Calibration method, equipment to be calibrated, calibration device, calibration system and storage medium

Abstract

The embodiment of the invention provides a calibration method, to-be-calibrated equipment, a calibration device, a calibration system and a storage medium, and is applied to the technical field of electronic measurement. The calibration method comprises the following steps: acquiring a first target to-be-calibrated parameter set; in the process of carrying out primary calibration on to-be-calibrated parameters in the first target to-be-calibrated parameter set, obtaining a first calibrated parameter set and a first to-be-calibrated parameter set based on a detected abnormal event; wherein the first calibrated parameter set comprises a parameter set obtained by calibrating to-be-calibrated parameters, which are not influenced by the abnormal event, in the first target to-be-calibrated parameter set, and the first to-be-calibrated parameter set comprises a parameter set, which is influenced by the abnormal event, in the first target to-be-calibrated parameter set. According to the embodiment, the calibration efficiency of the measuring instrument in the calibration process can be improved.

Description

Technical Field

[0001] The present application relates to the field of electronic measurement technology, and in particular to a calibration method, a device to be calibrated, a calibration apparatus, a calibration system, and a storage medium. Background Art

[0002] During the use of measuring instruments, changes in external conditions such as the measurement environment in which the measuring instrument is located, or internal factors such as aging of measuring instrument components may introduce uncertainty in the measurement results. Therefore, measuring instruments need to be calibrated regularly or according to the requirements of the usage scenario to reduce measurement errors and improve measurement precision and accuracy.

[0003] However, in the current related technologies, there is a problem of low calibration efficiency in the calibration process of measuring instruments. Summary of the Invention

[0004] The present application discloses a calibration method, a device to be calibrated, a calibration apparatus, a calibration system and a storage medium, which are used to solve the problem of low calibration efficiency during the calibration process of a measuring instrument.

[0005] In a first aspect, the present application provides a calibration method, comprising: obtaining a first target set of parameters to be calibrated. During an initial calibration of parameters to be calibrated in the first target set of parameters to be calibrated, based on a detected abnormal event, a first calibrated parameter set and a first set of parameters to be calibrated are obtained. The first calibrated parameter set includes a parameter set obtained by calibrating parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event, and the first set of parameters to be calibrated includes a parameter set in the first target set of parameters to be calibrated that are affected by the abnormal event.

[0006] In an embodiment of the present application, during the initial calibration process, based on the detected abnormal event, the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event are calibrated, and some available calibration parameters (the first calibrated parameter set) can be generated when the abnormality occurs, avoiding the problem of global failure due to a single point abnormality, thereby improving calibration efficiency.

[0007] In one possible embodiment, during the initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, based on the detected abnormal event, a first calibrated parameter set and a first parameter set to be calibrated are obtained, including: sequentially calibrating each item to be calibrated in the current item set to be calibrated; wherein, when an abnormal event is detected during the calibration process, performing isolation processing; the isolation processing includes: determining one or more affected items to be calibrated affected by the abnormal event, and updating the current item set to be calibrated based on the one or more affected items to be calibrated; the current item set to be calibrated is initially the first target parameter set to be calibrated. A set of items to be calibrated that are to be calibrated; each affected item to be calibrated includes an item to be calibrated that depends on an affected calibrated parameter, and / or an item to be calibrated that will be affected by an affected uncalibrated parameter; each item to be calibrated in the updated set of items to be calibrated is calibrated, and when an abnormal event is detected during the calibration of each item to be calibrated in the updated set of items to be calibrated, isolation processing and calibration of each item to be calibrated in the updated set of items to be calibrated are iteratively performed until calibration of all items to be calibrated in the updated set of items to be calibrated is completed, so as to obtain a first calibrated parameter set and a first set of parameters to be calibrated.

[0008] In an embodiment of the present application, dynamic fault tolerance and adaptive calibration of the calibration process under abnormal conditions are achieved during the parameter calibration process through an iterative anomaly isolation and dynamic update mechanism. Specifically, the method performs calibration on each item to be calibrated in the current set of items to be calibrated in turn. During the calibration process, once an abnormal event is detected, isolation processing is immediately performed: one or more items to be calibrated that are affected by the abnormal event are accurately determined, and the current set of items to be calibrated is updated accordingly. Each affected item to be calibrated includes both items that depend on the affected calibrated parameters and items that will be affected by the affected uncalibrated parameters. After the update is completed, the calibration, anomaly detection and isolation processing procedures are repeated for the new set of items to be calibrated until the calibration of all items to be calibrated is completed, and finally a partially useful or valid first set of calibrated parameters is obtained. This processing method can accurately lock the items to be calibrated that are affected by the abnormal event, effectively avoid the interference of the abnormality on other normal items to be calibrated, and thus improve the accuracy and reliability of the calibration.

[0009] In one possible implementation, updating the current set of items to be calibrated based on one or more affected items to be calibrated includes: removing at least one of the one or more affected items to be calibrated from the current set of items to be calibrated; accordingly, calibrating each item to be calibrated in the updated set of items to be calibrated includes: calibrating the remaining affected items to be calibrated in the one or more affected items to be calibrated that have not been removed from the current set of items to be calibrated using historical / default parameters.

[0010] In an embodiment of the present application, by specifying a specific method for updating the current set of items to be calibrated based on the affected items to be calibrated, when an abnormal event is detected, at least one of the one or more affected items to be calibrated is removed from the current set of items to be calibrated. This avoids the difficulty of obtaining accurate calibration results if the items to be calibrated are not calibrated correctly. Repeated calibration attempts may also waste significant time and resources, thereby reducing overall calibration efficiency. By promptly removing these affected items, ineffective calibration operations can be effectively avoided, allowing calibration work to focus on items with a greater likelihood of obtaining accurate results. Meanwhile, for the remaining affected items to be calibrated that have not been removed from the current set of items to be calibrated, historical / default parameters are used for calibration. This utilizes existing reliable parameter resources to ensure that the calibration process is not interrupted by abnormal events, maintaining the consistency of the calibration work. Furthermore, with these relatively reliable parameters, these items to be calibrated can be given relatively reasonable parameter values ​​whenever possible, making the entire parameter calibration process more flexible and adaptable in the face of abnormal situations.

[0011] In a possible implementation manner, the affected calibrated parameter is configured with identification information, where the identification information is used to indicate the affected calibrated parameter.

[0012] In an embodiment of the present application, a parameter identification management mechanism is used to configure dedicated identification information for calibrated parameters affected by anomalies to enable management of invalid parameters (affected calibrated parameters), such as rapid positioning, to provide precise guidance for subsequent maintenance and improve parameter maintenance efficiency.

[0013] In one possible implementation, during an initial calibration of parameters to be calibrated in a first target parameter set to be calibrated, after obtaining a first calibrated parameter set and a first parameter set to be calibrated based on a detected abnormal event, the method further includes: obtaining a second target parameter set to be calibrated, the second target parameter set to be calibrated including at least one parameter in the first parameter set to be calibrated, and calibrating the parameters to be calibrated in the second target parameter set to be calibrated to obtain a second calibrated parameter set.

[0014] In the embodiment of the present application, after completing the initial calibration and isolating the abnormal parameters, incremental calibration is further performed on the affected parameters to be calibrated (the first set of parameters to be calibrated) to achieve full calibration and self-repair capabilities of the calibration system. This technical solution has the following significant benefits: On the one hand, by constructing a second target set of parameters to be calibrated that includes at least one parameter in the first set of parameters to be calibrated, accurate recovery of abnormal parameters is achieved, significantly improving efficiency compared to full parameter recalibration. On the other hand, by splitting the abnormal parameter calibration into initial calibration and subsequent incremental calibration, both the timely output of normal parameters and the final calibration of abnormal parameters are guaranteed, thereby improving system availability indicators.

[0015] In one possible embodiment, obtaining a first target set of parameters to be calibrated includes: receiving a calibration instruction triggered by a user interaction module of a device to be calibrated, the calibration instruction being used to determine the first target set of parameters to be calibrated and a calibration strategy for the parameters to be calibrated in the first target set of parameters to be calibrated; obtaining a first calibrated parameter set and a first set of parameters to be calibrated based on a detected abnormal event during an initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, including: in response to the calibration instruction, obtaining the first calibrated parameter set and the first set of parameters to be calibrated according to the calibration strategy and the detected abnormal event during an initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

[0016] In this embodiment, the integration of a user interaction module and automated calibration allows users to directly specify the set of parameters to be calibrated and the calibration strategy, enabling the system to adapt to the personalized needs of different application scenarios. Furthermore, the interaction between user instructions and automated calibration preserves the flexibility of manual control while leveraging the efficiency advantages of automated calibration.

[0017] In one possible embodiment, after receiving a calibration instruction triggered by a user interaction module of the device to be calibrated, the method further includes: during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, after an abnormal event is detected, outputting indication information based on the calibration strategy and the detected abnormal event; the indication information is used to indicate the end of calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

[0018] In an embodiment of the present application, through the abnormal response mechanism and calibration strategy, when an abnormal event is detected during the initial calibration process, indication information representing the termination of calibration is output in real time, and the abnormal calibration process is actively terminated through a clear interrupt signal, thereby avoiding invalid calibration operations from continuously occupying computing resources and reducing resource waste.

[0019] In a second aspect, the present application provides a device to be calibrated, comprising: a first acquisition module for acquiring a first target set of parameters to be calibrated; a first calibration module for obtaining, during an initial calibration of parameters to be calibrated in the first target set of parameters to be calibrated, a first calibrated parameter set and a first set of parameters to be calibrated based on a detected abnormal event. The first calibrated parameter set comprises a set of parameters obtained by calibrating parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event, and the first set of parameters to be calibrated comprises a set of parameters in the first target set of parameters to be calibrated that are affected by the abnormal event.

[0020] In a third aspect, the present application provides a device to be calibrated, comprising: a memory and a processor. The memory is configured to store a computer program. The processor is configured to call the computer program in the memory and execute the calibration method according to any embodiment of the first aspect.

[0021] In a fourth aspect, the present application provides a calibration device, comprising: a user interaction module configured to obtain a first target set of parameters to be calibrated; and a decision execution module configured to obtain, during an initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, a first calibrated parameter set and a first set of parameters to be calibrated based on a detected abnormal event. The first calibrated parameter set comprises a parameter set obtained by calibrating the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event, and the first set of parameters to be calibrated comprises a parameter set in the first target set of parameters to be calibrated that are affected by the abnormal event.

[0022] In a fifth aspect, the present application provides a device to be calibrated, comprising: a device body and a calibration device as in any embodiment of the fourth aspect, wherein the calibration device is communicatively connected to the device body.

[0023] In a sixth aspect, the present application provides a calibration system, comprising: a signal source and a device to be calibrated as in any embodiment of the fifth aspect, the signal source being communicatively connected to the device to be calibrated, and providing a calibration signal to the device body.

[0024] In a seventh aspect, the present application provides a calibration system comprising: a signal source and a device to be calibrated, the signal source being communicatively connected to the device to be calibrated, and providing a calibration signal to the device to be calibrated. The calibration device, such as the calibration device in any embodiment of the fourth aspect, is communicatively connected to both the signal source and the device to be calibrated.

[0025] In an eighth aspect, the present application provides a computer-readable storage medium, the computer-readable storage medium comprising instructions. When the instructions are executed on a processor, the processor is caused to execute any calibration method in the first aspect.

[0026] Regarding the technical principles and beneficial effects of the second, third, fourth, fifth, sixth, seventh and eighth aspects, please refer to the relevant description of the first aspect above and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0028] Figure 1 is a schematic structural diagram of a calibration system according to some embodiments of the present application; Figure 2 A schematic diagram of a calibration device according to some embodiments of the present application is shown. Figure 1 ; Figure 3 A schematic diagram of a calibration device according to some embodiments of the present application is shown. Figure 2 ; Figure 4 A schematic diagram of the structure of a device to be calibrated according to some embodiments of the present application Figure 1 ; Figure 5 A schematic diagram of a calibration method according to some embodiments of the present application Figure 1 ; Figure 6 A schematic diagram of a calibration method according to some embodiments of the present application Figure 2 ; Figure 7 A schematic diagram of a calibration method according to some embodiments of the present application Figure 3 ; Figure 8 A schematic diagram of a calibration method according to some embodiments of the present application Figure 4 ; Figure 9 A schematic diagram of a calibration method according to some embodiments of the present application Figure 5 ; Figure 10 A schematic diagram of the structure of a device to be calibrated according to some embodiments of the present application Figure 2 .

[0029] Description of reference numerals: 10- Calibration system; 101-Signal source; 102-Device to be calibrated; 103-Calibration device; 1021-device body; 1022-first acquisition module; 1023-first calibration module; 1031-abnormal decision module; 1032-decision execution module; 1033-user interaction module; 10311-calibration process adjustment unit; 10312-abnormal parameter management unit; 10321-calibration process execution unit; 10322-calibration status update unit; 10331-Exception handling strategy configuration unit; 10332-Calibration parameter application unit. DETAILED DESCRIPTION

[0030] It should be noted that the terms "first", "second", etc. involved in the embodiments of the present application are only used to distinguish features of the same type and cannot be understood as indicating relative importance, quantity, order, etc.

[0031] The terms "exemplary" or "for example" in the embodiments of this application are used to indicate examples, illustrations, or descriptions. Any embodiment or design described in this application as "exemplary" or "for example" should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0032] The terms "coupling", "coupling" and "connection" involved in the embodiments of this application should be understood in a broad sense. For example, they may refer to a physical direct connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0033] Measuring instruments or devices, such as but not limited to oscilloscopes, spectrum analyzers, power meters, and network analyzers, are core equipment in the field of electronic measurement and are widely used in communications systems, radar systems, aerospace equipment, medical electronics, industrial automation systems, and other scenarios. These instruments typically work in conjunction with external devices such as signal generators, power meters, sensors, and data acquisition cards to accurately measure and analyze key parameters (such as voltage, frequency, phase, and waveform distortion) of signals (including but not limited to electrical and optical signals) to ensure that the performance of the system under test meets design requirements.

[0034] For example, in communications systems, spectrum analyzers can be used to analyze the spectral characteristics of wireless communication signals, while oscilloscopes can be used to observe the timing integrity of high-speed digital signals. For aerospace equipment, network analyzers are used to calibrate the impedance matching characteristics of antennas and RF links.

[0035] The measurement accuracy of measuring instruments directly impacts the performance evaluation results of the system under test. However, over long-term use, factors such as ambient temperature and humidity fluctuations and component aging can introduce uncertainty and bias into measurement results. For example, a single calibration item can correspond to multiple parameters. For example, temperature-sensitive calibration items can correspond to different parameters under different temperature conditions to accommodate varying ambient temperature conditions. To eliminate this bias, instruments must be calibrated regularly or as needed to reduce measurement errors and ensure the equipment's measurement precision and accuracy.

[0036] Measuring instruments contain many parameters, including calibrable parameters (which can include both calibrated and uncalibrated parameters) and non-calibrable parameters. For example, calibrable parameters include those that may drift over time or due to environmental changes, such as gain, offset, and frequency response. Non-calibrable parameters, on the other hand, may involve inherent hardware properties of the device or user-configurable options, such as input impedance, screen brightness, and language settings.

[0037] Calibration of calibrable parameters includes full calibration, partial calibration and incremental calibration.

[0038] Full calibration can mean a systematic and global calibration of all calibrable parameters of the device to be calibrated. Based on the dependencies between all calibrable parameters, all self-calibration processes are completed in sequence according to a pre-defined execution order, and finally all relevant calibration parameters are updated.

[0039] Partial calibration may refer to calibration of some of the calibrable parameters, and supports on-demand calibration.

[0040] Incremental calibration is similar to partial calibration and can also refer to calibrating only a subset of calibrable parameters. Incremental calibration can involve identifying all failed parameters, determining a set of items to be calibrated for these failed parameters, and then performing calibration.

[0041] Parameter calibration is accomplished by executing calibration items, which include the configuration of operating parameters, calibration algorithms, and data collection involved in calibrating the corresponding parameter to be calibrated. Each parameter has a corresponding calibration item.

[0042] The calibration of measuring instruments generally includes two methods: factory calibration and self-calibration (also known as user calibration): Factory calibration: A professional laboratory performs a full calibration using high-precision standard equipment (such as a reference signal source and a precision impedance analyzer). This calibration covers all calibrable parameters, such as gain, offset, linearity, and noise figure, and provides a calibration certificate. However, this method has the disadvantages of a long lead time, high cost (due to equipment downtime and shipping), and inability to respond to environmental changes in real time.

[0043] Self-calibration or user-calibration: The user performs calibration on-site using the instrument's built-in functions or an external calibration kit (such as a GPS synchronization signal source or standard load). Compared to factory calibration, self-calibration offers the advantages of convenience and real-time performance, reducing time and shipping costs and facilitating adaptation to changes in the device's operating environment.

[0044] However, when self-calibration is performed in a user's on-site environment, it often faces various uncertain external factors, such as the stability of the calibration environment, the standardization of operations, the reliability of the calibration network, and the accuracy of the calibration source. These issues significantly increase the possibility of anomalies during the self-calibration process. For high-precision precision measurement equipment, there are usually many parameters that need to be calibrated, and the calibration process is complex and time-consuming. Due to the correlation between the calibration steps and the calibration parameters, when one or more of the calibrated parameters are abnormal, the accuracy and usability of other parameters may be affected. In this case, it is usually necessary to recalibrate all parameters to ensure the correctness of the overall calibration results.

[0045] In scenarios where the device to be calibrated has a large number of parameters and a high probability of single-point anomalies, this full recalibration approach significantly increases the impact of anomalies on the entire self-calibration process, reducing the success rate of self-calibration and increasing the difficulty of resolving single-point anomalies. Furthermore, the validity of some parameters may change over time and in different environments. Due to the mutual coupling between parameters, full self-calibration is often required, further increasing the difficulty of resolving invalid parameters.

[0046] Due to the large number of parameters and the coupled nature of calibration parameters, a single anomaly during the calibration process often renders the entire set of calibration parameters inapplicable, or even renders the correctness and validity of the calibration parameters uncertain. Limited by the limited networking conditions at user sites and various uncertainties, current high-precision measuring instruments often struggle to implement reliable and effective self-calibration. This results in low self-calibration success rates, difficulty in handling anomalies, and poor usability. Therefore, a technical solution is urgently needed that can efficiently handle anomalies and reduce the need for full recalibration, thereby improving the success rate and practicality of self-calibration.

[0047] Example 1: In view of this, in order to solve one or more of the above technical problems, this embodiment provides a calibration system, such as Figure 1Figure 1 shows a calibration system 10 according to some embodiments of the present application. The calibration system 10 includes a signal source 101, a device to be calibrated 102, and a calibration apparatus 103. Signal source 101 is communicatively coupled to device to be calibrated 102. Signal source 101 is configured to provide a calibration signal to device to be calibrated 102, such as an electrical signal with a specific waveform (e.g., a sine wave, square wave, pulse), frequency, amplitude, and phase, to simulate an input signal of the system under test. Calibration apparatus 103 is communicatively coupled to both signal source 101 and device to be calibrated 102.

[0048] like Figure 2 As shown, the calibration device 103 includes: an abnormality decision module 1031 and a decision execution module 1032.

[0049] The abnormality decision module 1031 includes a calibration process adjustment unit 10311 and an abnormality parameter management unit 10312. The calibration process adjustment unit 10311 is used to identify the impact range of a single-point abnormality and isolate the calibrated parameters generated during the self-calibration process that are affected by the abnormality. The abnormality parameter management unit 10312 is used to adaptively adjust the self-calibration process based on the calibrated parameters after the abnormality is isolated, in combination with a user-configurable abnormality handling strategy.

[0050] The decision execution module 1032 includes a calibration process execution unit 10321 and a calibration status update unit 10322. Under the control of the abnormality decision module 1031, the decision execution module 1032 executes the self-calibration process through the calibration process execution unit 10321, detects and updates the self-calibration status in real time through the calibration status update unit 10322, and reports abnormalities.

[0051] The coordinated operation between the above modules can realize adaptive control of self-calibration anomalies. For example, the coordinated operation between the anomaly decision module 1031 and the decision execution module 1032 can realize adaptive control and calibration of self-calibration anomalies.

[0052] like Figure 3 As shown, the calibration device 103 may further include: a user interaction module 1033 .

[0053] The user interaction module 1033 is used to support user interaction and may include an exception handling policy configuration unit 10331 and a calibration parameter application unit 10332. The exception handling policy configuration unit 10331 supports user configuration of the calibration policy. The calibration parameter application unit 10332 allows the user to select the application of calibrated parameters, such as applying all or part of the parameters to the device 102 to be calibrated.

[0054] By integrating user interaction module 1033 directly into calibration device 103, the calibration process is streamlined and human-computer interaction is optimized. Furthermore, by optimizing the human-computer interaction interface, the entire calibration process is made more intuitive, efficient, and reliable, providing a more convenient and user-friendly solution for measurement equipment requiring high-frequency and timely calibration operations.

[0055] In some possible implementations, the calibration device 103 may be integrated into the device to be calibrated 102. Figure 4 As shown, the device to be calibrated 102 includes a device body 1021 and Figure 2 The calibration device 103 is shown. The calibration device 103 is in communication with the device body 1021. The device to be calibrated 102 may further include a user interaction module 1033 ( Figure 4 not shown).

[0056] In some examples, the device to be calibrated 102 may further include a device body 1021 and a Figure 3 The calibration device 103 is shown.

[0057] Based on Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The calibration system shown below will be combined with Figure 5 、 Figure 6 、 Figure 7 、 Figure 8 and Figure 9 , the specific calibration process is explained. Figure 5 、 Figure 6 、 Figure 7 、 Figure 8 and Figure 9 Each of them is a flow chart of a calibration method according to some embodiments of the present application.

[0058] like Figure 5 The calibration method shown specifically includes steps S11 and S12: S11. Obtain a first target parameter set to be calibrated.

[0059] In some embodiments, it may be Figure 1 、 Figure 2 or Figure 3 The calibration device 103 shown or Figure 4 The device to be calibrated 102 shown obtains a first target parameter set to be calibrated. The parameters to be calibrated in the first target parameter set to be calibrated may be parameters selected by the user through the user interaction module 1033 for calibration.

[0060] In some examples, Figure 4Taking the example of the device to be calibrated 102 obtaining the first target parameter set to be calibrated, the user interaction module 1033 receives a calibration instruction triggered by the user, which is used to indicate the first target parameter set to be calibrated and the calibration strategy for the parameters to be calibrated in the first target parameter set to be calibrated.

[0061] The calibration strategy refers to optional measures for specific situations during the self-calibration process. It can include definitions of various processing methods under different calibration states. For example, when the first target set of parameters to be calibrated includes parameters to be calibrated U and V, whether to continue calibrating parameter V after calibration of parameter U fails. When parameter W exists in the set of parameters to be calibrated before parameter U, whether to calibrate parameter W or directly use its default parameters or historical calibration parameters.

[0062] For example, the user can select parameters whose indicators do not meet the preset conditions (such as correctness, accuracy or timeliness requirements) as the target parameters to be calibrated through the user interaction module 1033 based on the actual usage requirements of the device 102 to be calibrated (such as changes in external conditions such as measuring ambient temperature or humidity), and trigger the calibration process, thereby triggering the calibration device 103 to execute the corresponding (full / partial / incremental) self-calibration process in the form of instructions.

[0063] In this embodiment, the calibration instruction is directly triggered by the user interaction module 1033, and the target parameters to be calibrated are flexibly selected, thereby reducing unnecessary parameter calibration, reducing the complexity of the calibration algorithm, and reducing the occupation of computing resources by the calibration process, reducing the impact on the normal operation of the device, and thus improving the availability of the device and user experience.

[0064] S12. During an initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, obtain a first calibrated parameter set and a first parameter set to be calibrated based on the detected abnormal event.

[0065] The first calibrated parameter set includes a parameter set obtained by calibrating parameters to be calibrated that are not affected by abnormal events in the first target parameter set to be calibrated, and the first parameter set to be calibrated includes a parameter set to be affected by abnormal events in the first target parameter set to be calibrated.

[0066] In some embodiments, abnormal events include events where the calibration process cannot be completed as expected or the calibration results are unreliable due to factors such as the external environment, operating procedures, or device status. Self-calibration is performed in the user's on-site environment, and there are various uncertain external factors, such as: calibration environment stability, operating regulations, calibration networking, and calibration source reliability. These issues increase the possibility of abnormalities during the self-calibration process. Specifically, abnormal events include but are not limited to the following situations: The calibration environment is abnormal. For example, environmental parameters such as temperature, humidity, and air pressure exceed the allowable calibration range; electromagnetic interference or vibration causes calibration signal distortion or loss.

[0067] Abnormal operation specifications, such as user error (such as incorrect connection of the calibration source, incorrect configuration parameters); the calibration process is not executed according to specifications (such as skipping key steps).

[0068] The calibration source is abnormal, such as the external calibration device (such as GPS, signal source) is insufficiently accurate or inaccurate; the calibration source signal is unstable or interrupted.

[0069] Abnormal equipment status, such as aging or failure of internal components of the instrument (such as amplifier gain drift, filter bandwidth change); calibration parameters exceeding preset thresholds (such as excessive frequency response deviation, abnormal noise figure).

[0070] Abnormal process execution, such as the inability to complete a calibration step due to dependencies (e.g., failure of a previous calibration item prevents subsequent calibration from being performed); or the failure of the calibration result to pass verification (e.g., a calibration parameter deviates significantly from the expected value).

[0071] Data anomalies, such as incomplete or lost calibration data collection.

[0072] A single point anomaly may represent any of the above-mentioned abnormal events. During the calibration process of the device to be calibrated, the probability of a single point anomaly occurring is relatively high.

[0073] For the detection of abnormal events, we can perform Figure 6 The calibration method shown is tested as Figure 6 As shown, a calibration method provided according to an embodiment of the present application specifically includes steps a1 to a2: Step a1: Detecting the operating parameters of the device to be calibrated during operation.

[0074] Step a2: When the operating parameters fall outside the preset parameter range, an abnormal event of the device to be calibrated is obtained.

[0075] In some cases, operating parameters are key indicators of the operating status of the equipment being calibrated. Abnormal changes in these parameters can directly or indirectly lead to calibration failure or unreliable calibration results. By detecting whether operating parameters exceed preset ranges, abnormal events can be quickly identified and appropriate measures can be taken.

[0076] If operating parameters are outside the preset range, the device may be in an abnormal state (such as a sudden environmental change, component failure, or signal distortion), triggering the abnormal event handling mechanism. If operating parameters are within the preset range, the device is operating normally and the calibration process can be executed as planned.

[0077] Preset parameter ranges are threshold intervals determined based on device design specifications, calibration accuracy requirements, and actual usage needs. They are used to determine whether operating parameters are normal. Examples include, but are not limited to, environmental parameter ranges (such as temperature, humidity, and air pressure), electrical parameter ranges (such as signal amplitude, frequency range, and noise figure), calibration source parameter ranges (such as calibration signal accuracy and calibration source stability), and process execution parameter ranges (such as calibration step duration and data acquisition integrity). For example, consider temperature anomalies within calibration environment anomalies. For example, if the hardware of device 102 to be calibrated (e.g., an oscilloscope) exhibits performance differences in different temperature environments, some parameters (or parameter indicators) of device 102 to be calibrated may exhibit temperature variations, requiring adjustment to achieve nominal values ​​at different temperatures. Calibration items corresponding to these parameters can be categorized as temperature-sensitive calibration items. These calibration items are used to calibrate the corresponding parameters to be calibrated. During calibration, stable ambient temperature conditions must be maintained, for example, with ambient temperature fluctuations not exceeding ±2°C. Other calibration items unrelated to ambient temperature are categorized as non-temperature-sensitive calibration items and are not subject to these restrictions. For temperature-sensitive calibration items, in addition to the default calibration parameters within the core operating temperature range provided by the device manufacturer, the self-calibration function allows users to generate self-calibration parameters that match the actual operating temperature of the measurement device when the ambient temperature changes. If the ambient temperature range exceeds a specified threshold during the self-calibration process, a self-calibration temperature anomaly is considered.

[0078] The implementation shown in steps a1 and a2 enables real-time monitoring of the parameters of the device being calibrated during operation, triggering an exception event when the parameter exceeds a preset range, thereby quickly identifying potential calibration issues. This mechanism enables timely response to anomalies at the earliest stages, preventing further escalation of the problem and improving the reliability and stability of the calibration process.

[0079] In other embodiments, the user interaction module 1033 receives a calibration instruction triggered by the user. The calibration device 103 responds to the calibration instruction and, during the initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, obtains a first calibrated parameter set and a first parameter set to be calibrated based on the calibration strategy and detected abnormal events. The integration of the user interaction module with automated calibration allows the user to directly specify the parameter set to be calibrated and the calibration strategy, enabling the system to adapt to the personalized needs of different application scenarios. Furthermore, the interaction between user instructions and automated calibration preserves the flexibility of manual control while leveraging the efficiency advantages of automated calibration.

[0080] Exemplarily, in response to a calibration instruction, the anomaly decision module 1031 determines an execution strategy based on the calibration strategy and currently detected anomalies during the initial calibration of the parameters in the first target set of parameters to be calibrated. The execution strategy corresponds to the currently detected anomaly. Based on the execution strategy, the decision execution module 1032 obtains the first calibrated parameter set and the first set of parameters to be calibrated. By integrating the preset strategy with the anomaly status in real time to generate the optimal execution plan, the accuracy of policy adaptation in abnormal scenarios is improved. Furthermore, the user-preset calibration strategy and real-time detected anomalies are considered to improve the efficiency of calibration decisions in complex environments. The specific method of adjusting the self-calibration process is controlled by a user-configurable anomaly handling strategy. This strategy can be configured for handling different types of anomalies, such as whether to directly exit the calibration process after a single-point anomaly occurs or to use a default configuration or other avoidance strategy to complete subsequent calibration. The anomaly handling strategy is configured before the self-calibration process begins. During the self-calibration process, the calibration device automatically performs adaptive processing based on the real-time calibration status and anomaly detection results, reducing or eliminating the need for manual intervention when an anomaly occurs. The above-mentioned adaptive control of the self-calibration process based on abnormality isolation can reduce the impact of single-point abnormalities on the main self-calibration process, reduce manual intervention in abnormality handling, and improve the flexibility and fault tolerance of the self-calibration process.

[0081] In other examples, during the initial calibration of parameters in a first target set of parameters to be calibrated, after an abnormal event is detected, indication information is output based on the calibration strategy and the detected abnormal event; the indication information is used to indicate the end of calibration of the parameters in the first target set of parameters to be calibrated. Through the abnormal response mechanism and calibration strategy, when an abnormal event is detected during the initial calibration process, indication information indicating the termination of calibration is output in real time. This actively terminates the abnormal calibration process through a clear interrupt signal, preventing invalid calibration operations from continuing to occupy computing resources and reducing resource waste.

[0082] For the implementation shown in steps S11 and S12, during the initial calibration process, based on the detected abnormal event, the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event are calibrated, and some available calibration parameters (the first calibrated parameter set) can be generated when the abnormality occurs, avoiding the problem of global failure due to a single point abnormality, thereby improving calibration efficiency.

[0083] In other embodiments, Figure 7 FIG. 1 is a flow chart of a calibration method according to an embodiment of the present application, wherein step S12 specifically includes steps S121 to S125: S121 , sequentially calibrate each item to be calibrated in the current set of items to be calibrated.

[0084] The current set of items to be calibrated is used to initially calibrate the parameters to be calibrated in the first target set of parameters to be calibrated. The execution order of the calibration items in the current set of items to be calibrated has been determined based on the parameters in the first target set of parameters to be calibrated. In some examples, during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, the calibration order of the parameters is determined based on the coupling between the parameters or the dependency between the parameters. Specifically, the calibration order can be determined by manually analyzing the dependency or automatically analyzing it through an algorithm within the device. Since the parameters are calibrated through the calibration items, after the calibration order of the parameters is determined, the execution order of the items to be calibrated can be determined.

[0085] For example, in one example, the first target parameter set to be calibrated includes a first parameter to be calibrated b1, a second parameter to be calibrated c1, and a third parameter to be calibrated d1. The items to be calibrated include a first item to be calibrated A and a second item to be calibrated B. The first item to be calibrated A is used to calibrate the first parameter to be calibrated b1 and is denoted as A(b1). The second item to be calibrated B is used to calibrate the second parameter to be calibrated c1 and the third parameter to be calibrated d1 and is denoted as B(c1, d1). If the second parameter to be calibrated c1 is associated with the first parameter to be calibrated b1, meaning that the calibration of the second parameter to be calibrated c1 depends on the validity or accuracy of the first parameter to be calibrated b1, then the first item to be calibrated A must be executed or calibrated before the second item to be calibrated B. The calibration order of the items to be calibrated is determined based on this coupling or association between the parameters.

[0086] In another example, step S121 may be executed by the calibration process execution unit 10321 .

[0087] S122: Whether an abnormal event is detected during the calibration process.

[0088] When an abnormal event is detected during the calibration process, step S123 to step S124 are executed; when no abnormal event is detected during the calibration process, step S125 is executed.

[0089] S123: Determine one or more affected items to be calibrated that are affected by the abnormal event, and update the current set of items to be calibrated based on the one or more affected items to be calibrated.

[0090] In some examples, each affected item to be calibrated includes an item to be calibrated that depends on an affected calibrated parameter and / or an item to be calibrated that will be affected by an affected uncalibrated parameter.

[0091] In one example, each affected item to be calibrated includes an item to be calibrated that is dependent on an affected calibrated parameter, where the affected calibrated parameter represents a parameter that was already calibrated before the abnormal event was detected. Specifically, taking the sequential calibration of a first item to be calibrated A and a second item to be calibrated B as an example, if the second parameter to be calibrated c1 is associated with the first parameter to be calibrated b1, i.e., the calibration of the second parameter to be calibrated c1 depends on the validity or accuracy of the first parameter to be calibrated b1, then if, during the calibration of the second item to be calibrated B, the first parameter to be calibrated b1 has already been calibrated to the first calibrated parameter b2, and an abnormal event is detected, and this abnormal event affects the calibration of the first parameter to be calibrated b1, then the first calibrated parameter b2 is the affected calibrated parameter, and the second item to be calibrated B is the item to be calibrated that is dependent on the affected calibrated parameter.

[0092] In another example, each affected item to be calibrated includes an item to be calibrated that is affected by an affected uncalibrated parameter. Specifically, taking the example of sequentially calibrating a first item to be calibrated A and a second item to be calibrated B, if the second parameter to be calibrated c1 is not associated with the first parameter to be calibrated b1, and if an abnormal event is detected during the calibration of the second item to be calibrated B, and this abnormal event affects the calibration of the second parameter to be calibrated c1, then the second parameter to be calibrated c1 is the affected uncalibrated parameter, and the second item to be calibrated B is the item to be calibrated that is affected by the affected uncalibrated parameter.

[0093] In another example, each affected item to be calibrated includes an item to be calibrated that depends on the affected calibrated parameter and an item to be calibrated that will be affected by the affected uncalibrated parameter.

[0094] In another example, the affected calibrated parameters are configured with identification information that indicates the affected calibrated parameters. Through the parameter identification management mechanism, dedicated identification information is assigned to calibrated parameters affected by the anomaly. This enables management of invalid parameters (affected calibrated parameters), such as rapid location, providing precise guidance for subsequent maintenance, and improving parameter maintenance efficiency.

[0095] In some other examples, the current set of items to be calibrated is initially the set of items to be calibrated for calibrating the first target parameter set to be calibrated. That is, in the parameter calibration process, the current set of items to be calibrated has a clear initial setting. It starts from the set of items to be calibrated for calibrating the first target parameter set to be calibrated, which defines the initial scope and object for the entire calibration work.

[0096] However, during the calibration process, the occurrence of abnormal events will disrupt this initial stable state. Once an abnormal event is detected, the current set of items to be calibrated can be dynamically adjusted based on the impact of the abnormal event. Specifically: In one example, items to be calibrated that were affected by an abnormal event can be removed from the current set of items to be calibrated, for example, by removing at least one of the one or more affected items from the current set. This is because if an item is affected, the calibration result will typically be inaccurate. Continuing to calibrate items affected by the abnormal event not only makes it difficult to obtain accurate calibration results, but also wastes significant time and resources due to repeated calibration attempts, thereby reducing overall calibration efficiency. Therefore, calibration can be postponed until certain conditions meet calibration standards (e.g., when environmental parameters such as temperature are normal).

[0097] Of course, this elimination process isn't arbitrary; it's based on a precise assessment of the degree of interference the abnormal event has on the items to be calibrated, ensuring that only items truly affected and potentially impacting calibration accuracy are eliminated. After the elimination process is complete, the current set of items to be calibrated is immediately updated, resulting in a completely new set. This means that the items in the current set are constantly changing. At different calibration moments, the current set of items to be calibrated will vary due to variations in the occurrence and impact of abnormal events (see the previous discussion of abnormal events for details). This dynamic mechanism enables calibration to flexibly respond to various abnormal conditions and promptly eliminate interfering factors, thereby ensuring the calibration process remains accurate and efficient.

[0098] For example, let's take the self-calibration function of a digital oscilloscope as an example. Because oscilloscope hardware performance varies across different temperature environments, some calibration parameters vary with temperature. Calibration items corresponding to these parameters are categorized as temperature-sensitive. These calibration items require a stable ambient temperature, for example, the ambient temperature fluctuation must not exceed ±2°C during calibration. Other calibration items unrelated to ambient temperature are categorized as non-temperature-sensitive and are not subject to these restrictions. For temperature-sensitive calibration items, in addition to the default calibration parameters within the core operating temperature range provided by the instrument manufacturer, the self-calibration function allows users to generate self-calibration parameters that match the instrument's actual operating temperature when the ambient temperature changes. If the ambient temperature fluctuation range exceeds a specified threshold during the self-calibration process, this is considered a self-calibration temperature anomaly and is handled using an adaptive control method based on anomaly isolation. Specifically, first, calibrated temperature-sensitive parameters are identified and marked as invalid. Second, uncalibrated temperature-sensitive parameters are identified and the corresponding calibration items are removed from the set of items to be calibrated.

[0099] In another example, all calibration items affected by the abnormal event can be retained in the current set of calibration items without being removed. These calibration items affected by the abnormal event can be calibrated using historical / default parameters to calibrate the remaining affected calibration items. For example, non-temperature-sensitive parameters associated with temperature-sensitive parameters can be subsequently calibrated based on factory default configurations or based on the parameters of the previous normal calibration. For details, see the description of step S124.

[0100] In yet another example, step S123 may be performed by the calibration status updating unit 10322 .

[0101] S124 , sequentially calibrating each item to be calibrated in the updated set of items to be calibrated.

[0102] When calibrating each item in the updated set of items to be calibrated, steps S122 to S124 are iteratively executed to calibrate each item in the updated set of items to be calibrated. If no abnormal event is detected during the calibration process, step S125 is executed.

[0103] In one example, step S124 - step S125 may be executed by the calibration process execution unit 10321 .

[0104] In some examples, if the updated set of items to be calibrated includes remaining affected items to be calibrated that have not been removed from the current set of items to be calibrated among one or more affected items to be calibrated, the remaining affected items to be calibrated may be calibrated using historical / default parameters. Here, historical / default parameters refer to historical parameters or default parameters. Historical parameters refer to parameters that have been calibrated previously, and default parameters refer to system default parameters, which are typically default parameters provided by the manufacturer.

[0105] In another example, the measuring instrument may provide some prompt information or an interactive interface (such as a pop-up dialog box) at this time to allow the user to choose whether to calibrate or whether to use historical / default parameters for calibration. It may also read pre-configured default options (such as a configuration file that usually stores the user's configuration) to choose whether to calibrate the affected items to be calibrated or whether to use historical / default parameters for calibration.

[0106] In another example, if the second parameter to be calibrated c1 is associated with the first parameter to be calibrated b1, i.e., the calibration of the second parameter to be calibrated c1 depends on the validity or accuracy of the first parameter to be calibrated b1, and the first parameter to be calibrated b1 is temperature-sensitive, then when calibrating the second item to be calibrated B, the first parameter to be calibrated b1 has already been calibrated to the first calibrated parameter b2, and an abnormal event is detected, and this abnormal event is a temperature abnormality that affects the calibration of the first parameter to be calibrated b1, then the first calibrated parameter b2 is the affected calibrated parameter, and the second item to be calibrated B is the item to be calibrated that depends on the affected calibrated parameter. In this case, the historical / default parameters of the first parameter to be calibrated b1 can be used to calibrate the second item to be calibrated B.

[0107] In another example, if the second parameter to be calibrated c1 is not associated with the first parameter to be calibrated b1 and is temperature-sensitive, and if an abnormal event is detected during calibration of the second item to be calibrated B, and this abnormal event affects the calibration of the second parameter to be calibrated c1, then the second parameter to be calibrated c1 will be the affected uncalibrated parameter, and the second item to be calibrated B will be the item to be calibrated that is affected by the affected uncalibrated parameter. In this case, calibration of the second item to be calibrated B can be continued using the historical / default parameters of the second parameter to be calibrated c1.

[0108] In the above-mentioned embodiments, the introduction of a parameter compensation mechanism during the complex process of parameter calibration becomes a key means of addressing anomalies and ensuring the smooth progress of calibration. When anomalies are identified in the set of parameters to be calibrated, the mechanism quickly takes effect, automatically replacing these anomaly parameters with default parameters or historical calibration parameters.

[0109] This replacement operation effectively avoids interruptions to the overall calibration process caused by individual parameter anomalies by promptly replacing abnormal parameters. If the calibration strategy is to abruptly halt the entire calibration process once a parameter anomaly occurs, this not only wastes previously invested time and resources, but can also prevent the system from obtaining accurate calibration results at critical moments, thus impacting normal system operation. The application of the parameter compensation mechanism allows the calibration process to maintain some core calibration functions even in the face of abnormal conditions, ensuring that the calibration process does not completely stall and providing strong support for the stable operation of the system.

[0110] In terms of calibration range effectiveness, replacing historical calibration parameters or default values ​​significantly expands the effective calibration range compared to completely terminating calibration. If calibration is terminated directly when an abnormal event occurs, all calibrated parameters will not be processed, and the effective calibration range will be zero. The parameter compensation mechanism, however, replaces the abnormal parameters, allowing those unaffected by the abnormal event to continue to be calibrated. This allows calibration to be completed as much as possible under abnormal conditions, improving the efficiency and effectiveness of calibration work.

[0111] For the remaining affected items to be calibrated that haven't been removed from the current set of items to be calibrated, using historical / default parameters for calibration also offers significant advantages. Historical / default parameters are reliable parameter resources that have been verified through long-term practice or pre-set. Using them for calibration ensures that the calibration process won't be interrupted by abnormal events, and that the consistency of calibration work is always maintained. Moreover, these relatively reliable parameters provide a reasonable reference benchmark for the affected items to be calibrated, enabling them to achieve relatively reasonable parameter values ​​for these items as much as possible. This makes the entire parameter calibration process more flexible and adaptable when faced with abnormal situations, enabling the calibration strategy to be quickly adjusted according to different abnormal conditions, ensuring the accuracy and reliability of the calibration results and laying a solid foundation for the stable operation and performance optimization of the system.

[0112] S125 : Calibrate the next item to be calibrated until all items to be calibrated in the updated set of items to be calibrated are calibrated to obtain a first calibrated parameter set and a first set of parameters to be calibrated.

[0113] The first calibrated parameter set includes all calibration parameters generated before the single-point anomaly occurs and are not affected by the anomaly, and all calibration parameters generated after the anomaly is isolated.

[0114] Regarding the implementation method provided in steps S121-S125, dynamic fault tolerance and adaptive calibration of the calibration process under abnormal conditions are achieved during the parameter calibration process through an iterative anomaly isolation and dynamic update mechanism. Specifically, the method performs calibration on each item to be calibrated in the current set of items to be calibrated in turn. During the calibration process, once an abnormal event is detected, isolation processing is immediately performed: one or more items to be calibrated affected by the abnormal event are accurately determined, and the current set of items to be calibrated is updated accordingly. Each affected item to be calibrated includes both items that depend on the affected calibrated parameters and items that will be affected by the affected uncalibrated parameters. After the update is completed, the calibration, anomaly detection, and isolation processing processes are repeated for the new set of items to be calibrated until the calibration of all items to be calibrated is completed, ultimately obtaining a partially useful or valid first set of calibrated parameters. This processing method can accurately lock in the items to be calibrated affected by the abnormal event, effectively avoid the interference of the abnormality on other normal items to be calibrated, and thus improve the accuracy and reliability of the calibration.

[0115] In some other embodiments, Figure 8 The figure shows a flow chart of a calibration method according to an embodiment of the present application, which is used in the case where an abnormality occurs in the self-calibration process during the initial calibration process or the previous calibration process, resulting in the failure to generate the full amount of self-calibration parameters. Step S12 also includes steps S13-S14: S13: Obtain a second target parameter set to be calibrated.

[0116] In some examples, the second target set of parameters to be calibrated includes at least one parameter to be calibrated in the first set of parameters to be calibrated.

[0117] S14: Calibrate the parameters to be calibrated in the second target parameter set to be calibrated to obtain a second calibrated parameter set.

[0118] In steps S13 and S14, after completing the initial calibration and isolating the abnormal parameter, incremental calibration is performed on the affected parameters to be calibrated (at least one parameter to be calibrated in the first set of parameters to be calibrated), thereby achieving full calibration and self-repair capabilities for the calibration system. This technical solution has the following significant benefits: On the one hand, by constructing a second target set to be calibrated that includes at least one parameter from the first set to be calibrated, accurate recovery of abnormal parameters is achieved, significantly improving efficiency compared to full parameter recalibration; on the other hand, by splitting the abnormal parameter calibration into initial calibration and subsequent incremental calibration, both the timely output of normal parameters and the final calibration of abnormal parameters are guaranteed, thereby improving system availability indicators.

[0119] In some examples, such as Figure 9As shown, step S14 specifically includes steps S141 to S145: S141: Taking the second target parameter set to be calibrated as the current parameter set to be calibrated, and determining a current item set to be calibrated based on the parameters to be calibrated in the current parameter set to be calibrated, wherein the current item set to be calibrated is used to calibrate the parameters to be calibrated in the current parameter set to be calibrated.

[0120] S142: Determine associated parameters of the parameters to be calibrated in the current set of parameters to be calibrated.

[0121] In one example, the parameters to be calibrated are correlated or coupled with each other, and one parameter needs to rely on the validity or correctness of another parameter.

[0122] Specifically, when the device to be calibrated 102 includes a parameter to be calibrated X, a parameter to be calibrated Y, and a parameter to be calibrated Z, there is a sequential dependency relationship among the parameters to be calibrated X, Y, and Z. For example, the accuracy of the parameter to be calibrated Y depends on the accuracy of the parameter to be calibrated X, and the accuracy of the parameter to be calibrated Z depends on the accuracy of the parameter to be calibrated Y. The correct calibration order for these three parameters to be calibrated in the device to be calibrated 102 should be to calibrate the parameters to be calibrated X, Y, and Z in that order.

[0123] When the user determines that the parameters Y and Z to be calibrated do not meet the preset conditions (such as accuracy) based on the actual usage requirements of the device to be calibrated 102, the user can choose to perform incremental calibration on the parameters Y and Z to be calibrated, and the parameter X to be calibrated is the associated parameter of the parameter Y to be calibrated.

[0124] S143: Determine whether there are parameters to be calibrated in the associated parameters.

[0125] If there are parameters to be calibrated, ie, invalid parameters, among the associated parameters, step S144 and steps S142 - S143 are executed; if all the associated parameters are calibrated, ie, valid parameters, step S145 is executed.

[0126] S144: Adjust the current set of items to be calibrated according to the associated parameters to obtain an adjusted current set of items to be calibrated.

[0127] In one example, because the associated parameter is a parameter to be calibrated, the associated parameter needs to be calibrated using a calibration item corresponding to the associated parameter, and thus the calibration item corresponding to the associated parameter needs to be added to the current set of items to be calibrated.

[0128] S145: Calibrate the current set of items to be calibrated to obtain a second set of calibrated parameters.

[0129] In steps S141-S145, the iterative calibration mechanism based on parameter association awareness enables dynamic dependency management and adaptive calibration strategy adjustment during incremental calibration of abnormal parameters. On the one hand, the real-time identification and processing of associated parameters, along with the dynamic determination of parameter dependencies within each iteration, ensure that the calibration sequence always complies with the physical constraints between parameters, reducing the calibration failure rate due to incorrect dependencies. On the other hand, the current set of items to be calibrated is adjusted based on the associated parameters. This continuous revision of the calibration item set during the iterative process enables the system to autonomously adapt to different abnormal scenarios, demonstrating higher scenario adaptability than traditional methods in communications equipment calibration testing.

[0130] The incremental calibration method is suitable for different application scenarios, such as: (1) If a single-point anomaly occurs in the main self-calibration process and the full calibration parameters are not generated, the abnormal incremental calibration can be completed based on the generated set of partially available calibration items to obtain the parameters corresponding to the full calibration items.

[0131] (2) Due to changes in time and environment, the parameters corresponding to some calibration items become invalid. In this case, the incremental calibration method can also be used.

[0132] During the execution of the self-calibration process of the incremental calibration, a single-point anomaly may also occur. In this process, the calibration method shown in the first embodiment is also applicable. By isolating the anomaly, some usable calibration items are generated.

[0133] The incremental repair method is suitable for different application scenarios, such as: (1) If a single-point anomaly occurs in the main self-calibration process and the full calibration parameters are not generated, the anomaly can be incrementally repaired based on the partially available calibration parameter set that has been generated, thereby obtaining the full calibration parameters.

[0134] (2) Due to changes in time and environment, some calibration parameters become invalid. In this case, the incremental repair method can also be used.

[0135] During the execution of the self-calibration process of incremental repair, a single-point abnormality may also occur. In this process, the adaptive control method based on abnormality isolation in the second embodiment is also applicable.

[0136] The anomaly incremental repair method can make full use of some of the available calibration parameters in the system. By iteratively analyzing the correlation between the invalid parameters to be repaired and other parameters and the validity of the associated parameters, the self-calibration anomaly decision module adaptively adjusts the set of items to be calibrated based on the user-configurable repair strategy, which can improve the self-calibration repair efficiency.

[0137] This adaptive control mechanism for the self-calibration process, based on anomaly isolation, effectively minimizes the impact of single-point anomalies on the main self-calibration process, reduces the need for manual intervention in anomaly handling, and improves the flexibility and fault tolerance of the self-calibration process. By supporting incremental calibration and adaptive anomaly handling, the system enables more efficient and reliable self-calibration in complex and changing field environments, providing a more optimized solution for calibrating high-precision measuring instruments.

[0138] Example 2: Based on the above embodiments, this embodiment provides a device to be calibrated, such as Figure 10 As shown, a device to be calibrated is provided according to an embodiment of the present application. The device to be calibrated 102 includes a first acquisition module 1022 and a first calibration module 1023 .

[0139] The first acquisition module 1022 is configured to acquire a first target parameter set to be calibrated.

[0140] The first calibration module 1023 is used to obtain a first calibrated parameter set and a first set of parameters to be calibrated based on the detected abnormal event during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated; wherein the first calibrated parameter set includes a parameter set after calibration of the parameters to be calibrated in the first target set of parameters to be calibrated that are not affected by the abnormal event, and the first set of parameters to be calibrated includes a parameter set in the first target set of parameters to be calibrated that is affected by the abnormal event.

[0141] In some embodiments, the first calibration module 1023 is further used to calibrate each item to be calibrated in the current set of items to be calibrated in sequence, wherein, when an abnormal event is detected during the calibration process, isolation processing is performed; the isolation processing includes: determining one or more affected items to be calibrated that are affected by the abnormal event, and updating the current set of items to be calibrated based on the one or more affected items to be calibrated; the current set of items to be calibrated is initially a set of items to be calibrated for calibrating the first target set of parameters to be calibrated; each affected item to be calibrated includes an item to be calibrated that depends on an affected calibrated parameter, and / or an item to be calibrated that will be affected by an affected uncalibrated parameter; calibrating each item to be calibrated in the updated set of items to be calibrated, and when an abnormal event is detected when calibrating each item to be calibrated in the updated set of items to be calibrated, iteratively performing the isolation processing and executing the process of calibrating each item to be calibrated in the updated set of items to be calibrated, until the calibration of all items to be calibrated in the updated set of items to be calibrated is completed to obtain the first calibrated parameter set and the first set of parameters to be calibrated.

[0142] In some embodiments, the first calibration module 1023 is further configured to update the current set of items to be calibrated based on the affected items to be calibrated, including: removing at least one of the one or more affected items to be calibrated from the current set of items to be calibrated; accordingly, Calibrating each item to be calibrated in the updated set of items to be calibrated includes: calibrating remaining affected items to be calibrated that are not removed from the current set of items to be calibrated among the one or more affected items to be calibrated using historical / default parameters.

[0143] In some implementations, the affected calibrated parameters in the first calibration module 1023 are configured with identification information, where the identification information is used to indicate the affected calibrated parameters.

[0144] In some embodiments, the device to be calibrated 102 further includes: The second acquisition module is configured to acquire a second target parameter set to be calibrated, where the second target parameter set to be calibrated includes at least one parameter in the first parameter set to be calibrated.

[0145] The second calibration module is configured to calibrate the parameters to be calibrated in the second target parameter set to be calibrated to obtain a second calibrated parameter set.

[0146] In some embodiments, the device to be calibrated 102 further includes: The output module is used to output indication information according to the calibration strategy and the detected abnormal event during the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, after an abnormal event is detected; the indication information is used to indicate the end of the calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

[0147] In some embodiments, the first acquisition module 1022 is further configured to receive a calibration instruction triggered by a user interaction module of the device to be calibrated, where the calibration instruction is configured to determine a first target parameter set to be calibrated and a calibration strategy for the parameters to be calibrated in the first target parameter set to be calibrated.

[0148] The first calibration module 1023 is further configured to obtain a first calibrated parameter set and a first to-be-calibrated parameter set according to a calibration strategy and a detected abnormal event during an initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set in response to a calibration instruction.

[0149] This embodiment further provides a device to be calibrated, comprising: a memory and a processor. The memory is used to store a computer program; the processor is used to call the computer program in the memory and execute the calibration method in any of the above embodiments.

[0150] This embodiment also provides a computer-readable storage medium. Persons skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing the relevant hardware through a computer program. The program can be stored in a computer-readable storage medium. When executed, the program can include the processes in the above-described method embodiments. The storage medium can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0151] Each of the above modules or units can be implemented by software, hardware, or a combination of software and hardware. For example, the calibration device 103 and the user interaction module 1033 can both be implemented based on software.

[0152] In this application, "implemented by software" means that the processor reads and executes program instructions stored in the memory to implement the functions corresponding to the above modules or units, wherein the processor refers to a processing circuit with the function of executing program instructions, including but not limited to at least one of the following: a central processing unit (CPU), a microprocessor, a digital signal processor (DSP), a microcontroller unit (MCU), or an artificial intelligence processor, etc., which are processing circuits capable of running program instructions. In other embodiments, the processor may also include circuits for other processing functions (such as hardware circuits for hardware acceleration, buses and interface circuits, etc.). The processor can be presented in the form of an integrated chip, for example, in the form of an integrated chip whose processing function only includes the function of executing software instructions, or it can also be presented in the form of a system on a chip (SoC), that is, on a chip, in addition to including a processing circuit capable of running program instructions (usually referred to as a "core"), it also includes other hardware circuits for implementing specific functions (of course, these hardware circuits can also be implemented separately based on ASIC or FPGA). Accordingly, in addition to including the function of executing software instructions, the processing function can also include various hardware acceleration functions (such as AI computing, encoding and decoding, compression and decompression, etc.).

[0153] In this application, "implemented through hardware" means that the functions of the aforementioned modules or units are realized through hardware processing circuits that do not process program instructions. This hardware processing circuit can be composed of discrete hardware components or integrated circuits. To reduce power consumption and size, it is often implemented in the form of integrated circuits. Hardware processing circuits can include application-specific integrated circuits (ASICs) or programmable logic devices (PLDs). PLDs can include field programmable gate arrays (FPGAs) and complex programmable logic devices (CPLDs). These hardware processing circuits can be individually packaged as a semiconductor chip (e.g., an ASIC) or integrated with other circuits (e.g., a CPU or DSP) to form a single semiconductor chip. For example, multiple hardware circuits and a CPU can be formed on a silicon substrate and packaged as a single chip, also known as an SoC. Alternatively, circuits implementing FPGA functions and a CPU can be formed on a silicon substrate and packaged as a single chip, also known as a system on a programmable chip (SoPC).

[0154] It should be noted that when the present application is implemented through software, hardware, or a combination of software and hardware, different software and hardware may be used, and it is not limited to the use of only one type of software or hardware. For example, one module or unit may be implemented using a CPU, and another module or unit may be implemented using a DSP. Similarly, when implemented using hardware, one module or unit may be implemented using an ASIC, and another module or unit may be implemented using an FPGA. Of course, it is not limited to implementing some or all modules or units using the same software (such as all through a CPU) or the same hardware (such as all through an ASIC). In addition, those skilled in the art will know that software is generally more flexible but has lower performance than hardware, while hardware is just the opposite. Therefore, those skilled in the art can choose software or hardware or a combination of the two to implement according to actual needs.

[0155] The above preferred embodiments further illustrate the objectives, technical solutions and advantages of the present invention in detail. It should be understood that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A calibration method, characterized in that: include: Obtaining a first target parameter set to be calibrated; During the initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, a first calibrated parameter set and a first parameter set to be calibrated are obtained based on the detected abnormal event; The first calibrated parameter set includes a parameter set obtained by calibrating the parameters to be calibrated in the first target parameter set to be calibrated that are not affected by the abnormal event, and the first parameter set to be calibrated includes a parameter set in the first target parameter set to be calibrated that is affected by the abnormal event.

2. The calibration method according to claim 1, wherein: The method of obtaining a first calibrated parameter set and a first to-be-calibrated parameter set based on a detected abnormal event during the initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set includes: Calibrate each item to be calibrated in the current set of items to be calibrated in turn; When an abnormal event is detected during the calibration process, an isolation process is performed; the isolation process includes: determining one or more affected items to be calibrated that are affected by the abnormal event, and updating the current set of items to be calibrated based on the one or more affected items to be calibrated; the current set of items to be calibrated is initially a set of items to be calibrated that are calibrated for the first target set of parameters to be calibrated; each affected item to be calibrated includes an item to be calibrated that depends on an affected calibrated parameter and / or an item to be calibrated that will be affected by an affected uncalibrated parameter; Calibrating each item to be calibrated in the updated set of items to be calibrated; when an abnormal event is detected during the calibration of each item to be calibrated in the updated set of items to be calibrated, iteratively performing the isolation processing and the process of performing the calibration on each item to be calibrated in the updated set of items to be calibrated until the calibration of all items to be calibrated in the updated set of items to be calibrated is completed, so as to obtain the first calibrated parameter set and the first set of parameters to be calibrated.

3. The calibration method according to claim 2, wherein: The updating of the current set of items to be calibrated based on the one or more affected items to be calibrated includes: removing at least one of the one or more affected items to be calibrated from the current set of items to be calibrated; accordingly, The calibrating each item to be calibrated in the updated set of items to be calibrated includes: calibrating the remaining affected items to be calibrated that are not removed from the current set of items to be calibrated among the one or more affected items to be calibrated using historical / default parameters.

4. The calibration method according to claim 2, wherein: The affected calibrated parameters are configured with identification information, where the identification information is used to indicate the affected calibrated parameters.

5. The calibration method according to any one of claims 1 to 4, characterized in that: During the initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, after obtaining the first calibrated parameter set and the first parameter set to be calibrated based on the detected abnormal event, the method further includes: Acquire a second target parameter set to be calibrated, where the second target parameter set to be calibrated includes at least one parameter in the first parameter set to be calibrated; Calibrate the parameters to be calibrated in the second target parameter set to be calibrated to obtain a second calibrated parameter set.

6. The calibration method according to any one of claims 1 to 4, characterized in that: The obtaining of a first target parameter set to be calibrated includes: Receiving a calibration instruction triggered by a user interaction module of the device to be calibrated, the calibration instruction being used to determine the first target parameter set to be calibrated and a calibration strategy for the parameters to be calibrated in the first target parameter set to be calibrated; The method of obtaining a first calibrated parameter set and a first to-be-calibrated parameter set based on a detected abnormal event during the initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set includes: In response to the calibration instruction, during an initial calibration of the parameters to be calibrated in the first target parameter set to be calibrated, a first calibrated parameter set and a first parameter set to be calibrated are obtained according to the calibration strategy and the detected abnormal event.

7. The calibration method according to claim 6, characterized in that: After receiving the calibration instruction triggered by the user interaction module of the device to be calibrated, the method further includes: During the initial calibration of the parameters to be calibrated in the first target set of parameters to be calibrated, after the abnormal event is detected, indication information is output according to the calibration strategy and the detected abnormal event; the indication information is used to indicate the end of the calibration of the parameters to be calibrated in the first target set of parameters to be calibrated.

8. A device to be calibrated, characterized in that: include: A first acquisition module is used to acquire a first target parameter set to be calibrated; A first calibration module is configured to obtain a first calibrated parameter set and a first to-be-calibrated parameter set based on a detected abnormal event during an initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set; The first calibrated parameter set includes a parameter set obtained by calibrating the parameters to be calibrated in the first target parameter set to be calibrated that are not affected by the abnormal event, and the first parameter set to be calibrated includes a parameter set in the first target parameter set to be calibrated that is affected by the abnormal event.

9. A device to be calibrated, characterized in that: include: Memory for storing computer programs; A processor, wherein the processor is configured to call the computer program in the memory to execute the calibration method according to any one of claims 1 to 7.

10. A calibration device, characterized in that: include: A user interaction module, configured to obtain a first target parameter set to be calibrated; a decision execution module, configured to obtain a first calibrated parameter set and a first to-be-calibrated parameter set based on a detected abnormal event during an initial calibration of the to-be-calibrated parameters in the first target to-be-calibrated parameter set; The first calibrated parameter set includes a parameter set obtained by calibrating the parameters to be calibrated in the first target parameter set to be calibrated that are not affected by the abnormal event, and the first parameter set to be calibrated includes a parameter set in the first target parameter set to be calibrated that is affected by the abnormal event.

11. The calibration device according to claim 10, characterized in that The decision execution module includes: A calibration process execution unit, configured to sequentially calibrate each item to be calibrated in the current set of items to be calibrated; When an abnormal event is detected during the calibration process, an isolation process is performed; the isolation process includes: determining one or more affected items to be calibrated that are affected by the abnormal event, and updating the current set of items to be calibrated based on the one or more affected items to be calibrated; the current set of items to be calibrated is initially a set of items to be calibrated that are calibrated for the first target set of parameters to be calibrated; each affected item to be calibrated includes an item to be calibrated that depends on an affected calibrated parameter and / or an item to be calibrated that will be affected by an affected uncalibrated parameter; a calibration status updating unit, configured to calibrate each item to be calibrated in the updated set of items to be calibrated, and when an abnormal event is detected during the calibration of each item to be calibrated in the updated set of items to be calibrated, iteratively execute the isolation processing and the process of executing the calibration of each item to be calibrated in the updated set of items to be calibrated until the calibration of all items to be calibrated in the updated set of items to be calibrated is completed, so as to obtain the first calibrated parameter set and the first set of parameters to be calibrated.

12. The calibration device according to claim 10, characterized in that Also includes: The abnormality decision module is used to determine the execution strategy according to the calibration strategy and the detected abnormal event type; the calibration strategy includes a plurality of the execution strategies, and the abnormal event type has a corresponding relationship with the execution strategy.

13. A device to be calibrated, characterized in that: include: Equipment body; The calibration device according to any one of claims 10 to 12, wherein the calibration device is communicatively connected to the device body.

14. A calibration system, characterized in that: include: Signal source; The device to be calibrated as claimed in claim 13, wherein the signal source is communicatively connected to the device to be calibrated, and the signal source provides a calibration signal to the device body.

15. A calibration system, characterized in that: include: Signal source; The device to be calibrated, the signal source being in communication with the device to be calibrated, and the signal source providing a calibration signal to the device body; The calibration device according to any one of claims 10 to 12, wherein the calibration device is communicatively connected to both the signal source and the device body.

16. A computer-readable storage medium, characterized in that The computer-readable storage medium includes instructions; when the instructions are executed on a processor, the processor is caused to perform the calibration method according to any one of claims 1 to 7.

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