Fault handling method, device, medium and terminal for confocal microendoscope

Abstract

The present application relates to the field of confocal microendoscopy, and discloses a fault processing method, device, medium and terminal for confocal microendoscopy. The method comprises: acquiring a current operation stage and / or a previous action for generating a target fault image, and generating an initial fault cause and an image feature judgment condition; calculating a fault feature parameter of the target fault image, and matching the fault feature parameter with the image feature judgment condition; positioning the target fault cause according to a matching result, and executing a corresponding preset fault processing scheme. The present application can not only analyze the image features of the fault image, but also record and associate refined user operation sequences, system automatic actions, environmental interference events and various state sensor data, so as to jointly judge and comprehensively trace the image fault cause in combination with the fault occurrence stage and the previous action before the fault occurs, thereby improving the accuracy and efficiency of fault identification, and providing a correct processing method according to the fault identification result.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of confocal endomicroscopy, in particular to a confocal endomicroscopy fault processing method, device, medium and terminal. BACKGROUND

[0002] The endomicroscopy is a kind of medical equipment that can enter the human body through the channel of gastroscope, colonoscope and the like, obtain local histological images to realize the accurate diagnosis of micro lesions, gastrointestinal lesions and early gastrointestinal cancer. The endomicroscopy is composed of a main machine, a probe and a display. During clinical examination, the probe is connected to the main machine, imaging is started, the probe enters the patient's body along the channel to reach the observation site, and the display displays the microscopic images of the observation site of the probe in real time.

[0003] During imaging, there are many factors that can cause image failure, such as unclear images. One is that the probe is collided. During the use of clinical examination, the physician needs to manually insert the probe into the channel, or accidentally touch the probe during use. Such operation can change the relative position of the probe connected to the main machine, causing serious quality degradation of the image. In addition, during the long-term operation of the endomicroscopy, the motor position changes can also cause the focusing effect to decrease, which can easily cause the image to be unclear. How to quickly and effectively identify the abnormal cause and realize automatic correction is a key problem to be solved at present. SUMMARY

[0004] The present application provides a confocal endomicroscopy fault processing method, device, medium and terminal, which solves the above technical problems.

[0005] The technical solution of the present application to solve the above technical problems is as follows: the first aspect of the embodiment of the present application provides a confocal endomicroscopy fault processing method, comprising the following steps:

[0006] Step 1, querying the operation log of the confocal endomicroscopy to obtain the current operation stage and / or the previous action that produces the target fault image;

[0007] Step 2, generating the initial fault cause of the target fault image and the image feature judgment condition corresponding to each initial fault cause according to the current operation stage and / or the previous action;

[0008] Step 3, calculating the fault feature parameter of the target fault image, matching the fault feature parameter with each image feature judgment condition, and positioning the target fault cause from the initial fault cause according to the matching result;

[0009] Step 4, executing the corresponding preset fault processing scheme according to the target fault cause.

[0010] The second aspect of the embodiment of the present application provides a computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to realize the fault processing method of the confocal endomicroscopy.

[0011] The third aspect of the embodiment of the present application provides a fault processing terminal of the confocal endomicroscopy, which comprises a computer readable storage medium and a processor, and the processor executes a computer program on the computer readable storage medium to realize the steps of the fault processing method of the confocal endomicroscopy.

[0012] The fourth aspect of the embodiment of the present application provides a fault processing device of the confocal endomicroscopy, which comprises a first acquisition module, a second acquisition module, a matching module and an execution module,

[0013] The first acquisition module is configured to query an operation log of the confocal endomicroscopy, and acquire a current operation stage and / or a previous action of generating a target fault image.

[0014] The second acquisition module is configured to generate initial fault reasons of the target fault image and image feature judgment conditions corresponding to each initial fault reason according to the current operation stage and / or the previous action.

[0015] The matching module is configured to calculate a fault feature parameter of the target fault image, match the fault feature parameter with each image feature judgment condition, and locate a target fault reason from the initial fault reasons according to a matching result.

[0016] The execution module is configured to execute a preset fault processing scheme corresponding to the target fault reason.

[0017] The embodiment of the present application provides a fault processing method, device, medium and terminal of the confocal endomicroscopy, changes an inefficient operation that can only check fault reasons one by one in the prior art, can analyze image features of a fault image, records and associates a refined user operation sequence, a system automatic action, an environmental interference event and various state sensor data, thereby jointly judges in combination with a fault occurrence stage and a previous action before the fault occurs, comprehensively traces a fault reason, improves accuracy and efficiency of fault identification, and can provide a correct processing method according to a fault identification result.

[0018] In order to make the above objectives, characteristics and advantages of the present application more obvious and easy to understand, the following describes preferred embodiments of the present application in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.

[0020] Figure 1 is a flowchart of the fault handling method of the confocal endomicroscopy provided in Embodiment 1;

[0021] Figure 2 is a fault image formed by the coupling lens being out of focus in Embodiment 1;

[0022] Figure 3 is a fault image formed by the probe being loose in Embodiment 1;

[0023] Figure 4 is a structural schematic diagram of the fault handling device of the confocal endomicroscopy provided in Embodiment 2;

[0024] Figure 5 is a structural schematic diagram of the fault handling terminal of the confocal endomicroscopy provided in Embodiment 3. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solutions and beneficial technical effects of the present application more clear, the following will further describe the present application in combination with the drawings and specific embodiments. It should be understood that the specific embodiments described in the present specification are only for the purpose of explaining the present application, and are not intended to limit the present application.

[0026] Figure 1 is a flowchart of the fault handling method of the confocal endomicroscopy provided in Embodiment 1, as shown in Figure 1 , comprising the following steps:

[0027] Step 1, querying the operation log of the confocal endomicroscopy to obtain the current operation stage and / or the previous action of generating the target fault image;

[0028] Step 2, generating the initial fault causes of the target fault image and the image feature judgment conditions corresponding to each initial fault cause according to the current operation stage and / or the previous action;

[0029] Step 3, calculating the fault feature parameters of the target fault image, matching the fault feature parameters with each image feature judgment condition, and positioning the target fault cause from the initial fault causes according to the matching result;

[0030] Step 4, executing the corresponding preset fault handling scheme according to the target fault cause.

[0031] The above embodiment provides a fault processing method of a confocal endomicroscope. The fault image features can be analyzed, and the refined user operation sequence, system automatic action, environmental interference event and various state sensor data are recorded and associated, so that the fault causes are comprehensively traced in combination with the fault occurrence stage and the pre-action before the fault occurs, the accuracy and efficiency of fault identification are improved, and a correct processing method can be provided according to the fault identification result.

[0032] The specific technical solutions and technical effects of the above steps are described below through specific embodiments.

[0033] For example, in a preferred embodiment, the operation process of the confocal endomicroscope is divided into three stages, including a start-up stage, a scanning stage and a maintenance stage. The image fault causes of the start-up stage mainly include probe coupling focusing failure. Specifically, after the confocal endomicroscope is started, the laser emits a laser beam of a certain intensity under the instruction control. The laser beam is expanded by a beam expander and reflected by a dichroic mirror to a galvanometer system composed of a horizontal galvanometer and a vertical galvanometer. The galvanometer system is driven by a control signal to deflect the laser beam to perform planar scanning. The scanning laser beam passes through a relay lens and a coupling lens and is coupled into an imaging probe. The focusing motor is responsible for driving the position of the coupling lens to ensure that the laser is accurately coupled to the end face of the imaging probe. If the system focusing is unstable or does not meet the focusing requirements, it is easy to cause the whole image to be blurred, as shown in Figure 2 .

[0034] The image fault causes in the scanning stage include probe collision and state change of the probe and the host caused by device movement. This is because the endomicroscope is a very precise instrument, and its imaging area is usually only a few hundred microns. A slight change in the relative position of the probe and the host will cause the image quality to deteriorate and affect the imaging accuracy. Specifically, the image in some areas is normal, and the image in some areas is unclear due to incomplete connection, and the unclear areas in multiple images are basically the same, as shown in the left and lower areas of the image in Figure 3 .

[0035] The image fault cause of the maintenance stage includes debugging parameter adjustment corresponding to the preset processing module, such as a motor control module, a distortion correction module, or a packaging module. The motor control module is used to drive the coupling lens position to achieve focusing. The distortion correction module is used to correct the scanning image that is not aligned or has stretching distortion. The packaging module is used to send the image corrected by the distortion to the upper computer. In the use process, especially in the maintenance mode, these modules will automatically change each parameter according to the preset method, thereby forming a plurality of types of fault images, so as to detect the actual application effect of the corresponding module or the accuracy of data transmission. For example, for the motor control module, only acceleration-constant speed-deceleration control can be used in the focusing process. In order to verify the effect, other control schemes such as constant speed throughout or acceleration throughout control scheme can be added. Corresponding fault images are formed under these control schemes.

[0036] Exemplarily, the pre-sequence action in the embodiment of the application includes user operation action, system automatic action and / or environmental action. During the use of the confocal microscopic endoscope, after the operation start instruction of the confocal microscopic endoscope is acquired, the user operation action and the system automatic action are continuously recorded, an operation log with a unified time stamp is established, and different actions in the operation log are marked. Through analysis of the operation log, all actions of the operator within a preset time before the generation of the fault image, such as 30 seconds to 5 minutes, can be acquired, including the insertion / removal action of the probe, the device movement action, the control parameter change action (such as laser power adjustment), the input or call action of various control instructions, such as start / pause scanning, save image, switch mode, etc. The system automatic action, such as automatic focusing and automatic gain adjustment generated by executing the control instruction, is also recorded in the operation log.

[0037] In the preferred embodiment, environmental actions such as environmental temperature and vibration are also considered. The environmental temperature is collected by a temperature sensor. The environmental temperature can cause the characteristics of electronic components to change, such as affecting the change of the galvanometer motion law and causing the image to be unclear. The same is true for environmental vibration. For example, moving the confocal imaging device can cause vibration. If the vibration exceeds a threshold value, the probe can be loosened and the motor can be shifted. Therefore, an accelerometer can be deployed at a key part of the device (such as the main machine and the probe handle) to continuously monitor the vibration amplitude and frequency spectrum and mark the vibration events and their times that exceed the threshold value.

[0038] Thus, the scheme can construct a time-synchronized, multi-source fused operation-environment-image state event log system, ensure synchronization of image timestamps, operation log timestamps, and sensor data timestamps, thereby obtain the pre-action of the fault image from the operation log, and make a preliminary cause judgment through the pre-action combined with the current operation stage. Specifically, the current operation stage and the pre-action can be used to query a preset fault library respectively, and the corresponding fault causes can be obtained through a pre-established mapping relationship, and the overlapping fault causes are selected as the preliminary fault cause of the embodiment.

[0039] In an example, the step of locating the target fault cause in step 3 specifically includes the following steps:

[0040] A plurality of continuous target fault images are obtained, the target fault images being fiber end face images;

[0041] The fiber cores and / or preset patterns of each target fault image are detected, and fault characteristic parameters are calculated according to the detection results, the fault characteristic parameters including the average number of cores, the number of cores in each preset end face region, the coincidence rate of the undistributed core region in the plurality of target fault images, and / or the target pattern contained in any target fault image;

[0042] The fault characteristic parameters are matched with each image characteristic judgment condition, a target judgment condition satisfied by the fault characteristic parameters is obtained, and an initial fault cause corresponding to the target judgment condition is taken as the target fault cause.

[0043] Specifically, the image characteristic judgment condition includes:

[0044] If the fault is a probe coupling focusing fault, the image characteristic judgment condition is that the average number of cores is less than a first preset value and the difference in the number of cores in each preset end face region is less than a second preset value;

[0045] If the fault is a change in the connection state of the probe and the host caused by probe collision or device movement, the image characteristic judgment condition is that the average number of cores is greater than a third preset value and the coincidence rate of the undistributed core region in the plurality of target fault images is greater than a fourth preset value, the third preset value being greater than the first preset value;

[0046] If the fault is an adjustment of the debugging parameters corresponding to the preset processing module, the image characteristic judgment condition is that the target pattern contained in any target fault image is consistent with the preset pattern.

[0047] The image failure states caused by different faults are different. If the motor is displaced to cause defocusing, the overall of continuous multiple frames of images is unclear, at this time, the fiber end face can be divided into multiple fiber end face areas with the same area, the number of identifiable cores of each frame of image is detected to obtain a first average number of cores of multiple frames of images and a second average number of cores in each preset end face area, if the first average number of cores is less than a first preset value, and the difference between the second average number of cores in each preset end face area is less than a second preset value, the unclarity is uniform, which indicates that the image failure is the problem of motor defocusing, at this time, the motor is returned to the initial position and refocused. If the probe is loosened due to vibration, contact and the like, the image of the loosened part is unclear, and the image of the connected part is clear, at this time, the number of identifiable cores of each frame of image and the distribution area of the number of identifiable cores can be detected, if the first average number of cores of multiple frames of images is greater than a third preset value and the coincidence rate of the core distribution area of multiple target failure images is greater than a fourth preset value, most of the cores can be detected and the distribution area is concentrated and fixed, it can be considered that the failure is caused by the loosening of the probe, at this time, a prompt can be given, and after the probe is fixed again, the fiber positioning is performed again, so that more accurate failure causes are obtained in combination with the stages of the above failure images and the previous actions.

[0048] For example, in order to test whether the data transmission is abnormal, the packaging parameters can be adjusted, so that the packaged images not only include normal corrected images, but also include failure images containing preset patterns such as vertical interval stripes, horizontal interval stripes, chess squares, horizontal gray scales and vertical gray scales. At this time, if the target pattern such as vertical interval stripes or horizontal interval stripes or chess squares or horizontal gray scales or vertical gray scales is detected in the failure image, it indicates that the data transmission is normal, at this time, the normal corrected images can be used for image diagnostic analysis of the upper computer or image display in the later stage, otherwise, the data transmission problem needs to be analyzed and located according to the abnormal phenomenon, and after the problem is solved, the normal corrected images are used for image diagnostic analysis of the upper computer or image display in the later stage.

[0049] Of course, in other embodiments, other judgment conditions can also be set according to the image characteristics of different faults, which are within the protection scope of the present application.

[0050] Exemplarily, the pre-warning step includes: if the fault feature parameter does not satisfy any image feature judgment condition, a pre-warning instruction is generated, and a repeated image feature of the continuous multiple frames of target fault images, i.e., a feature existing in multiple frames of fault images, is identified, and is matched in the alternative fault library one by one, and an alternative fault list is generated according to the repeated image feature. In the above preferred embodiment, when all conditions cannot be matched, it is indicated that the range of the initial fault cause is too small, and at this time, the operation stage or the previous action is not limited, and the image feature is directly matched in the fault library to obtain the alternative fault list, which is sent to the technical personnel for investigation, and the effect of image fault cause detection is further improved.

[0051] It should be understood that the size of the serial number of each step in the above embodiment does not mean the order of execution, and the execution order of each process should be determined according to its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the application.

[0052] The embodiment of the application also provides a computer readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the steps of the fault processing method of the confocal endomicroscopy are realized.

[0053] Figure 4 is a structural schematic diagram of the fault processing device of the confocal endomicroscopy provided in the embodiment 2, as shown in the figure, comprising a first acquisition module 100, a second acquisition module 200, a matching module 300 and an execution module 400, Figure 4

[0054] The first acquisition module 100 is used for querying the operation log of the confocal endomicroscopy, and acquiring the current operation stage and / or the previous action of the target fault image;

[0055] The second acquisition module 200 is used for generating the initial fault cause of the target fault image and the image feature judgment condition corresponding to each initial fault cause according to the current operation stage and / or the previous action;

[0056] The matching module 300 is used for calculating the fault feature parameter of the target fault image, matching the fault feature parameter and each image feature judgment condition, and positioning the target fault cause from the initial fault cause according to the matching result;

[0057] The execution module 400 is used for executing the corresponding preset fault processing scheme according to the target fault cause.

[0058] ​The above embodiment provides a fault processing device of a confocal endomicroscope, which can not only analyze image features of a fault image, but also record and associate refined user operation sequences, system automatic actions, environmental interference events and various state sensor data, so as to jointly judge the fault cause in combination with a fault occurrence stage and a pre-fault action, comprehensively trace the fault cause, improve the accuracy and efficiency of fault identification, and provide a correct processing method according to the fault identification result.

[0059] In a preferred embodiment, the device further comprises a log establishing module, which is configured to acquire an operation start instruction of the confocal endomicroscope, continuously record user operation actions, system automatic actions and / or environmental actions at a preset frequency, and establish an operation log with a unified timestamp.

[0060] In a preferred embodiment, the matching module 300 specifically comprises:

[0061] An image acquisition unit, configured to acquire a plurality of continuous target fault images, the target fault images being fiber end face images;

[0062] An image detection unit, configured to detect a fiber core and / or a preset pattern of each target fault image, and calculate a fault feature parameter according to a detection result, the fault feature parameter including an average core number, a core number of each preset end face region, a coincidence rate of a core non-distribution region in the plurality of target fault images and / or a target pattern contained in any target fault image.

[0063] A matching unit, configured to match the fault feature parameter and each image feature judgment condition, acquire a target judgment condition satisfied by the fault feature parameter, and take an initial fault cause corresponding to the target judgment condition as the target fault cause.

[0064] In a preferred embodiment, the device further comprises a pre-warning module, which is configured to generate a pre-warning instruction if the fault feature parameter does not satisfy any image feature judgment condition, identify a repeated image feature of the plurality of continuous target fault images, and match the repeated image feature one by one in an alternative fault library, and generate an alternative fault list according to the repeated image feature.

[0065] The embodiment of the present application further provides a confocal endomicroscope fault processing terminal, which comprises a computer readable storage medium and a processor, and the processor realizes the steps of the confocal endomicroscope fault processing method when executing a computer program on the computer readable storage medium. Figure 5 is a structure schematic diagram of the confocal endomicroscope fault processing terminal provided in Embodiment 3 of the present application, like Figure 5As shown, the failure processing terminal 8 of the embodiment of the confocal microendoscope comprises a processor 80, a readable storage medium 81, and a computer program 82 stored in the readable storage medium 81 and executable on the processor 80. The processor 80 implements the steps in each of the above method embodiments when executing the computer program 82, for example Figure 1 the steps as shown. Alternatively, the processor 80 implements the functions of each module in each of the above device embodiments when executing the computer program 82, for example Figure 4 the functions of the modules as shown.

[0066] For example, the computer program 82 can be divided into one or more modules, which are stored in the readable storage medium 81 and executed by the processor 80 to complete the present application. The one or more modules can be a series of computer program instruction segments capable of completing a specific function, which are used to describe the execution process of the computer program 82 in the failure processing terminal 8 of the confocal microendoscope.

[0067] The failure processing terminal 8 of the confocal microendoscope can include, but is not limited to, the processor 80 and the readable storage medium 81. Those skilled in the art can understand that Figure 5 The failure processing terminal 8 of the confocal microendoscope shown is only an example and does not constitute a limitation on the failure processing terminal 8 of the confocal microendoscope, and can include more or fewer components than shown, or combine certain components, or different components, for example, the failure processing terminal 8 of the confocal microendoscope can also include a power management module, an operation processing module, an input / output device, a network access device, a bus, etc.

[0068] The processor 80 can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic components, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor.

[0069] The readable storage medium 81 can be an internal storage unit of the confocal microscopic endoscope fault processing terminal 8, such as a hard disk or a memory of the confocal microscopic endoscope fault processing terminal 8. The readable storage medium 81 can also be an external storage device of the confocal microscopic endoscope fault processing terminal 8, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the confocal microscopic endoscope fault processing terminal 8. Further, the readable storage medium 81 can also include both the internal storage unit and the external storage device of the confocal microscopic endoscope fault processing terminal 8. The readable storage medium 81 is used to store the computer program and other programs and data required by the confocal microscopic endoscope fault processing terminal. The readable storage medium 81 can also be used to temporarily store data that has been output or will be output.

[0070] It can be clearly understood by those skilled in the art that, for the convenience and brevity of description, only the division of the above functional units and modules is exemplified, and in actual application, the above functions can be completed by different functional units and modules according to needs, that is, the internal structure of the device is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of software functional unit. In addition, the specific names of each functional unit and module are only for easy distinction, and do not limit the protection scope of the present application. The specific working process of the units and modules in the system can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0071] In the above embodiments, the description of each embodiment has its own emphasis, and the parts not described or recorded in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0072] Those skilled in the art can realize that the units and method steps of the examples described in combination with the embodiments disclosed herein can be realized in electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0073] In the embodiments of the present application, it should be understood that the disclosed apparatus / terminal device and method can be implemented in other manners. For example, the embodiments of the apparatus / terminal device described above are merely schematic, and the division of the modules or units is merely logical function division, and there can be another division manner in actual implementation. For example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections can be indirect couplings or communication connections through some interfaces, devices or units, and can be in electrical, mechanical or other forms.

[0074] The units described as separate components can or can not be physically separate, and the components shown as units can or can not be physical units, that is, can be located in one place, or can be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiments.

[0075] In addition, each functional unit in the various embodiments of the present application can be integrated into a processing unit, or each unit can exist physically, or two or more units can be integrated into one unit. The integrated unit can be implemented in the form of hardware or in the form of a software functional unit.

[0076] The present application is not limited to the description and embodiments described in the specification, and those skilled in the art can easily implement other advantages and modifications, and therefore the present application is not limited to the specific details, representative devices and examples of the drawings shown and described herein.

Claims

1. A method for troubleshooting a confocal endomicroscope, the method comprising: The method comprises the following steps: Step 1, querying the operation log of the confocal endomicroscopy to obtain the current operation stage and / or the previous action of generating the target fault image; Step 2, generating the initial fault cause of the target fault image and the image feature judgment condition corresponding to each initial fault cause according to the current operation stage and / or the previous action; Step 3, calculating the fault feature parameter of the target fault image, matching the fault feature parameter with each image feature judgment condition, and positioning the target fault cause from the initial fault causes according to the matching result; Step 4, executing the corresponding preset fault processing scheme according to the target fault cause. In the step 3, the target fault cause is positioned by: obtaining a plurality of continuous target fault images, the target fault image being an optical fiber end face image; detecting the optical fiber core and / or the preset pattern of each target fault image, and calculating the fault feature parameter according to the detection result, including the average core number, the core number of each preset end face region, the coincidence rate of the undistributed region of the core in the plurality of target fault images, and / or the target pattern contained in any target fault image; matching the fault feature parameter with each image feature judgment condition, obtaining the target judgment condition satisfied by the fault feature parameter, and taking the initial fault cause corresponding to the target judgment condition as the target fault cause; the image feature judgment condition comprises: if the fault is a probe coupling focusing fault, the image feature judgment condition is that the average core number is less than a first preset value and the difference of the core number in each preset end face region is less than a second preset value; if the fault is a change of the connection state of the probe and the host caused by probe collision or equipment movement, the image feature judgment condition is that the average core number is greater than a third preset value and the coincidence rate of the undistributed region of the core in the plurality of target fault images is greater than a fourth preset value, the third preset value being greater than the first preset value; if the fault is an adjustment of the debugging parameter corresponding to the preset processing module, the image feature judgment condition is that the target pattern contained in any target fault image is consistent with the preset pattern.

2. The failure handling method of a confocal endomicroscope according to claim 1, characterized in that, The operation process of the confocal endomicroscopy is divided into three stages, including a start-up stage, a scanning stage and a maintenance stage, the image fault cause of the start-up stage comprising a probe coupling focusing fault, the image fault cause of the scanning stage comprising a change of the connection state of the probe and the host caused by probe collision or equipment movement, and the image fault cause of the maintenance stage comprising an adjustment of the debugging parameter corresponding to the preset processing module.

3. The method of claim 1, wherein the method further comprises: The method further comprises an operation log establishing step, specifically: obtaining an operation start instruction of the confocal endomicroscopy, continuously recording user operation actions, system automatic actions and / or environmental actions at a preset frequency, and establishing an operation log with a unified time stamp.

4. The failure handling method of a confocal endomicroscope according to claim 3, characterized in that, The user operation actions comprise probe insertion / removal actions, equipment movement actions, control parameter adjustment actions, control instruction input / call actions; the system automatic actions comprise automatic focusing actions and / or automatic gain adjustment actions generated by executing the control instructions; and the environmental actions comprise environmental vibration and / or environmental temperature.

5. The method of claim 1-4, wherein the method further comprises, Further comprising a pre-warning step, specifically: if the fault feature parameter does not satisfy any image feature judgment condition, a pre-warning instruction is generated, and a repeated image feature of the continuous multiple frames of target fault images is identified and matched one by one in the alternative fault library, and an alternative fault list is generated according to the repeated image feature.

6. A device for handling a malfunction of a confocal endomicroscope, based on the method for handling a malfunction of a confocal endomicroscope according to any one of claims 1 to 5, characterized in that The method comprises a first acquisition module, a second acquisition module, a matching module and an execution module, The first acquisition module is configured to query an operation log of the confocal endomicroscopy, and acquire a current operation stage and / or a previous action for generating the target fault image; The second acquisition module is configured to generate initial fault reasons of the target fault image and image feature judgment conditions corresponding to each initial fault reason according to the current operation stage and / or the previous action; The matching module is configured to calculate a fault feature parameter of the target fault image, match the fault feature parameter with each image feature judgment condition, and locate a target fault reason from the initial fault reasons according to a matching result; The execution module is configured to execute a corresponding preset fault processing scheme according to the target fault reason.

7. A computer readable storage medium characterized in that, A computer program is stored, and when executed by a processor, the steps of the fault processing method of the confocal endomicroscopy according to any one of claims 1-5 are implemented.

8. A troubleshooting terminal for a confocal endomicroscope, characterized in that A computer readable storage medium and a processor are included, and when the processor executes a computer program on the computer readable storage medium, the steps of the fault processing method of the confocal endomicroscopy according to any one of claims 1-5 are implemented.

Images