Debugging and testing jig for surface acoustic wave device
By installing a top cover and fans on the SAW device debugging test rack to build an active air cooling system, the problem of local overheating during high-power testing was solved, achieving more accurate test results and device stability.
Patent Information
- Application Number
- CN202511278736.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-09
- Publication Date
- 2025-10-10
- Estimated Expiration
- 2045-09-09
AI Technical Summary
Existing SAW device debugging and testing frames lack heat dissipation structures during high-power testing, resulting in local overheating, affecting device stability and the accuracy of test results.
A top cover is installed on the surface of the test frame body, and an air induction ring and a fan are set in the middle of the bottom surface of the top cover to build an active air cooling and heat dissipation system. Air circulation is achieved through the air inlet and exhaust holes to remove heat and reduce the temperature of the device.
It effectively avoids local overheating, ensures that the test results are closer to the actual performance under actual working conditions, and improves the stability of the device and the accuracy of the test.
Smart Images

Figure CN120761676A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of test racks, in particular to a surface acoustic wave device debugging test rack. Background Art
[0002] Surface acoustic wave devices are solid-state devices that utilize the characteristics of acoustic-to-electric transducers to process acoustic signals propagating on the surface of a piezoelectric substrate and perform various functions. They utilize semiconductor planar processing to create interdigitated metal electrodes (called interdigital transducers (IDTs)) on the surface of the piezoelectric substrate. Applying an alternating voltage to these electrodes excites surface acoustic waves (SAWs) on the substrate surface, allowing electrical signals to be transmitted through these SAWs. Testing of SAW devices is an integral part of their research, development, production, and application.
[0003] For example, in the prior art, patent authorization announcement number CN203825116U discloses a surface acoustic wave device debugging and testing stand, including a debugging circuit board, a metal chassis, and an RF converter. The debugging circuit board is fixed to the metal chassis, and the RF converter is installed at both ends of the metal chassis. The debugging circuit board is made of a high-frequency double-sided copper-clad substrate, the central area of the front side of which is the socket for the device under test, the areas on both sides are the debugging circuit, and the back side is a large-area grounded copper-clad surface that contacts and connects to the metal chassis. The above-mentioned device integrates the device under test socket and debugging circuit used for debugging and testing surface acoustic wave devices on the high-frequency substrate, fixes the debugging circuit board to the metal chassis, and effectively connects the ground electrode to the metal base. The debugging circuit board is electrically connected to the test instrument through the RF converter. The entire device has a compact structure, low RF loss, and convenient debugging and testing operations.
[0004] However, the above-mentioned surface acoustic wave device debugging and testing frame has certain defects when used: During use, the above-mentioned surface acoustic wave device debugging test stand lacks a heat dissipation structure for the surface acoustic wave device, which causes local overheating during high-power testing, affecting the stability of the device, and further causing distortion of the test results, which cannot accurately reflect the actual performance of the device under normal working conditions. Summary of the Invention
[0005] In view of the deficiencies of the prior art, the present invention provides a surface acoustic wave device debugging and testing stand, which can reduce the temperature during the testing process.
[0006] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: a surface acoustic wave device debugging test stand, comprising a test stand body, a top cover installed on the surface of the test stand body, an air induced air ring fixedly connected to the middle of the bottom surface of the top cover, a fan fixedly connected to the middle of the air induced air ring, a plurality of exhaust holes corresponding to the fan positions are opened in the middle of the top cover surface, and a plurality of air inlet holes are opened on both sides of the top cover surface.
[0007] Further, the top cover is fixedly connected with two symmetrical rotating blocks on one side, the test stand body is provided with a connecting plate on one side of the surface, the connecting plate is provided with rotating grooves corresponding to the positions of the two rotating blocks on the surface, rotating shafts are fixedly connected in the rotating grooves, the rotating blocks are rotationally connected with the rotating shafts, the connecting plate is fixedly connected with an insertion block on the bottom surface, the test stand body is provided with a mounting groove corresponding to the position of the insertion block on the surface, two conductive insertion rods are fixedly connected in the mounting groove, the insertion block is provided with insertion grooves corresponding to the positions of the conductive insertion rods on the bottom surface, and the fan is electrically connected with the test stand body through the conductive insertion rods.
[0008] Further, the insertion block is provided with a positioning hole in the side wall, the test stand body is provided with a sliding groove corresponding to the position of the positioning hole on the back side, and the sliding groove is slidably connected with a positioning rod.
[0009] Further, the test stand body is fixedly connected with a fixing ring on the back side, the fixing ring is sleeved on the positioning rod, one end of the positioning rod away from the test stand body is fixedly connected with a moving disc, and the moving disc is fixedly connected with a return spring between the fixing ring.
[0010] Further, the rotating grooves are fixedly connected with magnetic attraction blocks on the inner walls, and the rotating blocks are fixedly connected with positioning blocks corresponding to the positions of the magnetic attraction blocks on the surfaces.
[0011] Further, the air guiding ring is provided with a filter screen on the bottom surface, the air guiding ring is threadedly connected with a mounting ring on the outer wall, the outer edge of the filter screen is located between the air guiding ring and the mounting ring, and the mounting ring is fixedly connected with a plurality of anti-skid blocks on the outer wall.
[0012] Further, the air inlet holes are fixedly connected with filter pieces.
[0013] Further, the top cover is fixedly connected with two symmetrical observation windows on the surface.
[0014] Further, the top cover is provided with a clamping groove on the side away from the rotating blocks.
[0015] Further, the top cover is fixedly connected with a buffer pad on the bottom surface.
[0016] Compared with the prior art, the present application has the following beneficial effects: This SAW device debugging test stand incorporates an active air-cooling system by adding a top cover to the test stand body and placing an air induction ring and fan in the center of the bottom of the top cover. When the SAW device is undergoing high-power testing, the fan activates to direct airflow, allowing cool air to enter the test area through the air inlets on both sides of the top cover. As it flows over the surface of the device under test, it removes heat, and the hot air is then exhausted through the exhaust holes in the center of the top cover. This active air-cooling system rapidly reduces the temperature of devices during high-power testing, preventing performance drift caused by localized overheating and ensuring that test results more closely resemble actual performance under actual operating conditions. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a schematic diagram of the overall three-dimensional structure of the present invention; Figure 2 A schematic diagram of a three-dimensional structure of another form of the present invention; Figure 3 This is a schematic diagram of a three-dimensional split structure of another form of the present invention; Figure 4 This is a schematic diagram of a three-dimensional split cross-sectional structure of the test stand body, the conductive insertion rod and the positioning rod of the present invention; Figure 5 This is a schematic diagram of the three-dimensional disassembled structure of the top cover, connecting plate and insert block of the present invention; Figure 6 This is a schematic diagram of the three-dimensional disassembled structure of the top cover, filter screen, mounting ring and fan of the present invention; Figure 7 It is a schematic diagram of the three-dimensional cross-sectional structure of the top cover, observation window and rotating block of the present invention; Figure 8 It is a schematic diagram of the three-dimensional disassembled structure of the connecting plate, insert block, rotating shaft and magnetic block of the present invention.
[0018] In the figure: 1. Test stand body; 2. Top cover; 3. Air induction ring; 4. Fan; 5. Filter; 6. Exhaust hole; 7. Air inlet hole; 8. Rotating block; 9. Connecting plate; 10. Rotating slot; 11. Rotating shaft; 12. Insert block; 13. Mounting slot; 14. Conductive insert rod; 15. Slot; 16. Positioning hole; 17. Sliding slot; 18. Positioning rod; 19. Fixed ring; 20. Moving plate; 21. Reset spring; 22. Magnetic block; 23. Positioning block; 24. Filter; 25. Mounting ring; 26. Anti-sliding block; 27. Buffer pad; 28. Observation window; 29. Card slot. DETAILED DESCRIPTION
[0019] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.
[0020] See also Figures 1 to 8 A surface acoustic wave device debugging test stand includes a test stand body 1, a top cover 2 is installed on the surface of the test stand body 1, an air induced ring 3 is fixedly connected to the middle of the bottom surface of the top cover 2, a fan 4 is fixedly connected to the middle of the air induced ring 3, a plurality of exhaust holes 6 corresponding to the position of the fan 4 are opened in the middle of the surface of the top cover 2, and a plurality of air inlet holes 7 are opened on both sides of the surface of the top cover 2.
[0021] The surface acoustic wave device debugging test stand of the present invention utilizes an active cooling system by attaching a top cover 2 to the test stand body 1 and disposing an air induced draft ring 3 and a fan 4 in the center of the bottom surface of the top cover 2. When the surface acoustic wave device is undergoing high-power testing, the fan 4 activates and directs airflow through the air induced draft ring 3. External cool air enters the test area through air inlet holes 7 on both sides of the top cover 2, removes heat as it flows over the surface of the device under test, and is then exhausted through exhaust holes 6 in the center of the top cover 2. This active air cooling system rapidly reduces the temperature of the device during high-power testing, preventing performance drift caused by localized overheating and ensuring that test results more closely resemble actual performance under actual operating conditions.
[0022] As a preferred technical solution of the present invention, two symmetrically arranged rotating blocks 8 are fixedly connected to one side of the top cover 2, and a connecting plate 9 is installed on one side of the surface of the test frame body 1. A rotating groove 10 corresponding to the positions of the two rotating blocks 8 is opened on the surface of the connecting plate 9, and a rotating shaft 11 is fixedly connected in the rotating groove 10. The rotating block 8 is rotatably connected to the rotating shaft 11. An insert block 12 is fixedly connected to the bottom surface of the connecting plate 9, and an installation groove 13 corresponding to the position of the insert block 12 is opened on the surface of the test frame body 1. Two conductive plug rods 14 are fixedly connected in the installation groove 13, and a slot 15 corresponding to the position of the conductive plug rod 14 is opened on the bottom surface of the plug block 12. The fan 4 is electrically connected to the test frame body 1 through the conductive plug rod 14.
[0023] Specifically, when it is necessary to place or replace a surface acoustic wave device under test, the top cover 2 can be flipped upward. Rotating block 8 then rotates around shaft 11 on connecting plate 9, enabling quick opening and closing of the top cover 2. The test stand body 1 can power the fan 4 via the conductive plug 14, eliminating the need for an additional power supply.
[0024] As a preferred technical solution of the present invention, a positioning hole 16 is opened on the side wall of the insert block 12, and a sliding groove 17 corresponding to the position of the positioning hole 16 is opened on the back side of the test stand body 1. A positioning rod 18 is slidably connected in the sliding groove 17.
[0025] Specifically, after top cover 2 is installed and insert 12 is fully embedded in mounting slot 13, positioning rod 18 on the back of test stand body 1 can slide inward along sliding slot 17 until its end enters positioning hole 16 in the side wall of insert 12, forming a mechanical lock. Positioning rod 18 and sliding slot 17 have a clearance fit, and locking is achieved by manually pushing. To unlock, pull positioning rod 18 in the opposite direction, disengaging it from positioning hole 16, allowing top cover 2 and connecting plate 9 to be removed for maintenance and replacement.
[0026] As a preferred technical solution of the present invention, a fixing ring 19 is fixedly connected to the back side of the test frame body 1, and the fixing ring 19 is sleeved on the outside of the positioning rod 18. The end of the positioning rod 18 away from the test frame body 1 is fixedly connected to a movable disk 20, and a reset spring 21 is fixedly connected between the movable disk 20 and the fixing ring 19.
[0027] Specifically, the return spring 21 pulls the movable plate 20 so that the positioning rod 18 is automatically inserted into the positioning hole 16 , thereby ensuring the stability of the positioning rod 18 .
[0028] As a preferred technical solution of the present invention, a magnetic block 22 is fixedly connected to the inner wall of each rotating groove 10 , and a positioning block 23 corresponding to the position of the magnetic block 22 is fixedly connected to the surface of the rotating block 8 .
[0029] Specifically, after the top cover 2 is opened, the magnetic block 22 and the positioning block 23 will be attracted together, and the magnetic force of the two will provide fixation for the top cover 2, thereby ensuring the stability of the top cover 2 in the open state, and preventing the top cover 2 from affecting the operation of the test stand body 1. At the same time, the magnetic fixation method also makes it easy to cancel the fixation of the top cover 2 and quickly close the top cover 2.
[0030] As a preferred technical solution of the present invention, a filter screen 24 is installed on the bottom surface of the air induced ring 3, and a mounting ring 25 is threadedly connected to the outer wall of the air induced ring 3. The outer edge of the filter screen 24 is located between the air induced ring 3 and the mounting ring 25, and a plurality of anti-sliding blocks 26 are fixedly connected to the outer wall of the mounting ring 25.
[0031] As a preferred technical solution of the present invention, a filter 5 is fixedly connected to each air inlet 7 .
[0032] Specifically, when fan 4 starts to guide airflow for heat dissipation, the outside air will carry a large amount of dust and impurities. The accumulation of dust will affect the heat dissipation performance of the device, preventing heat from being dissipated in a timely manner, thereby increasing the device temperature and affecting its performance stability and service life. Filter 5 can effectively intercept this dust, preventing it from entering the test area and adhering to the surface of the SAW device. Filter 24 can prevent damage to the fan blades caused by inhaled debris during fan 4 operation, ensuring continuous and stable operation of fan 4 and providing stable airflow to the test area, further ensuring the performance stability of the SAW device during testing and extending the device's service life.
[0033] As a preferred technical solution of the present invention, two symmetrically arranged observation windows 28 are fixedly connected to the surface of the top cover 2 .
[0034] Specifically, the observation window 28 is made of a special glass material with high transparency and high strength, which allows the operator to clearly observe the test status of the surface acoustic wave device inside the test frame body 1, including key information such as changes in the device's appearance and flashing of indicator lights.
[0035] As a preferred technical solution of the present invention, a slot 29 is provided on a side of the top cover 2 away from the rotating block 8 .
[0036] Specifically, the card slot 29 can bring convenience to the staff in opening the top cover 2 and improve the staff's operating experience.
[0037] As a preferred technical solution of the present invention, a buffer pad 27 is fixedly connected to the bottom surface of the top cover 2 .
[0038] Specifically, the buffer pad 27 can mitigate the vibration of the top cover 2, thereby reducing the noise generated during the operation of the fan 4 and providing a better testing environment for the staff.
[0039] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.
Claims
1. A surface acoustic wave device debugging test stand, comprising a test stand body (1), characterized in that: A top cover (2) is installed on the surface of the test stand body (1), an air induction ring (3) is fixedly connected to the middle of the bottom surface of the top cover (2), a fan (4) is fixedly connected to the middle of the air induction ring (3), a plurality of exhaust holes (6) corresponding to the position of the fan (4) are opened in the middle of the surface of the top cover (2), a plurality of air inlet holes (7) are opened on both sides of the surface of the top cover (2), two symmetrically arranged rotating blocks (8) are fixedly connected to one side of the top cover (2), a connecting plate (9) is installed on one side of the surface of the test stand body (1), and a plurality of air inlet holes (7) are opened on the surface of the connecting plate (9) corresponding to the positions of the two rotating blocks (8) are opened. The rotating groove (10) corresponds to the rotating groove (10), a rotating shaft (11) is fixedly connected in the rotating groove (10), the rotating block (8) is rotatably connected to the rotating shaft (11), the bottom surface of the connecting plate (9) is fixedly connected to the plug block (12), the surface of the test frame body (1) is provided with a mounting groove (13) corresponding to the position of the plug block (12), two conductive plug rods (14) are fixedly connected in the mounting groove (13), the bottom surface of the plug block (12) is provided with a slot (15) corresponding to the position of the conductive plug rod (14), and the fan (4) is electrically connected to the test frame body (1) through the conductive plug rod (14).
2. A surface acoustic wave device debugging and testing stand according to claim 1, characterized in that: A positioning hole (16) is provided on the side wall of the insert block (12), and a sliding groove (17) corresponding to the position of the positioning hole (16) is provided on the back side of the test stand body (1), and a positioning rod (18) is slidably connected in the sliding groove (17).
3. A surface acoustic wave device debugging and testing stand according to claim 2, characterized in that: A fixing ring (19) is fixedly connected to the back side of the test stand body (1), and the fixing ring (19) is sleeved outside the positioning rod (18). The end of the positioning rod (18) away from the test stand body (1) is fixedly connected to a moving disk (20), and a return spring (21) is fixedly connected between the moving disk (20) and the fixing ring (19).
4. A surface acoustic wave device debugging and testing stand according to claim 3, characterized in that: The inner wall of each rotating groove (10) is fixedly connected to a magnetic block (22), and the surface of the rotating block (8) is fixedly connected to a positioning block (23) corresponding to the position of the magnetic block (22).
5. A surface acoustic wave device debugging and testing stand according to claim 4, characterized in that: A filter screen (24) is installed on the bottom surface of the air induction ring (3), and a mounting ring (25) is threadedly connected to the outer wall of the air induction ring (3). The outer edge of the filter screen (24) is located between the air induction ring (3) and the mounting ring (25), and a plurality of anti-sliding blocks (26) are fixedly connected to the outer wall of the mounting ring (25).
6. A surface acoustic wave device debugging and testing stand according to claim 5, characterized in that: A filter (5) is fixedly connected to each of the air inlet holes (7).
7. A surface acoustic wave device debugging and testing stand according to claim 6, characterized in that: Two symmetrically arranged observation windows (28) are fixedly connected to the surface of the top cover (2).
8. The surface acoustic wave device debugging and testing rack according to claim 7, characterized in that: A slot (29) is provided on a side of the top cover (2) away from the rotating block (8).
9. A surface acoustic wave device debugging and testing stand according to claim 8, characterized in that: A buffer pad (27) is fixedly connected to the bottom surface of the top cover (2).
Citation Information
Patent Citations
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CN203825116U
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