Chip test tool

Abstract

The invention relates to the technical field of chip testing, and discloses a chip testing tool which comprises a testing table and a conveying mechanism, the upper surface and the lower surface of the testing table are in threaded connection with a connecting base and an air guiding table respectively, a testing component is arranged between the testing table and the connecting base, and an air closing component is arranged between the connecting base and the conveying mechanism. The air closing component body is formed by combining a movable half pipe and a positioning half pipe, when the movable half pipe and the positioning half pipe are in butt joint, the movable half pipe and the positioning half pipe synchronously press and abut against the connecting base, in the pressing process, sealing of a chip is directly completed, the chip is made to be located in a locally-sealed space, and after the movable half pipe and the positioning half pipe are in butt joint with the testing component, a flowing testing space is formed. The space is filled with flowing nitrogen and air is exhausted, so that the test chip is completely in an environment surrounded by inert gas, the test of the chip is stably guaranteed, and the condition of discharge caused by the pressure difference between the positive electrode and the negative electrode is avoided.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, specifically to a chip testing fixture. Background Technology

[0002] In high-voltage testing, the voltage difference between the two poles of the chip under test is extremely large. In normal environments, discharge is likely to occur, which can lead to chip breakdown and damage to the chip under test. To address this, a chip testing fixture is proposed. Summary of the Invention

[0003] To address the shortcomings of existing technologies, this invention provides a chip testing fixture that offers the advantage of providing a stable testing environment and solves the problem of discharge during testing in conventional environments.

[0004] To achieve the above objectives, the present invention provides the following technical solution: a chip testing fixture, comprising a testing stage and a conveying mechanism. A connecting seat and a gas guide platform are screwed onto the upper and lower surfaces of the testing stage, respectively. Openings penetrating the upper and lower surfaces of the testing stage and the connecting seat are provided, with the bottom of the openings communicating with the gas guide platform. A testing component is disposed within the openings. A movable cover is provided at the end of the top opening of the connecting seat, and the end of the movable cover retracts inward. An air-sealing component is disposed between the connecting seat and the conveying mechanism. The air-sealing component is mainly composed of a movable half-tube and a positioning half-tube, wherein the movable half-tube and the positioning half-tube are aligned... Upon connection, the chip simultaneously abuts against the movable cover at the top of the connector, thereby forming an airflow channel between the chip and the test bench and the connector. The chip is tested using a pipeline method, and is transported to the test station by a conveyor mechanism. The chip is pressed down onto the test component. During the pressing process, the chip is directly sealed, placing it in a locally sealed space. After docking with the test component, a flowing test space is formed. By injecting flowing nitrogen into this space and expelling the air, the test chip is completely surrounded by an inert gas environment, ensuring stable chip testing and preventing discharge due to the voltage difference between the positive and negative electrodes.

[0005] Preferably, the tubular flow channel is composed of a movable half-tube and several positioning half-tubes respectively. The movable half-tube is connected to a pneumatic push rod and is driven to move vertically up and down by the pneumatic push rod. The several positioning half-tubes are evenly installed on the conveying mechanism. Through the rotation of the conveying mechanism, they intervene in the vertical movement path of the movable half-tube and, through contact with the movable half-tube, also move down synchronously to abut against the connecting seat, forming a sealed test space, providing a limited space for subsequent nitrogen filling and nitrogen recovery.

[0006] Preferably, the bottom of the positioning half-tube is provided with a support frame for carrying the test chip, and the bottom of the movable half-tube is provided with a pressure cap. During the vertical descent of the movable half-tube, the pressure cap engages with the support frame and presses down on the test chip to prevent the chip from detaching from the test component due to the blowing of flowing nitrogen gas during the test.

[0007] Preferably, an air hood is provided above the pressure cap. The air hood is in the shape of an inverted bucket and is connected to the positioning half-pipe. The edge of the air hood is completely attached to the inner wall of the positioning half-pipe. The inverted bucket-shaped air hood can centrally recover the flowing nitrogen gas, which is convenient for secondary use.

[0008] Preferably, the connecting seat includes an airtight platform with an airtight cavity that mates with the opening of the test platform below. The test component is located in the airtight cavity, providing a limited space for testing the test component and preventing nitrogen gas from entering and escaping.

[0009] Preferably, a hoop extends upward from the airtight cavity, and the movable cover is located in the middle of the hoop. The top of the movable cover has an interface for docking with the movable half-pipe and the positioning half-pipe. When nitrogen is injected, the movable cover is pushed upward, which facilitates the restriction of the pipeline formed by the movable half-pipe and the positioning half-pipe.

[0010] Preferably, the movable cover slides up and down within the hoop, and the top of the hoop retracts inward to limit the sliding path of the movable cover and prevent it from falling off.

[0011] Preferably, the test component is composed of several spring pieces, an insulating partition is installed on the outside of the spring pieces, the main body of the spring piece is a positioning strip, the top of which is provided with a contact pin that docks with the chip, and the bottom of which is provided with a pin that docks with the test circuit board, and a curved strip is provided between the positioning strip and the contact pin.

[0012] Preferably, the curved strip has a certain degree of elasticity, which provides support for the elastic contraction of the stylus, allowing the stylus to move only up and down. When the stylus receives pressure from the chip, it sinks down. Its vertical sinking ensures docking with the chip and avoids lateral sliding, which could scratch the chip.

[0013] Compared with the prior art, the present invention provides a chip testing fixture, which has the following beneficial effects: 1. The chip is tested using a pipeline. It is transported to the test station by a conveyor mechanism and pressed down onto the test component. During the pressing process, the chip is directly sealed, placing it in a locally sealed space. After docking with the test component, a flow test space is formed. By injecting flowing nitrogen into this space and expelling the air, the test chip is completely surrounded by an inert gas environment, ensuring stable chip testing and preventing discharge due to the voltage difference between the positive and negative electrodes. 2. The resulting flow test space allows for targeted recovery of flowing nitrogen after air is exhausted. The nitrogen can be purified and reused. The recovered nitrogen has a high concentration and can be reused, which effectively reduces costs compared to conventional nitrogen preparation. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the overall appearance structure of a chip testing fixture according to the present invention; Figure 2 This is a schematic diagram of the structure of a chip testing fixture test bench according to the present invention; Figure 3 This is a schematic diagram of the external structure of a chip testing fixture connector according to the present invention; Figure 4 This is a schematic diagram of the internal structure of a chip testing fixture connector according to the present invention; Figure 5 This is a schematic diagram of the structure of a chip testing fixture test component according to the present invention; Figure 6 This is a schematic diagram of the air-sealing component of a chip testing fixture according to the present invention; Figure 7 This is a schematic diagram of the working structure of the air-sealing component of a chip testing fixture according to the present invention; Figure 8 This is a schematic diagram of the separation structure of the air-sealing component of a chip testing fixture according to the present invention.

[0015] In the picture: 1. Test bench; 11. Test circuit board; 12. Base plate; 2. Connecting seat; 21. Airtight platform; 22. Hoop ring; 23. Movable cover; 24. Airtight cavity; 25. Sealing ring; 3. Air guide platform; 4. Conveying mechanism; 5. Air-tight components; 51. Pneumatic push rod; 52. Movable half-tube; 53. Positioning half-tube; 54. Air hood; 55. Pressure cap; 56. Support frame; 57. Guide plug; 6. Test components; 61. Insulating partition; 62. Spring; 621. Stylus; 622. Curved bar; 623. Positioning bar; 624. Pin; 63. Ceramic rod. Detailed Implementation

[0016] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0017] As described in the background section, there are shortcomings in the existing technology. In order to solve the above-mentioned technical problems, this application proposes a chip testing fixture.

[0018] In a typical implementation of a chip testing fixture according to this application, such as Figure 1-8 As shown, a chip testing fixture includes a test platform 1 and a conveying mechanism 4. A connecting seat 2 and a gas guide platform 3 are screwed onto the upper and lower surfaces of the test platform 1, respectively. An opening is provided on the test platform 1 and the connecting seat 2, which are connected vertically. The bottom of the opening is connected to the gas guide platform 3, and a test component 6 is provided inside the opening. A movable cover 23 is provided at the end of the top opening of the connecting seat 2. The end of the movable cover 23 retracts inward and has a gas-binding function. An air-sealing component 5 is provided between the connecting seat 2 and the conveying mechanism 4. The main body of the air-sealing component 5 is composed of a movable half-tube 52 and a positioning half-tube 53. When the movable half-tube 52 and the positioning half-tube 53 are connected, they simultaneously abut against the movable cover 23 at the top of the connecting seat 2, thereby forming an airflow channel between the test platform 1 and the opening on the connecting seat 2.

[0019] One end of the gas guide platform 3 is connected to an external nitrogen source. Nitrogen is introduced into the formed airflow channel to provide a nitrogen-filled test space for chip testing. This reduces the probability of discharge due to the difference in high and low pressure between the positive and negative electrodes during chip testing. During the nitrogen introduction process, the nitrogen flow first rushes into the openings on the test platform 1 and the connecting seat 2, completely enclosing the test component 6 inside the opening. During this process, nitrogen is continuously injected into the opening. As the nitrogen pressure inside the opening gradually increases, the mixed air inside the opening is squeezed out from the contraction port at the end of the movable cover 23. By setting the movable cover 23 with a contraction at the end, the airflow discharge speed can be limited, allowing the nitrogen to more fully fill the entire space inside the opening, so as to completely discharge the mixed air inside the opening and further reduce the probability of discharge.

[0020] For further details, please refer to [link / reference]. Figure 2 as well as Figures 6 to 8 As shown, the air-sealing component 5 consists of a movable half-tube 52 fixed on the test bench 1 and a positioning half-tube 53 installed on the conveying mechanism 4. The movable half-tube 52 is connected to a pneumatic push rod 51, and the path setting for its vertical movement is completed by the drive of the pneumatic push rod 51. The positioning half-tube 53 is provided in several groups. Through the rotation of the conveying mechanism 4, it intervenes in the vertical movement path of the movable half-tube 52, and through contact with the movable half-tube 52, it also moves down synchronously to abut against the connecting seat 2 by utilizing the downward pressure of the movable half-tube 52, so as to form a complete tubular airflow channel to provide space for chip testing. The bottom of the positioning half tube 53 is provided with a support frame 56 for carrying the test chip, and the bottom of the movable half tube 52 is provided with a pressure cap 55. During the vertical descent of the movable half tube 52, the pressure cap 55 completes the sealing of the support frame 56 to press the chip it carries, ensuring stable docking between the chip and the test component 6 in the connector 2 and preventing loosening.

[0021] In addition, an air hood 54 is provided above the pressure cap 55 inside the movable half tube 52. The air hood 54 is in the shape of an inverted bucket. When the movable half tube 52 and the positioning half tube 53 are connected to form an airflow channel, the air hood 54 completely seals the airflow channel. When nitrogen is introduced into the gas guide platform 3, the nitrogen flows and covers the chip. By restricting the airflow channel, the flow rate of nitrogen flowing out can be reduced, which can ensure the stable maintenance of nitrogen concentration during chip testing.

[0022] Meanwhile, the tail end of the gas hood 54 is equipped with a recovery pipe, which can directionally recover the high-concentration nitrogen gas flowing out. This nitrogen gas can be purified and reused. The recovered high-concentration nitrogen gas can be re-purified, which can effectively reduce costs compared to conventional nitrogen preparation.

[0023] For further details, please refer to [link / reference]. Figure 3 and Figure 4 As shown, the connecting seat 2 includes an airtight platform 21. An airtight cavity 24 is provided in the airtight platform 21 to mate with the opening of the test platform 1 below. A sealing ring 25 is provided at the bottom of the airtight cavity 24 to ensure the airtightness when sealing with the test platform 1. The test component 6 is located in the airtight cavity 24. A hoop 22 extends upward from the airtight cavity 24. The movable cover 23 is located in the middle of the hoop 22. The top of the movable cover 23 is provided with an interface to mate with the movable half tube 52 and the positioning half tube 53. After the movable half tube 52 and the positioning half tube 53 are mated, they are inserted into the interface to complete the airtight connection with the opening.

[0024] The movable cover 23 slides up and down within the hoop 22. The top of the hoop 22 retracts inward to limit the sliding path of the movable cover 23, preventing it from detaching from the connecting seat 2 when sliding outward. The diameter of the opening at the top of the movable cover 23 is smaller than its inner wall diameter. When nitrogen is introduced into the airtight cavity 24 via the gas guide platform 3, the increased internal pressure of the airtight cavity 24 gradually pushes the movable cover 23 outward. During this pushing-out process, air is expelled from the airtight cavity 24 and the movable cover 23. This step limits the air expulsion speed from the airtight cavity 24 to ensure the opening remains open. The mixed air in the chamber is completely discharged, and the synchronous air-sealing component 5 sinks down and connects with the top interface of the movable cover 23. The movable cover 23 completely clamps the movable half-pipe 52 and the positioning half-pipe 53 to ensure the stability of the nitrogen concentration in the airtight cavity 24 and the airflow channel. At the same time, as the nitrogen in the airtight cavity 24 flows into the airflow channel formed by the movable half-pipe 52 and the positioning half-pipe 53, the supplementary nitrogen overflows from the gap between the movable cover 23 and the outer wall of the movable half-pipe 52 and the positioning half-pipe 53. This overflowing nitrogen isolates the external air from entering the test space to ensure stable test results.

[0025] For further details, please refer to [link / reference]. Figure 5 As shown, the test component 6 is composed of several spring pieces 62. An insulating partition 61 is installed on the outside of the spring piece 62. The main body of the spring piece 62 is a positioning strip 623. The top of the spring piece 62 is provided with a contact pin 621 that docks with the chip, and the bottom of the spring piece 623 is provided with a pin 624 that docks with the test circuit board 11. A curved strip 622 is provided between the positioning strip 623 and the contact pin 621. The curved strip 622 has a certain elasticity and provides support for the elastic contraction of the contact pin 621. At the same time, the insulating partition 61 restricts the elastic path of the contact pin 621, so that it can only move up and down. A ceramic rod 63 is provided between the spring piece 62 and the insulating partition 61 for fixed installation.

[0026] When docking with the chip, the chip and the contact pin 621 are brought into contact by the sinking of the air-sealing component 5, so that the contact pin 621 sinks vertically for testing. After the test is completed, the air-sealing component 5 rises, and the contact pin 621 rises vertically. During this process, the chip and the contact pin 621 are in complete point-to-point contact. During the transfer, no chip displacement occurs, and the contact pin 621 does not scratch the chip, which would cause chip damage.

[0027] Test procedure: The conveying mechanism 4 rotates to transport the positioning half-tube 53 carrying the test chip to the test point. Then, the pneumatic pusher 51 works to push the movable half-tube 52 down. During the descent, the movable half-tube 52 docks with the positioning half-tube 53, pushing the positioning half-tube 53 down together. Simultaneously, the pressure cover 55 rests on the support frame 56 to limit the position of the test chip. It should be noted that a guide plug 57 is provided at the connection between the positioning half-tube 53 and the conveying mechanism 4. The conveying mechanism 4 is equipped with a reset spring and a positioning rod. The positioning rod is inserted into the guide plug 57. When the positioning half-tube 53 sinks, it drives the guide plug 57 down together, allowing the reset spring to store energy.

[0028] During the descent, the movable half-tube 52 and the positioning half-tube 53 merge into a tubular shape and are inserted into the interface at the top of the movable cover 23. At this time, the chip carried on the support frame 56 connects with the contact pin 621 to form a circuit. Direct power-on testing is then performed under normal conditions. Due to the high and low voltage difference between the positive and negative terminals of the chip, discharge may occur. An external nitrogen source then supplies nitrogen to the gas guide platform 3. The nitrogen flows from the gas guide platform 3 through the notch on the test platform 1 into the airtight cavity 24 and continues to supply nitrogen to the movable half-tube 52 and the positioning half-tube 53. Nitrogen gas is introduced into the pipeline, displacing the air and maintaining its flow until the pipeline and the airtight cavity 24 are completely covered. At this point, the chip is in a nitrogen environment and can be powered on for testing. After the test is completed, the pneumatic push rod 51 drives the movable half tube 52 to reset, and at the same time, the reset spring pulls the test chip on the positioning half tube 53 and the support frame 56 to detach from the test station. Meanwhile, the conveying mechanism 4 continues to rotate, transferring the tested chip to the next step and simultaneously conveying a new chip to the test station.

[0029] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A chip testing fixture, comprising a test stage (1) and a conveying mechanism (4), characterized in that: The upper and lower surfaces of the test bench (1) are respectively screwed with a connecting seat (2) and a guide platform (3). The test bench (1) and the connecting seat (2) are provided with openings that pass through the upper and lower parts of the two. The bottom of the opening is connected to the guide platform (3), and a test component (6) is provided inside the opening. A movable cover (23) is provided at the end of the top opening of the connecting seat (2). The end of the movable cover (23) retracts inward. An air-sealing component (5) is provided between the connecting seat (2) and the conveying mechanism (4). The main body of the air-sealing component (5) is composed of a movable half tube (52) and a positioning half tube (53). When the movable half tube (52) and the positioning half tube (53) are connected, they simultaneously abut against the movable cover (23) at the top of the connecting seat (2), thereby forming an airflow channel between the test bench (1) and the connecting seat (2).

2. The chip testing fixture according to claim 1, characterized in that: The tubular flow channel is composed of a movable half tube (52) and several positioning half tubes (53). The movable half tube (52) is connected to a pneumatic push rod (51) and is driven to move vertically up and down by the pneumatic push rod (51). Several positioning half tubes (53) are evenly installed on the conveying mechanism (4). Through the rotation of the conveying mechanism (4), they intervene in the vertical movement path of the movable half tube (52) and, through contact with the movable half tube (52), also move down synchronously to abut against the connecting seat (2).

3. The chip testing fixture according to claim 2, characterized in that: The bottom of the positioning half tube (53) is provided with a support frame (56) for carrying the test chip, and the bottom of the movable half tube (52) is provided with a pressure cap (55). During the vertical downward movement of the movable half tube (52), the pressure cap (55) docks with the support frame (56).

4. The chip testing fixture according to claim 2, characterized in that: An air hood (54) is provided above the pressure cap (55). The air hood (54) is in the shape of an inverted bucket and is connected to the positioning half tube (53) on the movable half tube (52). The edge of the air hood (54) is completely attached to the inner wall of the positioning half tube (53).

5. A chip testing fixture according to claim 1, characterized in that: The connecting seat (2) includes an airtight platform (21), and an airtight cavity (24) is provided in the airtight platform (21) to connect with the notch of the test platform (1) below. The test component (6) is located in the airtight cavity (24).

6. The chip testing fixture according to claim 5, characterized in that: The airtight cavity (24) has a hoop (22) extending upwards, and the movable cover (23) is located in the middle of the hoop (22). The top of the movable cover (23) has an interface for docking with the movable half tube (52) and the positioning half tube (53).

7. A chip testing fixture according to claim 6, characterized in that: The movable cover (23) slides up and down inside the hoop (22), and the top of the hoop (22) contracts inward to limit the sliding path of the movable cover (23).

8. A chip testing fixture according to claim 1, characterized in that: The test component (6) is composed of several spring pieces (62). An insulating partition (61) is installed on the outside of the spring piece (62). The main body of the spring piece (62) is a positioning strip (623). The top of the spring piece (623) is provided with a contact pin (621) that docks with the chip, and the bottom of the spring piece (624) is provided with a pin (624) that docks with the test circuit board (11). A curved strip (622) is provided between the positioning strip (623) and the contact pin (621).

9. A chip testing fixture according to claim 8, characterized in that: The curved strip (622) has a certain elasticity, which provides support for the elastic contraction of the stylus (621), so that the stylus (621) can only move up and down.

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