the step S01, the step of obtaining the test parameters of the instrument channel to be tested includes: Obtain the test plan list from the preset server or formulate the test plan list according to the obtained formulation instructions.

9. A computer storage medium, characterized in that A computer program is stored, and when the computer program is run, the steps of the KRG system instrument channel test method according to any one of claims 1 to 8 are implemented.

10. A control device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the steps of the KRG system instrument channel test method according to any one of claims 1 to 8 are implemented.

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