Direct-current voltage proportion standard device calibration method and system based on quantum voltage

Abstract

The invention discloses a direct-current voltage proportion standard device calibration method based on quantum voltage, and discloses a device, a terminal and a medium with the method. According to the calibration method for the direct-current voltage proportion standard device based on the quantum voltage, accurate measurement of the high-voltage side voltage and the low-voltage side voltage of the direct-current voltage proportion standard device is achieved based on the quantum voltage precise measurement technology, and high-accuracy voltage proportion magnitude measurement is achieved; meanwhile, resistance temperature coefficients of the direct-current voltage proportion standard device at different voltages are monitored, resistance temperature control over the direct-current voltage proportion standard device is achieved through an incubator, and the voltage coefficient of the direct-current voltage proportion standard device is obtained by means of the relation between the voltage coefficient and the resistance temperature coefficient of the direct-current voltage proportion standard device. High-accuracy calibration of the direct-current voltage proportion standard device can be achieved under the low voltage, the proportion quantity value is directly traced to the quantum voltage standard, and a new method is provided for quantity value traceability of the direct-current voltage proportion standard device.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of electrical measurement and metrology, in particular to a direct current voltage ratio standard device calibration method and system based on quantum voltage. BACKGROUND

[0002] Self-calibration of direct current voltage ratio value by direct measurement method can achieve high accuracy level. However, this method not only needs to design complex reference voltage circuit and measurement test, but also needs to measure voltage difference at high potential, so the technical difficulty is great, and the applicable voltage level is low, generally not more than 1000V. A bootstrap test circuit uses Zener voltage standard, zero indicator and a reference divider to obtain 100V / 10V and 1000V / 100V ratio values, with uncertainties of 2×10 -7 and 5×10 -7 ; in addition, a reverse staggered test circuit uses a zero indicator and a reference divider to obtain 100V / 10V and 1000V / 100V ratio values, with uncertainties of 2×10 -7 and 5×10 -7 ; a bridge test circuit uses two direct current standard voltage sources and a high-precision digital voltmeter to obtain 1000V / 10V ratio value, with uncertainty of 1×10 -7 ; a comparison test circuit uses two digital voltmeters for segmented measurement at high potential to obtain (20V-1000V) / 10V ratio value, with uncertainty of 1.5×10 -7 ; a segmented calibration test circuit uses a potential-suspended reference voltage standard to obtain 1000V / 10V and 100V / 10V ratio values, with uncertainties of 3×10 -7 and 2×10 -7 ; a two-step difference measurement test circuit uses a developed high potential voltage difference measurement device to obtain (20V-1000V) / 10V ratio value, with uncertainty better than 2×10 -7 ; an experimental reference divider is established by using a 13-bit binary divider, and under the condition that the external load is known, the error of the binary resistance divider can theoretically reach better than 1×10 -7 ; a two-step difference measurement test circuit uses a developed high potential voltage difference measurement device to obtain (20V-1000V) / 10V ratio value, with uncertainty better than 2×10 -7 .

[0003] The new electric energy standard device based on quantum voltage can measure voltage amplitude up to 120V, current of 5A, frequency range of (50-1000) Hz, and measurement uncertainty of 4.9*10 -6 The invention patents "a merging unit verification instrument traceability method and system (patent number: 202411753633.X)", "a calibration system and method for an electronic mutual inductor verification instrument (patent number: 202011069131.7)", and "a calibration method for a voltage ratio standard and a quantum voltage measurement system (patent number: 202210590034.5)" disclose quantum traceability methods for digital metrology standards such as merging unit verification instruments and electronic mutual inductor verification instruments, and quantum traceability methods for analog metrology standard voltage ratio standards, which provide technical support for quantum voltage in metrology standard quantum traceability research, but there is no public disclosure of calibration method research based on quantum voltage based on quantum voltage based on quantum voltage. At present, quantum technology is used to establish a direct current voltage reference, and a self-calibration method is used for direct current voltage ratio value traceability. Quantum voltage technology can be theoretically applied to direct current voltage ratio value traceability, which is beneficial to improve the traceability accuracy, but when applied to 10V / 1V value traceability, impedance matching of quantum voltage, standard device and differential sampling equipment, traceability result and self-calibration result consistency evaluation, etc. When the direct current voltage ratio value is expanded from 10V / 1V to 1000V / 100V and 100V / 10V, the standard device optimization design, the proportion value expansion error accumulation and other problems need to be considered. SUMMARY

[0004] The present application aims to at least solve one of the technical problems existing in the prior art. To this end, the present application proposes a calibration method for a direct current voltage ratio standard device based on quantum voltage, which on the one hand realizes accurate measurement of the high voltage side voltage and the low voltage side voltage of the direct current voltage ratio standard device based on quantum voltage precision measurement technology, realizes high-accuracy voltage ratio value measurement, and on the other hand, by monitoring the resistance temperature coefficient of the direct current voltage ratio standard device at different voltages, and using a temperature box to realize resistance temperature control of the direct current voltage ratio standard device, the voltage coefficient of the direct current voltage ratio standard device is obtained by means of the relationship between the voltage coefficient and the resistance temperature coefficient of the direct current voltage ratio standard device.

[0005] The present application also proposes a device, a terminal and a medium with a calibration method for a direct current voltage ratio standard device based on quantum voltage.

[0006] The calibration method for a direct current voltage ratio standard device based on quantum voltage according to the first aspect embodiment of the present application is characterized in that it comprises the following steps:

[0007] A direct current voltage U1-Ux is applied to the high voltage side of the direct current voltage ratio standard device, and the temperature values T1-Tx of the high voltage arm resistor under different voltages are measured as preset values of the temperature;

[0008] The high voltage arm resistor is placed in a temperature box, and the temperature is adjusted to the preset values T1-Tx; the ratio K1-Kx of the high voltage side voltage to the low voltage side voltage under the preset temperature is measured; the measuring device is a double-channel programmable quantum voltage standard device, and the two differential sampling channels measure the high voltage arm and the low voltage arm, respectively;

[0009] The high voltage side of the direct current voltage ratio standard device is applied with a direct current voltage U1-Ux, and the ratio K1-Kx of the high voltage side voltage to the low voltage side voltage under the preset temperature is constructed to form a corresponding relationship between the applied voltage and the ratio, so as to realize the calibration of the direct current voltage ratio standard device based on the quantum voltage.

[0010] The calibration method of the direct current voltage ratio standard device based on the quantum voltage according to the embodiment of the present application can realize high-accuracy calibration of the direct current voltage ratio standard device under low voltage, and directly trace the proportional value to the quantum voltage standard, thereby providing a new method for value tracing of the direct current voltage ratio standard device.

[0011] According to some embodiments of the present application, the range of the direct current voltage U1-Ux applied to the high voltage side of the direct current voltage ratio standard device is 20V-1000V.

[0012] According to some embodiments of the present application, the step of measuring the ratio K1-Kx of the high voltage side voltage to the low voltage side voltage under the preset temperature comprises:

[0013] The first differential sampling channel of the quantum voltage standard device forms a high voltage side voltage measurement system with the first differential sampling channel;

[0014] The second differential sampling channel of the quantum voltage standard device forms a low voltage side voltage measurement system with the second differential sampling channel;

[0015] The proportional measurement unit calculates the ratio of the high voltage side voltage to the low voltage side voltage.

[0016] According to some embodiments of the present application, in the step of placing the high voltage arm resistor in the temperature box and adjusting the temperature to the preset values T1-Tx, a 10V voltage is applied by an external standard voltage source.

[0017] The calibration device of the direct current voltage ratio standard device based on the quantum voltage according to the second aspect embodiment of the present application comprises:

[0018] A temperature measuring module is capable of applying a direct current voltage U1-Ux to the high voltage side of the direct current voltage ratio standard device, measuring the temperature values T1-Tx of the high voltage arm resistor at different voltages as preset values of temperature;

[0019] A ratio value measuring module is capable of placing the high voltage arm resistor in a temperature box, adjusting the temperature to the preset values T1-Tx, and measuring the ratio K1-Kx of the high voltage side voltage to the low voltage side voltage at the preset temperature values; wherein the measuring device is a double-channel programmable quantum voltage standard device, and the two differential sampling channels measure the high voltage arm and the low voltage arm respectively;

[0020] A calibration module is capable of applying the direct current voltage U1-Ux to the high voltage side of the direct current voltage ratio standard device, and constructing a corresponding relationship between the applied voltage and the ratio K1-Kx of the high voltage side voltage to the low voltage side voltage at the preset temperature values, to realize the calibration of the direct current voltage ratio standard device based on quantum voltage.

[0021] According to some embodiments of the present application, the range of the direct current voltage U1-Ux applied to the high voltage side of the direct current voltage ratio standard device is 20V-1000V.

[0022] According to some embodiments of the present application, the ratio value measuring module comprises:

[0023] A first differential sampling channel of the quantum voltage standard device forms a high voltage side voltage measuring system with the first differential sampling channel;

[0024] A second differential sampling channel of the quantum voltage standard device forms a low voltage side voltage measuring system with the second differential sampling channel;

[0025] A ratio measuring unit calculates the ratio of the high voltage side voltage to the low voltage side voltage.

[0026] According to some embodiments of the present application, in the step of placing the high voltage arm resistor in a temperature box and adjusting the temperature to the preset values T1-Tx in the ratio value measuring module, an external standard voltage source is used to apply a 10V voltage.

[0027] The terminal according to the third aspect of the present application comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the above-mentioned calibration method of the direct current voltage ratio standard device based on quantum voltage.

[0028] According to the fourth aspect of the present application, a computer readable storage medium is provided, which stores computer executable instructions for executing the above-mentioned calibration method of the direct current voltage ratio standard device based on quantum voltage.

[0029] Additional aspects and advantages of the present application will be made apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0030] The above and / or additional aspects and advantages of the present application will become apparent and be readily appreciated from the following description, taken in conjunction with the accompanying drawings, in which:

[0031] Figure 1 A schematic diagram of steps of a quantum voltage based DC voltage ratio standard device calibration method according to an embodiment of the present application;

[0032] Figure 2 A logic block diagram of a quantum voltage based DC voltage ratio standard device calibration method according to an embodiment of the present application;

[0033] Figure 3 A structure block diagram of a quantum voltage based DC voltage ratio standard device calibration device according to an embodiment of the present application. DETAILED DESCRIPTION

[0034] Embodiments of the present application are described below in detail with reference to the accompanying drawings, in which like or similar elements are denoted by the same or similar reference signs, and the embodiments described below are examples for explaining the present application, and should not be construed as limiting the present application.

[0035] In the description of the present application, it should be understood that the orientation description, such as up, down, front, back, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be construed as limiting the present application.

[0036] In the description of the present application, several meanings are one or more, and the meaning of multiple is two or more, greater than, less than, more than, etc. are understood as not including the number, above, below, etc. are understood as including the number. If the first, second is described, it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or the order of technical features indicated.

[0037] In the description of the present application, unless otherwise explicitly limited, the words such as setting, installing, connecting, etc. should be broadly understood, and the person skilled in the art can reasonably determine the specific meaning of the above words in the present application in combination with the specific content of the technical solution.

[0038] The existing DC voltage ratio standard device calibration method based on quantum voltage cannot avoid the error caused by the heating effect of the resistor at different voltages and the voltage measuring instrument. The calibration of the DC voltage ratio standard device is essentially to measure the proportional coefficient of the DC voltage ratio standard device at different voltages, also known as the voltage coefficient.

[0039] On the one hand, the heating degree of the resistor of the DC voltage ratio standard device is different at different voltages, and the resistance value will drift due to the temperature coefficient, thereby affecting the voltage proportional value. Therefore, the voltage coefficient of the DC voltage ratio standard device is related to the temperature coefficient of the resistor, and the existing calibration method does not involve the measurement of the temperature coefficient of the resistor of the DC voltage ratio standard device. On the other hand, the proportional value of the DC voltage ratio standard device is actually the ratio of the high-voltage side voltage to the low-voltage side voltage, and the measurement accuracy of the two voltages will directly affect the accuracy of the proportional value. The existing calibration method mostly uses an 8-bit half digital multimeter to directly measure the high-voltage side voltage and the low-voltage side voltage of the DC voltage ratio standard device, or uses a nanovoltmeter to measure the differential voltage value of the DC voltage ratio standard device and the auxiliary voltage divider, and the accuracy is limited by the accuracy of the measuring instrument.

[0040] Embodiment one

[0041] Based on the limitations of the prior art, the present application provides a DC voltage ratio standard device calibration method based on quantum voltage, which can realize high-accuracy calibration of the DC voltage ratio standard device at low voltage and directly trace the proportional value to the quantum voltage standard, thereby providing a new method for the value traceability of the DC voltage ratio standard device. As shown in Figure 1 The specific steps include the following steps:

[0042] Step S100, a DC voltage U1-Ux is applied to the high-voltage side of the DC voltage ratio standard device, and the temperature values T1-Tx of the high-voltage arm resistor at different voltages are measured as the preset values of the temperature.

[0043] The DC voltage ratio standard device is composed of a high-voltage arm resistor and a low-voltage arm resistor as shown in Figure 2 A standard voltage source is used to apply a DC voltage Ux to the high-voltage side of the DC voltage ratio standard device, and Ux ranges from 20V to 1000V. At each voltage Ux, the resistance temperature value Tx of the DC voltage ratio standard device is measured to obtain the resistance temperature coefficient of the DC voltage ratio standard device at different voltages. For example, when U1, U2, U3, U4, U5, …, Ux voltages, the high-voltage arm resistance temperature values of the DC voltage ratio standard device are T1, T2, T3, T4, T5, …, Tx, respectively.

[0044] Step S200, the high-voltage arm resistor is placed in a temperature box, and the temperature is adjusted to a preset value T1-Tx; the ratio K1-Kx of the high-voltage side voltage to the low-voltage side voltage at the preset temperature is measured; wherein the measuring device is a double-channel programmable quantum voltage standard device, and two differential sampling channels respectively measure the high-voltage arm and the low-voltage arm.

[0045] The high-voltage arm resistor of the direct current voltage ratio standard device is placed in a temperature box or a container with constant temperature control, and the temperature of the high-voltage arm resistor of the direct current voltage ratio standard device is adjusted to a set temperature value through temperature adjustment.

[0046] Secondly, a quantum ratio measurement system is formed by using a quantum voltage standard device with double-channel programmable quantum voltage output, two differential sampling channels (differential sampling channel 1 and differential sampling channel 2 respectively), and a proportional measurement unit.

[0047] Finally, the standard voltage source outputs a 10V voltage, the temperature of the high-voltage arm resistor of the direct current voltage ratio standard device is set to T1, T2, T3, T4, T5, … Tx respectively through temperature adjustment, and the quantum ratio measurement system is used to obtain the ratio of the high-voltage side voltage to the low-voltage side voltage of the direct current voltage ratio standard device, which is K1, K2, K3, K4, K5, … Kx respectively.

[0048] Further, with reference to Figure 2 , when measuring the ratio of the high-voltage side voltage to the low-voltage side voltage of the direct current voltage ratio standard device, a quantum voltage standard device with double-channel programmable quantum voltage output is used. The quantum voltage output circuit OUT1 of the quantum voltage standard device and the differential sampling channel 1 constitute a voltage measurement system for measuring the high-voltage side voltage of the direct current voltage ratio standard device, and the quantum voltage output circuit OUT2 of the quantum voltage standard device and the differential sampling channel 2 also constitute a voltage measurement system for measuring the low-voltage side voltage of the direct current voltage ratio standard device.

[0049] The measured high-voltage side voltage and low-voltage side voltage are transmitted to the proportional measurement unit through the differential sampling channel 1 and the differential sampling channel 2 respectively, and the ratio of the high-voltage side voltage to the low-voltage side voltage is calculated in the proportional measurement unit

[0050] Step S300, the high-voltage side of the direct current voltage ratio standard device is applied with a direct current voltage U1-Ux, and the ratio K1-Kx of the high-voltage side voltage to the low-voltage side voltage at the preset temperature is constructed to establish a corresponding relationship between the applied voltage and the ratio, so as to realize quantum voltage-based calibration of the direct current voltage ratio standard device.

[0051] When voltages U1, U2, U3, U4, U5, ... Ux are applied to the high-voltage side of the DC voltage proportional standard device, the corresponding ratios of the high-voltage side voltage to the low-voltage side voltage of the DC voltage proportional standard device are K1, K2, K3, K4, K5, ... Kx, respectively. Based on the above comparison relationship, the calibration of the DC voltage proportional standard device is realized.

[0052] Example 2

[0053] Another embodiment of the present invention provides a calibration device for a DC voltage proportional standard device based on quantum voltage, such as... Figure 3 As shown, the device 30 includes:

[0054] The temperature measurement module 301 is capable of applying DC voltage U1 to Ux to the high-voltage side of the DC voltage proportional standard device and measuring the temperature values ​​T1 to Tx of the high-voltage arm resistance under different voltages, which are used as preset temperature values.

[0055] The proportional value measurement module 302 is capable of placing the high-voltage arm resistor in a temperature chamber and adjusting the temperature to a preset value T1 to Tx; measuring the ratio K1 to Kx of the high-voltage side voltage to the low-voltage side voltage at the preset temperature; wherein the measuring device is a dual-channel programmable quantum voltage standard device, and the two differential sampling channels measure the high-voltage arm and the low-voltage arm respectively;

[0056] The calibration module 303 is capable of constructing a correspondence between the applied DC voltage U1 to Ux on the high-voltage side of the DC voltage proportional standard device and the ratio K1 to Kx of the voltage on the high-voltage side to the voltage on the low-voltage side at the preset temperature, thereby realizing the calibration of the DC voltage proportional standard device based on quantum voltage.

[0057] Preferably, the range of DC voltage U1 to Ux applied to the high-voltage side of the DC voltage proportional standard device is 20V to 1000V.

[0058] Preferably, the proportionality measurement module 302 includes:

[0059] The first differential sampling channel of the quantum voltage standard device, together with the first differential sampling channel, constitutes a high-voltage side voltage measurement system;

[0060] The second differential sampling channel of the quantum voltage standard device, together with the second differential sampling channel, constitutes a low-voltage side voltage measurement system;

[0061] The proportional measurement unit calculates the ratio of the high-voltage side voltage to the low-voltage side voltage.

[0062] Preferably, in the proportional measurement module 302, during the step of placing the high-voltage arm resistor in a temperature chamber and adjusting the temperature to a preset value T1 to Tx, a 10V voltage is also applied through an external standard voltage source.

[0063] Furthermore, another aspect of the present invention provides a terminal comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the above-described calibration method for a quantum voltage-based DC voltage ratio standard device.

[0064] Specifically, the processor can be a CPU, a general-purpose processor, a DSP, an ASIC, an FPGA, or other programmable logic device, transistor logic device, hardware component, or any combination thereof. It can implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. The processor can also be a combination that implements computational functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.

[0065] Specifically, the processor connects to the memory via a bus, which may include a path for transmitting information. The bus can be a PCI bus or an EISA bus, etc. The bus can be divided into address bus, data bus, control bus, etc.

[0066] The memory may be ROM or other types of static storage devices that can store static information and instructions, RAM or other types of dynamic storage devices that can store information and instructions, or EEPROM, CD-ROM or other optical disc storage, optical disc storage (including compressed optical discs, laser discs, optical discs, digital universal optical discs, Blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer, but is not limited thereto.

[0067] Optionally, the memory stores the code of the computer program that executes the scheme of this application, and the execution is controlled by the processor. The processor executes the application code stored in the memory to implement... Figure 3 The operation of the calibration device of the DC voltage ratio standard device based on quantum voltage provided in the illustrated embodiment.

[0068] Another embodiment of this application provides a computer-readable storage medium storing computer-executable instructions for performing the above-described... Figure 1 The calibration method for a DC voltage proportional standard device based on quantum voltage is shown.

[0069] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0070] It will be understood by those skilled in the art that all or some of the steps and systems in the methods disclosed above can be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components can be implemented as software executed by a processor, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, which can include computer storage media (or non-transitory media) and communication media (or transient media). As is known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technologies, CD-ROM, digital versatile disc (DVD) or other optical disc storage, magnetic cartridges, magnetic tape, disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and is accessible to a computer. Furthermore, as is known to those skilled in the art, communication media typically contain computer-readable instructions, data structures, program modules, or other data in modulated data signals such as carrier waves or other transmission mechanisms, and may include any information delivery medium.

[0071] The above is a detailed description of the preferred embodiments of this application, but this application is not limited to the above embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of this application, and these equivalent modifications or substitutions are all included within the scope defined by the claims of this application.

Claims

1. A calibration method for a DC voltage proportional standard device based on quantum voltage, characterized in that, Includes the following steps: Apply DC voltages U1 to Ux to the high-voltage side of the DC voltage proportional standard device, and measure the temperature values ​​T1 to Tx of the high-voltage arm resistance under different voltages, which are used as preset temperature values. The high-voltage arm resistor is placed in a temperature chamber, and the temperature is adjusted to a preset value T1 to Tx; the ratio K1 to Kx of the voltage on the high-voltage side and the voltage on the low-voltage side at the preset temperature is measured; wherein, the measuring device is a dual-channel programmable quantum voltage standard device, and the two differential sampling channels measure the high-voltage arm and the low-voltage arm respectively; A DC voltage U1 to Ux is applied to the high-voltage side of the DC voltage proportional standard device, and a correspondence between the applied voltage and the ratio K1 to Kx of the high-voltage side voltage and the low-voltage side voltage at the preset temperature is established to realize the calibration of the DC voltage proportional standard device based on quantum voltage.

2. The method according to claim 1, characterized in that, The range of DC voltage U1 to Ux applied to the high-voltage side of the DC voltage proportional standard device is 20V to 1000V.

3. The method according to claim 1, characterized in that, The step of measuring the ratio K1 to Kx of the high-voltage side voltage to the low-voltage side voltage at the preset temperature includes: The first differential sampling channel of the quantum voltage standard device, together with the first differential sampling channel, constitutes a high-voltage side voltage measurement system; The second differential sampling channel of the quantum voltage standard device, together with the second differential sampling channel, constitutes a low-voltage side voltage measurement system; The proportional measurement unit calculates the ratio of the high-voltage side voltage to the low-voltage side voltage.

4. The method according to claim 1, characterized in that, In the step of placing the high-voltage arm resistor in a temperature chamber and adjusting the temperature to a preset value T1 to Tx, a 10V voltage is also applied through an external standard voltage source.

5. A calibration device for a DC voltage proportional standard based on quantum voltage, characterized in that, include: The temperature measurement module can apply DC voltage U1 to Ux to the high-voltage side of the DC voltage proportional standard device and measure the temperature values ​​T1 to Tx of the high-voltage arm resistance under different voltages, which are used as preset temperature values. The proportional measurement module can place the high-voltage arm resistor in a temperature chamber and adjust the temperature to a preset value T1 to Tx; measure the ratio K1 to Kx of the high-voltage side voltage to the low-voltage side voltage at the preset temperature; wherein the measuring device is a dual-channel programmable quantum voltage standard device, and the two differential sampling channels measure the high-voltage arm and the low-voltage arm respectively; The calibration module is capable of applying DC voltages U1 to Ux to the high-voltage side of the DC voltage proportional standard device and constructing a correspondence between the applied voltage and the ratio K1 to Kx of the voltage on the high-voltage side and the voltage on the low-voltage side at the preset temperature, thereby realizing the calibration of the DC voltage proportional standard device based on quantum voltage.

6. The apparatus according to claim 5, characterized in that, The range of DC voltage U1 to Ux applied to the high-voltage side of the DC voltage proportional standard device is 20V to 1000V.

7. The apparatus according to claim 5, characterized in that, The proportional measurement module includes: The first differential sampling channel of the quantum voltage standard device, together with the first differential sampling channel, constitutes a high-voltage side voltage measurement system; The second differential sampling channel of the quantum voltage standard device, together with the second differential sampling channel, constitutes a low-voltage side voltage measurement system; The proportional measurement unit calculates the ratio of the high-voltage side voltage to the low-voltage side voltage.

8. The apparatus according to claim 5, characterized in that, In the proportional measurement module, during the step of placing the high-voltage arm resistor in a temperature chamber and adjusting the temperature to a preset value T1 to Tx, a 10V voltage is also applied through an external standard voltage source.

9. A terminal, comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that the processor executes the computer program to implement the method of any one of claims 1 to 7.

10. A computer-readable storage medium storing computer-executable instructions for performing the method of any one of claims 1 to 7.

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