Test method based on distributed power supply access unit

Abstract

According to the test method based on the distributed power supply access unit disclosed by the invention, comprehensive and accurate test is realized by combining structure test and functional test of the distributed power supply access unit; besides, when the distributed power supply access unit is qualified, the results of different functional test items are comprehensively analyzed, the attenuation remaining time is predicted, and the regular test inspection of the distributed power supply access unit is dynamically adjusted through the attenuation remaining time, so that the normal operation of the corresponding distributed power supply access unit is ensured.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power system testing, and more particularly to a test method based on a distributed power source access unit. BACKGROUND

[0002] With a large number of distributed energy (such as photovoltaic and wind power) being connected to the power grid, the reliability and performance of the distributed power source access unit (DPU) as a key interface device are crucial. The DPU is responsible for realizing plug-and-play, operation control, state monitoring of the distributed power source, and information interaction with the upper master station.

[0003] At present, the testing of the DPU is mostly focused on the verification of a single function or performance, such as a communication protocol consistency test or a simple load capacity test. These test methods cannot comprehensively evaluate the overall reliability of the device. In addition, the traditional method does not dynamically compare multiple test results, which may result in low test effectiveness and potential risks not being discovered in time. SUMMARY

[0004] In view of the above problems, the purpose of the present application is to provide a test method based on a distributed power source access unit, which comprehensively analyzes the results of different functional test items, predicts the decay remaining time, and dynamically adjusts the regular test inspection of the distributed power source access unit according to the decay remaining time, thereby achieving comprehensive and accurate testing.

[0005] The present application provides a test method based on a distributed power source access unit, comprising: Based on the preset distributed power source access unit test prompt information, the distributed power source access unit to be tested is obtained; According to the distributed power source access unit to be tested, the number corresponding to the distributed power source access unit to be tested is determined; According to the number of the distributed power source access unit to be tested, it is determined whether the corresponding distributed power source access unit to be tested is the first test. If yes, the corresponding distributed power source access unit to be tested is subjected to a structure test, and when the structure test is qualified, the corresponding distributed power source access unit to be tested is subjected to a functional test. If not, the corresponding distributed power source access unit to be tested is subjected to a functional test; The functional test results of the distributed power source access unit to be tested are obtained; When the functional test results of the distributed power source access unit to be tested are all qualified, the corresponding distributed power source access unit to be tested is qualified. The functional test at least includes data transmission channel test, power source influence test, and continuous power stability test.

[0006] In the scheme, when the to-be-tested distributed power access unit is qualified, further comprising: normalizing the functional test result of the to-be-tested distributed power access unit to obtain a normalized value of the functional test result; evaluating the to-be-tested distributed power access unit based on the normalized value of the functional test result to obtain a performance evaluation score corresponding to the to-be-tested distributed power access unit; if the to-be-tested distributed power access unit is tested for the first time, associating and storing the performance evaluation score corresponding to the to-be-tested distributed power access unit and the number of the to-be-tested distributed power access unit; if the to-be-tested distributed power access unit is not tested for the first time, extracting the performance evaluation score of the to-be-tested distributed power access unit in the last test; subtracting the performance evaluation score in the last test from the current performance evaluation score to obtain a performance evaluation score difference value; if the performance evaluation score difference value is greater than a preset first performance evaluation score difference threshold, marking the to-be-tested distributed power access unit.

[0007] In the scheme, further comprising: extracting the last test time node of the marked distributed power access unit; subtracting the last test time node from the current test time node to obtain a test time difference value; dividing the performance evaluation score difference value by the test time difference value to obtain a performance evaluation score decay rate; based on the performance evaluation score decay rate, predicting a time value when the evaluation score of the current to-be-tested distributed power access unit decays to a preset qualified evaluation score, and setting the time value as a decay remaining time; if the decay remaining time is greater than or equal to a preset detection time period, no processing is needed; if the decay remaining time is less than the preset detection time period, the corresponding decay remaining time is set as an interval time for the next test of the corresponding to-be-tested distributed power access unit.

[0008] In the scheme, the step of predicting the time value when the evaluation score of the current to-be-tested distributed power access unit decays to the preset qualified evaluation score, specifically comprises: obtaining the usage time of the current to-be-tested distributed power access unit; taking the usage time of the current to-be-tested distributed power access unit as a reference, extracting historical data in a set time range from a historical database; extracting the performance evaluation score of any one distributed power access unit in the set time range at the test time node ​Test time nodes Performance evaluation score and test time nodes Performance evaluation score ; According to the test time node Performance evaluation score and test time nodes Performance evaluation score Determine the test time point Up to the test time point The rate of decay of the performance evaluation score; Test time points Up to the test time point The performance evaluation score decay rate multiplied by the test time node By the test time point The time difference is used to obtain the test time node. By the test time point The difference in predictive performance evaluation scores; Test time points Performance evaluation score Subtract test time points By the test time point The difference in predictive performance evaluation scores is used to obtain the test time points. The predictive performance evaluation score; Test time points Performance evaluation score Subtract test time points The predictive performance evaluation score is used to obtain the test time node. The error in the predictive performance evaluation score; Iterate through all historical data within a set time range to obtain the set of prediction performance evaluation scores and errors; The mean value of the predicted performance evaluation score error set is calculated to obtain the current revised value of the predicted performance evaluation score. Based on the current evaluation score, performance evaluation score decay rate, and current predicted performance evaluation score revision value of the distributed power access unit to be tested, a linear equation is constructed with the remaining decay time as the dependent variable and the predicted performance evaluation score as the independent variable. When the predicted pass / fail score is the preset pass / fail score, substitute it into the linear equation to obtain the remaining decay time.

[0009] In this solution, the step of normalizing the functional test results of the distributed power access unit to be tested to obtain normalized values ​​of the functional test results specifically includes: Obtaining a functional test value of the distributed power supply access unit to be tested and historical functional test data; If the functional test value and the corresponding functional test result are in a proportional relationship, the maximum functional test value with a qualified test result in the historical functional test data is extracted; If the functional test value is greater than or equal to the maximum functional test value with a qualified test result in the historical functional test data, the normalized value of the corresponding functional test result is set to 1; The functional test value of the distributed power supply access unit to be tested is subtracted by the corresponding functional test qualified threshold to obtain a first value; The maximum functional test value with a qualified test result in the historical functional test data is subtracted by the corresponding functional test qualified threshold to obtain a second value; The first value is divided by the second value to obtain the normalized value of the corresponding functional test result; If the functional test data and the corresponding functional test result are in an inverse proportional relationship, the minimum functional test value with a qualified test result in the historical functional test data is extracted; If the functional test value is less than or equal to the minimum functional test value with a qualified test result in the historical functional test data, the normalized value of the corresponding functional test result is set to 1; The corresponding functional test qualified threshold is subtracted by the functional test value of the distributed power supply access unit to be tested to obtain a first value; The corresponding functional test qualified threshold is subtracted by the minimum functional test value with a qualified test result in the historical functional test data to obtain a second value; The first value is divided by the second value to obtain the normalized value of the corresponding functional test result.

[0010] In the scheme, the data transmission channel test includes interchangeability test and load capacity test; the interchangeability test includes reset module level duration test and direct interaction command response time test.

[0011] In the scheme, the reset module level duration test specifically includes: The distributed power supply access unit to be tested is connected to a power supply, and whether the RST pin level state is high is detected in real time; if it is low, the detection is continued until it becomes high, and a preset first time is waited; The RST pin level state is detected in real time to see whether it is low; if it is high, the detection is continued until it becomes low, and a preset first time is waited; If the low level is detected, the current time is recorded and detect whether the RST pin level state is high at the next time node, if high, record the current time ; Subtract time from time , to get the duration of low level; If the duration of low level is in the preset first time range, the current reset module level duration is normal.

[0012] In the scheme, the step of the direct interaction command response time test specifically comprises: S201, access the distributed power access unit to be tested to the power supply; S202, detect whether the RST pin level state is high in real time, if low, continue to detect until it becomes high, and wait for a preset first time; S203, detect whether the RST pin level state is low in real time, if high, continue to detect until it becomes low, and wait for a preset first time; S204, if low is detected, continue to detect whether the RST pin level state is high at the next time node, if low, continue to detect until it becomes high, and wait for a preset first time; S205, if high is detected, delay for a preset second time; S206, based on the preset test equipment, send a query address command to the distributed power access unit to be tested; S207, the preset test equipment waits for the address acknowledgement frame sent by the distributed power access unit to be tested, waits for a preset third time, if no acknowledgement frame is received, return to step S206, and record the number of times of returning to step S206, if the number of times of returning to step S206 is greater than a preset first number threshold, determine that the current test is unqualified, and the test is ended; S208, according to the address responded by the distributed power access unit to be tested, group a read photovoltaic inverter voltage value frame, and send it to the distributed power access unit to be tested; S209, the preset test equipment waits for the acknowledgement frame of the photovoltaic inverter voltage value sent by the distributed power access unit to be tested, waits for a preset third time, if no acknowledgement frame is received, return to step S208, and record the number of times of returning to step S208, if the number of times of returning to step S208 is greater than a preset second number threshold, determine that the current test is unqualified, and the test is ended; S210, according to the received acknowledgement frame, determine whether the direct interaction command response time test is qualified.

[0013] In the scheme, the load capacity test includes initialization before steady-state load test, dual-mode communication module interface power supply voltage test, ripple test, interface power supply voltage test, steady-state load test and transient load test.

[0014] In the scheme, in the dual-mode communication module interface power supply voltage test, the interface power supply voltage V satisfies: Wherein And is a preset voltage range.

[0015] The one or more technical solutions proposed in the application have at least the following technical effects: By comprehensively analyzing the results of different functional test items and predicting the remaining attenuation time, and then dynamically adjusting the periodic test inspection of the distributed power access unit according to the remaining attenuation time, comprehensive and accurate testing is realized. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 A flowchart of a test method based on a distributed power access unit is shown. DETAILED DESCRIPTION

[0017] In order to more clearly understand the above-mentioned purposes, features and advantages of the present application, the present application will be further described in detail below in combination with the drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0018] In the following description, many specific details are set forth in order to provide a thorough understanding of the present application, however, the present application can also be implemented in other ways different from those described herein, therefore, the scope of protection of the present application is not limited by the specific embodiments disclosed below.

[0019] Figure 1 A flowchart of a test method based on a distributed power access unit is shown.

[0020] As Figure 1 shown, the present application discloses a test method based on a distributed power access unit, comprising: S101, based on the preset distributed power access unit test prompt information, obtaining the distributed power access unit to be tested; S102, determining the number corresponding to the distributed power access unit to be tested according to the distributed power access unit to be tested; S103, judging whether the corresponding distributed power access unit to be tested is the first test according to the number of the distributed power access unit to be tested, if yes, performing structural test on the corresponding distributed power access unit to be tested, and when the structural test is qualified, performing functional test on the corresponding distributed power access unit to be tested; if no, performing functional test on the corresponding distributed power access unit to be tested; S104, obtaining the functional test result of the distributed power access unit to be tested; S105, when the functional test result of the distributed power access unit to be tested is qualified, the corresponding distributed power access unit to be tested is qualified.

[0021] According to the embodiment of the present application, when there is a new distributed energy, such as photovoltaic, wind power and the like, the distributed power access unit test prompt information is generated; or the periodic test of the distributed power access unit is needed according to the set test period, the distributed power access unit test prompt information is generated; or there is some emergency event; the structural test of the distributed power access unit includes appearance size detection, communication interface detection, shell and its protection performance detection, electrical clearance and creepage distance detection, wiring mark detection and the like, such as the appearance size of the distributed power access unit, the distributed power access unit opening size, the appearance size needs to meet the appearance size standard set in advance; such as the dual-mode communication unit interface in the communication interface should meet the following requirements: 1. The communication rate can be set, the default is 115200 bps, the check method can be set, the default is even check, the data bit is 8 bits, and the stop bit is 1 bit; 2. The communication unit interface should support communication unit interchange; 3. The communication unit interface should support communication unit interchange. The functional test at least includes data transmission channel test, power supply influence test, continuous power stability test.

[0022] According to the embodiment of the present application, when the distributed power access unit to be tested is qualified, further comprising: normalizing the functional test result of the distributed power access unit to be tested to obtain the normalized value of the functional test result; evaluating the distributed power access unit to be tested based on the normalized value of the functional test result to obtain the performance evaluation score of the corresponding distributed power access unit to be tested; if the distributed power access unit to be tested is the first test, associating and storing the corresponding performance evaluation score and the number of the distributed power access unit to be tested; if the distributed power access unit to be tested is not the first test, extracting the performance evaluation score of the distributed power access unit to be tested in the last test; Subtract the performance evaluation score of the current performance evaluation score from the performance evaluation score of the last test to obtain a performance evaluation score difference value; If the performance evaluation score difference value is greater than a preset performance evaluation first score difference threshold value, mark the distributed power access unit to be tested.

[0023] It should be noted that when the performance evaluation score difference value is greater than the preset performance evaluation first score difference threshold value, it indicates that the performance of the distributed power access unit to be tested in the time period from the current time node to the last detection time node has decreased seriously, although it is still in the qualified state, but needs to be marked for special attention to prevent power failure of the distributed power access unit to be tested and the like; the normalized value of the functional test result is multiplied by the preset evaluation score coefficient corresponding to the functional test item to obtain the performance evaluation score corresponding to the distributed power access unit to be tested, such as setting the preset evaluation score coefficient corresponding to the functional test item as 1.

[0024] According to the embodiment of the application, further comprising: extracting the last test time node of the marked distributed power access unit; Subtract the current test time node from the last test time node to obtain a test time difference value; Divide the performance evaluation score difference value by the test time difference value to obtain a performance evaluation score decay rate; Based on the performance evaluation score decay rate, predict the time value when the evaluation score of the current distributed power access unit to be tested decays to the preset qualified evaluation score, and set it as a decay remaining time; If the decay remaining time is greater than or equal to the preset detection time period, no processing is required; if the decay remaining time is less than the preset detection time period, set the corresponding decay remaining time as the interval time of the next test of the corresponding distributed power access unit to be tested.

[0025] It should be noted that the preset qualified evaluation score is greater than the ideal qualified evaluation score of the corresponding distributed power access unit and less than 1, and the ideal qualified evaluation score of the distributed power access unit is the performance evaluation score when all test data of the test items of the distributed power access unit are on the qualified line, and the ideal qualified evaluation score of the distributed power access unit is zero.

[0026] According to the embodiment of the application, the step of predicting the time value when the evaluation score of the current distributed power access unit to be tested decays to the preset qualified evaluation score, specifically comprises: Obtain the use time of the current distributed power access unit to be tested; Based on the usage time of the distributed power access unit currently under test, historical data within a set time range is extracted from the historical database. Extract any distributed power supply unit from historical data within a specified time range at the test time node. Performance evaluation score Test time nodes Performance evaluation score and test time nodes Performance evaluation score ; According to the test time node Performance evaluation score and test time nodes Performance evaluation score Determine the test time point Up to the test time point The rate of decay of the performance evaluation score; Test time points Up to the test time point The performance evaluation score decay rate multiplied by the test time node By the test time point The time difference is used to obtain the test time node. By the test time point The difference in predictive performance evaluation scores; Test time points Performance evaluation score Subtract test time points By the test time point The difference in predictive performance evaluation scores is used to obtain the test time points. The predictive performance evaluation score; Test time points Performance evaluation score Subtract test time points The predictive performance evaluation score is used to obtain the test time node. The error in the predictive performance evaluation score; Iterate through all historical data within a set time range to obtain the set of prediction performance evaluation scores and errors; The mean value of the predicted performance evaluation score error set is calculated to obtain the current revised value of the predicted performance evaluation score. Based on the current evaluation score, performance evaluation score decay rate, and current predicted performance evaluation score revision value of the distributed power access unit to be tested, a linear equation is constructed with the remaining decay time as the dependent variable and the predicted performance evaluation score as the independent variable. When the predicted qualified evaluation score is the preset qualified evaluation score, the linear equation is substituted to obtain the decay remaining time.

[0027] It should be noted that the use time of the distributed power access unit to be tested is within a set time range, and the historical data of the set time range includes performance evaluation scores of at least three test time nodes, and the middle test time node of the set time range is set as ; the formula of the linear equation is , wherein represents a predicted performance evaluation score, represents an evaluation score of the distributed power access unit to be tested at present, k represents a performance evaluation score decay rate, represents a current predicted performance evaluation score correction value, represents a decay remaining time.

[0028] According to the embodiment of the present application, the step of normalizing the functional test result of the distributed power access unit to be tested to obtain a normalized value of the functional test result specifically includes: obtaining a functional test value of the distributed power access unit to be tested and historical functional test data; if the functional test value and the corresponding functional test result are in a direct proportional relationship, extracting a maximum functional test value with a qualified test result from the historical functional test data; if the functional test value is greater than or equal to the maximum functional test value with the qualified test result in the historical functional test data, setting the normalized value of the corresponding functional test result as 1; subtracting a corresponding functional test threshold from the functional test value of the distributed power access unit to be tested to obtain a first value; subtracting the corresponding functional test threshold from the maximum functional test value with the qualified test result in the historical functional test data to obtain a second value; dividing the first value by the second value to obtain the normalized value of the corresponding functional test result; if the functional test data and the corresponding functional test result are in an inverse proportional relationship, extracting a minimum functional test value with a qualified test result from the historical functional test data; if the functional test value is less than or equal to the minimum functional test value with the qualified test result in the historical functional test data, setting the normalized value of the corresponding functional test result as 1; subtracting the functional test value of the distributed power access unit to be tested from the corresponding functional test threshold to obtain a first value; Subtracting the minimum functional test value with a test result of pass in the historical functional test data from the corresponding functional test qualified threshold value, a second value is obtained; Dividing the first value by the second value, a normalized value corresponding to the functional test result is obtained.

[0029] It should be noted that when the functional test value and the corresponding functional test result are not in direct proportion or inverse proportion, the middle value of the determination range of the functional test value is set as the calibration value, the current functional test value is subtracted from the calibration value, and the absolute value is taken to obtain the first value; the calibration value is subtracted from the minimum value in the determination range to obtain the second value; and then the first value is divided by the second value to obtain the normalized value corresponding to the functional test result. For example, the voltage test of the dual-mode communication module interface power supply, the voltage determination range is 11V-13V, and the functional test value is 11.5V. For the functional test pass, the normalized value corresponding to the functional test result is .

[0030] It is explained that the set qualified value range corresponding to the functional test value is set for the functional test value According to the embodiment of the application, the data transmission channel test comprises interchangeability test and load capacity test; the interchangeability test comprises reset module level duration test and direct interaction command response time test.

[0031] According to the embodiment of the application, the steps of the reset module level duration test specifically comprise: The distributed power supply access unit to be tested is connected to the power supply, and the RST pin level state is detected in real time. If it is low, it is continuously detected until it becomes high, and a preset first time is waited; The RST pin level state is detected in real time. If it is high, it is continuously detected until it becomes low, and a preset first time is waited; If the low level is detected, the current time is recorded, and the RST pin level state at the next time node is detected. If the high level is detected, the current time is recorded. The time is subtracted from the time , and the duration of the low level is obtained. If the duration of the low level is within the preset first time range, the current reset module level duration is normal.

[0032] It should be noted that, for example, the waiting preset first time is set to 1 minute, if the waiting preset first time is exceeded, and the corresponding RST pin level state has not changed, it indicates that the current reset module level duration test is unqualified; for example, the preset first time range is set to be greater than or equal to 200 ms.

[0033] According to the embodiment of the present application, the step of the direct interaction command response time test specifically comprises: S201, access the distributed power supply access unit to be tested to the power supply; S202, detect whether the RST pin level state is high in real time, if it is low, continue to detect until it becomes high, and wait for a preset first time; S203, detect whether the RST pin level state is low in real time, if it is high, continue to detect until it becomes low, and wait for a preset first time; S204, if the low level is detected, continue to detect whether the RST pin level state is high at the next time node, if it is low, continue to detect until it becomes high, and wait for a preset first time; S205, if the high level is detected, delay for a preset second time; S206, based on the preset test equipment, send a query address command to the distributed power supply access unit to be tested; S207, the preset test equipment waits for the address acknowledgement frame sent by the distributed power supply access unit to be tested, waits for a preset third time, if the acknowledgement frame is not received, returns to step S206, and records the number of times of returning to step S206, if the number of times of returning to step S206 is greater than a preset first number threshold, it is determined that the current test is unqualified, and the test is ended; S208, according to the address responded by the distributed power supply access unit to be tested, a read photovoltaic inverter voltage value frame is composed and sent to the distributed power supply access unit to be tested; S209, the preset test equipment waits for the acknowledgement frame of the photovoltaic inverter voltage value sent by the distributed power supply access unit to be tested, waits for a preset third time, if the acknowledgement frame is not received, returns to step S208, and records the number of times of returning to step S208, if the number of times of returning to step S208 is greater than a preset second number threshold, it is determined that the current test is unqualified, and the test is ended; S210, according to the received acknowledgement frame, determine whether the direct interaction command response time test is qualified.

[0034] According to the embodiment of the present application, for example, the preset second time is set as 3 seconds, the preset third time is set as 6 seconds, the preset test device can be an oscilloscope, and when the preset test device receives the response frame of the photovoltaic inverter voltage value sent by the distributed power access unit to be tested within the preset third time, the direct interaction command response time test of the distributed power access unit to be tested is determined to be qualified or not.

[0035] According to the embodiment of the present application, the load capacity test includes steady-state load test initialization, double-mode communication module interface power voltage test, ripple test, interface power voltage test, steady-state load test and transient load test.

[0036] According to the embodiment of the present application, in the double-mode communication module interface power voltage test, the interface power voltage V satisfies: , wherein , and is a preset voltage range.

[0037] It should be noted that the steady-state load test initialization includes controlling the standard source to output single-phase 220V voltage, configuring the related parameters (such as load value and sampling frequency) of the oscilloscope, powering the distributed power access unit to be tested, waiting for a set time (default 15s) after the power-on initialization according to the software setting time, accessing the fixed load (current value 125mA) through the double-mode communication module power interface, accessing the fixed load (current value 50mA) through the RJ45-1 and RJ45-2 interfaces respectively; the preset voltage range can be set as 11V-13V, that is, the test value of the double-mode communication module interface power voltage is qualified between 11V-13V.

[0038] It should be noted that in the ripple test, the ripple voltage , wherein represents the peak voltage, represents the valley voltage, and when is less than the preset maximum ripple voltage, the ripple test is qualified, for example, the preset maximum ripple voltage is set as 12mV.

[0039] The present application discloses a test method based on a distributed power access unit, which realizes comprehensive and accurate test by combining the structural test and functional test of the distributed power access unit; in addition, when the distributed power access unit is qualified, the results of different functional test items are comprehensively analyzed, and the remaining attenuation time is predicted, and then the periodic test of the distributed power access unit is dynamically adjusted according to the remaining attenuation time, so as to ensure the normal operation of the corresponding distributed power access unit.

[0040] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other manners. The described device embodiments are merely illustrative. For example, the division of the units is only a logical function division. There can be another division manner for the actual implementation, for example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed coupling, or direct coupling or communication connection between the components can be indirect coupling or communication connection through some interfaces, devices, or units, and can be electrical, mechanical, or in other forms.

[0041] The units described as separate components can or can not be physically separate, and the components shown as units can or can not be physical units; they can be located in one place, or distributed on multiple network units; and some or all of the units can be selected as needed to achieve the purposes of the embodiments.

[0042] In addition, each functional unit in each embodiment of the present application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; and the integrated unit can be implemented in the form of hardware or hardware plus software functional units.

[0043] Those of ordinary skill in the art can understand that all or part of the steps of the above-described method embodiments can be completed by a program instructing related hardware, and the foregoing program can be stored in a computer-readable storage medium, and when the program is executed, the steps of the method embodiments are executed; and the foregoing storage medium includes mobile storage devices, read-only memories (ROMs), random access memories (RAMs), magnetic disks or optical disks, and various media that can store program codes.

[0044] Alternatively, the integrated units of the present application, if implemented in the form of software functional modules and sold or used as independent products, can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of the present application can be embodied in the form of a software product, and the computer software product is stored in a storage medium, and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the methods described in the embodiments of the present application. The foregoing storage medium includes mobile storage devices, ROMs, RAMs, magnetic disks or optical disks, and various media that can store program codes.

Claims

1. A test method based on a distributed power access unit, characterized in that, The method comprises the following steps: Based on the preset distributed power access unit test prompt information, the distributed power access unit to be tested is obtained; According to the distributed power access unit to be tested, the number corresponding to the distributed power access unit to be tested is determined; According to the number of the distributed power access unit to be tested, it is determined whether the corresponding distributed power access unit to be tested is tested for the first time. If yes, the structure test of the corresponding distributed power access unit to be tested is performed, and when the structure test is qualified, the functional test of the corresponding distributed power access unit to be tested is performed; if not, the functional test of the corresponding distributed power access unit to be tested is performed; The functional test result of the distributed power access unit to be tested is obtained; When the functional test result of the distributed power access unit to be tested is qualified, the corresponding distributed power access unit to be tested is qualified; The functional test at least includes data transmission channel test, power supply influence test and continuous power supply stability test.

2. The method of claim 1, wherein, After the distributed power access unit to be tested is qualified, the following steps are further included: The functional test result of the distributed power access unit to be tested is normalized to obtain the normalized value of the functional test result; Based on the normalized value of the functional test result, the distributed power access unit to be tested is evaluated to obtain the performance evaluation score of the corresponding distributed power access unit to be tested; If the distributed power access unit to be tested is tested for the first time, the corresponding performance evaluation score and the number of the distributed power access unit to be tested are associated and stored; If the distributed power access unit to be tested is not tested for the first time, the performance evaluation score of the distributed power access unit to be tested in the last test is extracted; The current performance evaluation score is subtracted from the performance evaluation score in the last test to obtain the performance evaluation score difference value; If the performance evaluation score difference value is greater than the preset performance evaluation first score difference threshold, the corresponding distributed power access unit to be tested is marked.

3. The method of claim 2, wherein, Further comprising: The last test time node of the marked distributed power access unit is extracted; The test time difference value is obtained by subtracting the last test time node from the current test time node; The performance evaluation score difference value is divided by the test time difference value to obtain the performance evaluation score decay rate; Based on the performance evaluation score decay rate, the time value when the evaluation score of the current distributed power access unit to be tested decays to the preset qualified evaluation score is predicted, which is set as the decay remaining time; If the decay remaining time is greater than or equal to the preset detection time period, it is not necessary to process; If the decay remaining time is less than the preset detection time period, the corresponding decay remaining time is set as the interval time of the next test of the corresponding distributed power access unit to be tested.

4. The method of claim 3, wherein, The step of predicting the time value when the evaluation score of the current distributed power access unit to be tested decays to the preset qualified evaluation score comprises the following steps: The use time of the current distributed power access unit to be tested is obtained; Extracting historical data in a set time range from a historical database based on the use time of the current distributed power access unit to be tested; Extract any distributed power supply unit from historical data within a specified time range at the test time node. Performance evaluation score Test time nodes Performance evaluation score and test time nodes Performance evaluation score ; a performance evaluation score of the test time node a performance evaluation score of the test time node a performance evaluation score of the test time node a performance evaluation score of the test time node a performance evaluation score of the test time node a performance evaluation score of the test time node a performance evaluation score of the test time node the test time node to the test time node the performance evaluation score decay rate of the test time node to the test time node the time difference of the test time node to the test time node the predicted performance evaluation score difference value of the test time node Test time points Performance evaluation score Subtract test time points By the test time point The difference in predictive performance evaluation scores is used to obtain the test time points. The predictive performance evaluation score; Test time points Performance evaluation score Subtract test time points The predictive performance evaluation score is used to obtain the test time node. The error in the predictive performance evaluation score; Traversing all historical data in the set time range to obtain a set of predicted performance evaluation score error values; Calculating the mean value of the values in the set of predicted performance evaluation score error values to obtain a current predicted performance evaluation score correction value; According to the evaluation score of the current distributed power access unit to be tested, the performance evaluation score decay rate, and the current predicted performance evaluation score correction value, constructing a linear equation with the decay remaining time as the dependent variable and the predicted performance evaluation score as the independent variable; When the predicted qualified evaluation score is the preset qualified evaluation score, substituting the linear equation to obtain the decay remaining time.

5. The method of claim 2, wherein the method further comprises: The step of normalizing the functional test result of the distributed power access unit to be tested to obtain the normalized value of the functional test result, specifically includes: Obtaining the functional test value of the distributed power access unit to be tested and historical functional test data; If the functional test value and the corresponding functional test result are in a direct proportional relationship, then extract the maximum functional test value with a test result of qualified from the historical functional test data; If the functional test value is greater than or equal to the maximum functional test value with a test result of qualified from the historical functional test data, then set the normalized value of the corresponding functional test result to 1; Subtract the corresponding functional test threshold from the functional test value of the distributed power access unit to be tested to obtain a first value; Subtract the corresponding functional test threshold from the maximum functional test value with a test result of qualified from the historical functional test data to obtain a second value; Divide the first value by the second value to obtain the normalized value of the corresponding functional test result; If the functional test data and the corresponding functional test result are in an inverse proportional relationship, then extract the minimum functional test value with a test result of qualified from the historical functional test data; If the functional test value is less than or equal to the minimum functional test value with a test result of qualified from the historical functional test data, then set the normalized value of the corresponding functional test result to 1; Subtract the corresponding functional test threshold from the functional test value of the distributed power access unit to be tested to obtain a first value; Subtract the corresponding functional test threshold from the minimum functional test value with a test result of qualified from the historical functional test data to obtain a second value; Divide the first value by the second value to obtain the normalized value of the corresponding functional test result.

6. The method of claim 1, wherein, The data transmission channel test includes interchangeability test and load capacity test; the interchangeability test includes reset module level duration test and direct interaction command response time test.

7. The method of claim 6, wherein, The step of reset module level duration test specifically includes: Connecting the distributed power access unit to be tested to a power supply and detecting in real time whether the RST pin level state is high, if it is low, continuously detecting until it becomes high, and waiting for a preset first time; Real-time detection of whether the RST pin level state is low, if it is high, continue to detect until it becomes low, and wait for a preset first time; If low level is detected, record current time and detect if the RST pin level state is high at the next time node, if high level is detected, record current time ; Time to Subtract time to get the duration of the low level; If the duration of the low level is within the preset first time range, the current reset module level duration is normal.

8. The method of claim 6, wherein the method further comprises: The step of the direct interaction command response time test specifically includes: S201, connecting the distributed power access unit to be tested to a power supply; S202, real-time detection of whether the RST pin level state is high, if it is low, continue to detect until it becomes high, and wait for a preset first time; S203, real-time detection of whether the RST pin level state is low, if it is high, continue to detect until it becomes low, and wait for a preset first time; S204, if a low level is detected, continue to detect whether the RST pin level state is high at the next time node, if it is low, continue to detect until it becomes high, and wait for a preset first time; S205, if a high level is detected, delay for a preset second time; S206, based on a preset test device, send a query address command to the distributed power access unit to be tested; S207, the preset test device waits for the distributed power access unit to be tested to send an address acknowledgement frame, waits for a preset third time, if no acknowledgement frame is received, return to step S206, and record the number of times of returning to step S206, if the number of times of returning to step S206 is greater than a preset first number threshold, determine that the current test is unqualified, and the test ends; S208, according to the address responded by the distributed power access unit to be tested, group a read photovoltaic inverter voltage value frame, and send it to the distributed power access unit to be tested; S209, the preset test device waits for the distributed power access unit to be tested to send a photovoltaic inverter voltage value acknowledgement frame, waits for a preset third time, if no acknowledgement frame is received, return to step S208, and record the number of times of returning to step S208, if the number of times of returning to step S208 is greater than a preset second number threshold, determine that the current test is unqualified, and the test ends; S210, according to the received acknowledgement frame, determine whether the direct interaction command response time test is qualified.

9. The method of claim 6, wherein the method further comprises: The load capacity test includes initialization before steady-state load test, dual-mode communication module interface power voltage test, ripple test, interface power voltage test, steady-state load test, and transient load test.

10. The method of claim 9, wherein, In the interface power voltage test of the dual-mode communication module, the interface power voltage V satisfies: wherein and is a preset voltage range.

Images