Hall sensor test system and method

Abstract

The invention provides a Hall sensor test system and method, the system comprises a test device and an upper computer device which are in communication connection, and the test device comprises a control module, and a magnetic field simulation module, a counting module and a timing module which are respectively connected with the control module. The magnetic field simulation module can operate under the control of the control module and flexibly simulate a magnetic field environment acting on the Hall sensor; the counting module and the timing module count multi-dimensional index data for evaluating the service life of the Hall sensor to be tested; and the upper computer device is used for analyzing the index data transmitted by the control module so as to generate a life test report. According to the invention, the control module is connected with each module to realize efficient integrated control of the testing device, a complex working condition is cooperatively simulated through a reasonable connection relationship among the modules to test the Hall sensor, and then analysis of index data, namely remote and intelligent control of the testing process, is realized through the upper computer device. The test efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of sensor testing, and in particular to a Hall sensor testing system and method. Background Art

[0002] Hall effect sensors currently play an important role in numerous fields. Accurate performance testing is crucial for their R&D, production, and quality control. However, existing Hall effect sensor testing equipment has numerous limitations. For example, traditional Hall effect sensor testing equipment has limited methods for generating magnetic fields, making it difficult to simulate complex, real-world magnetic field environments, thus affecting the comprehensiveness and accuracy of test results.

[0003] Therefore, the existing technology has defects and needs to be improved and developed. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a Hall sensor testing system and method for the above-mentioned defects of the prior art, which can flexibly simulate complex magnetic field environments and improve the testing accuracy of Hall sensors.

[0005] The technical solutions adopted by the present invention to solve the technical problems are as follows:

[0006] In a first aspect, the present invention discloses a Hall sensor testing system, comprising:

[0007] Communication connection between the test device and the host device;

[0008] The testing device comprises a control module and a magnetic field simulation module, a counting module and a timing module respectively connected to the control module;

[0009] The control module is used to control the magnetic field simulation module to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to the control instructions issued by the host computer device, and the magnetic field environment acts on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested;

[0010] The counting module is connected to the Hall sensor to be tested, and is used to count the life index of the Hall sensor to be tested during the life test process and transmit it to the control module;

[0011] The timing module is used to record the total life test duration of the Hall sensor to be tested in real time and transmit it to the control module;

[0012] The host computer device is used to analyze the total life test duration and the life index transmitted from the control module in the test device to generate a corresponding life test report.

[0013] Optionally, the testing device further includes:

[0014] A wireless communication module connected to the control module, the wireless communication module is used to provide a wireless communication network so that the control module in the test device can communicate with the host device through the wireless communication network.

[0015] Optionally, the testing device further includes:

[0016] a signal acquisition module connected to the control module and the Hall sensor to be tested, the signal acquisition module being configured to acquire signal data from the Hall sensor to be tested and transmit the signal data to the control module; the signal data being an electrical signal generated by the Hall sensor to be tested when operating in the magnetic field environment, and a digital signal obtained by sequentially amplifying, filtering, and digitizing the electrical signal;

[0017] The control module is further configured to sort the signal data and transmit the sorted signal data to the host computer device.

[0018] Optionally, the magnetic field simulation module is composed of a timer, a motor, a motor drive board, a rotating frame and a magnetic field coil;

[0019] The timer is connected to the motor drive board, the motor is connected to the motor drive board and the rotating frame respectively, and the magnetic field coil is installed on the rotating frame.

[0020] Optionally, the motor drive board is connected to the control module, and the control module is used to control the motor drive board to drive the motor to operate at the motor rotation cycle set by the timer according to the control instruction, so that the rotating frame rotates, and under the rotation of the rotating frame, magnetic fields with different magnetic field directions and different magnetic field strengths are generated by the magnetic field coil to obtain a magnetic field environment acting on the Hall sensor to be tested, so as to simulate the actual working conditions of the Hall sensor to be tested during the life test of the Hall sensor to be tested.

[0021] Optionally, the motor is a motor with adjustable speed and direction.

[0022] Optionally, the testing device further includes:

[0023] A posture adjustment module connected to the control module is used to carry the Hall sensor to be tested and adjust the position and posture of the Hall sensor to be tested.

[0024] Optionally, the host computer device is further configured to provide a visual interactive interface, so as to set test parameters through the visual interactive interface, generate the control instructions, and display the life test report.

[0025] Optionally, the testing device further includes a power supply module and a switch module connected to the control module;

[0026] The power supply module is used to provide power to the testing device;

[0027] The switch module is used to control the start and stop of the testing device.

[0028] In a second aspect, the present invention further discloses a Hall sensor testing method, which is applied to the Hall sensor testing system described above, and the method comprises:

[0029] The control module of the test device in the Hall sensor test system controls the magnetic field simulation module to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to the control instructions issued by the host computer device. The magnetic field environment acts on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested;

[0030] The counting module of the test device in the Hall sensor test system is used to count the life index of the Hall sensor to be tested during the life test process and transmit the counted data to the control module;

[0031] The total life test duration of the Hall sensor to be tested is recorded in real time by the timing module of the test device in the Hall sensor test system and transmitted to the control module;

[0032] The host computer device in the Hall sensor test system analyzes the total life test duration and the life index transmitted from the control module in the test device to generate a corresponding life test report.

[0033] In a third aspect, the present invention discloses a terminal, which includes: a memory, a processor, and a Hall sensor test stored in the memory and runnable on the processor, wherein the Hall sensor test implements the steps of the Hall sensor test method described above when executed by the processor.

[0034] In a fourth aspect, the present invention discloses a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and the computer program can be executed to implement the steps of the Hall sensor testing method as described above.

[0035] The present invention provides a Hall sensor testing system and method, the Hall sensor testing system comprising: a test device and a host computer device in communication connection; the test device comprising a control module and a magnetic field simulation module, a counting module and a timing module respectively connected to the control module; the control module is used to control the magnetic field simulation module to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to a control instruction issued by the host computer device, the magnetic field environment acting on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested; the counting module is connected to the Hall sensor to be tested, the counting module is used to count the life index of the Hall sensor to be tested during the life test and transmit it to the control module; the timing module is used to record the total life test time of the Hall sensor to be tested in real time and transmit it to the control module; the host computer device is used to analyze the total life test time and the life index transmitted from the control module in the test device to generate a corresponding life test report. It can be seen from this that the present invention tests the Hall sensor to be tested through a test device that integrates a control module, a magnetic field simulation module, a counting module and a timing module. In the test device, the magnetic field simulation module can operate under the precise control of the control module to simulate various loads or motion environments faced by the Hall sensor in actual application scenarios, that is, it can flexibly simulate complex magnetic field environments. The statistical data of the counting module and the timing module in the test device provide multi-dimensional quantitative index data for a comprehensive and scientific evaluation of the life of the Hall sensor to be tested, thereby improving the test accuracy of the Hall sensor. The upper computer device then conducts in-depth mining and analysis of the index data output by the test device during the test, which can not only generate a detailed and professional life test report, but also make intelligent decisions based on the life test report to guide the adjustment and optimization of the test process, thereby realizing remote and intelligent control of the test process and greatly improving the test efficiency and convenience. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 This is a schematic diagram of the structure of the Hall sensor testing system of the present invention;

[0037] Figure 2 This is a schematic structural diagram of a specific Hall sensor testing system disclosed in the present invention;

[0038] Figure 3 This is another specific schematic diagram of the structure of the Hall sensor test system disclosed in the present invention;

[0039] Figure 4 This is a schematic diagram of a visualization interface disclosed in the present invention;

[0040] Figure 5This is a schematic structural diagram of a specific Hall sensor testing system disclosed in the present invention;

[0041] Figure 6 This is a flow chart of a preferred embodiment of the Hall sensor testing method of the present invention;

[0042] Figure 7 It is a functional principle block diagram of a preferred embodiment of the terminal in the present invention. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solutions and advantages of the present invention more clear and distinct, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0044] The embodiment of the present application discloses a Hall sensor testing system, such as Figure 1 As shown, the test system includes: a test device 1 and a host device 2 that are communicatively connected;

[0045] The testing device 1 comprises a control module 11 and a magnetic field simulation module 12, a counting module 13 and a timing module 14 respectively connected to the control module;

[0046] The control module 11 is used to control the magnetic field simulation module 12 to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to the control instructions issued by the host computer device 2. The magnetic field environment acts on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested;

[0047] The counting module 13 is connected to the Hall sensor to be tested, and is used to count the life index of the Hall sensor to be tested during the life test process and transmit it to the control module 11;

[0048] The timing module 14 is used to record the total life test duration of the Hall sensor to be tested in real time and transmit it to the control module 11;

[0049] The host computer device 2 is used to analyze the total life test duration and the life index transmitted from the control module 11 in the test device 1 to generate a corresponding life test report.

[0050] In this embodiment, the control module 11 serves as the core control unit of the test device 1 and is connected to the magnetic field simulation module 12, the counting module 13, and the timing module 14. The control module 11 receives data and signals from each module, processes and analyzes them, controls the operation of other modules according to preset programs, preset parameters, or received instructions, and coordinates data collection and transmission. The control module 11 can be an MCU controller equipped with a high-performance microcontroller chip, equipped with multiple communication interfaces and data processing capabilities.

[0051] It should be noted that the Hall sensor to be tested, i.e. the object of the test, is installed in a specific test environment and works under the action of equipment simulating actual working conditions, outputting electrical signals reflecting its working status, which are transmitted to the counting module 13 and the control module 11 for processing. In addition, the control module 11 is used as the core control hub of the entire test device 1. The control module 11 closely connects the various modules together, thereby realizing efficient integrated control of the test device 1. The control module 11 has powerful data processing and logic control capabilities, can quickly receive data and signals from various modules, perform real-time analysis and processing, and accurately control the working status and operation rhythm of other modules according to preset programs and test parameters. In other words, using the control module 11 as the core control hub of the entire test device 1 can overcome the problems of decentralized control and difficulty in coordination between modules in traditional test devices, ensure the stability, reliability and efficiency of the operation of the entire test device, and improve the overall performance of the system.

[0052] In this embodiment, the magnetic field simulation module 12 in the test device 1 operates under the control of the control module 11. During the life test of the Hall sensor to be tested, a magnetic field environment with different magnetic field directions and magnetic field strengths can be provided as required to simulate the load or motion environment of the Hall sensor in actual application, that is, to simulate the actual working environment (actual working conditions) of the Hall sensor. Specifically, the magnetic field simulation module 12 can be composed of a timer 121, a motor 122, a motor drive board 123, a rotating frame 124 and a magnetic field coil 125; the timer 121 is connected to the motor drive board 123, the motor 122 is connected to the motor drive board 123 and the rotating frame 124 respectively, and the magnetic field coil 125 is installed on the rotating frame 124. The motor drive board 123 in the magnetic field simulation module 12 is connected to the control module 11. The control module 11 is specifically used to control the motor drive board 123 to drive the motor 122 to operate under the motor rotation cycle set by the timer 121 according to the control instruction issued by the user through the host computer device 2, so that the rotating frame 124 rotates, and under the rotation of the rotating frame 124, a magnetic field with different magnetic field directions and different magnetic field strengths is generated by the magnetic field coil 125, so as to obtain a magnetic field environment acting on the Hall sensor to be tested, so as to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested. And the motor 122 can be a motor with adjustable speed and direction. Specifically, it can be connected to the MCU controller through the motor drive circuit so that the motor 122 can operate under the precise control of the control module 11, simulating the various loads or motion environments faced by the Hall sensor in actual application scenarios. By flexibly adjusting parameters such as the speed and direction of the motor, the working conditions of the sensor are changed, the aging process is accelerated, and the life test cycle is greatly shortened.

[0053] It can be understood that the motor 122 is connected to the power supply and the motor drive board 123, and the timer 121 adjusts the rotation period of the motor 122, such as the time for one rotation, to determine the speed of the magnetic sound change. According to the test requirements, multiple magnetic field coils 125 work together, and different magnetic field coil 125 control methods are used to achieve different magnetic field environments at each position, so that the magnetic field of each axis on the rotating frame 124 is different. Through rotation, different magnetic fields pass through the test area, so that the Hall sensor to be tested can be tested under different magnetic fields.

[0054] For example, the timer 121 is started, and the timer 121 sets the motor rotation cycle (such as T = 1 second / cycle). The motor drive board 123 receives the pulse signal, amplifies the pulse signal, and drives the motor 122 to rotate the rotating frame 124 at a fixed speed. In the coordinated control of the magnetic field coil 125, single coil control or multi-coil coordination can be performed. For example, the local magnetic field strength can be changed by adjusting the current of a single coil (such as the larger the current, the stronger the magnetic field). For another example, through multi-coil coordination, coil A passes a positive current to generate an N-pole magnetic field, and coil B passes a reverse current to generate an S-pole magnetic field. When the rotating frame rotates, the test area alternately passes through coils A and B to form an alternating magnetic field, or multiple coils are distributed according to spatial angles (such as 0°, 90°, 180°), and the current size is controlled separately to make the magnetic field strength of each axis (x, y, z axis) on the rotating frame 124 different, forming a three-dimensional magnetic field gradient change during rotation. The magnetic field is linked to the Hall sensor test. When the rotating frame 124 rotates, the magnetic fields of different coils pass through the test area in sequence. The Hall sensor detects the intensity and direction changes of the magnetic field in real time and outputs electrical signals for data collection and analysis.

[0055] That is to say, the operation of the motor is controlled according to the instructions of the upper computer device 2, and the working state of the Hall sensor to be tested is adjusted. That is, by adjusting the speed, direction and other parameters of the motor, the working conditions of the sensor can be changed, and the actual working conditions of the Hall sensor to be tested can be more realistically simulated, the aging process of the sensor can be accelerated, and the life test cycle can be shortened.

[0056] The counting module 13 in this embodiment is connected to the Hall sensor to be tested. By counting the life indicators of the Hall sensor to be tested during the life test, it provides important data basis for evaluating the life of the Hall sensor to be tested. For example, the counting module 13 can be used to count the number of triggers or working cycles of the Hall sensor to be tested during the life test, and then transmit the trigger number or working cycle number to the control module 11. The counting module 13 can be implemented using a counter chip, so that it can accurately count the trigger signals of the Hall sensor and obtain the trigger number or working cycle number.

[0057] In this embodiment, timing module 14, connected to control module 11, records the total duration of the Hall effect sensor life test in real time. This precise timing data facilitates analysis of sensor performance changes over time, providing a time-based reference for evaluating the life of the Hall effect sensor under test. Timing module 14 can utilize a high-precision clock chip to accurately record test time, obtain the total duration of the life test, and then transmit this total duration to control module 11.

[0058] It can be understood that the counting module 13 and the timing module 14 respectively perform accurate statistics and records on the life index and test time of the Hall sensor, providing multi-dimensional quantitative index data for a comprehensive and scientific evaluation of the life of the Hall sensor. Compared with the traditional single simulation method, this multi-module collaborative working method can simulate complex actual working conditions more realistically and comprehensively.

[0059] As a specific embodiment, the test device 1 may further include: a wireless communication module 15 connected to the control module 11, the wireless communication module 15 is used to provide a wireless communication network so that the control module 11 in the test device 1 can communicate with the host device 2 via the wireless communication network. It can be understood that the wireless communication module 15 is connected to the control module 11 and is responsible for transmitting the data collected by the test device 1 to the host device 2 via a wireless communication network (such as a wireless WiFi network), and at the same time receiving the control instructions sent by the host device 2 and transmitting them to the control module 11, thereby realizing data interaction and remote control between the test device 1 and the host device 2. Among them, the wireless communication module 15 can be a WIFI module that complies with the IEEE802.11 standard to ensure stable data transmission.

[0060] That is, Figure 2 As shown, the Hall sensor test system includes: a test device 1 and a host computer device 2 that are communicatively connected; the test device 1 includes a control module 11 and a magnetic field simulation module 12, a counting module 13, a timing module 14 and a wireless communication module 15 that are respectively connected to the control module.

[0061] As another specific embodiment, the testing device 1 may further include: a control module 11 and a signal acquisition module 16 connected to the Hall sensor to be tested, the signal acquisition module 16 being used to collect signal data of the Hall sensor to be tested and transmit the signal data to the control module 11; the signal data is an electrical signal generated when the Hall sensor to be tested works in a magnetic field environment, and a digital signal is obtained by amplifying, filtering and digitizing the electrical signal in sequence.

[0062] Accordingly, the control module 11 is further configured to organize the signal data and transmit the organized signal data to the host device 2. Specifically, the wireless communication module 15 provides a wireless communication network to transmit the organized signal data to the host device 2.

[0063] It can be understood that in the magnetic field environment configured by the magnetic field simulation module 12, the Hall sensor generates a weak electrical signal, which is amplified and filtered by the signal conditioning circuit, and digitized by the A / D conversion circuit. It is then collected by the signal acquisition module 16 and transmitted to the microcontroller in the control module 11. After the microcontroller performs preliminary processing on the data, it sends the data to the host computer device 2 through the wireless communication module 15.

[0064] That is, Figure 3 As shown, the Hall sensor test system includes: a test device 1 and a host computer device 2 that are communicatively connected; the test device 1 includes a control module 11 and a magnetic field simulation module 12, a counting module 13 and a timing module 14, a wireless communication module 15 and a signal acquisition module 16 that are respectively connected to the control module.

[0065] Furthermore, in the above embodiment, the test device 1 may further specifically include: a posture adjustment module 17 connected to the control module, the posture adjustment module 17 being used to carry the Hall sensor to be tested and adjust the position and posture of the Hall sensor to be tested. It is understandable that the posture adjustment module 17 may be a slider, the Hall sensor to be tested is mounted on the slider, and the posture of the Hall sensor to be tested is adjusted according to the size of the Hall sensor to be tested and the position and posture required for the test, and then fixed after the adjustment is completed. For example, for a Hall sensor with a special angle installation requirement, the position can be finely adjusted to enable the Hall sensor to achieve an accurate installation angle.

[0066] In the above embodiment, the test device 1 may further include a power module 18 and a switch module 19 connected to the control module 11 ; the power module 18 is used to provide power to the test device 1 ; the switch module 19 is used to control the start and stop of the test device 1 .

[0067] As will be appreciated, power module 18 provides a stable power supply for the entire test device 1. Power module 18 has voltage regulation and stabilization functions, ensuring that each module in test device 1 operates properly at the appropriate voltage. Switch module 19 is used to control the start and stop of test device 1, facilitating operator operation.

[0068] The host computer device 2 in this embodiment communicates with the test device 1 via the wireless communication network provided by the wireless communication module 15. The host computer device 2 receives various data from the test device 2, such as the number of triggers of the counting module 13, the time data of the timing module 14, the output signal of the Hall sensor, etc., and uses the built-in data analysis algorithm to perform in-depth analysis on these data to generate a detailed life test report. In addition, the host computer device 2 is also used to provide a visual interactive interface so that the user can set the test parameters through the visual interactive interface to generate control instructions and display the life test report. For example, the operator can remotely set the test parameters, such as the speed range of the motor, the total test time, the data acquisition frequency, the working mode of the Hall sensor, etc., through the visual interactive interface of the computer host computer, and monitor the test process in real time. That is, a special test software is installed on the host computer device 2, and the test software has data acquisition, analysis, display and remote control functions.

[0069] It is understandable that after receiving the data, the host device 2 uses the built-in AI algorithm model to analyze and process the data of the entire test process. For example, by learning and comparing a large amount of test data, it can determine whether the Hall sensor has potential fault hazards, predict its performance under different working conditions, etc., and generate a detailed life test report, including the sensor's trigger count statistics, performance change trends, life assessment results, etc. For example, see Figure 4 As shown, operators can view, print, or store detailed test reports on the visual interactive interface of the host computer device 2, providing a reference for subsequent product development and quality improvement. At the same time, control instructions are sent through the visual interactive interface and transmitted to the microcontroller of the control module via the wireless communication module 15. In turn, the microcontroller controls the operation of the magnetic field simulation module 12 and the posture adjustment module 17, enabling remote adjustment of test parameters and process control.

[0070] It should also be noted that the wireless communication module 15 and the host device 2 construct an efficient IoT communication architecture, enabling remote monitoring and intelligent control based on the IoT. The wireless communication module 15 enables stable and real-time data exchange between the test device 1 and the host device 2. The operator can set various test parameters such as motor speed, test time, sensor operating mode, etc. through the computer host's visual interactive interface, and monitor various data during the test in real time, such as sensor output signal, trigger count, and test duration.

[0071] As can be seen from the above, in the embodiment of the present application, the Hall sensor to be tested is tested by a test device integrating a control module, a magnetic field simulation module, a counting module and a timing module. In the test device, the magnetic field simulation module can operate under the precise control of the control module to simulate various loads or motion environments faced by the Hall sensor in actual application scenarios, that is, it can flexibly simulate complex magnetic field environments, and the statistical data of the counting module and the timing module in the test device provide multi-dimensional quantitative data indicators for a comprehensive and scientific evaluation of the life of the Hall sensor to be tested, thereby improving the test accuracy of the Hall sensor. The data output by the test device during the test is deeply mined and analyzed by the upper computer device, which can not only generate a detailed and professional life test report, but also make intelligent decisions based on the life test report to guide the adjustment and optimization of the test process, thereby realizing remote and intelligent control of the test process and greatly improving the test efficiency and convenience.

[0072] For example, the Hall sensor test system can be specifically composed of a control module, a magnetic field simulation module, a Hall sensor, a counting module, a timing module, a computer host, a power supply and switch, and a wireless communication module. The control module serves as the core control hub of the entire test device. The control module tightly connects the various modules together, achieving efficient integrated control of the test device. Through the reasonable connection relationship between multiple modules, the Hall sensor can be tested by collaboratively simulating complex working conditions. Figure 5 As shown, the test device 1 in the Hall sensor test system can flexibly simulate complex magnetic field environments and adapt to various Hall sensors. The host computer device 2, with its built-in AI algorithm module, enables efficient data acquisition and analysis, supports remote monitoring, and intelligent control, improving the accuracy and reliability of Hall sensor life testing. It also enhances the convenience and intelligence of Hall sensor testing, providing more effective data support for product development and quality control. For example, the Baidu Smart Cloud-based Hall sensor detection device monitoring solution uses Hall sensors, as core components for magnetic field detection, to be widely used in scenarios such as motor speed monitoring, position feedback, and device status sensing. Advanced data analysis algorithms enable in-depth analysis and mining of massive amounts of collected test data. By analyzing the changing trends of Hall sensor output signals, modeling the relationship between trigger counts and time, and combining historical data with fault pattern recognition, it can not only accurately assess the current life state of the Hall sensor but also predict its remaining lifespan, providing a valuable reference for product development, quality control, and maintenance decisions. This intelligent data analysis and lifespan assessment method breaks the limitations of traditional reliance on experience and simple data statistics, making test results more scientific, accurate, and reliable. That is, by combining the technical capabilities of Baidu Smart Cloud, a full-link solution can be built from sensor data collection, cloud-based intelligent analysis to visual monitoring, to achieve real-time monitoring and intelligent early warning of device status. Among them, Baidu Smart Cloud IoT Hub supports the MQTT protocol to access Hall sensor data, that is, after collecting Hall sensor data through Modbus, it forwards it to the cloud, pre-processes the data locally (such as outlier filtering), reduces the pressure on the cloud, or processes the sensor data stream (such as magnetic field strength, switch state change frequency) in real time through the intelligent big data platform. Alternatively, through the AI ​​development platform, based on Baidu PaddlePaddle training, anomaly detection models (autoencoders) can be used to identify sudden changes in sensor data and use preset time series data to predict AI capabilities.

[0073] In one embodiment, if Figure 6 As shown, based on the above-mentioned Hall sensor testing system, the present invention also provides a Hall sensor testing method, which is applied to the above-mentioned Hall sensor testing system, including:

[0074] Step S11: controlling, by the control module of the test device in the Hall sensor test system, the magnetic field simulation module to configure magnetic field environments with different magnetic field directions and different magnetic field intensities according to the control instructions issued by the host computer device, so that the magnetic field environments act on the Hall sensor to be tested to simulate the actual working conditions of the Hall sensor to be tested during the life test of the Hall sensor to be tested;

[0075] Step S12: Counting the life index of the Hall sensor to be tested during the life test process through the counting module of the test device in the Hall sensor test system, and transmitting the counted data to the control module;

[0076] Step S13: Recording the total life test duration of the Hall sensor to be tested in real time through the timing module of the test device in the Hall sensor test system, and transmitting the result to the control module;

[0077] Step S14: Analyze the total life test duration and the life index transmitted from the control module in the test device through the host computer device in the Hall sensor test system to generate a corresponding life test report.

[0078] For the specific content of the above-mentioned Hall sensor testing method, please refer to the detailed introduction of the Hall sensor testing system mentioned above, which will not be repeated here.

[0079] Figure 7 This is a schematic diagram of the structure of a terminal provided in an embodiment of the present application. The terminal may include:

[0080] Memory 501 , processor 502 , and computer programs stored in the memory 501 and executable on the processor 502 .

[0081] When the processor 502 executes the program, the Hall sensor testing method provided in the above embodiment is implemented.

[0082] Furthermore, the terminal further includes:

[0083] The communication interface 503 is used for communication between the memory 501 and the processor 502 .

[0084] The memory 501 is used to store computer programs that can be run on the processor 502 .

[0085] The memory 501 may include a high-speed RAM memory, and may also include a non-volatile memory (non-volatile memory), such as at least one disk memory.

[0086] If the memory 501, processor 502, and communication interface 503 are implemented independently, the communication interface 503, memory 501, and processor 502 can be interconnected via a bus to enable communication between them. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Buses can be classified as address buses, data buses, control buses, etc. For ease of illustration, the figure shows only one line, but this does not mean that there is only one bus or only one type of bus.

[0087] Optionally, in a specific implementation, if the memory 501, the processor 502 and the communication interface 503 are integrated on a chip, the memory 501, the processor 502 and the communication interface 503 can communicate with each other through an internal interface.

[0088] The processor 502 may be a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0089] This embodiment further provides a computer-readable storage medium having a computer program stored thereon. When the program is executed by a processor, the above-mentioned Hall sensor testing method is implemented.

[0090] Other embodiments of the present invention will readily occur to those skilled in the art after considering the specification and practicing the invention disclosed herein. The present invention is intended to cover any variations, uses, or adaptations of the present invention that follow the general principles of the invention and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered as exemplary only, with the true scope and spirit of the invention being indicated by the claims.

[0091] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example" or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or N embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0092] The logic and / or steps represented in the flowchart or otherwise described herein may be considered, for example, as a sequenced list of executable instructions for implementing logical functions, and may be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processor, or other system that can read and execute instructions from an instruction execution system, apparatus, or device).

[0093] It should be understood that various parts of the present application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiment, the N steps or methods can be implemented using software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented using hardware, as in another embodiment, any one of the following technologies known in the art or a combination thereof can be used to implement: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application-specific integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field-programmable gate array (FPGA), etc.

[0094] It should be understood that the application of the present invention is not limited to the above examples. For those skilled in the art, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to the present invention.

Claims

1. A Hall sensor testing system, characterized in that: include: Communication connection between the test device and the host device; The testing device comprises a control module and a magnetic field simulation module, a counting module and a timing module respectively connected to the control module; The control module is used to control the magnetic field simulation module to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to the control instructions issued by the host computer device, and the magnetic field environment acts on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested; The counting module is connected to the Hall sensor to be tested, and is used to count the life index of the Hall sensor to be tested during the life test process and transmit it to the control module; The timing module is used to record the total life test duration of the Hall sensor to be tested in real time and transmit it to the control module; The host computer device is used to analyze the total life test duration and the life index transmitted from the control module in the test device to generate a corresponding life test report.

2. The Hall sensor testing system according to claim 1, characterized in that: The testing device further includes: A wireless communication module connected to the control module, the wireless communication module is used to provide a wireless communication network so that the control module in the test device can communicate with the host device through the wireless communication network.

3. The Hall sensor testing system according to claim 1, characterized in that: The testing device further includes: a signal acquisition module connected to the control module and the Hall sensor to be tested, the signal acquisition module being configured to acquire signal data from the Hall sensor to be tested and transmit the signal data to the control module; the signal data being an electrical signal generated by the Hall sensor to be tested when operating in the magnetic field environment, and a digital signal obtained by sequentially amplifying, filtering, and digitizing the electrical signal; The control module is further configured to sort the signal data and transmit the sorted signal data to the host computer device.

4. The Hall sensor testing system according to claim 1, characterized in that: The magnetic field simulation module consists of a timer, a motor, a motor drive board, a rotating frame and a magnetic field coil; The timer is connected to the motor drive board, the motor is connected to the motor drive board and the rotating frame respectively, and the magnetic field coil is installed on the rotating frame.

5. The Hall sensor testing system according to claim 4, characterized in that: The motor drive board is connected to the control module. The control module is used to control the motor drive board to drive the motor to operate at the motor rotation cycle set by the timer according to the control instruction, so that the rotating frame rotates. Under the rotation of the rotating frame, magnetic fields with different magnetic field directions and different magnetic field strengths are generated by the magnetic field coil to obtain a magnetic field environment acting on the Hall sensor to be tested, so as to simulate the actual working conditions of the Hall sensor to be tested during the life test of the Hall sensor to be tested.

6. The Hall sensor testing system according to claim 5, characterized in that: The motor is a motor with adjustable speed and direction.

7. The Hall sensor testing system according to claim 1, characterized in that: The testing device further includes: A posture adjustment module connected to the control module is used to carry the Hall sensor to be tested and adjust the position and posture of the Hall sensor to be tested.

8. The Hall sensor testing system according to claim 1, characterized in that: The host computer device is further configured to provide a visual interactive interface so as to set test parameters through the visual interactive interface, generate the control instructions, and display the life test report.

9. The Hall sensor testing system according to claim 1, characterized in that: The testing device further includes a power supply module and a switch module connected to the control module; The power supply module is used to provide power to the testing device; The switch module is used to control the start and stop of the testing device.

10. A Hall sensor testing method, characterized in that: Applied to the Hall sensor testing system according to any one of claims 1 to 9, the method comprises: The control module of the test device in the Hall sensor test system controls the magnetic field simulation module to configure a magnetic field environment with different magnetic field directions and different magnetic field strengths according to the control instructions issued by the host computer device. The magnetic field environment acts on the Hall sensor to be tested to simulate the actual working condition of the Hall sensor to be tested during the life test of the Hall sensor to be tested; The counting module of the test device in the Hall sensor test system is used to count the life index of the Hall sensor to be tested during the life test process and transmit the counted data to the control module; The total life test duration of the Hall sensor to be tested is recorded in real time by the timing module of the test device in the Hall sensor test system and transmitted to the control module; The host computer device in the Hall sensor test system analyzes the total life test duration and the life index transmitted from the control module in the test device to generate a corresponding life test report.

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