Measurement device, measurement method, and computer-readable recording medium

Abstract

The present invention relates to a measurement device (10), a measurement method, and a computer-readable recording medium, the measurement device (10) collecting, from each detection instrument provided in the feeding direction of an electrode sheet (S) having a reference mark (M), the detection result of the reference mark (M) detected by each detection instrument, and calculating the measurement result of the electrode sheet (S) on the basis of the collected detection results. An inter-instrument distance indicating an interval at which each detection instrument is provided is calculated.

Description

TECHNICAL FIELD

[0001] The present application relates to a measurement device, a measurement method, and a computer-readable recording medium. BACKGROUND

[0002] A battery electrode sheet (appropriately called "electrode sheet") is a structure in which an active material or the like is thinly coated on a metal foil and dried. In the manufacture of an electrode sheet, a slurry (liquid mixture) of a positive electrode and a negative electrode is coated on the surface of an aluminum foil or a copper foil. In the above coating step, in the case where the amount of coating of the slurry is measured, a detector instrument calculates the thickness, weight, or the like before and after coating, and the amount of coating is calculated from the difference.

[0003] Patent Literature 1: Japanese Patent Application Publication No. 2011-196755

[0004] In a production line of an electrode sheet or the like, in order to accurately calculate the amount of coating after coating, it is necessary to set the positions of the respective detector instruments and the speed at which the electrode sheet is fed so that the trajectories of the positions detected by the respective detector instruments differ in position. However, in an actual production line, it is difficult to accurately calculate the positions and relative distances of the respective detector instruments on the path along which the electrode sheet is fed. SUMMARY

[0005] The present application has been made in view of the above circumstances, and has an object to easily calculate the positions at which the respective detector instruments are arranged in a production line.

[0006] One embodiment of the present application relates to a measurement device including: a collection unit that collects detection results of a reference mark detected by respective detector instruments arranged in the feeding direction of a measurement target having the reference mark; and a calculation unit that calculates an instrument-to-instrument distance indicating the interval at which the respective detector instruments are arranged, on the basis of the collected detection results.

[0007] One embodiment of the present application relates to a measurement method including: collecting detection results of a reference mark detected by respective detector instruments arranged in the feeding direction of a measurement target having the reference mark; and calculating an instrument-to-instrument distance indicating the interval at which the respective detector instruments are arranged, on the basis of the collected detection results.

[0008] One embodiment of the present application relates to a measurement program recorded on a computer-readable recording medium, the measurement program causing a computer to execute: collecting detection results of a reference mark detected by respective detector instruments arranged in the feeding direction of a measurement target having the reference mark; and calculating an instrument-to-instrument distance indicating the interval at which the respective detector instruments are arranged, on the basis of the collected detection results.

[0009] Effects of the Invention

[0010] According to the present application, the setting positions of the respective inspection instruments included in the production line can be easily found. BRIEF DESCRIPTION OF DRAWINGS

[0011] Figure 1 is a diagram showing a structure example and a processing example of the coating amount measurement system to which the embodiment is applied.

[0012] Figure 2 is a diagram showing a specific example of the inspection instrument of the coating amount measurement system to which the embodiment is applied.

[0013] Figure 3 is a diagram showing a specific example of the coating production line of the coating amount measurement system to which the embodiment is applied.

[0014] Figure 4 is a diagram showing a specific example of the inspection result of the inspection instrument of the coating amount measurement system to which the embodiment is applied.

[0015] Figure 5 is a diagram for explaining an inter-instrument distance calculation process of the coating amount measurement system to which the reference technology is applied.

[0016] Figure 6 is a block diagram showing a structure example of each device of the coating amount measurement system to which the embodiment is applied.

[0017] Figure 7 is a diagram showing one example of the detection threshold storage section of the measurement device to which the embodiment is applied.

[0018] Figure 8 is a diagram showing one example of the inspection result storage section of the measurement device to which the embodiment is applied.

[0019] Figure 9 is a diagram showing one example of the calculation result storage section of the measurement device to which the embodiment is applied.

[0020] Figure 10 is a diagram showing a specific example of the reference mark to which the embodiment is applied.

[0021] Figure 11 is a diagram showing a specific example of the reference mark inspection process of the inspection instrument to which the embodiment is applied.

[0022] Figure 12 is a diagram showing a specific example of the inter-instrument distance calculation process of the measurement device to which the embodiment is applied.

[0023] Figure 13 is a flowchart showing one example of the flow of the entire coating amount measurement system to which the embodiment is applied.

[0024] Figure 14 is a flowchart showing one example of a flow of a reference mark management process of the coating amount measurement system to which the embodiment relates.

[0025] Figure 15 is a flowchart showing one example of a flow of a detection result management process of the coating amount measurement system to which the embodiment relates.

[0026] Figure 16 is a flowchart showing one example of a flow of a calculation result management process of the coating amount measurement system to which the embodiment relates.

[0027] Figure 17 is a diagram showing a hardware structure example to which the embodiment relates. DETAILED DESCRIPTION

[0028] Hereinafter, a measurement device, a measurement method, and a computer-readable recording medium to which one embodiment relates will be described in detail with reference to the drawings. Furthermore, the present application is not limited by the embodiment described below.

[0029] Hereinafter, a structure and a process of the coating amount measurement system 100, a structure and a process of each device of the coating amount measurement system 100, a flow of each process of the coating amount measurement system 100, and effects of the embodiment will be described.

[0030] [1. Structure and process of the coating amount measurement system 100]

[0031] The measurement device 10 measures the thickness and the weight of the electrode sheet S. Figures 1-4 A structure and a process of the coating amount measurement system 100 to which the embodiment relates will be described. Hereinafter, a structure example of the coating amount measurement system 100 as a whole, a basic principle of the coating amount measurement system 100, a process example of the coating amount measurement system 100, and effects of the coating amount measurement system 100 will be described. Furthermore, in the embodiment, the measurement device 10 that measures the thickness and the weight of the electrode sheet S will be described as one example, but the measurement object and the utilization field are not limited.

[0032] (1-1. Structure example of the coating amount measurement system 100 as a whole)

[0033] Here, the measurement device 10 measures the thickness and the weight of the electrode sheet S. Figure 1 A structure example of the coating amount measurement system 100 as a whole will be described. The coating amount measurement system 100 has the measurement device 10 and the detection instrument 20. Figure 1This diagram illustrates a structural example and a processing example of the coating quantity measuring system 100 according to the embodiment. Here, the measuring device 10 and the testing instrument 20 are communicatively connected via a predetermined communication network (not shown) and through wired or wireless means. Furthermore, various communication networks such as the Internet or dedicated lines can be used for the predetermined communication network. Additionally, the coating quantity measuring system 100 may include a coating instrument CM (not shown), a drying instrument DM (not shown), and coating production line instruments (not shown) such as rollers, which will be described later. Furthermore, the measuring device 10, the coating instrument (not shown), the drying instrument (not shown), and the coating production line instruments (not shown) are communicatively connected using analog signals, pulse signals, Ethernet (registered trademark), etc.

[0034] (1-1-1. Measuring Apparatus 10)

[0035] The measuring device 10 is used by the operator W of the coating production line that manages the electrode sheet S, and is used to measure the coating amount of the electrode sheet S, which is the object of the measurement. For example, the measuring device 10 is installed in the operation room of the coating production line that manages the electrode sheet S. Furthermore, Figure 1 The coating amount measurement system 100 shown may include multiple measuring devices 10. Additionally, in Figure 1 In the example shown, the measuring device 10 is implemented by a desktop PC (Personal Computer), but it can also be implemented by a laptop PC, smartphone, server device, cloud system, etc.

[0036] (1-1-2. Testing Instruments 20)

[0037] Testing instruments 20 (20-1, 20-2, ...) are arranged along the feeding direction of electrode sheet S and are used to detect the thickness or weight of electrode sheet S. For example, testing instrument 20 is an instrument managed by operator W and is installed on the coating production line of electrode sheet S. Figure 1 In the example, detection instruments 20-1, 20-2, ... are arranged from the upstream side (closer to the delivery start point) of electrode plate S to the downstream side (farthest from the delivery start point). Furthermore, Figure 1 The coating quantity measurement system 100 shown includes at least two detection instruments 20, but may include one detection instrument 20 or more than three detection instruments 20.

[0038] (1-2. Basic principle of coating amount measurement system 100)

[0039] Here, using Figures 2-4The basic principle of the coating amount measurement system 100 will be described. Hereinafter, a specific example of the detection instrument 20 of the coating amount measurement system 100, a specific example of the coating production line of the coating amount measurement system 100, and a specific example of the detection result of the detection instrument 20 of the coating amount measurement system 100 will be described.

[0040] (1-2-1. Specific example of detection instrument 20)

[0041] Here, the detection instrument 20 of the coating amount measurement system 100 is configured to detect the thickness (mm) and the mass (g) of the electrode sheet S by measuring the transmission intensity of the electrode sheet S. Figure 2 A specific example of the detection instrument 20 of the coating amount measurement system 100 will be described. Figure 2 is a view showing a specific example of the detection instrument 20 of the coating amount measurement system 100 according to the embodiment. As shown in the example of Figure 2

[0042] (1-2-1-1. Frame portion 21)

[0043] The frame portion 21 is a housing portion of the detection instrument 20, and is configured to be orthogonal to the feeding direction of the electrode sheet S. The frame portion 21 is provided with the sensor portion 22 (sensor portion upper portion 22U, sensor portion lower portion 22D).

[0044] (1-2-1-2. Sensor portion 22)

[0045] The sensor portion 22 is configured by a light source that emits a measurement light such as a radiation line (example: X-ray, β-ray), infrared ray, and a sensor head, and scans the electrode sheet S fed back and forth. At this time, the sensor portion 22 moves in a manner of being orthogonal to the feeding direction of the electrode sheet S and being fed back and forth in the frame portion 21, and detects the transmission intensity of the electrode sheet S with respect to the measurement light emitted from the light source.

[0046] (1-2-1-3. Control portion 23)

[0047] The control portion 23 is communicably connected to the sensor portion 22 by wired or wireless communication. The control portion 23 calculates the thickness (mm) and the mass (g) of the electrode sheet S based on the transmission intensity of the electrode sheet S detected by the sensor portion 22. In addition, the control portion 23 can transmit the transmission intensity of the electrode sheet S detected by the sensor portion 22 to the measurement device 10, and calculate the thickness (mm) and the mass (g) of the electrode sheet S by the measurement device 10.

[0048] (1-2-2. Specific example of coating production line)

[0049] Here, the coating production line of the coating amount measurement system 100 is configured to feed the electrode sheet S to the detection instrument 20. Figure 3 A specific example of the coating production line of the coating amount measurement system 100 will be described. Figure 3 ​is a view showing a specific example of a coating production line of the coating amount measurement system 100 to which the embodiment relates. As shown in Figure 3 The coating production line of the coating amount measurement system 100 has detection instruments 20 (20-1, 20-2, 20-3, 20-4, 20-5), coating instruments CM (CM-1, CM-2), and drying instruments DM (DM-1, DM-2), as shown in the example of

[0050] In the example of Figure 3 1st, the electrode sheet S is fed out at a constant speed by a feeding device (not shown) such as a roller or the like. 2nd, the thickness and mass of the electrode sheet S before the 1st coating are detected by the "detection instrument #1" as the detection instrument 20-1 (refer to thin dotted line). 3rd, the 1st coating is performed on the electrode sheet S by the "coating instrument #1" as the coating instrument CM-1 (refer to light hatching). 4th, the thickness and mass of the electrode sheet S after the 1st coating and before drying are detected by the "detection instrument #2" as the detection instrument 20-2 (refer to thin solid line). 5th, the electrode sheet S on which the 1st coating has been performed is dried by the "drying instrument #1" as the drying instrument DM-1. 6th, the thickness and mass of the electrode sheet S after the 1st coating and after drying and before the 2nd coating are detected by the "detection instrument #3" as the detection instrument 20-3 (refer to thin single-dot chain line). 7th, the 2nd coating is performed on the electrode sheet S by the "coating instrument #2" as the coating instrument CM-2 (refer to dark hatching). 8th, the thickness and mass of the electrode sheet S after the 2nd coating and before drying are detected by the "detection instrument #4" as the detection instrument 20-4 (refer to thick solid line). 9th, the electrode sheet S on which the 2nd coating has been performed is dried by the "drying instrument #2" as the drying instrument DM-2. 10th, the thickness and mass of the electrode sheet S after the 2nd coating and after drying are detected by the "detection instrument #5" as the detection instrument 20-5 (refer to thick dotted line).

[0051] In the case where two or more detection instruments 20 are provided as in the example of Figure 3 In order to make the traces detected by the sensor sections 22 consistent with each other by the respective detection instruments 20, the measurement of the coating amount needs to be performed by the respective detection instruments 20 in synchronization with each other by using the feeding speed of the electrode sheet S and the inter-instrument distance of the detection instruments 20 (the distance of the feeding direction of the electrode sheet S between the position of the sensor section 22 of the detection instrument 20 on the upstream side and the position of the sensor section 22 of the detection instrument 20 on the downstream side). More specifically, the measurement needs to be performed on the same trace by making the timing at which the sensor section 22 of the detection instrument 20 on the upstream side performs the operation consistent with the timing at which the sensor section 22 of the detection instrument 20 on the downstream side performs the operation by using the feeding distance calculated from the feeding speed of the electrode sheet S and the distance between the respective detection instruments 20.

[0052] Here, regarding the electrode sheet S sending speed, a value conforming to the actual painting production line can be obtained from each instrument of the painting production line via an analog signal, a pulse signal, external communication, or the like. At this time, the distance between instruments, i.e., the position at which each detection instrument 20 is disposed, is specified with reference to a CAD (Computer-Aided Design) drawing of the painting production line, but there is a setting error, and the distance between instruments of the actual painting production line does not match. That is, the synchronization of each detection instrument 20 based on the error in the distance between instruments produces an error, and thus the trajectories detected by the sensor portions 22 of each detection instrument 20 do not match. Therefore, the distance between instruments of the detection instrument 20 needs to be found with high precision according to the actual painting production line on site.

[0053] (1-2-3. Specific example of detection result)

[0054] Here, the detection result of the detection instrument 20 of the painting amount measurement system 100 is described using Figure 4 A specific example of the detection result of the detection instrument 20 of the painting amount measurement system 100 is described. Figure 4 is a view that shows a specific example of the detection result of the detection instrument 20 of the painting amount measurement system 100 to which the embodiment relates.

[0055] As shown in the example of Figure 4 (1), the sensor portion 22 of the detection instrument 20 moves in a manner that reciprocates between the A side and the B side on the frame portion 21 in a direction orthogonal to the sending direction of the electrode sheet S, and detects the transmission intensity of the electrode sheet S with respect to the measurement light emitted from the light source (see Figure 4 (1) "Trajectory of detection point").

[0056] As shown in the example of Figure 4 (2), the detection instrument 20 outputs a detection result of "electrode sheet areal weight" that indicates the weight (g / m 2 ) per unit area of the electrode sheet S on the vertical axis and "electrode sheet width direction" that indicates the position between the A side and the B side on the horizontal axis. At this time, the detection instrument 20 can output a detection result of "electrode sheet thickness" that indicates the thickness (mm) of the electrode sheet S on the vertical axis.

[0057] (1-3. Processing example of painting amount measurement system 100)

[0058] Again, the processing example of the painting amount measurement system 100 is described using Figure 1 The processing example of the painting amount measurement system 100 is described. Hereinafter, the reference mark setting processing, the detection threshold input processing, the sheet sending processing, the reference mark detection processing, the detection result collection processing, and the distance between instruments calculation processing are described. Furthermore, the processing of (1) to (6) below can also be executed in a different order. In addition, there can be omitted processing among the processing of (1) to (6) below.

[0059] (1-3-1. Reference mark setting process)

[0060] First, the operator W sets a reference mark M (refer to Figure 1 (1)) on the electrode sheet S as a measurement target. For example, the operator W, at the time of setting of the inspection instrument 20 to the coating production line or at the time of periodic inspection, seals and pastes a rectangular mark having a thickness of a certain degree or more to the electrode sheet S. Here, if the reference mark M is a mark that the inspection instrument 20 can detect, it can be a circular shape, an elliptical shape, a triangular shape, or the like, and can be a material or a paint different from the electrode sheet S, and the manner of the reference mark M is not particularly limited. In addition, the subject who sets the reference mark M is not limited to the operator W, and can be performed automatically using an instrument not shown. In addition, the measurement target is not limited to a metal foil such as the electrode sheet S, and can be a sheet-shaped object such as paper, a plastic film, or the like.

[0061] (1-3-2. Detection threshold input process)

[0062] Second, the operator W inputs a detection threshold of the reference mark M to the measurement device 10 (refer to Figure 1 (2)). For example, the operator W sets a detection threshold that the inspection instrument 20 can detect as a thickness of the reference mark M, and inputs it to the measurement device 10. In addition, the measurement device 10 transmits the input detection threshold to the inspection instrument 20, and sets it as a detection condition of the inspection instrument 20. Here, the measurement device 10 can set an internally prescribed detection threshold as a set condition of the inspection instrument 20 without the input of the detection threshold of the reference mark M based on the operator W. In addition, the measurement device 10 can automatically calculate the detection threshold according to the size of the measurement value of the presence or absence of the reference mark M, and set the calculated detection threshold as a set condition of the inspection instrument 20.

[0063] (1-3-3. Sheet feeding process)

[0064] Third, the operator W feeds the electrode sheet S as a measurement target at a constant speed (refer to Figure 1 (3)). For example, the operator W feeds the electrode sheet S on which the reference mark M is pasted at a feeding speed V (m / s) by causing a roller of a coating production line not shown to rotate. At this time, it is preferable that the inspection instrument 20 fix the sensor portion 22 and not reciprocally scan.

[0065] (1-3-4. Reference mark detection process)

[0066] Fourth, the inspection instrument 20 detects the reference mark M of the electrode sheet S fed (refer to Figure 1(4)). For example, the detection instrument 20 detects the reference mark M in a case where the detection threshold value set by the measuring apparatus 10 is exceeded. At this time, the detection instrument 20 outputs, as a detection result, a detection distance indicating the total distance by which the electrode sheet S is fed at the time point at which the reference mark M is detected. For example, the detection instrument 20-1 outputs, as the detection distance, XI (m) which is the distance from the end on the feed start side of the electrode sheet S. In addition, the detection instrument 20-2 outputs, as the detection distance, X2(m) which is the distance from the end on the feed start side of the electrode sheet S. Here, the detection distance can be set, for example, to the value obtained by calculating the product of the feed speed V (m / s) and the infinitesimal time (for example, several milliseconds) at intervals of the infinitesimal time and accumulating the products.

[0067] In addition, the detection instrument 20 can output, as a detection result, a detection time indicating the time at which the reference mark M is detected. For example, the detection instrument 20-1 outputs, as the detection time, Tl which is the time at which the reference mark M is detected. In addition, the detection instrument 20-2 outputs, as the detection time, T2 which is the time at which the reference mark M is detected.

[0068] In addition, the detection instrument 20 can output, as a detection result, information indicating the state in which the reference mark M is detected. For example, if the detection instrument 20-1 detects the reference mark M, the information indicating the state can be output immediately. In addition, if the detection instrument 20-2 detects the reference mark M, the information indicating the state can be output immediately.

[0069] (1-3-5. Detection result collection processing)

[0070] The measuring apparatus 10 collects the detection result from the detection instrument 20 (refer to FIG. 1) (5). Figure 1 (5)). For example, the measuring apparatus 10 collects, as a detection result, XI (m) which is the detection distance of the reference mark M from the detection instrument 20-1. In addition, the measuring apparatus 10 collects, as a detection result, X2(m) which is the detection distance of the reference mark M from the detection instrument 20-2.

[0071] Furthermore, the measuring device 10 can collect the detection time T1, which serves as the reference mark M, from the detection instrument 20-1 as the detection result. Additionally, the measuring device 10 can collect the detection time T2, which serves as the reference mark M, from the detection instrument 20-2 as the detection result. Moreover, the measuring device 10 can directly collect the detection time T1 and detection time T2 by receiving detection times T1 and T2 from the detection instruments 20-1 and 20-2 respectively. Alternatively, the measuring device 10 can indirectly collect the detection time T1 and detection time T2 by receiving information indicating the detection of the reference mark M from the detection instruments 20-1 and 20-2 respectively, and recording the time of receiving this information.

[0072] (1-3-6. Calculation and processing of distance between instruments)

[0073] 6. The measuring device 10 calculates the distance between the instruments based on the detection results (refer to...). Figure 1 (6)). For example, the measuring device 10 calculates the difference X2-X1 (m) between the measuring instruments 20-1 and 20-2 as the instrument-to-instrument distance, which is the reference mark M. At this time, the measuring device 10 stores the calculated X2-X1 (m) as the adjusted instrument-to-instrument distance between the measuring instruments 20-1 and 20-2.

[0074] Furthermore, the measuring device 10 can be used as the distance between the measuring instruments 20-1 and 20-2, and the product of the difference in the detection time (as a reference mark M) and the delivery speed V of the electrode plate S can be calculated as (T2-T1)×V(m). At this time, the measuring device 10 can store the calculated (T2-T1)×V(m) as the adjusted distance between the measuring instruments 20-1 and 20-2.

[0075] (1-4. Effect of Coating Volume Measurement System 100)

[0076] Below, based on an overview and discussion of the issues related to the coating quantity measurement system 100P in the reference technology, the effectiveness of the coating quantity measurement system 100 will be explained.

[0077] (1-4-1. Overview of the 100P Coating Volume Measurement System)

[0078] Here, using Figure 1 An overview of the coating amount measurement system 100P involved in the reference technology is provided. Figure 5 This diagram illustrates the calculation and processing of the inter-instrument distance in the coating amount measurement system 100P, which is related to the reference technology.

[0079] Here, the premise of the coating amount measurement system 100P is explained. In a production process such as an electrode sheet S where a certain material is coated onto a certain sheet, the coating amount needs to be determined with high precision. At this time, in order to accurately determine the coating amount after coating, it is necessary to ensure that the trajectories of the positions detected by the various detection instruments 20 with different settings (distances between each detection instrument 20) are consistent, especially the detection instruments 20 before and after coating.

[0080] Regarding the coating quantity measurement system 100P, the operator W needs to adjust the distance between instruments maintained within the system in a way that prevents deviation from the trajectory of the detection points of the detection instrument 20.

[0081] First, operator W uses... Figure 5 The marker pen mounting fixtures MT (MT-1, MT-2, ...) shown are used to mount marker pens MP (MP-1, MP-2, ...) such as oil-based pens to the upper part 22U (22U-1, 22U-2, ...) or lower part 22D (22D-1, 22D-2, ...) of the sensor section of the detection instruments 20 (20-1, 20-2, ...). At this time, in order to maintain the ink state of the marker pen MP, the operator W sets the mounting height of the marker pen MP at a height that does not contact the electrode plate S. Furthermore, in order to distinguish the tracks of each detection instrument 20, the operator W sets marker pens MP of different colors according to each detection instrument 20. For example, operator W installs a red marker pen MP-1 on the marker pen mounting fixture MT-1 of the upstream testing instrument 20-1, and installs a blue marker pen MP-2 on the marker pen mounting fixture MT-2 of the downstream testing instrument 20-2, which is the "testing instrument #2".

[0082] Second, operator W begins feeding electrode sheet S using the coating production line. At this time, operator W adjusts the mounting height of the marking pen MP so that it traces a line on electrode sheet S, causing the system to begin its measurement action. Figure 5 As shown, the trajectory actually detected by the sensor section 22 of the detection instrument 20 is traced on the electrode plate S. Figure 5 In the example, the trajectory of the detection point drawn by "Detection Instrument #1" of the upstream detection instrument 20-1 is represented by a dashed line (see reference). Figure 5 (1)), the trajectory of the detection point drawn by the "Detection Instrument #2" of the downstream detection instrument 20-2 is represented by a solid line (refer to...). Figure 5 (2)).

[0083] The operator W adjusts the inter-instrument distance maintained inside the system in such a manner that the trajectory drawn by each of the detectors 20 is visually confirmed so as not to deviate. At this time, the inter-instrument distance of the CAD drawing of the coating line input as an initial value and the actual conveying path of the coating line are usually different, and thus the trajectory of the marker pen MP drawn on the electrode sheet S is deviated in correspondence with the difference. The operator W investigates the amount of deviation using a ruler or the like and adjusts the inter-instrument distance based on the amount of deviation. The operator W repeatedly performs the above adjustment until the amount of deviation based on the trajectory of the marker pen MP converges within a prescribed range.

[0084] (1-4-2. Problems of the coating amount measurement system 100P)

[0085] The problems of the coating amount measurement system 100P related to the reference technology will be described. First, with regard to the coating amount measurement system 100P, the operator W needs to perform the operation of the marker pen mounting jig MT based on manual work and the confirmation of the trajectory of the marker pen MP based on visual confirmation. Therefore, with regard to the coating amount measurement system 100P, the adjustment accuracy of the inter-instrument distance of the detectors 20 fluctuates. In addition, with regard to the coating amount measurement system 100P, a plurality of persons need to be arranged for each of the detectors 20 and the like. Furthermore, with regard to the coating amount measurement system 100P, in the case where the radiation line of X-rays or β-rays is used for the detectors 20, the operator W arranged near the detectors 20 is restricted from the viewpoint of managing the radiation line. Second, with regard to the coating amount measurement system 100P, the ink of the marker pen MP sometimes adheres to each of the instruments of the coating line and causes contamination.

[0086] (1-4-3. Outline of the coating amount measurement system 100)

[0087] An outline of the coating amount measurement system 100 according to the embodiment will be described. With regard to the coating amount measurement system 100, the following processes are executed. First, the operator W sets the mark seal tape having a rectangular mark with a thickness of equal to or greater than a certain degree as a reference mark M to the electrode sheet S at the time of setting of the detection instrument 20 to the coating production line, at the time of periodic inspection, and the like. Second, the operator W inputs the detection threshold value that the detection instrument 20 can detect as the thickness of the reference mark M to the measurement device 10 and sets it as the detection threshold value of the detection instrument 20. Third, the operator W feeds out the electrode sheet S to which the mark seal tape is attached at a constant speed. Fourth, in a case where the set detection threshold value is exceeded, the detection instrument 20 detects the mark seal tape and outputs the above-mentioned detection distance and detection time as a detection result. Fifth, the measurement device 10 collects the above-mentioned detection distance and detection time based on the output result from the detection instrument 20. Sixth, the measurement device 10 calculates the instrument-to-instrument distance of the detection instrument 20 using the above-mentioned detection distance and detection time and saves the calculated instrument-to-instrument distance as an adjusted instrument-to-instrument distance.

[0088] (1-4-4. Effects of the coating amount measurement system 100)

[0089] The effects of the coating amount measurement system 100 according to the embodiment will be described. First, with regard to the coating amount measurement system 100, it is possible to automatically adjust the instrument-to-instrument distance of the detection instrument 20 using hardware and software. Therefore, with regard to the coating amount measurement system 100, it is possible to minimize the fluctuation in the adjustment accuracy of the instrument-to-instrument distance of the detection instrument 20 without the judgment of the operator W. Second, with regard to the coating amount measurement system 100, it is possible to omit the use of the marker pen MP and the confirmation of the trace based on the visual observation of the operator W. Therefore, with regard to the coating amount measurement system 100, it is possible to minimize the number of personnel required for the adjustment work of the instrument-to-instrument distance of the detection instrument 20 and to further minimize the work in the vicinity of the detection instrument 20 by omitting the operation of the marker pen mounting jig MT. Third, with regard to the coating amount measurement system 100, it is possible to solve the problem of the ink adhering to each instrument of the coating production line by introducing a mechanism that does not use the marker pen MP.

[0090] As described above, with regard to the coating amount measurement system 100, it is possible to easily find the set positions of each detection instrument included in the production line.

[0091] [2. Structures and processes of each device of the coating amount measurement system 100]

[0092] The structures and processes of each device of the coating amount measurement system 100 according to the embodiment will be described. Figure 5 The structures and processes of each device of the coating amount measurement system 100 according to the embodiment will be described. Figure 6 The structures and processes of each device of the coating amount measurement system 100 according to the embodiment will be described. Figure 1is a block diagram showing a configuration example of each device of the coating amount measurement system 100 to which the embodiment relates. Hereinafter, a configuration example of the coating amount measurement system 100 as a whole, a configuration example and processing example of the measurement device 10, and a configuration example and processing example of the detection instrument 20 to which the embodiment relates will be described.

[0093] (2-1. Configuration example of the coating amount measurement system 100 as a whole)

[0094] The coating amount measurement system 100 as a whole shown in FIG. 1 is a system for measuring a coating amount of a coating film formed on a workpiece W. The coating amount measurement system 100 as a whole shown in FIG. 1 is configured to include the measurement device 10 and the detection instrument 20. The measurement device 10 and the detection instrument 20 are communicably connected by a communication network N realized by the Internet, a dedicated line, or the like. The measurement device 10, a coating instrument CM (not shown), a drying instrument DM (not shown), and a coating line instrument (not shown) are communicably connected by an analog signal, a pulse signal, Ethernet (registered trademark), or the like. Figure 6 Figure 6 The configuration example of the coating amount measurement system 100 as a whole shown in FIG. 1 will be described. As shown in FIG. 1, the coating amount measurement system 100 has the measurement device 10 and the detection instrument 20. In addition, the measurement device 10 and the detection instrument 20 are communicably connected by a communication network N realized by the Internet, a dedicated line, or the like. In addition, the measurement device 10, a coating instrument CM (not shown), a drying instrument DM (not shown), and a coating line instrument (not shown) are communicably connected by an analog signal, a pulse signal, Ethernet (registered trademark), or the like. Figure 1 (2-2. Configuration example and processing example of the measurement device 10)

[0095] The configuration example and processing example of the measurement device 10 will be described. The measurement device 10 has an input section 11, an output section 12, a communication section 13, a storage section 14, and a control section 15.

[0096] Figure 6 The configuration example and processing example of the measurement device 10 will be described. The measurement device 10 has an input section 11, an output section 12, a communication section 13, a storage section 14, and a control section 15.

[0097] (2-2-1. Input section 11)

[0098] The input section 11 manages input of various information to the measurement device 10. For example, the input section 11 is realized by a mouse, a keyboard, or the like, and receives input of various information to the measurement device 10.

[0099] (2-2-2. Output section 12)

[0100] The output section 12 manages output of various information from the measurement device 10. For example, the output section 12 is realized by a display or the like, and displays various information stored in the measurement device 10.

[0101] (2-2-3. Communication section 13)

[0102] The communication section 13 manages data communication with other devices. For example, the communication section 13 performs data communication with each communication device via a router or the like. In addition, the communication section 13 can perform data communication with a terminal not shown.

[0103] (2-2-4. Storage section 14)

[0104] ​​The storage section 14 stores various information referred to when the control section 15 performs an operation, and various information acquired when the control section 15 performs an operation. The storage section 14 has a detection threshold storage section 14a, a detection result storage section 14b, and a calculation result storage section 14c. Here, the storage section 14 can be implemented by, for example, a RAM (Random Access Memory), a semiconductor memory element such as a flash memory, or a storage device such as a hard disk or an optical disk. Further, in the example of FIG. 1, the storage section 14 is provided inside the measurement device 10, but can be provided outside the measurement device 10, or a plurality of storage sections can be provided. Figure 6

[0105] (2-2-4-1. Detection threshold storage section 14a)

[0106] The detection threshold storage section 14a stores detection thresholds. For example, the detection threshold storage section 14a stores detection thresholds accepted by the reception section 15a of the control section 15 described later. Here, the data stored in the detection threshold storage section 14a is managed by, for example, a detection threshold ID, a detection target, and a detection threshold value. Figure 6 An example of the data stored in the detection threshold storage section 14a will be described. Figure 7 is a view showing an example of the detection threshold storage section 14a of the measurement device 10 according to the embodiment. In the example of FIG. 2, the detection threshold storage section 14a has items such as "adjustment target", "adjustment schedule", and "detection threshold". Figure 7

[0107] The "adjustment target" indicates identification information for identifying a production process of a measurement target object for which an inter-instrument distance is adjusted, and is, for example, an identification number or an identification mark of a coating production line of an electrode sheet S. The "adjustment schedule" indicates a schedule of adjusting the inter-instrument distance, and is, for example, indicated by a date when the detection instrument 20 is set, or a date when the coating production line is periodically checked. The "detection threshold" indicates a threshold of a detection intensity of the measurement target object, and is, for example, indicated by a deposition amount (g / m 2 ), a thickness (mm), or a signal value, i.e., a voltage (V).

[0108] That is, in Figure 7 , an example is shown in which, with respect to the adjustment target identified by "coating production line #1", data such as {adjustment schedule: "adjustment day #1", detection threshold: "detection threshold #1"}, {adjustment schedule: "adjustment day #2", detection threshold: "detection threshold #2"}, {adjustment schedule: "adjustment day #3", detection threshold: "detection threshold #3"},..., are stored in the detection threshold storage section 14a.

[0109] Further, in Figure 7 ​​In the above example, the detection threshold storage section 14a stores the detection threshold for each adjustment schedule, but the detection threshold storage section 14a can also store a single detection threshold corresponding to the adjustment object. That is, the detection threshold storage section 14a can also store, as a single detection threshold, "detection threshold #1" for the adjustment object identified by "painting production line #1", and update the stored detection threshold each time a detection threshold is newly accepted by the acceptance section 15a.

[0110] (2-2-4-2. Detection result storage section 14b)

[0111] The detection result storage section 14b stores detection results. For example, the detection result storage section 14b stores detection results collected by the collection section 15b of the control section 15 described later. Here, the data stored in the detection result storage section 14b is described using the example of the adjustment object "painting production line #1" and the adjustment schedule "adjustment day #1". Figure 7 An example of the data stored in the detection result storage section 14b is described. Figure 8 is a diagram showing an example of the detection result storage section 14b of the measuring device 10 involved in the embodiment. In the example of Figure 8 , the detection result storage section 14b has items such as "adjustment object", "adjustment schedule", "detection instrument", and "detection result".

[0112] The "adjustment object" indicates identification information for identifying a production process of a measurement target object for which the inter-instrument distance is adjusted, and is, for example, an identification number or an identification mark of a painting production line of an electrode sheet S. The "adjustment schedule" indicates a schedule for adjusting the inter-instrument distance, and is, for example, a date indicated by the year, month, and day at the time of setting of the detection instrument 20, or at the time of periodic inspection of the painting production line. The "detection instrument" indicates identification information of the detection instrument 20 for adjusting the inter-instrument distance, and is, for example, an identification number or an identification mark of the detection instrument 20 disposed from the upstream side to the downstream side of the painting production line. The "detection result" indicates information related to the position or the time of the reference mark M detected by the detection instrument 20, and is, for example, a detection distance indicated by meters (m) indicating the total distance through which the electrode sheet S is sent out, or a detection time indicated by hours, minutes, and seconds indicating the time at which the reference mark M is detected.

[0113] That is, in Figure 8 , an example is shown in which, for the adjustment object identified by "painting production line #1" and the adjustment schedule identified by "adjustment day #1", data such as {detection instrument: "detection instrument #1", detection result: "detection result #1"}, {detection instrument: "detection instrument #2", detection result: "detection result #2"}, {detection instrument: "detection instrument #3", detection result: "detection result #3"}, {detection instrument: "detection instrument #4", detection result: "detection result #4"},... is stored in the detection result storage section 14b.

[0114] (2-2-4-3. Calculation result storage section 14c)

[0115] The calculation result storage section 14c stores the calculation result. For example, the calculation result storage section 14c stores the calculation result output from the calculation section 15c of the control section 15 described later. Here, the data stored in the calculation result storage section 14c is described using the example of the adjustment object, the adjustment schedule, the detection instrument 1, the detection instrument 2, and the calculation result. Figure 8 An example of the data stored in the calculation result storage section 14c is described. Figure 9 is a diagram showing an example of the calculation result storage section 14c of the measurement device 10 according to the embodiment. In Figure 9 , the calculation result storage section 14c has items such as "adjustment object", "adjustment schedule", "detection instrument 1", "detection instrument 2", and "calculation result".

[0116] The "adjustment object" indicates identification information for identifying the production process of the measurement target object for which the inter-instrument distance is adjusted, and is, for example, the identification number or the identification mark of the electrode sheet S of the coating production line. The "adjustment schedule" indicates the schedule for adjusting the inter-instrument distance, and is, for example, the date of the setting of the detection instrument 20 or the periodic inspection of the coating production line. The "detection instrument 1" indicates the identification information of the detection instrument 20 on the upstream side of the adjustment of the inter-instrument distance, and is, for example, the identification number or the identification mark of the detection instrument 20 disposed on the side closer to the start point of the delivery of the coating production line. The "detection instrument 2" indicates the identification information of the detection instrument 20 on the downstream side of the adjustment of the inter-instrument distance, and is, for example, the identification number or the identification mark of the detection instrument 20 disposed on the side farther from the start point of the delivery of the coating production line. The "calculation result" indicates the inter-instrument distance of the detection instrument 20 calculated from the detection result, and is, for example, indicated by meters (m).

[0117] That is, in Figure 9 , an example is shown in which, with respect to the adjustment object identified by "coating production line #1" and the adjustment schedule identified by "adjustment day #1", the inter-instrument distance as the calculation result of the "detection instrument #1" on the upstream side and the "detection instrument #2" on the downstream side is "inter-instrument distance #1", the inter-instrument distance as the calculation result of the "detection instrument #2" on the upstream side and the "detection instrument #3" on the downstream side is "inter-instrument distance #2", the inter-instrument distance as the calculation result of the "detection instrument #3" on the upstream side and the "detection instrument #4" on the downstream side is "inter-instrument distance #3", and the like are stored in the calculation result storage section 14c.

[0118] (2-2-5. Control section 15)

[0119] The control section 15 governs control of the entire measuring device 10. The control section 15 has a reception section 15a, a collection section 15b, and a calculation section 15c. Here, the control section 15 can be implemented by, for example, an electronic circuit such as a CPU (Central Processing Unit), an MPU (Micro Processing Unit), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or the like.

[0120] (2-2-5-1. Reception section 15a)

[0121] The reception section 15a receives various information. In addition, the reception section 15a can store the received various information in the storage section 14. Hereinafter, detection threshold reception control processing and detection threshold transmission processing will be described.

[0122] (2-2-5-2. Detection threshold reception control processing)

[0123] The reception section 15a performs detection threshold reception control processing. For example, the reception section 15a receives a detection threshold for a detection reference mark M. The reference mark M is, for example, a sticker-like mark affixed to a measurement target. In addition, the reception section 15a stores the received detection threshold in the storage section 14.

[0124] A specific example of the detection threshold reception control processing will be described. The reception section 15a receives {adjustment target: "painting production line #1", adjustment schedule: "adjustment day #1", detection threshold: "detection threshold #1"} as a detection threshold input by the worker W via the input section 11, and stores it in the detection threshold storage section 14a.

[0125] (2-2-5-3. Detection threshold transmission processing)

[0126] The reception section 15a performs detection threshold transmission processing. For example, the reception section 15a transmits a detection threshold for a detection reference mark M to each detection instrument 20. At this time, the reception section 15a refers to the detection threshold stored in the storage section 14.

[0127] A specific example of the detection threshold transmission processing will be described. The reception section 15a refers to {adjustment target: "painting production line #1", adjustment schedule: "adjustment day #1", detection threshold: "detection threshold #1"} as a detection threshold stored in the detection threshold storage section 14a, and transmits the referred detection threshold to "detection instrument #1", "detection instrument #2", "detection instrument #3", "detection instrument #4",... as a detection condition for each detection instrument 20 provided in the adjustment target, that is, "painting production line #1".

[0128] (2-2-5-2. Collection section 15b)

[0129] The collection section 15b collects various information. In addition, the collection section 15b can store the collected various information in the storage section 14. Hereinafter, specific examples of the detection result collection control processing (detection distance collection control processing, detection timing collection control processing) and the reference marker M will be described.

[0130] (2-2-5-2-1. Detection result collection control processing)

[0131] The collection section 15b executes the detection result collection control processing. For example, the collection section 15b collects the detection results of the reference marker M detected by each of the detection instruments 20 from each of the detection instruments 20 provided in the conveyance direction of the measurement target object having the reference marker M. At this time, the collection section 15b collects the detection results detected by the sensor section 22 of each of the detection instruments 20, respectively. In addition, the collection section 15b collects the detection results detected by each of the detection instruments 20 according to the detection threshold value, respectively.

[0132] A specific example of the detection result collection control processing will be described. The collection section 15b collects "detection result #1" as the detection result detected by the sensor section 22-1 of the detection instrument 20-1, i.e., "detection instrument #1", "detection result #2" as the detection result detected by the sensor section 22-2 of the detection instrument 20-2, i.e., "detection instrument #2", and "detection result #3" as the detection result detected by the sensor section 22-3 of the detection instrument 20-3, i.e., "detection instrument #3", and stores them in the detection result storage section 14b, respectively.

[0133] (2-2-5-2-2. Detection distance collection control processing)

[0134] The collection section 15b executes the detection distance collection control processing as the detection result collection control processing. For example, the collection section 15b collects the detection distances indicating the total distance of the electrode sheet S conveyed as the detection result, respectively. At this time, the collection section 15b collects the detection distances indicating the total distance of the electrode sheet S conveyed, for example, respectively.

[0135] A specific example of the detection distance collection control processing will be described. The collection section 15b collects "detection distance #1" as the detection distance detected by the sensor section 22-1 of the detection instrument 20-1, i.e., "detection instrument #1", "detection distance #2" as the detection distance detected by the sensor section 22-2 of the detection instrument 20-2, i.e., "detection instrument #2", and "detection distance #3" as the detection distance detected by the sensor section 22-3 of the detection instrument 20-3, i.e., "detection instrument #3", and stores them in the detection result storage section 14b, respectively.

[0136] (detection time collection control processing)

[0137] The collection section 15b executes detection time collection control processing as detection result collection control processing. For example, the collection section 15b collects detection times each indicating a time at which the reference marker M is detected as a detection result. At this time, the collection section 15b collects detection times each indicating a time at which the sticker-like reference marker M is detected as being attached to the electrode sheet S, for example.

[0138] A specific example of the detection time collection control processing will be described. The collection section 15b collects "detection time #1" as a detection time detected by the sensor section 22-1 of the detection instrument 20-1, i.e., "detection instrument #1", collects "detection time #2" as a detection time detected by the sensor section 22-2 of the detection instrument 20-2, i.e., "detection instrument #2", and collects "detection time #3" as a detection time detected by the sensor section 22-3 of the detection instrument 20-3, i.e., "detection instrument #3", and stores them in the detection result storage section 14b, respectively.

[0139] (2-2-5-3. Calculation section 15c)

[0140] The calculation section 15c outputs a calculation result. In addition, the calculation section 15c can store the output calculation result in the storage section 14. Hereinafter, calculation result management processing (detection distance analysis processing, detection time analysis processing) and calculation result update processing will be described.

[0141] (Calculation result management processing)

[0142] The calculation section 15c executes calculation result management processing. For example, the calculation section 15c calculates an instrument-to-instrument distance indicating an interval at which each detection instrument 20 is arranged, based on the collected detection results.

[0143] As a specific example of the calculation result management processing, the calculation section 15c refers to {instrument: "instrument #1", detection result: "detection result #1"}, {instrument: "instrument #2", detection result: "detection result #2"}, {instrument: "instrument #3", detection result: "detection result #3"} and {instrument: "instrument #4", detection result: "detection result #4"} stored as the detection results by the detection result storage section 14b, calculates the inter-instrument distance between the upstream-side "instrument #1" and the downstream-side "instrument #2" as "inter-instrument distance #1", calculates the inter-instrument distance between the upstream-side "instrument #2" and the downstream-side "instrument #3" as "inter-instrument distance #2", and calculates the inter-instrument distance between the upstream-side "instrument #3" and the downstream-side "instrument #4" as "inter-instrument distance #3", and stores the calculation results in the calculation result storage section 14c.

[0144] (detection distance analysis processing)

[0145] The collection section 15b executes the detection distance analysis processing as the calculation result management processing. For example, the calculation section 15c calculates the difference in the detection distance of each detection instrument 20 as the inter-instrument distance.

[0146] As a specific example of the detection distance analysis processing, the calculation section 15c refers to {instrument: "instrument #1", detection distance: "detection distance #1"}, {instrument: "instrument #2", detection distance: "detection distance #2"}, {instrument: "instrument #3", detection distance: "detection distance #3"} and {instrument: "instrument #4", detection distance: "detection distance #4"} stored as the detection results by the detection result storage section 14b, calculates the difference between "detection distance #2" and "detection distance #1" as "inter-instrument distance #1", calculates the difference between "detection distance #3" and "detection distance #2" as "inter-instrument distance #2", and calculates the difference between "detection distance #4" and "detection distance #3" as "inter-instrument distance #3", and stores the calculation results in the calculation result storage section 14c.

[0147] (detection time analysis processing)

[0148] The collection section 15b executes the detection time analysis processing as the calculation result management processing. For example, the calculation section 15c calculates the product of the difference in the detection time of each detection instrument 20 and the delivery speed indicating the speed at which the measurement target object is delivered as the inter-instrument distance.

[0149] As a specific example of the analysis processing of the detection time, the calculation section 15c refers to {detection instrument: "detection instrument #1", detection time: "detection time #1"}, {detection instrument: "detection instrument #2", detection time: "detection time #2"}, {detection instrument: "detection instrument #3", detection time: "detection time #3"} and {detection instrument: "detection instrument #4", detection time: "detection time #4"} as the detection results stored in the detection result storage section 14b, and refers to "feed speed #1" as the feed speed of the electrode sheet S, calculates a value obtained by multiplying a difference between "detection time #2" and "detection time #1" by "feed speed #1" as "inter-instrument distance #1", calculates a value obtained by multiplying a difference between "detection time #3" and "detection time #2" by "feed speed #1" as "inter-instrument distance #2", and calculates a value obtained by multiplying a difference between "detection time #4" and "detection time #3" by "feed speed #1" as "inter-instrument distance #3", and stores the calculation results in the calculation result storage section 14c.

[0150] (Calculation result update processing)

[0151] The calculation section 15c performs the calculation result update processing. For example, the calculation section 15c updates parameters used when measuring the measurement target using the calculated inter-instrument distances.

[0152] As a specific example of the calculation result update processing, the calculation section 15c updates parameters used when performing synchronization of the sensor section 22 (parameters for adjusting the measurement position of the sensor section 22) using the calculated "inter-instrument distance #1", "inter-instrument distance #2" and "inter-instrument distance #3".

[0153] (2-3. Structure example and processing example of the detection instrument 20)

[0154] Again using Figure 9 A structure example and processing example of the detection instrument 20 will be described. The detection instrument 20 is provided in a coating production line in which a sheet-shaped measurement target is coated. For example, the detection instrument 20 is provided in a coating production line in which the electrode sheet S is coated. In addition, the detection instrument 20 has a frame section 21, a sensor section 22 and a control section 23.

[0155] (2-3-1. Frame section 21)

[0156] The frame section 21 is a metal housing portion, and the sensor section 22 (sensor section upper portion 22U, sensor section lower portion 22D) is provided.

[0157] (2-3-2. Sensor section 22)

[0158] The sensor unit 22 irradiates the sheet-shaped object to be measured with measuring light such as radiation or infrared light and acquires the transmission intensity of the measuring light. For example, the sensor unit 22 is implemented by upper and lower sensor heads, a light source that generates measuring light, etc., and acquires the transmission intensity of the measuring light irradiating the electrode sheet S.

[0159] (2-3-3. Control Unit 23)

[0160] The control unit 23 can be communicatively connected to the sensor unit 22 via wired or wireless means. Furthermore, the control unit 23 controls the reciprocating movement of the sensor unit 22 along the frame unit 21, the illumination of the measurement light, and the acquisition of transmission intensity. Additionally, based on the transmission intensity of the electrode sheet S detected by the sensor unit 22, the thickness (mm) and mass (g) of the electrode sheet S are calculated. Furthermore, the control unit 23 can transmit the transmission intensity of the electrode sheet S detected by the sensor unit 22 to the measuring device 10, and the measuring device 10 can then calculate the thickness (mm) and mass (g) of the electrode sheet S.

[0161] [3. Specific examples of each process in the coating amount measurement system 100]

[0162] use Figure 6 Specific examples of each process in the coating amount measurement system 100 according to the embodiment will be described below. Specific examples of the reference mark M, the reference mark detection process of the detection instrument 20, and the instrument distance calculation process of the measuring device 10 will be described below.

[0163] (3-1. Specific example of reference mark M)

[0164] use Figures 10-12 A specific example of the reference mark M is explained. Figure 10 This diagram illustrates a specific example of the reference numeral M involved in the implementation method. Below, basic and modified examples of the reference numeral M will be described.

[0165] (3-1-1.Basic example)

[0166] A basic example of how to set the reference mark M is explained. Figure 10 In this example, the reference mark M is a sticker-like mark (marker seal) affixed to the object being measured. For example, the reference mark M is a rectangular marker seal having a thickness greater than or equal to a certain level, affixed to the electrode sheet S. Alternatively, the reference mark M may be, for example, paper tape. In this case, the electrode sheet S meanders along the coating production line, which may cause deviations in the test results. Therefore, the marker seal is preferably affixed in a manner such that its length direction is perpendicular to the flow direction of the electrode sheet S.

[0167] (3-1-2. Variation)

[0168] A modification example of the setting method of the reference mark M will be described. If the reference mark M is a mark that can be detected by the detection instrument 20, it can be a sticker-shaped mark in a circular, elliptical, triangular, or the like shape. In addition, the reference mark M can be adhered or welded to a material different from the measurement target object. In addition, regarding the reference mark M, paint can be applied to the measurement target object (for example, the output unit of a photosensor is set to a threshold value, and the color is optically detected using the photosensor) or engraving can be performed (for example, a negative threshold value of the thickness and the amount of the land is set, and the engraving is detected). In addition, the reference mark M can not only be a single mark, but also a plurality of marks can be attached to the measurement target object at constant intervals.

[0169] (3-2. Specific example of reference mark detection processing of detection instrument 20)

[0170] By using Figure 10 A specific example of the reference mark detection processing of the detection instrument 20 will be described. Figure 11 is a view showing a specific example of the reference mark detection processing of the detection instrument 20 according to the embodiment. Hereinafter, a basic example and a modification example of the reference mark detection processing of the detection instrument 20 will be described.

[0171] (3-2-1. Basic example)

[0172] A basic example of the reference mark detection processing of the detection instrument 20 will be described. In Figure 11 In the example of FIG. 10, the detection instrument 20 is provided in a coating production line in which the electrode sheet S is coated. For example, the sensor portion 22-1 of the detection instrument 20-1 on the upstream side of the coating production line detects the reference mark M provided to the electrode sheet S. In addition, the sensor portion 22-2 of the detection instrument 20-2 on the downstream side of the coating production line detects the reference mark M provided to the electrode sheet S.

[0173] Further, in the above basic example, it is preferable that each detection instrument 20 detects the reference mark M in a state in which each sensor portion 22 is fixed without performing a round trip scan on the outgoing electrode sheet S. By fixing each sensor portion 22, the detection instrument 20 can detect the reference mark M even in a case where the reference mark M is provided only near the center of the electrode sheet S in the direction perpendicular to the electrode sheet flow direction, for example.

[0174] (3-2-2. Application example)

[0175] A modification of the reference mark detection process of the detection instrument 20 will be described. As described in (3-1. Specific example of reference mark M) (3-1-2. Modification) above, the reference mark M can not only be a single mark, but also a plurality of marks pasted at constant intervals to the measurement target. At this time, the measurement device 10 collects detection results of the reference mark M at a plurality of positions, calculates the inter-instrument distance corresponding to the number of settings of the reference mark M by one-time feeding of the measurement target, and calculates the average of the calculated inter-instrument distances. At this time, the measurement device 10 excludes values that are significantly different, thereby reducing the effects of false detection, delay of communication, and the like caused by noise.

[0176] Further, in the case of using a plurality of reference marks M as described above, the interval at which the reference mark M such as a mark seal is pasted can be determined in advance. The reason for this is that the detection instrument 20 cannot accurately detect that the reference marks M are close to each other in the case where the responsiveness of the sensor portion 22 is poor. In addition, the measurement device 10 can also exclude detection results that significantly deviate by specifying the interval.

[0177] In addition, the detection instrument 20 can achieve improvement in accuracy not only by using the detection result of the rise of the reference mark M, but also by using the detection result of the fall. That is, the detection instrument 20 can acquire detection results twice by using one reference mark M, and can also discriminate false detection caused by noise and the like by grasping the size of the reference mark M such as a mark seal in advance. In addition, the detection instrument 20 uses the sensor portion 22 such that the responsiveness of the falling edge is superior to that of the rising edge, and thus can achieve improvement in accuracy by using the detection result of the falling edge.

[0178] (3-3. Specific example of inter-instrument distance calculation process of measurement device 10)

[0179] By using Figure 11 A specific example of the calculation result will be described. Figure 12 is a diagram showing a specific example of the inter-instrument distance calculation process of the measurement device 10 according to the embodiment. Hereinafter, a basic example, a modification, and an application example of the inter-instrument distance calculation process of the measurement device 10 will be described.

[0180] (3-3-1. Basic example)

[0181] A basic example of the inter-instrument distance calculation process of the measurement device 10 will be described. In the example of (1), as the "detection instrument #1" of the detection instrument 20-1 on the upstream side of the painting production line, "5000 mm" is detected as the detection distance of the reference mark M in the case where the detection value exceeds the reference mark threshold value. In addition, in the example of (2), as the "detection instrument #2" of the detection instrument 20-2 on the downstream side of the painting production line, "5000 mm" is detected as the detection distance of the reference mark M in the case where the detection value exceeds the reference mark threshold value. Figure 12 (1), as the "detection instrument #1" of the detection instrument 20-1 on the upstream side of the painting production line, "5000 mm" is detected as the detection distance of the reference mark M in the case where the detection value exceeds the reference mark threshold value. In addition, in the example of (2), as the "detection instrument #2" of the detection instrument 20-2 on the downstream side of the painting production line, "5000 mm" is detected as the detection distance of the reference mark M in the case where the detection value exceeds the reference mark threshold value. Figure 12In example (2), the "detection instrument #2" of the downstream detection instrument 20-2 of the coating production line detects "12000mm" as the detection distance of the reference mark M when the detected value exceeds the reference mark threshold. Moreover, the measuring device 10 calculates "7000mm" as the difference between "12000mm" and "5000mm" as the instrument distance between "detection instrument #2" and "detection instrument #1".

[0182] (3-3-2. Variation Example)

[0183] A modified example of the instrument distance calculation processing of the measuring device 10 will be described. In the above (3-3-1. Basic Example), a specific example of instrument distance calculation processing using the detection distance as the detection result was described. However, if the delivery speed is known (preferably the delivery speed is constant), the measuring device 10 can also perform instrument distance calculation processing using the detection time as the detection result. Hereinafter, two possible methods will be described.

[0184] (3-3-2-1. Method 1)

[0185] Method 1, which uses the distance between instruments at the detection time as the detection result, will be explained. First, the measuring device 10 synchronizes the internal date and time of the detection instruments 20 with each other by performing date and time synchronization. Second, the detection instrument 20 records the date and time of the detection value that exceeds the detection threshold of the reference mark M, such as the marking seal sticker, and sends this date and time to the measuring device 10. Third, the measuring device 10 sets the distance between instruments as the value obtained by multiplying the difference between the received date and time by the delivery speed of the electrode plate S.

[0186] (3-3-2-2. Method 2)

[0187] Method 2 for calculating the inter-instrument distance using the detection time as the detection result will be explained. First, if the detection instrument 20 exceeds the detection threshold of a reference mark M such as a sealing sticker, it immediately notifies the measuring device 10. Second, the measuring device 10 records the date and time of receiving the notification, and multiplies the difference between that date and time by the delivery speed of the electrode plate S, setting the inter-instrument distance as the value obtained.

[0188] (3-3-3. Application Examples)

[0189] An application example of the instrument-to-instrument distance calculation processing of the measuring device 10 will be explained. Next, the smoothing processing of the detected values ​​as a noise countermeasure will be explained.

[0190] With respect to the measurement using the measurement light, sometimes the detection value is abruptly changed due to statistical fluctuation of the measurement light, noise, and the like, and it is possible that the detection threshold of the reference mark M or the like is exceeded at a wrong position or timing. As the above countermeasure, the measurement device 10 can also perform smoothing processing of the detection value. For example, the measurement device 10 can perform the smoothing processing using a moving average, a FIR (Finite Impulse Response), or the like as a structure in which the delay time of the smoothing is constant. Further, if the delay time is constant, even if there is a deviation between the position or timing at which the reference mark M passes through the detection instrument 20 and the detected position or timing, it is considered that the same deviation is generated with respect to the detection instrument 20, and thus the above deviation can be ignored.

[0191] [4. Flow of each process of the coating amount measurement system 100]

[0192] With respect to the measurement using the measurement light, sometimes the detection value is abruptly changed due to statistical fluctuation of the measurement light, noise, and the like, and it is possible that the detection threshold of the reference mark M or the like is exceeded at a wrong position or timing. As the above countermeasure, the measurement device 10 can also perform smoothing processing of the detection value. For example, the measurement device 10 can perform the smoothing processing using a moving average, a FIR (Finite Impulse Response), or the like as a structure in which the delay time of the smoothing is constant. Further, if the delay time is constant, even if there is a deviation between the position or timing at which the reference mark M passes through the detection instrument 20 and the detected position or timing, it is considered that the same deviation is generated with respect to the detection instrument 20, and thus the above deviation can be ignored. Figure 12 The flow of the process of the coating amount measurement system 100 according to the embodiment will be described. Hereinafter, on the basis of the description of the flow of the process of the entire coating amount measurement system 100, as each process, the reference mark management process, the detection result management process, and the calculation result management process will be described.

[0193] (4-1. Process of the entire coating amount measurement system 100)

[0194] With respect to the measurement using the measurement light, sometimes the detection value is abruptly changed due to statistical fluctuation of the measurement light, noise, and the like, and it is possible that the detection threshold of the reference mark M or the like is exceeded at a wrong position or timing. As the above countermeasure, the measurement device 10 can also perform smoothing processing of the detection value. For example, the measurement device 10 can perform the smoothing processing using a moving average, a FIR (Finite Impulse Response), or the like as a structure in which the delay time of the smoothing is constant. Further, if the delay time is constant, even if there is a deviation between the position or timing at which the reference mark M passes through the detection instrument 20 and the detected position or timing, it is considered that the same deviation is generated with respect to the detection instrument 20, and thus the above deviation can be ignored. Figures 13-16 The flow of the process of the entire coating amount measurement system 100 according to the embodiment will be described. Figure 13 is a flowchart showing one example of the flow of the entire coating amount measurement system 100 according to the embodiment. Further, the processes of the steps S101 to S103 described below can also be performed in different orders. In addition, there can be omitted processes among the processes of the steps S101 to S103 described below.

[0195] (4-1-1. Reference mark management process)

[0196] First, the coating amount measurement system 100 performs the reference mark management process (step S101). For example, the coating amount measurement system 100 sets the reference mark M to the electrode sheet S by performing the processes of the steps S201 to S203 described later, and sets the detection threshold indicating the detection condition of the reference mark M.

[0197] (4-1-2. Detection result management process)

[0198] First, the coating amount measurement system 100 executes a detection result management process (step S102). For example, the coating amount measurement system 100 detects the reference mark M provided to the electrode sheet S and collects a detection result indicating a position or a time at which the reference mark M is detected by executing the processes of steps S301 to S305 described later.

[0199] (4-1-3. Calculation result management process)

[0200] Third, the coating amount measurement system 100 executes a calculation result management process (step S103). For example, the coating amount measurement system 100 calculates the inter-instrument distance of the detection instrument 20 from the detection result indicating the position or the time at which the reference mark M is detected by executing the processes of steps S401 to S403 described later.

[0201] (4-2. Reference mark management process)

[0202] With Figure 13 The flow of the reference mark management process involved in the embodiment will be described. Figure 14 is a flowchart indicating one example of the flow of the reference mark management process of the coating amount measurement system 100 involved in the embodiment. Further, the processes of steps S201 to S203 described below can also be executed in different orders. In addition, there can be omitted processes among the processes of steps S201 to S203 described below.

[0203] (4-2-1. Reference mark setting process)

[0204] First, the worker W executes a reference mark setting process (step S201). For example, the worker W pastes a rectangular mark seal having a thickness greater than or equal to a certain degree to the electrode sheet S at the time of setting the detection instrument 20 to the coating production line or at the time of periodic inspection. At this time, the above-described reference mark setting process can be executed by a setting instrument that pastes the mark seal instead of the worker W.

[0205] (4-2-2. Detection threshold input process)

[0206] Second, the worker W executes a detection threshold input process (step S202). For example, the worker W sets a detection threshold at which the thickness of the mark seal can be detected by the detection instrument 20 and inputs it to the measurement device 10. The above-described detection threshold input process can also be omitted in the case where the measurement device 10 holds an internally prescribed detection threshold.

[0207] (4-2-3. Detection threshold storage process)

[0208] (3) The measuring device 10 executes a detection threshold value storage process (step S203). For example, the measuring device 10 stores the input detection threshold value in the detection threshold value storage section 14a.

[0209] (4-3. Detection result management process)

[0210] By using Figure 14 The flow of the detection result management process according to the embodiment will be described. Figure 15 is a flowchart showing one example of the flow of the detection result management process of the coating amount measuring system 100 according to the embodiment. Further, the processes of the following steps S301 to S305 can be executed in different orders. In addition, there can be omitted processes among the processes of the following steps S301 to S305.

[0211] (4-3-1. Detection threshold value transmission process)

[0212] (1) The measuring device 10 executes a detection threshold value transmission process (step S301). For example, the measuring device 10 transmits the detection threshold value stored in the detection threshold value storage section 14a to each detection instrument 20.

[0213] (4-3-2. Sheet feeding process)

[0214] (2) The worker W executes a sheet feeding process (step S302). For example, the worker W feeds the electrode sheet S to which the mark seal is attached at a feeding speed V (m / s) that is a constant speed by operating the rollers of the coating production line.

[0215] (4-3-3. Reference mark detection process)

[0216] (3) The detection instrument 20 executes a reference mark detection process (step S303). For example, the detection instrument 20 detects the mark seal of the fed electrode sheet S when the detection threshold value set by the measuring device 10 is exceeded.

[0217] (4-3-4. Detection result collection process)

[0218] (4) The measuring device 10 executes a detection result collection process (step S304). For example, the measuring device 10 collects the detection distance or the detection time of the mark seal on the electrode sheet S as a detection result from each detection instrument 20.

[0219] (4-3-5. Detection result storage process)

[0220] (5) The measuring device 10 executes a detection result storage process (step S305). For example, the measuring device 10 stores the detection distance or the detection time of the mark seal on the electrode sheet S as a detection result in the detection result storage section 14b.

[0221] (4-4. Calculation result management processing)

[0222] By using Figure 15 A flow of the calculation result management processing according to the embodiment will be described. Figure 16 is a flowchart showing one example of a flow of the calculation result management processing of the coating amount measurement system 100 according to the embodiment. Further, the processing of the following steps S401 to S403 can be executed in different orders. In addition, there can be omitted processing in the processing of the following steps S401 to S403.

[0223] (4-4-1. Detection result reference processing)

[0224] First, the measurement device 10 executes the detection result reference processing (step S401). For example, the measurement device 10 refers to the detection distance or the detection time of the marker seal on the electrode sheet S stored in the detection result storage section 14b as the detection result.

[0225] (4-4-2. Inter-instrument distance calculation processing)

[0226] Second, the measurement device 10 executes the inter-instrument distance calculation processing (step S402). For example, the measurement device 10 calculates the inter-instrument distance of the detection instruments 20 using the detection distance or the detection time of the marker seal on the electrode sheet S.

[0227] (4-4-3. Calculation result storage processing)

[0228] Third, the measurement device 10 executes the calculation result storage processing (step S403). For example, the measurement device 10 stores the inter-instrument distance of the detection instruments 20 in the calculation result storage section 14c as the calculation result.

[0229] [5. Effects of the embodiment]

[0230] Finally, the effects of the embodiment will be described. Hereinafter, effects 1 to 8 corresponding to the processing according to the embodiment will be described.

[0231] (5-1. Effect 1)

[0232] First, in the processing according to the above embodiment, the measurement device 10 collects the detection results of the reference marks M detected by the respective detection instruments 20 from the respective detection instruments 20 provided in the conveying direction of the measurement target object having the reference marks M, and calculates the inter-instrument distance representing the interval at which the respective detection instruments 20 are provided based on the collected detection results. Thus, in this processing, the arrangement positions of the respective detection instruments 20 included in the production line can be easily found.

[0233] (5-2. Effect 2)

[0234] Secondly, in the process described in the above embodiment, each detection instrument 20 has a sensor unit 22 that irradiates a sheet-shaped object to be measured with measurement light to obtain the transmission intensity of the measurement light. Furthermore, the measuring device 10 collects the detection results detected by the sensor units 22 of each detection instrument 20. Therefore, in this process, the installation position of each detection instrument 20 included in the production line can be easily determined in the coating amount measurement using measurement light.

[0235] (5-3. Effect 3)

[0236] Third, in the processing described in the above embodiment, the measuring device 10 accepts the detection threshold of the detection reference mark M, sends the accepted detection threshold to each detection instrument 20, and collects the detection results detected by each detection instrument 20 corresponding to the detection threshold. Therefore, in this processing, the setting position of each detection instrument 20 with the detection conditions set for the reference mark M can be easily determined.

[0237] (5-4. Effect 4)

[0238] Fourth, in the process described in the above embodiment, the measuring device 10 collects the detection distance, representing the total distance the object to be measured is sent out, as a detection result, and calculates the difference in detection distance between each measuring instrument 20 as the distance between instruments. Therefore, in this process, the installation position of each measuring instrument 20 included in the production line can be easily determined based on the distance the object to be measured is sent out.

[0239] (5-5. Effect 5)

[0240] Fifth, in the processing described in the above embodiment, the measuring device 10 collects the detection time, which indicates the time when the reference mark M is detected, as the detection result, and calculates the product of the difference in the detection time of each measuring instrument 20 and the delivery speed, which indicates the speed at which the object to be measured is delivered, as the distance between instruments. Therefore, in this processing, the installation position of each measuring instrument 20 included in the production line can be easily determined based on the time when the reference mark M is detected.

[0241] (5-6. Effect 6)

[0242] Sixth, in the process described in the above embodiment, the measuring device 10 updates the parameters used when measuring the object to be measured using the calculated instrument-to-instrument distance. Therefore, in this process, the installation position of each measuring instrument 20 included in the production line can be easily determined, and the instrument-to-instrument distance of each measuring instrument 20 can be automatically adjusted during installation, periodic inspection, etc.

[0243] (5-7. Effect 7)

[0244] (7) In the processing related to the above-described embodiment, the reference mark M is a sticker-like mark attached to the measurement target. Therefore, in the present processing, the setting positions of the respective inspection instruments 20 included in the production line can be easily found by using the mark seal sticker.

[0245] (5-8. Effect 8)

[0246] (8) In the processing related to the above-described embodiment, the respective inspection instruments 20 are provided in a painting production line in which sheet-shaped measurement targets are painted. Therefore, in the present processing, the setting positions of the respective inspection instruments 20 included in the painting production line can be easily found.

[0247] [6. System]

[0248] As for information including the processing sequence, the control sequence, the specific name, the various data, and the parameters shown in the above-described description and the drawings, the information can be arbitrarily changed except for the case where it is specifically described.

[0249] In addition, each structural element of each device illustrated is a functional concept, and is not necessarily physically configured as illustrated. That is, the specific manner of dispersing and integrating each device is not limited to the illustrated manner. That is, all or a part thereof can be configured to be dispersed / integrated in function or in physics in an arbitrary unit according to various loads, usage conditions, and the like.

[0250] Furthermore, all or any part of each processing function performed by each device can be realized by a CPU and a program executed by the CPU, or can be realized as hardware based on wired logic.

[0251] [7. Hardware]

[0252] Next, a hardware structure example of the measurement device 10 will be described. In addition, the same hardware structure can be provided to other devices. Figure 16 is a diagram for describing a hardware structure example related to the embodiment. As Figure 17 indicated, the measurement device 10 has a communication device 10a, an HDD (Hard Disk Drive) 10b, a memory 10c, and a processor 10d. In addition, Figure 17 Each part indicated in the drawing is connected to each other by a bus or the like.

[0253] The communication device 10a is a network interface card or the like, and performs communication with other servers. The HDD 10b stores a program, a database, and the like that act on the functions indicated in the drawing. Figure 17

[0254] The processor 10d executes the functions indicated in the drawing. Figure 6 ​The programs of the same processes of the respective processing sections shown are read out from the HDD 10b or the like and expanded in the memory 10c, whereby the processes are executed Figure 6 Figure 6 The processes of the respective functions described in the above-described embodiments are executed by the processes. For example, the processes execute the same functions as the respective processing sections of the measuring apparatus 10. Specifically, the processor 10d reads out the programs having the same functions as the reception section 15a, the collection section 15b, the calculation section 15c, or the like from the HDD 10b or the like. Also, the processor 10d executes processes that execute the same processing as the reception section 15a, the collection section 15b, the calculation section 15c, or the like.

[0255] In this way, the measuring apparatus 10 functions as an apparatus that reads out and executes programs to execute various processing methods. In addition, the measuring apparatus can also read out the above-described programs from a recording medium using a medium reading apparatus and execute the read-out programs, thereby achieving the same functions as the above-described embodiments. Furthermore, the programs described in the other embodiments are not limited to being executed by the measuring apparatus 10. For example, the present application can also be similarly applied in the case where other computers or servers execute programs, or in the case where they cooperatively function to execute programs.

[0256] The programs can be configured via a network such as the Internet. In addition, the programs can be recorded on a recording medium that can be read by a computer, such as a hard disk, a floppy disk (FD), a CD-ROM, a MO (Magneto-Optical disk), a DVD (Digital Versatile Disc), or the like, and executed by the computer by being read out from the recording medium.

[0257] [8. Other]

[0258] Several examples of combinations of disclosed technical features are described below.

[0259] (1) A measuring apparatus, wherein

[0260] The measuring apparatus has a collection section that collects detection results of the reference marks detected by the respective detection instruments from the respective detection instruments disposed in the conveying direction of the measurement target object having the reference marks, and a calculation section that calculates an instrument-to-instrument distance representing an interval at which the respective detection instruments are disposed, based on the collected detection results.

[0261] (2) The measuring apparatus according to (1), wherein

[0262] The respective detection instruments have a sensor section that irradiates the measurement light to the sheet-shaped measurement target object and acquires a transmission intensity of the measurement light, and the collection section collects the detection results detected by the sensor sections of the respective detection instruments.

[0263] (3) The measuring device according to (1) or (2), wherein

[0264] The measuring device further has a reception unit that receives a detection threshold value that detects the reference mark, and transmits the received detection threshold value to the respective detection instruments, and the collection unit respectively collects the detection results detected by the respective detection instruments corresponding to the detection threshold values.

[0265] (4) The measuring device according to any one of (1) to (3), wherein

[0266] The collection unit respectively collects, as the detection results, detection distances that indicate total distances of the measurement target objects that are sent out, and the calculation unit calculates, as the inter-instrument distance, a difference between the detection distances of the respective detection instruments.

[0267] (5) The measuring device according to any one of (1) to (4), wherein

[0268] The collection unit respectively collects, as the detection results, detection times that indicate times when the reference mark is detected, and the calculation unit calculates, as the inter-instrument distance, a product of a difference between the detection times of the respective detection instruments and a sending speed that indicates a speed at which the measurement target objects are sent out.

[0269] (6) The measuring device according to any one of (1) to (5), wherein

[0270] The calculation unit updates a parameter used when the measurement target objects are measured, using the calculated inter-instrument distance.

[0271] (7) The measuring device according to any one of (1) to (6), wherein

[0272] The reference mark is a sticker-like mark that is attached to the measurement target object.

[0273] (8) The measuring device according to any one of (1) to (7), wherein

[0274] The respective detection instruments are provided in a painting production line that paints the measurement target objects in a sheet shape.

[0275] (9) A measuring method, wherein

[0276] A computer performs a process of respectively collecting, from respective detection instruments provided in a sending direction of measurement target objects having reference marks, detection results of the reference marks detected by the respective detection instruments, and calculating, based on the collected detection results, an inter-instrument distance that indicates an interval at which the respective detection instruments are provided.

[0277] (10) A measurement program, wherein

[0278] The measurement program causes a computer to execute a process of collecting detection results of a reference mark detected by each detection instrument from each detection instrument disposed in a conveyance direction of a measurement target object having the reference mark, and calculating an inter-instrument distance representing an interval at which the each detection instrument is disposed, based on the collected detection results.

Claims

1. A measuring device, wherein, The measuring device has: The collection unit collects the detection results of the reference mark detected by each detection instrument from each detection instrument located in the delivery direction of the object to be measured with the reference mark; as well as The computing unit calculates the inter-instrument distance, which represents the interval between the various testing instruments, based on the collected detection results.

2. The measuring device according to claim 1, wherein, Each of the detection instruments has a sensor unit that irradiates the sheet-shaped object to be measured with measuring light to obtain the transmission intensity of the measuring light. The collection section collects the detection results detected by the sensor sections of each of the detection instruments.

3. The measuring device according to claim 1, wherein, The measuring device also includes a receiving unit, which receives the detection threshold for detecting the reference mark and sends the received detection threshold to each of the measuring instruments. The collection section collects the detection results detected by each detection instrument in accordance with the detection threshold.

4. The measuring device according to claim 1, wherein, The collection unit collects, as the detection result, the detection distance representing the total distance the object being measured was sent out. The calculation unit calculates the difference in detection distance between each detection instrument as the distance between the instruments.

5. The measuring device according to claim 1, wherein, The collection unit collects, as the detection result, the detection time representing the moment when the reference mark was detected. The calculation unit calculates the product of the difference in detection time of each detection instrument and the delivery speed, which represents the speed at which the object to be measured is delivered, as the distance between the instruments.

6. The measuring device according to claim 1, wherein, The calculation unit updates the parameters used when measuring the object being measured using the calculated distance between the instruments.

7. The measuring apparatus according to any one of claims 1 to 6, wherein, The reference mark is a sticker-like mark affixed to the object being measured.

8. The measuring apparatus according to any one of claims 1 to 6, wherein, Each of the testing instruments is installed on a coating production line that coats the sheet-like test object.

9. A determination method, wherein, The computer performs the following processing: Each detection instrument, positioned in the delivery direction of the object to be measured with reference marks, collects the detection results of the reference marks detected by each detection instrument. Based on the collected detection results, the distance between instruments, which represents the interval between the various detection instruments, is calculated.

10. A computer-readable recording medium recording a measurement program, wherein, The measurement procedure causes the computer to perform the following processing: collecting the detection results of the reference mark detected by each detection instrument located in the delivery direction of the object to be measured with the reference mark. Based on the collected detection results, the distance between instruments, which represents the interval between the various detection instruments, is calculated.

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