Multifunctional test module for program verification
By designing a multifunctional test module that integrates an MCU unit and multiple functions, the high cost and complex operation of existing program verification systems are solved, enabling low-cost, high-efficiency hardware verification and functional expansion.
Patent Information
- Application Number
- CN202511018047.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-23
- Publication Date
- 2025-11-21
AI Technical Summary
Existing program verification and testing systems are costly and complex to operate, making it difficult to effectively verify functions in a hardware environment. Furthermore, they require multiple modules to be assembled, increasing the number and complexity of hardware components.
Design a multifunctional test module that integrates an MCU unit, a digital-to-analog converter, a digital multimeter, a pulse signal output and frequency reading unit, a main control chip, and a flash memory unit. It supports Type-C power supply and has functions such as power supply, voltage reading, I2C and SPI communication, PDM and TDM signal processing, CAN bus verification, and frequency testing. All these functions are integrated into one module, which supports external modules and scan gun verification, enabling multifunctional loop testing.
It significantly reduces costs, simplifies the setup process, improves debugging efficiency, has strong applicability and portability, meets various complex testing needs, and supports functional expansion.
Smart Images
Figure CN120994573A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of electronic testing equipment, and in particular to a multifunctional testing module for program verification. Background Technology
[0002] In testing systems, after programming, verification is typically performed using a virtual environment. However, some functions are difficult to fully verify in a virtual environment. Further verification via a hardware environment often requires building a system using hardware modules, which necessitates integrating a large number of different types of boards. This makes building the entire system quite cumbersome and significantly increases the required hardware quantity and overall cost.
[0003] Current program verification and testing systems typically consist of multiple independent modules, which not only increases costs but also complicates platform setup. These systems require additional switching power supplies, and multiple modules need to be connected together during verification, making operation inconvenient. Therefore, it is necessary to provide a multifunctional test module for program verification that is low-cost, highly efficient in debugging, widely applicable, highly portable, supports external modules and scanhead verification, facilitates functional expansion, and uses a main control unit combined with peripheral circuits to achieve multifunctional loop testing, capable of meeting various complex testing needs. Summary of the Invention
[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a multi-functional test module for program verification. It is low in cost, high in debugging efficiency, highly applicable, highly portable, supports external modules and scan gun verification, is beneficial for functional expansion, and adopts a main control combined with peripheral circuits to realize multi-functional loop testing, which can meet various complex testing needs.
[0005] The technical solution adopted in this invention is as follows: This invention includes an MCU unit, which is connected to a digital-to-analog converter, a digital multimeter, a pulse signal output and frequency reading unit, a main control chip and a flash memory unit, and a pulse width modulation and time division multiplexing unit; The output voltage of the digital-to-analog converter (DAC) is amplified by an operational amplifier circuit, switched by a MUX switch, and then connected to the analog-to-digital converter (ADC) of the MCU unit for voltage reading, thereby realizing the DAC and verifying the ADC control program. The digital multimeter is used for verifying multiple module programs. The pulse signal output and frequency reading unit outputs a PWM signal through the MCU unit, which is then passed through an operational amplifier follower circuit and a comparator. The output signal is then connected to the MCU unit for testing, realizing the program verification functions of pulse width modulation (PWM) and frequency. The main control chip and flash memory unit are used for online program burning. The pulse width modulation and time division multiplexing (TDM) unit is used to realize the program verification functions of PDM and TDM. As can be seen from the above solution, this application supports Type-C power supply, which can be directly powered by a computer, greatly simplifying the setup process. All functions are integrated into one module, significantly reducing costs. This module has multiple functions, including power supply, voltage reading, I2C and SPI communication, PDM and TDM signal processing, CAN bus verification, frequency testing, and DMM continuous sampling, which can meet various complex testing needs. It can be powered by a computer's Type-C port, and uses a main control combined with peripheral circuits to realize multi-functional loop testing. The functions are integrated into one board, which facilitates multi-functional verification. It is convenient and fast to power it directly using a computer's Type-C port. It supports external modules and scanhead verification, which is beneficial for functional expansion. It has multi-functional verification examples, high debugging efficiency, strong applicability, and strong portability.
[0006] A preferred embodiment is that the MCU unit is connected to an FT232 serial port chip, the FT232 serial port chip is connected to an external host computer, and the serial port at the back end of the FT232 serial port chip is shorted to realize the program verification of USB to serial port self-transmission and self-reception.
[0007] In a preferred embodiment, the MCU unit is connected to a power controllable circuit, which is a PP3V3 power supply circuit built with a low dropout linear regulator and a MOSFET, and supports software-controlled on / off switching.
[0008] In a preferred embodiment, the MCU unit is connected to a level conversion chip, the level conversion chip is connected to an SD card slot, an SD card is inserted into the SD card slot, and the system program upgrade circuit built by the SD card slot and the level conversion chip supports online one-click system upgrade.
[0009] A preferred embodiment is that the MCU unit is connected to an LED controllable circuit, which is an LED control circuit built with LEDs and MOS transistors to realize the on / off control of LEDs and program verification of various changes in the running light.
[0010] In a preferred embodiment, the MCU unit is connected to a memory chip via I2C, and the memory chip enables I2C communication verification and calibration parameter writing and reading. Attached Figure Description
[0011] Figure 1 This is a system block diagram of the present invention; Figure 2 This is the circuit schematic of the power supply controllable circuit; Figure 3 This is a circuit diagram of the level conversion chip and the SD card socket; Figure 4 This is the circuit diagram of the controllable LED circuit. Figure 5 This is the circuit schematic of the memory chip; Figure 6 This is the circuit schematic of the aforementioned digital-to-analog converter; Figure 7 This is the circuit diagram of the digital multimeter. Figure 8 This is the circuit schematic diagram of the pulse signal output and frequency reading unit; Figure 9 This is the circuit schematic of the FT232 serial port chip; Figure 10 This is a circuit schematic diagram of the main control chip and the flash memory unit; Figure 11 This is the circuit schematic of the pulse width modulation and time division multiplexing unit. Detailed Implementation
[0012] like Figures 1 to 11 As shown, in this embodiment, the present invention includes an MCU unit 1, which is connected to a digital-to-analog converter 2, a digital multimeter 3, a pulse signal output and frequency reading unit 4, a main control chip and flash memory unit 5, and a pulse width modulation and time division multiplexing unit 6. The output voltage of the digital-to-analog converter 2 is amplified by the operational amplifier circuit, switched by the MUX switch, and then connected to the analog-to-digital converter of the MCU unit 1 for voltage reading, realizing the control program verification of the digital-to-analog converter 2 and the analog-to-digital converter; the digital multimeter 3 is used for program verification of multiple modules; the pulse signal output and frequency reading unit 4 outputs a PWM signal through the MCU unit 1, which is then connected to the MCU unit 1 for testing after passing through the operational amplifier follower circuit and comparator, realizing the program verification function of pulse width modulation and frequency; the main control chip and flash memory unit 5 are used for online program burning; the pulse width modulation and time division multiplexing unit 6 is used to realize the program verification function of PDM and TDM functions.
[0013] PDM (Pulse Density Modulation): A technology that converts analog signals into digital form, widely used in audio processing. If your project involves sound-related functions, you may need to use a PDM interface for testing.
[0014] TDM (Time Division Multiplexing): This technology allows multiple signals to share the same physical channel and be transmitted in turn according to time sequence. TDM may be used in certain specific applications, such as multi-channel audio systems.
[0015] like Figures 1 to 2As shown, in this embodiment, the MCU unit 1 is connected to an FT232 serial port chip 7, which is connected to an external host computer. The serial port at the back end of the FT232 serial port chip 7 is shorted to realize the program verification of USB to serial port self-transmission and self-reception.
[0016] like Figure 2 As shown, in this embodiment, the MCU unit 1 is connected to a power controllable circuit 8. The power controllable circuit 8 is a PP3V3 power supply circuit built with a low dropout linear regulator and a MOSFET, which supports software-controlled on / off switching. The BIT3 pin of the power controllable circuit 8 is connected to an I / O expansion.
[0017] like Figure 3 As shown, in this embodiment, the MCU unit 1 is connected to a level conversion chip 9, the level conversion chip 9 is connected to an SD card slot 10, and an SD card is inserted into the SD card slot 10. The system program upgrade circuit built by the SD card slot 10 and the level conversion chip 9 supports online one-click system upgrades. The Xavier_DAT2, Xavier_DAT3, Xavier_DAT0, Xavier_DAT1, Xavier_CMD, and Xavier_CL pins of the level conversion chip 9 are connected to the MCU unit 1.
[0018] like Figure 4 As shown, in this embodiment, the MCU unit 1 is connected to an LED controllable circuit 11. The LED controllable circuit 11 is an LED control circuit built with LEDs and MOS transistors to realize the on / off control of LEDs and the program verification of various changes of flowing lights.
[0019] like Figure 5 As shown, in this embodiment, the MCU unit 1 is connected to a memory chip 12 via I2C. The memory chip 12 enables I2C communication verification and calibration parameter writing and reading. I2C is a serial communication bus, mainly used for connecting low-speed peripheral devices over short distances. In testing, it can be used to communicate with components such as sensors to acquire data or send commands.
[0020] In this embodiment, the testing steps are as follows: 1. Power on the module; 2. Connect the network cable; 3. Ping the IP address to confirm if it can be pinged; 4. Programming; 5. Run the script on the host computer; 6. Power off after all functions are working correctly; 7. End.
[0021] Although the embodiments of the present invention are described with reference to actual solutions, they do not constitute a limitation on the meaning of the present invention. Modifications to the embodiments and combinations with other solutions based on this specification will be obvious to those skilled in the art.
Claims
1. A multi-functional testing module for program verification, characterized in that: It includes an MCU unit (1), which is connected to a digital-to-analog converter (2), a digital multimeter (3), a pulse signal output and frequency reading unit (4), a main control chip and flash memory unit (5), and a pulse width modulation and time division multiplexing unit (6). The output voltage of the digital-to-analog converter (2) is amplified by the operational amplifier circuit and switched by the MUX switch, and then connected to the analog-to-digital converter of the MCU unit (1) for voltage reading, thereby realizing the control program verification of the digital-to-analog converter (2); the digital multimeter (3) is used for program verification of multiple modules; the pulse signal output and frequency reading unit (4) outputs a PWM signal through the MCU unit (1), which is then connected to the MCU unit (1) for testing after passing through the operational amplifier follower circuit and comparator, thereby realizing the program verification function of pulse width modulation and frequency; the main control chip and flash memory unit (5) are used for online program burning; the pulse width modulation and time division multiplexing unit (6) is used to realize the program verification function of PDM and TDM functions.
2. The multifunctional testing module for program verification according to claim 1, characterized in that, The MCU unit (1) is connected to an FT232 serial port chip (7), which is connected to an external host computer. The serial port at the back end of the FT232 serial port chip (7) is shorted to realize the program verification of USB to serial port self-transmission and self-reception.
3. The multifunctional testing module for program verification according to claim 1, characterized in that, The MCU unit (1) is connected to a power controllable circuit (8), which is a PP3V3 power supply circuit built with a low dropout linear regulator and a MOS transistor, and supports software control of on / off switching.
4. The multifunctional testing module for program verification according to claim 1, characterized in that, The MCU unit (1) is connected to a level conversion chip (9), the level conversion chip (9) is connected to an SD card socket (10), the SD card socket (10) is fitted with an SD card, and the system program upgrade circuit built by the SD card socket (10) and the level conversion chip (9) supports online one-click system upgrade.
5. The multifunctional testing module for program verification according to claim 1, characterized in that, The MCU unit (1) is connected to an LED controllable circuit (11). The LED controllable circuit (11) is an LED control circuit built with LEDs and MOS transistors to realize the LED control on and off, and the program verification of various changes of the flowing light.
6. The multifunctional testing module for program verification according to claim 1, characterized in that, The MCU unit (1) is connected to a memory chip (12) via I2C. The memory chip (12) enables I2C communication verification and calibration parameter writing and reading.