High-Frequency and High-Speed ​​Switching Test System Based on Multi-Dimensional Fusion Analysis

Abstract

This invention relates to the field of electronic device testing technology, and more particularly to a high-frequency, high-speed switch testing system based on multi-dimensional fusion analysis. The system includes a multi-dimensional testing center, a test execution unit, a response acquisition unit, a progressive testing unit, a region positioning unit, a severity classification and tag acquisition unit, and a test feedback unit. The invention initially analyzes the test preconditions to reduce the interference of high-frequency, high-speed switch test preparation on subsequent tests. It evaluates the performance of the high-frequency, high-speed switch through information progression and comprehensive quantification to determine if its performance is abnormal. This achieves multi-dimensional collaborative testing of electrical performance, thermal characteristics, and environmental adaptability to improve test coverage and reliability. Furthermore, it analyzes from the perspective of feature extraction to determine fault location and type, and obtains the test feedback tag for the entire high-frequency, high-speed switch through comprehensive fault severity analysis.

Description

Technical Field

[0001] This invention relates to the field of electronic device testing technology, and in particular to a high-frequency, high-speed switching testing system based on multi-dimensional fusion analysis. Background Technology

[0002] In modern electronic devices, high-frequency and high-speed switches are widely used in fields such as communications, computers, and aerospace. With the continuous development of electronic technology, the performance requirements for high-frequency and high-speed switches are becoming increasingly stringent, such as switching speed, reliability, and stability. Therefore, accurate and comprehensive testing of high-frequency and high-speed switches has become particularly important.

[0003] However, traditional high-frequency and high-speed switch testing systems have the following shortcomings: the test parameters are singular, which cannot fully reflect the performance of the switch, resulting in low reliability of the test results. Furthermore, they lack in-depth analysis and fusion processing of test data, making it difficult to accurately locate the fault location of the high-frequency and high-speed switch. At the same time, it is difficult to visually display the fault location, fault type, and fault severity, and it is difficult to supervise the test preconditions, thus affecting the overall reliability and stability of the testing system.

[0004] To address the aforementioned technical shortcomings, a solution is proposed. Summary of the Invention

[0005] The purpose of this invention is to provide a high-frequency, high-speed switch testing system based on multi-dimensional fusion analysis to address the aforementioned technical deficiencies. This invention initially analyzes the pre-test conditions to reduce the interference of test preparation work on subsequent tests. It then evaluates the performance of the high-frequency, high-speed switch through information progression and comprehensive quantification to determine if its performance is abnormal. This achieves multi-dimensional collaborative testing of electrical performance, thermal characteristics, and environmental adaptability, thereby improving test coverage and the reliability of performance test results. Furthermore, it analyzes from the perspective of feature extraction to determine fault location and type. Through comprehensive fault severity analysis, it obtains the test feedback label for the entire high-frequency, high-speed switch, namely, fault location + target fault type + fault severity, providing data support for maintenance decisions.

[0006] The objective of this invention can be achieved through the following technical solution: a high-frequency and high-speed switch test system based on multi-dimensional fusion analysis, comprising a multi-dimensional test center, a test execution unit, a response acquisition unit, a progressive test unit, a region positioning unit, a degree division and label acquisition unit, and a test feedback unit;

[0007] Test Execution Unit: Performs test precondition discrimination analysis on the collected test preparation data to determine whether the condition feedback results of the test preparation data meet the standards;

[0008] Response acquisition unit: performs test response evaluation and analysis on the collected test system response data to determine whether the test system's test response capability is normal;

[0009] Diversified testing center: The collected electrical, thermal and environmental parameters are sent to the progressive testing unit for progressive performance testing and analysis, that is, to evaluate the performance of high-frequency and high-speed switches;

[0010] Regional positioning unit: It extracts and fuses features of electrical parameters, thermal parameters and environmental parameters to obtain time-frequency domain feature vectors, and further analyzes the time-frequency domain feature vectors to identify the target fault type of the location component and obtain a visual fault feature image;

[0011] When generating a visual feature image of a fault, the degree classification and label acquisition unit performs a weighted fusion analysis on the contact resistance deviation and temperature deviation of the fault location to obtain test feedback labels.

[0012] Preferably, the test prerequisite discrimination and analysis process is as follows: obtain the test preparation data of the high-frequency high-speed switch, which includes the test fixture, signal transmission cable, and parameter settings; obtain the condition feedback result of the test preparation data of the high-frequency high-speed switch, which includes qualified and unqualified; if the condition feedback result is qualified, a qualified feedback signal is generated; if the condition feedback result is unqualified, a unqualified feedback signal is generated.

[0013] Preferably, the specific test response evaluation and analysis process based on the feedback qualified signal is as follows: obtain the test system response data of the high-frequency high-speed switch, the test system response data includes information acquisition time and information transmission time; obtain the response evaluation result of the test system response data, the response evaluation result includes stability and fluctuation; if the response evaluation result is stable, a stable signal is generated; if the response evaluation result is fluctuating, an interference signal is generated.

[0014] Preferably, the progressive performance test and analysis process is as follows:

[0015] The collected electrical, thermal, and environmental parameters are preprocessed. Pre-set weighting factor coefficients are assigned to each electrical parameter, and the sum of the products of each electrical parameter and its corresponding pre-set weighting factor coefficient is set as the electrical reliability index. Pre-set weighting factor coefficients are assigned to each thermal parameter, and the sum of the products of each thermal parameter and its corresponding pre-set weighting factor coefficient is set as the thermal stability index. Pre-set weighting factor coefficients are assigned to each environmental parameter, and the sum of the products of each environmental parameter and its corresponding pre-set weighting factor coefficient is set as the environmental adaptability index.

[0016] Pre-set weighting factor coefficients are assigned to the electrical reliability index, thermal stability index, and environmental adaptability index. The sum of the products of the electrical reliability index, thermal stability index, and environmental adaptability index with their corresponding pre-set weighting factor coefficients is set as the reliability evaluation coefficient. The reliability evaluation coefficient is then processed to obtain a fault signal or a normal signal.

[0017] Preferably, the analysis process of the regional positioning unit is as follows:

[0018] The high-frequency high-speed switch is decomposed into multiple position components, and the electrical parameters, thermal parameters and environmental parameters of each position component are extracted. The feature extraction includes time domain features and frequency domain features. The time-frequency domain feature vector is obtained by fusing the time domain features and frequency domain features.

[0019] Historical fault data of high-frequency and high-speed switches are collected, and a fault identification model is trained using the historical fault data. Based on the fault identification model, the output results after obtaining the input time-frequency domain feature vector are obtained. The output results include the probability values ​​of each fault type. The fault type probability values ​​are then processed for discrimination. If the fault type probability value is less than the preset fault type probability value threshold, the corresponding component is determined to be normal. If the fault type probability value is greater than or equal to the preset fault type probability value threshold, the corresponding component is determined to be abnormal. At the same time, the fault type corresponding to the maximum value of the fault type probability value is set as the target fault type of the component.

[0020] Preferably, the basic information of the high-frequency high-speed switch is obtained through laser scanning technology. The basic information represents the size of each component, and a three-dimensional simulation image of the high-frequency high-speed switch is obtained based on the established spatial coordinate system.

[0021] Based on the location of the component corresponding to the target fault type, the location of the component corresponding to the target fault type is marked in red on the 3D simulation image;

[0022] The thermal feature image of the high-frequency high-speed switch is obtained, and the thermal feature image is preprocessed. Based on the preprocessed thermal feature image, the difference region between the thermal feature image and the standard thermal feature image is obtained, and the difference region between the preprocessed thermal feature image and the standard thermal feature image is set as the fault region.

[0023] Preferably, the fault area is marked on the 3D simulation image, and the fault area is compared and analyzed with the red mark. If the red mark belongs to the fault area, a positioning signal is generated, and the visual feature image of the fault after the fault area is marked is obtained. If the red mark does not belong to the fault area, a progressive verification signal is generated.

[0024] Preferably, the weighted fusion analysis process is as follows:

[0025] The location of the component whose fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault location, and the contact resistance deviation and temperature deviation of the fault location are obtained.

[0026] Pre-set weighting factor coefficients are assigned to the contact resistance deviation and temperature deviation. The sum of the products of the contact resistance deviation and temperature deviation with the pre-set weighting factor coefficients is set as the overall severity. The overall severity is then processed to obtain high severity, medium severity and low severity.

[0027] High severity, medium severity, and low severity are collectively referred to as fault severity. The fault location, target fault type, and fault severity are set as the test feedback label.

[0028] The beneficial effects of this invention are as follows:

[0029] (1) This invention initially analyzes the test prerequisites from the perspective of test conditions and further analyzes the test system response from the perspective of test conditions to ensure that the test prerequisites are met. At the same time, it reduces the interference of the test preparation work of high frequency and high speed switches on subsequent tests, which helps to provide data support and credibility for subsequent analysis. The performance of high frequency and high speed switches is evaluated by information progression and comprehensive quantification to determine whether the performance of high frequency and high speed switches is abnormal. That is, it realizes multi-dimensional collaborative testing of electrical performance, thermal characteristics and environmental adaptability to improve test coverage and improve the reliability of performance test results.

[0030] (2) This invention analyzes from the perspective of feature extraction to determine the fault location and fault type, and then performs reasonable and targeted fault management on high-frequency and high-speed switches based on the fault type and fault location. At the same time, it helps to improve the efficiency of fault diagnosis and location. Through the comprehensive severity analysis of the fault, the test feedback label of the entire high-frequency and high-speed switch is obtained, namely, fault location + target fault type + fault severity, which provides data support for maintenance decision-making. Attached Figure Description

[0031] The invention will now be further described with reference to the accompanying drawings;

[0032] Figure 1 This is a flowchart of the system of the present invention;

[0033] Figure 2 This is a partial reference analysis diagram of the present invention. Detailed Implementation

[0034] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0035] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments;

[0036] Example 1:

[0037] Please see Figures 1 to 2 As shown, the present invention is a high-frequency and high-speed switch test system based on multi-dimensional fusion analysis, including a multi-dimensional test center, a test execution unit, a response acquisition unit, a progressive test unit, a regional positioning unit, a degree division and label acquisition unit, and a test feedback unit. The multi-dimensional test center is bidirectionally connected to the test execution unit and the response acquisition unit. The multi-dimensional test center is unidirectionally connected to the regional positioning unit. The multi-dimensional test center is bidirectionally connected to the progressive test unit. The regional positioning unit is unidirectionally connected to the degree division and label acquisition unit. The degree division and label acquisition unit is unidirectionally connected to the test feedback unit.

[0038] The test execution unit is used to perform test precondition discrimination analysis on the collected test preparation data to determine whether all test preconditions are met, so as to ensure the stable execution of the entire test.

[0039] The response acquisition unit is used to evaluate and analyze the collected test system response data, determine whether the test system's test response capability is normal, and further improve the credibility of the entire test.

[0040] The specific test prerequisite discrimination and analysis process is as follows:

[0041] The test preparation data for the high-frequency and high-speed switch is obtained, including test fixtures, signal transmission cables, parameter settings, etc. The conditional feedback results of the test preparation data for the high-frequency and high-speed switch are obtained, including qualified and unqualified results. If the conditional feedback result is qualified, a qualified feedback signal is generated; if the conditional feedback result is unqualified, a unqualified feedback signal is generated. When an unqualified feedback signal is generated, the preset operation corresponding to the unqualified feedback signal is executed immediately to manage the test preparation data and ensure the test prerequisites.

[0042] This involves obtaining the results of various data in the test preparation data and inputting the results into the test execution unit for evaluation;

[0043] The specific test response evaluation and analysis process based on the feedback pass signal is as follows:

[0044] The test system response data of the high-frequency and high-speed switch is acquired, including information acquisition time and information transmission time. The response evaluation results of the test system response data are also acquired, including stability and fluctuation. If the response evaluation result is stable, a stable signal is generated; if the response evaluation result is fluctuating, an interference signal is generated. The diversified test center responds to the interference signal or the stable signal and immediately performs the preset warning operation corresponding to the interference signal or the stable signal. This allows for the rational management of the test preparation work of the high-frequency and high-speed switch, so as to reduce the interference of the test preparation work of the high-frequency and high-speed switch on the subsequent test.

[0045] In this embodiment of the invention, the analysis is conducted from the perspective of the test prerequisites of the test system, so as to reduce the interference of the test preparation work of high-frequency and high-speed switches on subsequent tests, and help to provide data support and credibility for subsequent analysis.

[0046] Example 2:

[0047] The diversified testing center is used to send the collected electrical, thermal, and environmental parameters to the progressive testing unit for progressive performance testing and analysis. This involves comprehensively and quantitatively evaluating the performance of the high-frequency, high-speed switch to determine if its performance is abnormal. The specific progressive performance testing and analysis process is as follows:

[0048] Electrical parameters, including contact resistance fluctuation coefficient and dielectric loss, are collected during the high-frequency and high-speed switch test period using a data acquisition instrument. Thermal parameters, including contact thermal resistance and encapsulation temperature, are collected during the high-frequency and high-speed switch test period using an infrared thermal imager. Environmental parameters, including ambient temperature and ambient humidity, are collected during the high-frequency and high-speed switch test period using temperature and humidity sensors.

[0049] Electrical, thermal, and environmental parameters are preprocessed, including noise reduction and normalization.

[0050] Each parameter in the electrical parameters is assigned a pre-set weighting factor coefficient, and the sum of the products of each parameter and its corresponding pre-set weighting factor coefficient is set as the electrical reliability index. Each parameter in the thermal parameters is assigned a pre-set weighting factor coefficient, and the sum of the products of each parameter and its corresponding pre-set weighting factor coefficient is set as the thermal stability index. Each parameter in the environmental parameters is assigned a pre-set weighting factor coefficient, and the sum of the products of each parameter and its corresponding pre-set weighting factor coefficient is set as the environmental adaptability index.

[0051] Pre-set weighting factor coefficients are assigned to the electrical reliability index, thermal stability index, and environmental adaptability index. The sum of the products of the electrical reliability index, thermal stability index, and environmental adaptability index with their respective pre-set weighting factor coefficients is set as the reliability evaluation coefficient. The reliability evaluation coefficient is then judged. If the reliability evaluation coefficient is less than the preset reliability evaluation coefficient threshold, a fault signal is generated. If the reliability evaluation coefficient is greater than or equal to the preset reliability evaluation coefficient threshold, a normal signal is generated.

[0052] The test feedback unit is used to respond to fault signals or normal signals and immediately display the preset warning text corresponding to the fault signal or normal signal so as to intuitively understand the test feedback results. This invention breaks through the traditional single electrical parameter test mode and realizes multi-dimensional collaborative testing of electrical performance, thermal characteristics and environmental adaptability to improve test coverage. Furthermore, it uses deep learning algorithms to realize the correlation analysis of multi-source data, which helps to improve the accuracy of test results.

[0053] In this embodiment of the invention, the performance of the high-frequency high-speed switch directly affects the reliability and stability of the entire electronic system, therefore, accurate and comprehensive testing of it is crucial.

[0054] The collected data is preprocessed and analyzed to improve its quality. At the same time, the performance of the high-frequency high-speed switch is evaluated through a comprehensive quantitative method to determine whether the performance of the high-frequency high-speed switch is abnormal.

[0055] Example 3:

[0056] When a fault signal is generated, the area positioning unit is used to extract and fuse electrical parameters, thermal parameters and environmental parameters to obtain time-frequency domain feature vectors, and further analyze the time-frequency domain feature vectors to identify the target fault type of the location component and obtain a visual fault feature image.

[0057] The analysis process for the regional positioning unit is as follows:

[0058] The high-frequency high-speed switch is decomposed into multiple position components, such as contact group A, contact group B, and insulating layer C.

[0059] Features are extracted from the electrical, thermal, and environmental parameters of components at each location. The feature extraction includes time-domain features and frequency-domain features. A time-frequency domain feature vector is obtained by fusing the time-domain features and frequency-domain features.

[0060] Collect historical fault data of high-frequency and high-speed switches. The historical fault data includes fault type (contact degradation, insulation breakdown), fault time, etc.

[0061] A fault identification model is trained using historical fault data. The output results are obtained after the input time-frequency domain feature vector is obtained based on the fault identification model. The output results include the probability values ​​of each fault type. The probability values ​​of the fault types are then processed for discrimination. If the probability value of the fault type is less than the preset fault type probability value threshold, the corresponding component is determined to be normal. If the probability value of the fault type is greater than or equal to the preset fault type probability value threshold, the corresponding component is determined to be abnormal. At the same time, the fault type corresponding to the maximum value of the fault type probability value is set as the target fault type of the component.

[0062] The basic information of the high-frequency and high-speed switch is obtained by laser scanning technology. The basic information represents the size of each component. Based on the established spatial coordinate system, a three-dimensional simulation image of the high-frequency and high-speed switch is obtained.

[0063] Based on the location of the component corresponding to the target fault type, the location of the component corresponding to the target fault type is marked in red on the 3D simulation image;

[0064] The thermal feature image of the high-frequency high-speed switch is obtained, and the thermal feature image is preprocessed, including cleaning and enhancement. Based on the preprocessed thermal feature image, the difference area between the thermal feature image and the standard thermal feature image is obtained, and the difference area between the preprocessed thermal feature image and the standard thermal feature image is set as the fault area.

[0065] The fault area is marked on the 3D simulation image, and the fault area is compared and analyzed with the red mark. If the red mark belongs to the fault area, a positioning signal is generated, and the visual feature image of the fault after the fault area is marked is obtained.

[0066] If the red marker does not belong to the fault area, a progressive verification signal is generated;

[0067] The test feedback unit is used to respond to the visual feature image of the fault or the progressive verification signal, and immediately display the visual feature image of the fault or further verify the fault location. The image positioning display helps to intuitively understand the fault location of the high-frequency and high-speed switch. At the same time, the fault type is obtained based on the analysis of the time-frequency domain feature vector. Then, based on the fault type and fault location, the high-frequency and high-speed switch can be reasonably and targetedly managed, which also helps to improve the efficiency of fault diagnosis and location.

[0068] In this embodiment of the invention, feature extraction and multi-dimensional fusion analysis are performed on the collected data. Feature extraction is used to extract key feature parameters that can reflect switch faults from the preprocessed data. Multi-dimensional fusion analysis integrates multiple different types of feature parameters to obtain more comprehensive and accurate switch fault assessment results.

[0069] When generating a visual feature image of a fault, the severity classification and label acquisition unit performs a weighted fusion analysis on the contact resistance deviation and temperature deviation of the fault location to obtain a comprehensive severity and test feedback label.

[0070] The specific weighted fusion analysis process is as follows:

[0071] The location of the component whose fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault location, and the contact resistance deviation and temperature deviation of the fault location are obtained.

[0072] The analysis process for contact resistance deviation is as follows: the measured value of contact resistance, the normal value of contact resistance, and the contact resistance fault threshold are obtained at the fault location. The value obtained by (measured value of contact resistance - normal value of contact resistance) / (fault threshold of contact resistance - normal value of contact resistance) × 100% is set as the contact resistance deviation.

[0073] The process of analyzing temperature deviation is as follows: the measured temperature, normal temperature and fault temperature threshold of the fault location are obtained, and the value obtained by (measured temperature - normal temperature) / (fault temperature threshold - normal temperature) × 100% is set as the temperature deviation.

[0074] Pre-set weighting factor coefficients are assigned to the contact resistance deviation and temperature deviation. The sum of the products of the contact resistance deviation and temperature deviation with the pre-set weighting factor coefficients is set as the overall severity, and the overall severity is then judged.

[0075] If the overall severity score is greater than the maximum value in the preset overall severity score range, it is judged as high severity.

[0076] If the overall severity falls within the preset overall severity range, it is classified as medium severity.

[0077] If the overall severity is less than the minimum value in the preset overall severity range, it is judged as low severity.

[0078] High severity, medium severity, and low severity are collectively referred to as fault severity.

[0079] The fault location, target fault type, and fault severity are set as test feedback labels. The test feedback unit responds to the test feedback labels and immediately displays them, so as to intuitively understand the fault location, target fault type, and fault severity of the high-frequency and high-speed switch, and provide data support for maintenance decisions.

[0080] Through the above steps, high-frequency and high-speed switch fault location can achieve accuracy and quantitatively assess the severity of the fault, providing data support for maintenance decisions.

[0081] In summary, this invention initially analyzes the test prerequisites and further analyzes the test system response to ensure that the test prerequisites are met. It also reduces the interference of high-frequency, high-speed switch test preparation on subsequent tests, helping to provide data support and credibility for subsequent analysis. Furthermore, by using a progressive information approach and comprehensive quantification to evaluate the performance of the high-frequency, high-speed switch, it determines whether the switch's performance is abnormal. This achieves multi-dimensional collaborative testing of electrical performance, thermal characteristics, and environmental adaptability, thereby improving test coverage and the reliability of performance test results.

[0082] Analyzing from the perspective of feature extraction allows for the determination of fault location and type. This enables reasonable and targeted fault management of high-frequency and high-speed switches based on the fault type and location, while also improving the efficiency of fault diagnosis and location. Through comprehensive fault severity analysis, the test feedback label of the entire high-frequency and high-speed switch is obtained, namely fault location + target fault type + fault severity, providing data support for maintenance decisions.

[0083] The threshold is set for comparative analysis of results to determine whether they are good or bad. The value of the threshold is determined by a combination of large-scale model analysis of sample data and human experience. It can also be adjusted appropriately based on seasonal or common-sense influencing factors.

[0084] The size of the coefficient is a specific value obtained by quantifying each parameter to facilitate subsequent comparison. The size of the coefficient depends on the amount of sample data and the corresponding operating coefficient initially set by those skilled in the art for each set of sample data; as long as it does not affect the proportional relationship between the parameter and the quantified value.

[0085] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A high-frequency, high-speed switching test system based on multi-dimensional fusion analysis, characterized in that, It includes a diversified testing center, a test execution unit, a response acquisition unit, a progressive testing unit, a regional positioning unit, a degree division and label acquisition unit, and a test feedback unit; Test Execution Unit: Performs test precondition discrimination analysis on the collected test preparation data to determine whether the condition feedback results of the test preparation data meet the standards; Response acquisition unit: performs test response evaluation and analysis on the collected test system response data to determine whether the test system's test response capability is normal; Diversified testing center: The collected electrical, thermal and environmental parameters are sent to the progressive testing unit for progressive performance testing and analysis, that is, to evaluate the performance of high-frequency and high-speed switches; Regional positioning unit: It extracts and fuses features of electrical parameters, thermal parameters and environmental parameters to obtain time-frequency domain feature vectors, and further analyzes the time-frequency domain feature vectors to identify the target fault type of the location component and obtain a visual fault feature image; When generating a visual feature image of a fault, the degree classification and label acquisition unit performs a weighted fusion analysis on the contact resistance deviation and temperature deviation of the fault location to obtain test feedback labels.

2. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 1, characterized in that, The test prerequisite discrimination and analysis process is as follows: obtain the test preparation data of the high-frequency high-speed switch, which includes the test fixture, signal transmission cable, and parameter settings; obtain the condition feedback result of the test preparation data of the high-frequency high-speed switch, which includes qualified and unqualified. If the condition feedback result is qualified, a qualified feedback signal is generated; if the condition feedback result is unqualified, a unqualified feedback signal is generated.

3. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 2, characterized in that, The specific test response evaluation and analysis process based on the feedback qualified signal is as follows: Obtain the test system response data of the high-frequency high-speed switch. The test system response data includes the information acquisition time and the information transmission time. Obtain the response evaluation results of the test system response data. The response evaluation results include stability and fluctuation. If the response evaluation result is stable, a stable signal is generated. If the response evaluation result is fluctuating, an interference signal is generated.

4. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 1, characterized in that, The progressive performance test and analysis process is as follows: The collected electrical, thermal, and environmental parameters are preprocessed. Pre-set weighting factor coefficients are assigned to each electrical parameter, and the sum of the products of each electrical parameter and its corresponding pre-set weighting factor coefficient is set as the electrical reliability index. Pre-set weighting factor coefficients are assigned to each thermal parameter, and the sum of the products of each thermal parameter and its corresponding pre-set weighting factor coefficient is set as the thermal stability index. Pre-set weighting factor coefficients are assigned to each environmental parameter, and the sum of the products of each environmental parameter and its corresponding pre-set weighting factor coefficient is set as the environmental adaptability index. Pre-set weighting factor coefficients are assigned to the electrical reliability index, thermal stability index, and environmental adaptability index. The sum of the products of the electrical reliability index, thermal stability index, and environmental adaptability index with their corresponding pre-set weighting factor coefficients is set as the reliability evaluation coefficient. The reliability evaluation coefficient is then processed to obtain a fault signal or a normal signal.

5. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 1, characterized in that, The analysis process of the regional positioning unit is as follows: The high-frequency high-speed switch is decomposed into multiple position components, and the electrical parameters, thermal parameters and environmental parameters of each position component are extracted. The feature extraction includes time domain features and frequency domain features. The time-frequency domain feature vector is obtained by fusing the time domain features and frequency domain features. Historical fault data of high-frequency and high-speed switches are collected, and a fault identification model is trained using the historical fault data. Based on the fault identification model, the output results after obtaining the input time-frequency domain feature vector are obtained. The output results include the probability values ​​of each fault type. The fault type probability values ​​are then processed for discrimination. If the fault type probability value is less than the preset fault type probability value threshold, the corresponding component is determined to be normal. If the fault type probability value is greater than or equal to the preset fault type probability value threshold, the corresponding component is determined to be abnormal. At the same time, the fault type corresponding to the maximum value of the fault type probability value is set as the target fault type of the component.

6. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 5, characterized in that, The basic information of the high-frequency and high-speed switch is obtained by laser scanning technology. The basic information represents the size of each component. Based on the established spatial coordinate system, a three-dimensional simulation image of the high-frequency and high-speed switch is obtained. Based on the location of the component corresponding to the target fault type, the location of the component corresponding to the target fault type is marked in red on the 3D simulation image; The thermal feature image of the high-frequency high-speed switch is obtained, and the thermal feature image is preprocessed. Based on the preprocessed thermal feature image, the difference region between the thermal feature image and the standard thermal feature image is obtained, and the difference region between the preprocessed thermal feature image and the standard thermal feature image is set as the fault region.

7. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 6, characterized in that, The fault area is marked on the 3D simulation image, and the fault area is compared and analyzed with the red mark. If the red mark belongs to the fault area, a positioning signal is generated, and the visual feature image of the fault after the fault area is marked is obtained. If the red mark does not belong to the fault area, a progressive verification signal is generated.

8. The high-frequency, high-speed switching test system based on multi-dimensional fusion analysis according to claim 1, characterized in that, The weighted fusion analysis process is as follows: The location of the component whose fault type probability value is greater than or equal to the preset fault type probability value threshold is set as the fault location, and the contact resistance deviation and temperature deviation of the fault location are obtained. Pre-set weighting factor coefficients are assigned to the contact resistance deviation and temperature deviation. The sum of the products of the contact resistance deviation and temperature deviation with the pre-set weighting factor coefficients is set as the overall severity. The overall severity is then processed to obtain high severity, medium severity and low severity. High severity, medium severity, and low severity are collectively referred to as fault severity. The fault location, target fault type, and fault severity are set as the test feedback label.

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