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218 results about "Photoionization" patented technology

Photoionization is the physical process in which an ion is formed from the interaction of a photon with an atom or molecule.

Hydrogen production method and system by wind power, photoionization/grid connection

The invention provides a hydrogen production method and system by wind power, photoionization/grid connection, and relates to the technical field of wind power hydrogen production. The power supply ofthe hydrogen production device is a main wind power plant wind turbine generator set grid and an energy storage unit, and the energy storage unit is connected with a vertical axis wind turbine generator set of a hydrogen production plant and a photovoltaic battery panel as an auxiliary power generation unit; On the premise of meeting the demand of power grid, hydrogen is produced by utilizing theexcess electric energy of power grid. When the excess electric energy of power grid is too low, the electric energy of energy storage unit is released and supplemented for hydrogen production, so that the input power of a hydrogen production device is smoother and more stable. The hydrogen production device comprises an alkaline electrolytic cell and a solid oxide electrolytic cell. The inventionmainly solves the problem of wide power fluctuation of hydrogen production by wind power existing in the prior art, makes the input power of the hydrogen production device smooth, and improves the efficiency and service life of the hydrogen production device.
Owner:HEBEI UNIVERSITY OF SCIENCE AND TECHNOLOGY

Method for recognizing and analyzing sample and ion transfer spectrometer

InactiveCN101413919AImprove the ability of analysis and recognitionMaterial analysis by electric/magnetic meansIon transferIon-mobility spectrometry
The invention provides a method used for identifying and analyzing samples. The sample is ionized by two or three combination types out of the following types: photoionization VUV, radioactive <63>Ni ionization, point discharge ionization and electron spray ionization. Subsequently, the detection in a positive ion mode and the detection in a negative ion mode are carried out at the same time, thus obtaining positive/negative ion signal spectrogram; the obtained ion signals are respectively amplified by a micro-current amplifier and subsequently collected by a multi-passage data collecting card; the data is analyzed by a computer so as to obtain the type and the consistency of the sample to be tested. The method has the advantages that according to type difference of compounds measured by ion mobility spectrometry under different ionization sources and different detection modes, the types of the compounds measured by the ion mobility spectrometry is enlarged; meanwhile, according to the difference between the characteristic of the spectrogram and the spectrogram, the sample is analyzed and identified, thus improving the analysis and identification capability of the ion mobility spectrometry on the sample; meanwhile, the advantages the ion mobility spectrometer is small and portable can be kept.
Owner:DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI

Novel electric spray sample introduction vacuum ultraviolet single photon ionization mass spectrum analysis apparatus

The invention relates to a novel electro-spray sampling vacuum ultraviolet single-photon ionization mass spectrometry analysis device which solves the analysis problems of a plurality of non-polarity composition complex systems. The device of the invention comprises a photoionization chamber and a differential chamber which are adjacent to each other; the adjacent side walls of the photoionization chamber and the differential chamber are communicated with a perforated ladle which is convex towards the differential chamber; the outlet of the perforated ladle is corresponding to the middle of the lead-out electrode and acceleration electrode of a time-of-flight mass spectrometer; the inlet of the perforated ladle is corresponding to an inverted horn-shaped nozzle on the side wall of the differential chamber; the inlet of the perforated ladle is in inverted horn shape; an electro-spray needle corresponding to the nozzle is arranged outside the differential chamber; the other end of the electro-spray needle is connected with an injection pump. The device of the invention combines the electro-spray sampling and vacuum ultraviolet photoionization mass spectrometry technique, directly sprays the sample to be measured out of the electro-spray needle during the testing and analysis process, and requires no complex pre-processing and separation of the sample; as the electro-spraying has no restrictions on the thermal stability and volatility of the sample, the device of the invention can be widely applied to the analysis and detection of simple organic matters and complex organic mixtures and can monitor certain organic reaction processes in real time.
Owner:UNIV OF SCI & TECH OF CHINA

Mass spectrum VUV (Vacuum Ultraviolet) photoionization source device for in-source collision induced dissociation

The invention relates to a mass spectrum analyzer, in particular to a mass spectrum VUV (Vacuum Ultraviolet) photoionization source device for in-source collision induced dissociation, which comprises a sample injecting capillary tube, an ion repelling electrode, an ion accelerating electrode, a vacuum ultraviolet lamp, a side pumping valve and an ionization source cavity, wherein the ion repelling electrode and the ion accelerating electrode are placed in the ionization source cavity at interval in parallel, the sample injecting capillary tube passes through the outer wall of the ionization source cavity, and one end of the sample injecting capillary tube is arranged in a central small hole of the ion repelling electrodes; a light emitting window of the vacuum ultraviolet lamp is placed opposite to a gap between the ion repelling electrode and the ion accelerating electrode; and an air outlet is arranged on the side wall of the ionization source cavity, and the side pumping valve is connected with the air outlet through a pipeline. The mass spectrum VUV photoionization source device can be used together with any types of quality analyzers, can simultaneously obtain the molecular weight and the structural information of a matter to be analyzed and also be used for rapidly distinguishing isomerides by utilizing in-source collision induced dissociation.
Owner:DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI

Infrared laser desorption/vacuume ultraviolet single photon ionization mass spectrometry analytical equipment

The invention relates to a novel IR laser desorption/vacuum UV single-photon ionization mass spectrum analyzing device for analysis and detection of a biological sample, which solves the problems of the prior art that uses matrix and is unlikely to analyze complex mixture with low polarity and low molecular weight. The device is structurally characterized in that a photoionization chamber is arranged on one side of a time-of-flight mass spectrometer, an ion injection hole is provided on one sidewall of the photoionization chamber, an ion injector and a sample target are arranged in the chamber, a laser is disposed outside the photoionization chamber on the sample target side, and vacuum UV light source is arranged on the other side. By combining IR laser desorption technology and vacuum UV ionization mass spectrum technology, the invention can achieve high-efficiency and rapid analysis without selecting different matrixes according to the sample and without complex pre-treatment and separation of the sample, thus preventing the matrix interference on mass spectral signals. The invention is specifically suitable for analysis of thermal-unstable and nonvolatile organic compounds and biological molecules.
Owner:UNIV OF SCI & TECH OF CHINA

Method of direct Coulomb explosion in laser ablation of semiconductor structures

A new technique and Method of Direct Coulomb Explosion in Laser Ablation of Semiconductor Structures in semiconductor materials is disclosed. The Method of Direct Coulomb Explosion in Laser Ablation of Semiconductor Structures provides activation of the “Coulomb explosion” mechanism in a manner which does not invoke or require the conventional avalanche photoionization mechanism, but rather utilizes direct interband absorption to generate the Coulomb explosion threshold charge densities. This approach minimizes the laser intensity necessary for material removal and provides optimal machining quality. The technique generally comprises use of a femtosecond pulsed laser to rapidly evacuate electrons from a near surface region of a semiconductor or dielectric structure, and wherein the wavelength of the laser beam is chosen such that interband optical absorption dominates the carrier production throughout the laser pulse. The further application of a strong electric field to the semiconductor or dielectric structure provides enhancement of the absorption coefficient through a field induced redshift of the optical absorption. The use of this electric field controlled optical absorption is available in all semiconductor materials and allows precise control of the ablation rate. When used in conjunction with nanoscale semiconductor or dielectric structures, the application of a strong electric field provides for laser ablation on sub-micron lateral scales.
Owner:OPTICAL ANALYTICS
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