Taking clamp for aging test of small photoelectric coupler chip

Abstract

The invention relates to the technical field of photoelectric coupler processing, in particular to a taking clamp for a small photoelectric coupler chip aging test, which comprises a movable handle, a spring, a fixed handle, a connecting rod, a sliding block, a sleeve, a clamping plate and an inserting needle, through the hinges, one end of the connecting rod is connected with the movable handle, and the other end of the connecting rod is connected with the sliding block; the connecting rod and the sliding block penetrate through the sleeve, the fixed handle and the clamping plate are fixed to the two ends of the sleeve respectively, a strip-shaped groove is formed in the side wall of the sleeve, and the inserting needle penetrates through the strip-shaped groove and is fixed to the sliding block. The movable handle and the fixed handle form a lever structure through a hinge, the lever structure is used for achieving movement of the sliding block along the sleeve, and the spring is used for resetting the lever structure. According to the taking clamp designed by the invention, the taking efficiency of taking the chip from the aging seat in the aging experiment process is improved, the pin scratch ratio caused by manual taking is reduced, the first pass yield of products is improved, and batch aging experiments are more convenient to carry out.

Description

Technical Field

[0001] The invention relates to the technical field of photoelectric coupler processing, in particular to a taking clip used for an aging test of a small photoelectric coupler chip. Background Art

[0002] The chip burn-in test is a reliability testing method that accelerates the exposure of potential chip defects through stress conditions such as high temperature and high voltage. The complete burn-in test process is as follows: select a suitable burn-in rack and install the chip to be tested on the burn-in rack; set the burn-in test parameters according to the chip specifications and parameters; connect the power supply, start the burn-in test, and regularly check and record the chip performance status; turn off the power supply and remove the chip; perform failure analysis on the chip to locate the cause of the defect.

[0003] Among the steps described above, the "chip removal" process has significant process defects: the burn-in experiment requires a tight fit between the chip and the burn-in socket. The tight fit, coupled with the small size of the chip, makes chip removal difficult and easily causes the device pins to bend and deform. According to statistics, the defective rate of pin deformation caused by improper operation is as high as 8%-12%, seriously affecting the product pass rate. In addition, the current single-chip manual plug-in and pull-out operation mode greatly limits production efficiency. The removal of a single batch of devices takes as long as 2-3 hours, seriously restricting the overall production capacity of the production line and also increasing operator fatigue.

[0004] In the prior art, CN119780651A discloses a high-efficiency heat-dissipating stacked-topology diode current burn-in structure, which was published by the Xi'an Institute of Microelectronics Technology. This document proposes a burn-in rack structure that improves both space utilization and burn-in effectiveness during burn-in experiments. CN119901947A discloses a device burn-in apparatus and testing method, which was published by the Aerospace Science and Industry Corporation Defense Technology Research and Testing Center. This document proposes a device burn-in apparatus that allows for multiple burn-in sockets to be installed on a burn-in board, enabling batch burn-in testing of devices and improving burn-in efficiency.

[0005] Existing technologies have improved the efficiency and effectiveness of burn-in experiments in different aspects, but the problems of product pass rate and production efficiency caused by removing the chip link have not been solved. Summary of the Invention

[0006] In view of this, the present invention discloses a clamp for use in a burn-in test of a small optocoupler chip to solve the above-mentioned problem. The clamp comprises a movable handle, a spring, a fixed handle, a connecting rod, a slider, a sleeve, a clamping plate, and an insertion needle.

[0007] Furthermore, hinges are provided at both ends of the connecting rod, through which one end of the connecting rod is connected to the movable handle and the other end is connected to the slider;

[0008] Furthermore, the connecting rod and the slider pass through the sleeve, the fixed handle and the clamping plate are respectively fixed to both ends of the sleeve, and a strip groove is provided on the side wall of the sleeve, the insertion needle passes through the strip groove and is fixed to the slider;

[0009] Furthermore, the movable handle and the fixed handle form a lever structure through a hinge, the lever structure is used to realize the movement of the slider along the sleeve, and the spring is used to reset the lever structure;

[0010] The removal clip designed by the present invention for the burn-in test of small optocoupler chips improves the efficiency of removing chips from the aging seat during the burn-in experiment, reduces the proportion of pin scratches caused by manual removal, improves the product pass rate, and is more convenient for batch burn-in test. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 This is a structural diagram of a pick-up clip used for a burn-in test of a small optocoupler chip according to an embodiment of the present application;

[0012] Figure 2 A perspective view of a clip for use in a burn-in test of a small optocoupler chip according to an embodiment of the present application;

[0013] Figure 3 Schematic diagram of the use of a pick-up clip for a burn-in test of a small optocoupler chip according to an embodiment of the present application;

[0014] Figure 4 A schematic diagram of the use of a pick-up clip for a small optocoupler chip burn-in test according to an embodiment of the present application;

[0015] Numbers in the figure: 1-fixed handle, 2-spring, 3-movable handle, 4-connecting rod, 5-sleeve, 6-insertion needle, 7-clamping plate, 8-slider. DETAILED DESCRIPTION

[0016] In order to make the purpose, technical solutions, features and advantages of the present invention more clear and understandable, and to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention is further described in detail below with reference to the accompanying drawings and embodiments.

[0017] Example 1:

[0018] This embodiment includes a clip for a small photoelectric coupler chip burn-in test, the overall structure of which is as follows: Figure 1 As shown, the perspective view is as Figure 2 As shown, it includes: a movable handle, a spring, a fixed handle, a connecting rod, a slider, a sleeve, a clamping plate and an insertion needle; Figure 2 The middle dotted line indicates the active portion of the access clip designed in the present invention.

[0019] Hinges are provided at both ends of the connecting rod. One end of the connecting rod is connected to the movable handle and the other end is connected to the slider through the hinge.

[0020] In this embodiment, the connecting rod has 8mm diameter hemispheres at its upper and lower ends. At their centers are hinge holes with a diameter of 2mm, centered 62mm apart. Below the hinge holes are 3mm deep grooves for connecting with the movable handle and slider. Excluding the spherical portions at the upper and lower ends, the connecting rod is a square cylinder with an 8mm side length. Excluding the portion connecting to the connecting rod, the slider is a 10mm diameter, 15mm high cylinder. The slider also features a 2mm diameter, 5mm deep pinhole for securing the insertion needle.

[0021] The connecting rod and the slider pass through the sleeve, the fixed handle and the clamping plate are respectively fixed on both ends of the sleeve, a strip groove is provided on the side wall of the sleeve, the insertion needle passes through the strip groove and is fixed to the slider.

[0022] The movable handle and the fixed handle form a lever structure through a hinge. The lever structure is used to realize the movement of the slider along the sleeve, and the spring is used to reset the lever structure.

[0023] In this embodiment, the movable handle consists of a horizontal section and an inclined section. The horizontal section is equipped with two hinges, connecting to the connecting rod and the fixed handle respectively. Specifically, the movable handle is a column 100mm long and 10mm wide. The horizontal section is 9.5mm long, the inclined section is 100mm long, the two hinge holes are 15mm apart, and the hinge holes have a diameter of 2mm.

[0024] The fixed handle is a column with a length of 100 mm, a width of 10 mm and a thickness of 10 mm. In this embodiment, the maximum movable angle between the movable handle and the fixed handle is 30°. For easy gripping, the maximum distance between the inclined section of the movable handle and the fixed handle is 50 mm, and the included angle is not less than 10°.

[0025] The spring is arranged on the fixed handle at a distance of 37.5 mm from the sleeve. The spring selected in this embodiment has an outer diameter of 8 mm, an inner diameter of 6 mm, a pitch of 3 mm, and a free height of 50 mm.

[0026] The length of the insertion needle is 207 mm and the diameter is 2 mm; the head of the insertion needle is cylindrical and the tail 10 mm is conical. The head is used to insert into the pin hole on the slider, and the conical insertion needle is used to more conveniently insert into the reserved through hole; the clamping plate is 202 mm long, 8 mm wide and 3 mm thick; the distance between the insertion needle and the clamping plate does not exceed the thickness of the coupler to be clamped. In this embodiment, the distance between the insertion needle and the clamping plate does not exceed 3 mm.

[0027] The sleeve is a hollow square cylinder, 15mm long, 15mm wide, and 80mm high. A cylindrical hole, 11mm in diameter, is located in the center of the sleeve to restrict the movement of the slider along the sleeve. In this embodiment, a strip groove, 8mm wide and 3mm high, is located below the clamping plate. The insertion needle passes through the strip groove and is inserted into the pin hole of the slider.

[0028] The insertion needle and the clamping plate are arranged opposite to each other, and the movable handle and the fixed handle are arranged opposite to each other, that is, the insertion needle and the clamping plate are in the same vertical plane, and the movable handle and the fixed handle are in the same vertical plane.

[0029] The movable handle, spring, fixed handle, connecting rod, slider and sleeve are made of 304 stainless steel, and the clamping plate and insertion needle are made of 316 stainless steel.

[0030] Specifically, 304 stainless steel has excellent corrosion resistance. It contains 18% chromium and 8% nickel, which can form a dense oxide film on the surface, making it corrosion-resistant and resistant to erosion by the atmosphere, water, and some weak acids and alkalis. It has good toughness and is not easy to break. At the same time, it has high strength and can withstand a certain amount of pressure and weight. Its smooth surface makes it easy to clean and maintain.

[0031] 316 stainless steel adds molybdenum to 304 stainless steel, which has better resistance to pitting and crevice corrosion and can withstand more severe environments. When in contact with aging experimental chips, usually in a high temperature environment of 125℃ to 150℃, 316 stainless steel can still maintain good strength and stability in high temperature environments, and will not cause scratches when in contact with the chip, and will not cause damage to the gold layer of the tube shell.

[0032] Furthermore, the movable handle, the fixed handle, the sleeve and the clamping plate are provided with chamfers to prevent the aging experimental chip from being bumped and scratched.

[0033] In this embodiment, 2mm rounded corners are provided on the four edges of the movable handle, the fixed handle, the sleeve and the clamping plate, and 5mm rounded corners are provided on the tail end.

[0034] like Figure 3 When using the retrieval clamp designed for the burn-in test of small optocoupler chips, the insertion needle is inserted into the strip notch reserved on the burn-in seat. The movable handle compresses the spring, and the lever structure formed with the fixed handle drives the connecting rod. The slider at the other end of the connecting rod moves along the sleeve, driving the insertion needle to move toward the clamping plate. The chip is clamped and taken out between the insertion needle and the clamping plate, completing the chip removal for the burn-in test. In this embodiment, the strip notch reserved on the burn-in seat is 20mm long and 2mm wide. When using the retrieval clamp, Figure 4 The middle support point is supported on the aging plate to form a lever to further help clamp the chip.

[0035] Testing has shown that fully fitting a single eight-pin coupler chip into the burn-in socket requires a force of 2 N to remove. The extraction clamp provided in this embodiment for burn-in testing of small optocoupler chips can hold up to five coupler chips at a time, requiring a minimum force of 10 N applied to the end of the insertion pin without significant deformation. Calculations indicate that a 200 mm long 316 stainless steel insertion pin would require a force of 40 N before significant deformation occurs, thus satisfying the application scenario.

[0036] Example 2:

[0037] This embodiment provides a clip for use in burn-in testing of small optocoupler chips. The difference from embodiment 1 is that the tail of the insertion needle in this embodiment is hemispherical, which can further prevent the chip from being scratched.

[0038] It should be noted that the above only describes some embodiments of the present invention. For those skilled in the art, it is conceivable that various changes, modifications, substitutions and deformations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents, and the above-mentioned actions should be covered within the scope of protection of the present invention.

[0039] In addition, in the above description of the embodiments, unless otherwise expressly specified or limited, the terms "extract", "take", "use", "grip", "place", etc. should be understood in a broad sense; the terms "upper", "lower", "vertical", "inner", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use. They are used only to facilitate the description of the invention and simplify the description, and do not limit or imply that the device or component referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore should not be understood as limiting the invention; the term "vertical" does not mean that the component must be absolutely vertical, but can be slightly tilted. For example, "vertical" only means that its direction is more vertical than "horizontal", and does not mean that the structure must be completely vertical, but can be slightly tilted. The terms "disposed", "movable", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or a physical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be internal communication between two components. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

Claims

1. A clip for use in burn-in testing of small optocoupler chips, characterized in that: include: A movable handle, a spring, a fixed handle, a connecting rod, a slider, a sleeve, a clamping plate and an insertion needle; Among them, hinges are provided at both ends of the connecting rod, through which one end of the connecting rod is connected to the movable handle and the other end is connected to the slider; The connecting rod and the slider pass through the sleeve, and the fixed handle and the clamping plate are respectively fixed at both ends of the sleeve. A strip groove is provided on the side wall of the sleeve, and the insertion needle passes through the strip groove and is fixed to the slider; The movable handle and the fixed handle form a lever structure through a hinge. The lever structure is used to realize the movement of the slider along the sleeve, and the spring is used to reset the lever structure.

2. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The insertion needle is arranged opposite to the clamping plate, and the movable handle is arranged opposite to the fixed handle.

3. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The movable handle, spring, fixed handle, connecting rod, slider and sleeve are made of 304 stainless steel.

4. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The clamping plate and insertion needle are made of 316 stainless steel.

5. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The movable handle, fixed handle, sleeve and clamping plate are provided with chamfers to prevent the aging experimental chip from being bumped and scratched.

6. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The movable handle compresses the spring and drives the connecting rod through the lever structure formed with the fixed handle. The slider at the other end of the connecting rod moves along the sleeve, driving the insertion needle to move toward the clamping plate to complete the clamping of the aging experiment chip.

7. The clip for miniature optocoupler chip burn-in test according to claim 1, characterized in that: The distance between the clamping plate and the insertion needle does not exceed the thickness of the coupler to be clamped.

8. The clip for miniature photocoupler chip burn-in test according to claim 1, characterized in that: The distance between the movable handle and the fixed handle shall not exceed 50mm.

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