The invention provides a solid sample direct introduction device of a microwave plasma torch spectrometer. The solid sample direct introduction device mainly includes pulsed laser system, an imaging positioning system, a sample processing system, a position regulating system and an air path switching system. Through the adoption of the solid sample direct introduction device disclosed by the invention, the direct sampling analysis of solid samples comprising biological samples, metallic materials and the like can be realized, besides, the device is suitable for sampling regular sample surfaces and irregular sample surfaces, direct laser ablation sampling can atomize all the elements, and the device can be used for full elementary analysis of the microwave plasma torch spectrometer. The device can be applied to many existing fields of metallurgy, medical inspection, life science, agriculture, food safety detection, forestry, environmental monitoring, biological identification, medicolegal expertise and the like. The device disclosed by the invention is reasonable in design, and can be used for direct sample introduction for the solid samples, the pretreatment steps of the samples are decreased, requirements for the material state of the samples are lower, and the device satisfies user demands.