Lean evaluation method for substation Sdd secondary circuit visualization system
Through the lean evaluation method of the substation SDD secondary circuit visualization system, the layout quality, visualization efficiency, system performance and safety and reliability scores are obtained, which solves the problem of difficulty in establishing the relationship between physical links and virtual circuits in the existing technology, and realizes the optimized evaluation of system performance and fault location.
Patent Information
- Application Number
- CN202510841239.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-23
- Publication Date
- 2025-09-30
AI Technical Summary
The existing substation secondary circuit visualization system has difficulty in establishing the relationship between physical links and virtual circuits, resulting in insufficient fault location and fault type identification. The existing software functions are imperfect and cannot meet the needs of smart substations.
This paper provides a lean evaluation method for the substation SDD secondary circuit visualization system. By collecting and preprocessing event monitoring data, the layout quality score, visualization efficiency score, system performance score and safety and reliability score are obtained. An evaluation report is generated and optimization suggestions are provided to achieve an effective connection between the physical link and the virtual circuit.
It provides a reliable measurement standard for the substation SDD secondary circuit visualization system, improves the accuracy and reliability of the evaluation, solves the problem of difficulty in establishing the relationship between physical links and virtual circuits in existing technologies, and optimizes system performance evaluation.
Smart Images

Figure CN120728857A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of substation data analysis, and in particular to a lean evaluation method for a substation SDD secondary circuit visualization system. Background Art
[0002] With the rapid development of smart grids, the intelligence level of substation secondary equipment has been continuously improved, and the number of secondary equipment has also been increasing, which has put higher requirements on the management, operation, maintenance and inspection personnel of the equipment.
[0003] At present, smart substations use digital information to replace the analog information of conventional substations, and use optical fiber communication to replace conventional cable communication, so that the secondary circuits that can be actually operated in the substation are transformed into editable text information, and the visible and tangible cable connections are transformed into invisible and intangible virtual connections [1]. This change makes it difficult for traditional secondary circuit visualization to adapt to the needs of smart substations and cannot provide a favorable means for secondary applications. At the same time, due to the improvement of equipment self-test capabilities and communication capabilities, information between devices and between devices and people can be fully exchanged, allowing operation and maintenance personnel to more accurately understand the operation status of the equipment.
[0004] However, existing visualization software remains imperfect. It displays IEDs in a limited tree-like format, and version comparison is slow when SCD files are large. Traditional secondary circuit status monitoring methods, primarily based on rules and experience, suffer from low accuracy and susceptibility to interference. Furthermore, existing smart substation secondary circuit visualization systems still struggle with fault location and fault type identification, making it difficult to establish relationships between physical links and virtual circuits. Summary of the Invention
[0005] The embodiment of the present application solves the problem in the prior art that it is difficult to establish the relationship between physical links and virtual circuits by providing a lean evaluation method for the substation SDD secondary circuit visualization system, provides a reliable measurement standard for the quality evaluation of the substation SDD secondary circuit visualization system, effectively connects the relationship between physical links and virtual circuits, realizes the effect and value evaluation between different systems or different methods, and overcomes the deficiency in the prior art that it is difficult to establish the relationship between physical links and virtual circuits.
[0006] The embodiment of the present application provides a lean evaluation method for a substation Sdd secondary circuit visualization system, comprising the following steps: S1, collecting event monitoring data of the substation Sdd secondary circuit visualization system, and preprocessing the event monitoring data; S2. Obtaining a layout quality score, a visualization efficiency score, a system performance score, and a safety and reliability score based on the preprocessed event monitoring data; S3. Evaluate the overall performance indicators of the substation SDD secondary circuit visualization system based on the layout quality score, visualization efficiency score, system performance score, and safety and reliability score; S4. When the overall performance index is lower than the preset threshold, an evaluation report is generated and a prompt is given; otherwise, optimization suggestions are generated.
[0007] Furthermore, the collection of the event monitoring data includes the following steps: Step 201: Automatically identify the CAD drawing of the substation secondary circuit layout using CAD drawing recognition software using OCR recognition technology, obtain text information and connection relationship information between electrical devices in the drawing, identify the connection points and connection line paths of each electrical device based on the text information and connection relationship information, count the number of cross edges, and calculate the total wiring length based on the connection line paths; Step 202: Pick up the text box position coordinates and text in the CAD drawing, match them with the connecting line position coordinates, and obtain the corresponding relationship between the text box and the connecting line; Step 203: Assign the text information in the text box to the function description attribute of the corresponding connection line to obtain the connection line function identifier of each connection line, and perform fault location and typical circuit design based on the function identifier of each connection line; Step 204: Event monitoring data is collected through the lower computer data acquisition system and the mobile smart terminal. The event monitoring data includes the fault location time and typical circuit design time obtained by statistical fault location and typical circuit design, as well as the frame rate of visual node rendering, the dangerous operation interception rate corresponding to different risk types, the false alarm rate, the missed alarm rate and the number of occurrences.
[0008] Furthermore, the pre-processing of the event monitoring data includes the following steps: Standardize the collected event monitoring data, unify the data units, timestamp format, and standardize text descriptions; The standardized data is filled with missing values, then outliers in the data are eliminated, and finally outliers in the data are detected and processed to obtain preprocessed event monitoring data.
[0009] Furthermore, the layout quality score is obtained as follows: Extracting the algorithm output cross edge number and algorithm output total routing length from the initial layout generated by the algorithm; Obtaining the number of manually corrected cross edges and the total length of manually corrected wiring when manually correcting the layout; Compare the number of cross edges and total wiring length output by the algorithm with those after manual correction to obtain the difference in the number of cross edges and the difference in total wiring length; Obtain the preset maximum allowable cross edge number difference and maximum allowable total wiring length difference; The weighted sum of the difference in the number of crossing edges and the difference in the total wiring length is output as the layout quality score.
[0010] Furthermore, the calculation formula of the layout quality score is: ; in, represents the layout quality score, represents the cross edge weight, represents the difference in the number of cross edges, Indicates the maximum allowed cross edge number difference, Represents the total length weight of the wiring, Indicates the total wiring length difference, Indicates the maximum allowable total wiring length difference, .
[0011] Furthermore, the visualization efficiency score is obtained as follows: Obtain the minimum and maximum values of typical circuit design time and the minimum and maximum values of fault location time; Obtain the actual typical circuit design time and actual fault location time from the timestamp in the operation log; The typical loop design time and fault location time are normalized, and weighted processing is performed according to the normalized typical loop design time and fault location time to obtain a visualized efficiency score.
[0012] Furthermore, the system performance score is obtained as follows: Use the browser performance monitoring tool to obtain the frame rate of the specified visualization node when rendering, and input the statistical frame rate into the system performance score calculation formula to obtain the system performance index; The system performance score calculation formula is: ; in, Indicates the system performance score, Indicates the actual frame rate under the specified visualization node. Indicates the minimum frame rate under the specified visualization node. Indicates the maximum frame rate under the specified visualization node.
[0013] Furthermore, the security reliability score is obtained as follows: Extract safety monitoring data corresponding to different risk types from operation and maintenance event records, including dangerous operation interception rate, false alarm rate, missed alarm rate, and number of occurrences; The safety monitoring data corresponding to different risk types are input into the safety reliability score calculation formula to obtain the safety reliability score, which is used to reflect the safety and reliability of the substation Sdd secondary circuit visualization system; The safety reliability score calculation formula is:
[0014] in, represents the safety reliability score, i is the risk type number, I is the total number of risk types, For normalization, represents the interception rate of dangerous operations for category i risk, represents the false alarm rate of the i-th risk, represents the underreporting rate of risk type i, represents the number of occurrences of the i-th risk, represents the weight of the i-th risk.
[0015] Furthermore, the formula for obtaining the overall performance index is: ; in, Represents the overall performance index, represents the layout quality weight coefficient, represents the layout quality score, represents the visualization efficiency weight coefficient, represents the visualization efficiency score, represents the system performance weight coefficient, Indicates the system performance score, represents the safety reliability weight coefficient, Indicates the safety reliability score.
[0016] Furthermore, the evaluation report includes the current system evaluation results, optimization suggestions, improvement measures and acceptance criteria; The current system evaluation results include layout quality score, visualization efficiency score, system performance score, safety and reliability score and overall performance indicators.
[0017] One or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages: 1. By obtaining the layout quality score, visualization efficiency score, system performance score, safety and reliability score and overall performance indicators, a reliable measurement standard is provided for the quality evaluation of the substation SDD secondary circuit visualization system. The effective connection between the physical link and the virtual circuit realizes the effect and value evaluation between different systems or different methods, overcomes the deficiency of the existing technology that it is difficult to establish the relationship between the physical link and the virtual circuit, and effectively solves the problem that it is difficult to establish the relationship between the physical link and the virtual circuit in the substation SDD secondary circuit visualization in the existing technology.
[0018] 2. By comparing algorithm output with manual correction, analyzing operation log timestamps, using browser performance monitoring tools, and statistical analysis of operation and maintenance event records, a comprehensive evaluation of secondary circuit layout quality, visualization efficiency, system performance, safety, and reliability is achieved. This overcomes the shortcomings of traditional evaluation methods that rely on rules and experience and are easily interfered with, and improves the accuracy and reliability of the evaluation.
[0019] 3. The event monitoring data is systematically preprocessed by standardization, filling missing values, eliminating abnormal values and processing outliers, thereby improving the accuracy and reliability of the evaluation method. As a standardized tool for substation secondary equipment status evaluation, it effectively reduces the workload of traditional evaluation methods and improves the efficiency of substation secondary equipment status evaluation. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 A flowchart of a lean evaluation method for a substation Sdd secondary circuit visualization system provided in an embodiment of the present application. DETAILED DESCRIPTION
[0021] The embodiment of the present application solves the problem in the prior art that it is difficult to establish the relationship between the physical link and the virtual circuit in the visualization of the SDD secondary circuit of the substation by providing a lean evaluation method for the SDD secondary circuit visualization system of the substation, and obtains the layout quality score, visualization efficiency score, system performance score, safety and reliability score and overall performance index, thereby providing a reliable measurement standard for the quality evaluation of the SDD secondary circuit visualization system of the substation, effectively connecting the relationship between the physical link and the virtual circuit, realizing the effect and value evaluation between different systems or different methods, and overcoming the deficiency in the prior art that it is difficult to establish the relationship between the physical link and the virtual circuit.
[0022] The technical solution in the embodiment of the present application is to solve the problem that the above-mentioned substation SDD secondary circuit visualization system lacks qualitative and quantitative measurement standards and is difficult to establish the relationship between the physical link and the virtual circuit.
[0023] In order to better understand the above technical solution, the above technical solution will be described in detail below with reference to the accompanying drawings and specific implementation methods.
[0024] like Figure 1 As shown, it is a flow chart of a lean evaluation method for a substation Sdd secondary circuit visualization system provided by an embodiment of the present application, the method comprising the following steps: S1, collecting event monitoring data of the substation Sdd secondary circuit visualization system, and preprocessing the event monitoring data; S2. Obtaining a layout quality score, a visualization efficiency score, a system performance score, and a safety and reliability score based on the preprocessed event monitoring data; S3. Evaluate the overall performance indicators of the substation SDD secondary circuit visualization system based on the layout quality score, visualization efficiency score, system performance score, and safety and reliability score; S4. When the overall performance index is lower than the preset threshold, an evaluation report is generated and a prompt is given; otherwise, optimization suggestions are generated.
[0025] Furthermore, the collection of the event monitoring data includes the following steps: Step 201: Automatically identify the CAD drawing of the substation secondary circuit layout using CAD drawing recognition software using OCR recognition technology, obtain text information and connection relationship information between electrical devices in the drawing, identify the connection points and connection line paths of each electrical device based on the text information and connection relationship information, count the number of cross edges, and calculate the total wiring length based on the connection line paths; Step 202: Pick up the text box position coordinates and text in the CAD drawing, match them with the connecting line position coordinates, and obtain the corresponding relationship between the text box and the connecting line; Step 203: Assign the text information in the text box to the function description attribute of the corresponding connection line to obtain the connection line function identifier of each connection line, and perform fault location and typical circuit design based on the function identifier of each connection line; Step 204: Event monitoring data is collected through the lower computer data acquisition system and the mobile smart terminal. The event monitoring data includes the fault location time and typical circuit design time obtained by statistical fault location and typical circuit design, as well as the frame rate of visual node rendering, the dangerous operation interception rate corresponding to different risk types, the false alarm rate, the missed alarm rate and the number of occurrences.
[0026] Data quality and consistency are ensured through standardization, missing value filling, outlier removal, and outlier detection. This helps improve the accuracy and efficiency of visualization and addresses the issue of the single tree-structured display of IED devices in existing technologies.
[0027] By collecting and processing event monitoring data, the system's performance evaluation is optimized, thus solving the problem of slow version comparison when the SCD file is large.
[0028] Furthermore, the pre-processing of the event monitoring data includes the following steps: Standardize the collected event monitoring data, unify the data units, timestamp format, and standardize text descriptions; The standardized data is filled with missing values, then outliers in the data are eliminated, and finally outliers in the data are detected and processed to obtain preprocessed event monitoring data.
[0029] Furthermore, the layout quality score is obtained as follows: Extracting the algorithm output cross edge number and algorithm output total routing length from the initial layout generated by the algorithm; Obtaining the number of manually corrected cross edges and the total length of manually corrected wiring when manually correcting the layout; Compare the number of cross edges and total wiring length output by the algorithm with those after manual correction to obtain the difference in the number of cross edges and the difference in total wiring length; Obtain the preset maximum allowable cross edge number difference and maximum allowable total wiring length difference; The weighted sum of the difference in the number of crossing edges and the difference in the total wiring length is output as the layout quality score.
[0030] Furthermore, the calculation formula of the layout quality score is: ; in, represents the layout quality score, represents the cross edge weight, represents the difference in the number of cross edges, Indicates the maximum allowed cross edge difference, Represents the total length weight of the wiring, Indicates the total wiring length difference, Indicates the maximum allowable total wiring length difference, .
[0031] The calculation formula for the difference in the number of crossing edges is: ,in Indicates the number of cross edges output by the algorithm, Indicates the number of manually corrected cross edges.
[0032] The calculation formula for the total wiring length difference is: ,in Indicates the total wiring length output by the algorithm, Indicates the total length of manually corrected wiring.
[0033] Layout Quality Score The range is limited to 0-1. When the difference is 0, the score is 1, which is the best case; when the difference reaches the preset maximum allowable value, the score is 0, which is the worst case.
[0034] Furthermore, the visualization efficiency score is obtained as follows: Obtain the minimum and maximum values of typical circuit design time and the minimum and maximum values of fault location time; Obtain the actual typical circuit design time and actual fault location time from the timestamp in the operation log; The typical loop design time and fault location time are normalized, and weighted processing is performed according to the normalized typical loop design time and fault location time to obtain a visualized efficiency score.
[0035] The calculation formula for visualization efficiency score is: ; in, represents the visualization efficiency score, For normalization, represents the typical loop design time weight, represents the typical circuit design time, represents the time weight of the fault location, Indicates the fault location time.
[0036] Combined with the minimum of typical circuit design time and maximum value , Minimum value of fault location time and maximum value Normalize the typical loop design time and fault location time.
[0037] Normalization process of typical loop design time: ; Normalization process of fault location time: ; The calculation formula for typical loop design time is: ,in Indicates the end timestamp, Indicates the start timestamp.
[0038] The calculation formula for fault location time is: ,in Indicates the fault location timestamp. Indicates the timestamp when the fault occurs.
[0039] Furthermore, the system performance score is obtained as follows: Use the browser performance monitoring tool to obtain the frame rate of the specified visualization node when rendering, and input the statistical frame rate into the system performance score calculation formula to obtain the system performance index; The system performance score calculation formula is: ; in, Indicates the system performance score, Indicates the actual frame rate under the specified visualization node. Indicates the minimum frame rate under the specified visualization node. Indicates the maximum frame rate under the specified visualization node.
[0040] Furthermore, the security reliability score is obtained as follows: Extract safety monitoring data corresponding to different risk types from operation and maintenance event records, including dangerous operation interception rate, false alarm rate, missed alarm rate, and number of occurrences; The safety monitoring data corresponding to different risk types are input into the safety reliability score calculation formula to obtain the safety reliability score, which is used to reflect the safety and reliability of the substation Sdd secondary circuit visualization system; The safety reliability score calculation formula is: ;
[0041] in, represents the safety reliability score, i is the risk type number, I is the total number of risk types, For normalization, represents the interception rate of dangerous operations for category i risk, represents the false alarm rate of the i-th risk, represents the underreporting rate of risk type i, represents the number of occurrences of the i-th risk, represents the weight of the i-th risk.
[0042] The calculation formula for the dangerous operation interception rate of risk type i is: ,in represents the number of successful interceptions of the i-th risk, The total number of dangerous operations representing the risk of category i; The calculation formula for the false alarm rate of the i-th risk is: ,in represents the number of false alarms for the i-th risk category, Indicates the total number of alarms for risk category i; The formula for calculating the underreporting rate of risk type i is: ,in represents the number of missed reports of risk category i, Indicates the total number of actual failures of risk category i.
[0043] In a specific embodiment, the weight of the i-th risk is obtained as follows: Step 1: Obtain a hierarchical model. The target layer of the hierarchical model is the safety and reliability score of the substation SDD secondary circuit visualization system. The criterion layer is the three risk types: real-time plug-in, incorrect interval, and protection connector erroneously thrown back. The solution layer is the four specific risk assessment indicators: interception rate, false alarm rate, missed alarm rate, and number of occurrences. Step 2: Based on the hierarchical structure model, the three risk types in the criterion layer are compared pairwise, a judgment matrix is constructed, and the importance of each risk type is scored using a 1-9 scale. Step 3: Normalize the judgment matrix by columns, calculate the proportion of each element in the column, and obtain the normalized matrix; Step 4: Calculate the row average of the normalized matrix to obtain the weight vectors of the three risk types; Step 5: Calculate the maximum eigenvalue of the judgment matrix , using the formula Calculate the consistency index CI, where n is the order of the judgment matrix; Step 6: Find the corresponding random consistency index RI according to the order of the judgment matrix; Step 7, using the formula Calculate the consistency ratio CR. If CR is less than 0.1, the judgment matrix is considered to have passed the consistency test. In step 8, if the judgment matrix passes the consistency check, the weight vectors represent the weights of the three risk types in the safety and reliability scores. If not, the judgment matrix needs to be readjusted, and steps 2 through 7 are repeated until the check passes. The corresponding weights for each risk type are then output.
[0044] Furthermore, the formula for obtaining the overall performance index is: ; in, Represents the overall performance index, represents the layout quality weight coefficient, represents the layout quality score, represents the visualization efficiency weight coefficient, represents the visualization efficiency score, represents the system performance weight coefficient, Indicates the system performance score, represents the safety reliability weight coefficient, Indicates the safety reliability score.
[0045] Furthermore, the evaluation report includes the current system evaluation results, optimization suggestions, improvement measures and acceptance criteria; The current system evaluation results include layout quality score, visualization efficiency score, system performance score, safety and reliability score and overall performance indicators. Example
[0046] A lean evaluation method for a substation SDD secondary circuit visualization system includes the following steps: Step 1: Establish an evaluation index system for the substation SDD secondary circuit visualization system, including indicators in four dimensions: layout quality score, visualization efficiency score, system performance score, and safety and reliability score. Among them, the layout quality score includes the number of cross edges and the total length of wiring, and the layout quality score is determined by comparing the algorithm output with the results of manual correction; the visualization efficiency score includes the typical circuit design time and fault location time, and the visualization efficiency score is determined by analyzing the operation log timestamp; the system performance score includes the 2000 node rendering frame rate, and the system performance is monitored through the browser performance monitoring tool; the safety and reliability score includes the dangerous operation interception rate and the false alarm rate, and the system safety and reliability score is statistically analyzed through operation and maintenance event records.
[0047] Step 2: Use CAD drawing recognition software using OCR recognition technology to identify the CAD drawing, with an accuracy of no less than 98%. Then, pick up the text box position coordinates and text in the CAD drawing, match them with the position coordinates of the connecting line, obtain the correspondence between the text box and the connecting line, assign the text in the text box to the functional description attributes of the connecting line, and improve the functional identification of the connecting line. Finally, collect real-time on-site data through the lower-level computer data acquisition system and mobile smart terminals. The lower-level computer data acquisition system adopts a modular structure with multiple fault-tolerant and anti-interference technologies. Each module can work independently and is easy to install, maintain, and replace, and has high reliability.
[0048] Step 3: Preprocess the collected data, including data standardization, missing value filling, outlier removal, and outlier detection. Then, analyze the scores of each dimension indicator.
[0049] In step 4, the scores of each dimension indicator are normalized to the interval [0, 1]. Then, using the min-max normalization method, the maximum and minimum values of each dimension indicator are mapped to the interval [0, 1]. The overall performance indicator is calculated based on the normalized weights of each dimension indicator. Finally, if the overall performance indicator falls below the preset threshold, an evaluation report is generated with a prompt; otherwise, optimization recommendations are generated. The evaluation report includes the current system evaluation results, optimization recommendations, improvement measures, and acceptance criteria.
[0050] In summary, the embodiments of the present application obtain layout quality scores, visualization efficiency scores, system performance scores, safety and reliability scores, and overall performance indicators, thereby providing a reliable measurement standard for the quality evaluation of the substation SDD secondary circuit visualization system, and effectively connecting the relationship between physical links and virtual circuits, realizing the effect and value evaluation between different systems or different methods, and overcoming the deficiency of the existing technology that it is difficult to establish the relationship between physical links and virtual circuits.
[0051] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0052] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0053] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.
[0054] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.
[0055] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.
[0056] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to include such changes and modifications.
Claims
1. A lean evaluation method for a substation Sdd secondary circuit visualization system, characterized in that: The following steps are involved: S1, collect event monitoring data of the substation Sdd secondary circuit visualization system and pre-process the event monitoring data; S2. Obtaining a layout quality score, a visualization efficiency score, a system performance score, and a safety and reliability score based on the preprocessed event monitoring data; S3. Evaluate the overall performance indicators of the substation SDD secondary circuit visualization system based on the layout quality score, visualization efficiency score, system performance score, and safety and reliability score; S4. When the overall performance index is lower than the preset threshold, an evaluation report is generated and a prompt is given; otherwise, optimization suggestions are generated.
2. A lean evaluation method for a substation Sdd secondary circuit visualization system according to claim 1, characterized in that: The collection of the event monitoring data comprises the following steps: Step 201: Automatically identify the CAD drawing of the substation secondary circuit layout using CAD drawing recognition software using OCR recognition technology, obtain text information and connection relationship information between electrical devices in the drawing, identify the connection points and connection line paths of each electrical device based on the text information and connection relationship information, count the number of cross edges, and calculate the total wiring length based on the connection line paths; Step 202: Pick up the text box position coordinates and text in the CAD drawing, match them with the connecting line position coordinates, and obtain the corresponding relationship between the text box and the connecting line; Step 203: Assign the text information in the text box to the function description attribute of the corresponding connection line to obtain the connection line function identifier of each connection line, and perform fault location and typical circuit design based on the function identifier of each connection line; Step 204: Event monitoring data is collected through the lower computer data acquisition system and the mobile smart terminal. The event monitoring data includes the fault location time and typical circuit design time obtained by statistical fault location and typical circuit design, as well as the frame rate of visual node rendering, the dangerous operation interception rate corresponding to different risk types, the false alarm rate, the missed alarm rate and the number of occurrences.
3. A lean evaluation method for a substation SDD secondary circuit visualization system according to claim 1, characterized in that: The pre-processing of the event monitoring data comprises the following steps: Standardize the collected event monitoring data, unify the data units, timestamp format, and standardize text descriptions; The standardized data is filled with missing values, then outliers in the data are eliminated, and finally outliers in the data are detected and processed to obtain preprocessed event monitoring data.
4. A lean evaluation method for a substation Sdd secondary circuit visualization system as claimed in claim 2, characterized in that: The layout quality score is obtained as follows: Extracting the algorithm output cross edge number and algorithm output total routing length from the initial layout generated by the algorithm; Obtaining the number of manually corrected cross edges and the total length of manually corrected wiring when manually correcting the layout; Compare the number of cross edges and total wiring length output by the algorithm with those after manual correction to obtain the difference in the number of cross edges and the difference in total wiring length; Obtain the preset maximum allowable cross edge number difference and maximum allowable total wiring length difference; The weighted sum of the difference in the number of crossing edges and the difference in the total wiring length is output as the layout quality score.
5. A lean evaluation method for a substation Sdd secondary circuit visualization system as claimed in claim 4, characterized in that: The calculation formula of the layout quality score is: ; in, represents the layout quality score, represents the cross edge weight, represents the difference in the number of cross edges, Indicates the maximum allowed cross edge number difference, Represents the total length weight of the wiring, Indicates the total wiring length difference, Indicates the maximum allowable total wiring length difference, .
6. A lean evaluation method for a substation Sdd secondary circuit visualization system as claimed in claim 2, characterized in that: The visualization efficiency score is obtained as follows: Obtain the minimum and maximum values of typical circuit design time and the minimum and maximum values of fault location time; Obtain the actual typical circuit design time and actual fault location time from the timestamp in the operation log; The typical loop design time and fault location time are normalized, and weighted processing is performed according to the normalized typical loop design time and fault location time to obtain a visualized efficiency score.
7. A lean evaluation method for a substation Sdd secondary circuit visualization system as claimed in claim 2, characterized in that: The system performance score is obtained as follows: Use the browser performance monitoring tool to obtain the frame rate of the specified visualization node when rendering, and input the statistical frame rate into the system performance score calculation formula to obtain the system performance index; The system performance score calculation formula is: ; in, Indicates the system performance score, Indicates the actual frame rate under the specified visualization node. Indicates the minimum frame rate under the specified visualization node. Indicates the maximum frame rate under the specified visualization node.
8. A lean evaluation method for a substation Sdd secondary circuit visualization system as claimed in claim 2, characterized in that: The safety reliability score is obtained as follows: Extract safety monitoring data corresponding to different risk types from operation and maintenance event records, including dangerous operation interception rate, false alarm rate, missed alarm rate, and number of occurrences; The safety monitoring data corresponding to different risk types are input into the safety reliability score calculation formula to obtain the safety reliability score, which is used to reflect the safety and reliability of the substation Sdd secondary circuit visualization system; The safety reliability score calculation formula is: ; in, represents the safety reliability score, i is the risk type number, I is the total number of risk types, For normalization, represents the interception rate of dangerous operations for category i risk, represents the false alarm rate of the i-th risk, represents the underreporting rate of risk type i, represents the number of occurrences of the i-th risk, represents the weight of the i-th risk.
9. A lean evaluation method for a substation SDD secondary circuit visualization system according to claim 1, characterized in that: The formula for obtaining the overall performance index is: ; in, Represents the overall performance index, represents the layout quality weight coefficient, represents the layout quality score, represents the visualization efficiency weight coefficient, represents the visualization efficiency score, represents the system performance weight coefficient, Indicates the system performance score, represents the safety reliability weight coefficient, Indicates the safety reliability score.
10. A lean evaluation method for a substation SDD secondary circuit visualization system according to claim 1, characterized in that: The assessment report includes the current system assessment results, optimization suggestions, improvement measures and acceptance criteria; The current system evaluation results include layout quality score, visualization efficiency score, system performance score, safety and reliability score and overall performance indicators.
