Test method, device and system, automatic driving system and vehicle

Abstract

The invention provides a testing method, device and system, an automatic driving system and a vehicle, and relates to the technical field of electronic information, in particular to the technical fields of automatic driving, electronic testing, signal analysis and the like. The specific test method is applied to the test device, and the test device comprises a controller and a test assembly. The test assembly is used for being connected with an object main body of a tested object through a signal transmission assembly of the tested object; the test method comprises the steps that a controller tests a tested object through a test assembly to obtain a test result for the tested object; wherein the test result comprises a reliability test result for the object main body and / or a signal transmission quality test result for the signal transmission assembly. By adopting the method and the device, a more comprehensive test result which is more related to stable operation of the tested object relative to a functional test result can be obtained, so that whether the tested object can stably operate in a complex and changeable application environment or not can be accurately judged.

Description

Technical Field

[0001] The present disclosure relates to the field of electronic information technology, in particular to technical fields such as autonomous driving, electronic testing, and signal analysis, and specifically to a testing method, device, system, autonomous driving system, and vehicle. Background Art

[0002] Currently, autonomous vehicles, developed based on autonomous driving technology, are gradually entering the public eye and gaining widespread adoption. To improve the safety and reliability of autonomous vehicles, it is necessary to test key components within them. Summary of the Invention

[0003] The present disclosure provides a testing method, device, system, automatic driving system and vehicle.

[0004] According to a first aspect of the present disclosure, a testing method is provided, which is applied to a testing device, wherein the testing device includes a controller and a testing component; the testing component is used to connect to an object body of a tested object through a signal transmission component of the tested object;

[0005] Test methods include:

[0006] The controller tests the object under test through the test component to obtain test results for the object under test; wherein the test results include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component.

[0007] According to a second aspect of the present disclosure, there is provided a testing device comprising a controller and a testing component connected to the controller; the testing component is configured to be connected to an object body of a tested object via a signal transmission component of the tested object;

[0008] The controller is used to test the object under test through the test component to obtain test results for the object under test; wherein the test results include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component.

[0009] According to a third aspect of the present disclosure, there is provided a testing system comprising the testing device provided in the second aspect, and a cloud platform connected to a controller in the testing device;

[0010] The controller is used to send the test results to the cloud platform; the cloud platform is used to mark the object under test as a poor quality object when the test results indicate that the object under test does not meet the overall test requirements; or to mark the object under test as a qualified object when the test results indicate that the object under test meets the overall test requirements.

[0011] According to a fourth aspect of the present disclosure, an automatic driving system is provided, comprising the test device provided by the second aspect.

[0012] According to a fifth aspect of the present disclosure, a vehicle is provided, comprising the automatic driving system provided by the fourth aspect.

[0013] According to a sixth aspect of the present disclosure, there is provided an electronic device, including:

[0014] at least one processor;

[0015] a memory communicatively coupled to the at least one processor;

[0016] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform at least part of the steps in the testing method provided in the first aspect of the present disclosure.

[0017] The present disclosure can obtain test results that are more comprehensive and more relevant to the stable operation of the object under test compared to functional test results, thereby helping to accurately determine whether the object under test can operate stably in a complex and changeable application environment.

[0018] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings are provided to facilitate a better understanding of the present invention and do not constitute a limitation of the present disclosure.

[0020] Figure 1 A schematic diagram of a first test device and its corresponding application provided in an embodiment of the present disclosure;

[0021] Figure 2 A flow chart of a testing method provided in an embodiment of the present disclosure;

[0022] Figure 3 A second test device and its corresponding application schematic diagram provided in an embodiment of the present disclosure;

[0023] Figure 4 A third test device and its corresponding application schematic diagram provided in an embodiment of the present disclosure;

[0024] Figure 5 A fourth test device and its corresponding application schematic diagram provided in an embodiment of the present disclosure;

[0025] Figure 6 A schematic diagram of a process for obtaining reliability test results provided in an embodiment of the present disclosure;

[0026] Figure 7 A schematic diagram of a process for obtaining eye diagram test results provided in an embodiment of the present disclosure;

[0027] Figure 8 A fifth test device and its corresponding application schematic diagram provided in an embodiment of the present disclosure;

[0028] Figure 9 A sixth test device and its corresponding application diagram provided in an embodiment of the present disclosure;

[0029] Figure 10 A schematic diagram of a process for obtaining return loss test results provided in an embodiment of the present disclosure;

[0030] Figure 11 A schematic diagram of a first test system and its corresponding application provided in an embodiment of the present disclosure;

[0031] Figure 12 A schematic diagram of a second test system and its corresponding application provided in an embodiment of the present disclosure;

[0032] Figure 13 A flowchart of a management process for test results is provided for an embodiment of the present disclosure;

[0033] Figure 14 A schematic structural diagram of a vehicle provided in an embodiment of the present disclosure;

[0034] Figure 15 A schematic structural block diagram of an electronic device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0035] The following description of exemplary embodiments of the present disclosure is made in conjunction with the accompanying drawings, including various details of the embodiments of the present disclosure to facilitate understanding, which should be considered as merely exemplary. Therefore, it should be appreciated by those skilled in the art that various changes and modifications may be made to the embodiments described herein without departing from the scope of the present disclosure. Similarly, for the sake of clarity and conciseness, descriptions of well-known functions and structures are omitted in the following description.

[0036] As mentioned above, at present, autonomous driving vehicles developed based on autonomous driving technology are gradually entering the public eye and are widely used. In order to improve the safety and reliability of autonomous driving vehicles, it is necessary to test the key objects in autonomous driving vehicles. However, the inventors have found that traditional testing schemes only focus on functional testing of key objects to obtain functional test results that characterize whether the key objects can achieve the corresponding functions. However, in actual use, even if the key objects can achieve the corresponding functions, it does not mean that they can operate stably in complex and changing application environments. Therefore, there is an urgent need to provide a more comprehensive and in-depth testing scheme to obtain test results that are more comprehensive and more relevant to the stable operation of the object under test compared to the functional test results, so as to ensure that the key objects can operate stably in complex and changing application environments.

[0037] In response to the above problems, the present disclosure provides a testing method for testing a device. Figure 1 In the embodiment of the present disclosure, the test device 110 may include a controller 111 and a test component 112 connected to the controller 111. The test component 112 may be used to connect to an object body 122 of the object under test 120 through a signal transmission component 121 of the object under test 120. The controller 111 may be a field programmable gate array (FPGA), a microcontroller unit (MCU), a complex programmable logic device (CPLD), a central processing unit (CPU), a data processing unit (DPU), a system on chip (SOC), etc. The test component 112 may be a device assembly for transmitting and / or processing signals / data, and can assist in completing the test work on the object under test 120.

[0038] The following will be combined Figure 2 The flow chart shown illustrates a testing method provided by an embodiment of the present disclosure.

[0039] In step S201 , the controller tests the object under test through the test component to obtain a test result for the object under test.

[0040] Among them, the object to be measured can be a key object in an autonomous driving vehicle, specifically a key object in an autonomous driving vehicle with data transmission requirements, such as camera modules, lidar, millimeter-wave radar and other environmental perception devices.

[0041] For example, when the object to be measured is a camera module, the object body it includes may be an image collector, and the signal transmission component it includes may be used to send image data collected by the image collector to an automated driving domain controller (ADCU).

[0042] In addition, it should be noted that, in the embodiments of the present disclosure, the test results may include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component. The reliability test results can be used to characterize the reliability of the object body, for example, it can be used to characterize the reliability of the object body under repeated power on and off conditions; the signal transmission quality test results can be used to characterize the signal transmission quality of the communication link where the signal transmission component is located, and further characterize the possibility that an abnormality occurs in the communication link where the signal transmission component is located, resulting in data loss (for example, image data loss) or connection failure (failure to connect to the ADCU) in the object body.

[0043] By adopting the test method provided by the embodiment of the present disclosure, after the test component is connected to the object body of the object under test through the signal transmission component of the object under test, the controller can test the object under test through the test component to obtain test results for the object under test, and the test results may include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component. Among them, the reliability test results can be used to characterize the reliability of the object body; the signal transmission quality test results can be used to characterize the signal transmission quality of the communication link where the signal transmission component is located. In other words, by adopting the test method provided by the embodiment of the present disclosure, it is possible to obtain test results that are more comprehensive and more relevant to the stable operation of the object under test than the functional test results, so as to help accurately judge whether the object under test can operate stably in a complex and changeable application environment. Moreover, when the test method is applied to the production or quality inspection of key objects, poor-quality key objects (i.e., inferior objects) can be screened out in advance, and risks can be pre-positioned, thereby reducing the incidence of later failures of key objects and, in turn, reducing the maintenance costs of autonomous vehicles. When the test method is applied to actual application scenarios of key objects, it can help to promptly discover key objects with degraded performance, thereby further improving the safety and reliability of autonomous vehicles.

[0044] Furthermore, taking the object under test as a camera module as an example, the object body included therein is an image collector, and the signal transmission component included therein is used to send the image data collected by the image collector to the ADCU, and the signal transmission component usually uses serial transmission to send the image data to the ADCU. Therefore, the transmission rate of the image data is relatively high. For example, for an image collector with a resolution of 8 million pixels, when the image data is sent to the ADCU in a serial transmission manner, the transmission rate is usually 3 gigabits per second (Gbps) or 6 Gbps, and the high-speed transmission rate has high requirements for the return loss (Return Loss) of the communication link. Based on this, in an embodiment of the present disclosure, the signal transmission component may include a serializer and a first connector, and the serializer may be connected to the object body and the first connector respectively, and the signal transmission quality test result may include an eye diagram test result and / or a return loss test result to improve the comprehensiveness of the test result and improve the correlation between the test result and whether the object under test can operate stably, thereby helping to accurately judge whether the object under test can operate stably in a complex and changeable application environment. Among them, the serializer can be an integrated circuit designed using Gigabit Multimedia Serial Link (GMSL) development technology, or video serial communication bus (Flat Panel Display Link, FPD Link) interface technology, or the automotive physical layer specification (Automotive Physical, A-PHY) interface technology provided by the Mobile Industry Processor Interface Alliance (MIPI), which can be used to convert parallel data into serial data, for example, converting parallel image data into serial image data, so as to facilitate the transmission of image data through a coaxial cable or a pair of differential lines; the first connector can be used to achieve temporary or permanent connection between the object under test and the test component in the test device.

[0045] In addition, it should be noted that in the embodiments of the present disclosure, the eye diagram test results can be used to indicate whether the signal transmission component meets the eye diagram test requirements, specifically whether the electrical signal (e.g., voltage signal or current signal) transmitted on the communication link where the signal transmission component is located meets the eye diagram test requirements; the return loss test results can be used to indicate whether the signal transmission component meets the return loss test requirements, specifically whether the communication link where the signal transmission component is located meets the return loss test requirements. The eye diagram test requirements and return loss test requirements can be set according to actual application requirements, and the embodiments of the present disclosure do not impose any restrictions on this.

[0046] Based on the above, please combine Figure 3In the embodiment of the present disclosure, as a first optional implementation, the test component 312 may include a deserializer 3121 and a second connector 3122 (in Figure 3 For the controller 311 included in the test device 310, and the signal transmission component 321 and the object body 322 included in the object 320, see Figure 1 , and the signal transmission component 321 included in the object under test 320 may include a serializer 3212 and a first connector 3211). The deserializer 3121 may be an integrated circuit designed using GMSL development technology, or FPD Link interface technology, or the A-PHY interface technology provided by MIPI, which can be used to convert serial data into parallel data. For example, when the object under test 320 is a camera module (that is, the object body 322 is an image collector), serial image data is converted into parallel image data; the second connector 3122 can be used to achieve a temporary or permanent connection between the test component 312 and the signal transmission component 321 in the object under test 320. Specifically, the second connector 3122 can cooperate with the first connector 3211 to achieve a temporary or permanent connection between the test component 312 and the signal transmission component 321 in the object under test 320. In this way, not only can wiring resources be saved, but also the reliability of the test results can be improved.

[0047] like Figure 3 As shown, in the embodiment of the present disclosure, the deserializer 3121 can be connected to the controller 311 and the second connector 3122 respectively. Specifically, the deserializer 3121 can be directly connected to the controller 311, and at the same time, connected to the second connector 3122 through the DC isolation circuit 3123, and the second connector 3122 can be used to connect to the first connector 3211. The DC isolation circuit 3123 can be used to prevent the DC component in the electrical signal from passing through, while allowing the AC component in the electrical signal to pass through, so as to avoid the negative impact of the DC bias on the stability of the test device 310. Based on this, in the embodiment of the present disclosure, step S201, that is, "the controller tests the object under test through the test component to obtain the test results for the object under test", can include at least one of the following:

[0048] The controller 311 tests the object under test 320 through the deserializer 3121 , the second connector 3122 , the first connector 3211 , and the serializer 3212 to obtain a reliability test result.

[0049] The controller 311 tests the object under test 320 through the deserializer 3121 , the second connector 3122 , the first connector 3211 , and the serializer 3212 to obtain an eye diagram test result.

[0050] In one example, the controller 311 can test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain reliability test results, and test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain eye diagram test results. For example, the controller 311 can first test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain a reliability test result, and then test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain an eye diagram test result; for another example, the controller 311 can first test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain an eye diagram test result, and then test the object under test 320 through the deserializer 3121, the second connector 3122, the first connector 3211 and the serializer 3212 to obtain a reliability test result.

[0051] In addition, it should be noted that in the embodiment of the present disclosure, the test device 310 may further include a programmable power supply 313 and a filter circuit 314. The programmable power supply 313 may be connected to the controller 311 and the filter circuit 314, respectively; and the filter circuit 314 may be connected between the DC blocking circuit 3123 and the second connector 3122. In this way, during the process of obtaining the reliability test results, when there is a need to start the object body 322, the controller 311 can send a power-on signal to the programmable power supply 313 to enable the programmable power supply 313 to generate a power signal (for example, a DC power signal), and provide the power signal to the object body 322 through the filtering circuit 314, the second connector 3122, the first connector 3211 and the serializer 3212, so that the object body 322 is in a startup state; during the process of obtaining the eye diagram test results, when there is a need to start the object body 322, the controller 311 can send a power-on signal to the programmable power supply 313 to enable the programmable power supply 313 to generate a power signal, and provide the power signal to the object body 322 through the filtering circuit 314, the second connector 3122, the first connector 3211 and the serializer 3212, so that the object body 322 is in a startup state.

[0052] Through the above configuration, in the disclosed embodiment, the test device 310 can be implemented with a simple circuit structure. Furthermore, the test device 310 can be used to obtain reliability test results and eye diagram test results. This not only reduces the design and production costs of the test device 310, but also improves the comprehensiveness of the test results and the correlation between the test results and whether the object under test 320 can operate stably, thereby helping to accurately determine whether the object under test 320 can operate stably in complex and changing application environments.

[0053] Please combine Figure 4 In the embodiment of the present disclosure, as a second optional implementation, the test component 412 may include a signal transceiver module 4121 and a second connector 4122 (in Figure 4 For the controller 411 included in the test device 410, and the signal transmission component 421 and the object body 422 included in the object 420, see Figure 1 , furthermore, the signal transmission component 421 included in the test object 420 may include a serializer 4212 and a first connector 4211. The signal transceiver module 4121 may be used to generate a test signal and receive a target reflection signal corresponding to the test signal. The second connector 4122 may be used to achieve a temporary or permanent connection between the test component 412 and the signal transmission component 421 in the test object 420. Specifically, the second connector 4122 may cooperate with the first connector 4211 to achieve a temporary or permanent connection between the test component 412 and the signal transmission component 421 in the test object 420. This not only saves wiring harness resources but also improves the reliability of test results.

[0054] like Figure 4 As shown, in the embodiment of the present disclosure, the signal transceiver module 4121 can be connected to the controller 411 and the second connector 4122 respectively. Specifically, the signal transceiver module 4121 can be directly connected to the controller 411, and at the same time, connected to the second connector 4122 through the DC isolation circuit 4123, and the second connector 4122 can be used to connect to the first connector 4211. The DC isolation circuit 4123 can be used to prevent the DC component in the electrical signal from passing through, while allowing the AC component in the electrical signal to pass through, so as to avoid the DC bias from negatively affecting the stability of the test device 410. Based on this, in the embodiment of the present disclosure, step S201, that is, "the controller tests the object under test through the test component to obtain the test results for the object under test", can include:

[0055] The controller 411 tests the object under test 420 through the signal transceiver module 4121 , the second connector 4122 , the first connector 4211 and the serializer 4212 to obtain a return loss test result.

[0056] Furthermore, it should be noted that, in the disclosed embodiment, the test device 410 may further include a programmable power supply 413 and a filter circuit 414. The programmable power supply 413 may be connected to the controller 411 and the filter circuit 414, respectively; the filter circuit 414 may also be connected between the DC isolation circuit 4123 and the second connector 4122. Thus, during the acquisition of return loss test results, if there is a need to deactivate the object body 422, the controller 411 may send a power-off signal to the programmable power supply 413. Upon receiving the power-off signal, the programmable power supply 413 may cut off the power supply signal to the object body 422, thereby deactivating the object body 422.

[0057] Through the above configuration, in the disclosed embodiment, the test device 410 can be implemented with a simple circuit structure, and can be used to obtain return loss test results. This not only reduces the design and production costs of the test device 410, but also improves the correlation between the test results and whether the object under test 420 can operate stably, thereby helping to accurately determine whether the object under test 420 can operate stably in complex and changing application environments.

[0058] Please combine Figure 5 In the embodiment of the present disclosure, the test component 512, as a third optional implementation, may include a deserializer 5121, a signal transceiver module 5122, a gate 5123 and a second connector 5124 (in Figure 5 For the controller 511 included in the test device 510, and the signal transmission component 521 and the object body 522 included in the object 520, see Figure 1Related description of the corresponding part, and the signal transmission component 521 included in the object under test 520 may include a serializer 5212 and a first connector 5211). Among them, the deserializer 5121 can be an integrated circuit designed using GMSL development technology, or FPDLink interface technology, or the A-PHY interface technology provided by MIPI, which can be used to convert serial data into parallel data, for example, when the object under test 520 is a camera module (that is, the object body 522 is an image collector), converting serial image data into parallel image data; the signal transceiver module 5122 can be used to generate a test signal and receive a target reflection signal corresponding to the test signal; the selector 5123 can be an analog multiplexer that acts as a single-pole double-throw switch, and its communication bandwidth can be in the range of 3.5 gigahertz (GHz) to 10 GHz; the second connector 5124 can be used to achieve a temporary or permanent connection between the test component 512 and the signal transmission component 521 in the object under test 520. Specifically, the second connector 5124 can cooperate with the first connector 5211 to achieve a temporary or permanent connection between the test component 512 and the signal transmission component 521 in the object under test 520. This not only saves wiring harness resources but also improves the reliability of test results.

[0059] like Figure 5 As shown, in the embodiment of the present disclosure, the deserializer 5121 can be connected to the controller 511 and the gate 5123 respectively; the signal transceiver module 5122 can be connected to the controller 511 and the gate 5123 respectively; the gate 5123 can be connected to the controller 511 and the second connector 5124 respectively. Specifically, the gate 5123 can be directly connected to the controller 511, and at the same time, connected to the second connector 5124 through the DC isolation circuit 5125; the second connector 5124 can be used to connect to the first connector 5211. The DC isolation circuit 5125 can be used to prevent the DC component in the electrical signal from passing through, while allowing the AC component in the electrical signal to pass through, so as to avoid the DC bias from having a negative impact on the stability of the test device 510. Based on this, step S201, that is, "the controller tests the object under test through the test component to obtain the test results for the object under test", can include at least one of the following:

[0060] The controller 511 controls the selector 5123 to connect the deserializer 5121 and the second connector 5124 to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a reliability test result;

[0061] The controller 511 controls the selector 5123 to connect the deserializer 5121 and the second connector 5124 to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain an eye diagram test result;

[0062] The controller 511 controls the selector 5123 to connect the signal transceiver module 5122 and the second connector 5124 to test the object under test 520 through the signal transceiver module 5122, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a return loss test result.

[0063] In one example, the controller 511 can control the selector 5123 to connect the deserializer 5121 and the second connector 5124 to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a reliability test result. It can also control the selector 5123 to connect the deserializer 5121 and the second connector 5124 to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain an eye diagram test result. It can also control the selector 5123 to connect the signal transceiver module 5122 and the second connector 5124 to test the object under test 520 through the signal transceiver module 5122, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a return loss test result. For example, the controller 511 can first control the selector 5123 to connect the deserializer 5121 and the second connector 5124, so as to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a reliability test result, and then keep the selector 5123 in a state of connecting the deserializer 5121 and the second connector 5124, so as to test the object under test 520 through the deserializer 5121, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain an eye diagram test result, and finally, control the selector 5123 to connect the signal transceiver module 5122 and the second connector 5124, so as to test the object under test 520 through the signal transceiver module 5122, the second connector 5124, the first connector 5211 and the serializer 5212 to obtain a return loss test result.

[0064] In addition, it should be noted that, in the embodiment of the present disclosure, the test device 510 may further include a programmable power supply 513 and a filter circuit 514. The programmable power supply 513 may be connected to the controller 511 and the filter circuit 514 respectively; the filter circuit 514 may also be connected between the DC isolation circuit 5125 and the second connector 5124. In this way, in the process of obtaining the reliability test results, when there is a startup requirement for the object body 522, the controller 511 may send a power-on signal to the programmable power supply 513, so that the programmable power supply 513 generates a power signal, and provides a power signal to the object body 522 through the filter circuit 514, the second connector 5124, the first connector 5211 and the serializer 5212, so that the object body 522 is in a startup state; in the process of obtaining the eye diagram test results, when there is a startup requirement for the object body 522, the controller 511 may send a power-on signal to the programmable power supply 513. signal, so that the programmable power supply 513 generates a power signal, and provides the power signal to the object body 522 through the filtering circuit 514, the second connector 5124, the first connector 5211 and the serializer 5212, so that the object body 522 is in a startup state; in the process of obtaining the return loss test result, when there is a need to deactivate the object body 522, the controller 511 can send a power-off signal to the programmable power supply 513, and the programmable power supply 513 can cut off the power signal to the object body 522 after receiving the power-off signal, so that the object body 522 is in a deactivated state.

[0065] Through the above configuration, in the disclosed embodiment, the test device 510 can be implemented using a simple circuit structure. Furthermore, the test device 510 can be used to obtain reliability test results, eye diagram test results, and return loss test results. This not only reduces the design and production costs of the test device 510, but also improves the comprehensiveness of the test results and the correlation between the test results and whether the object under test 520 can operate stably, thereby helping to accurately determine whether the object under test 520 can operate stably in complex and changing application environments.

[0066] As mentioned above, in the embodiment of the present disclosure, the test device has Figure 3 or Figure 5 In the circuit structure shown, the controller can be used to test the object under test through the deserializer, the second connector, the first connector, and the serializer to obtain a reliability test result. Moreover, the reliability test result may be a first reliability test result or a second reliability test result. The process of obtaining the reliability test result may include:

[0067] (1) Obtain the number of reliability tests n.

[0068] Wherein, n≥2, and n is an integer.

[0069] In the embodiment of the present disclosure, the value of n can be set according to application requirements, for example, it can be set to 100, and the embodiment of the present disclosure does not limit this.

[0070] (2) Entering the i-th round of reliability testing process for the subject to obtain data analysis results for the reliability test data.

[0071] Wherein, 1≤i≤n, and i is an integer.

[0072] In the embodiment of the present disclosure, the reliability test process of the i-th round (i.e., the process of "obtaining data analysis results for reliability test data") may include:

[0073] (2.1) Provide a power signal to the object body to put the object body into a startup state.

[0074] In one example, the controller can send a power-on signal to the programmable power supply to enable the programmable power supply to generate a power signal, and provide the power signal to the object body through the filtering circuit, the second connector, the first connector and the serializer to put the object body into a startup state.

[0075] (2.2) Sending a trigger signal to the object subject to receive reliability test data returned by the object subject.

[0076] In one example, a trigger signal may be sent to the object body through the deserializer, the second connector, the first connector, and the serializer, and reliability test data returned by the object body may be received.

[0077] In the embodiment of the present disclosure, when the object under test is a camera module (i.e., the object body is an image collector), the trigger signal may be an image output indication signal; the reliability test data may include multiple test images captured within a preset time length, specifically multiple test images captured by the image collector within a preset time length. The preset time length may be set according to application requirements, for example, it may be set to 10 seconds (s), and the embodiment of the present disclosure does not impose any limitation on this.

[0078] In one specific example, before sending a trigger signal to the object body through the deserializer, the second connector, the first connector and the serializer, and receiving the reliability test data returned by the object body, the object body can also be configured for reliability testing, so that when the reliability test configuration is successful, a trigger signal is sent to the object body to receive the reliability test data returned by the object body according to the configuration result of the reliability test configuration; when the reliability test configuration fails, a first reliability test result can be directly obtained to characterize that the object body does not meet the reliability test requirements. Specifically, the object body can be configured for reliability testing through the deserializer, the second connector, the first connector and the serializer, so that when the reliability test configuration is successful, a trigger signal is sent to the object body through the deserializer, the second connector, the first connector and the serializer, and the reliability test data returned by the object body according to the configuration result of the reliability test configuration. Wherein, the reliability test configuration can be an initialization configuration for the object body. For example, when the object under test is a camera module (that is, the object body is an image acquisition device), the reliability test configuration can include initialization frame rate, initialization resolution, and initialization image format.

[0079] In addition, it should be noted that in the embodiment of the present disclosure, the controller can access the internal status register of the object body through the deserializer, the second connector, the first connector, and the serializer to determine whether the reliability test configuration is successful, and when the reliability configuration fails, obtain the specific reason for the reliability configuration failure, such as a communication failure, a physical disconnection, etc. Based on this, it can be understood that in the embodiment of the present disclosure, in process (2.2), the first reliability test result obtained can carry the specific reason for the reliability configuration failure, such as a communication failure, a physical disconnection, etc.

[0080] (2.3) Obtain data analysis results for reliability test data.

[0081] In the embodiment of the present disclosure, when the object under test is a camera module (i.e., the object body is an image collector), the trigger signal is an image output indication signal, and the reliability test data includes multiple test images collected within a preset time length, the data analysis results may include at least one of image size, frame rate, and frame delay. The frame delay may be obtained by:

[0082] The acquisition time interval between every two adjacent test images in the multiple test images is calculated as a candidate delay to obtain multiple candidate delays, and the candidate delay with the longest time length is selected from the multiple candidate delays as the frame delay.

[0083] (3) When the data analysis result does not meet the preset reliability standard, a first reliability test result is obtained to characterize that the object subject does not meet the reliability test requirement.

[0084] In an embodiment of the present disclosure, when the object under test is a camera module (i.e., the main object is an image collector), the trigger signal is an image output indication signal, the reliability test data includes multiple test images acquired within a preset time length, and the data analysis results include image size, frame rate, and frame delay, the preset reliability standard can be that the image size is a preset size, the frame rate is within a preset frame rate range, and the frame delay is within a preset duration range. The preset size, preset frame rate range, and preset duration range can be set according to application requirements and are not limited in this embodiment of the present disclosure.

[0085] In addition, it should be noted that in the embodiment of the present disclosure, in process (3), the first reliability test result obtained can carry a reliability test failure indication, which is used to characterize which one or several of the preset reliability standards the data analysis results do not meet, for example, whether the image size is not the preset size, or the frame rate exceeds the preset frame rate range, or the frame delay exceeds the preset time range.

[0086] (4) When the data analysis results meet the preset reliability standards, the power supply signal is cut off to the object body to put the object body into an inactive state, and when i < n, the i+1th reliability test process for the object body is entered, or when i = n, a second reliability test result is obtained to characterize that the object body meets the reliability test requirements.

[0087] In one example, the controller may send a power-off signal to the programmable power supply, and after receiving the power-off signal, the programmable power supply may cut off the power supply signal to the object body, so that the object body is in an inactive state.

[0088] In addition, it should be noted that in the embodiment of the present disclosure, after the power signal is cut off to the object body so that the object body is in an inactive state, when i<n, i=i+1 and the i+1th reliability test process for the object body can be entered; or, when i=n, a second reliability test result is obtained to characterize that the object body meets the reliability test requirements.

[0089] Through the above process, in the embodiment of the present disclosure, the reliability test results obtained can be used to characterize the reliability of the object body under repeated power on and off conditions. In this way, the correlation between the reliability test results and whether the object under test can operate stably can be improved, thereby helping to accurately determine whether the object under test can operate stably in a complex and changeable application environment. Moreover, in the process of obtaining the reliability test results, before sending a trigger signal to the object body through the deserializer, the second connector, the first connector, and the serializer and receiving the reliability test data returned by the object body, the object body can also be configured for reliability testing through the deserializer, the second connector, the first connector, and the serializer. If the reliability test configuration is successful, the deserializer, the second connector, the first connector, and the serializer send a trigger signal to the object body and receive the reliability test data returned by the object body according to the configuration result of the reliability test configuration; if the reliability test configuration fails, a first reliability test result can be directly obtained to characterize that the object body does not meet the reliability test requirements. In this way, the correlation between the reliability test results and whether the object under test can operate stably can be further improved, thereby helping to more accurately determine whether the object under test can operate stably in a complex and changeable application environment.

[0090] Next, the test device has the following Figure 5 As an example, the circuit structure shown in Figure 6 , describes the complete process of "the controller controls the selector to connect the deserializer and the second connector, so as to test the object under test through the deserializer, the second connector, the first connector and the serializer to obtain the reliability test results."

[0091] Step S601: The controller obtains the reliability test times n.

[0092] Wherein, n≥2, and n is an integer.

[0093] In the embodiment of the present disclosure, the value of n can be set according to application requirements, for example, it can be set to 100, and the embodiment of the present disclosure does not limit this.

[0094] Step S602 : The controller controls the selector to connect the deserializer and the second connector.

[0095] In an embodiment of the present disclosure, the controller can control the selector to connect the deserializer and the DC isolation circuit to connect the deserializer and the second connector. Specifically, the controller can send a first selection control signal to the selector to control the selector to connect the deserializer and the DC isolation circuit, and then connect the deserializer and the second connector.

[0096] After executing step S601 and step S602, the reliability test process for the object subject in round i may be entered:

[0097] In step S603-1, the controller sends a power-on signal to the programmable power supply, so that the programmable power supply generates a power signal, and provides the power signal to the object body through the filtering circuit, the second connector, the first connector and the serializer, so that the object body is in a startup state.

[0098] In step S603-2, the controller performs a reliability test configuration on the object body through the deserializer, the second connector, the first connector, and the serializer.

[0099] Among them, the reliability test configuration can be an initialization configuration for the object body. For example, when the object under test is a camera module (that is, the object body is an image collector), the reliability test configuration can include initialization frame rate, initialization resolution, and initialization image format.

[0100] In step S603-3, the controller determines whether the reliability test configuration is successful.

[0101] In the embodiment of the present disclosure, the controller can access the internal status register of the object body through the deserializer, the second connector, the first connector and the serializer to determine whether the reliability test configuration is successful, and when the reliability configuration fails, obtain the specific reason for the reliability configuration failure, such as communication failure, physical disconnection, etc., and then enter step S603-4; or, when the reliability configuration is successful, enter step S603-5.

[0102] In step S603 - 4 , the controller obtains a first reliability test result indicating that the object body does not meet the reliability test requirement.

[0103] In step S603 - 4 , the obtained first reliability test result may carry the specific reason for the reliability configuration failure, such as communication failure, physical disconnection, etc.

[0104] In step S603-5, the controller sends a trigger signal to the object body through the deserializer, the second connector, the first connector and the serializer, and receives reliability test data returned by the object body according to the configuration result of the reliability test configuration.

[0105] In the embodiment of the present disclosure, when the object under test is a camera module (i.e., the object body is an image collector), the trigger signal may be an image output indication signal; the reliability test data may include multiple test images captured within a preset time length, specifically multiple test images captured by the image collector within a preset time length. The preset time length may be set according to application requirements, for example, it may be set to 10 seconds, and the embodiment of the present disclosure does not impose any limitation on this.

[0106] In addition, it should be noted that in the embodiment of the present disclosure, the controller can send a trigger signal to the object body through the deserializer, the selector, the DC blocking circuit, the second connector, the first connector and the serializer, and receive the reliability test data returned by the object body according to the configuration results of the reliability test configuration.

[0107] In step S603 - 6 , the controller obtains data analysis results for the reliability test data.

[0108] In an embodiment of the present disclosure, when the object under test is a camera module (i.e., the main object is an image collector), the trigger signal is an image output indication signal, and the reliability test data includes multiple test images captured within a preset time length, the data analysis results may include at least one of image size, frame rate, and frame delay. The frame delay may be obtained by calculating the acquisition time interval between each two adjacent test images in the multiple test images as a candidate delay, thereby obtaining multiple candidate delays, and selecting the candidate delay with the longest time length from the multiple candidate delays as the frame delay.

[0109] In step S603-7, the controller determines whether the data analysis result meets a preset reliability standard.

[0110] In an embodiment of the present disclosure, when the object under test is a camera module (i.e., the main object is an image collector), the trigger signal is an image output indication signal, the reliability test data includes multiple test images acquired within a preset time length, and the data analysis results include image size, frame rate, and frame delay, the preset reliability standard can be that the image size is a preset size, the frame rate is within a preset frame rate range, and the frame delay is within a preset duration range. The preset size, preset frame rate range, and preset duration range can be set according to application requirements and are not limited in this embodiment of the present disclosure.

[0111] When the data analysis result does not meet the preset reliability standard, the process proceeds to step S603 - 8 ; when the data analysis result meets the preset reliability standard, the process proceeds to step S603 - 9 .

[0112] In step S603 - 8 , the controller obtains a first reliability test result indicating that the object body does not meet the reliability test requirement.

[0113] In step S603-8, the first reliability test result obtained may carry a reliability test failure indication to characterize which one or more of the preset reliability standards the data analysis results do not meet, for example, whether the image size is not the preset size, or the frame rate exceeds the preset frame rate range, or the frame delay exceeds the preset time range.

[0114] In step S603-9, the controller cuts off the power supply signal to the object body, so that the object body is in an inactive state.

[0115] In one example, the controller may send a power-off signal to the programmable power supply, and after receiving the power-off signal, the programmable power supply may cut off the power supply signal to the object body, so that the object body is in an inactive state.

[0116] In step S603-10, the controller determines whether i is equal to n.

[0117] In the embodiment of the present disclosure, when i is not equal to n, that is, i<n, i=i+1 can be set and the i+1th reliability test process for the object body can be entered, that is, returning to step S603-1; or, when i is equal to n, entering step S604.

[0118] In step S604 , the controller obtains a second reliability test result for indicating that the object body meets the reliability test requirement.

[0119] As mentioned above, in the embodiment of the present disclosure, the test device has Figure 3 or Figure 5 In the circuit structure shown, the controller can be used to test the object under test through the deserializer, the second connector, the first connector, and the serializer to obtain an eye diagram test result. Moreover, the eye diagram test result may be a first eye diagram test result or a second eye diagram test result. The process of obtaining the eye diagram test result may include:

[0120] (1) A power signal is provided to the object body to put the object body into an activated state.

[0121] In one example, the controller can send a power-on signal to the programmable power supply to enable the programmable power supply to generate a power signal, and provide the power signal to the object body through the filtering circuit, the second connector, the first connector and the serializer to put the object body into a startup state.

[0122] (2) Obtain the target eye diagram related to the signal transmission component.

[0123] In one example, a target eye diagram associated with a signal transmission component may be obtained through the deserializer, the second connector, the first connector, and the serializer.

[0124] The target eye diagram may be the bit information of the electrical signal transmitted on the communication link where the signal transmission component is located. In a specific example, the process of obtaining the target eye diagram may include:

[0125] (2.1) Read the first eye diagram from the test component.

[0126] For example, the first eye diagram can be read from the deserializer.

[0127] The first eye image may include a first eye width and a first eye height.

[0128] In a specific example, multiple first eye diagram parameters can be read from a deserializer. For example, multiple first eye diagram parameters can be read from a register of the deserializer according to a first read configuration result for the deserializer. Each of the multiple first eye diagram parameters can include a first eye width value and a first eye height value. That is, the multiple first eye diagram parameters can include multiple first eye width values ​​and multiple first eye height values. After obtaining the multiple first eye width values, the maximum eye width value and the minimum eye width value of the multiple first eye width values ​​can be deleted to obtain multiple first remaining eye width values, and the average of the multiple first remaining eye width values ​​is used as the first eye width. Similarly, after obtaining the multiple first eye height values, the maximum eye height value and the minimum eye height value of the multiple first eye height values ​​can be deleted to obtain multiple first remaining eye height values, and the average of the multiple first remaining eye height values ​​is used as the first eye height.

[0129] In addition, it should be noted that the first read configuration result may include the first read count, the first time resolution, the first voltage resolution, etc., and the first read count, the first time resolution, and the first voltage resolution can be set according to application requirements, and the present disclosure does not limit this. Based on this, it can be understood that in the present disclosure embodiment, before reading the first eye diagram from the deserializer, it is also necessary to perform the first read configuration for the deserializer, that is, write the first read configuration result for the deserializer into the register of the deserializer.

[0130] (2.2) Read the second eye pattern from the signal transmission component.

[0131] For example, the second eye diagram may be read from the serializer through the deserializer, the second connector, and the first connector.

[0132] The second eye image may include a second eye width and a second eye height.

[0133] In a specific example, multiple second eye diagram parameters can be read from the serializer via the deserializer, the second connector, and the first connector. For example, the multiple second eye diagram parameters can be read from the serializer's register via the deserializer, the second connector, and the first connector according to a second read configuration result for the serializer. Each of the multiple second eye diagram parameters can include a second eye width value and a second eye height value. That is, the multiple second eye diagram parameters can include multiple second eye width values ​​and multiple second eye height values. After obtaining the multiple second eye width values, the maximum eye width value and the minimum eye width value from the multiple second eye width values ​​can be deleted to obtain multiple second remaining eye width values, and the average of the multiple second remaining eye width values ​​is used as the second eye width. Similarly, after obtaining the multiple second eye height values, the maximum eye height value and the minimum eye height value from the multiple second eye height values ​​can be deleted to obtain multiple second remaining eye height values, and the average of the multiple second remaining eye height values ​​is used as the second eye height.

[0134] In addition, it should be noted that the second read configuration result may include a second read count, a second time resolution, a second voltage resolution, etc., and the second read count may be the same as the first read count, the second time resolution may be the same as the first time resolution, and the second voltage resolution may be the same as the first voltage resolution. Based on this, it can be understood that in the embodiment of the present disclosure, before reading the second eye diagram from the serializer, it is necessary to perform a second read configuration for the serializer through the deserializer, the second connector, and the first connector, that is, write the second read configuration result for the serializer into the register of the serializer.

[0135] (2.3) Based on the first eye diagram and the second eye diagram, a target eye diagram related to the signal transmission component is obtained.

[0136] The target eye diagram may include a target eye width and a target eye height.

[0137] In a specific example, when the difference between the first eye width included in the first eye diagram and the second eye width included in the second eye diagram is within a preset eye width difference range, the minimum eye width of the first eye width and the second eye width can be used as the target eye width. Furthermore, when the difference between the first eye height included in the first eye diagram and the second eye height included in the second eye diagram is within a preset eye height difference range, the minimum eye height of the first eye height and the second eye height can be used as the target eye height. The target eye width and target eye height can be used together as the target eye diagram associated with the signal transmission component. The preset eye width difference range and the preset eye height difference range can be set based on application requirements and are not limited in this regard in the present disclosure.

[0138] Furthermore, it should be noted that, in the disclosed embodiment, if the difference between the first eye width included in the first eye diagram and the second eye width included in the second eye diagram exceeds a preset eye width difference range, a null value can be obtained as the target eye width. Similarly, if the difference between the first eye height included in the first eye diagram and the second eye height included in the second eye diagram exceeds a preset eye height difference range, a null value can be obtained as the target eye height. Finally, the target eye width and target eye height are collectively used as the target eye diagram associated with the signal transmission component.

[0139] (3) When the target eye diagram does not meet the preset eye diagram standard, a first eye diagram test result is obtained for characterizing that the signal transmission component does not meet the eye diagram test requirement.

[0140] The preset eye diagram standard may include a target eye width within a preset eye width range and a target eye height within a preset eye height range in the target eye diagram. The preset eye width range and the preset eye height range can be set based on application requirements and are not limited in this embodiment of the present disclosure.

[0141] In addition, it should be noted that in the embodiment of the present disclosure, in process (3), the first eye diagram test result obtained can carry an eye diagram test failure indication, which is used to characterize the target eye diagram, specifically whether the target eye width does not meet the preset eye diagram standard, or the target eye height does not meet the preset eye diagram characterization indication information.

[0142] (4) When the target eye diagram meets the preset eye diagram standard, a second eye diagram test result is obtained to characterize whether the signal transmission component meets the eye diagram test requirement.

[0143] Through the above process, in the embodiment of the present disclosure, the eye diagram test result can be obtained through a simple acquisition process, and this eye diagram test result can intuitively reflect the impact of the communication link where the signal transmission component is located on the amplitude and timing of the electrical signal transmitted thereon, so as to accurately judge the signal transmission quality of the communication link where the signal transmission component is located, thereby helping to accurately judge whether the object under test can operate stably in a complex and changeable application environment. Moreover, when the target eye diagram related to the signal transmission component is obtained through the deserializer, the second connector, the first connector and the serializer, the first eye diagram can be read from the deserializer, and the second eye diagram can be read from the serializer through the deserializer, the second connector and the first connector, and then the target eye diagram related to the signal transmission component can be obtained based on the first eye diagram and the second eye diagram. In this way, the correlation between the eye diagram test result and whether the object under test can operate stably can be further improved, thereby helping to more accurately judge whether the object under test can operate stably in a complex and changeable application environment.

[0144] Next, the test device has the following Figure 5As an example, the circuit structure shown in Figure 7 , describes the complete process of "the controller controls the selector to connect the deserializer and the second connector, so as to test the object under test through the deserializer, the second connector, the first connector and the serializer to obtain the eye diagram test result."

[0145] Step S701 : The controller controls the selector to connect the deserializer and the second connector.

[0146] In an embodiment of the present disclosure, the controller can control the selector to connect the deserializer and the DC isolation circuit to connect the deserializer and the second connector. Specifically, the controller can send a first selection control signal to the selector to control the selector to connect the deserializer and the DC isolation circuit, and then connect the deserializer and the second connector.

[0147] In step S702, the controller sends a power-on signal to the programmable power supply to enable the programmable power supply to generate a power signal, and provide the power signal to the object body through the filtering circuit, the second connector, the first connector and the serializer to enable the object body to be in a startup state.

[0148] In step S703 , the controller writes a first read configuration result for the deserializer into a register of the deserializer, and writes a second read configuration result for the serializer into a register of the serializer through the deserializer, the second connector, and the first connector.

[0149] Among them, the first reading configuration result may include the first reading number, the first time resolution, the first voltage resolution, etc., and the first reading number, the first time resolution, and the first voltage resolution can be set according to application requirements, and the embodiment of the present disclosure does not limit this; the second reading configuration result may include the second reading number, the second time resolution, the second voltage resolution, etc., and the second reading number can be the same as the first reading number, the second time resolution can be the same as the first time resolution, and the second voltage resolution can be the same as the first voltage resolution.

[0150] In step S704 , the controller reads a first eye diagram from the deserializer, and reads a second eye diagram from the serializer through the deserializer, the second connector, and the first connector, and obtains a target eye diagram related to the signal transmission component based on the first eye diagram and the second eye diagram.

[0151] The first eye diagram may include a first eye width and a first eye height; the second eye diagram may include a second eye width and a second eye height; and the target eye diagram may include a target eye width and a target eye height.

[0152] In a specific example, multiple first eye diagram parameters can be read from a deserializer. For example, multiple first eye diagram parameters can be read from a register of the deserializer according to a first read configuration result for the deserializer. Each of the multiple first eye diagram parameters can include a first eye width value and a first eye height value. That is, the multiple first eye diagram parameters can include multiple first eye width values ​​and multiple first eye height values. After obtaining the multiple first eye width values, the maximum eye width value and the minimum eye width value of the multiple first eye width values ​​can be deleted to obtain multiple first remaining eye width values, and the average of the multiple first remaining eye width values ​​is used as the first eye width. Similarly, after obtaining the multiple first eye height values, the maximum eye height value and the minimum eye height value of the multiple first eye height values ​​can be deleted to obtain multiple first remaining eye height values, and the average of the multiple first remaining eye height values ​​is used as the first eye height.

[0153] In another specific example, multiple second eye diagram parameters can be read from the serializer via the deserializer, the second connector, and the first connector. For example, the multiple second eye diagram parameters can be read from the serializer's register via the deserializer, the second connector, and the first connector according to the second read configuration result for the serializer. Each of the multiple second eye diagram parameters can include a second eye width value and a second eye height value. That is, the multiple second eye diagram parameters can include multiple second eye width values ​​and multiple second eye height values. After obtaining the multiple second eye width values, the maximum eye width value and the minimum eye width value from the multiple second eye width values ​​can be deleted to obtain multiple second remaining eye width values, and the average of the multiple second remaining eye width values ​​is used as the second eye width. Similarly, after obtaining the multiple second eye height values, the maximum eye height value and the minimum eye height value from the multiple second eye height values ​​can be deleted to obtain multiple second remaining eye height values, and the average of the multiple second remaining eye height values ​​is used as the second eye height.

[0154] After obtaining a first eye diagram (including a first eye width and a first eye height) and a second eye diagram (including a second eye width and a second eye height), if the difference between the first eye width included in the first eye diagram and the second eye width included in the second eye diagram is within a preset eye width difference range, the minimum eye width of the first eye width and the second eye width can be used as the target eye width. If the difference between the first eye height included in the first eye diagram and the second eye height included in the second eye diagram is within a preset eye height difference range, the minimum eye height of the first eye height and the second eye height can be used as the target eye height. The target eye width and the target eye height can be used together as the target eye diagram associated with the signal transmission component. The preset eye width difference range and the preset eye height difference range can be set according to application requirements and are not limited in this regard in the present embodiment.

[0155] Furthermore, it should be noted that, in the disclosed embodiment, if the difference between the first eye width included in the first eye diagram and the second eye width included in the second eye diagram exceeds a preset eye width difference range, a null value can be obtained as the target eye width. Similarly, if the difference between the first eye height included in the first eye diagram and the second eye height included in the second eye diagram exceeds a preset eye height difference range, a null value can be obtained as the target eye height. Finally, the target eye width and target eye height are collectively used as the target eye diagram associated with the signal transmission component.

[0156] In step S705 , the controller determines whether the target eye diagram meets a preset eye diagram standard.

[0157] The preset eye diagram standard may include a target eye width within a preset eye width range and a target eye height within a preset eye height range in the target eye diagram. The preset eye width range and the preset eye height range can be set based on application requirements and are not limited in this embodiment of the present disclosure.

[0158] When the target eye diagram does not meet the preset eye diagram standard, the process proceeds to step S706 ; when the target eye diagram meets the preset eye diagram standard, the process proceeds to step S707 .

[0159] In step S706 , the controller obtains a first eye diagram test result for indicating that the signal transmission component does not meet the eye diagram test requirement.

[0160] In step S706, the obtained first eye diagram test result may carry an eye diagram test failure indication, which is used to indicate whether the target eye width in the target eye diagram does not meet the preset eye diagram standard or the target eye height does not meet the preset eye diagram characteristic.

[0161] In step S707 , the controller obtains a second eye diagram test result for indicating that the signal transmission component meets the eye diagram test requirement.

[0162] As mentioned above, in the embodiment of the present disclosure, the test device has Figure 4 or Figure 5 In the circuit structure shown, the controller can be used to test the object under test through the signal transceiver module, the second connector, the first connector, and the serializer to obtain a return loss test result. Moreover, the return loss test result may be a first return loss test result or a second return loss test result. The process of obtaining the return loss test result may include:

[0163] (1) Cut off the power supply signal to the object body to put the object body into an inactive state.

[0164] In one example, the controller may send a power-off signal to the programmable power supply, and after receiving the power-off signal, the programmable power supply may cut off the power supply signal to the object body, so that the object body is in an inactive state.

[0165] (2) Sending a test signal to the object body and receiving a target reflection signal returned by the object body to obtain a return loss characterization value related to the signal transmission component based on the target reflection signal.

[0166] In one example, a test signal can be sent to the object body through the signal transceiver module, the second connector, the first connector and the serializer, and a target reflection signal returned by the object body can be received, and based on the target reflection signal, a return loss characterization value related to the signal transmission component can be obtained, so as to obtain a return loss characterization value related to the signal transmission component based on the target reflection signal.

[0167] The test signal may be a radio frequency signal; and the return loss characterization value may be a return loss parameter (also known as an S parameter), specifically an S11 parameter.

[0168] Furthermore, please combine Figure 8 , the test device 810 has the following Figure 4 The circuit structure shown, therefore, for Figure 8 Some of the components are not described here. Figure 8 In the example, the signal transceiver module 8121 may include a signal generating circuit 81211, a signal transceiver 81212, and a signal processing circuit 81213. The signal generating circuit 81211 may be an integrated circuit capable of generating a radio frequency signal as a test signal; the signal transceiver 81212 may be a radio frequency signal transceiver 81212 including radio frequency circuits such as a directional coupler and a receiver; the signal processing circuit 81213 may include a voltage-controlled amplifier 812131 and an analog-to-digital converter 812132 connected to the voltage-controlled amplifier 812131. The voltage-controlled amplifier 812131 may be used to adjust the signal amplitude, specifically to amplify the input electrical signal; and the analog-to-digital converter 812132 may be used to perform analog-to-digital conversion on the input electrical signal.

[0169] exist Figure 8In the embodiment, the signal generating circuit 81211 can be connected to the controller 811 and the signal transceiver 81212 respectively; the signal transceiver 81212 can also be connected to the signal processing circuit 81213, and the signal processing circuit 81213 can be connected to the controller 811. Specifically, the signal transceiver 81212 can be connected to the voltage-controlled amplifier 812131 in the signal processing circuit 81213; the signal processing circuit 81213 can be connected to the controller 811 via the analog-to-digital converter 812132 included therein. The signal transceiver 81212 can also be connected to the DC blocking circuit 8123.

[0170] Based on this, Figure 8 In the test device 810 shown in FIG, “the controller 811 sends a test signal to the object body 822 through the signal generating circuit 81211, the signal transceiver 81212, the second connector 8122, the first connector 8211 and the serializer 8212, and receives the target reflected signal obtained after the signal processing circuit 81213 processes the initial reflected signal returned from the object body 822 to the signal transceiver 81212”, specifically, the controller 811 controls the signal generating circuit 81211 to generate a radio frequency signal as the test signal, and transmits the test signal to the object body 822 through the signal transceiver 81212, the DC blocking circuit 81213, and the DC blocking circuit 81213. 123, the second connector 8122, the first connector 8211, and the serializer 8212 transmit the test signal to the target body 822. After the signal transceiver 81212 receives the initial reflection signal returned by the target body 822, it transmits the initial reflection signal to the voltage-controlled amplifier 812131. The voltage-controlled amplifier 812131 amplifies the initial reflection signal by a preset intensity multiple to obtain an amplified initial reflection signal. The analog-to-digital converter 812132 performs analog-to-digital conversion on the amplified initial reflection signal to obtain a target reflection signal that can be recognized by the controller 811. The preset intensity multiple can be set according to actual application requirements and is not limited in this embodiment of the present disclosure.

[0171] Further, in Figure 8In the test device 810 shown, "the controller 811 obtains the target reference signal after the signal processing circuit 81213 processes the initial reference signal sent by the signal transceiver 81212 to the signal processing circuit 81213", which can specifically be: after the signal transceiver 81212 distributes the initial reference signal (also known as the true signal of the test signal) to the voltage-controlled amplifier 812131 based on the test signal, the initial reference signal is amplified by a preset strength multiple by the voltage-controlled amplifier 812131 to obtain an amplified initial reference signal, and the amplified initial reference signal is converted into a digital form by the analog-to-digital converter 812132 to obtain a target reference signal that can be recognized by the controller 811. The initial reference signal and the test signal can have the same signal phase, and the signal strength of the reference signal can be a preset multiple (for example, 50%) of the signal strength of the test signal; the preset strength multiple can be set according to actual application requirements, and the embodiments of the present disclosure are not limited to this.

[0172] After receiving the target reflection signal and the target reference signal, the controller 811 may obtain a return loss characterization value related to the signal transmission component 821 based on the target reflection signal and the target reference signal. In one example, after receiving the target reflection signal and the target reference signal, the controller 811 may obtain a return loss characterization value related to the signal transmission component 821 based on the target reflection signal and the target reference signal in the following manner:

[0173] S111=Pr1 / Pi1

[0174] Among them, S111 is used to represent the return loss characterization value; Pr1 is used to represent the power of the target reflection signal; Pi1 is used to represent the power of the target reference signal.

[0175] Please combine Figure 9 , some components in the test device 910 have the following features: Figure 5 The circuit structure shown, therefore, for Figure 9 This part of the components is not described here in detail. Figure 9In the embodiment, the signal transceiver module 9122 may include a signal generating circuit 91221, a signal transceiver 91222, and a signal processing circuit 91223. The signal generating circuit 91221 may be an integrated circuit capable of generating a radio frequency signal as a test signal; the signal transceiver 91222 may be a radio frequency signal transceiver 91222 including radio frequency circuits such as a directional coupler and a receiver; the signal processing circuit 91223 may include a voltage-controlled amplifier 912231 and an analog-to-digital converter 912232 connected to the voltage-controlled amplifier 912231. The voltage-controlled amplifier 912231 may be used to adjust the signal amplitude, specifically to amplify the input electrical signal; and the analog-to-digital converter 912232 may be used to perform analog-to-digital conversion on the input electrical signal.

[0176] exist Figure 9 In the embodiment, the signal generating circuit 91221 can be connected to the controller 911 and the signal transceiver 91222 respectively; the signal transceiver 91222 can also be connected to the signal processing circuit 91223, and the signal processing circuit 91223 can be connected to the controller 911. Specifically, the signal transceiver 91222 can be connected to the voltage-controlled amplifier 912231 in the signal processing circuit 91223; the signal processing circuit 91223 can be connected to the controller 911 via the analog-to-digital converter 912232 included therein. The signal transceiver 91222 can also be connected to the gate 9123.

[0177] Based on this, Figure 9In the test device 910 shown in FIG, “the controller 911 sends a test signal to the object body 922 through the signal generating circuit 91221, the signal transceiver 91222, the second connector 9124, the first connector 9211, and the serializer 9212, and receives the target reflected signal obtained after the signal processing circuit 91223 processes the initial reflected signal returned from the object body 922 to the signal transceiver 91222”, specifically, the controller 911 controls the signal generating circuit 91221 to generate a radio frequency signal as the test signal, and transmits the test signal to the object body 922 through the signal transceiver 91222, the gate 9123, the isolator 9123, and the first connector 9211. The direct circuit 9125, the second connector 9124, the first connector 9211, and the serializer 9212 transmit the test signal to the target body 922. After the signal transceiver 91222 receives the initial reflection signal returned by the target body 922, it transmits the initial reflection signal to the voltage-controlled amplifier 912231. The voltage-controlled amplifier 912231 amplifies the initial reflection signal by a preset intensity factor to obtain an amplified initial reflection signal. The analog-to-digital converter 912232 then performs analog-to-digital conversion on the amplified initial reflection signal to obtain a target reflection signal that can be recognized by the controller 911. The preset intensity factor can be set according to actual application requirements and is not limited in this embodiment of the present disclosure.

[0178] Further, in Figure 9 In the test device 910 shown, "the controller 911 obtains the target reference signal after the signal processing circuit 91223 processes the initial reference signal sent by the signal transceiver 91222 to the signal processing circuit 91223", which can specifically be: after the signal transceiver 91222 distributes the initial reference signal (also known as the true signal of the test signal) to the voltage-controlled amplifier 912231 based on the test signal, the initial reference signal is amplified by a preset strength multiple by the voltage-controlled amplifier 912231 to obtain an amplified initial reference signal, and the amplified initial reference signal is converted into a digital form by the analog-to-digital converter 912232 to obtain a target reference signal that can be recognized by the controller 911. The initial reference signal and the test signal can have the same signal phase, and the signal strength of the reference signal can be a preset multiple (for example, 50%) of the signal strength of the test signal; the preset strength multiple can be set according to actual application requirements, and the embodiments of the present disclosure are not limited to this.

[0179] After receiving the target reflection signal and the target reference signal, the controller 911 may obtain a return loss characterization value associated with the signal transmission component 921 based on the target reflection signal and the target reference signal. In one example, after receiving the target reflection signal and the target reference signal, the controller 911 may obtain a return loss characterization value associated with the signal transmission component 921 based on the target reflection signal and the target reference signal in the following manner:

[0180] S112=Pr2 / Pi2

[0181] Among them, S112 is used to characterize the return loss characterization value; Pr2 is used to characterize the power of the target reflection signal; Pi2 is used to characterize the power of the target reference signal.

[0182] (3) When the return loss characterization value does not meet the preset return loss standard, a first return loss test result is obtained, which is used to characterize that the signal transmission component does not meet the return loss test requirement.

[0183] The preset return loss standard may be that the return loss characterization value is within a preset value range. Here, the preset value range can be set according to application requirements, and the embodiments of the present disclosure do not limit this.

[0184] In addition, it should be noted that, in the embodiment of the present disclosure, in process (3), the first return loss test result obtained may carry the return loss characterization value and the preset return loss standard.

[0185] (4) When the return loss characterization value meets the preset return loss standard, a second return loss test result is obtained to characterize that the signal transmission component meets the return loss test requirement.

[0186] Through the above process, in the embodiment of the present disclosure, the return loss test result can be obtained through a simple acquisition process. Moreover, this return loss test result can reflect the impedance reflection characteristics of the communication link where the signal transmission component is located, which is crucial for screening the quality of communication links with high-speed transmission rates. Therefore, it can further improve the correlation between the test results and whether the object under test can operate stably, thereby helping to accurately determine whether the object under test can operate stably in a complex and changeable application environment.

[0187] Next, the test device has the following Figure 9 As an example, the circuit structure shown in Figure 10 , describes the complete process of "the controller controls the selector to connect the signal transceiver module and the second connector, so as to test the object under test through the signal transceiver module, the second connector, the first connector and the serializer to obtain the return loss test result."

[0188] Step S1001: The controller controls the gate to connect the signal transceiver and the second connector.

[0189] In an embodiment of the present disclosure, the controller can control the gate to connect the signal transceiver and the DC isolation circuit to connect the signal transceiver and the second connector. Specifically, the controller can send a second gate control signal to the gate to control the gate to connect the signal transceiver and the DC isolation circuit to connect the signal transceiver and the second connector.

[0190] In step S1002 , the controller cuts off the power supply signal to the object body, so that the object body is in an inactive state.

[0191] In one example, the controller may send a power-off signal to the programmable power supply, and after receiving the power-off signal, the programmable power supply may cut off the power supply signal to the object body, so that the object body is in an inactive state.

[0192] In step S1003, the controller controls the signal generating circuit to generate a radio frequency signal as a test signal, and transmits the test signal to the object body through the signal transceiver, the gate, the DC blocking circuit, the second connector, the first connector, and the serializer. After the signal transceiver receives the initial reflected signal returned by the object body, the initial reflected signal is transmitted to the voltage-controlled amplifier. At the same time, the signal transceiver distributes an initial reference signal to the voltage-controlled amplifier based on the test signal.

[0193] The initial reference signal and the test signal may have the same signal phase, and the signal strength of the reference signal may be a preset multiple (eg, 50%) of the signal strength of the test signal.

[0194] In step S1004, after the voltage-controlled amplifier amplifies the initial reflected signal by a preset intensity multiple to obtain the amplified initial reflected signal, the amplified initial reflected signal is converted into a digital form by an analog-to-digital converter to obtain a target reflected signal that can be identified by the controller. At the same time, after the voltage-controlled amplifier amplifies the initial reference signal by a preset intensity multiple to obtain the amplified initial reference signal, the amplified initial reference signal is converted into a digital form by the analog-to-digital converter to obtain a target reference signal that can be identified by the controller.

[0195] The preset intensity multiple can be set according to actual application requirements, and the embodiments of the present disclosure do not limit this.

[0196] In step S1005 , after receiving the target reflection signal and the target reference signal, the controller obtains a return loss characterization value related to the signal transmission component based on the target reflection signal and the target reference signal.

[0197] In one example, after receiving the target reflection signal and the target reference signal, the controller may obtain a return loss characterization value associated with the signal transmission component based on the target reflection signal and the target reference signal in the following manner:

[0198] S11=Pr / Pi

[0199] Among them, S11 is used to represent the return loss characterization value; Pr is used to represent the power of the target reflection signal; Pi is used to represent the power of the target reference signal.

[0200] In step S1006 , the controller determines whether the return loss characterization value meets a preset return loss standard.

[0201] The preset return loss standard may be that the return loss characterization value is within a preset value range. Here, the preset value range can be set according to application requirements, and the embodiments of the present disclosure do not limit this.

[0202] When the return loss characterization value meets the preset return loss standard, the process proceeds to step S1007; when the return loss characterization value does not meet the preset return loss standard, the process proceeds to step S1008.

[0203] In step S1007 , the controller obtains a first return loss test result for indicating that the signal transmission component does not meet the return loss test requirement.

[0204] In step S1007, the obtained first return loss test result may carry a return loss characterization value and a preset return loss standard.

[0205] In step S1008 , the controller obtains a second return loss test result for indicating that the signal transmission component meets the return loss test requirement.

[0206] Furthermore, in an embodiment of the present disclosure, to enable reporting and / or remote aggregation of test results, as an optional implementation, the controller may also be configured to connect to a cloud platform to transmit the test results to the cloud platform. The cloud platform may be configured to mark the object under test as a poor quality object if the test results indicate that the object under test does not meet the overall test requirements; or to mark the object under test as a qualified object if the test results indicate that the object under test meets the overall test requirements.

[0207] In one example, the test results include reliability test results and signal transmission quality test results, and the signal transmission quality test results include eye diagram test results and return loss test results. Then, the overall test requirements may include:

[0208] The reliability test result is used to indicate that the subject meets the reliability test requirements, that is, the reliability test result is a second reliability test result;

[0209] The eye diagram test result indicates that the signal transmission component meets the eye diagram test requirement, that is, the eye diagram test result is a second eye diagram test result;

[0210] The return loss test result is used to indicate that the signal transmission component meets the return loss test requirements, that is, the return loss attempt result is a second return loss attempt result.

[0211] Therefore, for a certain object under test, when its object body meets the reliability test requirements and its signal transmission components meet the eye diagram test requirements and return loss test requirements, the object under test is considered to meet the overall test requirements and is marked as a qualified object. Otherwise, the object under test is marked as a poor quality object.

[0212] Through the above settings, in the embodiment of the present disclosure, the controller can also be connected to the cloud platform to send the test results to the cloud platform, and the cloud platform can be used to mark the tested object as a poor quality object when the test results indicate that the tested object does not meet the overall test requirements; or mark the tested object as a qualified object when the test results indicate that the tested object meets the overall test requirements. In this way, not only can the quality attributes of the tested object be known in a timely manner, but the test results of multiple tested objects can also be summarized on the cloud platform to improve the application convenience of the test results.

[0213] In an embodiment of the present disclosure, the test device may further include a wireless communication module and a storage device, and the wireless communication module and the storage module are respectively connected to the controller. Based on this, in an embodiment of the present disclosure, the controller can send the test results to the cloud platform via the wireless communication module when the wireless communication module is in an available state; when the wireless communication module is in an unavailable state, the controller can store the test results in the storage module, so that after the wireless communication module switches from the unavailable state to the available state, the controller can send the test results to the cloud platform via the wireless communication module.

[0214] Furthermore, in an embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the cloud platform may also be configured to divide the plurality of qualified objects based on the return loss characterization value corresponding to each qualified object in the plurality of qualified objects, thereby obtaining a first object set and a second object set. The first object set includes at least one high-quality object from the plurality of qualified objects, and the second object set includes at least one low-quality object from the plurality of qualified objects.

[0215] In one example, the cloud platform can sort the multiple qualified objects by quality based on the return loss characterization value corresponding to each qualified object, obtaining a sorting result. A preset proportion of qualified objects that are ranked higher in the sorting result are stored as high-quality objects in a first object set, and the remaining qualified objects, excluding the high-quality objects, are stored as secondary objects in a second object set. In a specific example, the multiple qualified objects can be sorted by quality in ascending order of their corresponding return loss characterization values ​​to obtain a sorting result. The preset proportion can be set based on application requirements, for example, 90%, and is not limited in this regard in the presently disclosed embodiments.

[0216] In another example, the cloud platform may store qualified objects whose corresponding return loss characterization values ​​are less than or equal to a preset characterization value in a first object set, and store qualified objects whose corresponding return loss characterization values ​​are greater than the preset characterization value in a second object set. The preset characterization value can be set based on application requirements and is not limited in this embodiment of the present disclosure.

[0217] (2) Qualified objects whose corresponding return loss characterization values ​​are greater than a preset characterization value among the multiple qualified objects are stored in a second object set.

[0218] Through the above settings, in the embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the cloud platform can also be used to divide the multiple qualified objects based on the return loss characterization value corresponding to each qualified object in the multiple qualified objects, to obtain a first object set (i.e., a high-quality object set) and a second object set (i.e., a secondary object set) to achieve hierarchical classification of qualified objects. In this way, when the first object set is applied, it can be used with a control device with qualified performance (e.g., ADCU) and a qualified wiring harness solution, and when the second object set is applied, it can be used with a control device with better performance and a superior wiring harness solution, thereby improving the availability of the secondary objects and reducing the maintenance cost of the autonomous driving vehicle applied to the secondary objects.

[0219] In an embodiment of the present disclosure, to achieve local aggregation of test results, as an optional implementation, the testing device may further include a test result processing module, and the test result processing module may be connected to the controller. Based on this, in an embodiment of the present disclosure, the controller may also be configured to send the test results to the test result processing module, and the test result processing module may be configured to mark the tested object as a poor quality object if the test results indicate that the tested object does not meet the overall test requirements; or to mark the tested object as a qualified object if the test results indicate that the tested object meets the overall test requirements.

[0220] In one example, the test results include reliability test results and signal transmission quality test results, and the signal transmission quality test results include eye diagram test results and return loss test results. The overall test requirements may include:

[0221] The reliability test result is used to indicate that the subject meets the reliability test requirements, that is, the reliability test result is a second reliability test result;

[0222] The eye diagram test result indicates that the signal transmission component meets the eye diagram test requirement, that is, the eye diagram test result is a second eye diagram test result;

[0223] The return loss test result is used to indicate that the signal transmission component meets the return loss test requirements, that is, the return loss attempt result is a second return loss attempt result.

[0224] Therefore, for a certain object under test, when its object body meets the reliability test requirements and its signal transmission components meet the eye diagram test requirements and return loss test requirements, the object under test is considered to meet the overall test requirements and is marked as a qualified object. Otherwise, the object under test is marked as a poor quality object.

[0225] Through the above settings, in the embodiment of the present disclosure, the controller can also send the test results to the test result processing module, and the test result processing module can mark the tested object as a poor quality object if the test results indicate that the tested object does not meet the overall test requirements; or mark the tested object as a qualified object if the test results indicate that the tested object meets the overall test requirements. In this way, not only can the quality attributes of the tested object be known in a timely manner, but the test results of multiple tested objects can also be summarized on the cloud platform to improve the application convenience of the test results.

[0226] Furthermore, in an embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the test result processing module may further be configured to divide the plurality of qualified objects based on the return loss characterization value corresponding to each qualified object in the plurality of qualified objects, thereby obtaining a first object set and a second object set. The first object set includes at least one high-quality object among the plurality of qualified objects, and the second object set includes at least one low-quality object among the plurality of qualified objects.

[0227] In one example, the test result processing module can sort the multiple qualified objects by quality based on the return loss characterization value corresponding to each qualified object, obtaining a sorting result, and then store a preset proportion of qualified objects that are ranked higher in the sorting result as high-quality objects in a first object set, and store the remaining qualified objects, excluding the high-quality objects, as secondary objects in a second object set. In a specific example, the multiple qualified objects can be sorted by quality in ascending order of their corresponding return loss characterization values ​​to obtain a sorting result; the preset proportion can be set based on application requirements, for example, 90%, and this is not limited in the presently disclosed embodiments.

[0228] In another example, the test result processing module may store qualified objects whose corresponding return loss characterization values ​​are less than or equal to a preset characterization value in a first object set, and store qualified objects whose corresponding return loss characterization values ​​are greater than the preset characterization value in a second object set. The preset characterization value may be set based on application requirements and is not limited in this embodiment of the present disclosure.

[0229] Through the above settings, in the embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the test result processing module can also be used to divide the multiple qualified objects based on the return loss characterization value corresponding to each qualified object in the multiple qualified objects, to obtain a first object set (i.e., a high-quality object set) and a second object set (i.e., a secondary object set) to achieve hierarchical classification of qualified objects. In this way, when the first object set is applied, it can be used with a control device with qualified performance (e.g., ADCU) and a qualified wiring harness solution, and when the second object set is applied, it can be used with a control device with better performance and a superior wiring harness solution, thereby improving the availability of the secondary objects and reducing the maintenance cost of the autonomous driving vehicle applied to the secondary objects.

[0230] Furthermore, the embodiment of the present disclosure also provides a testing device, which may be a testing instrument (eg, a handheld testing instrument). Figure 1 As shown, the test device provided by the embodiment of the present disclosure may include a controller and a test component connected to the controller; the test component is used to connect to the object body of the object under test through the signal transmission component of the object under test;

[0231] The controller is used to test the object under test through the test component to obtain test results for the object under test; wherein the test results include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component.

[0232] In some optional embodiments, the signal transmission component includes a serializer and a first connector, and the serializer is connected to the object body and the first connector respectively;

[0233] The signal transmission quality test results include eye diagram test results and / or return loss test results.

[0234] In some optional embodiments, the test assembly includes a deserializer and a second connector;

[0235] The deserializer is connected to the controller and the second connector respectively;

[0236] The second connector is used to connect with the first connector;

[0237] The controller is configured to perform at least one of the following:

[0238] Testing the object under test through the deserializer, the second connector, the first connector, and the serializer to obtain a reliability test result;

[0239] The object under test is tested through the deserializer, the second connector, the first connector and the serializer to obtain an eye diagram test result.

[0240] In some optional embodiments, the test assembly includes a signal transceiver module and a second connector;

[0241] The signal transceiver module is connected to the controller and the second connector respectively;

[0242] The second connector is used to connect with the first connector;

[0243] The controller is used to test the object under test through the signal transceiver module, the second connector, the first connector and the serializer to obtain a return loss test result.

[0244] In some optional embodiments, the test assembly includes a deserializer, a signal transceiver module, a gate, and a second connector;

[0245] The deserializer is connected to the controller and the selector respectively;

[0246] The signal transceiver module is connected to the controller and the gate respectively;

[0247] The gate is connected to the controller and the second connector respectively;

[0248] The second connector is used to connect with the first connector;

[0249] The controller is configured to perform at least one of the following:

[0250] Controlling the selector to connect the deserializer and the second connector to test the object under test through the deserializer, the second connector, the first connector and the serializer to obtain a reliability test result;

[0251] Controlling the selector to connect the deserializer and the second connector to test the object under test through the deserializer, the second connector, the first connector and the serializer to obtain an eye diagram test result;

[0252] The gate is controlled to connect the signal transceiver module and the second connector, so as to test the object under test through the signal transceiver module, the second connector, the first connector and the serializer to obtain a return loss test result.

[0253] In some optional embodiments, the controller is configured to:

[0254] Get the reliability test times n, where n≥2 and n is an integer;

[0255] Entering the i-th round of reliability testing process for the subject to obtain data analysis results for the reliability test data; where 1≤i≤n, and i is an integer;

[0256] When the data analysis result does not meet the preset reliability standard, a first reliability test result is obtained for indicating that the subject does not meet the reliability test requirement;

[0257] Alternatively, when the data analysis results meet the preset reliability standards, the power signal is cut off to the object body to put the object body into an inactive state, and when i is less than n, the i+1th reliability test process for the object body is entered, or when i is equal to n, a second reliability test result is obtained to characterize that the object body meets the reliability test requirements.

[0258] In some optional embodiments, the controller is configured to:

[0259] providing a power signal to the object body so that the object body is in a starting state;

[0260] Sending a trigger signal to the object body to receive reliability test data returned by the object body;

[0261] Obtain data analysis results for reliability test data.

[0262] In some optional embodiments, the controller is configured to:

[0263] Conduct reliability test configuration on the subject;

[0264] When the reliability test configuration is successful, a trigger signal is sent to the object body to receive the reliability test data returned by the object body according to the configuration result of the reliability test configuration.

[0265] In some optional embodiments, the object body is an image collector;

[0266] The reliability test data includes multiple test images collected within a preset time length;

[0267] The data analysis result includes at least one of image size, frame rate, and frame delay.

[0268] In some optional embodiments, the controller is configured to:

[0269] providing a power signal to the object body so that the object body is in a starting state;

[0270] obtaining a target eye diagram associated with the signal transmission component through the deserializer, the second connector, the first connector, and the serializer;

[0271] When the target eye diagram does not meet the preset eye diagram standard, a first eye diagram test result is obtained for characterizing that the signal transmission component does not meet the eye diagram test requirement;

[0272] Alternatively, when the target eye diagram meets a preset eye diagram standard, a second eye diagram test result is obtained for indicating that the signal transmission component meets the eye diagram test requirement.

[0273] In some optional embodiments, the controller is configured to:

[0274] Read the first eye image from the deserializer;

[0275] reading a second eye diagram from the serializer via the deserializer, the second connector, and the first connector;

[0276] A target eye diagram related to the signal transmission component is obtained based on the first eye diagram and the second eye diagram.

[0277] In some optional embodiments, the controller is configured to:

[0278] When a difference between a first eye width included in the first eye image and a second eye width included in the second eye image is within a preset eye width difference range, taking the smallest eye width of the first eye width and the second eye width as the target eye width;

[0279] When a difference between a first eye height included in the first eye image and a second eye height included in the second eye image is within a preset eye height difference range, taking the minimum eye height of the first eye height and the second eye height as the target eye height;

[0280] The target eye width and target eye height are taken together as the target eye diagram related to the signal transmission components.

[0281] In some optional embodiments, the controller is configured to:

[0282] Cutting off the power supply signal to the object body so as to put the object body into an inactive state;

[0283] Sending a test signal to the object body through the signal transceiver module, the second connector, the first connector, and the serializer, and receiving a target reflected signal returned by the object body, so as to obtain a return loss characterization value related to the signal transmission component based on the target reflected signal;

[0284] When the return loss characterization value does not meet the preset return loss standard, obtaining a first return loss test result for characterizing that the signal transmission component does not meet the return loss test requirement;

[0285] Alternatively, when the return loss characterization value meets the preset return loss standard, a second return loss test result is obtained, which is used to characterize that the signal transmission component meets the return loss test requirement.

[0286] In some optional embodiments, the signal transceiver module includes a signal generating circuit, a signal transceiver, and a signal processing circuit;

[0287] The signal generating circuit is connected to the controller and the signal transceiver respectively;

[0288] The signal transceiver is also connected to the signal processing circuit;

[0289] The signal processing circuit is also connected to the controller;

[0290] The controller is used to:

[0291] Sending a test signal to the target body through the signal generating circuit, the signal transceiver, the second connector, the first connector, and the serializer, and receiving a target reflected signal obtained after the signal processing circuit processes the initial reflected signal returned from the target body to the signal transceiver;

[0292] Acquire a target reference signal obtained after the signal processing circuit processes an initial reference signal sent by the signal transceiver to the signal processing circuit; wherein the initial reference signal and the test signal have the same signal phase, and the signal strength of the reference signal is a preset multiple of the signal strength of the test signal;

[0293] Based on the target reflected signal and the target reference signal, a return loss characterization value related to the signal transmission component is obtained.

[0294] In some optional embodiments, the controller is further configured to connect to a cloud platform to send the test results to the cloud platform;

[0295] The cloud platform is used to mark the object under test as a poor quality object when the test results indicate that the object under test does not meet the overall test requirements; or to mark the object under test as a qualified object when the test results indicate that the object under test meets the overall test requirements.

[0296] In some optional implementations, the test device provided by the embodiment of the present disclosure further includes a test result processing module, and the test result processing module is connected to the controller;

[0297] The controller is further configured to send the test results to the test result processing module;

[0298] The test result processing module is used to mark the object under test as a poor quality object if the test result indicates that the object under test does not meet the overall test requirements; or to mark the object under test as a qualified object if the test result indicates that the object under test meets the overall test requirements.

[0299] In some optional implementations, the test result includes a signal transmission quality test result, and the signal transmission quality test result includes a return loss test result;

[0300] The test result processing module is also used to divide the multiple qualified objects based on the return loss characterization value corresponding to each qualified object in the multiple qualified objects to obtain a first object set and a second object set; wherein the first object set includes at least one high-quality object among the multiple qualified objects; and the second object set includes at least one secondary object among the multiple qualified objects.

[0301] In some optional implementations, the test result processing module is configured to:

[0302] sorting the plurality of qualified objects based on a return loss characterization value corresponding to each of the plurality of qualified objects to obtain a sorting result;

[0303] A preset proportion of qualified objects at the top of the sorting results are regarded as high-quality objects and stored in the first object set;

[0304] The remaining objects except the high-quality object among the plurality of qualified objects are taken as secondary objects and stored in the second object set.

[0305] In the embodiments of the present disclosure, the specific descriptions and examples of the above components can be found in the relevant descriptions in the test method embodiments, which will not be repeated here.

[0306] Please combine Figure 11 The present disclosure also provides a test system 1110, which may include the aforementioned test device 1111 (specifically, Figure 1 ), and a cloud platform 1112 connected to the controller 11111 in the test device 1111. Based on this, in the embodiment of the present disclosure, the controller 11111 can be used to send the test results to the cloud platform 1112, and the cloud platform 1112 can be used to mark the tested object 1120 as a poor quality object when the test results indicate that the tested object 1120 does not meet the overall test requirements; or mark the tested object 1120 as a qualified object when the test results indicate that the tested object 1120 meets the overall test requirements.

[0307] In one example, the test results include reliability test results and signal transmission quality test results, and the signal transmission quality test results include eye diagram test results and return loss test results. Then, the overall test requirements may include:

[0308] The reliability test result is used to indicate that the object subject 1122 meets the reliability test requirements, that is, the reliability test result is a second reliability test result;

[0309] The eye diagram test result indicates that the signal transmission component 1121 meets the eye diagram test requirement, that is, the eye diagram test result is a second eye diagram test result;

[0310] The return loss test result is used to indicate that the signal transmission component 1121 meets the return loss test requirement, that is, the return loss attempt result is a second return loss attempt result.

[0311] Therefore, for a certain object under test 1120, when its object body 1122 meets the reliability test requirements and its signal transmission component 1121 meets the eye diagram test requirements and the return loss test requirements, the object under test 1120 is considered to meet the overall test requirements and is marked as a qualified object; otherwise, the object under test 1120 is marked as a poor quality object.

[0312] Through the above configuration, in the embodiment of the present disclosure, the controller 11111 can also be connected to the cloud platform 1112 to send the test results to the cloud platform 1112, and the cloud platform 1112 can be used to mark the tested object 1120 as a poor quality object when the test results indicate that the tested object 1120 does not meet the overall test requirements; or mark the tested object 1120 as a qualified object when the test results indicate that the tested object 1120 meets the overall test requirements. In this way, not only can the quality attributes of the tested object 1120 be known in a timely manner, but the test results of multiple tested objects 1120 can also be summarized on the cloud platform 1112 to improve the application convenience of the test results.

[0313] Please combine Figure 12 In the embodiment of the present disclosure, in the test system 1210, the test device 1211 has Figure 9 The circuit structure shown, therefore, for Figure 12 Some of the components are not described here. Figure 12 In the embodiment, the test device 1211 may further include a wireless communication module 12115 and a storage module 12116, and the wireless communication module 12115 and the storage module 12116 are respectively connected to the controller. Based on this, in the embodiment of the present disclosure, the controller can send the test results to the cloud platform 1212 via the wireless communication module 12115 when the wireless communication module 12115 is in an available state; when the wireless communication module 12115 is in an unavailable state, the controller can store the test results in the storage module 12116, so that after the wireless communication module 12115 switches from the unavailable state to the available state, the controller can send the test results to the cloud platform 1212 via the wireless communication module 12115.

[0314] Furthermore, in an embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the cloud platform 1212 may also be configured to divide the plurality of qualified objects based on the return loss characterization value corresponding to each qualified object in the plurality of qualified objects, thereby obtaining a first object set and a second object set. The first object set includes at least one high-quality object from the plurality of qualified objects, and the second object set includes at least one low-quality object from the plurality of qualified objects.

[0315] In one example, cloud platform 1212 can sort the multiple qualified objects by quality based on the return loss characterization value corresponding to each qualified object, obtain a sorting result, and store a preset proportion of qualified objects that are ranked higher in the sorting result as high-quality objects in a first object set, and store the remaining qualified objects, excluding the high-quality objects, as secondary objects in a second object set. In a specific example, the multiple qualified objects can be sorted by quality in ascending order of their corresponding return loss characterization values ​​to obtain a sorting result; the preset proportion can be set according to application requirements, for example, 90%, and this is not limited in the present embodiment.

[0316] In another example, the cloud platform 1212 may store qualified objects whose corresponding return loss characterization values ​​are less than or equal to a preset characterization value in a first object set, and store qualified objects whose corresponding return loss characterization values ​​are greater than the preset characterization value in a second object set. The preset characterization value may be set based on application requirements and is not limited in this embodiment of the present disclosure.

[0317] Through the above settings, in the embodiment of the present disclosure, when the test results include signal transmission quality test results, and the signal transmission quality test results include return loss test results, the cloud platform 1212 can also be used to divide the multiple qualified objects based on the return loss characterization value corresponding to each qualified object in the multiple qualified objects, to obtain a first object set (i.e., a high-quality object set) and a second object set (i.e., a secondary object set) to achieve hierarchical classification of qualified objects. In this way, when the first object set is applied, it can be used with a control device with qualified performance (e.g., ADCU) and a qualified wiring harness solution, and when the second object set is applied, it can be used with a control device with better performance and a superior wiring harness solution, thereby improving the availability of the secondary objects and reducing the maintenance cost of the autonomous driving vehicle applied to the secondary objects.

[0318] Below, we take the test system as an example. Figure 13 As an example, the system composition shown in the figure is combined with Figure 13 , describes the management process for test results based on the test system.

[0319] Step S1301: The controller sends the test results to the cloud platform.

[0320] In the embodiment of the present disclosure, the controller can send the test results to the cloud platform through the wireless communication module when the wireless communication module is in an available state; when the wireless communication module is in an unavailable state, the test results can be stored in the storage module, so that after the wireless communication module switches from an unavailable state to an available state, the test results can be sent to the cloud platform through the wireless communication module.

[0321] In step S1302 , the cloud platform marks the object under test as a poor quality object if the test result indicates that the object under test does not meet the overall test requirements; or marks the object under test as a qualified object if the test result indicates that the object under test meets the overall test requirements.

[0322] In one example, the test results include reliability test results and signal transmission quality test results, and the signal transmission quality test results include eye diagram test results and return loss test results. Then, the overall test requirements may include:

[0323] The reliability test result is used to indicate that the subject meets the reliability test requirements, that is, the reliability test result is a second reliability test result;

[0324] The eye diagram test result indicates that the signal transmission component meets the eye diagram test requirement, that is, the eye diagram test result is a second eye diagram test result;

[0325] The return loss test result is used to indicate that the signal transmission component meets the return loss test requirements, that is, the return loss attempt result is a second return loss attempt result.

[0326] Therefore, for a certain object under test, when its object body meets the reliability test requirements and its signal transmission components meet the eye diagram test requirements and return loss test requirements, the object under test is considered to meet the overall test requirements and is marked as a qualified object. Otherwise, the object under test is marked as a poor quality object.

[0327] In step S1303 , the cloud platform performs quality ranking on the multiple qualified objects based on the return loss characterization value corresponding to each of the multiple qualified objects to obtain a ranking result.

[0328] In a specific example, the plurality of qualified objects may be sorted by quality according to the corresponding return loss characterization values ​​from small to large to obtain a sorting result.

[0329] In step S1304, the cloud platform stores a preset proportion of qualified objects that are ranked at the top of the ranking results as high-quality objects in the first object set.

[0330] The preset characterization value may be set according to application requirements, and the embodiment of the present disclosure does not limit this.

[0331] In step S1305 , the cloud platform stores the remaining objects among the plurality of qualified objects except the high-quality objects as secondary objects in the second object set.

[0332] In the embodiment of the present disclosure, when applying the first set of objects, it can be used with a control device with qualified performance (for example, ADCU) and a qualified wiring harness solution. When applying the second set of objects, it can be used with a control device with better performance and / or a superior wiring harness solution, thereby improving the availability of the secondary objects and reducing the maintenance cost of the autonomous driving vehicle applied to the secondary objects.

[0333] Please combine Figure 14 The embodiments of the present disclosure further provide an autonomous driving system 1401 and a vehicle 1400 (e.g., an autonomous driving vehicle) including the autonomous driving system 1401. The autonomous driving system 1401 may include the aforementioned test device 14011. The controller in the test device 14011 may function as an ADCU.

[0334] In the embodiment of the present disclosure, the specific description and examples of the above steps can be found in the relevant description of the test device embodiment, which will not be repeated here.

[0335] In addition, it should be noted that the acquisition, storage and application of user personal information involved in the technical solutions provided by the embodiments of the present disclosure comply with the provisions of relevant laws and regulations and do not violate public order and good morals.

[0336] Furthermore, an embodiment of the present disclosure also provides an electronic device.

[0337] Figure 15 A schematic block diagram of an example electronic device 1500 that can be used to implement embodiments of the present disclosure is shown. Electronic device 1500 is intended to represent various forms of digital computers, such as vehicle-mounted computing devices, laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic device 1500 can also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are provided as examples only and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0338] like Figure 15As shown, the electronic device 1500 includes a computing unit 1501, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 1502 or a computer program loaded from a storage unit 1508 into a random access memory (RAM) 1503. Various programs and data required for the operation of the electronic device 1500 can also be stored in the RAM 1503. The computing unit 1501, the ROM 1502, and the RAM 1503 are connected to each other via a bus 1504. An input / output (I / O) interface 1505 is also connected to the bus 1504.

[0339] Multiple components in the electronic device 1500 are connected to the I / O port 1505, including an input unit 1506, such as a keyboard, a mouse, etc.; an output unit 1507, such as various types of renderers, speakers, etc.; a storage unit 1508, such as a magnetic disk, an optical disk, etc.; and a communication unit 1509, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 1509 allows the electronic device 1500 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0340] The computing unit 1501 can be a variety of general-purpose and / or specialized processing components with processing and computing capabilities. Some examples of the computing unit 1501 include, but are not limited to, a CPU, a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various computing units that run machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The computing unit 1501 performs the various methods and processes described above, such as at least some of the steps in the testing method. For example, in some embodiments, at least some of the steps in the testing method can be implemented as a computer software program that is tangibly contained in a machine-readable medium, such as the storage unit 1508. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 1500 via the ROM 1502 and / or the communication unit 1509. When the computer program is loaded into the RAM 1503 and executed by the computing unit 1501, at least some of the steps in the testing method described above can be performed. Alternatively, in other embodiments, the computing unit 1501 may be configured to perform at least part of the steps in the testing method in any other appropriate manner (for example, by means of firmware).

[0341] Various embodiments of the systems and techniques described herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), system on chips (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system that includes at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0342] The program code for implementing the method of the present disclosure can be written in any combination of one or more programming languages. These program codes can be provided to a processor or controller of a general-purpose computer, a special-purpose computer, or other programmable data optimization device so that the program code, when executed by the processor or controller, implements the functions / operations specified in the flow chart and / or block diagram. The program code can be executed entirely on the machine, partially on the machine, as a stand-alone software package, partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0343] In the context of the present disclosure, a machine-readable medium can be a tangible medium that can contain or store a program for use by or in conjunction with an instruction execution system, device or equipment. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or equipment, or any suitable combination of the foregoing. A more specific example of a machine-readable storage medium can include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a RAM, a ROM, an erasable programmable read-only memory (EPROM) or flash memory, an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0344] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a rendering device (e.g., a cathode ray tube (CRT) renderer or a liquid crystal display (LCD) renderer) for rendering information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user can provide input to the computer. Other types of devices are also used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0345] The systems and techniques described herein can be implemented in a computing system that includes back-end components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes front-end components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such back-end components, middleware components, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), and the Internet.

[0346] A computer system may include a client and a server. The client and server are generally remote from each other and typically interact via a communication network. The client-server relationship arises through computer programs running on the respective computers and establishing a client-server relationship. The server may be a cloud server, a server in a distributed system, or a server integrated with a blockchain.

[0347] An embodiment of the present disclosure further provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to enable a computer to execute at least part of the steps in the testing method.

[0348] An embodiment of the present disclosure further provides a computer program product, including a computer program, which implements at least part of the steps in the testing method when executed by a processor.

[0349] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this disclosure can be executed in parallel, sequentially or in a different order, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved, and this document does not limit this. In addition, in this disclosure, relational terms such as "first", "second", "third", etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. In addition, "multiple" in this disclosure can be understood as at least two.

[0350] The foregoing specific embodiments do not constitute a limitation on the scope of protection of this disclosure. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the principles of this disclosure are intended to be included within the scope of protection of this disclosure.

Claims

1. A testing method, applied to a testing device, wherein the testing device comprises a controller and a testing component; the testing component is configured to connect to a main body of a tested object via a signal transmission component of the tested object; The test method includes: The controller tests the object under test through the test component to obtain a test result for the object under test; wherein the test result includes a reliability test result for the object body and / or a signal transmission quality test result for the signal transmission component.

2. The testing method according to claim 1, wherein: The signal transmission quality test result includes an eye diagram test result and / or a return loss test result.

3. The testing method according to claim 1 or 2, wherein: The controller tests the object under test through the test component to obtain a test result for the object under test, including: Get the reliability test times n, where n≥2 and n is an integer; Entering the i-th round of reliability testing process for the subject to obtain data analysis results for the reliability test data; wherein 1≤i≤n, and i is an integer; When the data analysis result does not meet the preset reliability standard, obtaining a first reliability test result for indicating that the subject does not meet the reliability test requirement; Alternatively, when the data analysis result meets the preset reliability standard, the power supply signal to the object body is cut off to put the object body into an inactive state, and when i<n, the i+1th reliability test process for the object body is entered, or when i=n, a second reliability test result is obtained to characterize that the object body meets the reliability test requirements.

4. The method according to claim 3, wherein: Obtaining the data analysis results for the reliability test data includes: providing a power signal to the object body to put the object body into a startup state; Sending a trigger signal to the object body to receive reliability test data returned by the object body; Obtaining data analysis results for the reliability test data.

5. The testing method according to claim 4, wherein: The sending of a trigger signal to the object subject to receive reliability test data returned by the object subject includes: Performing reliability test configuration on the object body; In the case that the reliability test configuration is successful, the trigger signal is sent to the object body to receive the reliability test data returned by the object body according to the configuration result of the reliability test configuration.

6. The method according to claim 3, wherein: The object body is an image collector; The reliability test data includes a plurality of test images collected within a preset time length; The data analysis result includes at least one of image size, frame rate, and frame delay.

7. The testing method according to claim 2, wherein: The controller tests the object under test through the test component to obtain a test result for the object under test, including: providing a power signal to the object body to put the object body into a startup state; Obtaining a target eye diagram associated with the signal transmission component; When the target eye diagram does not meet the preset eye diagram standard, obtaining a first eye diagram test result for characterizing that the signal transmission component does not meet the eye diagram test requirement; Alternatively, when the target eye diagram meets a preset eye diagram standard, a second eye diagram test result is obtained to indicate that the signal transmission component meets the eye diagram test requirement.

8. The testing method according to claim 7, wherein: Obtaining a target eye diagram related to the signal transmission component includes: reading a first eye pattern from the test component; reading a second eye pattern from the signal transmission component; The target eye diagram related to the signal transmission component is obtained based on the first eye diagram and the second eye diagram.

9. The testing method according to claim 8, wherein: The obtaining, based on the first eye diagram and the second eye diagram, the target eye diagram related to the signal transmission component includes: When a difference between a first eye width included in the first eye diagram and a second eye width included in the second eye diagram is within a preset eye width difference range, taking a minimum eye width between the first eye width and the second eye width as a target eye width; When a difference between a first eye height included in the first eye diagram and a second eye height included in the second eye diagram is within a preset eye height difference range, taking the minimum eye height between the first eye height and the second eye height as the target eye height; The target eye width and the target eye height are used together as the target eye diagram associated with the signal transmission component.

10. The testing method according to claim 1 or 2, wherein: The controller tests the object under test through the test component to obtain a test result for the object under test, including: Cutting off the power supply signal to the object body so that the object body is in an inactive state; sending a test signal to the object body and receiving a target reflection signal returned by the object body, so as to obtain a return loss characterization value related to the signal transmission component based on the target reflection signal; When the return loss characterization value does not meet the preset return loss standard, obtaining a first return loss test result for characterizing that the signal transmission component does not meet the return loss test requirement; Alternatively, when the return loss characterization value meets a preset return loss standard, a second return loss test result is obtained for characterizing that the signal transmission component meets the return loss test requirement.

11. The testing method according to claim 10, wherein: The test component includes a signal transceiver module, and the signal transceiver module includes a signal generating circuit, a signal transceiver, and a signal processing circuit; sending a test signal to the object body and receiving a target reflection signal returned by the object body to obtain a return loss characterization value related to the signal transmission component based on the target reflection signal, including: sending the test signal to the object body, and receiving the target reflection signal obtained after the signal processing circuit processes the initial reflection signal returned from the object body to the signal transceiver; Obtaining a target reference signal obtained after the signal processing circuit processes an initial reference signal sent by the signal transceiver to the signal processing circuit; wherein the initial reference signal and the test signal have the same signal phase, and the signal strength of the reference signal is a preset multiple of the signal strength of the test signal; The return loss characterization value associated with the signal transmission component is obtained based on the target reflection signal and the target reference signal.

12. The testing method according to claim 1, wherein: The controller is further configured to connect to a cloud platform; and the testing method further comprises: The controller sends the test result to the cloud platform; wherein, the cloud platform is used to mark the object under test as a poor quality object when the test result indicates that the object under test does not meet the overall test requirements; or mark the object under test as a qualified object when the test result indicates that the object under test meets the overall test requirements.

13. The testing method according to claim 2, wherein: The testing device further includes a test result processing module, and the test result processing module is connected to the controller; The test method further comprises: The controller sends the test result to the test result processing module; The test result processing module marks the object under test as a poor quality object when the test result indicates that the object under test does not meet the overall test requirements; or marks the object under test as a qualified object when the test result indicates that the object under test meets the overall test requirements.

14. The testing method according to claim 13, wherein: The test result includes the signal transmission quality test result, and the signal transmission quality test result includes the return loss test result; The test method further comprises: The test result processing module divides the multiple qualified objects based on the return loss characterization value corresponding to each qualified object to obtain a first object set and a second object set; wherein the first object set includes at least one high-quality object among the multiple qualified objects; and the second object set includes at least one secondary object among the multiple qualified objects.

15. The testing method according to claim 14, wherein: The method of dividing the plurality of qualified objects based on the return loss characterization value corresponding to each qualified object to obtain a first object set and a second object set includes: sorting the plurality of qualified objects based on a return loss characterization value corresponding to each qualified object to obtain a sorting result; A preset proportion of qualified objects at the top of the ranking results are taken as the high-quality objects, and stored in the first object set; The remaining objects in the plurality of qualified objects except the high-quality object are taken as the secondary objects and stored in the second object set.

16. A testing device comprising a controller and a testing component connected to the controller; the testing component is configured to connect to a main body of a tested object via a signal transmission component of the tested object; The controller is used to test the object under test through the test component to obtain a test result for the object under test; wherein, The test results include reliability test results for the object body and / or signal transmission quality test results for the signal transmission component.

17. The device according to claim 16, wherein The signal transmission component includes a serializer and a first connector, and the serializer is connected to the object body and the first connector respectively; The signal transmission quality test result includes an eye diagram test result and / or a return loss test result.

18. The device according to claim 17, wherein The test assembly includes a deserializer, a signal transceiver module, a gate and a second connector; The deserializer is connected to the controller and the gate respectively; The signal transceiver module is connected to the controller and the gate respectively; The gate is connected to the controller and the second connector respectively; The second connector is used to connect with the first connector; The controller is configured to perform at least one of the following: controlling the selector to connect the deserializer and the second connector, so as to test the object under test through the deserializer, the second connector, the first connector and the serializer, and obtain the reliability test result; controlling the selector to connect the deserializer and the second connector, so as to test the object under test through the deserializer, the second connector, the first connector and the serializer, and obtain the eye diagram test result; The gate is controlled to connect the signal transceiver module and the second connector, so as to test the object under test through the signal transceiver module, the second connector, the first connector and the serializer to obtain the return loss test result.

19. A testing system comprising the testing device according to claim 16, and a cloud platform connected to the controller in the testing device; The controller is used to send the test result to the cloud platform; the cloud platform is used to mark the object under test as a poor quality object if the test result indicates that the object under test does not meet the overall test requirements; or, if the test result indicates that the object under test meets the overall test requirements, mark the object under test as a qualified object.

20. The test system according to claim 19, wherein: The test result includes the signal transmission quality test result, and the signal transmission quality test result includes a return loss test result; The cloud platform is further configured to divide the plurality of qualified objects based on a return loss characterization value corresponding to each of the plurality of qualified objects to obtain a first object set and a second object set; wherein the first object set includes at least one high-quality object among the plurality of qualified objects; and the second object set includes at least one secondary object among the plurality of qualified objects.

21. The test system according to claim 20, wherein: The cloud platform is used to: sorting the plurality of qualified objects based on a return loss characterization value corresponding to each qualified object to obtain a sorting result; A preset proportion of qualified objects at the top of the ranking results are taken as the high-quality objects, and stored in the first object set; The remaining objects in the plurality of qualified objects except the high-quality object are taken as the secondary objects and stored in the second object set.

22. An automatic driving system comprising the testing device according to any one of claims 16 to 18.

23. A vehicle comprising the automatic driving system according to claim 22.

24. An electronic device comprising: at least one processor; a memory communicatively coupled to the at least one processor; The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform at least part of the steps in any one of claims 1 to 15.

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