Comparison device for preparing pixelated scintillation material sample
By designing a scintillation material sample comparison device including a detection platform, a sampling platform and an optical detector, the low efficiency problem in the existing technology is solved, the rapid preparation and efficient detection of pixelated scintillation materials are achieved, and the sample comparison effect is improved.
Patent Information
- Application Number
- CN202510719325.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-30
- Publication Date
- 2025-10-10
AI Technical Summary
Existing scintillation material detection devices are inefficient when testing multiple groups of different materials and different light source intensities, which affects the sample comparison effect.
A scintillation material sample comparison device was designed, which included a detection table, a sampling table, a heating tank, an injection molding table, an optical detector and other components. By heating and curing the pixelated scintillation material, and using an adjustable light source intensity and a mobile optical detector to collect data, rapid preparation and comparison were achieved.
The rapid preparation and efficient detection of pixelated scintillation materials are achieved, and samples can be compared under different light source intensities, improving detection efficiency and accuracy.
Smart Images
Figure CN120761347A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to a device for preparing pixelated scintillation material sample comparison, belonging to the technical field of scintillation material detection. Background Art
[0002] Pixelated scintillating materials are materials with specific optical properties that cause them to flash or fluoresce in a specific manner when stimulated by light. These materials are typically designed into tiny units or pixels, each of which can produce a visible light signal under specific conditions.
[0003] Scintillating materials have a wide range of applications in various fields, including radiation detection and measurement. Medical imaging uses them for monitoring and diagnosis in radioactive medical imaging, such as PET scans. Security testing uses them for radiation safety and nuclear material tracking. Environmental monitoring uses them to measure radiation levels and radioactive contamination. However, different scintillating materials exhibit different properties when excited by light sources of varying intensities, necessitating the use of scintillating material sample comparison testing equipment for testing.
[0004] Although the scintillating material detection devices currently on the market can excite and detect scintillating materials, the handling and replacement of pixelated thin film materials is rather cumbersome. The efficiency is poor when testing multiple groups of different materials and different light source intensities, which in turn affects the contrast effect of the samples. Summary of the Invention
[0005] In order to solve the problem that the existing technology of scintillation material sample comparison device has poor efficiency when testing multiple groups of different materials and different light source intensities, thereby affecting the contrast effect of the samples, this application proposes a technical solution for the structural design of a pixelated scintillation material sample comparison device.
[0006] This application adopts the following technical solutions:
[0007] According to a first aspect of the present application, a device for preparing pixelated scintillation material sample comparison is provided, comprising a detection platform (1), wherein the right end of the detection platform (1) is fixedly connected to a sampling platform (2);
[0008] A heating tank (4) is provided inside the upper end of the sampling platform (2), and an injection molding platform (5) is fixedly installed on the top of the right end of the sampling platform (2);
[0009] A detection box (9) is fixedly mounted on the upper surface of the detection platform (1), a mounting frame (12) is fixedly mounted on the top of the rear end of the detection platform (1), an optical detector (14) is mounted on the upper part of the mounting frame (12), and the optical detector (14) is located above the detection box (9). A mounting groove (17) is provided inside the upper end of the detection box (9), an LED light strip (18) is fixedly mounted laterally at the rear end of the mounting groove (17), and a plurality of light source control boxes (19) are fixedly mounted inside the mounting groove (17) at the front end of the LED light strip (18), an electric telescopic rod (20) is slidably connected to the inside of the detection box (9), a base plate (21) is detachably plugged into the top end of the electric telescopic rod (20), and a comparison area (22) is provided on the surface of the base plate (21).
[0010] Optionally, a reflective plate (35) is fixedly mounted on the inner bottom end of the light source control box (19), the side end of the reflective plate (35) is in close contact with the LED light strip (18), and the upper end surface of the reflective plate (35) is fixedly connected to a dotted glass plate (29).
[0011] Optionally, inside the light source control box (19), a lower polarizer (30) is fixedly mounted on the upper end face of the dotted glass plate (29), a thin film transistor plate (31) is fixedly connected to the upper end face of the lower polarizer (30), and an upper polarizer (32) is fixedly connected to the upper end face of the thin film transistor plate (31).
[0012] Optionally, a pressurizer (33) is fixedly mounted on the side of the thin film transistor plate (31) facing the front end of the detection box (9), and a resistance adjustment knob (16) located on the surface of the detection box (9) is mounted on the side of the pressurizer (33) facing the front end of the detection box (9).
[0013] Optionally, a plurality of feeding ports (23) are provided at the right end of the comparison area (22), a circular hole (24) is provided at the left end inside the feeding port (23), a plurality of sample grooves (26) are provided at the left end of the comparison area (22), a drainage groove (27) is provided at the left end inside the sample groove (26), and a rubber plug (25) is inserted into the interior of the feeding port (23).
[0014] Optionally, a material film injection groove (28) is provided at the inner bottom end of the sample groove (26), and the material film injection groove (28) is located directly above the upper polarizer (32).
[0015] Optionally, a hydraulic rod (13) is mounted on the mounting frame (12) at the upper end of the optical detector (14), and a clamping plate (15) is fixedly mounted on the lower end of the optical detector (14).
[0016] Optionally, a hinge (10) is installed on the top edge of the front end of the detection box (9), and the top of the front end of the detection box (9) is rotatably connected to a transparent protective plate (11) through the hinge (10).
[0017] Optionally, a heater (3) is fixedly installed inside the sampling platform (2), and a support pad (8) is fixedly connected to the bottom end of the sampling platform (2).
[0018] Optionally, a plurality of raw material barrels (6) are fixedly mounted on the top of the injection molding table (5), and a plurality of injection molding heads (7) are fixedly mounted on the bottom of the injection molding table (5), and the injection molding heads (7) are located above the heating tank (4).
[0019] The beneficial effects of this application include:
[0020] (1) The device for preparing pixelated scintillation material sample comparison provided in the present application can quickly plastically prepare test samples in a substrate through a feeding device in an injection molding table and a heating device at a sampling table. The structure of the substrate is convenient for installation and disassembly. When testing the sample, protective devices can be added to the side and top of the substrate to prevent the sample from being contaminated and affecting the test structure.
[0021] (2) The substrate described in this application is provided with multiple sets of comparison areas and multiple sample slots, which can be used to place different materials at the same time. During the test, the light intensity at the sample slots in different positions can be adjusted by the resistance adjustment knob. During the test, the excitation luminescence data comparison of the same material at different light intensities can be provided, and the excitation luminescence data comparison of different materials at the same light intensity can be provided.
[0022] (3) The device of the present application utilizes an optical detector that can be moved up and down to collect the luminescence data of pixelated scintillation material samples, and can plot the data into a graph on a computer display, making it convenient for experimenters to conduct intuitive comparison and data collection. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] Figure 1 This is a schematic diagram of the structure of a comparison device for preparing pixelated scintillation material samples according to the present application;
[0024] Figure 2 Schematic diagram of the structure of the detection device in this application;
[0025] Figure 3 This is the internal structure diagram of the detection box in this application;
[0026] Figure 4 Schematic diagram of the sample substrate structure in this application;
[0027] Figure 5 This is a structural plan of the light source control box in this application;
[0028] Figure 6 It is a structural plan view of the detection device in the application.
[0029] Reference signs
[0030] 1-detection table, 2-sampling table, 3-heater, 4-heating groove, 5-injection table, 6-raw material barrel, 7-injection head, 8-support pad, 9-detection box, 10-hinge, 11-transparent protective plate, 12-mounting rack, 13-hydraulic rod, 14-optical detector, 15-clamping plate, 16-resistance adjusting knob, 17-mounting groove, 18-LED light strip, 19-light source control box, 20-electric telescopic rod, 21-base plate, 22-contrast area, 23-charging port, 24-round hole, 25-rubber plug, 26-sample groove, 27-drainage groove, 28-material film injection groove, 29-dot glass plate, 30-lower polarizer, 31-thin film transistor plate, 32-upper polarizer, 33-pressurizer, 34-plug-in groove, 35-reflective plate. DETAILED DESCRIPTION
[0031] In order to make the technical problems solved in the application, the technical solutions adopted and the technical effects reached more clear, the application will be further described in detail below in conjunction with the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the application, but not to limit the application. In addition, it should be noted that, in order to facilitate the description, only the parts related to the application are shown in the drawings, not all.
[0032] In the description of the application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the application; the terms "first", "second", "third" are only for the purpose of description, and cannot be understood as indicating or implying relative importance; in addition, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connection" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrally connected; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, or the communication inside two elements. For those skilled in the art, the specific meaning of the above terms in the application can be understood according to the specific circumstances.
[0033] According to an embodiment of the application, as Figure 1-6The structural schematic diagram shown is a device for preparing pixelated scintillating material sample comparison, comprising a test table 1, a sampling table 2 fixedly connected to the right end of the test table 1, a heating tank 4 provided inside the sampling table 2, an injection molding table 5 fixedly mounted on the top of the right end of the sampling table 2, a test box 9 fixedly mounted on the surface of the test table 1, a mounting frame 12 fixedly mounted on the top of the rear end of the test table 1, an optical detector 14 mounted below the mounting frame 12, a mounting slot 17 provided inside the test box 9, an LED light strip 18 fixedly mounted inside the rear end of the mounting slot 17, a plurality of light source control boxes 19 fixedly mounted inside the mounting slot 17 and located at the front end of the LED light strip 18, an electric telescopic rod 20 slidably connected to the inside of the test box 9, a substrate 21 inserted at the top end of the electric telescopic rod 20, and a comparison area 22 provided on the surface of the substrate 21. The injection molding table 5 at the sampling table 2 can inject a solution sample of the pixelated scintillating material into the feeding port 23 in the substrate 21, and the heating tank 4 is used to heat and solidify the solution film located in the material film injection tank 28 in the sample tank 26. An LED light strip 18 and a light source control box 19, mounted at the bottom of the detection box 9, provide and control the input light source. A base plate 21 is mounted above the motorized telescopic rod 20 within the detection box 9. The film injection slot 28 is a transparent plate, allowing the pixelated scintillating material film formed within the slot to be placed above the light source in the light source control box 19. A comparison area 22 houses control groups with different materials added and controls with the same material but different light source intensities. A light source signal is mounted within the mounting frame 12 to detect and receive the signal from the material within the film injection slot 28 after it is excited.
[0034] like Figure 3 and Figure 5 As shown, a reflector plate 35 is fixedly mounted at the bottom of the light source control box 19. An LED light strip 18 is mounted on the side of the reflector plate 35. A dotted glass plate 29 is fixedly attached to the reflector plate 35. When the LED light strip 18 is activated, light is reflected by the reflector plate 35, redirecting the light upward. Once the light enters the dotted glass plate 29, the linear light source is transformed into a surface light source.
[0035] like Figure 5 As shown, a lower polarizer 30 is fixedly mounted on the top of the dotted glass plate 29. A thin-film transistor (TFT) plate 31 is fixedly connected to the top of the lower polarizer 30. The top of the TFT plate 31 is fixedly connected to the top of the TFT plate 31. An upper polarizer 32 is fixedly connected to the top of the TFT plate 31. After the surface light source passes through the lower polarizer 30, TFT plate 31, and upper polarizer 32, it can be sent to the bottom of the pixelated scintillating thin film material, causing the material to emit light.
[0036] like Figure 3 and Figure 5As shown, a voltage regulator 33 is fixedly mounted on the side of the thin-film transistor panel 31. A resistance adjustment knob 16 is mounted on the top of the voltage regulator 33, located on the surface of the test box 9. Turning the resistance adjustment knob 16 controls the voltage input to the voltage regulator 33. As the voltage at the voltage regulator 33 increases, the luminous flux at the thin-film transistor panel 31 decreases, and as the light source at the thin-film transistor panel 31 dims, the input light source is adjusted. This facilitates comparative testing, allowing the excitation state of the same material under different light source intensities to be tested.
[0037] like Figure 4 As shown, a feeding port 23 is provided at the right end of the comparison area 22, a circular hole 24 is provided at the inner left end of the feeding port 23, and multiple sample slots 26 are provided at the left end of the comparison area 22. A drainage slot 27 is provided at the inner left end of the sample slots 26. A rubber stopper 25 is inserted into the feeding port 23. When adding different raw material solutions, the rubber stopper 25 can be removed first, and the different material solutions can be poured into the multiple feeding ports 23. The solutions are allowed to flow through the circular hole 24 and drainage slot 27 into the multiple sample slots 26, and a pixelated film is formed at the material film injection slot 28 within the sample slots 26.
[0038] like Figure 4 As shown, a material film injection groove 28 is provided at the bottom of the sample slot 26, and the material film injection groove 28 is located directly above the upper polarizer 32. Sample slots 26 in the same row are used to place the same material, and a light source control box 19 is provided below each sample slot 26 to provide different light source intensities to facilitate sample comparison testing.
[0039] like Figure 2 As shown, a hydraulic rod 13 is mounted at the bottom of the mounting frame 12. An optical detector 14 is fixedly connected to the bottom of the hydraulic rod 13, and a clamping plate 15 is fixedly mounted at the lower end of the optical detector 14. Activating the hydraulic rod 13 moves the optical detector 14 and clamping plate 15 up and down. When the clamping plate 15 is moved to the surface of the transparent protective plate 11 above the substrate 21, light signals from the scintillating thin film material can be collected. A background display simultaneously displays luminescence data for the material under different light source intensities and for different materials under the same light source intensity, facilitating intuitive comparison and data collection for experimenters.
[0040] like Figure 1 and Figure 6 As shown, a hinge 10 is installed at the top front end of the detection box 9, and a transparent protective plate 11 is rotatably connected to the top front end of the detection box 9 via the hinge 10. The transparent protective plate 11 can be rotatably placed on the surface of the detection box 9 via the hinge 10, covering and protecting the top of the substrate 21 from external environmental influences during detection.
[0041] like Figure 1As shown, a heater 3 is fixedly installed inside the sampling platform 2, and a support pad 8 is fixedly connected to the bottom end of the sampling platform 2. The heater 3 is used to heat the solution in the tank 4 to solidify and shape it into a pixelated scintillating film.
[0042] like Figure 1 As shown, a plurality of raw material barrels 6 are fixedly mounted on the bottom of the injection molding platform 5, and a plurality of injection molding heads 7 are fixedly mounted on the bottom of the injection molding platform 5. The raw material barrels 6 are used to place different solution materials. The injection molding heads 7 can deliver the raw materials to the inside of the feeding port 23.
[0043] Working principle: The injection molding station 5 at the sampling station 2 can inject the solution sample of the pixelated scintillating material into the feeding port 23 in the substrate 21, and the heating tank 4 is used to heat, solidify and shape the solution film located at the material film injection tank 28 in the sample tank 26. The LED light strip 18 and the light source control box 19 installed at the bottom end of the detection box 9 are used to provide and control the input light source. When adding different raw material solutions, the rubber plug 25 can be pulled out first, and the raw material barrel 6 is used to place different solution materials. The injection molding head 7 can deliver the raw material to the inside of the feeding port 23. Different material solutions are poured into the inside of multiple feeding ports 23, and the solutions are allowed to flow into multiple sample tanks 26 through the circular hole 24 and the drainage tank 27. The heater 3 is used to heat the solution in the tank 4, allowing it to solidify and shape into a pixelated film at the material film injection tank 28 in the sample tank 26. Then the substrate 21 can be inserted into the top of the electric telescopic rod 20 in the detection box 9 through the insertion slot 34, and the electric telescopic rod 20 is started to lift it up and send it to the top of the internal light source control box 19 of the detection box 9.
[0044] Then start the LED light strip 18, and the light source can be injected into the reflective plate 35 for reflection, and the light is changed to be irradiated upward. After the light source enters the dot glass plate 29, the line light source can be converted into a surface light source. After the surface light source passes through the lower polarizer 30, the thin film transistor plate 31, and the upper polarizer 32, the input light source can be sent to the bottom of the pixelated scintillating film material to excite the material to emit light. When the resistance adjustment knob 16 is turned, the voltage input size of the booster 33 can be controlled. When the voltage at the booster 33 increases, the luminous flux at the thin film transistor plate 31 becomes smaller, and then when the light source at the thin film transistor plate 31 becomes darker, the size of the input light source is adjusted. It is convenient to carry out comparative testing and test the excitation state of the same material under different light source intensities. The sample slots 26 in the same row are used to place the same material, and the light source control box 19 set below each sample slot 26 is used to provide different light source intensities to facilitate sample comparative testing.
[0045] Finally, the transparent protective plate 11 is rotated and placed on the surface of the test box 9, covering and protecting the top of the substrate 21 from external environmental influences during testing. The hydraulic rod 13 is activated to move the optical detector 14 and the card 15 up and down. When the card 15 is moved to the surface of the transparent protective plate 11 above the substrate 21, the optical signal of the scintillating thin film material can be collected. The background display device can simultaneously display the luminescence data of the material under different light intensities and the excitation data of different materials under the same light intensity, facilitating intuitive comparison and data collection for the experimenter.
[0046] This device can quickly prepare pixelated scintillating films and add multiple groups of different film materials for comparison. The device is equipped with an adjustable input light source intensity structure, which can simultaneously perform light source intensity excitation state comparison detection on pixelated scintillating film materials. Sample preparation is simple and the detection efficiency is high.
[0047] The above descriptions are merely a few embodiments of the present application and do not constitute any form of limitation to the present application. Although the present application discloses the preferred embodiments as above, they are not intended to limit the present application. Any technical personnel familiar with the present profession, without departing from the scope of the technical solution of the present application, using the technical content disclosed above to make slight changes or modifications are equivalent to equivalent implementation cases and fall within the scope of the technical solution.
Claims
1. A device for preparing pixelated scintillating material sample comparison, characterized in that: It comprises a detection platform (1), wherein the right end of the detection platform (1) is fixedly connected to a sampling platform (2); A heating tank (4) is provided inside the upper end of the sampling platform (2), and an injection molding platform (5) is fixedly installed on the top of the right end of the sampling platform (2); A detection box (9) is fixedly mounted on the upper surface of the detection platform (1), a mounting frame (12) is fixedly mounted on the top of the rear end of the detection platform (1), an optical detector (14) is mounted on the upper part of the mounting frame (12), and the optical detector (14) is located above the detection box (9). A mounting groove (17) is provided inside the upper end of the detection box (9), an LED light strip (18) is fixedly mounted laterally at the rear end of the mounting groove (17), and a plurality of light source control boxes (19) are fixedly mounted inside the mounting groove (17) at the front end of the LED light strip (18), an electric telescopic rod (20) is slidably connected to the inside of the detection box (9), a base plate (21) is detachably plugged into the top end of the electric telescopic rod (20), and a comparison area (22) is provided on the surface of the base plate (21).
2. The device for preparing pixelated scintillation material sample comparison according to claim 1, characterized in that: A reflective plate (35) is fixedly mounted on the inner bottom end of the light source control box (19), the side end of the reflective plate (35) is in close contact with the LED light strip (18), and the upper end surface of the reflective plate (35) is fixedly connected to a dotted glass plate (29).
3. The device for preparing pixelated scintillating material sample comparison according to claim 2, characterized in that: Inside the light source control box (19), a lower polarizer (30) is fixedly mounted on the upper end surface of the dotted glass plate (29), a thin film transistor plate (31) is fixedly connected to the upper end surface of the lower polarizer (30), and an upper polarizer (32) is fixedly connected to the upper end surface of the thin film transistor plate (31).
4. The device for preparing pixelated scintillation material sample comparison according to claim 3, characterized in that: A pressurizer (33) is fixedly mounted on the side of the thin film transistor plate (31) facing the front end of the detection box (9), and a resistance adjustment knob (16) located on the surface of the detection box (9) is mounted on the side of the pressurizer (33) facing the front end of the detection box (9).
5. The device for preparing pixelated scintillating material sample comparison according to claim 1, characterized in that: The right end of the comparison area (22) is provided with a plurality of feeding ports (23), the left end of the interior of the feeding ports (23) is provided with a circular hole (24), the left end of the comparison area (22) is provided with a plurality of sample grooves (26), the left end of the interior of the sample grooves (26) is provided with a drainage groove (27), and the interior of the feeding port (23) is plugged with a rubber plug (25).
6. The device for preparing pixelated scintillation material sample comparison according to claim 5, characterized in that: A material film injection groove (28) is provided at the inner bottom end of the sample groove (26), and the material film injection groove (28) is located directly above the upper polarizer (32).
7. The device for preparing pixelated scintillating material sample comparison according to claim 1, characterized in that: A hydraulic rod (13) is mounted on the mounting frame (12) at the upper end of the optical detector (14), and a clamping plate (15) is fixedly mounted on the lower end of the optical detector (14).
8. The device for preparing pixelated scintillating material sample comparison according to claim 1, characterized in that: A hinge (10) is installed on the top edge of the front end of the detection box (9), and a transparent protective plate (11) is rotatably connected to the top of the front end of the detection box (9) through the hinge (10).
9. The device for preparing pixelated scintillating material sample comparison according to claim 1, characterized in that: A heater (3) is fixedly installed inside the sampling platform (2), and a support pad (8) is fixedly connected to the bottom end of the sampling platform (2).
10. The device for preparing pixelated scintillating material sample comparison according to claim 1, characterized in that: A plurality of raw material barrels (6) are fixedly mounted on the top of the injection molding table (5), and a plurality of injection molding heads (7) are fixedly mounted on the bottom of the injection molding table (5), wherein the injection molding heads (7) are located above the heating tank (4).