Connector performance detection method
By simultaneously acquiring micro-strain signals and contact resistance signals at the base of the pins, and dividing the insertion and removal events into time periods, the deformation and hysteresis characteristic values are calculated, a performance degradation coefficient is generated, and trend analysis is performed. This solves the problem of performance degradation monitoring for sheathless L-type pin connectors, and achieves early warning and improved accuracy.
Patent Information
- Application Number
- CN202511310766.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-15
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2045-09-15
AI Technical Summary
In the existing technology, the dynamic correlation analysis method of vibration signal and contact resistance cannot effectively monitor the mechanical and electrical performance degradation of the sheathless L-type pin connector, especially the stress concentration at the pin root during repeated insertion and removal, which leads to deformation accumulation and contact surface offset.
Strain gauges are used to simultaneously acquire micro-strain signals and contact resistance signals at the root of the insertion pin. Combined with insertion and removal events, analysis time periods are divided, deformation characteristic values and hysteresis characteristic values are calculated, performance degradation coefficients are generated, and early warning is triggered through trend separation processing.
It enables early performance degradation monitoring of unsheathed L-type pin connectors, improving monitoring accuracy and reducing maintenance costs. It can provide early warning when the pins show invisible bending deformation, thus avoiding equipment failure.