Metering drift compensation method and device for electric energy meter

Abstract

The invention provides an electric energy meter metering drift compensation method and device, and the method comprises the steps: carrying out the temperature rise test of a voltage sampling resistor and a metering chip of a current sampling element under a large-current heating condition, and collecting the temperature data of each device at different time points; calculating the error contribution degree of a current sampling element, the error contribution degree of a voltage sampling resistor and the error contribution degree of a metering chip according to the temperature data and the temperature coefficient of each unit at different time points; determining a combined error according to a first linear relationship among the error contribution degree of the current sampling element, the error contribution degree of the voltage sampling resistor and the error contribution degree of the metering chip, and performing metering drift compensation on the electric energy meter according to the combined error and the aging compensation parameter; wherein the aging compensation parameter is used for correcting any one of the following effects: resistance value drift, reference voltage attenuation and gain temperature coefficient deterioration. According to the method, the metering drift compensation accuracy of the electric energy meter is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electric energy meter monitoring, and in particular to an electric energy meter measurement drift compensation method and device. BACKGROUND

[0002] Power consumers work continuously, and the weather is continuously high in summer, which causes the temperature of temperature-sensitive devices inside the electric energy meter to rise, resulting in measurement characteristic drift. To solve this problem, the electric energy meter needs to improve the anti-temperature change technology to ensure the error performance of the electric energy meter under long-term large current or frequent switching of large / small loads and high ambient temperature, and to protect the interests of the people and the power company.

[0003] In related technologies, the anti-temperature change method of the electric energy meter according to temperature compensation usually reads the temperature inside the electric energy meter or the terminal temperature. However, in actual use, due to different wiring methods and tightness of the devices, the terminal temperature rise and the test temperature rise are inconsistent, resulting in inaccurate compensation data for measurement drift. Moreover, since the temperature inside the electric energy meter changes slowly, the measurement drift compensation effect is poor when dealing with rapidly changing loads. SUMMARY

[0004] The present application provides an electric energy meter measurement drift compensation method and device to solve the defect that the measurement drift compensation result is inaccurate when the existing technology reads the temperature inside the electric energy meter or the terminal temperature to achieve measurement drift compensation. The method improves the accuracy of electric energy meter measurement drift compensation.

[0005] The present application provides an electric energy meter measurement drift compensation method applied to an electric energy meter, which includes the following devices: a current sampling element, a voltage sampling resistor, and a measurement chip. The method includes the following steps: Performing temperature rise testing on the current sampling element, the voltage sampling resistor, and the measurement chip under a large current heating working condition, and collecting temperature data of each device at different time points; Calculating the current sampling element error contribution degree, the voltage sampling resistor error contribution degree, and the measurement chip error contribution degree according to the temperature data and the temperature coefficient of each unit at different time points; Determining the combined error according to the first linear relationship between the current sampling element error contribution degree, the voltage sampling resistor error contribution degree, and the measurement chip error contribution degree, and performing measurement drift compensation on the electric energy meter according to the combined error and the aging compensation parameter. The aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation, and gain temperature coefficient deterioration.

[0006] According to the electric energy meter measurement drift compensation method provided by the present application, the aging compensation parameter is determined by the following method: constructing a sampling resistance aging model and a metering chip aging model; determining the aging compensation parameter by the current sampling voltage, the output value of the sampling resistance aging model, the output value of the metering chip aging model, current temperature data, a system level coupling coefficient and an electric energy meter running time.

[0007] According to the electric energy meter metering drift compensation method provided by the application, the metering chip aging model comprises a reference voltage aging model and an analog-digital converter (ADC) gain aging model. The reference voltage aging model is expressed by the following formula: V_ref ( t , T )= Vref 0 * [1+ γv ln( t +1)+ δv ( T −25)^3; wherein, V_ref ( t , T ) is the reference voltage of the metering chip when the current temperature is T and the running time is t , Vref 0 is a reference reference voltage, γv is a reference logarithmic drift rate, δv is a reference temperature curvature; The ADC gain aging model is expressed by the following formula: G_adc(t,T)=G0*[1+κg*t^0.4*(T+40)] ; wherein, G_adc(t,T) is the ADC gain of the metering chip when the current temperature is T and the running time is t , G0 is a reference ADC gain, κg is a gain aging-temperature coupling coefficient.

[0008] According to the electric energy meter metering drift compensation method provided by the application, the first linear relationship is expressed by the following formula: combined error = Err1 + Err2 - k *Err3; wherein, Err1 is a voltage sampling resistance error contribution degree, Err2 is a current sampling element error contribution degree, Err3 is a metering chip error contribution degree, k is a coefficient.

[0009] The method further comprises, after the metering drift compensation of the electric energy meter according to the combined error and the aging compensation parameter, the following steps: According to the correlation between the temperature coefficients of different devices of the electric energy meter and target characteristic data, a matching decision is provided for a target device, wherein the target characteristic data includes temperature drift, resistance aging rate, resistance TCR curvature, reference logarithmic drift rate, and reference temperature curvature; and the target device is at least one of a current sampling element, a voltage sampling resistor, and a metering chip.

[0010] The application further provides an electric energy meter metering drift compensation device, which is applied to an electric energy meter including the following devices: a current sampling element, a voltage sampling resistor, and a metering chip; and includes the following modules: A temperature acquisition module is configured to perform temperature rise testing on the current sampling element, the voltage sampling resistor, and the metering chip under a large-current heating working condition, and to acquire temperature data of each device at different time points; An error contribution degree calculation module is configured to calculate current sampling element error contribution degree, voltage sampling resistor error contribution degree, and metering chip error contribution degree according to the temperature data of each unit at different time points and temperature coefficients; A metering drift compensation module is configured to determine a combined error according to a first linear relationship among the current sampling element error contribution degree, the voltage sampling resistor error contribution degree, and the metering chip error contribution degree, and to perform metering drift compensation on the electric energy meter according to the combined error and an aging compensation parameter; wherein the aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation, and gain temperature coefficient deterioration.

[0011] The device further includes the following modules: A device matching module is configured to, after the metering drift compensation of the electric energy meter according to the combined error and the aging compensation parameter, provide a matching decision for a target device according to the correlation between the temperature coefficients of different devices of the electric energy meter and target characteristic data; wherein the target characteristic data includes temperature drift, resistance aging rate, resistance TCR curvature, reference logarithmic drift rate, and reference temperature curvature; and the target device is at least one of a current sampling element, a voltage sampling resistor, and a metering chip.

[0012] The application further provides an electronic device including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the electric energy meter metering drift compensation method according to any one of the above when executing the computer program.

[0013] The application further provides a non-transitory computer-readable storage medium, which stores a computer program, and the computer program is executed by a processor to implement the power meter measurement drift compensation method.

[0014] The application further provides a computer program product, which comprises a computer program, and the computer program is executed by a processor to implement the power meter measurement drift compensation method.

[0015] The power meter measurement drift compensation method and device provided by the application, by means of temperature test on the current sampling element voltage sampling resistor and the measurement chip under the large current heat working condition, collecting temperature data of each device at different time points, calculating the current sampling element error contribution, the voltage sampling resistor error contribution and the measurement chip error contribution according to the temperature data of each unit at different time points and the temperature coefficient, finally determining the combined error according to the first linear relationship between each error contribution, and performing measurement drift compensation on the power meter according to the combined error and the aging compensation parameter, the power meter measurement drift compensation accuracy is improved. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the present application or prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings described below are some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without creative labor.

[0017] Figure 1 is one of the flowcharts of the power meter measurement drift compensation method provided by the application.

[0018] Figure 2 is the second flowchart of the power meter measurement drift compensation method provided by the application.

[0019] Figure 3 is the structural schematic diagram of the power meter measurement drift compensation device provided by the application.

[0020] Figure 4 is the structural schematic diagram of the electronic device provided by the application. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical scheme and advantages of the present application more clear, the technical scheme of the present application will be described clearly and completely in the following combined with the drawings in the present application. Obviously, the described embodiments are some embodiments of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the present application.

[0022] The application is described below Figures 1-3 The application provides an electric energy metering drift compensation method and device.

[0023] Figure 1 The application provides an electric energy metering drift compensation method and device. Figure 1 The application provides an electric energy metering drift compensation method and device. Step 110, in a large-current heating working condition, temperature test is performed on the current sampling element, voltage sampling resistor and metering chip, and temperature data of each device at different time points is collected.

[0024] In this step, the temperature test mainly analyzes the temperature characteristic change of elements (such as resistor-type conversion units and A / D converters) affecting the error stability of the electric energy meter, and obtains temperature change data of each element in a typical working condition of the electric energy meter.

[0025] Taking a large-current heating working condition of a single-phase electric energy meter as an example, the temperature test includes the following steps: (1) thermocouples are connected to the current sampling element, voltage sampling resistor and metering chip respectively, the load current is adjusted to Imax, the electric energy meter is continuously heated, and the electric energy meter runs for a hours (a value can be set according to user demand, for example, a = 1); (2) the electric energy meter current is adjusted to a specified value, the electric energy meter continues to run for b hours (b value can be set according to user demand, for example, b = 1), and temperature data is recorded every second, so that temperature sets T1, T2 and T3 of three types of elements can be obtained, T = {t1, t2, t3, … tn} In an embodiment, during the temperature test for (a+b) hours, the total sampling point number is 7471, according to the experimental result, the current sampling element has the largest heating amount, the temperature rises by about 37℃, and reaches a temperature stable state at 0.5h. The metering chip rises by about 13℃, and the voltage sampling resistor rises by about 10℃.

[0026] Step 120, according to the temperature data of each unit at different time points and the temperature coefficient, the error contribution degree of the current sampling element, the error contribution degree of the voltage sampling resistor and the error contribution degree of the metering chip are calculated.

[0027] In this step, the error contribution degree of each device can be calculated in the following manner: The error contribution degree of the voltage sampling resistor is Err1 = {y1 | y1 = (T1max-T1min) * α1}; The error contribution degree of the current sampling element is Err2 = {y2 | y2 = (T2max-T2min) * α2}; The meter chip error contribution Err3 is {y3 | y3 = (T3max-T2min)*a3}.

[0028] wherein, Err1, Err2 and Err3 are all percentage representations, y1, y2 and y3 are decimals corresponding to Err1, Err2 and Err3 respectively; T1max is the maximum value of each temperature data in the temperature set T1, T1min is the minimum value of each temperature data in the temperature set T1, and so on; a1, a2 and a3 are temperature coefficients; wherein, different temperature coefficients correspond to different devices, and the coefficients can be obtained from the component manual.

[0029] According to the above experimental results, the current sampling element generates the maximum heat, and the temperature rises by about 37℃, and reaches a temperature stable state at 0.5h. The meter chip rises by about 13℃, and the voltage sampling resistor rises by about 10℃; then T1max-T1min=37, T2max-T2min=10, and T3max-T3min=13.

[0030] In step 130, the combined error is determined according to the first linear relationship between the current sampling element error contribution, the voltage sampling resistor error contribution and the meter chip error contribution, and the metering drift of the electric energy meter is compensated according to the combined error and the aging compensation parameter; wherein, the aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation and gain temperature coefficient deterioration.

[0031] In this step, the electric energy meter can simulate the sampling signal Vsignal and the reference voltage Vref after the reference (establishing the proportional relationship between the parameters) through the AD conversion and the corresponding relationship of the register according to the following formula 1: Vsignal / Vref=Reg / 2^N; wherein, 2^N is the word length, and Reg is the digital register value of the AD conversion result.

[0032] It should be noted that, since the electric energy meter generally uses resistance division to sample the fire line voltage, uses series fire line manganese copper to generate voltage to sample the fire line current, and at different temperatures (weather reasons / long time large current causes sampling device characteristic drift, etc.), the Vref temperature characteristics of the sampling device itself will cause errors. Thus affecting the AD conversion and the subsequent digital algorithm path and precision error.

[0033] In this embodiment, it is assumed that due to temperature changes, the sampling error caused by the change of the sampling device characteristics is△Vs, and the change amount of Vref is represented as△Vf; then after introducing△Vs,△Vf and△Reg in formula 1, there is the following formula 2 relationship: (Vsignal+△Vs) / (Vref+△Vf)=(Reg+△Reg) / 2^N; Wherein,△Reg represents the change of Re; the relative error Err_Vs of the sampling signal, the relative error Err_Vref of the reference voltage and the relative error Err_Reg of the digital register value are calculated by the following formula 3: Err_Vs=△Vs / Vsignal*100%; Err_Vref=△Vf / Vref*100%; Err_Reg=△Reg / Reg*100%; By combining formula 2 and formula 3, we can get: (Vsignal+△Vs)*2^N=(Vref+△Vf)*(Reg+△Reg); Vs(1+Err_Vs%)*2^N=Vref*Reg(1+Err_Vref%+Err_Reg%)+△Vref*△Reg; Wherein,△Vref*△Reg can be ignored, and the following corresponding relationship is further obtained: Err_Vs%=Err_Vref%+Err_Reg%; That is, the voltage channel dividing resistance_Err%=register_Err%+Vref_Err%; The current channel manganese copper resistance_Err%=register_Err%+Vref_Err%; Since the register and Vref can be directly read or measured, the temperature error characteristics P of the dividing resistance and the temperature error characteristics P' of the manganese copper resistance are obtained by the above relationship, which are respectively represented as: P=Vu*Vi*cosθ; P′=(Vu+△u)*(Vi+△i)*cosθ; Wherein, θ is the voltage and current angle; then the accuracy error Err% is represented by the following formula: Err%=(P′-P) / P*100%=(Vu*△i+Vi*△u) / (Vu*Vi)=△u / Vu+△i / Vi; According to the above voltage resistance, the first linear relationship of manganese copper determines the combined error; the first linear relationship is represented by the following formula: Combined error=Err1+Err2- k *Err3; Wherein, Err1 is the voltage sampling resistance error contribution, Err2 is the current sampling element error contribution, Err3 is the metering chip error contribution, k Is the coefficient, for example,k =2; the first linear relationship indicates that the error of the electric energy meter is positively correlated with the current sampling element and the voltage sampling resistance, and is negatively correlated with the change of the reference voltage of the metering chip.

[0034] In one embodiment, the temperature drift coefficients of the devices of the test prototype are set as: α1=30ppm, α2=25ppm, and α3=10ppm, and the combined error Err% can be calculated as approximately 0.056%, which is basically consistent with the measured data.

[0035] It should be noted that the error offset of the electric energy meter is caused by the performance drift of the elements under the heating condition, the current sampling element and the voltage sampling resistance can be regarded as a pure resistance model, and the error offset of the metering chip is mainly affected by the reference voltage Vref. By reasonably matching the temperature drift performance of the current sampling element, the metering chip and the voltage sampling, the error under the heating condition can be controlled in a very small range. This method breaks the limitations of time compensation and temperature compensation, does not need to increase the code amount, has good reliability in a complex load environment, and has higher environmental adaptability.

[0036] The electric energy meter measurement drift compensation method provided by the embodiment of the present application can perform temperature test on the current sampling element, the voltage sampling resistance and the metering chip under the large current heating condition, collect the temperature data of each device at different time points, calculate the error contribution degree of the current sampling element, the error contribution degree of the voltage sampling resistance and the error contribution degree of the metering chip according to the temperature data and the temperature coefficients of each unit at different time points, determine the combined error according to the first linear relationship between the error contribution degrees, and perform measurement drift compensation on the electric energy meter according to the combined error and the aging compensation parameter, thereby improving the measurement drift compensation accuracy of the electric energy meter.

[0037] In some embodiments, the aging compensation parameter is determined in the following manner: (1) Construct a sampling resistance aging model and a metering chip aging model.

[0038] It should be noted that according to the series standards such as Q / GDW10827 and Q / GDW10364 of the State Grid, the service life of the whole electric energy meter is greater than or equal to 16 years, and therefore, the influence of element aging on the model is considered in the embodiment. The measurement loop devices of the embodiment include the current sampling element, the voltage sampling resistance and the metering chip. For the above-mentioned case, the current sampling element is generally a manganese copper material, and the manganese copper conductor usually does not have obvious chemical change (such as oxidation) in the long-term operation process, so the temperature coefficient of the current sampling element does not change significantly in the life cycle. The embodiment mainly analyzes the change of the temperature coefficient of the voltage sampling resistance (patch resistance) and the metering chip after long-term operation.

[0039] Specifically, for the joint compensation of sampling resistance and aging of the metering chip, a multi-parameter coupling model needs to be established, and effects such as resistance value drift, reference voltage attenuation, and gain temperature coefficient deterioration need to be corrected.

[0040] (1.1) The sampling resistance aging model is established by the following formula: R_shunt_aged t, T R_ 0 * {1 +α_R*t^ 0.5 *e^ [ -E_aR / k / T+ 273)] + β_R* T-T 0) ^ 2}; wherein, R_shunt_aged t, T ) is the resistance value of the resistance at the current temperature T , and the running time is t ; R_ 0 is the initial resistance value (calibration value), t is the running time of the electric energy meter (unit: kilohour, kHr), T is the current temperature (unit: Celsius, ℃), α_R is the resistance aging rate (ppm / √kHr), E_aR is the activation energy (unit: eV), k is the Boltzmann constant, T 0 is the reference temperature (usually 25℃), β_R is the resistance TCR curvature (ppm / ℃²).

[0041] (1.2) The metering chip aging model includes a reference voltage aging model and an analog-to-digital converter (ADC) gain aging model; (1.2.1) The reference voltage aging model is represented by the following formula: V_ref t T Vref 0 * [1+ γv ln( t +1)+ δv ( T −25)^3; wherein, V_ref t T is the reference voltage of the metering chip at the current temperature T , and the running time is t ; Vref 0 is the reference reference voltage, γv ​​​​​​​​​​is the base logarithmic drift rate, δv is the base temperature curvature; (1.2.2) The ADC gain aging model is expressed as follows: G_adc(t,T)=G0*[1+κg*t^0.4*(T+40)] ; in, G_adc(t,T) The current temperature of the measuring chip is T , the running time is t The ADC gain is G0 is the reference ADC gain, κg is the gain aging-temperature coupling coefficient.

[0042] (2) The aging compensation parameters are determined by the current sampling voltage, the output value of the sampling resistor aging model, the output value of the metering chip aging model, the current temperature data, the system-level coupling coefficient and the operation time of the electricity meter.

[0043] In this embodiment, the following joint compensation formula (which can be used for sampling value correction) is established based on the output value of the current sampling voltage and the output value of the sampling resistor aging model: I_cal=[V_sense / R_shunt_aged]*[1 / (G_adc*V_ref)]*[1+η*(T- 85 )*t^ 2 ] ; in, η is the system-level coupling coefficient, V_sense is the current sampling voltage; the following Table 1 is determined based on the corresponding calculation results when the parameters are not selected appropriately: Table 1. Aging compensation parameters As shown in Table 1, under extreme working conditions, the uncompensated error can reach -8.08% after 15 years if the parameters are not selected appropriately.

[0044] The electric energy meter drift compensation method provided in an embodiment of the present invention constructs a sampling resistor aging model and a metering chip aging model, and determines the aging compensation parameters based on the current sampling voltage, the output value of the sampling resistor aging model, the output value of the metering chip aging model, current temperature data, the system-level coupling coefficient, and the electric energy meter operation time, thereby ensuring that the measurement accuracy of each component remains stable throughout the life cycle of the electric energy meter.

[0045] In some embodiments, after performing metering drift compensation on the electric energy meter based on the combined error and aging compensation parameters, the electric energy meter metering drift compensation method further includes: providing a matching decision for the target device based on the correlation between the temperature coefficients of different components of the electric energy meter and the target characteristic data; wherein the target characteristic data includes temperature drift, resistance aging rate, resistance TCR curvature, reference logarithmic drift rate, and reference temperature curvature; the target device is at least one of a current sampling element, a voltage sampling resistor, and a metering chip.

[0046] In this embodiment, according to the national standard GB / T17215.211, the operation error of the electric energy meter needs to be within the error level range of the electric energy meter, and the embodiment considers selecting appropriate devices according to the combined error and aging compensation parameters.

[0047] Specifically, the device matching and effect display are shown in Table 2.

[0048] Table 2. Parameter configuration table between temperature coefficient, aging compensation parameter and temperature drift data In actual application, considering the cost problem in batch production, the higher the resistance accuracy, the more expensive the price, for example, in actual application, 25-50ppm elements can be selected.

[0049] Specifically, α3 can be-50ppm, α2 can be 25ppm, and α1 can be 30ppm, and by the temperature coefficient configuration, the combined error is controlled in a very small range.

[0050] The embodiment analyzes the common temperature coefficients of current sampling elements, metering chips and resistors in the market, and proposes the feasibility of controlling the cost while ensuring the product quality.

[0051] The electric energy meter measurement drift compensation method provided by the embodiment of the present application provides matching decisions for target devices through the correlation between the temperature coefficients of different devices of the electric energy meter and the target characteristic data, and proposes a scheme for reducing product cost without using high-precision devices, which meets the needs of engineering application.

[0052] Figure 2 is a second flowchart of the electric energy meter measurement drift compensation method provided by the present application, in Figure 2 The electric energy meter measurement drift compensation method includes: analyzing the heat-sensitive components that cause unstable errors of the electric energy meter; measuring the temperature rise of the heat-sensitive components; calculating the error contribution degree through the temperature coefficient; establishing a combined error model, and realizing device selection in combination with the establishment of the aging joint compensation method.

[0053] The electric energy meter measurement drift compensation device provided by the present application is described below, and the electric energy meter measurement drift compensation device described below can be correspondingly referred to the electric energy meter measurement drift compensation method described above.

[0054] Figure 3 is a structural schematic diagram of the electric energy meter measurement drift compensation device provided by the present application, as Figure 3 The electric energy meter measurement drift compensation device is applied to an electric energy meter, and the electric energy meter includes the following devices: a current sampling element, a voltage sampling resistor and a metering chip; and includes: a temperature acquisition module 310, an error contribution degree calculation module 320 and a measurement drift compensation 330.

[0055] The temperature collection module 310 is configured to collect temperature data of each device at different time points by temperature test on the current sampling element voltage sampling resistor and the metering chip under a large current heat working condition; The error contribution degree calculation module 320 is configured to calculate the current sampling element error contribution degree, the voltage sampling resistor error contribution degree and the metering chip error contribution degree according to the temperature data of each unit at different time points and the temperature coefficients. The metering drift compensation 330 is configured to determine a combined error according to a first linear relationship among the current sampling element error contribution degree, the voltage sampling resistor error contribution degree and the metering chip error contribution degree, and to perform metering drift compensation on the electric energy meter according to the combined error and the aging compensation parameter.

[0056] The electric energy meter metering drift compensation device provided by the embodiment of the application improves the accuracy of the electric energy meter metering drift compensation by collecting temperature data of each device at different time points by temperature test on the current sampling element voltage sampling resistor and the metering chip under a large current heat working condition, calculating the current sampling element error contribution degree, the voltage sampling resistor error contribution degree and the metering chip error contribution degree according to the temperature data of each unit at different time points and the temperature coefficients, and finally determining a combined error according to a first linear relationship among the error contribution degrees and performing metering drift compensation on the electric energy meter according to the combined error and the aging compensation parameter.

[0057] In some embodiments, the electric energy meter metering drift compensation device further comprises a device matching module The device matching module is configured to provide a matching decision for a target device according to the association between the temperature coefficients of different devices of the electric energy meter and target characteristic data after the metering drift compensation on the electric energy meter according to the combined error and the aging compensation parameter.

[0058] The electric energy meter metering drift compensation device provided by the embodiment of the application provides a matching decision for a target device according to the association between the temperature coefficients of different devices of the electric energy meter and target characteristic data, and proposes a scheme for reducing product cost without using high-precision devices, which meets the needs of engineering application.

[0059] Figure 4 An example of a schematic diagram of the physical structure of an electronic device is shown in FIG. 1. Figure 4As shown, the electronic device can include a processor 410, a communications interface 420, a memory 430, and a communications bus 440, wherein the processor 410, the communications interface 420, and the memory 430 complete mutual communication through the communications bus 440. The processor 410 can invoke a logic instruction in the memory 430 to execute the electric energy metering drift compensation method, which includes: under a large current heat generating working condition, performing temperature rise testing on a current sampling element voltage sampling resistor and a metering chip, and collecting temperature data of each device at different time points; calculating current sampling element error contribution, voltage sampling resistor error contribution, and metering chip error contribution according to the temperature data of each unit at different time points and the temperature coefficient; determining a combined error according to a first linear relationship between the current sampling element error contribution, the voltage sampling resistor error contribution, and the metering chip error contribution, and performing metering drift compensation on the electric energy meter according to the combined error and an aging compensation parameter; wherein the aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation, and gain temperature coefficient deterioration.

[0060] In addition, the logic instruction in the memory 430 described above can be implemented in the form of a software function unit and sold or used as an independent product, and can be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or part of the technical solutions can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a plurality of instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the steps of the method described in various embodiments of the present application. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), a magnetic disk or an optical disk, and various program code storage media.

[0061] In another aspect, the present application also provides a computer program product comprising a computer program, which can be stored on a non-transitory computer readable storage medium, and the computer program can be executed by a processor to enable a computer to perform the power meter measurement drift compensation method provided by the above-mentioned methods, which comprises: performing temperature test on the current sampling element voltage sampling resistor and the measurement chip under a large current heat working condition, and collecting temperature data of each device at different time points; calculating the current sampling element error contribution, the voltage sampling resistor error contribution and the measurement chip error contribution according to the temperature data of each unit at different time points and the temperature coefficient; determining the combined error according to the first linear relationship between the current sampling element error contribution, the voltage sampling resistor error contribution and the measurement chip error contribution, and performing measurement drift compensation on the power meter according to the combined error and the aging compensation parameter; wherein the aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation and gain temperature coefficient deterioration.

[0062] In another aspect, the present application also provides a non-transitory computer readable storage medium having a computer program stored thereon, and the computer program can be executed by a processor to implement the power meter measurement drift compensation method provided by the above-mentioned methods, which comprises: performing temperature test on the current sampling element voltage sampling resistor and the measurement chip under a large current heat working condition, and collecting temperature data of each device at different time points; calculating the current sampling element error contribution, the voltage sampling resistor error contribution and the measurement chip error contribution according to the temperature data of each unit at different time points and the temperature coefficient; determining the combined error according to the first linear relationship between the current sampling element error contribution, the voltage sampling resistor error contribution and the measurement chip error contribution, and performing measurement drift compensation on the power meter according to the combined error and the aging compensation parameter; wherein the aging compensation parameter is used to correct any one of the following effects: resistance value drift, reference voltage attenuation and gain temperature coefficient deterioration.

[0063] The apparatus embodiments described above are merely illustrative, wherein the units shown as separate components can or can not be physically separate, and the components shown as units can or can not be physical units, i.e., they can be located in one place, or distributed on multiple network units. Part or all of the modules can be selected to achieve the purpose of the present embodiment scheme according to actual needs. Those skilled in the art can understand and implement it without creative labor.

[0064] Those skilled in the art can clearly understand the technical solutions of the various embodiments from the above description of the embodiments, and the various embodiments can be implemented by means of software with the necessary general hardware platforms, and of course, can also be implemented by hardware. Based on such understanding, the above technical solutions, essentially or in other words, the part of the prior art that makes a contribution, can be embodied in the form of a software product, which can be stored in a computer readable storage medium, such as a ROM / RAM, a magnetic disk, an optical disk, and the like, and includes a number of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0065] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for some technical features therein; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for compensating for electric energy meter drift, characterized in that: Applied to an electric energy meter, the electric energy meter includes the following components: a current sampling element, a voltage sampling resistor, and a metering chip. The method includes: Performing a temperature rise test on the current sampling element, the voltage sampling resistor, and the metering chip under a high current heating condition, and collecting temperature data of each device at different time points; Calculate the error contribution of the current sampling element, the error contribution of the voltage sampling resistor, and the error contribution of the metering chip based on the temperature data and temperature coefficient of each unit at different time points; A combined error is determined based on a first linear relationship among the error contribution of the current sampling element, the error contribution of the voltage sampling resistor, and the error contribution of the metering chip, and metering drift compensation is performed on the electric energy meter based on the combined error and an aging compensation parameter; wherein the aging compensation parameter is used to correct any one of the following effects: resistance drift, reference voltage attenuation, and gain temperature coefficient deterioration.

2. The method for compensating for electric energy meter drift according to claim 1, characterized in that: The aging compensation parameters are determined as follows: Construct sampling resistor aging model and metering chip aging model; The aging compensation parameter is determined by the current sampling voltage, the output value of the sampling resistor aging model, the output value of the metering chip aging model, current temperature data, the system-level coupling coefficient and the running time of the electric energy meter.

3. The method for compensating for electric energy meter drift according to claim 1 or 2, characterized in that: The metering chip aging model includes a reference voltage aging model and an analog-to-digital converter ADC gain aging model; The reference voltage aging model is expressed by the following formula: V_ref ( t , T )= Vref 0 * [1+ γv* ln( t +1)+ δv* ( T −25)^3； in, V_ref ( t , T ) is the current temperature of the metering chip T , the running time is t The reference voltage at Vref 0 is the reference voltage, γv is the base logarithmic drift rate, δv is the base temperature curvature; The ADC gain aging model is expressed as follows: G_adc(t,T)=G0*[1+κg*t^0.4*(T+40)] ； in, G_adc(t,T) The current temperature of the measuring chip is T , the running time is t The ADC gain is G0 is the reference ADC gain, κg is the gain aging-temperature coupling coefficient.

4. The method for compensating for electric energy meter drift according to claim 1, wherein: The first linear relationship is expressed by the following formula: Combined error = Err1 + Err2 - k *Err3; Among them, Err1 is the error contribution of the voltage sampling resistor, Err2 is the error contribution of the current sampling component, and Err3 is the error contribution of the metering chip. k is the coefficient.

5. The method for compensating for electric energy meter drift according to claim 1, characterized in that: After performing metering drift compensation on the electric energy meter according to the combined error and the aging compensation parameter, the method further includes: Based on the correlation between the temperature coefficients of different components in the electricity meter and target characteristic data, a matching decision is provided for the target component; the target characteristic data includes temperature drift, resistance aging rate, resistance TCR curvature, reference logarithmic drift rate, and reference temperature curvature; the target component is at least one of a current sampling element, a voltage sampling resistor, and a metering chip.

6. An electric energy meter drift compensation device, characterized in that: Applied to electric energy meter, the electric energy meter includes the following components: current sampling element, voltage sampling resistor and metering chip; including: A temperature acquisition module is used to perform a temperature rise test on the current sampling element, the voltage sampling resistor, and the metering chip under high current heating conditions, and to collect temperature data of each device at different time points; An error contribution calculation module is used to calculate the error contribution of the current sampling element, the error contribution of the voltage sampling resistor, and the error contribution of the metering chip based on the temperature data and temperature coefficient of each unit at different time points; A metering drift compensation system is configured to determine a combined error based on a first linear relationship among the error contribution of the current sampling element, the error contribution of the voltage sampling resistor, and the error contribution of the metering chip, and to perform metering drift compensation on the electric energy meter based on the combined error and an aging compensation parameter; wherein the aging compensation parameter is configured to correct for any one of the following effects: resistance drift, reference voltage attenuation, and gain temperature coefficient deterioration.

7. The electric energy meter measurement drift compensation device according to claim 6, characterized in that: The device further comprises: A device matching module is configured to, after performing metering drift compensation on the electric energy meter according to the combined error and aging compensation parameters, provide a matching decision for a target device based on an association between temperature coefficients of different devices in the electric energy meter and target characteristic data; wherein the target characteristic data includes temperature drift, resistor aging rate, resistor TCR curvature, reference logarithmic drift rate, and reference temperature curvature; and the target device is at least one of a current sampling element, a voltage sampling resistor, and a metering chip.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the method for compensating for the measurement drift of an electric energy meter as claimed in any one of claims 1 to 5 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for compensating for metering drift of an electric energy meter as claimed in any one of claims 1 to 5 is implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the method for compensating for metering drift of an electric energy meter as claimed in any one of claims 1 to 5 is implemented.

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