HCT tester

Abstract

The invention discloses an HCT tester, and relates to the technical field of electrical variable testing of instruments and meters, the HCT tester comprises a cabinet, and the bottom of the cabinet is provided with a high-current power supply module; the multi-probe assembly comprises a support arranged in the cabinet, a plurality of sleeves fixedly connected to the support, probe rods slidably connected to the interiors of the sleeves and connected with the high-current power supply module, first springs arranged outside the probe rods in a sleeving mode, shells fixedly connected to the side faces of the sleeves, and arc-shaped scraping pieces rotationally connected to the lower portions of the shells. Through the sequential design of scraping and removing the film first and then conducting precisely, and in combination with the force control threshold value of the spring II and the stroke limit of the baffle plate, the oxide film removal effect is ensured, the test error caused by excessive scraping or poor contact is avoided, and compared with the prior art, on the premise that the service life of the probe is ensured, the test efficiency is improved. And the condition that the removed oxide film is remained at the tip of the probe to influence the on-resistance is also avoided.

Description

Technical Field

[0001] This invention relates to the field of electrical variable testing technology for instruments and meters, and more specifically, to an HCT tester. Background Technology

[0002] PCB boards and other components are commonly used in electrical instruments and meters such as power load control systems. High current testing is usually performed using an HCT tester. An HCT tester is a precision testing device specifically designed to evaluate the reliability of electronic equipment, circuit boards, and components under high current conditions. Its core function is to simulate the current load in actual operation to detect the current withstand capability, thermal stability, and electrical performance of the tested object, ensuring the safety and stability of the product under extreme conditions. The tester conducts electricity by making contact with the test point of the test object through a probe. To ensure the accuracy of the test, two core requirements must be met simultaneously: first, the oxide film on the surface of the test point must be removed to ensure effective conductivity between the probe and the test point; second, the pressure of the probe on the test point must be controlled to avoid damage to the test object.

[0003] In existing technology, a probe structure with a locking part has been proposed. This structure supports an inclined rod-shaped probe via a support component. When the probe is subjected to a compressive load exceeding a certain value axially, the locking part disengages from the contact part of the support component, causing the probe to undergo elastic deformation (e.g., bending at one end or compression of the main body). Oxide film removal is achieved by the probe tip sliding along the surface of the test point, while simultaneously suppressing excessive pressure force through load dispersion. This approach has made some progress in balancing pressure force and oxide film removal effectiveness, but it still has shortcomings that require further optimization in practical applications. Firstly, the removal of oxide film depends on the elastic deformation of the probe itself. During each detection process, the probe must undergo bending, compression and other deformation processes. Long-term and frequent deformation can easily lead to fatigue wear of the probe material, reducing the service life of the probe. This not only increases the maintenance cost and downtime of the equipment, but may also lead to incomplete removal of oxide film due to the decay of the probe's deformation capacity, affecting the stability of the detection.

[0004] Secondly, after the probe peels off the oxide film by sliding, the resulting oxide film debris tends to adhere to the probe tip or the contact area between the probe and the test point. As the contact process between the probe and the test point continues, these debris are difficult to detach naturally from the contact interface, resulting in increased contact resistance between the probe and the test point, interfering with the transmission and acquisition of the detection signal, and affecting the accuracy of the detection data.

[0005] To address the above problems, an HCT testing instrument is proposed. Summary of the Invention

[0006] To solve the above-mentioned technical problems, an HCT tester is provided, and this technical solution solves the problems mentioned in the background art.

[0007] To achieve the above objectives, the present invention can be implemented using the following technical solutions: This invention provides an HCT testing instrument, comprising: The server rack has a high-current power supply module at the bottom. A multi-probe assembly includes a bracket housed in a cabinet, multiple sleeves fixedly connected to the bracket, a probe rod slidably connected inside each sleeve and connected to a high-current power supply module, a spring one sleeved outside each probe rod, a housing fixedly connected to the side of each sleeve, an arc-shaped scraper rotatably connected to the bottom of each housing, a pinhole opened in the middle of each arc-shaped scraper, a baffle fixedly connected to the top of the rotating shaft of each arc-shaped scraper, a baffle fixedly connected inside each housing and located on the side of the baffle near the sleeve, an arc-shaped rod fixedly connected to the bottom of each housing and passing through the baffle, and a spring two sleeved outside each arc-shaped rod. The pinhole diameter is larger than the probe rod diameter, and when the arc-shaped scraper deflects at a certain angle, the pinhole will align with the probe rod. The fixing assembly includes a fixing base disposed below the bracket for fixing components; and, The alignment component, located above the support, is used to adjust the position of the support so that each probe rod is aligned and abuts against the test point of the component.

[0008] Furthermore, the fixing assembly also includes a linear slide fixedly mounted on the countertop, a fixing base fixedly mounted on the mover of the linear slide at the bottom, a limiting groove opened on the top of the fixing base for limiting the position of the components, an electric cylinder fixedly mounted on both ends of the mover of the linear slide, and a clamping plate fixedly connected to the telescopic ends of the two electric cylinders.

[0009] Furthermore, the fixing component also includes a hollow heat dissipation channel opened in the middle of the fixing base, and the hollow heat dissipation channel is connected to the limiting groove.

[0010] Furthermore, the alignment component includes a three-dimensional linear module system fixedly installed inside the cabinet and located above the bracket. The actuator of the three-dimensional linear module system can move freely in the horizontal and vertical planes. A bushing is fixedly connected to the side of the actuator of the three-dimensional linear module system. A motor is fixedly connected to the top of the bushing. A vertical shaft is vertically rotatably connected inside the bushing. The top of the vertical shaft is fixedly connected to the motor drive end. A ball sleeve is fixedly connected to the bottom of the vertical shaft. A universal ball joint is rotatably fitted inside the ball sleeve. The universal ball joint is fixedly connected to the top center of the bracket. Two side arms are fixedly connected to the side of the vertical shaft at a 90-degree angle. Electric cylinders are rotatably connected to one end of the two side arms. The telescopic ends of the two electric cylinders are rotatably connected to two corresponding points on the top of the bracket.

[0011] Furthermore, the alignment assembly also includes alignment cameras fixedly mounted at both ends of the bottom of the bracket.

[0012] Furthermore, it also includes a cooling assembly, which includes a fan fixedly installed at the top of the cabinet, a first nozzle fixedly installed in the middle of the bracket, and a second nozzle fixedly installed on the inner wall of one side of the cabinet, wherein the air outlet of the fan is connected to the air inlet of the first nozzle and the second nozzle respectively.

[0013] Furthermore, a flaw detection camera is fixedly installed on one side of the bottom of the bracket.

[0014] Furthermore, one end of the cabinet's platform is equipped with an operating position for operating the testing equipment.

[0015] Furthermore, a screen for displaying test data is provided on one side of the cabinet's surface.

[0016] Furthermore, the airflow direction of the second nozzle is opposite to the direction of the operating position.

[0017] As described above, the features and advantages of the HCT testing instrument of the present invention are as follows: This invention utilizes an independently designed arc-shaped scraper to remove oxide films, completely changing the traditional method that relies on probe deformation for film removal. During testing, the arc-shaped scraper deflects along an arc-shaped trajectory under the action of spring two and external pressure, removing the oxide film by scraping along the tangent between its bottom and the test point. The probe rod only passes through the pinhole of the scraper and makes contact with the test point after the scraper has completed film removal and deflected to a preset angle. In this process, the probe rod does not need to participate in the deformation of the film removal stage, but only bears the stable pressure required for contact and conduction, significantly reducing material fatigue loss. This design extends the overall service life of the multi-probe assembly, reduces the maintenance frequency and cost of the equipment, and avoids film removal failure caused by probe fatigue, thus improving the long-term operational stability of the testing equipment.

[0018] This invention effectively solves the problem of residual oxide film debris by employing a timing design of "scraping off the film first, then making contact and establishing continuity" and optimizing the arc-shaped scraping trajectory. During the deflection and film removal process, the oxide film debris detached from the test point surface is carried away by the arc-shaped movement trajectory of the scraper, avoiding the accumulation of debris in the contact area. Simultaneously, the probe rod only contacts the test point after the scraper has completed film removal and created clearance space, completely avoiding the risk of the probe rod tip directly contacting undetached oxide film debris. Furthermore, the independent structural design of the scraper and the probe rod prevents direct adhesion between them, further reducing the possibility of debris transfer and adhesion to the probe rod. The above design ensures a low-resistance, stable conductive contact between the probe rod and the test point, significantly improving the accuracy and reliability of the test data. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 for Figure 1 Another perspective diagram of the structure; Figure 3 This is a schematic diagram of the internal assembly structure of the cabinet shown in this invention; Figure 4 This is a schematic diagram of the assembly of the sleeve and the outer shell according to the present invention; Figure 5 This is a schematic diagram of the internal structure of the sleeve and outer shell shown in this invention; Figure 6 This is a schematic diagram showing the probe rod gradually engaging with the pinhole in an embodiment of the present invention; Figure 7 This is a schematic diagram of the fixed component structure shown in the present invention; Figure 8 This is a schematic diagram of the alignment component structure shown in this invention.

[0020] The reference numerals in the appendix of this invention are as follows: 11. Cabinet; 12. High-current power supply module; 13. Operating position; 14. Screen; 15. Flaw detector camera; Multi-probe assembly: 21. Support; 22. Sleeve; 23. Probe rod; 231. Spring 1; 24. Housing; 25. Arc-shaped scraper; 251. Pinhole; 26. Baffle; 27. Arc-shaped rod; 28. Spring 2; 29. ​​Baffle plate; Fixed components: 31. Linear slide; 32. Fixing base; 321. Limiting groove; 322. Hollowed-out heat dissipation channel; 33. Electric cylinder one; 34. Clamping plate; Alignment components: 41. 3D linear module system; 42. Bushing; 43. Vertical shaft; 44. Ball sleeve; 45. Universal ball joint; 46. Side arm; 47. Electric cylinder II; 48. Alignment camera; 49. Motor; Cooling components: 51. Fan; 52. First nozzle; 53. Second nozzle. Detailed Implementation

[0021] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0022] See Figures 1-8 As shown, an embodiment of the present invention is provided, and an HCT testing instrument will be described in detail below: See Figures 1-2As shown, the present invention provides an HCT tester, including a cabinet 11, a high current power supply module 12 at the bottom of the cabinet 11, an operation position 13 for operating the test equipment at one end of the table of the cabinet 11, and a screen 14 for displaying test data on one side of the table of the cabinet 11.

[0023] It should be noted that the high-current power supply module 12 is the core component of the HCT (High Current Tester), which mainly provides high-amplitude currents of tens to thousands of amperes to the test object. Some modules can be extended to tens of thousands of amperes or more through parallel connection of multiple modules. At the same time, it achieves high-precision control by relying on digital feedback and PID algorithm. It has built-in overcurrent and overheat protection circuits, which can cut off the output in milliseconds in case of abnormality. It is also compatible with communication protocols such as USB and RS485, and can realize remote parameter configuration and real-time data monitoring. It is an existing technology and will not be described in detail here.

[0024] See Figures 3-6 As shown, the HCT tester also includes a multi-probe assembly, which includes a bracket 21 housed in the cabinet 11 (the bracket 21 has precise three-dimensional position adjustment capability to facilitate precise alignment between the multi-probe assembly and components; the specific alignment method will be described below), multiple sleeves 22 fixedly connected to the bracket 21, probe rods 23 slidably connected inside each sleeve 22 and connected to the high-current power supply module 12, springs 231 sleeved on the outside of each probe rod 23, a housing 24 fixedly connected to the side of each sleeve 22, an arc-shaped scraper 25 rotatably connected to the bottom of each housing 24, and a needle opened in the middle of each arc-shaped scraper 25. The device includes a hole 251, a baffle 26 fixedly connected to the top of the rotating shaft of each arc-shaped scraper 25, a baffle 29 fixedly connected inside each housing 24 and located on the side of the baffle 26 near the sleeve 22, an arc-shaped rod 27 fixedly connected to the bottom of each housing 24 and passing through the baffle 26, and a spring 28 sleeved on the outside of each arc-shaped rod 27. The diameter of the hole 251 is larger than the diameter of the probe rod 23. When the arc-shaped scraper 25 deflects at a certain angle, the hole 251 will align with the probe rod 23. The baffle 26 has a hole that slides with the arc-shaped rod 27. The diameter of the hole on the baffle 26 is larger than the diameter of the arc-shaped rod 27 and smaller than the diameter of the spring 28.

[0025] It should be noted that the connection between the probe rod 23 and the high-current power supply module 12 adopts existing technology, which will not be elaborated on here. The connection between the probe rod 23 and the high-current power supply module 12 revolves around low impedance transmission, mechanical stability and heat dissipation, which are key aspects of high-current testing. The probe rod 23 mostly adopts a spring structure, which provides stable contact pressure through pre-compression. This can not only compensate for the displacement caused by thermal expansion or vibration, ensuring close contact between the probe tip and the test piece, but also shorten the distance and reduce the resistance by using the internal large cross-section (such as flat type, multi-strand stranded type) conductive path. The outer shell 24 is made of high-strength stainless steel to resist electromagnetic deformation, and is combined with an insulating layer to achieve safe isolation and Kelvin connection.

[0026] In terms of connection, it can be integrated through a modular interface via a dedicated high-current connector or flexible wire harness to form a low-inductance path. In dynamic testing, floating installation can also be used to optimize contact. The main body of the probe rod 23 is mostly made of copper alloy to balance conductivity and strength. The tip is nickel-plated / gold-plated to prevent oxidation and reduce resistance. When multiple probe rods 23 are connected in parallel, the load is balanced through current sharing technology. Combined with the millisecond-level overcurrent protection of the power supply module, it ensures stable transmission of high current and supports the current withstand and thermal stability testing requirements of PCB, power semiconductor and other devices.

[0027] When the above-mentioned multi-probe assembly is working, the control bracket 21 is first moved precisely within the cabinet 11 at the operation position 13, thereby driving each probe rod 23 to align with the corresponding test points of the component. Then the bracket 21 moves down, which will drive the arc-shaped scraper 25 to gradually come into contact with the test points of the component.

[0028] As the support 21 continues to apply downward pressure, the test point generates an upward vertical reaction force on the bottom of the arc-shaped scraper 25. Due to the rotation axis of the arc-shaped scraper 25 deviating from the line of action of the reaction force (specifically in this embodiment, the structural characteristic formed by the rotation axis of the arc-shaped scraper 25 being located on one side of the sleeve 22), a clockwise deflection torque is formed (with the sleeve 22 on the left and the outer shell 24 on the right as a reference position). At this time, the baffle 26 at the top of the rotation axis of the arc-shaped scraper 25 rotates synchronously with the arc-shaped scraper 25, along the arc... The rod 27 slides away from the sleeve 22 (in this embodiment, the center of the arc rod 27 coincides with the axis of rotation of the arc scraper 25), and squeezes the spring 28 sleeved outside the arc rod 27. The elastic force of the spring 28 and the limiting effect of the baffle 29 on the baffle 26 together form resistance, ensuring that the arc scraper 25 will only be effectively deflected when the pressure of the bracket 21 reaches the set threshold (sufficient to overcome the adhesion of the oxide film). During the deflection process, the bottom of the arc scraper 25 scrapes the surface of the test point tangentially along its own arc trajectory, peeling off the oxide film layer by layer, realizing the precise linkage of "pressure-scraping" of the probe rod 23.

[0029] When the arc-shaped scraper 25 deflects to the preset angle, the baffle 26 is blocked by the spring 28 under extreme compression. At this time, the pinhole 251 in the middle of the arc-shaped scraper 25 is exactly aligned with the axis of the probe rod 23 inside the sleeve 22. The bracket 21 continues to move down, and the probe rod 23 slides inside the sleeve 22. After passing through the pinhole 251, it directly comes into close contact with the test point that has been scraped. At the same time, the spring 231 sleeved outside the probe rod 23 is compressed. Its elastic deformation generates a stable contact pressure to ensure low resistance conduction between the probe rod 23 and the test point. Subsequently, the high current power supply module 12 loads the set current to the test point through the probe rod 23. The parameter monitoring module (a well-known technique in the art, namely monitoring the current, voltage, temperature and other data during the test, the results of which will be displayed on the screen 14 for the operator to view, which will not be elaborated here) synchronously collects the test data to complete the high current performance test of the component.

[0030] After the test, the bracket 21 returns to its original position, and the spring 231 releases its elastic potential energy to push the probe rod 23 back to its original position. At the same time, the spring 28 drives the baffle 26 to slide back along the arc rod 27, pulling the arc-shaped scraper 25 to rotate around the axis and return to its original position. The pinhole 251 and the axis of the probe rod 23 are misaligned again, waiting for the next test cycle. The whole process, through the timing design of "scraping to remove the film first, and then precise conduction", combined with the force control threshold of the spring 28 and the stroke limit of the baffle 29, not only ensures the oxide film removal effect, but also avoids test errors caused by excessive scraping or poor contact.

[0031] Compared to existing technologies, this method not only ensures the lifespan of the probe but also avoids the situation where the removed oxide film remains on the probe tip, affecting the on-resistance.

[0032] It should be emphasized that this solution can control the deflection torque of the arc-shaped scraper blade 25 by setting the elastic coefficient of the second spring 28. Obviously, by selecting different springs 28, it is possible to achieve a good removal effect on oxide films with different adhesion strengths.

[0033] For further details, please refer to [link / reference]. Figure 3 As shown, a flaw detection camera 15 is fixedly installed on one side of the bottom of the bracket 21.

[0034] It should be noted that the existing technology used in the flaw detector 15 plays a crucial auxiliary role in the entire process of high-current performance testing of components by the HCT tester, namely "defect pre-inspection and hidden danger investigation". Its core function is to screen the inherent defects of the components themselves (such as internal cracks, incomplete welding joints, pin root porosity, semiconductor chip package inclusions, etc.) through non-destructive testing before the components enter the HCT high-current test. This avoids these latent defects from causing misjudgments when high current is applied (such as misjudging "abnormal voltage drop caused by defects" as "compliance of component performance"). At the same time, it prevents defective components from being burned or cracked under high current, which could damage the multi-probe components or power supply module of the HCT tester. After the high-current test, it can also detect whether the components have suffered latent damage due to the high current load (such as internal wire fatigue cracks, latent ablation of pads), helping to distinguish whether the "test failure" is due to inherent defects of the components or damage caused by test stress.

[0035] See Figure 1 and Figure 7 As shown, the HCT tester also includes a fixing component, which includes a fixing seat 32 located below the bracket 21 for fixing components. The fixing component also includes a linear slide 31 fixedly installed on the table surface of the cabinet 11. The bottom of the fixing seat 32 is fixedly installed on the mover of the linear slide 31. A limiting groove 321 is opened on the top of the fixing seat 32 for limiting the position of the components. Electric cylinders 33 are fixedly installed at both ends of the mover of the linear slide 31. Clamping plates 34 are fixedly connected to the telescopic ends of the two electric cylinders 33. The fixing component also includes a hollow heat dissipation channel 322 opened in the middle of the fixing seat 32. The hollow heat dissipation channel 322 is connected to the limiting groove 321.

[0036] When the above structure is in operation: In the initial state, the mover of the linear slide 31 is in the initial position close to the operating position 13, the telescopic end of the electric cylinder 33 is in the fully extended state, the two side clamps 34 are in an open posture, and the limiting groove 321 at the top of the fixed seat 32 is in a continuous state with the hollow heat dissipation channel 322 in the middle, preparing for the loading of components.

[0037] During the pre-test loading stage, the operator places the component to be tested into the limiting groove 321 on the top of the fixed base 32. The shape of the limiting groove 321 matches the contour of the component, which can quickly achieve the initial positioning of the component and prevent it from shifting laterally during subsequent movement. Then, the electric cylinder 33 is started, and its telescopic end retracts synchronously, driving the two clamping plates 34 to move towards the component until the clamping plates 34 are tightly attached to the two side walls of the component. The electric cylinder 33 controls the clamping force through preset pressure parameters, which can not only fix the component firmly in the limiting groove 321 (preventing displacement due to vibration or pressure of the probe rod 23 during high current testing), but also avoid excessive clamping force that could cause deformation of the component.

[0038] After the components are fixed, the linear slide 31 starts to work. Its mover moves precisely along the preset trajectory, driving the fixed seat 32 and the clamped components to move synchronously until the test point of the component is aligned vertically with the probe rod 23 of the multi-probe assembly above (in conjunction with the three-dimensional adjustment of the bracket 21, the test point and the probe rod 23 are precisely aligned). At this time, the fixed assembly is positioned and waits for the multi-probe assembly to press down to perform scraping and continuity testing.

[0039] During high-current testing, the heat generated by the components due to current carrying will be rapidly dissipated through the through-structure of the limiting groove 321 and the hollow heat dissipation channel 322. The hollow channel can guide the airflow in the cabinet 11 to flow through the bottom and surrounding of the components, accelerate heat dissipation, avoid temporary changes in performance or permanent damage to the components due to local overheating, and ensure the accuracy of test data.

[0040] After the test, the multi-probe assembly moves upward and resets, the linear slide 31 drives the mover and the fixed seat 32 back to the initial position, then the electric cylinder 33 raises the clamping plate 34, and the operator can then take out the tested component from the limit groove 321. The fixed assembly returns to the initial state, waiting for the next test cycle.

[0041] See Figure 3 and Figure 8As shown, the HCT tester also includes an alignment component, which is located above the bracket 21 to adjust the position of the bracket 21 so that each probe rod 23 is aligned and abuts against the component test point. The alignment component includes a three-dimensional linear module system 41 fixedly installed inside the cabinet 11 and located above the bracket 21. The actuator of the three-dimensional linear module system 41 can move freely in the horizontal and vertical planes. A bushing 42 is fixedly connected to the side of the actuator of the three-dimensional linear module system 41, and a motor 49 is fixedly connected to the top of the bushing 42. A vertical shaft 43 is rotatably connected inside the bushing 42. The top end of the vertical shaft 43 is fixedly connected to the drive end of the motor 49. A ball sleeve 44 is fixedly connected to the bottom end of the vertical shaft 43. A universal ball head 45 is rotatably fitted inside the ball sleeve 44. The universal ball head 45 is fixedly connected to the top center of the bracket 21. Two side arms 46 are fixedly connected to the side of the vertical shaft 43 at a 90-degree angle. Electric cylinders 47 are rotatably connected to one end of the two side arms 46. The telescopic ends of the two electric cylinders 47 are rotatably connected to two corresponding points on the top of the bracket 21.

[0042] For further details, please refer to [link / reference]. Figure 3 As shown, the alignment assembly also includes alignment cameras 48 that are fixedly mounted at both ends of the bottom of the bracket 21.

[0043] The working process of the HCT tester alignment component revolves around the precise alignment of the probe rod 23 and the component test point through "coarse adjustment + fine adjustment". This is achieved through the large-range movement of the three-dimensional linear module system 41, the fine-tuning of the attitude of the motor 49 and the second electric cylinder 47, combined with the visual feedback from the alignment camera 48, thus realizing efficient alignment between the probe rod 23 and the test point. The specific process is as follows: Step 1: After the test is started, the fixing component has completed the clamping and initial movement of the components. At this time, the alignment camera 48 of the alignment component is activated first to capture images of the test points of the components on the fixing base 32. After the image data is transmitted to the control system, the system quickly calculates the initial positional deviation between the component test points and the probe rod 23 (including the horizontal X / Y offset and the vertical height difference). Subsequently, the three-dimensional linear module system 41 is activated, and its actuator drives the bushing 42, motor 49, vertical shaft 43 and the support 21 below to move synchronously: in the horizontal plane, the actuator translates along the X and Y axes to compensate for the horizontal offset between the test points and the probe rod 23; in the vertical plane, the actuator fine-tunes the height to maintain a suitable distance between the bottom of the probe rod 23 and the component test points, completing the "coarse alignment" and laying the foundation for subsequent fine adjustment.

[0044] Step 2: After the rough alignment is completed, the 3D linear module system 41 stops operating, and the alignment camera 48 takes a second picture to capture more precise positional deviations (including the horizontal rotation angle deviation and tilt deviation of the bracket 21).

[0045] Horizontal rotation adjustment: If there is a rotational deviation, the motor 49 starts and drives the vertical shaft 43 to rotate inside the bushing 42. The vertical shaft 43 rotates together with the two side arms 46 on the side, and then drives the bracket 21 to rotate through the rotation of the electric cylinder 47 (the lateral interaction force between the side arms 46, the electric cylinder 47 and the bracket 21 pulls the bracket 21 to rotate around the vertical shaft 43) until the rotation angle of the bracket 21 is corrected and the probe rod 23 is circumferentially aligned with the test point.

[0046] Tilt posture adjustment: If there is a tilt deviation in the front-back or left-right direction (causing some probe rods 23 to be at different heights from the test points), the two electric cylinders 47 at a 90-degree angle will act according to the deviation signal: for example, when the front end of the bracket 21 is too low, the telescopic end of the electric cylinder 47 on the corresponding front side will extend, pushing the front end of the bracket 21 upward; when the right side of the bracket 21 is too high, the telescopic end of the electric cylinder 47 on the corresponding right side will retract, pulling the right side of the bracket 21 downward. During this process, the universal ball joint 45 rotates flexibly in the ball sleeve 44, providing a flexible fulcrum for the tilt adjustment of the bracket 21, ensuring that the adjustment process is smooth and without jamming. The alignment camera 48 provides real-time feedback of the adjusted image, and the control system repeatedly corrects the actions of the motor 49 and the electric cylinder 47 until the axis of each probe rod 23 is precisely aligned with the corresponding component test point, and the fine alignment process ends.

[0047] Step 3: After alignment, the actuator of the three-dimensional linear module system 41 drives the bracket 21 to move slowly downward, so that the arc-shaped scraper 25 of the multi-probe assembly first contacts the test point to scrape off the oxide film. Then the probe rod 23 passes through the pin hole 251 and abuts against the test point, entering the high current test stage. At this time, the electric cylinder 47 maintains its current extension state, and the universal ball head 45 and the ball sleeve 44 are tightly engaged to provide stable support for the bracket 21 and avoid the probe pressure causing the bracket 21 to shift its posture during the test.

[0048] After the test, the actuator of the three-dimensional linear module system 41 drives the bracket 21 to move upward and reset, the telescopic end of the electric cylinder 47 returns to the center position, the motor 49 drives the vertical shaft 43 to rotate back to the initial angle, the bracket 21 returns to the horizontal posture, and finally, the three-dimensional linear module system 41 drives the entire alignment component and the bracket 21 back to the initial position, the alignment camera 48 is turned off, and it waits for the next test cycle.

[0049] The entire process utilizes a closed-loop control system of "visual feedback + mechanical fine-tuning," combined with the "wide-range movement" of the three-dimensional linear module and the "high-precision attitude adjustment" of motor 49 and electric cylinder 2 47, to achieve efficient and accurate alignment between probe rod 23 and test point, providing a core guarantee for the accuracy of high current testing.

[0050] It should be noted that both the aforementioned three-dimensional linear module system 41 and the alignment camera 48 utilize existing technology products. The three-dimensional linear module system 41 is the core modular device for achieving precise spatial motion. It consists of three orthogonal linear modules for X, Y, and Z directions, corresponding to horizontal, vertical, and longitudinal movements in a Cartesian coordinate system (see the specific implementation details in this embodiment). Figures 2-3 As shown, the horizontal motion mechanism includes a horizontal linear module fixedly installed on the inner wall of one side of the cabinet 11, and a slide rail fixedly installed parallel to the inner wall of the opposite side. The vertical mechanism includes a vertical linear module fixedly installed on the two moving parts of the horizontal linear module and the slide rail at both ends. The vertical mechanism includes a vertical linear module fixedly installed on the moving part of the vertical linear module. The single-axis module is selected according to the requirements to use ball screw (high precision, repeatability ±0.01mm level) or synchronous belt (high speed, suitable for long stroke) transmission. It is combined with servo / stepper motor and encoder to form closed-loop control. During operation, after the control system analyzes the target coordinates, it drives the three-axis module to move together and drive the load (such as the probe bracket 21 of the HCT tester) to complete translation, lifting and other actions. In HCT testing, the probe and the component are first coarsely adjusted over a large range, and then the fine adjustment structure is used to complete the precise alignment from millimeter level to micrometer level.

[0051] The alignment camera 48 is a key component for visual positioning. It typically uses an industrial CCD / CMOS camera with a lens that matches the focal length. It is usually fixed to a moving part (such as the bracket 21) or a stationary structure in the cabinet 11. During operation, the camera captures images of the component test points and probe rods 23, and transmits the image data to the control system. The system uses template matching and feature extraction algorithms to calculate the positional deviation (such as X / Y offset and rotation angle) between the probe rods 23 and the test points, and feeds back the deviation signal to the drive mechanism (such as the three-dimensional linear module system 41 and the electric cylinder 47). In HCT testing, it provides real-time visual closed-loop feedback to ensure that each probe rod 23 is accurately aligned with the component test points, which is the core guarantee for improving alignment accuracy.

[0052] See Figures 2-3 As shown, the HCT tester also includes a cooling assembly, which includes a fan 51 fixedly installed at the top of the cabinet 11, a first nozzle 52 fixedly installed in the middle of the bracket 21, and a second nozzle 53 fixedly installed on the inner wall of one side of the cabinet 11. The air blowing direction of the second nozzle 53 is away from the operating position 13 (in this embodiment, it is installed below the horizontal straight module to improve the operator's testing comfort). The air outlet of the fan 51 is connected to the air inlets of the first nozzle 52 and the second nozzle 53, respectively.

[0053] After the test is completed, the high-pressure airflow is blown by the fan 51 to the first nozzle 52 and the second nozzle 53. The first nozzle 52 directly dissipates heat from the surface of the component, while the second nozzle 53 blows the hot air away from the operating position 13.

[0054] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0055] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An HCT testing instrument, characterized in that, include: The cabinet (11) has a high current power supply module (12) at the bottom. The multi-probe assembly includes a bracket (21) housed in a cabinet (11), multiple sleeves (22) fixedly connected to the bracket (21), probe rods (23) slidably connected inside each sleeve (22) and connected to a high-current power supply module (12), a spring (231) sleeved on the outside of each probe rod (23), a housing (24) fixedly connected to the side of each sleeve (22), an arc-shaped scraper (25) rotatably connected to the bottom of each housing (24), and a pinhole (251) opened in the middle of each arc-shaped scraper (25). A baffle (26) is connected to the top of the rotating shaft of each arc-shaped scraper (25), a baffle (29) is fixedly connected inside each housing (24) and located on the side of the baffle (26) near the sleeve (22), an arc-shaped rod (27) is fixedly connected to the bottom of each housing (24) and passes through the baffle (26), and a spring (28) is sleeved on the outside of each arc-shaped rod (27). The diameter of the pinhole (251) is larger than the diameter of the probe rod (23). When the arc-shaped scraper (25) deflects at a certain angle, the pinhole (251) will be aligned with the probe rod (23). The fixing assembly includes a fixing base (32) disposed below the bracket (21) for fixing components; and, The alignment component is located above the bracket (21) to adjust the position of the bracket (21) so that each probe rod (23) is aligned and abuts against the test point of the component.

2. The HCT testing instrument according to claim 1, characterized in that: The fixing assembly also includes a linear slide (31) fixedly installed on the table of the cabinet (11), a fixing seat (32) fixedly installed on the mover of the linear slide (31) at the bottom, a limiting groove (321) opened on the top of the fixing seat (32) for limiting the position of the components, an electric cylinder (33) fixedly installed at both ends of the mover of the linear slide (31), and a clamp (34) fixedly connected to the telescopic ends of the two electric cylinders (33).

3. The HCT testing instrument according to claim 2, characterized in that: The fixing component also includes a hollow heat dissipation channel (322) opened in the middle of the fixing base (32), and the hollow heat dissipation channel (322) is connected to the limiting groove (321).

4. The HCT testing instrument according to claim 3, characterized in that: The alignment component includes a three-dimensional linear module system (41) fixedly installed inside the cabinet (11) and located above the bracket (21). The actuator of the three-dimensional linear module system (41) is free to move in the horizontal and vertical planes. A bushing (42) is fixedly connected to the side of the actuator of the three-dimensional linear module system (41). A motor (49) is fixedly connected to the top of the bushing (42). A vertical shaft (43) is vertically rotatably connected inside the bushing (42). The top of the vertical shaft (43) is connected to the motor (49). The drive end is fixedly connected to a ball sleeve (44) at the bottom of the vertical shaft (43), and a universal ball head (45) is rotatably fitted inside the ball sleeve (44). The universal ball head (45) is fixedly connected to the top center of the bracket (21). Two side arms (46) are fixedly connected to the side of the vertical shaft (43) at a 90-degree angle, and two electric cylinders (47) are rotatably connected to one end of the two side arms (46). The telescopic ends of the two electric cylinders (47) are rotatably connected to the two points on the top of the bracket (21) respectively.

5. An HCT testing instrument according to claim 4, characterized in that: The alignment assembly also includes alignment cameras (48) fixedly mounted at both ends of the bottom of the bracket (21).

6. An HCT testing instrument according to claim 5, characterized in that: It also includes a cooling assembly, which includes a fan (51) fixedly installed at the top of the cabinet (11), a first nozzle (52) fixedly installed in the middle of the bracket (21), and a second nozzle (53) fixedly installed on the inner wall of one side of the cabinet (11), wherein the air outlet of the fan (51) is connected to the air inlet of the first nozzle (52) and the second nozzle (53) respectively.

7. An HCT testing instrument according to claim 6, characterized in that: A flaw detection camera (15) is fixedly installed on one side of the bottom of the bracket (21).

8. An HCT testing instrument according to claim 7, characterized in that: The cabinet (11) has an operating position (13) at one end of the table for operating the test equipment.

9. An HCT testing instrument according to claim 8, characterized in that: A screen (14) for displaying test data is provided on one side of the tabletop of the cabinet (11).

10. An HCT testing instrument according to claim 9, characterized in that: The blowing direction of the second nozzle (53) is opposite to the direction of the operating position (13).

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