Method and system for burning pipeline SN code based on ATEFT test

Abstract

The invention discloses a method and a system for burning a pipeline SN code based on ATEFT test. According to the method, in a preprocessing stage, a corresponding flow card is generated for a committed work order of each batch, and then a unique order number CODE is generated according to a client code and an MES batch number; the method comprises the following steps: creating a CODE catalogue on a server, and storing an SN.txt text file, an SNMIN.txt text file and an SNMAX.txt text file into the CODE catalogue; the method comprises the following steps of: in a pre-detection stage, before a current batch of test is started, judging whether an SN.txt text file, an SNMIN.txt text file and an SNMAX.txt text file can be correctly acquired from a server or not; if the SN.txt text file, the SNMIN.txt text file and the SNMAX.txt text file on the server can be backed up to the local; when a burning test item is executed, reading the current SN.txt text file, the current SNMIN.txt text file and the current SNMAX.txt text file from a server and judging whether the current SN.txt text file, the current SNMIN.txt text file and the current SNMAX.txt text file meet test requirements or Then testing each test site to serially obtain SN information, and judging whether the SN information meets the requirements or not; and if the requirement is met, the SN code is added automatically and then written into the chip. According to the invention, the SN uniqueness and the whole-course traceability can be ensured, and the test cost is obviously reduced.

Description

Technical Field

[0001] This invention relates to a method and system for testing and programming serial number (SN) codes based on ATE_FT, belonging to the field of integrated circuit testing technology. Background Technology

[0002] ATE_FT testing is a critical step after semiconductor back-end packaging. It involves using Automated Test Equipment (ATE) to apply stimuli to the chip and collect its responses to verify whether its functions and performance under real-world operating conditions fully meet design specifications. The test results directly determine whether the chip can proceed to the next stage or be delivered to the customer, thus serving as the final gatekeeper for quality control.

[0003] In mass production, to ensure that each chip can be uniquely traced in subsequent distribution, application, and even after-sales stages, a non-volatile serial number (SN code) must be burned into its non-volatile memory area (such as on-chip Flash) during the testing phase. This SN code not only serves as a lifelong identifier for the chip but is also permanently bound to key data such as its production batch, test batch, and failure records. This facilitates quality traceability, prevents tampering or forgery, and ultimately becomes the source for generating unique identifiers for terminal devices.

[0004] However, the existing process still relies on manual operation: for each batch or process change, engineers must first manually modify the SN text file in the test program directory according to the work order, and then repeatedly open the file to check the current SN value during the test. Human intervention is very likely to cause SN codes to be written incorrectly, omitted, or overwritten; if the test program is accidentally deleted after the test is completed, the SN record for that batch will also be lost, causing a break in the data chain.

[0005] After testing, the system categorizes the chip into different failure bins (BINs) based on the results. Each BIN corresponds to a failure mode or performance level; for example, BIN2 might indicate that a certain electrical parameter exceeds the limit. The binding of the serial number (SN) code to the BIN forms a complete failure profile, providing a basis for subsequent analysis and processing.

[0006] A complete test task is typically completed at one or more "test sites". A site is a workstation consisting of one or more ATE (Automatic Test Equipment) units, which can simultaneously apply stimuli to one or more chips and collect responses. Due to the lack of a unified SN (Serial Number) allocation and verification mechanism between sites, human error or insufficient coordination between sites often leads to duplicate, skipped, or out-of-range SNs, directly affecting data integrity and product reliability. Summary of the Invention

[0007] The primary technical problem to be solved by this invention is to provide a method for testing and programming serial number (SN) codes based on ATE_FT.

[0008] Another technical problem to be solved by the present invention is to provide a system for testing and burning serial number SN codes based on ATE_FT.

[0009] To achieve the above-mentioned technical objectives, the present invention adopts the following technical solution:

[0010] According to a first aspect of the present invention, a method for testing and programming serial number (SN) codes based on ATE_FT is provided, comprising the following steps:

[0011] In the preprocessing stage, the total number of SN codes is divided into M batches, where M is a positive integer. Each batch of work orders generates a corresponding process card, which includes the customer code, SN value, SN_MIN value, SN_MAX value and MES batch number. Then, using the customer code and the MES batch number as parameters, a unique order number CODE is generated according to the MES unique order number generation algorithm.

[0012] Create a CODE directory on the server, and generate SN.txt, SN_MIN, and SN_MAX text files from the SN, SN_MIN, and SN_MAX values, and save them to the CODE directory.

[0013] During the pre-testing phase, before the current batch test begins, it is first determined whether the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be correctly obtained from the server; if they can be obtained, the SN.txt, SN_MIN.txt, and SN_MAX.txt text files on the server are backed up to the local machine.

[0014] When performing the programming test, the system first reads from the server and checks whether the character format and numerical value of the current SN.txt, SN_MIN.txt, and SN_MAX.txt text files meet the requirements. If they do, the SN code in SN.txt is incremented and then written to the chip. If they do not meet the requirements, the SN status is set to invalid.

[0015] Finally, a CSV file is used to record the time, SN value, SN status, SN_MIN, SN_MAX, and burning result information for each test site.

[0016] Preferably, the step of determining whether the character format and numerical size of the current SN.txt, SN_MIN.txt, and SN_MAX.txt text files meet the conditions includes:

[0017] Check if the SN value contains only valid characters from 0 to 9;

[0018] Check if SN_MIN≤SN≤SN_MAX is satisfied.

[0019] Preferably, the step of determining whether the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be correctly obtained from the server specifically includes:

[0020] Based on the customer code and MES batch number in the process card, a unique order number (CODE) is generated. Then, the unique order number (CODE) is used to query the CODE directory to obtain the storage paths of the SN.txt, SN_MIN.txt, and SN_MAX.txt text files in the CODE directory of the current test batch on the server.

[0021] Preferably, the following steps are performed during the pre-detection stage:

[0022] Step 2.1 Enter mass production mode and automatically enter the customer code, MES batch number, product name of the work order, batch number of the work order, and test program name of the work order according to the process card.

[0023] Step 2.2 Automatically download and load the test program for the work order;

[0024] Step 2.3 Obtain the storage paths of the SN.txt, SN_MIN.txt, and SN_MAX.txt text files in the CODE directory on the server for the current test batch;

[0025] Step 2.4 checks if the path exists. If it does not exist, a pop-up window will display the error type, and the test program will exit. If a CODE directory corresponding to the CODE calculated in Step 2.3 exists on the server, proceed to the next step.

[0026] Step 2.5 Check if the text files SN.txt, SN_MIN.txt, and SN_MAX.txt exist in the CODE directory. If they do not exist, a pop-up window will display the error type, and the test program will exit. If they exist, proceed to the next step.

[0027] Step 2.6 Copy the text files SN.txt, SN_MIN.txt, and SN_MAX.txt from the CODE directory on the server to the current test directory.

[0028] Preferably, the following steps are included when performing the programming test:

[0029] Step 3.1 Open the server's SN.txt, SN_MIN.txt, and SN_MAX.txt text files;

[0030] Step 3.2 Check if the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be successfully read. If it fails, a pop-up window will indicate the error type, and then the BIN will be invalidated.

[0031] Step 3.3 Read SN, SN_MIN, and SN_MAX in character form;

[0032] Step 3.4 Check whether SN, SN_MIN, and SN_MAX contain only characters 0 to 9. If other illegal characters are found, a pop-up window will indicate the error type, and then the BIN will be set as invalid.

[0033] Step 3.5 Obtain the decimal values ​​of SN, SN_MIN, and SN_MAX;

[0034] Step 3.6 Check if SN_MIN≤SN≤SN_MAX is satisfied. If not, a pop-up window will indicate the error type, and then the BIN will be set as invalid.

[0035] Step 3.7 Determine if the current test site is the maximum number of test sites. If so, proceed to step 3.16.

[0036] Step 3.8 Initialize the SN, SN_MIN, and SN_MAX of the multiple chips for each test;

[0037] Step 3.9 Open the SN text file serially at each test site;

[0038] Step 3.10 Check if the SN text has been successfully obtained. If it fails, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0039] Step 3.11 Read the SN in character form;

[0040] Step 3.12 checks if the SN value contains only valid characters 0 to 9. If other illegal characters are found, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0041] Step 3.13 Obtain the decimal value of SN;

[0042] Step 3.14 checks whether SN_MIN≤SN≤SN_MAX is satisfied. If not, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0043] Step 3.15 increments the SN value and writes it to the server and local backup SN text files respectively;

[0044] Step 3.16 Check if the SN information of each test site is valid. If not, set it as an invalid BIN.

[0045] Step 3.17 Write the SN code into the chip;

[0046] Step 3.18 Obtain the SN code writing result;

[0047] Step 3.19 Record the SN value, SN status, SN information usage time, burning result, SN_MIN value, and SN_MAX value for each test site using a CSV file.

[0048] Preferably, the SN_MIN value in the process card is the SN_MAX value of the previous work order plus a preset value; the SN_MAX value is the SN_MIN value plus the number of tests and the amount of loss; the initial SN value is the SN_MIN value.

[0049] According to a second aspect of the present invention, a system for testing and programming serial number (SN) codes based on ATE_FT is provided, comprising a processor and a memory, wherein the processor and the memory are coupled together; wherein the memory is used to store a computer program; and the processor is used to run the computer program stored in the memory to implement the above-described method for testing and programming serial number (SN) codes based on ATE_FT.

[0050] Compared with existing technologies, this invention automates the generation, allocation, writing, and traceability of serial numbers (SNs) through a closed-loop process of "unified server preprocessing—pre-emptive error prevention detection—serial auto-increment allocation—multi-level verification—full-process CSV recording—batch verification," completely replacing manual intervention and reducing the SN error rate from an average of once every two months to zero. Simultaneously, it ensures SN uniqueness and full traceability through a unique CODE directory, dual character and numerical verification, real-time logs, and dedicated inspection tools, significantly reducing testing costs and improving efficiency and economic benefits. Attached Figure Description

[0051] Figure 1 This is a schematic diagram of the preprocessing stage of the method for testing and burning serial number SN codes based on ATE_FT in the first embodiment of the present invention.

[0052] Figure 2 This is a flowchart illustrating the pre-detection stage in the first embodiment of the present invention;

[0053] Figure 3 This is a schematic diagram of the first part of the programming stage process in the first embodiment of the present invention;

[0054] Figure 4 To and Figure 3 A schematic diagram of the second part of the subsequent burning stage process;

[0055] Figure 5 To and Figure 4 A schematic diagram of the third part of the subsequent burning stage process;

[0056] Figure 6 This is a schematic diagram of the software interface during the final verification stage in the first embodiment of the present invention;

[0057] Figure 7 This is a schematic diagram of the system structure for testing and programming serial number SN codes based on ATE_FT in the second embodiment of the present invention. Detailed Implementation

[0058] The technical content of the present invention will now be described in detail with reference to the accompanying drawings and specific embodiments.

[0059] First Embodiment

[0060] The technical concept of this invention is to address the drawback of manually generating serial numbers (SNs) one by one at each test site. Instead, it preprocesses the SNs uniformly on the server before testing, using a unified on-site serial number generation rule to avoid human error in SN codes. A pre-detection stage is added, which detects errors through error prevention and directly displays error messages, allowing operators to handle them in advance and avoiding classifying these SN codes (i.e., the SN values) as invalid BINs, thus reducing SN code waste. During the programming stage, the error prevention process is improved to enhance the detection rate of invalid SN codes, and the work record of the finally written SN codes is recorded on the test site. In the final verification stage, the SN codes of the current batch or all batches are checked to ensure that there are no duplicate SN codes.

[0061] The following is combined with Figures 1-6 This document details the specific processing steps of the method for testing and programming serial number SN codes based on ATE_FT provided in the embodiments of the present invention.

[0062] Phase 1: Preprocessing phase.

[0063] Based on the total number of serial numbers (SNs) in a customer's work order, the integrated circuit testing organization divides the total number of SNs into multiple batches M (M being a positive integer) using the optimal batch capacity. For example, the optimal capacity for each batch can be set to 50,000 (i.e., total number of SNs = 50,000 * M). This is an empirical value derived from years of industry best practices, ensuring both efficient and smooth processing while minimizing losses and processing costs when SN errors occur.

[0064] Based on the divided batch M, M work orders are generated (containing information such as work order number, client, SN value, SN_MIN value, SN_MAX value, test quantity, product name, MES batch number, tag batch number, and test program name). The SN_MIN value is the previous work order's SN_MAX value plus a preset value (e.g., 100). The SN_MAX value is the SN_MIN value plus the test quantity and loss rate (assuming a 5% loss rate). The integrated circuit testing organization generates corresponding runcards based on the information of each work order. Each runcard contains all the information of the aforementioned work order. The customer code corresponds to the client; the initial SN value in the runcard is the SN-MIN value; the SN_MIN value corresponds to the work order's SN_MIN value, and the SN_MAN value corresponds to the work order's SN_MXN value; the MES batch number in the runcard consists of the integrated circuit testing organization's code and the work order number; the QR code in the runcard contains information such as the customer code, MES batch number, work order product name, work order batch number, and work order test program name.

[0065] Then, using the customer code and MES batch number from this process card as parameters, a unique tracking number (CODE) is generated according to the MES unique tracking number generation algorithm. This CODE is used to uniquely identify the process card on the server. A directory for this unique tracking number (CODE directory) is created on the server, and the information from the Runcard's SN, SN_MIN, and SN_MAX is saved as text files SN.txt, SN_MIN.txt, and SN_MAX.txt to the CODE directory.

[0066] In the preprocessing stage, the generation of serial number (SN) codes is transferred from scattered test sites to the server, where all SN codes are generated uniformly. Standardization and automation are achieved through a unique serial number algorithm (generating a unique directory based on customer code and MES batch number), range definition (SN_MIN / SN_MAX), and batch division rules (50,000 / batch), reducing manual intervention. Thus, the server automatically generates SN codes, avoiding errors during manual allocation (such as mis-entered spaces or symbols).

[0067] Phase Two: Pre-detection Phase.

[0068] The pre-detection stage mainly involves error prevention, identifying and filtering out some common mistakes in advance.

[0069] Before starting the current batch test, first determine whether the SN.txt, SN_MIN.txt, and SN_MAX.txt text files from step 1.2 can be correctly obtained from the server. If they can be obtained, first back up the SN.txt, SN_MIN.txt, and SN_MAX.txt text files from the server to the local machine (the main control computer controlling multiple test sites) to facilitate recording the use of SN values ​​in the process during the test.

[0070] The specific steps are as follows:

[0071] Step 2.1 Enter mass production mode. Based on the Runcard (e.g., scan the Runcard QR code), automatically enter the customer code, MES batch number, product name of the work order, batch number of the work order, and test program name of the work order from the Runcard.

[0072] Step 2.2 Automatically download and load the test program for the work order;

[0073] Step 2.3: The test program generates a unique tracking number (CODE) based on the MES unique tracking number generation algorithm, using the customer code and MES batch number from the entered Runcard as parameters. Then, it queries the CODE directory using this unique tracking number to obtain the storage paths of the SN.txt, SN_MIN.txt, and SN_MAX.txt text files within the CODE directory on the server for the current test batch. The CODE directory is a directory of files named after the CODE.

[0074] Step 2.4 Check if the path exists. If it does not exist, a pop-up window will display an error message and the test program will exit; if it exists, meaning that a CODE directory corresponding to the CODE calculated in Step 2.3 exists on the server, proceed to the next step.

[0075] Step 2.5 checks if the text files SN.txt, SN_MIN.txt, and SN_MAX.txt exist in the CODE directory. If they do not exist, a pop-up window will display an error message, and the test program will exit. If they exist, proceed to the next step.

[0076] Step 2.6 Copy the text files SN.txt, SN_MIN.txt, and SN_MAX.txt from the CODE directory on the server to the current test directory.

[0077] The pre-testing phase enforces file path checks and file validity verification before testing begins to prevent errors, such as missing files, illegal characters, and format errors, thus avoiding erroneous serial numbers from entering subsequent processes.

[0078] The text files SN.txt, SN_MIN.txt, and SN_MAX.txt are stored in the same Runcard and generated using the same algorithm in both the server's storage directory and the directory generated by the test program. When retrieving these three text files, a match was made between the directory generated by the test program and the server's storage directory to ensure that these are the three files required for this task and to avoid errors.

[0079] Furthermore, in this embodiment of the invention, server files are backed up to the local host computer to ensure that the test environment is consistent with the server data.

[0080] Phase 3: Burning Phase.

[0081] The programming stage is the main execution stage, in which the SN code is programmed onto the chip.

[0082] When executing the burning test, firstly, the system reads from the server and determines whether the current text files SN.txt, SN_MIN.txt, and SN_MAX.txt meet the test requirements. The determination criteria include whether the character format and numerical values ​​of the three files meet preset conditions.

[0083] If the requirements are met, the SN code in SN.txt will be incremented; if the requirements are not met, no operation will be performed on the SN code in SN.txt, an error message will be displayed, and the SN status of the site will be set to invalid. Subsequently, the SN status of each site will be uniformly judged, and sites with invalid SN status will be classified as invalid bins.

[0084] Then, the information is written to the chip. Finally, a dedicated .csv file records the time, SN value, SN status, SN_MIN, SN_MAX, and programming result information for each test site. Here, the SN information includes the SN, SN_MIN, and SN_MAX values. The data file generated by the ATE during testing contains all parameters of the entire test project, which is not conducive to intuitively viewing the current programming stage status; therefore, using a dedicated file can effectively solve this problem. The dedicated file format facilitates review by the production department / QE; and this .csv file can also be used for SN checking tools.

[0085] The specific steps for this stage are as follows:

[0086] Step 3.1 Open the server's SN.txt, SN_MIN.txt, and SN_MAX.txt text files.

[0087] Step 3.2 checks if the three text files can be successfully read. If it fails, a pop-up window will display the error type, and then the file will be set as a failed BIN.

[0088] Step 3.3 Read SN, SN_MIN, and SN_MAX in character form.

[0089] Step 3.4 checks whether the characters in SN, SN_MIN, and SN_MAX are valid (containing only a portion of the 10 numeric characters from 0 to 9, i.e., only all numeric characters). If other characters are found, a pop-up window will indicate the error type, and then the BIN will be set as invalid.

[0090] The reason for ensuring that the SN value, SN_MIN, and SN_MAX strings are only all numeric characters is that if other characters are present, the character conversion to decimal number operation will have the following problems. For example, when 12345 is entered as 123 45 (with a space between 3 and 4), 123*45, 123X45, etc., the final decimal value obtained will be 123, and the 45 will be truncated.

[0091] Step 3.5 Obtain the decimal values ​​of SN, SN_MIN, and SN_MAX.

[0092] This step serves two purposes: firstly, it facilitates subsequent data processing; secondly, it ensures, as described in step 3.19, that the data is recorded in decimal format in the csv file, making it easy for the production or QE departments to access in later steps.

[0093] Step 3.6 checks if SN_MIN≤SN≤SN_MAX is satisfied. If not, a pop-up window will display the error type, and the affected BIN will be set as invalid.

[0094] Step 3.7 Determine if the current test site is the maximum number of test sites. If so, proceed to step 3.16.

[0095] Step 3.8 Initialize the SN, SN_MIN, and SN_MAX of the multiple chips for each test.

[0096] Typically, each main control computer controls 4 or 8 test sites, so the number of chips tested each time is multiple.

[0097] Step 3.9 Open the SN text file serially at each test site.

[0098] Step 3.10 checks if the SN text was successfully obtained. If it fails, a pop-up window will display the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0099] Step 3.11 Read the SN value in character form.

[0100] Step 3.12 checks if the SN value contains only valid characters 0 to 9 (these ten characters). If other illegal characters are found, a pop-up window will display the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0101] Step 3.13 Obtain the decimal number of the SN value.

[0102] Step 3.14 checks if the condition SN_MIN≤SN≤SN_MAX is met. If not, a pop-up window will display the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution.

[0103] Step 3.15 increments the SN value and writes it to the server and local backup SN text files respectively.

[0104] Step 3.16 Check if the SN information of each test site is valid (i.e., the SN status value is not "invalid"). If not, set it as an invalid BIN.

[0105] Step 3.17 Write the SN code into the chip.

[0106] Step 3.18 Obtain the SN code writing result.

[0107] Step 3.19 Record the SN value, SN status, SN information usage time, burning result, SN_MIN value, and SN_MAX value for each test site using a CSV file.

[0108] During the programming stage, a multi-level verification mechanism is employed: 1) File validity check (containing only numeric characters); 2) Numeric range check (whether the SN is between SN_MIN and SN_MAX); 3) Serial auto-increment allocation to avoid concurrent conflicts; 4) Real-time recording (recording the usage time, status, and programming result of each SN code in a CSV file) to ensure traceability. It is evident that the programming stage uses triple verification—character validity, numerical range, and auto-increment logic—to ensure that each SN code is valid and unique; simultaneously, the auto-increment mechanism prevents duplicate allocation.

[0109] Each test site sequentially executes steps 3.9 to 3.15. In steps 3.10, 3.12, and 3.14, if a test site meets the judgment conditions, its SN status is set to OK; otherwise, its SN status is set to Failed, and no further action is taken. After each site completes steps 3.9 to 3.15, step 3.16 uniformly checks whether the SN status of each site is OK (valid). Sites with an Failed SN status are directly deactivated in the BIN process, while all sites with an OK SN status simultaneously execute the burning process, thus saving burning time.

[0110] Phase Four: Final Verification Phase.

[0111] After the batch test is completed, you can use the SN checking tool (a dedicated tool) to check whether the SN codes are duplicated in the current batch or in the CSV files of all tests.

[0112] The specific steps are as follows:

[0113] 4.1 Use an SN checking tool, set the CSV file to be checked, and parameters such as SN_MIN and SN_MAX, to check for duplicate SN codes. If duplicates are found, execute the corresponding processing procedure in the integrated circuit testing organization.

[0114] Therefore, the final verification stage uses specialized tools to perform full SN uniqueness verification on batch or historical data, filling the gap in the traditional process that relies solely on manual sampling and completely eliminating the risk of duplication.

[0115] This invention utilizes process refactoring (unified generation), error-proofing technology (layered verification), and data closure (recording and verification) to transform SN code management from reliance on manual experience to systematic control. The core innovation lies in "prevention" rather than "remediation." In practical use, integrated circuit testing institutions previously experienced SN code duplication or SN code deviations from the specified range on average once every two months. After adopting this invention, such incidents have decreased to zero. Therefore, the ATE_FT-based method for writing pipelined SN codes in chip testing, provided by this invention, significantly reduces the error rate of writing SN codes during chip testing, lowers chip testing costs, improves testing efficiency, and enhances economic benefits.

[0116] Second Embodiment

[0117] like Figure 7 As shown, based on the above-described method for testing and programming serial number (SN) codes using ATE_FT, the second embodiment of the present invention further provides a system for testing and programming SN codes using ATE_FT. This system includes one or more processors and a memory. The memory is coupled to the processor and is used to store one or more programs. When the programs are executed by the processor, the processor implements the method for testing and programming SN codes using ATE_FT as described in the above embodiment.

[0118] The processor controls the overall operation of the system to complete all or part of the steps of the ATE_FT test-based serial number programming method. This processor can be a central processing unit (CPU), graphics processing unit (GPU), field-programmable gate array (FPGA), application-specific integrated circuit (ASIC), digital signal processing (DSP) chip, etc. The memory stores various types of data to support the operation of the system. This data may include instructions for any application or method operating on the system, as well as application-related data. The memory can be implemented using any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, etc.

[0119] In another exemplary embodiment, the present invention also provides a computer-readable storage medium including program instructions that, when executed by a processor, implement the steps of the method for programming serial number (SN) based on ATE_FT test in any of the above embodiments. For example, the computer-readable storage medium may be the memory including the program instructions described above, which may be executed by the system's processor to complete the method for programming serial number (SN) based on ATE_FT test and achieve the same technical effects as the method described above.

[0120] It should be noted that the above embodiments are merely illustrative examples. The technical solutions of the various embodiments can be combined, and the order of the steps can be changed, all of which are within the scope of protection of this patent.

[0121] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0122] The method and system for testing and programming serial number (SN) codes based on ATE_FT provided by this invention have been described in detail above. Any obvious modifications made by those skilled in the art without departing from the essence of this invention will constitute an infringement of the patent rights of this invention and will incur corresponding legal liability.

Claims

1. A method for testing and programming serial number (SN) codes based on ATE_FT, characterized in that... Includes the following steps: In the preprocessing stage, the total number of SN codes is divided into M batches, where M is a positive integer. Each batch of work orders generates a corresponding process card, which includes the customer code, SN value, SN_MIN value, SN_MAX value and MES batch number. Then, using the customer code and the MES batch number as parameters, a unique order number CODE is generated according to the MES unique order number generation algorithm. Create a CODE directory on the server, and generate SN.txt, SN_MIN, and SN_MAX text files from the SN, SN_MIN, and SN_MAX values, and save them to the CODE directory. During the pre-testing phase, before the current batch test begins, it is first determined whether the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be correctly obtained from the server; if they can be obtained, the SN.txt, SN_MIN.txt, and SN_MAX.txt text files on the server are backed up to the local machine. When performing the programming test, the system first reads from the server and checks whether the character format and numerical value of the current SN.txt, SN_MIN.txt, and SN_MAX.txt text files meet the requirements. If they do, the SN code in SN.txt is incremented and then written to the chip. If they do not meet the requirements, the SN status is set to invalid. Finally, a CSV file is used to record the time, SN value, SN status, SN_MIN, SN_MAX, and burning result information for each test site.

2. The method for testing and programming serial number based on ATE_FT as described in claim 1, characterized in that... The steps to determine whether the character format and numerical value of the current text files SN.txt, SN_MIN.txt, and SN_MAX.txt meet the conditions include: Check if the SN value contains only valid characters from 0 to 9; Check if SN_MIN≤SN≤SN_MAX is satisfied.

3. The method for testing and programming serial number based on ATE_FT as described in claim 2, characterized in that... The steps for determining whether the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be correctly obtained from the server specifically include: Based on the customer code and MES batch number in the process card, a unique order number (CODE) is generated. Then, the unique order number (CODE) is used to query the CODE directory to obtain the storage paths of the SN.txt, SN_MIN.txt, and SN_MAX.txt text files in the CODE directory of the current test batch on the server.

4. The method for testing and programming serial number SN based on ATE_FT as described in claim 3, characterized in that... The following steps are performed during the pre-detection phase: Step 2.1 Enter mass production mode and automatically enter the customer code, MES batch number, product name of the work order, batch number of the work order, and test program name of the work order according to the process card. Step 2.2 Automatically download and load the test program for the work order; Step 2.3 Obtain the storage paths of the SN.txt, SN_MIN.txt, and SN_MAX.txt text files in the CODE directory on the server for the current test batch; Step 2.4 Check if the path exists. If it does not exist, a pop-up window will display the error type and the test program will exit. If a CODE directory corresponding to the CODE calculated in step 2.3 exists on the server, proceed to the next step; Step 2.5 Check if the text files SN.txt, SN_MIN.txt, and SN_MAX.txt exist in the CODE directory. If they do not exist, a pop-up window will display the error type, and the test program will exit. If they exist, proceed to the next step. Step 2.6 Copy the text files SN.txt, SN_MIN.txt, and SN_MAX.txt from the CODE directory on the server to the current test directory.

5. The method for testing and programming serial number SN based on ATE_FT as described in claim 4, characterized in that... The specific steps involved in performing the programming test are as follows: Step 3.1 Open the server's SN.txt, SN_MIN.txt, and SN_MAX.txt text files; Step 3.2 Check if the SN.txt, SN_MIN.txt, and SN_MAX.txt text files can be successfully read. If it fails, a pop-up window will indicate the error type, and then the BIN will be invalidated. Step 3.3 Read SN, SN_MIN, and SN_MAX in character form; Step 3.4 Check whether SN, SN_MIN, and SN_MAX contain only characters 0 to 9. If other illegal characters are found, a pop-up window will indicate the error type, and then the BIN will be set as invalid. Step 3.5 Obtain the decimal values ​​of SN, SN_MIN, and SN_MAX; Step 3.6 Check if SN_MIN≤SN≤SN_MAX is satisfied. If not, a pop-up window will indicate the error type, and then the BIN will be set as invalid. Step 3.7 Determine if the current test site is the maximum number of test sites. If so, proceed to step 3.

16. Step 3.8 Initialize the SN, SN_MIN, and SN_MAX of the multiple chips for each test; Step 3.9 Open the SN text file serially at each test site; Step 3.10 Check if the SN text has been successfully obtained. If it fails, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution. Step 3.11 Read the SN in character form; Step 3.12 checks if the SN value contains only valid characters 0 to 9. If other illegal characters are found, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution. Step 3.13 Obtain the decimal value of SN; Step 3.14 checks whether SN_MIN≤SN≤SN_MAX is satisfied. If not, a pop-up window will indicate the error type, the SN status will be set to invalid, and then proceed to step 3.7 to continue execution. Step 3.15 increments the SN value and writes it to the server and local backup SN text files respectively; Step 3.16 Check if the SN information of each test site is valid. If not, set it as an invalid BIN. Step 3.17 Write the SN code into the chip; Step 3.18 Obtain the SN code writing result; Step 3.19 Record the SN value, SN status, SN information usage time, burning result, SN_MIN value, and SN_MAX value for each test site using a CSV file.

6. The method for testing and programming serial number based on ATE_FT as described in claim 5, characterized in that: The SN_MIN value in the process card is the SN_MAX value of the previous work order plus a preset value; the SN_MAX value is the SN_MIN value plus the number of tests and the amount of loss; the initial SN value is the SN_MIN value.

7. A system for testing and programming serial number (SN) codes based on ATE_FT, characterized in that... The device includes a processor and a memory, the processor and the memory being coupled together; wherein the memory is used to store a computer program; the processor is used to run the computer program stored in the memory, implementing the method for burning serial number SN based on ATE_FT test according to any one of claims 1 to 6.

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