Dual electrical contact test pin

CN120801979APending Publication Date: 2025-10-17TEXAS INSTRUMENTS INC
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Patent Information

Application Number
CN202410394526.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-04-02
Publication Date
2025-10-17

AI Technical Summary

Technical Problem

In existing integrated circuit test equipment, the contact area of ​​the contact finger is easily worn when contacting the external leads of the device under test, resulting in poor contact and increased rejection rate, a shorter service life, and increased manufacturing costs.

Method used

The double-contact test pin has contact fingers that extend in opposite directions. The contact area is designed with a slender tip to increase contact pressure. After wear, it can be rotated 180° to use the opposite end for testing, extending its service life.

Benefits of technology

By increasing the contact pressure and rotating the opposite end, the service life of the contact fingers is extended by at least two times, reducing the rejection rate and manufacturing costs.

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Abstract

The embodiment of the invention relates to a dual electrical contact test pin. A test assembly (200) for an electronic device test apparatus is provided and includes a contact body (202) having at least one elongated opening (206) defined therein, where the at least one elongated opening (206) extends in a width direction of the contact body (202). The elongated opening (206) extends through the contact body (202) from a first surface (208) to a second surface (210) of the contact body (202) in a direction substantially perpendicular to the width direction. At least one dual contact test pin (204) is disposed in the at least one elongated opening (206). The at least one dual contact test pin (204) has a pair of contact fingers (224) extending in opposite directions from each other, wherein each of the pair of contact fingers (224) includes a contact region (238) having an elongated tip.
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