Methods and related equipment for assessing cable insulation degradation based on scattering tests

Abstract

This application discloses a method and related equipment for evaluating the degree of cable insulation degradation based on scattering tests, relating to the field of cable quality testing technology. It only requires obtaining the scattering intensity of the cable insulation material, thus eliminating the need for a large number of samples, complex sample processing, and destructive treatment of the cable samples. By constructing a first relationship curve between scattering intensity, scattering vector, and interface phase thickness parameters, the correlation between scattering intensity, scattering vector, and interface phase thickness parameters can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and preset scattering vector ranges, the optimal interface phase thickness parameter is determined among different preset interface phase thickness parameters. The optimal interface phase thickness parameter can accurately characterize the microstructural degradation state of the cable insulation material. Therefore, using the optimal interface phase thickness parameter to evaluate the structural degradation degree of the cable insulation material can accurately reflect the degradation status of the cable insulation material.

Description

Technical Field

[0001] This invention relates to the field of cable quality testing technology, and in particular to a method and related equipment for assessing the degree of cable insulation degradation based on scattering tests. Background Technology

[0002] In the detection and evaluation of microstructural degradation in cable insulation, existing methods mostly rely on physical and chemical tests or electrical property measurements. These methods typically assess microstructural degradation based on changes in the insulation performance and microstructure of the insulating material during aging. Each of these methods has its own limitations, resulting in varying degrees of restriction in characterizing the microstructural degradation state. For example, methods based on breakdown field strength require a large number of samples and cause irreparable damage to the samples; methods based on dielectric loss require sophisticated sample processing and are time-consuming; and methods based on microstructural changes, such as X-ray diffraction and Fourier transform infrared spectroscopy, can only calculate characteristic parameters from a single perspective to assess the overall microstructural degradation. Furthermore, the microstructural degradation process is highly complex, and the degradation of cable insulation at different levels is usually not synchronous, thus failing to accurately characterize the degree of cable insulation degradation. Summary of the Invention

[0003] In view of this, the present invention provides a method and related equipment for evaluating the degree of cable insulation degradation based on scattering tests.

[0004] The specific technical solution of the first embodiment of the present invention is as follows: a method for evaluating the degree of microstructural degradation of cable insulation based on scattering tests, the method comprising: conducting a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; constructing a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter being the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; determining the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range; the optimal interface phase thickness parameter being the actual interface phase thickness parameter of the cable insulation material to be evaluated; and evaluating the degree of structural degradation of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

[0005] Preferably, determining the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range includes: correcting the first relationship curve using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; and fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter.

[0006] Preferably, the step of fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: fitting the second relationship curve within the preset scattering vector range to obtain a fitted straight line for each second relationship curve; obtaining the standard deviation between the fitted straight line and the second relationship curve; determining the second relationship curve with the smallest standard deviation as the optimal second relationship curve; and the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

[0007] Preferably, the first relationship curve is obtained using the following formula:

[0008]

[0009] in, As a preset constant, The correlation distance is a measure of the inhomogeneity of a two-phase system. The interface phase thickness parameter. The scattering vector, The scattering intensity is denoted as .

[0010] Preferably, the step of evaluating the microstructural degradation degree of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter includes: obtaining the transition interface phase thickness of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter; the transition interface phase thickness is the transition interface thickness from the crystalline region to the amorphous region of the cable insulation material to be evaluated; and evaluating the structural degradation degree of the cable insulation material to be evaluated based on the transition interface phase thickness and a preset evaluation rule.

[0011] Preferably, the preset evaluation rules include: the greater the thickness of the transition interface phase, the less severe the structural degradation of the cable insulation material to be evaluated; the smaller the thickness of the transition interface phase, the more severe the structural degradation of the cable insulation material to be evaluated.

[0012] Preferably, the thickness of the transition interface phase is obtained using the following formula:

[0013]

[0014] in, The thickness of the transition interface phase. The optimal interface phase thickness parameter is given.

[0015] The specific technical solution of the second embodiment of this application is as follows: a cable insulation microstructure degradation assessment system based on scattering tests, the system comprising: a scattering intensity acquisition module, a relationship curve construction module, an optimal selection module, and an assessment module; the scattering intensity acquisition module is used to perform small-angle scattering experiments on the cable insulation material to be assessed to obtain the scattering intensity of the cable insulation material to be assessed; the relationship curve construction module is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be assessed; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material; the optimal selection module is used to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be assessed; the assessment module is used to assess the structural degradation degree of the cable insulation material to be assessed based on the optimal interface phase thickness parameter.

[0016] The specific technical solution of the third embodiment of the present invention is as follows: a cable insulation microstructure degradation assessment device based on scattering test, comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor performs the steps of the method as described in any one of the first embodiments of this application.

[0017] The specific technical solution of the fourth embodiment of the present invention is as follows: a computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, the processor performs the steps of the method as described in any one of the first embodiments of this application.

[0018] Implementing the embodiments of the present invention will have the following beneficial effects:

[0019] This invention only requires obtaining the scattering intensity of the cable insulation material, thus eliminating the need for a large number of samples, complex sample processing procedures, and destructive treatment of the cable samples. Different degrees of degradation result in different scattering intensities and interface phase thickness parameters. By constructing a first relationship curve between scattering intensity, scattering vector, and interface phase thickness parameters, the correlation between these parameters can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and preset scattering vector ranges, the optimal interface phase thickness parameter can be determined. This optimal parameter accurately characterizes the microstructural degradation state of the cable insulation material. Therefore, using the optimal parameter to assess the structural degradation degree of the cable insulation material can accurately reflect its degradation status. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 The flowchart shows the steps of the method for assessing the structural degradation of insulating materials based on scattering tests.

[0022] Figure 2 A schematic diagram of the scattering intensity curves of cable insulation materials after different heat treatment times;

[0023] Figure 3 This is a schematic diagram of the second relationship curve after correction for cable insulation material that has not undergone heat treatment;

[0024] Figure 4 This is a schematic diagram of the second relationship curve after correction of cable insulation materials subjected to different heat treatment times;

[0025] Figure 5 This is a schematic diagram showing the thickness variation of the interface between the crystalline and amorphous regions of cable insulation material at different heat treatment stages.

[0026] Figure 6 This is a schematic diagram of a system for assessing the structural degradation of insulating materials based on scattering tests.

[0027] Figure 7 This is a diagram of the internal structure of a computer device.

[0028] Among them, 201 is the scattering intensity acquisition module; 202 is the relationship curve construction module; 203 is the optimal selection module; and 204 is the evaluation module. Detailed Implementation

[0029] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0030] The terms "first," "second," etc., used in the specification, claims, and drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or modules is not limited to the listed steps or modules, but may optionally include steps or modules not listed, or may optionally include other steps or modules inherent to such processes, methods, products, or apparatus.

[0031] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0032] Please see Figure 1 This is a flowchart illustrating the steps of a cable insulation degradation assessment method based on a scattering test in the first embodiment of this application, used to estimate the structural degradation degree of the cable insulation material. The method includes:

[0033] Step 101: Perform a small-angle scattering experiment on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated;

[0034] Step 102: Construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material.

[0035] Step 103: Using different preset interface phase thickness parameters, the first relationship curve, and the preset scattering vector range, determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated.

[0036] Step 104: Evaluate the degree of structural degradation of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

[0037] Specifically, a small-angle scattering experiment (which can be a small-angle neutron scattering or small-angle X-ray scattering experiment) is performed on the cable insulation material to be evaluated. The test angle range and the wavelength of the scattering source are set, and the obtained scattering information is processed to remove background scattering and normalize, thus obtaining the scattering intensity of the cable insulation material to be evaluated. I ( q ), for scattering intensity I ( q Perform mathematical transformations to obtain the scattering vector. q Construct scattering intensity I ( q ), scattering vector q Interfacial phase thickness parameters of the cable insulation material to be evaluated The first relationship curve between them; starting from 0 and gradually increasing, taking different values... The value is then used to correct the first relationship curve within a preset scattering vector range to determine the optimal interface phase thickness parameter. The degree of structural degradation of the cable insulation material to be evaluated is determined based on the optimal interface phase thickness parameters.

[0038] The method in this embodiment only requires obtaining the scattering intensity of the cable insulation material, thus eliminating the need for a large number of samples, complex sample processing, and destructive treatment of the cable samples. Different degrees of degradation result in different scattering intensities and interface phase thickness parameters. By constructing a first relationship curve between scattering intensity, scattering vector, and interface phase thickness parameters, the correlation between these parameters can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and preset scattering vector ranges, the optimal interface phase thickness parameter is determined. This optimal parameter accurately characterizes the microstructural degradation state of the cable insulation material. Therefore, using the optimal parameter to assess the degree of structural degradation of the cable insulation material can accurately reflect its degradation status.

[0039] In a specific embodiment, determining the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range includes: correcting the first relationship curve using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; and fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter.

[0040] Specifically, the obtained first relationship curve is corrected. The correction method is as follows: starting from 0 and gradually increasing, different values ​​are selected... Different second relationship curves are obtained. A linear fit is then performed on the obtained second relationship curves using a preset interface phase thickness parameter. The optimal interface phase thickness parameter is obtained when the standard deviation of the linear fit is minimized. .

[0041] In a specific embodiment, the step of fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: fitting the second relationship curve within the preset scattering vector range to obtain a fitted straight line for each second relationship curve; obtaining the standard deviation between the fitted straight line and the second relationship curve; determining the second relationship curve with the smallest standard deviation as the optimal second relationship curve; and the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

[0042] Specifically, in characterizing the crystalline structure of insulating materials Linear fitting is performed on the value range to obtain different The fitted straight line of the corresponding second relationship curve is used to iterate through all preset interface phase thickness parameters. The second relationship curve that minimizes the standard deviation is selected as the optimal relationship curve, and the corresponding target preset interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated. If multiple candidate parameters have similar standard deviations, a consistency constraint on the scattering intensity gradient is further introduced (e.g., the deviation between the scattering intensity gradient ∇I(q) and the theoretical gradient is less than 10%). Through the constraints on the scattering vector range and the evaluation of the goodness of fit, the influence of noise interference on the thickness parameter inversion is effectively reduced, and the robustness and accuracy of the interface phase thickness screening are improved.

[0043] In a specific embodiment, the first relationship curve is obtained using the following formula:

[0044]

[0045] in, As a preset constant, The correlation distance is a measure of the inhomogeneity of a two-phase system. The interface phase thickness parameter. The scattering vector, The scattering intensity is denoted as .

[0046] Specifically, through the scattering vector With scattering intensity The coupling relationship will affect the interface phase thickness parameters. The (interfacial phase thickness inhomogeneity parameter) is directly correlated with scattering experimental data, enabling quantitative inversion from scattering signals to microstructural parameters, overcoming the limitations of traditional methods that rely solely on empirical comparisons. (Exponential term) Introduced The attenuation effect on scattering intensity can effectively suppress high-frequency noise (large). q The interference of the value region on thickness inversion is reduced, improving the accuracy of parameter selection under low signal-to-noise ratio conditions. Correlation distance As a measure characterizing the inhomogeneity of the microstructure of the interfacial phase, it is obtained through the formula... Term and scattering vector The secondary correlation can sensitively capture the spatial correlation of electron density fluctuations within the interfacial phase, providing crucial information for assessing the degree of degradation of insulating materials (such as local defects or uneven aging). Preset constants. The formula can be flexibly adjusted to adapt to the microstructure regularity of different cable materials (such as polyethylene, cross-linked polyethylene, etc.), making the formula universal, and can be calibrated experimentally. and This can further optimize the accuracy of thickness screening.

[0047] In a specific embodiment, evaluating the structural degradation degree of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter includes: obtaining the transition interface phase thickness of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter; the transition interface phase thickness is the thickness of the transition interface from the crystalline region to the amorphous region of the cable insulation material to be evaluated; and evaluating the structural degradation degree of the cable insulation material to be evaluated based on the transition interface phase thickness and a preset evaluation rule. Specifically, the transition interface phase thickness obtained by inversion from the optimal interface phase thickness parameter can quantitatively describe the microscopic transition region between the crystalline and amorphous regions in the cable insulation material. Evaluating the structural degradation degree of the cable insulation material to be evaluated based on the transition interface phase thickness and the preset evaluation rule yields an accurate evaluation result.

[0048] In a specific embodiment, the preset evaluation rules include: the greater the thickness of the transition interface phase, the less severe the structural degradation of the cable insulation material being evaluated; conversely, the smaller the thickness of the transition interface phase, the more severe the structural degradation of the cable insulation material being evaluated. Specifically, an intuitive quantitative evaluation index is established through the positive correlation between the thickness of the transition interface phase and the degree of structural degradation. When the thickness of the transition interface phase is small, it indicates that the boundary between the crystalline and amorphous regions is blurred and the disorder of chain segment arrangement is increased (such as crystalline region destruction due to thermal aging or electrical stress), directly reflecting the aggravated microstructural degradation of the cable insulation material; conversely, a large thickness indicates a denser interface structure and higher crystal integrity. This rule simplifies the degradation diagnosis logic and avoids the complexity of multi-parameter comprehensive analysis required by traditional methods.

[0049] In a specific embodiment, the thickness of the transition interface phase is obtained using the following formula:

[0050]

[0051] in, The thickness of the transition interface phase. The optimal interface phase thickness parameter is given.

[0052] Specifically, an example of a method for assessing the structural degradation of insulating materials based on scattering tests is as follows:

[0053] 1. Sample Preparation: In this embodiment, the XLPE insulation layer of a 500kV cable was selected as the sample. XLPE samples with a thickness between 0.2 and 0.4 mm were obtained by circumferential cutting. The samples were cleaned in an ultrasonic cleaner containing anhydrous ethanol for 30 minutes and then dried in a 60℃ oven for 4 hours. Several samples were then heat-treated at 135℃ for 336 h, 672 h, 1008 h, and 1344 h. Square samples with a width of approximately 10 mm were cut from the sample sheets for later use.

[0054] 2. X-ray scattering test on the sample: The test angle range was set to 0°~4°, and the wavelength of the double-slit collimated Cu-Kα X-ray source was λ=1.542 Å. The acquired scattering image was subtracted from the background scattering and then integrated to obtain the scattering vector. For scattering intensity One-dimensional curves such as Figure 2 As shown, by Figure 2 It can be seen that as the heat treatment time increases, the scattering intensity peak first increases and then decreases.

[0055] 3. The obtained scattering intensity The parameters are mathematically transformed to obtain the square of the scattering vector. right The change curve, the mathematical transformation is based on the Debye formula for small-angle scattering in the quasi-two-phase structure of semi-crystalline polymers, and the scattering intensity. and scattering vector Establish the following relationship:

[0056]

[0057] 4. Regarding the obtained The curve is corrected. The correction method is as follows: starting from 0, select different values ​​successively from small to large. Worth getting different The obtained curve represents the XLPE crystal structure. A linear fit is performed on the value range, and the desired result is obtained when the standard deviation of the linear fit is minimized. value. Figure 3This indicates the XLPE test without heat treatment. The corrected curve changes as the value increases from 2.24 to 2.30. The corrected curve characterizes the XLPE crystal structure. Linear fitting was performed on values ​​in the range of 0.20 to 0.80, and the value was determined based on minimizing the standard deviation (root mean square error) of the fit. The values ​​and the standard deviation of the fit are shown in Table 1. It can be seen that when The error is minimized when the value is 2.27, so this value is selected. The value is what we are looking for. value.

[0058] Table 1: Standard deviation of the square of the optimal interfacial phase thickness parameters for different interface phase parameters in untreated cable insulation

[0059]

[0060] Using the same method, XLPE samples were subjected to different heat treatment stages. The curve is corrected to obtain the required result. Value, result as Figure 4 As shown, by Figure 4 It can be seen that after the curve is corrected, The linear relationship is more obvious in the range of 0.2-0.8.

[0061] 5. Calculate the thickness of the transition interface phase from the XLPE crystalline region to the amorphous region based on the obtained σ value. The calculation formula is as follows: .

[0062] The calculation results are as follows Figure 5 As shown, after short-term heat treatment, the XLPE sample exhibits a recrystallization effect, causing some amorphous molecular chains to fold and rearrange into the crystalline region, resulting in an increase in the thickness of the transition interface. This indicates that the XLPE molecular chain arrangement tends towards regularity in the early stage of heat treatment, improving its microstructure quality rather than deteriorating it. However, with increasing heat treatment time, the XLPE molecular chains are gradually destroyed, crystalline defects increase, and the transition interface thickness decreases, leading to a gradual deterioration of the XLPE microstructure. Therefore, the degree of microstructure deterioration can be accurately assessed based on the change in the transition interface thickness (E value). The higher the value, the less the microstructure of XLPE deteriorates and the better the performance and quality of XLPE. The smaller the value, the more severe the degradation of the XLPE microstructure and the worse its performance and quality.

[0063] This embodiment analyzes the structural changes of the crystalline transition interface in XLPE during its degradation process. During XLPE degradation, the microstructure of the transition interface between crystalline and amorphous regions changes sensitively with XLPE degradation. Characterizing these changes accurately reflects the degree of microstructure degradation in XLPE. The essence of XLPE structural degradation is the gradual reduction of relatively regular crystalline regions and the gradual increase of amorphous regions. This method accurately characterizes the molecular chain aggregation structure changes as crystalline regions gradually transform into amorphous regions during XLPE microstructure degradation. This method has advantages such as simple operation, non-destructive nature, high accuracy, and small sample size requirement. It also provides a new characteristic quantity for assessing the degree of microstructure degradation in XLPE insulation, serving as a valuable supplement to XLPE insulation degradation assessment methods.

[0064] In a specific embodiment, please refer to Figure 6 This document provides a schematic diagram of a cable insulation degradation assessment system based on a scattering test, according to a second embodiment of this application. The system includes: a scattering intensity acquisition module 201, a relationship curve construction module 202, an optimal selection module 203, and an assessment module 204. The scattering intensity acquisition module 201 is used to perform a small-angle scattering experiment on the cable insulation material to be assessed to obtain the scattering intensity of the cable insulation material. The relationship curve construction module 202 is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be assessed. The interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material. The optimal selection module 203 is used to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range. The optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be assessed. The assessment module 204 is used to assess the structural degradation degree of the cable insulation material to be assessed based on the optimal interface phase thickness parameter.

[0065] The system in this embodiment only needs to acquire the scattering intensity of the cable insulation material, thus eliminating the need for a large number of samples, complex sample processing, and destructive treatment of the cable samples. Different degrees of degradation result in different scattering intensities and interface phase thickness parameters. By constructing a first relationship curve between scattering intensity, scattering vector, and interface phase thickness parameters, the correlation between these parameters can be comprehensively considered. Using different preset interface phase thickness parameters, the first relationship curve, and preset scattering vector ranges, the optimal interface phase thickness parameter can be determined. This optimal parameter accurately characterizes the microstructural degradation state of the cable insulation material. Therefore, using the optimal parameter to assess the degree of structural degradation of the cable insulation material can accurately reflect its degradation status.

[0066] In a specific embodiment, the third embodiment of this application provides a cable insulation degradation assessment based on a scattering test, including a memory and a processor. The memory stores a computer program, and when the computer program is executed by the processor, the processor performs the steps of the method as described in any of the first embodiments of this application.

[0067] In a specific embodiment, the fourth embodiment of this application provides a computer-readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform the steps of the method as described in any one of the first embodiments of this application.

[0068] Figure 7 An internal structural diagram of a computer device in one embodiment is shown. This computer device can specifically be a terminal or a server. See also... Figure 7 The computer device includes a processor, memory, etc., connected via a system bus. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and may also store a computer program. When executed by the processor, this computer program causes the processor to implement the method described in this embodiment. The internal memory may also store a computer program, which, when executed by the processor, causes the processor to perform the method described in this embodiment. Those skilled in the art will understand that... Figure 7 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0069] The above embodiments merely illustrate several implementation methods of this application, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

[0070] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any other way. Any person skilled in the art may make changes or modifications to the above-disclosed technical content to create equivalent embodiments for application in other fields. However, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present invention without departing from the scope of the present invention shall still fall within the protection scope of the present invention.

Claims

1. A method for assessing the degree of cable insulation degradation based on scattering tests, characterized in that, The method includes: A small-angle scattering experiment was conducted on the cable insulation material to be evaluated to obtain the scattering intensity of the cable insulation material to be evaluated; A first relationship curve is constructed between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material. Using different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range, the optimal interface phase thickness parameter is determined among the different preset interface phase thickness parameters; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated. The structural degradation degree of the cable insulation material to be evaluated is determined based on the optimal interface phase thickness parameter. The step of determining the optimal interface phase thickness parameter among different preset interface phase thickness parameters, the first relationship curve, and a preset scattering vector range includes: The first relationship curve is corrected by using different preset interface phase thickness parameters to obtain a second relationship curve corresponding to each preset interface phase thickness parameter; The optimal interface phase thickness parameter is determined by fitting the second relationship curve within the preset scattering vector range; The first relationship curve is obtained using the following formula: in, As a preset constant, The correlation distance is a measure of the inhomogeneity of a two-phase system. The interface phase thickness parameter. The scattering vector, The scattering intensity is denoted as .

2. The method for assessing cable insulation degradation based on scattering tests as described in claim 1, characterized in that, The step of fitting the second relationship curve within the preset scattering vector range to determine the optimal interface phase thickness parameter includes: The second relationship curve is fitted within the preset scattering vector range to obtain a fitted straight line for each of the second relationship curves; Obtain the standard deviation between the fitted straight line and the second relationship curve; The second relationship curve corresponding to the minimum standard deviation is determined as the optimal second relationship curve; the target preset interface phase thickness parameter in the optimal second relationship curve is the optimal interface phase thickness parameter.

3. The method for evaluating cable insulation degradation based on scattering tests as described in claim 1, characterized in that, The evaluation of the microstructural degradation degree of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter includes: The transition interface phase thickness of the cable insulation material to be evaluated is obtained based on the optimal interface phase thickness parameter; the transition interface phase thickness is the thickness of the transition interface from the crystalline region to the amorphous region of the cable insulation material to be evaluated. The structural degradation degree of the cable insulation material to be evaluated is assessed based on the thickness of the transition interface phase and the preset evaluation rules.

4. The cable insulation degradation assessment method based on scattering tests as described in claim 3, characterized in that, The preset evaluation rules include: the greater the thickness of the transition interface phase, the less severe the structural degradation of the cable insulation material to be evaluated; the smaller the thickness of the transition interface phase, the more severe the structural degradation of the cable insulation material to be evaluated.

5. The method for evaluating cable insulation degradation based on scattering tests as described in claim 4, characterized in that, The thickness of the transition interface phase is obtained using the following formula: in, The thickness of the transition interface phase. The optimal interface phase thickness parameter is given.

6. A cable insulation degradation assessment system based on scattering tests, applied to the cable insulation degradation assessment method based on scattering tests as described in claim 1, characterized in that, The system includes: a scattering intensity acquisition module, a relationship curve construction module, an optimal selection module, and an evaluation module; The scattering intensity acquisition module is used to perform a small-angle scattering experiment on the cable insulation material to be evaluated, and to obtain the scattering intensity of the cable insulation material to be evaluated. The relationship curve construction module is used to construct a first relationship curve between the scattering intensity, the scattering vector of the scattering intensity, and the interface phase thickness parameter of the cable insulation material to be evaluated; the interface phase thickness parameter is the thickness of the transition region between the crystalline phase and the adjacent amorphous phase of the cable insulation material. The optimal selection module is used to determine the optimal interface phase thickness parameter among the different preset interface phase thickness parameters by using different preset interface phase thickness parameters, the first relationship curve, and the preset scattering vector range; the optimal interface phase thickness parameter is the actual interface phase thickness parameter of the cable insulation material to be evaluated. The evaluation module is used to evaluate the degree of structural degradation of the cable insulation material to be evaluated based on the optimal interface phase thickness parameter.

7. A cable insulation degradation assessment device based on scattering tests, comprising a memory and a processor, characterized in that, The memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 1 to 5.

8. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, the processor performs the steps of the method as described in any one of claims 1 to 5.

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