Probe assembly and test equipment

Abstract

The invention relates to the technical field of PCB testing, and discloses a probe assembly and testing equipment, and the probe assembly comprises at least two probes; the grounding assembly comprises a supporting piece and a short-circuit piece, the supporting piece is fixedly connected with one probe, the short-circuit piece is suitable for abutting against the multiple probes at the same time, the short-circuit piece is movably and fixedly connected with the supporting piece, an elastic piece is further arranged between the short-circuit piece and the supporting piece, and the elastic piece is suitable for being connected with the short-circuit piece when the pressure between the short-circuit piece and the probes is reduced. And the short-circuit piece is driven to move towards the direction close to the probe, so that the short-circuit piece and the probe are kept abutting against each other. According to the probe assembly provided by the invention, the elastic piece is arranged between the short-circuit piece and the supporting piece, so that when the probe tends to be away from the short-circuit piece, the short-circuit piece is driven by the elastic piece to move towards the direction close to the probe, and therefore, stable contact between the short-circuit piece and the probe is ensured; therefore, the test result is prevented from being influenced by unstable contact between the short-circuit piece and the probe.

Description

Technical Field

[0001] This invention relates to the field of PCB board testing technology, specifically to a probe assembly and testing equipment. Background Technology

[0002] Currently, most PCB manufacturers still rely on manual testing of the impedance characteristics of PCB traces, specifically the COUPON test for impedance traces designed at the board edge. This manual testing method is inefficient, has low alignment accuracy, and produces unstable results. Furthermore, the impedance values ​​of the internal circuitry deviate significantly from those of the COUPON strips. For high-end PCBs, impedance testing of the internal circuitry is required, making this edge-based method unsuitable. An impedance testing machine can be used to test both the COUPON and internal circuitry impedances. However, impedance testing machines require grounding during operation, and the unstable contact between the probe and the grounding block as the probe moves can affect the impedance test results. Summary of the Invention

[0003] In view of this, the present invention provides a probe assembly and a testing device to solve the problem that the contact between the probe and the grounding block is unstable during the movement of the probe in the impedance tester, which affects the impedance test.

[0004] In a first aspect, the present invention provides a probe assembly, comprising:

[0005] At least two probes;

[0006] A grounding assembly includes a support and a shorting member. The support is fixedly connected to one of the probes, and the shorting member is adapted to simultaneously abut against multiple probes. The shorting member is movably fixedly connected to the support. An elastic member is also provided between the shorting member and the support. The elastic member is adapted to move the shorting member toward the probe when the pressure between the shorting member and the probe decreases, so that the shorting member and the probe remain in contact.

[0007] Beneficial effects: By setting an elastic element between the shorting element and the support element, when the probe tends to move away from the shorting element, the shorting element is driven by the elastic element to move towards the probe, thereby ensuring stable contact between the shorting element and the probe, and thus avoiding unstable contact between the shorting element and the probe that would affect the test results.

[0008] In one alternative embodiment, a spring is connected between the shorting member and the support member, and the spring is adapted to move the shorting member toward the direction of the probe.

[0009] In one optional implementation, the arrangement direction of the plurality of probes is defined as a first direction, the shorting member extends along the first direction, and the two ends of the shorting member along its extension direction are respectively provided with first mounting holes. The grounding assembly also includes an adjusting screw, which passes through the first mounting hole and is threadedly connected to the support member, and a spring is sleeved on the adjusting screw.

[0010] Beneficial effect: The adjusting screw passes through the first mounting hole and the spring and connects with the support, thereby allowing the shorting part to move on the adjusting screw, which helps to improve the stability of the shorting part's movement under the action of the spring.

[0011] In one alternative embodiment, the first mounting hole located at at least one end of the shorting member along its extension direction is configured as a strip hole, the length direction of the strip hole being parallel to the length direction of the shorting member, and the length of the strip hole including 3 mm; along the radial direction of the adjusting screw, the gap between the inner wall of the first mounting hole and the adjusting screw including 0.1 mm.

[0012] Beneficial effects: By constructing the first mounting hole at at least one end of the shorting member into a strip-shaped hole, space is provided for the shorting member to tilt under the pressure of the probe; and by limiting the gap between the inner wall of the first mounting hole and the adjusting screw, the relative positions of the spring and the shorting member are prevented from being misaligned, which would result in uneven force exerted on the shorting member by multiple springs, and thus unstable contact between the shorting member and the probe.

[0013] In one alternative embodiment, the support member is provided with a set screw at the position corresponding to the adjusting screw, and the set screw is adapted to abut against the adjusting screw.

[0014] Beneficial effects: By setting a set screw to tighten the adjusting screw after it is installed in place, the unexpected loosening of the adjusting screw during the use of the probe assembly is prevented, which helps to improve the stability of the probe assembly.

[0015] In one alternative implementation, the jumper includes a brass jumper.

[0016] In one alternative embodiment, the shorting member is provided with a nickel coating, the thickness of which includes 2.5 μm;

[0017] And / or, the shorting connector is provided with a gold coating, the thickness of which includes 2 μm.

[0018] In one optional embodiment, the probe assembly further includes a probe holder fixedly connected to the probe; the grounding assembly further includes a fixing member fixedly connected to the support member, the fixing member having a second mounting hole, the fixing member being fixedly connected to the probe holder by a fastening bolt passing through the second mounting hole, the second mounting hole including an oblong hole.

[0019] Beneficial effect: By constructing the second mounting hole as an oblong hole, it is easy to adjust the relative position of the fastener on the probe seat as needed.

[0020] In one alternative implementation, the probe holder includes a PEek probe holder (polyetheretherketone probe holder).

[0021] Beneficial effects: By using PEEK material to make the probe holder, the radio frequency signal is grounded and isolated from the structure supporting the probe holder, avoiding radio frequency signal crosstalk, thereby improving the stability of the test waveform and improving the test accuracy.

[0022] Secondly, the present invention also provides a testing device, including the probe assembly described above.

[0023] Since the testing equipment includes a probe assembly, it has the same effect as the probe assembly, and its beneficial effects will not be elaborated here. Attached Figure Description

[0024] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0025] Figure 1 This is a three-dimensional schematic diagram of the probe assembly of the present invention. Figure 1 ;

[0026] Figure 2 This is a three-dimensional schematic diagram of the probe assembly of the present invention. Figure 2 ;

[0027] Figure 3 This is a front view of the probe assembly of the present invention;

[0028] Figure 4 This is a side view of the probe assembly of the present invention;

[0029] Figure 5 This is a three-dimensional schematic diagram of the grounding component of the present invention;

[0030] Figure 6 This is a side view of the grounding component of the present invention;

[0031] Figure 7 This is a front view of the grounding component of the present invention;

[0032] Figure 8 This is a three-dimensional view of the shorting connector of the present invention.

[0033] Explanation of reference numerals in the attached figures:

[0034] 11. Probe holder; 111. Mounting slot; 12. Probe; 2. Grounding assembly; 21. Fixing member; 211. Second mounting hole; 22. Reinforcing member; 23. Connecting member; 24. Support member; 25. Adjusting screw; 26. Spring; 27. Set screw; 28. Shorting member; 281. First mounting hole. Detailed Implementation

[0035] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0036] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0037] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0038] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0039] The following is combined Figures 1 to 8 The following describes embodiments of the present invention.

[0040] According to an embodiment of the present invention, in one aspect, a probe assembly is provided, comprising:

[0041] At least two probes 12;

[0042] The grounding assembly 2 includes a support member 24 and a shorting member 28. The support member 24 is fixedly connected to one of the probes 12. The shorting member 28 is adapted to simultaneously abut against multiple probes 12. The shorting member 28 is movably fixedly connected to the support member 24. An elastic member is also provided between the shorting member 28 and the support member 24. The elastic member is adapted to move the shorting member 28 toward the probe 12 when the pressure between the shorting member 28 and the probe 12 decreases, so that the shorting member 28 and the probe 12 remain in contact.

[0043] The probe assembly provided in this embodiment provides an elastic element between the shorting member 28 and the support member 24. This allows the shorting member 28 to move towards the probe 12 under the action of the elastic element when the probe 12 tends to move away from the shorting member 28. This ensures stable contact between the shorting member 28 and the probe 12, thereby preventing unstable contact between the shorting member 28 and the probe 12 from affecting the test results.

[0044] Specifically, during the testing of the device under test (e.g., during impedance testing of a PCB board), the spacing between the multiple probes 12 varies. Before testing, the jumper 28 is in tangential contact with the sidewall of the probe 12, at which point there is pressure between the jumper 28 and the probe 12. However, during the movement of the probe 12, it may move away from the jumper 28, resulting in unstable contact between the probe 12 and the jumper 28, which in turn affects the test results. The probe assembly provided in this embodiment uses an elastic element between the shorting member 28 and the support member 24. This elastic element causes the shorting member 28 to abut against the probe 12. When the pressure between the shorting member 28 and the probe 12 decreases, the shorting member 28 moves closer to the probe 12, ensuring contact between them. Conversely, when the pressure between the shorting member 28 and the probe 12 increases, the shorting member 28 moves away from the probe 12, preventing excessive pressure that could damage the probe 12 and / or the shorting member 28. The shorting member 28 includes a shorting tab, a shorting rod, a shorting plate, and a shorting block; the support member 24 includes a support rod, a support plate, and a support block; and the elastic element includes rubber and a spring.

[0045] The shorting member 28 is mounted on the support member 24 via an elastic element, so that the elastic element can automatically compensate according to the pressure between the shorting member 28 and the probe 12, thereby keeping the pressure between the shorting member 28 and the probe 12 basically consistent. Without an elastic element, i.e., the short connector 28 is fixedly connected to the support 24, when the probe 12 moves toward or away from the short connector 28, the pressure change between the probe 12 and the short connector 28 per unit time is large because the relative position between the short connector 28 and the support 24 is fixed. However, by providing an elastic element, the short connector 28 can be stretched or compressed, causing it to move a certain distance toward the probe 12 when the pressure between it and the probe 12 changes. This reduces the pressure change between the probe 12 and the short connector 28 per unit time. Furthermore, since the displacement of the probe 12 in the direction away from or toward the short connector 28 is small, the stretching or compression of the elastic element is also small. Therefore, the pressure change between the short connector 28 and the probe 12 is smaller, thus keeping the pressure between the short connector 28 and the probe 12 basically consistent.

[0046] In some embodiments, combined with Figures 1 to 8 As shown, a spring 26 is connected between the shorting member 28 and the support member 24. The spring 26 is adapted to drive the shorting member 28 to move toward the probe 12.

[0047] Specifically, the elastic element is constructed as a spring 26. In one possible embodiment, the shorting member 28 is positioned on the side of the probe 12 closest to the support member 24. In this case, the spring 26 is compressed, with one end fixedly connected to the support member 24 and the other end fixedly connected to or abutting against the shorting member 28, thereby supporting and abutting the shorting member 28 against the probe 12 via the spring 26. In an additional embodiment, the shorting member 28 is positioned on the side of the probe 12 furthest from the support member 24. In this case, the spring 26 is stretched, with one end fixedly connected to the support member 24 and the other end fixedly connected to the shorting member 28, thereby keeping the shorting member 28 abutting against the probe 12.

[0048] In some embodiments, combined with Figures 1 to 8 As shown, the arrangement direction of multiple probes 12 is defined as the first direction. The shorting member 28 extends along the first direction. The two ends of the shorting member 28 along its extension direction are respectively provided with first mounting holes 281. The grounding component 2 also includes an adjusting screw 25. The adjusting screw 25 passes through the first mounting hole 281 and is threadedly connected to the support member 24. The spring 26 is sleeved on the adjusting screw 25.

[0049] The probe assembly provided in this embodiment has an adjusting screw 25 that passes through the first mounting hole 281 and the spring 26 and is connected to the support member 24, thereby allowing the shorting member 28 to move on the adjusting screw 25, which helps to improve the stability of the shorting member 28 under the action of the spring 26.

[0050] Specifically, the shorting member 28 extends along a first direction so that its side along the extension direction abuts against the probe 12. The adjusting screw 25 passes through the first mounting hole 281 and is threadedly connected to the support member 24 via the spring 26, facilitating movement of the shorting member 28 toward or away from the support member 24 via the adjusting screw 25, thereby improving the stability of movement of the shorting member 28, spring 26, and support member 24. As a possible implementation, the shorting member 28 is positioned on the side of the probe 12 facing the support member 24 and connected to the support member 24 via the spring 26 and adjusting screw 25, with the spring 26 in a compressed state. Before testing, the relative position of the shorting member 28 and the support member 24 is adjusted by rotating the adjusting screw 25, thereby ensuring tangential contact between the shorting member 28 and the probe 12 and maintaining a certain positive pressure.

[0051] In some embodiments, combined with Figures 1 to 8 As shown, the first mounting hole 281 located at at least one end of the shorting member 28 along its extension direction is constructed as a strip hole, the length direction of the strip hole is parallel to the length direction of the shorting member 28, and the length of the strip hole includes 3 mm; along the radial direction of the adjusting screw 25, the gap between the inner wall of the first mounting hole 281 and the adjusting screw 25 includes 0.1 mm.

[0052] The probe assembly provided in this embodiment constructs a strip-shaped hole for the first mounting hole 281 located at at least one end of the shorting member 28 to provide reserved space for the shorting member 28 to tilt under the pressure of the probe 12; and by limiting the gap between the inner wall of the first mounting hole 281 and the adjusting screw 25, it avoids misalignment between the relative positions of the spring 26 and the shorting member 28, which would result in uneven force exerted on the shorting member 28 by the multiple springs 26, thereby making the contact between the shorting member 28 and the probe 12 unstable.

[0053] Specifically, when the pressure between the probe 12 and the shorting member 28 changes, the shorting member 28 will tilt at a certain angle under the abutment of the probe 12. At this time, the spacing between the two ends of the shorting member 28 changes along the first direction, while the spacing between the two adjusting screws 25 remains unchanged. Therefore, by constructing the first mounting hole 281 at at least one end of the shorting member 28 as a strip-shaped hole, and the length direction of the strip-shaped hole is parallel to the length direction of the shorting member 28 (i.e., the extension direction of the shorting member 28), space is reserved for the tilting of the shorting member 28. The length of the strip-shaped hole includes 2mm to 4mm, and preferably, the length of the strip-shaped hole is 3mm. The strip-shaped hole includes an oblong hole, a rectangular hole, and an elliptical hole. Along the radial direction of the adjusting screw 25 and perpendicular to the first direction, the gap between the first mounting hole 281 and the adjusting screw 25 includes 0.05mm to 0.2mm. Preferably, this gap is constructed to be 0.1mm, thereby preventing the end of the spring 26 near the shorting member 28 from passing through this gap or even into the other side of the shorting member 28 when the spring 26 is in a compressed state. This would cause the relative position of the spring 26 and the shorting member 28 to be misaligned, resulting in uneven force exerted on the shorting member 28 by the multiple springs 26, and thus unstable contact between the shorting member 28 and the probe 12.

[0054] In some embodiments, combined with Figures 1 to 8 As shown, the support member 24 is provided with a set screw 27 at the position corresponding to the adjusting screw 25, and the set screw 27 is adapted to abut against the adjusting screw 25.

[0055] The probe assembly provided in this embodiment uses a set screw 27 to tighten the adjusting screw 25 after it is installed in place, which can prevent the adjusting screw 25 from loosening unexpectedly during the use of the probe assembly and improve the stability of the probe assembly.

[0056] Specifically, the support member 24 is provided with at least one set screw 27 corresponding to the position of each adjusting screw 25. After the adjusting screw 25 is adjusted into place, the set screw 27 is tightened so that the set screw 27 presses against the adjusting screw 25 to prevent the adjusting screw 25 from loosening.

[0057] In some embodiments, combined with Figures 1 to 8 As shown, the jumper 28 includes a brass jumper.

[0058] Specifically, the shorting connector 28 is made of an alloy or metal such as brass, and preferably, the shorting connector 28 is made of C3064 material.

[0059] In some embodiments, combined with Figures 1 to 8 As shown, the shorting connector 28 is provided with a nickel coating, the thickness of which includes 2.5 μm;

[0060] And / or, the shorting connector 28 is provided with a gold coating, the thickness of which includes 2 μm.

[0061] Specifically, the shorting connector 28 adopts a gold-plated surface treatment process, wherein the thickness of the nickel coating ranges from 1μm to 4μm, and preferably, the thickness of the nickel coating is set to 2.5μm; the thickness of the gold coating ranges from 1μm to 3μm, and preferably, the thickness of the gold coating is set to 2μm.

[0062] In some embodiments, combined with Figures 1 to 8 As shown, the probe assembly also includes a probe base 11 fixedly connected to the probe 12; the grounding assembly 2 also includes a fixing member 21 fixedly connected to the support member 24. The fixing member 21 has a second mounting hole 211. The fixing member 21 is fixedly connected to the probe base 11 by a fastening bolt passing through the second mounting hole 211. The second mounting hole 211 includes a waist-shaped hole.

[0063] The probe assembly provided in this embodiment constructs the second mounting hole 211 as an oblong hole to facilitate adjustment of the relative position of the fixing member 21 on the probe holder 11 as needed.

[0064] Specifically, the probe holder 11 has a mounting groove 111, and the probe 12 is fixedly installed in the mounting groove 111. The probe holder 11 has a threaded hole, and the fixing member 21 is fixedly connected to the probe holder 11 by fastening bolts passing through the second mounting hole 211 and the threaded hole. The fixing member 21 includes a fixing plate and a fixing rod. The second mounting hole 211 includes a slotted hole, a rectangular hole, and an elliptical hole to facilitate adjustment of the relative position of the fixing member 21 on the probe holder 11 as needed. A connecting member 23 is fixedly connected between the fixing member 21 and the support member 24. The connecting member 23 includes a connecting rod and a connecting plate. One end of the connecting member 23 is fixedly connected to the fixing member 21, and the other end is fixedly connected to the support member 24. Additionally, at least one reinforcing member 22 is provided at the connection between the connector 23 and the fixing member 21. One side of the reinforcing member 22 is fixedly connected to the fixing member 21, and the other side is fixedly connected to the connector 23, thereby enhancing the connection stability between the fixing member 21 and the connector 23. The reinforcing member 22 includes a reinforcing rod and a reinforcing plate.

[0065] In some embodiments, combined with Figures 1 to 8 As shown, probe holder 11 includes a PEek probe holder (polyetheretherketone probe holder).

[0066] The probe assembly provided in this embodiment uses PEEK material to make the probe holder 11, thereby isolating the radio frequency signal from the structure supporting and fixing the probe holder 11, avoiding radio frequency signal crosstalk, and thus improving the stability of the test waveform and improving the test accuracy.

[0067] Specifically, the probe holder 11 is made of plastic. Preferably, the probe holder 11 is made of PEEK material to isolate the radio frequency signal from the ground, thereby improving the stability of the test waveform and increasing the test accuracy, and avoiding the problem of large deviation between the maximum and minimum values ​​of the test waveform.

[0068] According to an embodiment of the present invention, another aspect provides a testing device, including the probe assembly described above.

[0069] Specifically, the testing equipment, such as an impedance tester for testing the impedance of a PCB board, uses the aforementioned probe assembly, which can reduce the impact of grounding instability on the impedance test waveform and improve the stability of the impedance test waveform.

[0070] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Although embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and all such modifications and variations fall within the scope defined by the present invention.

Claims

1. A probe assembly, characterized in that, include: At least two probes (12); The grounding assembly (2) includes a support member (24) and a shorting member (28). The support member (24) is fixedly connected to one of the probes (12). The shorting member (28) is adapted to simultaneously abut against multiple probes (12). The shorting member (28) is movably fixedly connected to the support member (24). An elastic member is also provided between the shorting member (28) and the support member (24). The elastic member is adapted to move the shorting member (28) toward the probe (12) when the pressure between the shorting member (28) and the probe (12) decreases, so that the shorting member (28) and the probe (12) remain in contact.

2. The probe assembly according to claim 1, characterized in that, A spring (26) is connected between the short connector (28) and the support member (24), and the spring (26) is adapted to drive the short connector (28) to move toward the probe (12).

3. The probe assembly according to claim 2, characterized in that, The arrangement direction of the plurality of probes (12) is defined as the first direction. The shorting member (28) extends along the first direction. The shorting member (28) has first mounting holes (281) at both ends along its extension direction. The grounding assembly (2) also includes an adjusting screw (25). The adjusting screw (25) passes through the first mounting hole (281) and is threadedly connected to the support member (24). The spring (26) is sleeved on the adjusting screw (25).

4. The probe assembly according to claim 3, characterized in that, The first mounting hole (281) located at at least one end of the short connector (28) along its extension direction is constructed as a strip hole, the length direction of the strip hole is parallel to the length direction of the short connector (28), and the length of the strip hole includes 3 mm; along the radial direction of the adjusting screw (25), the gap between the inner wall of the first mounting hole (281) and the adjusting screw (25) includes 0.1 mm.

5. The probe assembly according to claim 3, characterized in that, The support member (24) is provided with a set screw (27) corresponding to the position of the adjusting screw (25), and the set screw (27) is adapted to abut against the adjusting screw (25).

6. The probe assembly according to claim 1, characterized in that, The jumper (28) includes a brass jumper.

7. The probe assembly according to claim 1, characterized in that, The short connector (28) is provided with a nickel coating, the thickness of which includes 2.5 μm; And / or, the shorting member (28) is provided with a gold coating, the thickness of which includes 2 μm.

8. The probe assembly according to any one of claims 1 to 7, characterized in that, The probe assembly further includes a probe base (11) fixedly connected to the probe (12); the grounding assembly (2) further includes a fixing member (21) fixedly connected to the support member (24), the fixing member (21) having a second mounting hole (211), the fixing member (21) being fixedly connected to the probe base (11) by a fastening bolt passing through the second mounting hole (211), the second mounting hole (211) including a waist-shaped hole.

9. The probe assembly according to claim 8, characterized in that, The probe holder (11) includes a PEek probe holder (polyetheretherketone probe holder).

10. A testing device, characterized in that, include: The probe assembly according to any one of claims 1 to 9.

Images