Micro-motion sample rod for dynamic tensile test of transmission electron microscope

Abstract

The invention discloses a micro-motion sample rod for a dynamic tensile test of a transmission electron microscope, which comprises a piezoelectric ceramic actuator assembled on a central through hole of a sample rod body, the sample rod body and a total bearing table fixed on the sample rod body, and the total bearing table is provided with a guide rail which is in movable contact with a movable sample bearing table. The fixed sample bearing table is fixed on the main bearing table through a nut, the power amplifier is assembled on the tail side of a sample rod body, an electric signal is transmitted to the piezoelectric ceramic actuator through the power amplifier during working, and the piezoelectric ceramic actuator pushes the movable sample bearing table so as to realize dynamic stretching of a sample. The sample rod disclosed by the invention can be used for realizing micron-dimension dynamic controllable stretching of a test sample, so that the microstructure of a material under dynamic stretching is observed.

Description

Technical Field

[0001] This invention relates to the field of dynamic observation of sample tension in transmission electron microscopy, and in particular to a micro-motion sample rod for dynamic tensile testing in transmission electron microscopy. Background Technology

[0002] The deformation of materials under stress is closely related to their microscopic structure. With the continuous development of microscopy, many devices have emerged that have overcome the limitations of optical microscopes, allowing observation of minute structures smaller than 0.2 μm. Many devices now boast nanoscale resolution, significantly impacting fields such as chemistry, biology, and materials science. Currently, the observation of microstructures is largely limited to static observation of samples after experiments, lacking observation of the dynamic changes in the sample's microstructure during the experiment. This often leads to analytical errors.

[0003] Static observation using transmission electron microscopy (TEM) primarily focuses on the structure and morphology of samples, obtaining microscopic details through high-resolution imaging. Dynamic observation under TEM, however, allows for the observation of not only the microstructure and morphology of samples but also stress changes during tensile testing and dynamic behaviors such as displacement, deformation, and crack propagation during deformation, revealing the mechanical properties and deformation mechanisms of materials.

[0004] A micro-motion sample bar for dynamic tensile testing using transmission electron microscopy (TEM) enables in-situ tensile testing at the nanoscale. Combined with the high-resolution imaging capabilities of TEM, it provides detailed information on the material's mechanical properties and deformation mechanisms. This is significant for nanomaterials research and engineering applications, and offers valuable reference and guidance for material design and optimization. While there are many types of sample bars available, few are specifically designed for mechanics and material deformation. For example, Gatan Corporation in the US offers a tensile sample bar that achieves low-rate displacement through a combination of precision gears and a precision worm gear. This invention, however, uses a piezoelectric ceramic actuator as the driving device for low-rate displacement, enabling precise tensile control by adjusting the sample's tensile rate through electric field control. This allows for high-precision tensile testing. The biaxial tilting in-situ electromechanical property comprehensive testing sample bar for TEM invented by Beijing University of Technology has one end of the sample directly fixed to a deformable material for applying stress. In contrast, this invention uses a piezoelectric ceramic actuator to apply stress to the sample, offering advantages in control precision and stability. This results in more reliable and accurate tensile data, improving experimental repeatability.

[0005] Furthermore, the tensile driving method of this invention features rapid response, enabling fast and precise tensile motion. In in-situ TEM tensile tests, rapid response can capture the transient behavior and deformation process of materials, providing more detailed and accurate information. It also achieves nanometer-level displacement resolution, allowing for more precise research and analysis of the material's microstructure and properties. This invention maintains stable force and displacement control during tensile testing. This is crucial for long-term experiments and studies requiring high material stability. Summary of the Invention

[0006] The main technical problem solved by this invention is to provide a micro-motion sample rod for dynamic tensile testing under transmission electron microscopy, which can solve the problem of observing the changes in the microstructure of the sample under dynamic tensile stress under transmission electron microscopy.

[0007] To solve the above-mentioned technical problems, one technical solution adopted by the present invention is: providing a micro-motion sample rod for dynamic tensile testing of transmission electron microscopy, comprising:

[0008] Sample rod body, power amplifier, main support platform, fixed sample support platform, movable sample support platform, piezoelectric ceramic actuator, spring, test sample.

[0009] A square groove is provided at the central axis position of the fixed sample support stage and the movable sample support stage;

[0010] The square groove of the fixed sample support stage is provided with slide rails on both sides and a U-shaped hole at the other end. The assembly nut is assembled and fixed on the main support stage through the U-shaped hole.

[0011] A U-shaped contact structure is provided on the opposite side of the square groove of the movable sample support stage;

[0012] The test sample assembly includes: sample needle and sample.

[0013] A round hole is provided on the main support platform, and the assembly nut is assembled and fixed to the sample rod body through the round hole;

[0014] The main support platform has guide rails and an L-shaped structure on both sides of the round hole, and a U-shaped through hole on the other side.

[0015] The sample rod has guide rails on both sides of the central axis of the head, as well as a convex structure and a through hole in the center of the rod.

[0016] The convex structure of the sample rod and the L-shaped structure of the main support platform combine to form a rectangular groove after the main support platform and the sample rod are assembled, which is used to place and fix the spring.

[0017] The central through hole of the sample rod is used to place and fix the piezoelectric ceramic actuator.

[0018] The fixed sample support stage and the movable sample support stage have U-shaped openings in front of their square grooves. The diameter of the U-shaped openings is slightly larger than the diameter of the sample needle. The square grooves are used to support molten low-temperature alloys.

[0019] Compared with the prior art, the significant advantages of this invention are:

[0020] (1) The present invention can produce a micro-motion sample rod for dynamic tensile testing of transmission electron microscopy through precise machining and micro-machining technology. Compared with similar products, it is easier to manufacture and reduces processing costs.

[0021] (2) The dimensions of this invention are compatible with the dimensions of most scanning electron microscope sample holders and can be docked with focused ion beam micro-cutting (FIB) technology.

[0022] (3) The present invention achieves dynamic stretching of the sample by using a piezoelectric ceramic actuator. When stretching the sample, micron-level adjustment can be achieved by controlling the electrical signal. Automatic reset can be achieved after stretching. Attached Figure Description

[0023] Figure 1 This is an assembly diagram of the main body of a micro-motion sample rod for dynamic tensile testing using transmission electron microscopy according to the present invention.

[0024] Figure 2 This is a schematic diagram of the overall sample rod.

[0025] Figure 3 Schematic diagram of a fixed sample support stage;

[0026] Figure 4 This is a partial schematic diagram of the sample rod.

[0027] Figure 5 This is a schematic diagram of the main support platform;

[0028] Figure 6 This is a schematic diagram of a movable sample support stage;

[0029] Figure 7 Schematic diagram of the overall assembly of the test sample.

[0030] The components in the attached diagram are labeled as follows: 1. Fixed sample support stage; 2. Movable sample support stage; 3. Sample rod body; 4. Piezoelectric ceramic actuator; 5. Nut; 6. Main support stage; 7. Spring; 8. Test sample assembly; 10. Power amplifier; 11. Square groove; 12. Slide rail; 13. U-shaped hole; 14. Guide rail; 15. Guide rail; 16. U-shaped through hole; 17. Round hole; 18. L-shaped structure; 19. T-shaped structure; 20. Central through hole; 21. Sample needle; 22. Sample; 23. Threaded hole; 24. Threaded hole; 27. U-shaped contact structure. Detailed Implementation

[0031] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby providing a clearer and more explicit definition of the scope of protection of the present invention.

[0032] Please see Figures 1 to 7 The embodiments of the present invention include:

[0033] A micro-motion sample rod for dynamic tensile testing under transmission electron microscopy includes: an observation device for performing dynamic tensile testing of a sample under a transmission electron microscope, mainly comprising a piezoelectric ceramic actuator, a fixed sample support stage, and a movable sample support stage. This mechanism enables dynamic tensile testing of the sample on the sample rod under a transmission electron microscope.

[0034] The main device for achieving sample stretching includes a main support platform 6, which is fixed to the sample rod body. The thinner portion of the main support platform 6 has a U-shaped through-hole 16, which is the area through which the electron beam passes in the transmission electron microscope. The thicker portion of the main support platform 6 has a slide rail 15, allowing the movable sample support platform 2 to make movable contact with the main support platform 6 via the slide rail 15. The thicker portion of the main support platform 6 also has two L-shaped structures 19 symmetrical to the central axis. After the main support platform 6 is fixed to the sample rod body 3, the L-shaped structures 19 on the main support platform 6 and the convex structures 20 on the sample rod body 3 cooperate to form a rectangular groove for placing the spring 7. The fixed sample support platform 1 has a U-shaped hole 13, which is fixed to the main support platform 6 by a nut 5 and a threaded hole 24 on the main support platform 6. The other side of the fixed sample support platform 1 has a slide rail 12, which makes movable contact with the movable sample support platform 2. The fixed sample support platform 1 has a square groove 11. The movable sample support stage 2 has a square groove 11 on its other side and a U-shaped contact structure 27 on its other side. The movable sample support stage 2 is assembled on the main support stage 6 via a slide rail 12 and a guide rail 15. The bottom of the U-shaped contact structure 27 on the movable sample support stage 2 contacts the bottom of the spring 7. The piezoelectric ceramic actuator 4 is assembled in the central through hole 20 on the sample rod body 3. After the above parts are assembled, the distance between the square groove 11 on the fixed sample support stage 1 and the movable sample support stage 2 is adjusted according to the length of the sample needle 21 on the test sample assembly 8. Then, the fixed sample support stage 1 is fixed on the main support stage 6. The sample needle 21 on the test sample assembly 8 is then welded to the square groove 11 on the fixed sample support stage 1 and the movable sample support stage 2 respectively by low temperature alloy welding. The power amplifier 10 sends an electrical signal to the piezoelectric ceramic actuator 4 to produce a micron-level displacement. This displacement is transmitted to the test sample assembly 8 through the movable sample support stage 2, thereby realizing the dynamic stretching of the sample 22.

[0035] As attached Figure 1The diagram shown is an assembly of the main structure of the observation device for dynamic stretching of samples under a transmission electron microscope, which is involved in this application. It includes, in sequence, a sample rod 3, a power amplifier 10, a main support stage 6, a fixed sample support stage 1, a movable sample support stage 2, a piezoelectric ceramic actuator 4, a spring 7, and a test sample assembly 8.

[0036] As attached Figure 2 The image shown is a general thumbnail of the observation apparatus for dynamic stretching of samples under a transmission electron microscope, as described in this application.

[0037] As attached Figure 3 The diagram shown is of the parts for fixing the sample support stage 1.

[0038] As attached Figure 4 The image shown is a part drawing of sample rod 3.

[0039] As attached Figure 5 The diagram shown is of the components of the main support platform 6.

[0040] As attached Figure 6 The diagram shown is a part drawing of the movable sample support stage 2.

[0041] As attached Figure 7 The image shown is a part drawing of test sample assembly 8.

[0042] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A micro-motion sample rod for dynamic tensile testing using transmission electron microscopy; characterized in that, include: Sample rod body (3), power amplifier (10), main support platform (6), fixed sample support platform (1), movable sample support platform (2), piezoelectric ceramic actuator (4), spring (7), test sample assembly (8).

2. The fixed sample support stage (1) according to claim 1, characterized in that: A square groove (11) is provided at its central axis position and slide rails (12) are provided on both sides thereon.

3. The movable sample support stage (2) according to claim 1, characterized in that: A square groove (11) is provided at its central axis position.

4. The fixed sample support stage (1) according to claim 1, characterized in that: A U-shaped hole (13) is provided at the other end of the square groove (11), and the mounting nut (5) is mounted and fixed on the threaded hole (24) on the main support platform (6) through the U-shaped hole (13).

5. The movable sample support stage (2) according to claim 1, characterized in that: A U-shaped contact structure (27) is provided on the other side of the square groove (11), which directly contacts the head of the piezoelectric ceramic actuator (4).

6. The test sample assembly (8) according to claim 1, characterized in that: Includes sample needle (21) and sample (22).

7. The main support platform (6) according to claim 1, characterized in that: Set a round hole (17) and assemble the nut (5) through the round hole (17) to fix it on the threaded hole (23) of the sample rod body (3).

8. The main support platform (6) according to claim 1, characterized in that: Guide rails (15) and an L-shaped structure (18) are provided on both sides of the round hole (17), and a U-shaped through hole (16) is provided on the thinner side.

9. The sample rod body (3) according to claim 1, characterized in that: The head has guide rails (14) on both sides of the central axis, as well as a convex structure (19) and a through hole (20) in the center of the rod.

10. The convex-shaped structure (19) according to claim 10 and the L-shaped structure (18) according to claim 9 are combined after the main support platform (6) and the sample rod body (3) are assembled to form a rectangular groove for placing the spring (7).

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