Distribution network environment parameter acquisition device and acquisition analysis method

Abstract

The invention relates to the technical field of data acquisition, and provides a distribution network environment parameter acquisition device and an acquisition analysis method, and the device comprises a device main body which is internally divided into a working area and an acquisition area through a shielding isolation layer; the peripheral circuit is arranged in the working area, and an internal interface and an external interface of the peripheral circuit are respectively connected with a chip pin of the tested chip and a port of tested equipment; a data acquisition unit arranged in the acquisition area, wherein the data acquisition unit acquires electromagnetic interference and electric field characteristics of ports of the tested chip and the tested equipment through a port measurement unit, a pin measurement unit, a first electric field probe and a second electric field probe; according to the method, a time-frequency dual signal is obtained based on an optimized transformation function and a time-domain signal of an electromagnetic environment parameter of a distribution network scene, and the time-frequency dual signal and climate data are analyzed to obtain an extreme environment parameter; theoretical basis and guidance are provided for revealing the influence mechanism of the comprehensive environment on the electrical equipment and the chip in the distribution network scene, and normal operation and optimal design of the electrical equipment and the chip are facilitated.

Description

Technical Field

[0001] The present invention relates to the technical field of data acquisition, and in particular to a distribution network environment parameter acquisition device and an acquisition and analysis method. Background Art

[0002] In power distribution network scenarios, power equipment and its internal chips face the influence of a variety of complex and harsh environments during use. Different environmental factors have different impact mechanisms on the equipment. At the same time, various environmental factors do not exist in isolation, but often act together on the equipment and its internal chips. Due to the coupling of environmental factors, the multi-physical field effects of the electromagnetic environment, temperature, and humidity environments will have a serious impact on the operation and use of the equipment and its internal chips, and will generate a large number of new and unknown failure modes. However, in the environmental reference collection process of most power distribution network scenarios, only a single factor such as temperature or humidity is generally collected and analyzed. The lack of real-time monitoring and analysis of electromagnetic environment-related parameters is not conducive to the normal operation and optimized design of power equipment and chips. Summary of the Invention

[0003] In order to solve the above technical problems, the present invention provides a distribution network environment parameter collection device and collection and analysis method.

[0004] The technical solution adopted in the present invention is as follows:

[0005] A distribution network environment parameter acquisition device includes a device main body, the interior of which is divided into a working area and a collection area by a shielding isolation layer; a peripheral circuit arranged in the working area, the internal interface and external interface of the peripheral circuit being electrically connected to the chip pins of the chip under test and the port of the device under test respectively; a data acquisition unit arranged in the collection area, the data acquisition unit being electrically connected to the external interface and the chip pins through a port measurement unit and a pin measurement unit respectively, and being used to collect electromagnetic interference conducted by the device port and electromagnetic interference conducted by the chip; a first electric field probe arranged in the working area and a second electric field probe outside the device main body, the first electric field probe and the second electric field probe being electrically connected to the data acquisition unit respectively, and being used to collect external electric field characteristics and internal electric field characteristics of the device main body.

[0006] According to one embodiment of the present invention, the port measurement unit is a high-voltage probe, and the pin measurement unit is a high-frequency high-voltage probe.

[0007] According to one embodiment of the present invention, a fixing fixture is further provided in the working area, and the fixing fixture is used to fix the chip under test.

[0008] According to one embodiment of the present invention, the device further comprises a temperature and humidity sensor disposed outside the device body, for collecting distribution network ambient temperature data and ambient humidity data.

[0009] According to an embodiment of the present invention, a power supply filter is further provided in the acquisition area, and an external power supply supplies power to the data acquisition unit through the power supply filter.

[0010] A distribution network environment parameter collection and analysis method based on the distribution network environment parameter collection device described above, the method comprising the following steps: S1, collecting time domain signals and climate data of electromagnetic environment parameters in a distribution network scenario, the electromagnetic environment parameters including external electric field characteristics, internal electric field characteristics, device port conducted electromagnetic interference, and chip conducted electromagnetic interference of the device body; S2, obtaining a time-frequency dual signal based on an optimized transformation function and the time domain signal; S3, analyzing the climate data and the time-frequency dual signal to obtain extreme environment parameters in the distribution network scenario.

[0011] According to one embodiment of the present invention, step S2 specifically includes: transforming the time domain signal by optimizing the transformation function to obtain a transformed time domain signal; solving the instantaneous frequency corresponding to the time domain signal and the intensity in the time-frequency dual domain based on the transformed time domain signal to obtain a time-frequency dual signal.

[0012] According to one embodiment of the present invention, the calculation formula of the optimized transformation function is:

[0013]

[0014] Where x(t) represents the time domain signal, t represents time, e is the exponential function with natural logarithm as the base, and W x is the transformed time domain signal, a is the scale factor, b is the time factor, and c is the network distribution scenario compensation factor. The network distribution scenario compensation factor is adjusted according to the electromagnetic field environment of the device under test, and the value range of c is [0,1].

[0015] According to one embodiment of the present invention, the calculation formula for the instantaneous frequency corresponding to the time domain signal and the intensity in the time-frequency dual domain is:

[0016]

[0017] Where W f represents the instantaneous frequency, i represents the imaginary unit, T represents the intensity, f represents the frequency, Δf represents the frequency change, a k is the discrete scale factor, Δa k is the change in discrete scale factor.

[0018] Beneficial effects of the present invention:

[0019] The present invention designs a data acquisition unit to collect electromagnetic interference and electric field characteristics of the tested chip and the tested device port in the collection area through corresponding measurement units or electric field probes, that is, electromagnetic environment parameters in the distribution network scenario. It can perform real-time monitoring of the electromagnetic environment parameters in the distribution network scenario, provide equipment support for the analysis of the impact of environmental factors on power equipment and chips in the distribution network scenario, and is beneficial to the normal operation and optimized design of power equipment and chips; and also divides the interior of the device body into a working area and a collection area through a shielding isolation layer, and arranges the peripheral circuit connected to the tested chip and the tested chip in the working area, and arranges the data acquisition unit in the collection area, thereby reducing the mutual electromagnetic interference between the tested chip and the data acquisition unit and improving the accuracy of data acquisition.

[0020] Based on optimizing the transformation function and the time domain signal, the time domain signal is obtained to obtain the time-frequency dual signal. Compared with the traditional time-frequency dual domain method, it can better control the error in the conversion process, realize the accurate conversion of the time domain signal, and the time-frequency resolution is also higher; by analyzing the climate data and the time-frequency dual signal, the extreme environmental parameters in the distribution network scenario are obtained, which can provide a theoretical basis and guidance for revealing the impact mechanism of the comprehensive environment on electrical equipment and chips in the distribution network scenario, and is conducive to the normal operation and optimized design of power equipment and chips. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 Schematic diagram of a block diagram of a distribution network environment parameter acquisition device according to an embodiment of the present invention;

[0022] Figure 2 and Figure 3 The port voltage and electric field measurement results of the distribution network environment parameter acquisition device when the device under test is switched on and off in the distribution network scenario;

[0023] Figure 4 Flowchart of a method for collecting and analyzing distribution network environment parameters according to an embodiment of the present invention;

[0024] Figure 5 and Figure 6 The time-frequency double domain analysis results of the port voltage of the device under test based on the traditional time-frequency double domain method and the method of the present invention under switching operation. DETAILED DESCRIPTION

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0026] like Figure 1As shown, the distribution network environment parameter acquisition device of the embodiment of the present invention includes: a device body 1, the interior of which is divided into a working area and a collection area by a shielding isolation layer 2; a peripheral circuit 3 arranged in the working area, the internal interface and the external interface of the peripheral circuit 3 are electrically connected to the chip pins of the tested chip 4 and the port of the tested device 5 respectively; a data acquisition unit 6 arranged in the collection area, the data acquisition unit 6 is electrically connected to the external interface and the chip pins through the port measurement unit 7 and the pin measurement unit 8 respectively, and is used to collect the electromagnetic interference conducted by the device port and the electromagnetic interference conducted by the chip; a first electric field probe 9 arranged in the working area and a second electric field probe 10 outside the device body 1, the first electric field probe 9 and the second electric field probe 10 are electrically connected to the data acquisition unit 6 respectively, and are used to collect the external electric field characteristics and the internal electric field characteristics of the device body 1. Among them, the shielding isolation layer 2 may include an insulating plate between the working area and the collection area; the signal transmission lines between each component may be provided with an anti-interference shielding layer and an insulating layer, etc.; the peripheral circuit 3 may include multiple external interfaces, and be respectively connected to multiple ports of the device under test 5, and the data acquisition unit 6 may perform synchronous data acquisition on multiple ports of the device under test 5 through multiple port measurement units 8, etc., and this embodiment does not limit this.

[0027] The distribution network environment parameter acquisition device of the embodiment of the present invention is designed to collect electromagnetic interference and electric field characteristics of the chip under test and the port of the device under test in the collection area through corresponding measurement units or electric field probes, that is, electromagnetic environment parameters in the distribution network scenario. It can perform real-time monitoring of electromagnetic environment parameters in the distribution network scenario, provide equipment support for analyzing the impact of environmental factors on power equipment and chips in the distribution network scenario, and is beneficial to the normal operation and optimized design of power equipment and chips; and the interior of the device body 1 is divided into a working area and a collection area by a shielding isolation layer 2, and the peripheral circuit 3 connected to the chip under test and the chip under test are arranged in the working area, and the data acquisition unit 6 is arranged in the collection area, thereby reducing the mutual electromagnetic interference between the chip under test 4 and the data acquisition unit 6, and improving the accuracy of data acquisition.

[0028] In one embodiment of the present invention, the port measurement unit 7 can be a high-voltage probe, and the pin measurement unit 8 can be a high-frequency, high-voltage probe. It is understood that high-voltage probes offer greater safety and common-mode noise suppression capabilities. However, the measurement space for chip pins is typically small, and the frequency at chip pin test points is high, resulting in weak signals. Therefore, the use of high-frequency, high-voltage probes with high bandwidth and low loading effects can effectively improve measurement accuracy and ensure data acquisition accuracy.

[0029] In one embodiment of the present invention, the distribution network environment parameter acquisition device may further include a fixing fixture 11 arranged in the working area, and the fixing fixture 11 is used to fix the chip under test 4 to prevent the posture of the chip under test 4 from changing and affecting the accuracy of data acquisition.

[0030] In one embodiment of the present invention, the distribution network environment parameter acquisition device may further include a temperature and humidity sensor 12 disposed outside the device body 1 for acquiring distribution network environment temperature data and environment humidity data.

[0031] In one embodiment of the present invention, the distribution network environment parameter acquisition device may further include a power filter 13 disposed in the acquisition area. An external power source, such as 220V AC power, may power the data acquisition unit 6 through the power filter 13 .

[0032] In a specific embodiment of the present invention, the measurement frequency of the high-voltage probe can be DC to 100 MHz, the maximum input peak-to-peak voltage can be 16 kV, the measurement frequency of the high-frequency voltage probe can be DC to 200 MHz, the maximum input peak-to-peak voltage can be 600 V, the measurement frequency of the electric field probe can be DC to 200 MHz, the maximum measurement field strength can be 12 kV / m, the temperature measurement range of the temperature and humidity sensor 12 can be -40 to 80 ° C, and the humidity measurement range can be 0-100% RH, so as to meet the measurement requirements of the distribution network scenario.

[0033] In a specific embodiment of the present invention, the configuration process of the distribution network environment parameter acquisition device in the distribution network scenario is as follows: first, the external 220V AC power is connected to the power filter 13, and then the voltage and current in the peripheral circuit 3 are respectively connected to the voltage and current ports corresponding to the device under test on the distribution network side. Finally, the data acquisition unit 6 is used to collect the electromagnetic interference U1 conducted by the device port, the electromagnetic interference U2 conducted by the chip, the external electric field characteristics E1 of the device body 1, that is, the external electric field characteristics of the device under test, the internal electric field characteristics E2 of the device body 1, that is, the electric field characteristics of the signal transmission area between the device under test and the chip under test, the temperature T and the humidity TU. Among them, the collected U1, U2, E1, and E2 are time domain signals, and the T and HU collection time intervals can be set according to actual needs, for example, once an hour.

[0034] After the configuration is completed, the configured distribution network environment parameter acquisition device can also be tested. The test results of the distribution network environment parameter acquisition device of this embodiment are as follows: Figure 2 and Figure 3 As shown, according to Figure 2 Voltage time domain fluctuations and amplitudes at different frequencies, Figure 3 The time domain fluctuations of the electric field strength and the amplitude at different frequencies showed that the interference frequency band in this test environment was concentrated between 10MHz and 30MHz.

[0035] In addition, based on the distribution network environment parameter collection device described above, the present invention also proposes a distribution network environment parameter collection and analysis method.

[0036] like Figure 4As shown, the distribution network environment parameter collection and analysis method according to an embodiment of the present invention includes the following steps:

[0037] S1. Collect time domain signals and climate data of electromagnetic environment parameters in the distribution network scenario. The electromagnetic environment parameters include the external electric field characteristics of the device body, the internal electric field characteristics, the electromagnetic interference conducted by the device port, and the electromagnetic interference conducted by the chip. The time domain signals of the electromagnetic environment parameters are collected by the distribution network environment parameter collection device described above. The electric field characteristics may include the power frequency electric field, the power frequency magnetic field, the steady-state electromagnetic field, the transient electric field and its main frequency, the transient magnetic field and its main frequency, etc.; the electromagnetic interference may include the interference voltage and its main frequency, etc.; the climate data may include the ambient temperature data and the ambient humidity data, etc., which are not limited in this embodiment.

[0038] S2, a time-frequency dual signal is obtained based on the optimized transformation function and the time domain signal.

[0039] Specifically, step S2 may include the following steps S21 and S22:

[0040] S21, transform the time domain signal x(t) by optimizing the transformation function to obtain the transformed time domain signal W x .

[0041] In one embodiment of the present invention, the calculation formula of the optimized transformation function is:

[0042]

[0043] Where x(t) represents the time domain signal, t represents time, e is the exponential function with natural logarithm as the base, and W x is the transformed time domain signal at time t, a is the scale factor, b is the time factor, and c is the compensation factor for the distribution network scenario. The compensation factor for the distribution network scenario is adjusted according to the electromagnetic field environment of the device under test. The value range of c is [0,1].

[0044] It should be noted that the calculation formula of the traditional transformation function is:

[0045]

[0046] This embodiment introduces a distribution network scenario compensation factor c to comprehensively consider the distribution network environment. Compared with the traditional transformation function, it can effectively reduce the conversion error. This is described below with reference to a specific embodiment.

[0047] In a specific embodiment of the present invention, when the ambient electromagnetic field is less than 10 V / m, c=0 is set; when the ambient electromagnetic field is greater than 10 V / m and less than 30 V / m, c=0.5 is set; when the ambient electromagnetic field is greater than 30 V / m, c=1 is set; and the electromagnetic field time domain signal is converted based on the optimized transformation function and the above parameters, and the traditional transformation function is also used to convert the time domain signal. The specific results are shown in Table 1 below.

[0048] Table 1

[0049]

[0050] As can be seen from Table 1, the peak error after the optimized transformation function is smaller than that after the traditional transformation function is transformed, and the time domain signal can be converted more accurately.

[0051] S22, solving the instantaneous frequency W corresponding to the time domain signal based on the transformed time domain signal f and the intensity T in the time-frequency double domain, we get the time-frequency double signal (t, W f , T).

[0052] In one embodiment of the present invention, the calculation formula for the instantaneous frequency corresponding to the time domain signal and the intensity in the time-frequency dual domain is:

[0053]

[0054] Where W f represents the instantaneous frequency, i represents the imaginary unit, T represents the intensity, f represents the frequency, Δf represents the frequency change, a k is the discrete scale factor, Δa k is the change in discrete scale factor.

[0055] Figure 5 and Figure 6 The figures show the time-frequency double-domain analysis results of the port voltage of the device under test under switching operation based on the traditional time-frequency double-domain method and the method of the present invention in a specific embodiment of the present invention. In the analysis results of the traditional time-frequency double-domain method, each waveform is relatively wide, which indicates that the time-frequency resolution is low. In the time-frequency double-domain analysis results obtained by the method of the present invention, the waveforms are relatively narrow and the time-frequency resolution is higher.

[0056] S3 analyzes climate data and time-frequency dual signals to obtain extreme environmental parameters in distribution network scenarios, thereby providing a theoretical basis and guidance for revealing the impact mechanism of the comprehensive environment on electrical equipment and chips in distribution network scenarios, optimizing the reliability design of electrical equipment and chips, and proposing comprehensive environmental reliability test methods.

[0057] Specifically, if there are extreme values ​​in the climate data or time-frequency dual signal at a certain moment, the electromagnetic environment parameters and climate data at that moment can be recorded as a set of extreme environment parameters, thereby obtaining multiple sets of extreme environment parameters.

[0058] In a specific embodiment of the present invention, a set of extreme environmental parameters obtained using the method of the present invention are as follows: the maximum ground power frequency electric field can reach 15kV / m, the maximum ground power frequency magnetic field can reach 1760A / m; the ground 0.5MHz steady-state electromagnetic field can reach up to 81.2dBμV / m, the ground space transient electric field can reach up to 11.4kV / m, the main frequency can reach above 100MHz, the transient magnetic field can reach up to 1000A / m, and the main frequency can reach up to 100kHz; the maximum power line interference voltage can reach 2.5kV, the main frequency can reach up to 30MHz; the maximum signal line interference voltage can reach 2098V, and the main frequency can reach up to 30MHz. The temperature range is -2°C to 75°C, and the humidity range is 10% RH to 95% RH. These parameters represent the climate and electromagnetic environment parameter thresholds that power equipment must withstand in distribution network scenarios, providing a reference for subsequent environmental testing and electromagnetic compatibility testing of power chips and power equipment in distribution network scenarios.

[0059] The distribution network environmental parameter acquisition and analysis method of the embodiment of the present invention adopts the distribution network environmental parameter acquisition device described above, so it also has the same beneficial effects and is not repeated here; the distribution network environmental parameter acquisition and analysis method is based on optimizing the transformation function and the time domain signal to obtain the time domain signal to obtain the time-frequency dual signal. Compared with the traditional time-frequency dual domain method, it can better control the error in the conversion process, realize the accurate conversion of the time domain signal, and the time-frequency resolution is also higher; the distribution network environmental parameter acquisition and analysis method also analyzes the climate data and the time-frequency dual signal to obtain the extreme environmental parameters in the distribution network scenario, which can provide a theoretical basis and guidance for revealing the impact mechanism of the comprehensive environment on electrical equipment and chips in the distribution network scenario, and is conducive to the normal operation and optimized design of power equipment and chips.

[0060] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. "Multiple" means two or more, unless otherwise specifically defined.

[0061] In the present invention, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediary. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0062] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0063] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, segment or portion of code comprising one or more executable instructions for implementing the steps of a specific logical function or process, and the scope of the preferred embodiments of the present invention includes alternative implementations in which functions may be performed out of the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention pertain.

[0064] The logic and / or steps represented in the flowcharts or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing the logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (e.g., a computer-based system, a system including a processor, or other system that can fetch and execute instructions from an instruction execution system, apparatus, or device). For purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include the following: an electrical connection having one or more wires (electronic devices), a portable computer disk cartridge (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disc read-only memory (CDROM). Furthermore, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing it in another suitable manner if necessary, and then storing it in a computer memory.

[0065] It should be understood that various parts of the present invention can be implemented using hardware, software, firmware, or a combination thereof. In the above-described embodiments, multiple steps or methods can be implemented using software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented using hardware, as in another embodiment, any one of the following technologies known in the art or a combination thereof can be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application-specific integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0066] Those skilled in the art will understand that all or part of the steps in the method of the above embodiment can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiment.

[0067] In addition, the functional units in the various embodiments of the present invention may be integrated into a single processing module, or each unit may exist physically separately, or two or more units may be integrated into a single module. The aforementioned integrated modules may be implemented in the form of hardware or in the form of software functional modules. If the integrated modules are implemented in the form of software functional modules and sold or used as independent products, they may also be stored in a computer-readable storage medium.

[0068] Although the embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and are not to be construed as limitations on the present invention. A person skilled in the art may change, modify, replace and modify the above embodiments within the scope of the present invention.

Claims

1. A distribution network environment parameter collection device, characterized in that: include: The main body of the device is divided into a working area and a collection area by a shielding isolation layer; A peripheral circuit is provided in the working area, wherein the internal interface and the external interface of the peripheral circuit are electrically connected to the chip pins of the chip under test and the port of the device under test respectively; A data acquisition unit is provided in the acquisition area, the data acquisition unit being electrically connected to the external interface and the chip pins through a port measurement unit and a pin measurement unit, respectively, for acquiring electromagnetic interference conducted by the device port and electromagnetic interference conducted by the chip; A first electric field probe is arranged in the working area, and a second electric field probe is arranged outside the device body. The first electric field probe and the second electric field probe are electrically connected to the data acquisition unit respectively, and are used to collect the external electric field characteristics and internal electric field characteristics of the device body.

2. The distribution network environment parameter acquisition device according to claim 1, characterized in that: The port measurement unit is a high-voltage probe, and the pin measurement unit is a high-frequency high-voltage probe.

3. The distribution network environment parameter acquisition device according to claim 1, characterized in that: It also includes a fixing fixture arranged in the working area, and the fixing fixture is used to fix the chip under test.

4. The distribution network environment parameter acquisition device according to claim 1, characterized in that: It also includes a temperature and humidity sensor arranged on the outside of the device body, which is used to collect distribution network environment temperature data and environment humidity data.

5. The distribution network environment parameter acquisition device according to claim 1, characterized in that: It also includes a power filter arranged in the acquisition area, and an external power supply supplies power to the data acquisition unit through the power filter.

6. A distribution network environment parameter collection and analysis method based on the distribution network environment parameter collection device according to any one of claims 1 to 5, characterized in that: The method comprises the following steps: S1, collecting time domain signals and climate data of electromagnetic environment parameters in a distribution network scenario, wherein the electromagnetic environment parameters include external electric field characteristics, internal electric field characteristics, device port conducted electromagnetic interference, and chip conducted electromagnetic interference; S2, obtaining a time-frequency dual signal based on the optimized transformation function and the time domain signal; S3, analyzing the climate data and the time-frequency dual signal to obtain extreme environmental parameters in a distribution network scenario.

7. The method for collecting and analyzing distribution network environment parameters according to claim 6, characterized in that: Step S2 specifically includes: Transforming the time domain signal by optimizing the transformation function to obtain a transformed time domain signal; Based on the transformed time domain signal, the instantaneous frequency corresponding to the time domain signal and the intensity in the time-frequency dual domain are solved to obtain the time-frequency dual signal.

8. The distribution network environment parameter collection and analysis method according to claim 7, characterized in that: The calculation formula of the optimized transformation function is: Where x(t) represents the time domain signal, t represents time, e is the exponential function with natural logarithm as the base, and W x is the transformed time domain signal, a is the scale factor, b is the time factor, and c is the network distribution scenario compensation factor. The network distribution scenario compensation factor is adjusted according to the electromagnetic field environment of the device under test, and the value range of c is [0,1].

9. The distribution network environment parameter collection and analysis method according to claim 8, characterized in that: The calculation formula for the instantaneous frequency corresponding to the time domain signal and the intensity in the time-frequency dual domain is: Where W f represents the instantaneous frequency, i represents the imaginary unit, T represents the intensity, f represents the frequency, Δf represents the frequency change, a k is the discrete scale factor, Δa k is the change in discrete scale factor.

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