X-ray source artifact identification method and X-ray detection device

Abstract

The invention provides an X-ray source artifact identification method and an X-ray detection device, and the method comprises the steps: transmitting an X-ray source based on a glass window ray tube, enabling a ray light spot to cover a detection plate, and detecting whether an image on the detection plate has an artifact or not so as to correct the image; replacing the glass window ray tube with a metal window ray tube, covering the detection plate with the ray light spot again, and detecting whether the image on the detection plate has artifacts or not again; when artifacts appear on the detection plate, the positions of the artifacts are recorded; changing the spatial relationship between the metal window ray tube and the detection plate, and detecting whether the artifacts on the detection plate are changed or not again; when the position of the artifact is not changed, judging that the artifact is a detection plate artifact; and when the position of the artifact is changed, the artifact is judged to be the artifact of the metal window ray tube. According to the method, the detection plate artifacts are corrected firstly, and then the window artifacts are identified, so that the accuracy of ray tube quality detection is ensured; meanwhile, the accuracy of image recognition can be improved subsequently.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of image detection, in particular to an X-ray source artifact identification method and an X-ray detection device. BACKGROUND

[0002] In the process of quality detection of the X-ray tube, it is often necessary to observe whether the X-ray tube imaging is accurate and free from artifact interference. The X-ray source artifact usually refers to the image distortion caused by the X-ray source itself or the hardware system related to the X-ray source in the X-ray imaging process. The existing artifact identification algorithm performs artifact elimination steps after detecting the artifact to ensure the relative accuracy of the X-ray imaging. However, this method cannot completely improve the artifact problem, and the artifact caused by more serious physical structure defects (such as a small amount of welding slag or uneven welding material on the metal window or process error on the detection plate) cannot be effectively eliminated by the algorithm, which will limit the accuracy of the X-ray source. Since more technical personnel rely on algorithm correction, when the technical personnel perform quality detection on the glass window of the X-ray tube, the judgment is often inaccurate whether it is caused by the artifact problem of the unqualified quality of the X-ray tube.

[0003] Therefore, there is an urgent need for a new method for identifying X-ray source artifacts to ensure the accuracy and efficiency of X-ray tube quality detection.

[0004] It should be noted that the above introduction to the technical background is only to facilitate the clear and complete description of the technical scheme of the present application, and to facilitate the understanding of those skilled in the art. The above technical scheme cannot be considered as known to those skilled in the art only because it is described in the background section of the present application. SUMMARY

[0005] In view of the above-mentioned shortcomings of the prior art, the purpose of the present application is to provide an X-ray source artifact identification method and an X-ray detection device, which are used to solve the problem that more technical personnel rely on algorithm correction, and when the technical personnel perform quality detection on the glass window of the X-ray tube, the judgment is often inaccurate whether it is caused by the artifact problem of the unqualified quality of the X-ray tube.

[0006] To achieve the above object and other related objects, the present application provides an X-ray source artifact identification method, comprising:

[0007] S1, emitting an X-ray source based on a glass window ray tube, and making a ray spot cover the detection plate, and detecting whether an artifact appears on the image on the detection plate; when the detection plate has an artifact, determining that it is a detection plate artifact, and correcting the detection plate to remove the artifact;

[0008] S2, replace the glass window ray tube with a metal window ray tube, again make the ray spot cover the detection plate and again detect whether the image on the detection plate appears artifacts; when the detection plate appears artifacts, record the artifact position;

[0009] S3, change the spatial relationship between the metal window ray tube and the detection plate, and again detect whether the artifacts on the detection plate change; when the artifact position does not change, it is determined to be a detection plate artifact; when the artifact position changes, it is determined to be a metal window ray tube artifact.

[0010] Optionally, the X-ray source artifact identification method further comprises step S4;

[0011] S4, when the artifact is a detection plate artifact, correct the detection plate to remove the artifact.

[0012] Optionally, when the area of the artifact is greater than or equal to a preset area, it is determined that the artifact needs to be corrected to remove the artifact.

[0013] Optionally, the method of correcting the detection plate includes algorithm correction and physical correction.

[0014] Optionally, the algorithm correction is set to at least one of a bias correction algorithm, a gain correction algorithm, and a bad pixel ring line correction algorithm.

[0015] Optionally, in step S3, changing the spatial relationship between the metal window ray tube and the detection plate is set to change the distance between the metal window ray tube and the detection plate, change the incident angle between the metal window ray tube and the detection plate, rotate the metal window ray tube in the X-ray direction or rotate the detection plate in the X-ray direction.

[0016] Optionally, when changing the spatial relationship between the metal window ray tube and the detection plate is set to rotating the metal window ray tube in the X-ray direction or rotating the detection plate in the X-ray direction, it is set to rotate in any angle from 0° to 180° in the clockwise direction or counterclockwise direction.

[0017] To achieve the above-mentioned purposes and other related purposes, the present application provides an X-ray detection device for realizing the X-ray source artifact identification method described above, comprising a ray tube and a detection plate;

[0018] The ray tube is used to emit X-rays to the detection plate; the detection surface of the detection plate receives X-rays and converts them into image information;

[0019] The X-ray tube comprises a body and a window body; the body is used for emitting X-rays; the window body is arranged on the path of the X-rays, and the X-rays are emitted to the outside of the X-ray tube; and the window body is arranged as a glass window or a metal window.

[0020] Optionally, the body comprises a filament, a grid, an anode, an anode target, and a lens structure; the two ends of the filament are respectively connected to different voltages to generate an electron beam through voltage heating; the anode is provided with a through hole at the center, and the electron beam flows into the lens structure through the through hole; the grid is arranged between the filament and the anode, and is used for adjusting the intensity of the electron beam; the anode target is arranged on the inner side of the window body and corresponds to the lens structure; and the lens structure comprises an electric lens or a magnetic lens, and is used for converging the electron beam and emitting the electron beam to the anode target to generate X-rays, and then the X-rays are emitted to the outside of the X-ray tube through the window.

[0021] Optionally, the X-ray detection device is arranged in a lead room environment.

[0022] As described above, the X-ray source artifact identification method and the X-ray detection device have the following beneficial effects:

[0023] 1. The X-ray source artifact identification method and the X-ray detection device can correct the probe plate artifact and then identify the metal window X-ray tube artifact, thereby ensuring the accuracy of the quality detection of the X-ray tube; and at the same time, the accuracy of subsequent image recognition can be improved.

[0024] 2. The X-ray source artifact identification method and the X-ray detection device set the identification steps in a certain order and cannot be separated, so that after the probe is corrected by the algorithm, the person skilled in the art directly determines that the newly appearing artifact is all derived from the metal window, without considering the artifact caused by accidental errors or other reasons, thereby avoiding the problem of affecting the accuracy of image recognition and quality detection of the X-ray tube.

[0025] 3. The X-ray source artifact identification method is simple, and the X-ray detection device has a simple structure and can be widely applied. BRIEF DESCRIPTION OF DRAWINGS

[0026] Figure 1 A step schematic diagram of the X-ray source artifact identification method is shown.

[0027] Figure 2 A schematic diagram of the X-ray detection device is shown.

[0028] Figure 3 A schematic diagram of the X-ray detection device in step S3 is shown.

[0029] Figure 4 An artifact bad point imaging schematic diagram is shown in step S2 of the present application.

[0030] Figure 5 An artifact bad point imaging schematic diagram is shown in step S3 of the present application.

[0031] Figure 6 A structural schematic diagram of the X-ray detection device of the present application is shown.

[0032] Element number explanation

[0033] 1 X-ray detection device

[0034] 11 X-ray tube

[0035] 110 Electron beam

[0036] 111 Filament

[0037] 112 Grid

[0038] 113 Anode

[0039] 1131 Through hole

[0040] 114 Anode target

[0041] 115 Lens structure

[0042] 116 Deflection structure

[0043] 12 Detection plate DETAILED DESCRIPTION

[0044] The present application is described in detail below with specific reference being made to certain embodiments. It is to be understood that other embodiments of the application can be practiced with different modifications and changes to the details of the application as described herein, without departing from the spirit and scope of the application. It is also to be understood that the following description is only one of the many possible embodiments of the application.

[0045] Reference will now be made to the drawings, wherein Figures 1-6 It is to be understood that the above-mentioned arrangements are merely meant to illustrate the principle of the present application, and thus the drawings are not drawn to scale and only show components related to the present application, and not all components which can be comprised in a device according to the present application. The actual implementation of the components, their number, shape and size can be varied in a wide range, and the layout of the components can also be more complex.

[0046] EMBODIMENT

[0047] As Figure 1As shown, the embodiment provides an X-ray source artifact identification method, which includes: S1, based on the glass window X-ray tube 11 emits X-ray source, and makes the ray spot cover the detection plate 12, and detects whether the image on the detection plate 12 appears artifact; When the detection plate 12 appears artifact, it is judged that it is the detection plate 12 artifact, and the detection plate 12 is corrected to remove the artifact.

[0048] Specifically, when the area of the artifact is greater than or equal to the preset area, it is determined that the artifact needs to be corrected to remove the artifact. Artifacts refer to various forms of images that do not exist in the scanned object but appear on the image. Artifacts may interfere with the interpretation of the image, affecting the accuracy of diagnosis or measurement. In this embodiment, when the X-ray tube 11 is used for scanning detection, the image artifact is often formed due to different reasons. The first is that the window of the X-ray tube is set to a metal window, and the metal window has a little welding slag or uneven welding material, so that the X-ray tube 11 generates an artifact on the detection plate 12 when imaging. In this embodiment, the metal window is set to a beryllium tube or an aluminum tube. The second is the artifact caused by the process error on the detection plate 12. In step S1, the window of the X-ray tube 11 is set to a glass window to avoid the interference of the window artifact, thereby ensuring that the artifact obtained in step S1 is only the detection plate 12 artifact interference. When the area of the artifact exceeds a certain preset area, such as in this embodiment, the artifact area exceeds 4 pixel points, it is considered that the artifact needs to be compensated to avoid affecting the subsequent image processing.

[0049] It should be noted that in step S1, the glass window can also be changed to a standard metal window that has been checked for no welding slag or welding material interference to facilitate subsequent detection.

[0050] As an example, the method of correcting the detection plate 12 includes algorithm correction and physical correction. When the artifact on the detection plate 12 is detected, since the artifact can only come from the detection plate 12, the detection plate 12 can be corrected based on this. For example, the artifact defect is compensated by algorithm, or the artifact defect is avoided by replacing a more standard detection plate 12, etc. In actual use, at least one method can be used to correct the detection plate 12.

[0051] As a further example, in this embodiment, the algorithm correction is set to at least one of the bias correction algorithm, the gain correction algorithm, and the bad pixel ring line correction algorithm.

[0052] In this embodiment, the bias correction algorithm can be used to eliminate the brightness non-uniformity caused by non-uniform illumination or sensor itself characteristics. This non-uniformity can be manifested as a dark corner or a bright spot in the center of the image. The correction process usually involves identifying and removing such systematic brightness deviations from the image. This can be achieved by estimating the dark areas in the image and using the average value of these areas as a bias correction factor.

[0053] In this embodiment, the gain correction algorithm can be used to adjust the overall brightness level of the image to compensate for the gain difference of the detection panel 12 or the change of the illumination intensity. Gain correction is usually achieved by multiplying a proportional factor, which can be determined according to the histogram or other statistical information of the non-uniform image.

[0054] In this embodiment, the bad pixel ring line correction algorithm can be used to identify and repair abnormal pixels in the image, which can be static (always showing as an error value) or dynamic (changing under different conditions), and the correction method can include detecting these points and replacing them with the average or median value of the surrounding pixels. In actual use, it is considered that there is a bad line when the bad pixels exceed a certain proportion. Based on the determined bad pixels or bad lines, subsequent replacement repair is facilitated.

[0055] It should be noted that more algorithmic repair of artifacts on the detection panel 12 can also be made in actual use, which is not limited to this embodiment.

[0056] S2, replace the glass window ray tube 11 with a metal window ray tube 11, again make the ray spot cover the detection panel 12 and again detect whether artifacts appear on the detection panel 12; when the detection panel 12 has artifacts, record the artifact position.

[0057] Specifically, as shown in Figure 2 the position of the detection panel 12, at this time the artifact bad pixel port position is in the second quadrant range centered on the plane where the detection panel 12 is located. Since the bad pixels of the detection panel 12 cannot be completely removed by step S1, the artifact bad pixel port still has two possibilities, the bad pixels of the detection panel 12 and the bad pixels of the metal window ray tube 11 after replacing the metal window. Further identification of the artifact bad pixel port in step S2 is required.

[0058] S3, change the spatial relationship between the metal window ray tube 11 and the detection panel 12, and again detect whether the artifact on the detection panel 12 has changed; when the artifact position has not changed, it is determined to be a detection panel 12 artifact; when the artifact position has changed, it is determined to be a metal window ray tube 11 artifact.

[0059] Specifically, in step S3, the spatial relationship between the metal window X-ray tube 11 and the detection plate 12 is changed by changing the distance between the metal window X-ray tube 11 and the detection plate 12, changing the incident angle between the metal window X-ray tube 11 and the detection plate 12, rotating the metal window X-ray tube 11 about the X-ray axis, or rotating the detection plate 12 about the X-ray axis. In other words, any of these changes can be considered a change in the spatial relationship between the metal window X-ray tube 11 and the detection plate 12, thereby achieving the purpose of identifying the source of the artifact.

[0060] As an example, when the spatial relationship between the metal window X-ray tube 11 and the detection plate 12 is changed, the metal window X-ray tube 11 is rotated with the X-ray axis or the detection plate 12 is rotated with the X-ray axis, and the rotation is set to any angle between 0° and 180° in the clockwise direction or counterclockwise direction. In this embodiment, if Figure 3 As shown, the image is rotated 90° counterclockwise with the X-ray axis as the axis. Since the artifact bad point port has shifted from the second quadrant to the third quadrant, it is believed that the artifact is present on the metal window X-ray tube 11 and can be removed using an algorithmic or physical method. The specific removal methods have been described above and will not be repeated here. Additionally, if the artifact bad point port exceeds a preset area (e.g., a preset number of pixels), a physical method can be directly selected to replace the metal window X-ray tube 11 with a new one to improve the accuracy of the X-ray detection device.

[0061] It should be noted that, in addition to the method of rotating the metal window X-ray tube 11 provided in this embodiment, the detection plate 12 can also be rotated to perform artifact type judgment; in the second embodiment, the distance between the metal window X-ray tube 11 and the detection plate 12 can also be changed (such as Figure 2 、 Figure 3 The distance D=30cm in the figure is modified to D=35cm or D=25cm), and the type of the artifact is confirmed by comparing the areas of the two artifacts; in the third embodiment, the incident angle between the metal window X-ray tube 11 and the detection plate 12 can also be changed, such as rotating the detection plate 12 about any straight line on the plane where the detection plate 12 is located. At this time, the artifact bad point port will be deformed, and part of the position will be elongated. By judging the deformation of the two artifacts, the type of the artifact is confirmed. In fact, as long as there is only one variable in the relationship between the X-ray tube 11 and the detection plate 12 to determine the position where the artifact bad point port appears, it can be used as the protection scope of this embodiment. At the same time, when performing correction based on the artifact area in the subsequent process, it is necessary to consider that the preset area brought about by this change also needs to change accordingly to ensure the consistency of the final detection standard.

[0062] It needs to be further explained that when the X-ray tube 11 performs scanning detection, the image artifact is often caused by a little welding slag or uneven welding material on the metal window and the process error on the detection plate 12. The skilled person in the art often relies on the algorithm to directly correct the artifact, but it ignores that the algorithm correction cannot guarantee that the artifact can be completely eliminated, and if the correction method is not used specifically according to the position of the artifact, the physical correction method cannot actually solve the technical problem. In practical application, the method of the embodiment is suitable for reviewing the quality of the metal window. If the source of the artifact cannot be clearly known, only the image is corrected, on the one hand, it will affect the quality identification of the metal window; on the other hand, it will affect the accuracy of the subsequent image.

[0063] More importantly, the method provided in the embodiment must ensure that the detection plate artifact in step S1 has been corrected before steps S2 and S3 are performed. These three steps are indispensable. On the one hand, the detection plate artifact is corrected by the algorithm, which is conducive to improving the accuracy of subsequent image recognition; on the other hand, it is to avoid the problem that the artifact in step S2 is determined to come from the metal window by the skilled person in the art after the algorithm correction is completed, without considering the artifact caused by accidental error or other reasons. In fact, the artifact source cannot be determined as one or the other only because the artifact source is limited, so the number and order of steps S1-S3 cannot be changed.

[0064] Specifically, the X-ray source artifact identification method further includes step S4; when the artifact is the detection plate 12 artifact, the detection plate 12 is corrected to remove the artifact. The specific method has been described in the foregoing, which will not be repeated here.

[0065] Specifically, as an example, when the area of the artifact is greater than or equal to the preset area, it is determined that the artifact needs to be corrected to remove the artifact. In the embodiment, when the area of the artifact is greater than or equal to the preset area, the physical device where the artifact appears can be directly replaced based on the physical method; when the area of the artifact is less than the preset area, the image where the artifact appears can be directly compensated based on the algorithm method. The specific method has been described in the foregoing, which will not be repeated here.

[0066] As shown in Figures 4-5 , the X-ray source artifact identification method of the embodiment can effectively identify the position where the image artifact is generated (part A in step S2 and part B in step S3), and through algorithm correction and physical correction, it is convenient to improve the accuracy of the X-ray detection device.

[0067] As shown in Figure 2 , Figure 3 , and Figure 6As shown, the embodiment also provides an X-ray detection device 1 for implementing the X-ray source artifact identification method described above, comprising a ray tube 11 and a detection plate 12; the ray tube 11 is used to emit X-rays to the detection plate 12; the detection surface of the detection plate 12 receives X-rays and converts them into image information; wherein the ray tube 11 comprises a body and a window (not shown in the figure); the body is used to emit X-rays; the window is arranged on the path of the X-rays, emitting the X-rays outside the ray tube 11; the window is arranged as a glass window or a metal window. In this embodiment, the window is arranged outside the body; the metal window is arranged as a beryllium window or an aluminum window.

[0068] Specifically, the body comprises a filament 111, a grid 112, an anode 113, an anode target 114, and a lens structure 115; the two ends of the filament 111 are respectively connected to different voltages to generate an electron beam 110 by voltage heating; the anode 113 has a through hole 1131 at its center, and the electron beam 110 flows into the lens structure 115 through the through hole 1131; the grid 112 is arranged between the filament 111 and the anode 113, used to adjust the intensity of the electron beam 110; the anode target 114 is arranged on the inner side of the window and corresponds to the lens structure 115; the lens structure 115, which comprises an electric lens or a magnetic lens, is used to converge the electron beam and emit it onto the anode target 114 to generate X-rays, which are then emitted outside the ray tube through the window.

[0069] In this embodiment, the body also comprises a deflection structure 116; the deflection structure 116 is arranged between the anode 113 and the lens structure 115, used to adjust the deflection angle of the electron beam flowing into the lens structure 115.

[0070] Specifically, the X-ray detection device 1 is arranged in a lead room environment to avoid radiation leakage during measurement and isolate external interference.

[0071] Based on the X-ray source artifact identification method and the X-ray detection device provided in this embodiment, the artifact problem that may occur when the X-ray tube is used for industrial detection can be avoided, and the misjudgment of internal defects of the detected object can be avoided, such as mistaking artifacts for actual defects or failing to correctly identify real defects. By reducing or eliminating artifacts, the detection result can be ensured to be more accurate, thereby avoiding potential safety risks or unnecessary maintenance costs caused by misjudgment.

[0072] The application provides an X-ray source artifact identification method and an X-ray detection device, which comprises the following steps: an X-ray source is emitted based on a glass window ray tube, a ray spot covers a detection plate, and whether an artifact appears on the image on the detection plate is detected to correct it; the glass window ray tube is replaced by a metal window ray tube, the ray spot covers the detection plate again, and whether an artifact appears on the image on the detection plate is detected again; when the artifact appears on the detection plate, the artifact position is recorded; the spatial relationship between the metal window ray tube and the detection plate is changed, and whether the artifact on the detection plate changes is detected again; when the artifact position does not change, it is determined that the artifact is a detection plate artifact; when the artifact position changes, it is determined that the artifact is a metal window ray tube artifact. The application corrects the detection plate artifact first and then identifies the window artifact, thereby ensuring the accuracy of the quality detection of the ray tube; meanwhile, it is also beneficial to improve the accuracy of subsequent image identification. Therefore, the application effectively overcomes various shortcomings in the prior art and has high industrial utilization value.

[0073] The above examples only exemplarily illustrate the principles and effects of the application, and are not used to limit the application. Any person skilled in the art can modify or change the above examples without departing from the spirit and scope of the application. Therefore, all equivalent modifications or changes completed by those skilled in the art without departing from the spirit and technical thought disclosed by the application should be covered by the claims of the application.

Claims

1. A method of X-ray source artifact identification, characterized by, The micro-focus X-ray source artifact identification method at least comprises: S1, emitting X-ray source based on glass window ray tube, and making the ray spot cover the detection plate, and detecting whether the image on the detection plate appears artifact; when the detection plate appears artifact, it is determined that it is detection plate artifact, and the detection plate is corrected to remove artifact; S2, replacing the glass window ray tube with metal window ray tube, again making the ray spot cover the detection plate and again detecting whether the image on the detection plate appears artifact; when the detection plate appears artifact, record the artifact position; S3, changing the space relationship between the metal window ray tube and the detection plate, and again detecting whether the artifact on the detection plate changes; when the artifact position does not change, it is determined that it is detection plate artifact; when the artifact position changes, it is determined that it is metal window ray tube artifact.

2. The X-ray source artifact identification method of claim 1, wherein: The X-ray source artifact identification method further comprises step S4; S4, when the artifact is detection plate artifact, correcting the detection plate to remove artifact.

3. The X-ray source artifact identification method of claim 2, wherein: When the area of the artifact is greater than or equal to the preset area, it is determined that the artifact needs to be corrected to remove artifact.

4. The X-ray source artifact identification method of claim 3, wherein: The method for correcting the detection plate comprises algorithm correction and physical correction.

5. The X-ray source artifact identification method of claim 4, wherein: The algorithm correction is set to at least one of bias correction algorithm, gain correction algorithm and bad point ring line correction algorithm.

6. The method of x-ray source artifact identification according to any one of claims 1 to 5, characterized in that: In step S3, changing the space relationship between the metal window ray tube and the detection plate is set to change the distance between the metal window ray tube and the detection plate, change the incident angle between the metal window ray tube and the detection plate, rotate the metal window ray tube in the X-ray axis direction or rotate the detection plate in the X-ray axis direction.

7. The X-ray source artifact identification method of claim 6, wherein: When changing the space relationship between the metal window ray tube and the detection plate is set to rotate the metal window ray tube in the X-ray axis direction or rotate the detection plate in the X-ray axis direction, it is set to rotate any angle in the clockwise direction or counterclockwise direction from 0° to 180°.

8. An X-ray detection apparatus for implementing the X-ray source artifact identification method according to any one of claims 1 to 7, characterized in that, The X-ray detection device at least comprises a ray tube and a detection plate; The ray tube is used to emit X-ray to the detection plate; the detection surface of the detection plate receives X-ray and converts it into image information; The ray tube comprises a body and a window; the body is used to emit X-ray; the window is arranged on the path of the X-ray, and the X-ray is emitted to the outside of the ray tube; the window is set to glass window or metal window.

9. The X-ray detection apparatus of claim 8, characterized in that: The body comprises a filament, a grid, an anode, an anode target and a lens structure; The two ends of the filament are respectively connected to different voltages to generate electron beam by voltage heating; The anode is provided with a through hole at the positive center, and the electron beam flows into the lens structure through the through hole; The grid is arranged between the filament and the anode, and is used to adjust the intensity of the electron beam; The anode target is arranged on the inner side of the window and corresponds to the lens structure. The lens structure, including an electric lens or a magnetic lens, is used to converge the electron beam and emit it onto an anode target to generate X-rays, which are then emitted outside the ray tube through the window.

10. The X-ray detection apparatus of claim 8, wherein: The X-ray detection device is arranged in a lead room environment.

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