WiFi near-field probe structure and test system

Abstract

The invention relates to a WiFi near-field probe structure and a test system, the probe structure comprises a shell, a probe assembly and a sleeve assembly, and the probe assembly is arranged in the shell; the sleeve assembly is provided with a conductive sleeve and a telescopic adjusting piece, the conductive sleeve is arranged in the shell and sleeves the probe assembly, the telescopic adjusting piece is arranged outside the shell, and the telescopic adjusting piece is used for adjusting the conductive sleeve to move in the axial direction; and the conductive sleeve is electrically connected with the common ground of the probe assembly, so that efficient WiFi near-field detection is realized. The probe assembly is sleeved with the telescopic conductive sleeve, an effective tool for actively resisting the hand capacitance effect and environmental noise is provided for an operator, external interference can be reduced to the maximum extent by stretching out the sleeve in key measurement, and therefore more stable, reliable and repeatable measurement data can be obtained; the dual functions of mechanical protection and radio frequency shielding are achieved, the reliability and durability of measurement are improved, and the system integration degree is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of WiFi probe, in particular to a WiFi near-field probe structure and a test system. BACKGROUND

[0002] The WiFi near-field probe is a near-field probe specially designed for the complex electromagnetic environment generated by wireless local area network (WLAN) devices, especially devices complying with IEEE 802.11 series standards and working in 2.4GHz, 5GHz and 6GHz frequency bands.

[0003] At present, the existing WiFi near-field probe has low system integration, low measurement reliability and poor probe durability. SUMMARY

[0004] Therefore, it is necessary to provide a WiFi near-field probe structure and a test system with high system integration, high measurement reliability and high durability to solve the problems of the existing WiFi near-field probe.

[0005] To achieve the above purpose, the embodiment of the present application provides a WiFi near-field probe structure, which comprises:

[0006] a shell;

[0007] a probe assembly arranged in the shell;

[0008] a sleeve assembly, the sleeve assembly is provided with a conductive sleeve and an extension adjusting piece, the conductive sleeve is arranged in the shell and sleeved on the probe assembly, the extension adjusting piece is arranged outside the shell, and the extension adjusting piece is used for adjusting the movement of the conductive sleeve in the axial direction; the conductive sleeve is electrically connected with the common ground of the probe assembly.

[0009] In one embodiment, the probe assembly comprises a tip, a probe plunger and an elastic piece; the tip is connected to the first end of the probe plunger, and the elastic piece is arranged corresponding to the second end of the probe plunger.

[0010] When the tip abuts against the measured object, the probe plunger applies pressure to the elastic piece, so that the elastic piece deforms; when the tip is separated from the measured object, the elastic piece applies a rebound force to the probe plunger, so that the elastic piece restores the deformation.

[0011] In one embodiment, the probe assembly further comprises an ESD protection circuit.

[0012] The ESD protection circuit is arranged between the second end of the probe plunger and the elastic piece, and the ESD protection circuit is electrically connected with the second end of the probe plunger.

[0013] In one embodiment, the elastic piece is a flexible and compliant structure.

[0014] In one of the embodiments, the outer surface of the probe plunger and the tip part is provided with a first metal layer, and a second metal layer is arranged on the first metal layer; the first metal layer is a nickel layer, and the second metal layer is a gold layer.

[0015] In one of the embodiments, the WiFi near-field probe structure further comprises an impedance matching connector, which is used to connect the test equipment and the probe assembly.

[0016] In one of the embodiments, the conductive sleeve is provided with an elastic contact piece.

[0017] The elastic contact piece is electrically connected to the common ground of the probe assembly.

[0018] In one of the embodiments, the shell is provided with an inner shell and an outer shell.

[0019] At least part of the probe assembly and at least part of the conductive sleeve are arranged in the inner shell; the inner shell is provided with a through hole, and the probe assembly and the conductive sleeve protrude from the inner shell through the through hole.

[0020] The outer shell is arranged outside the inner shell, and there is a gap between the outer shell and the inner shell.

[0021] In one of the embodiments, the material of the outer shell is a self-repairing polymer.

[0022] The material of the inner shell is polycarbonate or polyphenylene sulfide.

[0023] In another aspect, the application also provides a test system, which comprises a test equipment and a WiFi near-field probe structure according to any one of the above embodiments.

[0024] The test equipment is connected to the WiFi near-field probe structure.

[0025] One of the above technical solutions has the following advantages and beneficial effects:

[0026] In each of the above embodiments of the WiFi near-field probe structure, the shell, the probe assembly and the sleeve assembly are included, and the probe assembly is arranged in the shell; the sleeve assembly is provided with a conductive sleeve and an extension adjusting piece, the conductive sleeve is arranged in the shell and sleeved on the outside of the probe assembly, and the extension adjusting piece is arranged outside the shell and used to adjust the movement of the conductive sleeve in the axial direction; the conductive sleeve is electrically connected to the common ground of the probe assembly, and high-efficiency WiFi near-field detection is realized. The application provides an effective tool for the operator to actively resist the hand capacitance effect and environmental noise by sleeving the extendable conductive sleeve on the outside of the probe assembly. By extending the sleeve in the key measurement, the external interference can be minimized, so that more stable, reliable and repeatable measurement data can be obtained. The WiFi near-field probe structure has the dual functions of mechanical protection and radio frequency shielding, improves the reliability and durability of the measurement, and improves the system integration. BRIEF DESCRIPTION OF DRAWINGS

[0027] Figure 1 Fig. 1 is a schematic diagram of a WiFi near field probe structure in one embodiment.

[0028] Reference Signs:

[0029] 10, housing; 110, inner housing; 120, outer housing; 20, probe assembly; 210, tip portion; 220, probe plunger; 230, spring; 240, ESD protection circuit; 30, sleeve assembly; 310, conductive sleeve; 312, spring contact; 320, telescoping adjustment; 40, impedance matching connector. DETAILED DESCRIPTION

[0030] In order to better understand the present application, the following will describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work should fall within the scope of protection of the present application.

[0031] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a list of steps or units does not necessarily limit to those clearly listed steps or units, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0032] In addition, the term "a plurality of" should mean two and more than two.

[0033] It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict. The present application will be described in detail below with reference to the drawings and in combination with the embodiments.

[0034] In one embodiment, as Figure 1As shown, a WiFi near-field probe structure is provided, which comprises a shell 10, a probe assembly 20 and a sleeve assembly 30, the probe assembly 20 is arranged in the shell 10; the sleeve assembly 30 is provided with a conductive sleeve 310 and a telescopic adjusting member 320, the conductive sleeve 310 is arranged in the shell 10 and sleeved outside the probe assembly 20, the telescopic adjusting member 320 is arranged outside the shell 10, and the telescopic adjusting member 320 is used for adjusting the movement of the conductive sleeve 310 in the axial direction; the conductive sleeve 310 is electrically connected with the common ground of the probe assembly 20.

[0035] The shell 10 has a receiving cavity for accommodating the probe assembly 20 and the conductive sleeve 310. The shape of the shell 10 can be set based on the holding manner of the operator, and the overall shape of the shell 10 has a comfortable holding curve and an anti-slip texture, which ensures that the operator does not easily get tired during long-time use and the operation is stable.

[0036] The probe assembly 20 is used for contacting the measured object to detect the signal of the measured object. For example, when the WiFi near-field probe structure is connected to the test equipment through a connecting line, the probe assembly 20 transmits the detected signal to the test equipment, so that the test equipment analyzes the signal and displays the analysis result.

[0037] The sleeve assembly 30 comprises the conductive sleeve 310, at least part of the conductive sleeve 310 is arranged in the receiving cavity of the shell 10, at least part of the conductive sleeve 310 protrudes from the shell 10, the telescopic adjusting member 320 is arranged on the conductive sleeve 310 and exposed outside the shell 10, so that the user can adjust the extension or retraction of the conductive sleeve 310 by operating the telescopic adjusting member 320. For example, when the conductive sleeve 310 is fully extended, the conductive sleeve 310 can cover and protect the probe assembly 20, effectively resist accidental collision, scratching and wear from the side, significantly improve the physical survival ability of the probe assembly 20 in complex operating environment, and enhance the mechanical protection function of the probe structure.

[0038] For example, the conductive sleeve 310 can be a cylindrical tube formed by precision machining, and the material of the conductive sleeve 310 is a high-conductivity material, such as anodized aluminum, conductive polymer or light alloy coated with a conductive layer. The conductive sleeve 310 is sleeved outside the probe assembly 20 and can slide in the axial direction. The extension and retraction control process of the conductive sleeve 310 can be achieved by driving the pin inside the conductive sleeve 310 to move in the spiral groove on the outer wall of the probe assembly 20 through the telescopic adjusting member 320. It needs to be noted that mechanical positioning points are provided at the fully extended and fully retracted positions of the conductive sleeve 310 to ensure stable locking at the selected positions.

[0039] When the conductive sleeve 310 is extended, it effectively extends the Faraday cage structure of the probe assembly 20, covering the potential joint gaps of the tip portion 210 of the probe assembly 20. These gaps are the main path of radio frequency leakage in the conventional design. The application forms an over-cutoff waveguide structure for external interference fields through the extended conductive sleeve 310, which can effectively attenuate electromagnetic waves higher than its cutoff frequency, thereby significantly improving the overall shielding performance and anti-interference capability of the probe assembly 20, and realizing the tunable active radio frequency shielding function.

[0040] When the operator holds the probe structure for precise measurement, the extended conductive sleeve 310 extends towards the tip of the probe assembly 20, can intercept the electric field lines from the operator's hand, and guide them into the ground plane, greatly reducing the capacitive coupling between the operator's hand and the signal sensitive area of the probe assembly 20, thereby effectively suppressing the hand capacitance effect that causes unstable measurement results. The operator can flexibly adjust according to the test requirements, for example, when performing large-scale rapid scanning, the conductive sleeve 310 can be retracted to obtain more flexible operability; when high-precision and high-stability point measurement is required, the conductive sleeve 310 can be extended to obtain the best shielding effect and measurement repeatability, effectively suppressing the hand capacitance effect, and realizing the synergistic effect of mechanical protection and radio frequency shielding of the probe structure.

[0041] In the above embodiment, the probe assembly 20 is arranged in the shell 10; the sleeve assembly 30 is provided with the conductive sleeve 310 and the telescopic adjusting member 320, the conductive sleeve 310 is arranged in the shell 10 and sleeved outside the probe assembly 20, the telescopic adjusting member 320 is arranged outside the shell 10, and the telescopic adjusting member 320 is used for adjusting the movement of the conductive sleeve 310 in the axial direction; the conductive sleeve 310 is electrically connected with the common ground of the probe assembly 20, and high-efficiency WiFi near-field detection is realized. The application provides an effective tool for the operator to actively resist the hand capacitance effect and environmental noise by sleeving the telescopic conductive sleeve 310 outside the probe assembly 20. By extending the sleeve in key measurement, external interference can be minimized, so that more stable, reliable and repeatable measurement data can be obtained, and the application has the dual functions of mechanical protection and radio frequency shielding, improves the reliability and durability of measurement, and improves the system integration.

[0042] In one embodiment, as Figure 1As shown, the probe assembly 20 comprises a tip portion 210, a probe plunger 220 and an elastic member 230; the tip portion 210 is connected to a first end of the probe plunger 220, and the elastic member 230 is arranged corresponding to a second end of the probe plunger 220; when the tip portion 210 abuts against the measured object, the probe plunger 220 applies pressure to the elastic member 230, so that the elastic member 230 deforms; when the tip portion 210 is separated from the measured object, the elastic member 230 applies a springback force to the probe plunger 220, so that the elastic member 230 restores the deformation.

[0043] The tip portion 210 is the most precise and most vulnerable part of the probe assembly 20, and is also the starting point of signal pickup. The tip portion 210 and the first end of the probe plunger 220 can be connected by threads or buckles, etc., so that the operator can quickly replace the tip portion 210 when it is damaged or needs to be replaced with a different type of tip portion 210. For example, the tip portion 210 can be an elastic retractable probe; the tip portion 210 is made of beryllium copper (BeCu) alloy which has elasticity and conductivity.

[0044] The second end of the probe plunger 220 is arranged adjacent to the elastic member 230, for example, the second end of the probe plunger 220 can be arranged on the elastic member 230 by clamping or the like, so that when the tip portion 210 of the probe assembly 20 abuts against the measured object, the probe plunger 220 applies pressure to the elastic member 230, so that the elastic member 230 is compressed and deformed; when the tip portion 210 is separated from the measured object, the elastic member 230 applies a springback force to the probe plunger 220, so that the elastic member 230 rebounds and restores the deformation, thereby absorbing the axial impact of the probe plunger 220, effectively buffering the lateral impact and torsional stress, and improving the measurement accuracy and reliability of the probe structure.

[0045] In one embodiment, as shown in Figure 1 The probe assembly 20 further comprises an ESD protection circuit 240; the ESD protection circuit 240 is arranged between the second end of the probe plunger 220 and the elastic member 230, and the ESD protection circuit 240 is electrically connected to the second end of the probe plunger 220.

[0046] The ESD protection circuit can be arranged on a miniaturized printed circuit board (PCB), thereby improving the integration of the system. The ESD protection circuit 240 can be composed of one or more TVS (Transient Voltage Suppression) diodes. The parasitic capacitance of the ESD protection circuit 240 is typically less than 0.3 pF, and is designed to protect the USB 3.0, HDMI and other high-speed data lines or radio frequency antenna interfaces, thereby reducing the disturbance of high-frequency signals.

[0047] It should be noted that when designing the wiring of the micro-PCB, the connecting line of the probe assembly 20, the TVS diode and its connecting wire are taken as a whole to construct a microstrip transmission environment. By accurately calculating and optimizing the geometric size (width, length, distance from the ground layer) of the wire through simulation software (such as ADS), the parasitic capacitance of the TVS diode is effectively absorbed into the input matching network of the entire probe assembly 20. Finally, the entire probe assembly 20 presents a characteristic impedance close to the preset 50 ohms in the target working frequency band (such as 2.4-6 GHz), thereby solving the problem of serious signal reflection and insertion loss caused by the traditional ESD protection scheme, and realizing reliable ESD protection for the probe assembly 20 without sacrificing any radio frequency performance.

[0048] In the above embodiment, by setting the ESD protection circuit 240 inside the probe assembly 20, the destructive influence of the parasitic parameters of the protection device on high-frequency signals is solved, while providing strong ESD protection capability, ensuring extremely low insertion loss and excellent return loss of the probe assembly 20 in the entire WiFi frequency band, and guaranteeing the highest fidelity of the measurement results.

[0049] In one embodiment, the elastic member 230 is a flexible compliant structure.

[0050] The flexible compliant structure is formed of a high-performance polymer. For example, the material of the flexible compliant structure can be polyether ether ketone (PEEK) or polyetherimide (Ultem). It should be noted that the flexible compliant structure can realize movement by using the elastic deformation of the material itself, without relying on traditional rigid joints such as pins and sliders.

[0051] For example, based on the second end of the probe plunger 220 being arranged in the flexible compliant structure, when the tip portion 210 abuts against the measured object, the probe plunger 220 applies pressure to the flexible compliant structure, causing the flexible compliant structure to deform; when the tip portion 210 is separated from the measured object, the flexible compliant structure applies a springback force to the probe plunger 220, causing the flexible compliant structure to recover from the deformation,

[0052] Through the ingenious geometric design (such as beams, thin walls, torsion structures) of the flexible compliant structure, precise control of multi-axial flexibility can be provided, which not only absorbs the axial impact from the probe plunger 220, but also effectively buffers the lateral impact and torsional stress, providing the probe assembly 20 with all-around impact protection far beyond that of traditional springs, ensuring that the probe assembly 20 can accurately reset after being disturbed, guaranteeing the long-term consistency of the measurement and improving the reliability of the measurement.

[0053] In the above embodiment, by arranging the flexible compliant structure at the second end of the probe plunger 220, various complex physical impacts can be effectively coped with; and the polymer shell 120 with self-repairing capability can resist wear and tear in daily use, so that the probe assembly 20 is far superior to the conventional products in physical durability, enhances the durability of the product, significantly prolongs the effective service life, and reduces the cost.

[0054] In one embodiment, the outer surface of the probe plunger 220 and the tip portion 210 is provided with a first metal layer, and a second metal layer is arranged on the first metal layer; the first metal layer is a nickel layer, and the second metal layer is a gold layer.

[0055] The thickness of the first metal layer is greater than the thickness of the second metal layer. For example, the first metal layer is a 100-micro-inch nickel layer, and the second metal layer is a 30-50-micro-inch gold layer.

[0056] The outer surface of the probe plunger 220 and the tip portion 210 can be electroplated based on an electroplating process to form the first metal layer, and then the second metal layer is electroplated on the first metal layer. For example, in order to ensure the best performance and the longest life, a composite electroplating process is used on the surface of the probe plunger 220 and the tip portion 210, a relatively thick hard nickel layer is first plated as a wear-resistant and diffusion-resistant base to form the first metal layer; and then a hard gold layer with a thickness less than the first metal layer is plated on the surface of the first metal layer to achieve extremely low contact resistance and excellent corrosion and wear resistance, and to ensure stable performance after multiple contact cycles.

[0057] In one embodiment, as shown in Figure 1 The WiFi near-field probe structure further includes an impedance matching connector 40, which is used to connect the test equipment and the probe assembly 20.

[0058] The impedance matching connector 40 can be a coaxial connector, and the coaxial connector can be a 50-ohm coaxial connector. The coaxial connector has a signal transmission line for transmitting the signal detected by the probe assembly 20.

[0059] Based on the fact that one end of the impedance matching connector 40 is electrically connected to the probe assembly 20, the other end of the impedance matching connector 40 can be connected to the test equipment through plugging, and then the probe assembly 20 can transmit the detected signal to the test equipment in real time, so that the received signal can be analyzed and displayed by the test equipment, ensuring the integrity of the signal display. It should be noted that the test equipment can be a spectrum analyzer.

[0060] In one embodiment, as shown in Figure 1 The conductive sleeve 310 is provided with an elastic contact piece 312; and the elastic contact piece 312 is electrically connected to the common ground of the probe assembly 20.

[0061] The elastic contact 312 is a low-impedance elastic contact 312, for example, the elastic contact 312 can be a beryllium copper elastic contact. The common ground of the probe assembly 20 is electrically connected to the outer conductor of the impedance matching connector 40.

[0062] For example, the elastic contact 312 can be arranged on the inner wall of the conductive sleeve 310, one end of the elastic contact 312 can be electrically connected to the conductive sleeve 310 by welding or the like, and the other end of the elastic contact 312 can be electrically connected to the common ground of the probe assembly 20 by welding or crimping, so that the conductive sleeve 310 and the common ground of the probe assembly 20 are always in reliable electrical connection, avoiding the disconnection between the conductive sleeve 310 and the probe assembly 20 during the expansion and contraction of the conductive sleeve 310, and improving the active radio frequency shielding reliability of the conductive sleeve 310.

[0063] In one embodiment, as shown in Figure 1 The shell 10 is provided with an inner shell 110 and an outer shell 120; at least part of the probe assembly 20 and at least part of the conductive sleeve 310 are arranged in the inner shell 110; the inner shell 110 is provided with a through hole, and the probe assembly 20 and the conductive sleeve 310 protrude from the inner shell 110 through the through hole; the outer shell 120 is arranged outside the inner shell 110, and the outer shell 120 has a gap with the inner shell 110.

[0064] The inner shell 110 is used to support the probe assembly 20 and the conductive sleeve 310, and the inner shell 110 is provided with a through hole, and the probe assembly 20 and the conductive sleeve 310 are exposed from the through hole of the inner shell 110, and the outer shell 120 is wrapped around the inner shell 110, for example, a double-material injection molding process is adopted to form an inner-outer double-layer shell 10 structure, and the outer shell 120 has a gap with the inner shell 110, improving the reliability of the shell 10 and facilitating the operator to operate the probe structure.

[0065] In one embodiment, the material of the outer shell 120 is a self-repairing polymer; the material of the inner shell 110 is polycarbonate or polyphenylene sulfide.

[0066] The inner shell 110 is a hard high-performance engineering plastic, such as glass fiber reinforced polycarbonate (PC) or polyphenylene sulfide (PPS), which provides a solid and dimensionally stable structural support for the entire probe structure.

[0067] The shell 120 can be injection molded from a self-healing polymer material. It should be noted that the self-healing polymer contains special reversible chemical bonds (such as hydrogen bonds, ionic bonds, dynamic covalent bonds) in the molecular chain or is coated with microcapsules containing repair agents. When the surface of the shell 120 is slightly scratched or scuffed, these reversible bonds will break and recombine, or the microcapsules will rupture to release the repair agent, thereby restoring the damage to some extent. This process can occur autonomously at room temperature or be accelerated by applying a mild external stimulus such as heat. This feature greatly enhances the wear resistance and appearance retention of the probe structure, solves the inevitable damage problem of the probe structure in long-term use, and significantly extends the overall service life and value of the product.

[0068] In one embodiment, the present application also provides a test system comprising a test device and a WiFi near-field probe structure according to any one of the above embodiments; the test device is connected to the WiFi near-field probe structure.

[0069] The test device can be, but is not limited to, a spectrum analyzer. For specific description of the WiFi near-field probe structure, refer to the description of the WiFi near-field probe structure in the above embodiments, which will not be repeated here.

[0070] Based on the connection of the WiFi near-field probe structure to the test device, the WiFi near-field probe structure comprises a shell, a probe assembly and a sleeve assembly, the probe assembly is arranged in the shell; the sleeve assembly is provided with a conductive sleeve and a telescopic adjusting piece, the conductive sleeve is arranged in the shell and sleeved outside the probe assembly, the telescopic adjusting piece is arranged outside the shell, and the telescopic adjusting piece is used to adjust the movement of the conductive sleeve in the axial direction; the conductive sleeve is electrically connected to the common ground of the probe assembly, realizes efficient WiFi near-field detection, and transmits the detected signal to the test device, which analyzes and displays the detected signal in real time. The application provides an effective tool for operators to actively resist the effects of hand capacitance and environmental noise by sleeving the telescopic conductive sleeve outside the probe assembly. By extending the sleeve during key measurements, external interference can be minimized to obtain more stable, reliable and repeatable measurement data. The application has the dual functions of mechanical protection and RF shielding, improves the reliability and durability of the measurement, and improves the system integration.

[0071] The technical features of the above embodiments can be combined in any way. To make the description concise, not all possible combinations of the technical features in the above embodiments are described, but as long as the combinations of the technical features do not exist, they should be considered as the scope of the present application.

[0072] The above-described embodiments are merely illustrative of several embodiments of the present application, which are described in more detail and in a specific and detailed manner, but should not be construed as limiting the scope of the patent. It should be noted that for those skilled in the art, several modifications and improvements can be made without departing from the concept of the present application, and these are all within the scope of the present application. Therefore, the scope of protection of the patent of the present application should be subject to the appended claims.

Claims

1. A WiFi near-field probe structure, characterized in that, The application relates to a WiFi near-field probe structure. The WiFi near-field probe structure comprises a shell, a probe assembly arranged in the shell, and a sleeve assembly provided with a conductive sleeve and a telescopic adjusting piece. The conductive sleeve is arranged in the shell and sleeved on the probe assembly, and the telescopic adjusting piece is arranged outside the shell and used for adjusting the axial movement of the conductive sleeve. The probe assembly comprises a tip, a probe plunger and an elastic piece.

2. The WiFi near-field probe structure of claim 1, wherein, When the tip abuts against a measured object, the probe plunger applies pressure to the elastic piece to make the elastic piece deform. When the tip is separated from the measured object, the elastic piece applies an elastic recovery force to the probe plunger to make the elastic piece restore the deformation.

3. The WiFi near-field probe structure of claim 2, wherein, The probe assembly further comprises an ESD protection circuit. The ESD protection circuit is arranged between the second end of the probe plunger and the elastic piece and electrically connected with the second end of the probe plunger.

4. The WiFi near-field probe structure of claim 3, wherein, The elastic piece is a flexible and compliant structure.

5. The WiFi near-field probe structure of claim 2, wherein, The outer surfaces of the probe plunger and the tip are provided with a first metal layer and a second metal layer arranged on the first metal layer.

6. The WiFi near-field probe structure of claim 1, wherein, The first metal layer is a nickel layer, and the second metal layer is a gold layer.

7. The WiFi near-field probe structure of claim 6, wherein, The WiFi near-field probe structure further comprises an impedance matching connector used for connecting a test device and the probe assembly. The conductive sleeve is provided with an elastic contact piece.

8. The WiFi near-field probe structure of any one of claims 1 to 7, wherein, The elastic contact piece is electrically connected with the common ground of the probe assembly. The shell is provided with an inner shell and an outer shell. At least part of the probe assembly and at least part of the conductive sleeve are arranged in the inner shell.

9. The WiFi near-field probe structure of claim 8, wherein, The inner shell is provided with a through hole through which the probe assembly and the conductive sleeve protrude out of the inner shell. The outer shell is arranged outside the inner shell and has a gap with the inner shell.

10. A test system, characterized by The material of the outer shell is a self-repairing polymer. The material of the inner shell is polycarbonate or polyphenylene sulfide. The application further relates to a test device and the WiFi near-field probe structure. The test device is connected with the WiFi near-field probe structure.

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