Trigger adjusting method and adjusting device of electromechanical switch type measuring device

Abstract

The invention provides a trigger adjusting method and adjusting device for an electromechanical switch type measuring device, and belongs to the technical field of measuring equipment, and the trigger adjusting method comprises the steps: obtaining the on-resistance collection data of a conductive contact switch in the electromechanical switch type measuring device, the current trigger state of the electronic mechanical switch type measuring device is acquired according to the on-resistance acquisition data; selecting a preset dynamic comparison threshold according to the current trigger state, and comparing the on-resistance acquisition data with the preset dynamic comparison threshold; wherein different current trigger states correspond to different preset dynamic comparison thresholds; and adjusting the triggering state of the electromechanical switch type measuring device according to the comparison result. Through the dynamic multi-threshold design, the defect of low measurement accuracy in the prior art is overcome, so that the electronic mechanical switch type measurement device obtains more accurate and more stable measurement results, and misjudgment of the trigger state is effectively avoided.

Description

Technical Field

[0001] This invention relates to the field of measuring equipment technology, and in particular to a triggering and adjustment method and adjustment device for an electromechanical switch-type measuring device. Background Technology

[0002] Electromechanical switch-type measuring devices, such as trigger-type probes, typically determine the on / off state and issue a trigger signal by detecting the overall resistance value of multiple series-connected mechanical conductive contacts and comparing it with a set threshold. Alternatively, they can independently detect the contact resistance of each group of contacts and comprehensively summarize the results to determine the on / off state. This triggering method is widely used in trigger control scenarios for electromechanical switch-type measuring devices due to its simplicity.

[0003] However, due to the uncertain direction and angle of the relative movement of the electromechanical switch contacts, and the influence of many factors such as contact oxidation, contamination and wear, the simple comparison of the resistance value with the set threshold to achieve trigger control cannot accurately identify the trigger state of the contacts. This results in problems such as low measurement accuracy, large pre-stroke and unstable operation of electromechanical switch measuring devices. Summary of the Invention

[0004] This invention provides a trigger adjustment method and adjustment device for an electromechanical switch-type measuring device. Through the design of dynamic multi-threshold, it solves the defect of low measurement accuracy in the prior art, enabling the electromechanical switch-type measuring device to obtain more accurate and stable measurement results, and effectively avoiding misjudgment of trigger state.

[0005] In a first aspect, the present invention provides a trigger adjustment method for an electromechanical switch-type measuring device, comprising: Acquire the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, and obtain the current triggering state of the electromechanical switch measuring device based on the on-resistance data; A preset dynamic comparison threshold is selected based on the current trigger state, and the on-resistance data is compared with the preset dynamic comparison threshold; wherein, the preset dynamic comparison threshold is different for different current trigger states; Adjust the trigger state of the electromechanical switch-type measuring device according to the comparison results.

[0006] According to a trigger adjustment method for an electromechanical switch-type measuring device provided by the present invention, the step of selecting a preset dynamic comparison threshold based on the current trigger state and comparing the on-resistance acquisition data with the preset dynamic comparison threshold includes: When the current triggering state is a pre-triggering state, the on-resistance data is compared with a first preset dynamic comparison threshold, and the on-resistance data is compared with a second preset dynamic comparison threshold. When the current triggering state is the triggering state, the on-resistance data is compared with the third preset dynamic comparison threshold, and the on-resistance data is compared with the fourth preset dynamic comparison threshold. When the current triggering state is a triggered state, the on-resistance data is compared with the fifth preset dynamic comparison threshold. When the current trigger state is the released state, the on-resistance data is compared with the sixth preset dynamic comparison threshold.

[0007] According to the present invention, a trigger adjustment method for an electromechanical switch-type measuring device, wherein adjusting the trigger state of the electromechanical switch-type measuring device based on a comparison result includes: The current triggering state is a pre-triggering state. When the on-resistance data is greater than the first preset dynamic comparison threshold and less than or equal to the second preset dynamic comparison threshold, the triggering state is adjusted to a triggering state. When the on-resistance data is greater than the second preset dynamic comparison threshold, the triggering state is adjusted to a triggered state. Wherein, the first preset dynamic comparison threshold is less than the second preset dynamic comparison threshold. The current triggering state is the triggering state. When the on-resistance data is less than the third preset dynamic comparison threshold, the triggering state is adjusted to the pre-triggering state. When the on-resistance data is greater than the fourth preset dynamic comparison threshold, the triggering state is adjusted to the triggered state. The third preset dynamic comparison threshold is less than the fourth preset dynamic comparison threshold. The current trigger state is the triggered state. When the on-resistance data is less than the fifth preset dynamic comparison threshold, the trigger state is adjusted to the released state. The current trigger state is the released state. When the on-resistance data is greater than the sixth preset dynamic comparison threshold, the trigger state is adjusted to the triggered state.

[0008] According to the trigger adjustment method of an electromechanical switch-type measuring device provided by the present invention, after acquiring the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, the method further includes: The collected on-resistance data of a preset length are saved as a resistance data sequence according to the collection order; Adjusting the trigger state of the electromechanical switch-type measuring device based on the comparison result includes: When the current trigger state is a triggered state or the adjusted trigger state is a triggered state, interpolation is performed on the multiple on-resistance data collected in the resistance data sequence to obtain the trigger time of the electromechanical switch measuring device, and the electromechanical switch measuring device is triggered according to the trigger time.

[0009] According to the present invention, a trigger adjustment method for an electromechanical switch-type measuring device includes, wherein interpolating multiple on-resistance data collected in the resistance data sequence to obtain the trigger time of the electromechanical switch-type measuring device comprises: Linear interpolation is performed on multiple on-resistance data in the resistance data sequence to obtain the trigger time of the electromechanical switch-type measuring device.

[0010] According to the present invention, a trigger adjustment method for an electromechanical switch-type measuring device, wherein adjusting the trigger state of the electromechanical switch-type measuring device based on a comparison result includes: When the current trigger state is a released state or the adjusted trigger state is a released state, obtain the duration of the released state; When the duration exceeds the preset duration, the trigger state is adjusted to a pre-trigger state.

[0011] According to the trigger adjustment method of an electromechanical switch-type measuring device provided by the present invention, before comparing the on-resistance acquisition data with the preset dynamic comparison threshold, the method further includes: The on-resistance data is subjected to noise filtering.

[0012] Secondly, the present invention also provides a trigger adjustment device for an electromechanical switch-type measuring device, comprising: The parameter acquisition module is used to acquire the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, and to acquire the current triggering state of the electromechanical switch measuring device based on the on-resistance data. The threshold comparison module is used to select a preset dynamic comparison threshold according to the current trigger state, and compare the on-resistance acquisition data with the preset dynamic comparison threshold; wherein, the preset dynamic comparison threshold is different for different current trigger states; The trigger adjustment module is used to adjust the trigger state of the electromechanical switch-type measuring device according to the comparison result.

[0013] Thirdly, the present invention also provides an electromechanical switch-type measuring device, including a microprocessor, a communication interface, and a computer program stored in and running on the microprocessor. When the microprocessor executes the computer program, it implements the trigger adjustment method of the electromechanical switch-type measuring device as described in the first aspect.

[0014] Fourthly, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the triggering and adjustment method of the electromechanical switch-type measuring device as described in the first aspect.

[0015] This invention, based on the contact state acquired in the previous acquisition cycle, calculates the current trigger state according to reasonable state transition rules, eliminating state anomalies and measurement errors caused by abnormal sampling data. Specifically, it acquires the contact resistance value of the contact switch and uses an optimized dynamic multi-threshold processing method to perform finite state transitions based on the trigger state identified in the previous moment. That is, based on the previous trigger state and the acquired data sequence, the current trigger state is integrated according to multi-state dynamic threshold analysis. This can accurately identify the triggering timing of the switch, enabling the electromechanical switch-type measuring device to obtain more accurate and stable measurement results, effectively avoiding misjudgment of the trigger state, and achieving lower costs. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0017] Figure 1 This is a schematic flowchart of the trigger adjustment method for the electromechanical switch-type measuring device provided by the present invention.

[0018] Figure 2 This is a schematic diagram of the trigger state transition corresponding to the finite state machine in the electromechanical switch-type measuring device provided by the present invention.

[0019] Figure 3 This is a schematic diagram illustrating the specific process of the trigger adjustment method for the electromechanical switch-type measuring device provided by the present invention.

[0020] Figure 4 This is a schematic diagram of the logic structure of the trigger adjustment device of the electromechanical switch-type measuring device provided by the present invention.

[0021] Figure 5 This is a schematic diagram of the electronic circuit of the electromechanical switch-type measuring device provided by the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0023] The following is combined Figures 1-5 This invention describes the triggering and adjustment method and apparatus for an electromechanical switch-type measuring device. Figure 1 This is a schematic flowchart of the trigger adjustment method for the electromechanical switch-type measuring device provided by the present invention. The trigger adjustment method for the electromechanical switch-type measuring device can be executed by the trigger adjustment device of the electromechanical switch-type measuring device provided in this embodiment of the invention. This trigger adjustment device can be implemented using software and / or hardware. For example... Figure 1 As shown, the trigger adjustment method for the electromechanical switch-type measuring device includes the following steps: Step 101: Obtain the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, and obtain the current triggering state of the electromechanical switch measuring device based on the on-resistance data.

[0024] Specifically, the triggering state of an electromechanical switch-type measuring device corresponds to the contact state of the mechanical trigger contacts within the device, and simultaneously to the gap state of the conductive contact switches. Triggering an electromechanical switch-type measuring device means that the mechanical trigger contacts are no longer in contact, or that the contact resistance of the conductive contact switches approaches infinity. Electromechanical switch-type measuring devices often include multiple conductive contact switches; the opening of any one or more conductive contact switches is considered a triggering of the electromechanical switch-type measuring device.

[0025] Specifically, the electromechanical switch-type measuring device can be, for example but not limited to, a trigger-type probe or a tool setter using an electromechanical switch; here, we take a trigger-type probe using an electromechanical switch as an example. The trigger-type probe using an electromechanical switch employs a kc support structure, i.e., a motion coupling structure, and uses rigid ball-and-pin couplings to ensure structural stability and repeatability. Each ball-and-pin coupling acts as a mechanical conductive contact switch; for example, but not limited to, three or six sets of ball-and-pin mechanical switches are connected in series to form a whole. Measuring the on-resistance of this whole switch allows us to determine the contact triggering status. The on-resistance data of the conductive contact switches in the electromechanical switch-type measuring device, i.e., the acquired on-resistance, can be used to determine the contact triggering status. For example, a microprocessor can be used to acquire the contact level after resistive voltage division, calculate and convert it to obtain the on-resistance data of the conductive contact switches in the electromechanical switch-type measuring device.

[0026] After calculating and converting to obtain the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, according to the description of the aforementioned embodiment, there is a correspondence between the on-resistance data and the trigger state of the electromechanical switch-type measuring device. Therefore, the current trigger state of the electromechanical switch-type measuring device can be obtained based on the on-resistance data, so that in subsequent acquisition cycles, the trigger state of the electromechanical switch-type measuring device can be adjusted based on the real-time acquired on-resistance data. Furthermore, in the initial stage, the current trigger state of the electromechanical switch-type measuring device can be initially set, and the trigger state of the electromechanical switch-type measuring device is continuously adjusted during the execution of the trigger adjustment method.

[0027] In addition, before obtaining the aforementioned parameters, the electromechanical switch measuring device can be controlled to start the measurement program after receiving the operation command to detect the trigger state or contact state of the electromechanical switch measuring device, and at the same time start the initialization program to initialize the state machine state of the electromechanical switch measuring device.

[0028] In some embodiments, after performing the above steps and before comparing the on-resistance acquisition data with a preset dynamic comparison threshold, noise filtering processing can also be performed on the on-resistance acquisition data.

[0029] Specifically, electromechanical switch-type measuring devices are affected by factors such as microstructural wear and mechanical vibration, resulting in glitch data in the acquired on-resistance data, which affects the final on-resistance measurement result. This embodiment of the invention performs anti-noise filtering on the on-resistance data before comparing it with a preset dynamic comparison threshold. Based on the data acquisition pattern and anti-noise algorithm, the on-resistance data is filtered to remove abrupt glitch data, i.e., jump points and noise signals, thereby improving the accuracy of the on-resistance data acquisition.

[0030] Step 102: Select a preset dynamic comparison threshold according to the current trigger state, and compare the on-resistance data with the preset dynamic comparison threshold; wherein, the preset dynamic comparison threshold is different for different current trigger states.

[0031] Figure 2 This is a schematic diagram of the trigger state transition corresponding to the finite state machine in the electromechanical switch-type measuring device provided by the present invention. For example... Figure 2 As shown, the method of obtaining a preset dynamic comparison threshold based on a limited number of current trigger states and comparing the on-resistance data with the preset dynamic comparison threshold can include: when the current trigger state is pre-trigger state T1, comparing the on-resistance data with a first preset dynamic comparison threshold R1 and comparing the on-resistance data with a second preset dynamic comparison threshold R2; when the current trigger state is triggering state T2, comparing the on-resistance data with a third preset dynamic comparison threshold R3 and comparing the on-resistance data with a fourth preset dynamic comparison threshold R4; when the current trigger state is triggered state T3, comparing the on-resistance data with a fifth preset dynamic comparison threshold R5; and when the current trigger state is released state T4, comparing the on-resistance data with a sixth preset dynamic comparison threshold R6.

[0032] Specifically, the trigger state of an electromechanical switch-type measuring device or the contact state of a mechanical trigger contact can be decomposed into finite states suitable for state machine algorithms. These finite states can include, for example, a pre-trigger state T1, a triggering state T2, a triggered state T3, and a released state T4. The aforementioned finite states are as follows: Figure 2The diagram shows a reasonable transition path. During the trigger state transition of the electromechanical switch-type measuring device, different transition thresholds correspond to different current trigger states, i.e., different preset dynamic comparison thresholds. This can be understood as the way the change in contact resistance value needs to be detected differs for different trigger state transitions. Based on different contact materials and surface treatment processes, a reasonable transition threshold can be set as the preset dynamic comparison threshold for the corresponding state transition by collecting a large amount of experimental data. This embodiment of the invention does not limit the specific value of the preset dynamic comparison threshold.

[0033] In electromechanical switch-type measuring devices, the relative positions of the contacts of the electromechanical switch are not fixed at the microscopic level and are in an unstable state. Therefore, this invention proposes the aforementioned four finite states to characterize four different triggering states of the electromechanical switch-type measuring device. Specifically, the pre-triggering state T1 represents the state where the electromechanical switch-type measuring device is waiting to be triggered, i.e., it has not been triggered. The triggering state T2 represents the intermediate state where the electromechanical switch-type measuring device is approaching triggering, but it still needs to be determined whether to trigger. The triggered state T3 represents the state where the electromechanical switch-type measuring device has determined to trigger. The released state T4 represents the state where the electromechanical switch-type measuring device is no longer triggering. Taking a pressed switch as an example, the pre-triggering state T1 corresponds to the state where the switch is waiting to be pressed. The triggering state T2 represents the intermediate state where the switch has just been contacted and it still needs to be determined whether to press the switch. The triggered state T3 represents the state where the switch has been pressed. The released state T4 represents the state where the switch has been released.

[0034] It should be noted that the contact state or conduction resistance of the electromechanical switch is the same in both the pre-triggered state T1 and the released state T4. The state can be determined by obtaining the release time of the electromechanical switch. For example, it can be set that when the release time of the electromechanical switch is less than or equal to a preset time, it is determined to be in the released state T4; when the release time of the electromechanical switch is greater than the preset time, it is determined to be in the pre-triggered state T1, i.e., corresponding to... Figure 2 The conversion conditions shown in the diagram indicate that a timeout will trigger the next loop. The preset time can be specifically set based on the results of multiple experiments; however, this embodiment of the invention does not impose a specific limitation on it.

[0035] Accordingly, different preset dynamic comparison thresholds are set for different current trigger states. For example... Figure 2As shown, the first preset dynamic comparison threshold R1 corresponds to the transition threshold from the pre-triggered state T1 to the triggered state T2; the second preset dynamic comparison threshold R2 corresponds to the transition threshold from the pre-triggered state T1 to the triggered state T3; the third preset dynamic comparison threshold R3 corresponds to the transition threshold from the triggered state T2 to the pre-triggered state T1; the fourth preset dynamic comparison threshold R4 corresponds to the transition threshold from the triggered state T2 to the triggered state T3; the fifth preset dynamic comparison threshold R5 corresponds to the transition threshold from the triggered state T3 to the released state T4; and the sixth preset dynamic comparison threshold R6 corresponds to the transition threshold from the released state T4 to the triggered state T3.

[0036] Step 103: Adjust the trigger state of the electromechanical switch measuring device according to the comparison results.

[0037] In some embodiments, such as Figure 2 As shown, the trigger state of the electromechanical switch-type measuring device is adjusted according to the comparison result. The current trigger state can be the pre-trigger state T1. When the on-resistance data is greater than the first preset dynamic comparison threshold R1 and less than or equal to the second preset dynamic comparison threshold R2, it indicates that the device is about to be triggered, and the trigger state is adjusted to the triggering state T2. When the on-resistance data is greater than the second preset dynamic comparison threshold R2, it indicates that the trigger is valid, and the trigger state is adjusted to the triggered state T3. The first preset dynamic comparison threshold R1 is less than the second preset dynamic comparison threshold R2.

[0038] The current triggering state is T2 (triggering state). When the on-resistance data is less than the third preset dynamic comparison threshold R3, the triggering is invalid, and the triggering state is adjusted to the pre-triggering state T1. When the on-resistance data is greater than the fourth preset dynamic comparison threshold R4, the triggering is valid, and the triggering state is adjusted to the triggered state T3. The third preset dynamic comparison threshold R3 is less than the fourth preset dynamic comparison threshold R4.

[0039] The current trigger state is triggered (T3). When the on-resistance data is less than the fifth preset dynamic comparison threshold R5, the trigger is released, and the trigger state is adjusted to the released state (T4). The current trigger state is released (T4). When the on-resistance data is greater than the sixth preset dynamic comparison threshold R6, the trigger is triggered again, and the trigger state is adjusted to the triggered state (T3).

[0040] Therefore, in this embodiment of the invention, for different contact states, the trigger state of the electromechanical switch measuring device at the current moment is determined by comparing the collected on-resistance data with the corresponding preset dynamic comparison threshold and assigning a state machine value, thereby realizing the deduction of the trigger state of the electromechanical switch measuring device at this time based on the contact state obtained from the analysis of the previous collection cycle and according to the preset reasonable state transition rules.

[0041] In some embodiments, after acquiring the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, multiple on-resistance data of a preset length can be saved as a resistance data sequence. Accordingly, the trigger state of the electromechanical switch measuring device can be adjusted according to the comparison result. When the current trigger state is triggered state T3 or the adjusted trigger state is triggered state T3, interpolation calculation can be performed on the multiple on-resistance data in the resistance data sequence to obtain a more accurate trigger time for the electromechanical switch measuring device, and the electromechanical switch measuring device can be triggered based on this trigger time.

[0042] Specifically, on-resistance data can be acquired according to a preset sampling period, and multiple on-resistance data sets of a preset length can be saved as a resistance data sequence. This embodiment of the invention does not specifically limit the preset length, i.e., the number of on-resistance data sets saved in the resistance data sequence. Currently, a threshold can be set for the on-resistance of an electromechanical switch. If the on-resistance exceeds this threshold, it is determined that the group of electromechanical switches has widened its gap and tends to separate, thus triggering the circuit. However, this method simply compares a single set threshold and cannot accurately identify the contact state, resulting in low accuracy in the trigger determination process.

[0043] In this embodiment of the invention, regardless of whether the current triggering state is triggered state T3, or after adjusting the transition from other triggering states to triggered state T3, interpolation calculations can be performed on multiple on-resistance acquisition data in the resistance data sequence to calculate a more accurate triggering time. Taking the example of saving five on-resistance acquisition data obtained according to a preset sampling period as a single resistance data sequence, the interpolation calculation process is explained. The five on-resistance acquisition data correspond to sampling points at five consecutive moments.

[0044] Since the on-resistance data at the current sampling point is not the same as the on-resistance data at the actual triggering time of the electromechanical switch measuring device, interpolation can be performed on the five on-resistance data obtained from continuous periodic sampling using the aforementioned five sampling points. The triggering time obtained through interpolation may be shifted forward by one or more, or by a non-integer number of sampling points, compared to the current time, thus obtaining the accurate triggering time after the shift. The shifted triggering time is the compensation value. After obtaining the trigger compensation value through interpolation, the triggering time is compensated based on this compensation value, and a trigger signal is sent to the electromechanical switch measuring device using the compensated triggering time as a reference to trigger the electromechanical switch measuring device.

[0045] For example, the on-resistance data collected at the aforementioned five sampling points are, for example but not limited to, 1KΩ, 2KΩ, 3KΩ, 4KΩ, and 5KΩ, respectively. The 5KΩ value represents the on-resistance data collected at the current moment, but it is not the on-resistance data collected at the actual trigger moment of the electromechanical switch-type measuring device. Therefore, interpolation can be used to process the aforementioned five resistance values, and the calculated result is, for example but not limited to, 2.3KΩ. The system control uses the moment when the on-resistance data is 2.3KΩ as a reference to trigger the electromechanical switch-type measuring device. The trigger moment corresponding to this moment is the accurate trigger moment, thereby achieving precise compensation and control of the trigger moment. It should be noted that the embodiments of the present invention do not limit the specific result of the interpolation operation. The on-resistance data collected at the accurate trigger moment can be obtained through multiple experiments. The purpose of the interpolation operation is to find the ideal trigger moment.

[0046] Therefore, in this embodiment of the invention, the current trigger state is integrated based on the previous contact state and the collected data sequence using multi-state dynamic threshold analysis. If a trigger event occurs, i.e., the trigger state is triggered state T3, a trigger signal is given based on the precise trigger timing calculated by interpolation. This effectively avoids misjudgment of the trigger state and provides a more accurate trigger signal, precisely identifying the trigger timing of the switch. Simultaneously, due to the stability of the trigger determination and the high resolution of the data interpolation calculation, the accuracy of the electromechanical switch-type measuring device can be effectively improved. Compared to trigger control without using a multi-state dynamic threshold data interpolation algorithm, where the standard deviation 2σ of multiple single-point touch measurements is generally greater than 0.6 micrometers and the range is greater than 2 micrometers, this embodiment of the invention uses interpolation to make the standard deviation 2σ of the measurement results approximately 0.3 micrometers and the range less than 1 micrometer.

[0047] In some embodiments, interpolating multiple on-resistance data in a resistance data sequence to obtain the trigger time of an electromechanical switch-type measuring device can be performed by linear interpolating multiple on-resistance data in a resistance data sequence to obtain the trigger time of an electromechanical switch-type measuring device.

[0048] Specifically, linear interpolation is preferred, that is, using an interpolation function that is a first-order polynomial to process multiple on-resistance data in the resistance data sequence to obtain the interpolation node with zero interpolation error, i.e., to obtain the on-resistance data corresponding to the precise trigger moment. This leverages the fast computation speed of linear interpolation to accelerate the acquisition of the trigger moment of the electromechanical switch-type measuring device, thereby speeding up the trigger response speed of the device and improving its measurement efficiency.

[0049] In some embodiments, such as Figure 2As shown, the trigger state of the electromechanical switch measuring device is adjusted according to the comparison result. When the current trigger state is the released state T4 or the adjusted trigger state is the released state T4, the duration of the released state T4 is obtained. If the duration is greater than the preset duration, the trigger state is adjusted to the pre-trigger state T1.

[0050] Specifically, regardless of whether the current trigger state is the released state T4, or whether the trigger state has been changed to the released state T4 after adjustment, the duration of the released state T4 needs to be compared with the preset duration. When the duration is greater than the preset duration, it is determined that the electromechanical switch measuring device has not been triggered for a relatively long time, and the electromechanical switch measuring device is waiting to be triggered again. Therefore, the trigger state is adjusted to the pre-trigger state T1, corresponding to... Figure 2 The state transition condition is that the timeout triggers the next loop. When the duration is less than or equal to the preset duration, the acquired on-resistance data is compared with the sixth preset dynamic comparison threshold R6. When the on-resistance data is greater than the sixth preset dynamic comparison threshold R6, the trigger state is adjusted from the released state T4 back to the triggered state T3.

[0051] It should be noted that the embodiments disclosed herein do not specifically limit the preset duration, and the preset duration can be set according to the actual operating conditions and actual operating parameters of the electromechanical switch measuring device.

[0052] For example, an analog-to-digital converter (ADC) can be used to acquire on-resistance data, i.e., to acquire contact resistance data. The ADC can acquire on-resistance data, for example, by obtaining the voltage level data after a resistor divider. Then, a microprocessor is used to filter the on-resistance data to remove jagged spikes, and to compare the resistance data and adjust the trigger state of the electromechanical switch-type measuring device based on the comparison result. Alternatively, the ADC can be an external ADC or implemented using a digital-to-analog converter sampling module integrated within the microprocessor.

[0053] Alternatively, a comparator can be used to acquire on-resistance data, i.e., to acquire contact resistance data. For example, a comparator can acquire on-resistance data by obtaining the voltage level data after a resistor divider. The comparator's input signal can correspond to a preset threshold value for the acquired data. The comparator's comparison process ensures the acquired data falls within the preset range, achieving initial filtering of abrupt changes in the acquired data. Then, a microprocessor is used to filter the acquired data to remove sudden spikes, compare the resistance data, and adjust the trigger state of the electromechanical switch-type measuring device based on the comparison result. Alternatively, the comparator function can be implemented using a comparator module integrated within the microprocessor, which helps reduce the implementation cost of the trigger adjustment method for the electromechanical switch-type measuring device and saves battery power.

[0054] Figure 3 This is a schematic diagram illustrating the specific process of the trigger adjustment method for the electromechanical switch-type measuring device provided by the present invention. For example... Figure 3 As shown, the triggering and adjustment method of the electromechanical switch-type measuring device specifically includes: Step 201: Initialize and start the measurement.

[0055] Specifically, after receiving the operation command, the electromechanical switch-type measuring device starts the measurement operation and executes the initialization program to initialize the state machine in the electromechanical switch-type measuring device.

[0056] Step 202: Collect data.

[0057] Specifically, for example, but not limited to, the voltage level data after resistor voltage division can be acquired by an analog-to-digital converter, and the voltage level data can be calculated and converted into the corresponding contact resistance data to obtain the on-resistance data of the conductive contact switch in the electromechanical switch measuring device.

[0058] Step 203: Filtering.

[0059] Specifically, based on the data acquisition patterns and noise reduction algorithms, abnormal data such as jumps in the acquired on-resistance data can be eliminated.

[0060] Step 204: Serialization.

[0061] Specifically, on-resistance data can be acquired according to a preset sampling period, and multiple on-resistance data of a preset length can be saved as a resistance data sequence.

[0062] Step 205: Is the current state T1? If yes, proceed to step 206; otherwise, proceed to step 207.

[0063] Step 206: Is R greater than R1 and less than or equal to R2? If yes, proceed to step 208; otherwise, proceed to step 209.

[0064] Step 207: Is the current state T2? If yes, proceed to step 211; otherwise, proceed to step 212.

[0065] Step 208, assign state T2.

[0066] Step 209: Is R greater than R2? If yes, proceed to step 210; otherwise, proceed to step 202.

[0067] Step 210, assign state T3.

[0068] Specifically, steps 205, 206, 208, 209, and 210 are explained as follows: if the current contact state is T1, and the on-resistance data R is greater than the second preset dynamic comparison threshold R2, the state is changed to T3; if the on-resistance data R is greater than the first preset dynamic comparison threshold R1 and less than or equal to the second preset dynamic comparison threshold R2, the state is changed to T2.

[0069] Step 211: Is R greater than R4? If yes, proceed to step 210; if no, proceed to step 213.

[0070] Step 212: Is the current state T3? If yes, proceed to step 215; otherwise, proceed to step 216.

[0071] Step 213: Is R less than R3? If yes, proceed to step 214; otherwise, proceed to step 202.

[0072] Step 214: Assign state T1.

[0073] Specifically, steps 207, 211, 210, 213, and 214 are explained as follows: if the current contact state is T2, and the on-resistance data R is greater than the fourth preset dynamic comparison threshold R4, the state is changed to T3; if the on-resistance data R is less than the third preset dynamic comparison threshold R3, the state is changed to T1.

[0074] Step 215: Interpolation calculation.

[0075] Step 216: Is R greater than R6? If yes, proceed to step 210; if no, proceed to step 217.

[0076] Step 217: Has it timed out? If yes, proceed to step 214; if no, proceed to step 202.

[0077] If the current contact state is T4 and the comparison parameter is greater than RG43, the state is changed to T3. Otherwise, the timeout is calculated. If a timeout occurs, the state is set to T1, and a new triggering loop is entered.

[0078] Specifically, steps 216 and 217 are explained as follows: If the current contact state is T4, and the on-resistance data R is greater than the sixth preset dynamic comparison threshold R6, the state is changed to T3; otherwise, it is determined whether a timeout has occurred. If a timeout has occurred, the state is changed to T1 to enter a new triggering loop. If no timeout has occurred, the state transition is determined based on the re-acquired data.

[0079] Step 218: Is R less than R5? If yes, proceed to step 219; otherwise, proceed to step 202.

[0080] Step 219, assign state T4.

[0081] Specifically, steps 212, 215, 218, and 219 are explained as follows: If the current contact state is T3, interpolation calculation is performed, that is, the precise trigger time is calculated by interpolation based on the parameter sequence, and a trigger signal is sent based on the calculated precise time. Then, when the on-resistance data R is less than the fifth preset dynamic comparison threshold R5, the state is changed to T4.

[0082] It should be noted that the corresponding branch returns to step 202, meaning the loop begins again from re-collecting data for the next time step. Additionally, for Figure 3 Interpolation calculations can be performed regardless of whether the current triggering state is already triggered (T3) or after transitioning from another triggering state to already triggered (T3) through adjustment. Figure 3 Interpolation calculations are performed after step 210. For example, after step 210 obtained by the logic in step 209, after step 210 obtained by the logic in step 211, and after step 210 obtained by the logic in step 216, interpolation calculations can be performed. Then, after the interpolation calculation, the state transition is performed again based on the data collected in the subsequent cycle. That is, after the aforementioned interpolation calculation, the process returns to step 202 to loop.

[0083] Electromechanical switch-type measuring devices, such as trigger-type probes, typically determine the on / off state and issue a trigger signal by detecting the overall resistance value of multiple series-connected mechanical conductive contacts and comparing it with a set threshold. This triggering method is widely used in trigger control scenarios for electromechanical switch-type measuring devices due to its simplicity.

[0084] However, since the relative movement of electromechanical switch contacts has no fixed direction and angle, and due to the influence of many factors such as contact oxidation, contamination and wear, simply comparing the overall resistance value with the set threshold to achieve trigger control cannot accurately identify the trigger state of the contacts. This results in problems such as low measurement accuracy, large pre-stroke and unstable operation of electromechanical switch measuring devices.

[0085] This invention, based on the contact state acquired in the previous acquisition cycle, calculates the current trigger state according to reasonable state transition rules, eliminating state anomalies and measurement errors caused by abnormal sampling data. Specifically, it acquires the contact resistance value of the contact switch and employs an optimized dynamic multi-threshold processing method. Based on the trigger state identified in the previous moment, it performs finite state transitions. That is, based on the previous contact state and the acquired data sequence, it integrates the current trigger state according to multi-state dynamic threshold analysis, accurately identifying the trigger timing of the switch. This allows the electromechanical switch-type measuring device to obtain more accurate and stable measurement results. If a trigger event occurs, the precise trigger timing is calculated by interpolation and reported to the host. While effectively avoiding misjudgment of the trigger state, it can provide a more accurate trigger signal, enabling the electromechanical switch-type measuring device to obtain more accurate measurement results at a lower cost.

[0086] The trigger adjustment device of the electromechanical switch type measuring device provided by the present invention is described below. The trigger adjustment device of the electromechanical switch type measuring device described below can be referred to in correspondence with the trigger adjustment method of the electromechanical switch type measuring device described above.

[0087] Figure 4 This is a schematic diagram of the logic structure of the trigger adjustment device of the electromechanical switch-type measuring device provided by the present invention. Figure 4 As shown, the trigger adjustment device of the electromechanical switch-type measuring device includes a parameter acquisition module 301, a threshold comparison module 302, and a trigger adjustment module 303. The parameter acquisition module 301 is used to acquire the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, and to acquire the current trigger state of the electromechanical switch-type measuring device based on the on-resistance data. The threshold comparison module 302 is used to select a preset dynamic comparison threshold based on the current trigger state, and to compare the on-resistance data with the preset dynamic comparison threshold. Different current trigger states correspond to different preset dynamic comparison thresholds. The trigger adjustment module 303 is used to adjust the trigger state of the electromechanical switch-type measuring device based on the comparison result.

[0088] Figure 5 This is a schematic diagram of the electronic circuit of the electromechanical switch-type measuring device provided by the present invention. Figure 5 As shown, the electromechanical switch-type measuring device may include: a microprocessor U1, a communication interface U2, and a computer program stored in the microprocessor U1 and running on the microprocessor U1. When the microprocessor U1 executes the computer program, it implements the trigger adjustment method of the electromechanical switch-type measuring device as described in the above embodiments.

[0089] The microprocessor (MCU) has internal memory. The power supply VCC forms a voltage divider circuit through resistor R1, a set of series-connected electromechanical contacts TR1 to TR6, and resistor R3. This voltage divider is connected to pin PA1 of the microprocessor U1 to connect to its built-in data acquisition circuit, allowing for data acquisition of the contact resistance under program instruction control. Pin PA14 of the microprocessor U1 is connected to the communication interface U2, such as an optocoupler, through resistor R4, enabling the output of a trigger signal. External systems can obtain the TRIG trigger signal through the output pin of the communication interface U2 and send it to a host computer or CNC system. The microprocessor U1 can call logic instructions from its internal memory to execute the trigger adjustment method of the electromechanical switch-type measuring device. This method includes: Acquire the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, and obtain the current triggering state of the electromechanical switch-type measuring device based on the on-resistance data; A preset dynamic comparison threshold is selected based on the current trigger state, and the on-resistance data is compared with the preset dynamic comparison threshold; the preset dynamic comparison threshold is different for different current trigger states; Adjust the trigger state of the electromechanical switch-type measuring device based on the comparison results.

[0090] Furthermore, the aforementioned logical instructions stored in the microprocessor U1 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium, such as the internal memory area of ​​the microprocessor.

[0091] On the other hand, the present invention also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer is able to execute the trigger adjustment method of the electromechanical switch-type measuring device provided by the above methods, the method comprising: Acquire the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, and obtain the current triggering state of the electromechanical switch-type measuring device based on the on-resistance data; A preset dynamic comparison threshold is selected based on the current trigger state, and the on-resistance data is compared with the preset dynamic comparison threshold; the preset dynamic comparison threshold is different for different current trigger states; Adjust the trigger state of the electromechanical switch-type measuring device based on the comparison results.

[0092] In another aspect, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements a trigger adjustment method for the electromechanical switch-type measuring device provided by the methods described above, the method comprising: Acquire the on-resistance data of the conductive contact switch in the electromechanical switch-type measuring device, and obtain the current triggering state of the electromechanical switch-type measuring device based on the on-resistance data; A preset dynamic comparison threshold is selected based on the current trigger state, and the on-resistance data is compared with the preset dynamic comparison threshold; the preset dynamic comparison threshold is different for different current trigger states; Adjust the trigger state of the electromechanical switch-type measuring device based on the comparison results.

[0093] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0094] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the parts that contribute to the prior art, can be embodied in the form of software products. Generally, the running program is stored in the internal memory area of ​​the microprocessor, executing the methods described in various embodiments or certain parts of the embodiments.

[0095] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A triggering and adjustment method for an electromechanical switch-type measuring device, characterized in that, include: Acquire the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, and obtain the current triggering state of the electromechanical switch measuring device based on the on-resistance data; A preset dynamic comparison threshold is selected based on the current trigger state, and the on-resistance data is compared with the preset dynamic comparison threshold; wherein, the preset dynamic comparison threshold is different for different current trigger states; Adjust the trigger state of the electromechanical switch-type measuring device according to the comparison results.

2. The triggering and adjustment method of the electromechanical switch-type measuring device according to claim 1, characterized in that, The step of selecting a preset dynamic comparison threshold based on the current trigger state and comparing the on-resistance acquisition data with the preset dynamic comparison threshold includes: When the current triggering state is a pre-triggering state, the on-resistance data is compared with a first preset dynamic comparison threshold, and the on-resistance data is compared with a second preset dynamic comparison threshold. When the current triggering state is the triggering state, the on-resistance data is compared with the third preset dynamic comparison threshold, and the on-resistance data is compared with the fourth preset dynamic comparison threshold. When the current triggering state is a triggered state, the on-resistance data is compared with the fifth preset dynamic comparison threshold. When the current trigger state is the released state, the on-resistance data is compared with the sixth preset dynamic comparison threshold.

3. The triggering and adjustment method of the electromechanical switch-type measuring device according to claim 2, characterized in that, Adjusting the trigger state of the electromechanical switch-type measuring device based on the comparison result includes: The current triggering state is a pre-triggering state. When the on-resistance data is greater than the first preset dynamic comparison threshold and less than or equal to the second preset dynamic comparison threshold, the triggering state is adjusted to a triggering state. When the on-resistance data is greater than the second preset dynamic comparison threshold, the triggering state is adjusted to a triggered state. Wherein, the first preset dynamic comparison threshold is less than the second preset dynamic comparison threshold. The current triggering state is the triggering state. When the on-resistance data is less than the third preset dynamic comparison threshold, the triggering state is adjusted to the pre-triggering state. When the on-resistance data is greater than the fourth preset dynamic comparison threshold, the triggering state is adjusted to the triggered state. The third preset dynamic comparison threshold is less than the fourth preset dynamic comparison threshold. The current trigger state is the triggered state. When the on-resistance data is less than the fifth preset dynamic comparison threshold, the trigger state is adjusted to the released state. The current trigger state is the released state. When the on-resistance data is greater than the sixth preset dynamic comparison threshold, the trigger state is adjusted to the triggered state.

4. The triggering and adjustment method of the electromechanical switch-type measuring device according to any one of claims 1-3, characterized in that, After acquiring the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, the method further includes: The collected on-resistance data of a preset length are saved as a resistance data sequence according to the collection order; Adjusting the trigger state of the electromechanical switch-type measuring device based on the comparison result includes: When the current trigger state is a triggered state or the adjusted trigger state is a triggered state, interpolation is performed on the multiple on-resistance data collected in the resistance data sequence to obtain the trigger time of the electromechanical switch measuring device, and the electromechanical switch measuring device is triggered according to the trigger time.

5. The triggering and adjustment method of the electromechanical switch-type measuring device according to claim 4, characterized in that, The step of interpolating multiple on-resistance data in the resistance data sequence to obtain the trigger time of the electromechanical switch-type measuring device includes: Linear interpolation is performed on multiple on-resistance data in the resistance data sequence to obtain the trigger time of the electromechanical switch-type measuring device.

6. The triggering and adjustment method of the electromechanical switch-type measuring device according to any one of claims 1-3, characterized in that, Adjusting the trigger state of the electromechanical switch-type measuring device based on the comparison result includes: When the current trigger state is a released state or the adjusted trigger state is a released state, obtain the duration of the released state; When the duration exceeds the preset duration, the trigger state is adjusted to a pre-trigger state.

7. The triggering and adjustment method of the electromechanical switch-type measuring device according to any one of claims 1-3, characterized in that, Before comparing the on-resistance data with the preset dynamic comparison threshold, the method further includes: The on-resistance data is subjected to noise filtering.

8. A triggering and adjusting device for an electromechanical switch-type measuring device, characterized in that, include: The parameter acquisition module is used to acquire the on-resistance data of the conductive contact switch in the electromechanical switch measuring device, and to acquire the current triggering state of the electromechanical switch measuring device based on the on-resistance data. The threshold comparison module is used to select a preset dynamic comparison threshold according to the current trigger state, and compare the on-resistance acquisition data with the preset dynamic comparison threshold; wherein, the preset dynamic comparison threshold is different for different current trigger states; The trigger adjustment module is used to adjust the trigger state of the electromechanical switch-type measuring device according to the comparison result.

9. An electromechanical switch-type measuring device, comprising a microprocessor, a communication interface, and a computer program stored in and running on the microprocessor, characterized in that, When the microprocessor executes the computer program, it implements the triggering and adjustment method of the electromechanical switch-type measuring device as described in any one of claims 1-7.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the triggering and adjustment method of the electromechanical switch-type measuring device as described in any one of claims 1-7.

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