Hardware-in-the-loop test method of battery management system controller and related equipment

By creating system variables and mapping them to a database in the hardware-in-the-loop test of the battery management system controller, the problem of low testing efficiency for different versions of the controller is solved, and efficient and accurate hardware-in-the-loop testing is achieved.

CN121008563APending Publication Date: 2025-11-25上海北汇信息科技有限公司
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Patent Information

Application Number
CN202511232909.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-29
Publication Date
2025-11-25

AI Technical Summary

Technical Problem

Because the database of the battery management system controller varies greatly between different versions, hardware-in-the-loop testing requires frequent modifications to the test program, which reduces testing efficiency and accuracy.

Method used

By creating system variables and mapping them to the databases of different controllers in the automated hardware-in-the-loop test program, the operation of the automated test program can be directly controlled, avoiding the need to modify the test project.

Benefits of technology

This improves the efficiency and accuracy of hardware-in-the-loop testing of the battery management system controller and reduces test case errors caused by parameter settings from different manufacturers.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a hardware-in-the-loop test method of a battery management system controller and related equipment, and relates to the field of energy storage, system variables of a battery management system are imported into test item editing software, and the system variables and databases of different controllers are mapped in an automatic hardware-in-the-loop test program, so that the system variables of the battery management system are subjected to hardware-in-the-loop test; and the automatic hardware-in-the-loop test program executes a test case corresponding to the automatic hardware-in-the-loop test program by controlling the system variables. Based on the above, through a system variable mapping mode, automatic hardware-in-the-loop test program operation is directly controlled, hardware HIL tests of controllers of different versions of the battery management system can be met without modifying a test project, the test efficiency of the HIL tests of the controllers of the battery management system is improved, and the situation that the HIL tests of the controllers of the battery management system are different due to different parameter settings of different manufacturers is avoided. The problem that the case is changed mistakenly during testing is solved, and the HIL testing accuracy of the BMS controller is improved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the field of energy storage, in particular to a hardware-in-the-loop test method for a battery management system controller and related equipment. BACKGROUND

[0002] The development of a battery management system (BMS) controller to mass production needs to go through multiple tests and verifications, but due to the reason of database changes, the test engineering also needs to be modified, thus wasting time on modifying the test engineering and test cases.

[0003] And each manufacturer has its own database file, and the name of this database may also be different in different versions of the BMS controller, so the host computer engineering used in the hardware-in-the-loop (HIL) test needs to be modified to meet the different versions of the BMS controller, thus resulting in low efficiency of the BMS controller HIL test.

[0004] Therefore, how to improve the efficiency of the BMS controller HIL test is a problem that needs to be solved by the present application. SUMMARY

[0005] Therefore, the present application discloses a hardware-in-the-loop test method for a battery management system controller and related equipment, aiming to improve the test efficiency and accuracy of the BMS controller HIL test.

[0006] In order to achieve the above-mentioned purpose, the disclosed technical solution is as follows:

[0007] The first aspect of the present application discloses a hardware-in-the-loop test method for a battery management system controller, comprising:

[0008] creating system variables of a battery management system;

[0009] importing the system variables into a test project editing software, and mapping the system variables with databases of different controllers in an automated hardware-in-the-loop test program;

[0010] making the automated hardware-in-the-loop test program execute test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

[0011] Preferably, the creating of the system variables of the battery management system comprises:

[0012] creating the system variables of the battery management system in a test control execution software, wherein the test control execution software runs in a host computer of a device manufacturer.

[0013] Preferably, the system variable is imported into the test item editing software, and the system variable is mapped with the database of different controllers in the automated hardware-in-the-loop test program, comprising:

[0014] The system variable is imported into the test item editing software, wherein the test item editing software runs in the host computer of the equipment manufacturer.

[0015] In the test item editing software, the variable is mapped with the database table involved in the database of different controllers in the automated hardware-in-the-loop test program; wherein the database table defined by different controllers for the battery management system is different.

[0016] Preferably, the automated hardware-in-the-loop test program is executed by controlling the system variable, comprising:

[0017] The corresponding database table is operated by the system variable to assign and read the parameters in the database table, wherein the database table matches the test case involved in the automated hardware-in-the-loop test program.

[0018] When the test item to be executed set in the configuration window of the automated hardware-in-the-loop test program is monitored, the automated hardware-in-the-loop test program is executed based on the parameters in the database table, and the test case corresponding to the automated hardware-in-the-loop test program is executed, and the correctness of the controller device detection is confirmed by the mapped system variable, to realize the hardware-in-the-loop test of the corresponding controller device.

[0019] Preferably, it further comprises:

[0020] After the mapping of the system variable and the database of different controllers in the automated hardware-in-the-loop test program is completed, the test data required for the hardware output test item test of the system is controlled by the automated hardware-in-the-loop test program running through the system variable; wherein the test data at least includes voltage and temperature.

[0021] Preferably, after the automated hardware-in-the-loop test program is executed by controlling the system variable, the method further comprises:

[0022] The test data after the execution of the test case is obtained.

[0023] The test data is analyzed to obtain the corresponding test report; wherein the test report at least includes the setting value of the system variable and the feedback value of the controller device.

[0024] The second aspect of this application discloses a hardware-in-the-loop testing device for a battery management system controller, comprising: a variable creation unit, a variable mapping unit, and a control execution unit;

[0025] The variable creation unit is used to create system variables for the battery management system;

[0026] The variable mapping unit is used to import the system variables into the test project editing software and map the system variables with the databases of different controllers in the automated hardware-in-the-loop test program.

[0027] The control execution unit is used to enable the automated hardware-in-the-loop test program to execute the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

[0028] Preferably, the variable creation unit includes: a variable creation subunit;

[0029] The variable creation subunit is used to create system variables for the battery management system in the test control execution software, wherein the test control execution software runs on the host computer of the equipment manufacturer.

[0030] The third aspect of this application discloses a computer-readable storage medium having a program stored thereon, which, when executed by a processor, implements a hardware-in-the-loop testing method for a battery management system controller as described in any one of the first aspects.

[0031] The fourth aspect of this application discloses an electronic device, the electronic device including at least one processor, at least one memory and a bus connected to the processor; wherein the processor and the memory communicate with each other through the bus; the processor is used to call program instructions in the memory to execute a hardware-in-the-loop test method for a battery management system controller as described in any one of the first aspects.

[0032] As can be seen from the above technical solution, this application discloses a hardware-in-the-loop testing method and related equipment for a battery management system controller. The method involves creating system variables for the battery management system, importing the system variables into test project editing software, and mapping the system variables to the databases of different controllers in an automated hardware-in-the-loop testing program. This allows the automated hardware-in-the-loop testing program to execute the corresponding test cases by controlling the system variables.

[0033] The beneficial effects of this application are as follows: By mapping system variables, the operation of automated hardware-in-the-loop test program can be directly controlled. Hardware HIL testing of different versions of BMS controllers can be met without modifying the test project. This not only improves the testing efficiency of BMS controller HIL testing, but also avoids the problem of incorrect test case changes due to different parameter settings from different manufacturers, thus improving the accuracy of BMS controller HIL testing.

[0034] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description

[0035] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0036] Figure 1 This is a schematic flowchart of a hardware-in-the-loop testing method for a battery management system controller disclosed in an embodiment of this application;

[0037] Figure 2 This is a schematic diagram of the structure of the BMS HIL testing system disclosed in the embodiments of this application;

[0038] Figure 3 This is a schematic diagram illustrating the process of mapping system variables to databases of different controllers in an automated HIL test program, as disclosed in an embodiment of this application.

[0039] Figure 4 This is a flowchart illustrating the test cases corresponding to the automated hardware-in-the-loop test program disclosed in the embodiments of this application;

[0040] Figure 5 This is a schematic diagram of the hardware-in-the-loop testing device for a battery management system controller disclosed in an embodiment of this application;

[0041] Figure 6 This is a schematic diagram of the structure of the electronic device disclosed in the embodiments of this application. Detailed Implementation

[0042] Exemplary embodiments of the invention will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0043] In this application, the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0044] As the background technology shows, each manufacturer has its own database files, and the name of this database may be different in different versions of the BMS controller. Therefore, the host computer project used for hardware HIL testing needs to be modified to meet the different versions of the BMS controller, resulting in low efficiency of BMS controller HIL testing.

[0045] To address the aforementioned issues, this application discloses a hardware-in-the-loop (HIL) testing method and related equipment for a battery management system (BMS) controller. By mapping system variables, the method directly controls the execution of an automated HIL testing program, enabling hardware HIL testing of different versions of the BMS controller without requiring modifications to the test project. This not only improves the testing efficiency of BMS controller HIL testing but also avoids errors in test case modification due to different parameter settings from different manufacturers, thereby increasing the accuracy of BMS controller HIL testing.

[0046] It should be noted that the hardware-in-the-loop testing method and related equipment for a battery management system controller provided in this application can be used in the fields of energy storage and other technologies. The above is only an example and does not limit the application field of the hardware-in-the-loop testing method and related equipment for a battery management system controller provided in this application.

[0047] refer to Figure 1 The image shows a hardware-in-the-loop testing method for a battery management system controller disclosed in this application. The hardware-in-the-loop testing method for the battery management system controller mainly includes the following steps:

[0048] S101: Creates system variables for the BMS system.

[0049] In S101, system variables for the BMS system are created in the test control execution software, which runs on the equipment manufacturer's host computer.

[0050] Among them, the BMS system is an intelligent system that integrates sensors, control algorithms, and actuators. It achieves safety protection, performance improvement, and life extension by monitoring, controlling, and optimizing the operating status of the battery pack in real time.

[0051] System variables in a BMS system include, but are not limited to, voltage monitoring variables, current measurement variables, and temperature detection variables.

[0052] The host computer contains test control execution software. This software is used to control all hardware in the BMS HIL test system via Controller Area Network (CAN), Ethernet, or other means, and to perform tests and record data.

[0053] A schematic diagram of the BMS HIL testing system is shown below. Figure 2 As shown. The BMS HIL test system includes a low-voltage power supply module, input / output (I / O) modules, a battery simulator, a high-voltage power supply, a current source, a device under test (DUT) placement box, and a communication module.

[0054] The low-voltage power supply module is used to provide power to the BMS system so that the BMS system can work properly.

[0055] The I / O module is used to provide the necessary I / O signals to the BMS system.

[0056] The battery simulator is used to provide the BMS system with signals such as cell voltage and temperature.

[0057] The high-voltage power supply is used to provide the total battery voltage signal to the BMS system.

[0058] The current source is used to provide the total battery voltage signal to the BMS system.

[0059] The test box is used to hold the BMS controller that needs to be tested.

[0060] The communication module provides the necessary CAN communication interface and Ethernet control interface to the BMS and peripheral devices such as power supplies and simulators.

[0061] The CAN communication interface includes CAN_1, CAN_2 and CAN_3 communication interfaces.

[0062] Both the CAN_1 and CAN_2 communication interfaces are used to monitor CAN messages on the BMS system.

[0063] The CAN_3 communication interface is used to control hardware that requires CAN control in the BMS HIL test system through a host computer software, including but not limited to low-voltage power supply modules, battery simulators, etc.

[0064] The Ethernet control interface includes the ETH_1 interface and the ETH_2 interface.

[0065] The ETH_1 interface is used to establish Ethernet communication with the BMS system.

[0066] The ETH_2 interface is used to control Ethernet-controlled hardware in the BMS HIL test system, such as I / O modules, high-voltage power supplies, and current sources, via a host computer control software. This allows for the control of all hardware resources in the BMS HIL test system through a single host computer, facilitating subsequent automation and improving testing efficiency.

[0067] S102: Import system variables into the test project editing software and map the system variables to the databases of different controllers in the automated HIL test program.

[0068] After mapping the system variables to the databases of different controllers in the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program controls the system variables to control the hardware output test data required for the test items; among which, the test data includes at least voltage and temperature.

[0069] In the test control execution software, variables are created for mapping with different controller databases. By mapping with different controller databases, objects can be manipulated directly without writing complex database statements, avoiding data inconsistency issues caused by manually operating different controller databases.

[0070] The process of writing automated HIL test programs for different controller databases is as follows:

[0071] The variables created in the test control execution software are imported into the test project editing software. Following the test items and procedures required in "GB_T 34131-2023 Battery Management System for Power Energy Storage", an automated test program is written using the test project editing software. This automated test program only needs to be written once and can be directly reused in other projects, thereby improving the development efficiency of the automated test program.

[0072] Specifically, this involves importing system variables into the test project editing software and mapping these system variables to the databases of different controllers in the automated HIL test program, such as...Figure 3 As shown, the main steps include the following:

[0073] S301: Import system variables into the test project editing software, which runs on the equipment manufacturer's host computer.

[0074] The host computer also includes test project editing software. This software is designed to write each step as a script, based on the program control flow, outlining its function and steps.

[0075] S302: In the test project editing software, the variables are mapped to the database tables involved in the databases of different controllers in the automated hardware-in-the-loop test program; wherein, the database tables defined for the battery management system are different for different controllers.

[0076] The beneficial effects of this embodiment are as follows: By importing system variables into the test project editing software and mapping the system variables with the databases of different controllers in the automated hardware-in-the-loop test program, objects can be directly manipulated without writing complex database statements, avoiding data inconsistency problems caused by manually operating the databases of different controllers, reducing the amount of code and reducing code error efficiency, thereby improving development efficiency, accuracy and ensuring data consistency.

[0077] S103: Enables the automated hardware-in-the-loop test program to execute the corresponding test cases by controlling system variables.

[0078] In S103, the automated test program written in the test project editing software is imported into the test control execution software. The test projects to be executed are set in the configuration window of the test control execution software, and then the hardware-in-the-loop test is started.

[0079] Specifically, this involves the automated hardware variable control-in-the-loop test program executing the corresponding test cases by controlling system variables, such as... Figure 4 As shown. The main steps include the following:

[0080] S401: Operate on the corresponding database table through system variables to assign values ​​and read parameters in the database table, wherein the database table matches the test cases involved in the automated hardware-in-the-loop test program.

[0081] The test cases for different test items are the coded representations of the manual operation steps for these test items in a specific sequence. Using the test case library, before hardware-in-the-loop testing, operators only need to complete the matching with the manufacturer's parameters and signals, click the "Start Run Test Case" switch, and wait for the test cases to complete. No further operation is required during test case execution, reducing operator workload and improving testing efficiency.

[0082] S402: When a test item to be executed is detected in the configuration window of the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program runs the corresponding test cases based on the parameters in the database table, and confirms whether the controller device detection is correct through the mapped system variables, so as to realize the hardware-in-the-loop test of the corresponding controller device.

[0083] It should be noted that all test cases in the test case library are written using variables. The test cases do not involve specific signals. All assignments of manufacturer thresholds and manufacturer signals are done in the host computer software. This avoids the problem of modifying test cases incorrectly when changing parameters from different manufacturers, and improves the accuracy of hardware-in-the-loop testing.

[0084] The correctness of the controller device detection is confirmed by using the mapped system variables. Specifically, the correctness of the controller device detection is confirmed by checking whether the set value of the system variable matches the feedback value of the controller device. If the set value of the system variable matches the feedback value of the controller device, the controller device detection is confirmed to be correct. If the set value of the system variable does not match the feedback value of the controller device, the controller device detection is confirmed to be incorrect.

[0085] During hardware-in-the-loop testing, test data can be displayed in real time.

[0086] Obtain test data after test case execution, analyze the test data, and generate a corresponding test report with one click after the test is completed; the test report shall include at least the set values ​​of system variables and the feedback values ​​of controller devices.

[0087] The beneficial effects of this embodiment are as follows: Before hardware-in-the-loop testing, operators only need to complete the matching with the manufacturer's parameters and signals, click the "Start Test Case" switch, and wait for the test cases to complete. No operation is required during the execution of the test cases, reducing the operator's workload and improving testing efficiency. Furthermore, all test cases in the test case library are written using variables; the test cases do not involve specific signals. All assignments related to manufacturer thresholds and signals are done in the host computer software, avoiding the problem of incorrect test case modifications when changing parameters from different manufacturers, thus improving the accuracy of hardware-in-the-loop testing.

[0088] This application addresses the issue of spending considerable time modifying test programs for the same test items in the "GB_T 34131-2023 Battery Management System for Electric Energy Storage" standard across different energy storage BMS systems, and helps testers complete closed-loop testing effectively and quickly.

[0089] The beneficial effects of the method embodiments of this application are as follows: By mapping system variables, the operation of the automated hardware-in-the-loop test program can be directly controlled. The test project can meet the hardware HIL test of different versions of BMS controllers without modification. This not only improves the test efficiency of BMS controller HIL test, but also avoids the problem of incorrect test case changes due to different parameter settings of different manufacturers, thus improving the accuracy of BMS controller HIL test.

[0090] Based on the above embodiments Figure 1 This application discloses a hardware-in-the-loop testing method for a battery management system controller, and also provides a corresponding hardware-in-the-loop testing apparatus for the same controller. Figure 5 As shown, the hardware-in-the-loop test device for the battery management system controller includes a variable creation unit 501, a variable mapping unit 502, and a control execution unit 503.

[0091] Variable creation unit 501 is used to create system variables for the battery management system;

[0092] The variable mapping unit 502 is used to import system variables into the test project editing software and map the system variables with the databases of different controllers in the automated hardware-in-the-loop test program.

[0093] The control execution unit 503 is used to enable the automated hardware-in-the-loop test program to execute the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

[0094] Furthermore, the variable creation unit 501 includes a variable creation subunit;

[0095] The variable creation subunit is used to create system variables for the battery management system in the test control execution software, which runs on the equipment manufacturer's host computer.

[0096] Furthermore, the variable mapping unit 502 includes a variable import subunit and a variable mapping subunit;

[0097] The variable import subunit is used to import system variables into the test project editing software, which runs on the equipment manufacturer's host computer.

[0098] The variable mapping subunit is used to map variables to database tables involved in the databases of different controllers in the automated hardware-in-the-loop test program within the test project editing software; wherein, different controllers define different database tables for the battery management system.

[0099] Furthermore, the control execution unit 503 includes:

[0100] The operation subunit is used to operate on the corresponding database table through system variables, so as to assign values ​​and read parameters in the database table. The database table is matched with the test cases involved in the automated hardware-in-the-loop test program.

[0101] The test run subunit is used to run the corresponding test cases of the automated hardware-in-the-loop test program based on the parameters in the database table when a test item to be executed is detected in the configuration window of the automated hardware-in-the-loop test program. The system variables are then mapped to confirm whether the controller device detection is correct, thereby realizing the hardware-in-the-loop test of the corresponding controller device.

[0102] Furthermore, the controller hardware-in-the-loop testing apparatus also includes:

[0103] The control unit is used to map system variables to the databases of different controllers in the automated hardware-in-the-loop test program, and then, after the automated hardware-in-the-loop test program runs, control the system variables to control the hardware output test data required for the test items; wherein, the test data includes at least voltage and temperature.

[0104] Furthermore, the controller hardware-in-the-loop testing apparatus also includes:

[0105] The acquisition unit is used to acquire test data after the test cases are executed.

[0106] The analysis unit is used to analyze the test data and obtain the corresponding test report; the test report includes at least the set values ​​of system variables and the feedback values ​​of the controller device.

[0107] The beneficial effects of the device embodiments of this application are as follows: By mapping system variables, the operation of the automated hardware-in-the-loop test program can be directly controlled. The test project can meet the hardware HIL test of different versions of BMS controllers without modification. This not only improves the test efficiency of BMS controller HIL test, but also avoids the problem of incorrect test case changes due to different parameter settings of different manufacturers, thus improving the accuracy of BMS controller HIL test.

[0108] This application provides a computer-readable storage medium storing a program that, when executed by a processor, implements a hardware-in-the-loop testing method for the battery management system.

[0109] This application provides a processor for running a program, wherein the program executes a hardware-in-the-loop testing method for the battery management system. The processor includes a kernel that retrieves corresponding program units from memory. One or more kernels can be configured, and by adjusting kernel parameters through variable mapping, the execution of the automated hardware-in-the-loop testing program can be directly controlled without modifying the test project. This not only improves testing efficiency but also avoids errors caused by different parameter settings from different manufacturers when modifying test cases.

[0110] This application provides an electronic device 60, such as... Figure 6 As shown, the electronic device 60 includes at least one processor 601, at least one memory 602 connected to the processor 601, and a bus 603; wherein the processor 601 and the memory 602 communicate with each other through the bus 603; the processor 601 is used to call program instructions in the memory 602 to execute the hardware-in-the-loop test method of the battery management system controller described above. The electronic device in this article may be a server, PC, PAD, mobile phone, etc.

[0111] This application also provides a computer program product, which, when executed on an electronic device, is suitable for executing a program that initializes the following method steps:

[0112] A hardware-in-the-loop testing method for a battery management system includes:

[0113] Create system variables for the battery management system;

[0114] The system variables are imported into the test project editing software, and the system variables are mapped to the databases of different controllers in the automated hardware-in-the-loop test program;

[0115] The automated hardware-in-the-loop test program executes the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

[0116] Optionally, the system variables for creating the battery management system include:

[0117] System variables for the battery management system are created in the test control execution software, which runs on the equipment manufacturer's host computer.

[0118] Optionally, importing the system variables into the test project editing software and mapping the system variables to the databases of different controllers in the automated hardware-in-the-loop test program includes:

[0119] The system variables are imported into the test project editing software, which runs on the host computer of the equipment manufacturer.

[0120] In the test project editing software, the variables are mapped to the database tables involved in the databases of different controllers in the automated hardware-in-the-loop test program; wherein, different controllers define different database tables for the battery management system.

[0121] Optionally, the step of enabling the automated hardware-in-the-loop test program to execute the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables includes:

[0122] The system variables are used to operate on the corresponding database tables to assign and read parameters in the database tables, wherein the database tables are matched with the test cases involved in the automated hardware-in-the-loop test program.

[0123] When a test item to be executed is detected in the configuration window of the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program runs the corresponding test cases based on the parameters in the database table, and confirms whether the controller device detection is correct through the mapped system variables, so as to realize the hardware-in-the-loop test of the corresponding controller device.

[0124] Optional, also includes:

[0125] After mapping the system variables to the databases of different controllers in the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program controls the system variables to control the hardware output test data required for the test items; wherein, the test data includes at least voltage and temperature.

[0126] Optionally, after the automated hardware-in-the-loop test program executes the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables, the method further includes:

[0127] Obtain the test data after the test cases are executed;

[0128] The test data is analyzed to obtain a corresponding test report; wherein the test report includes at least the set values ​​of system variables and the feedback values ​​of the controller device.

[0129] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus, electronic devices (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable device, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0130] In a typical configuration, an electronic device includes one or more processors (CPUs), memory, and a bus. The electronic device may also include input / output interfaces, network interfaces, etc.

[0131] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, like read-only memory (ROM) or flash RAM, and memory includes at least one memory chip. Memory is an example of computer-readable media.

[0132] Computer-readable media include both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0133] In the description of this application, it should be understood that if the terms "upper", "lower", "front", "back", "left" and "right" are used to indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the position or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0134] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0135] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0136] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A hardware-in-the-loop testing method for a battery management system controller, characterized in that, include: Create system variables for the battery management system; The system variables are imported into the test project editing software, and the system variables are mapped to the databases of different controllers in the automated hardware-in-the-loop test program; The automated hardware-in-the-loop test program executes the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

2. The method according to claim 1, characterized in that, The system variables for creating the battery management system include: System variables for the battery management system are created in the test control execution software, which runs on the equipment manufacturer's host computer.

3. The method according to claim 1, characterized in that, The step of importing the system variables into the test project editing software and mapping the system variables to the databases of different controllers in the automated hardware-in-the-loop test program includes: The system variables are imported into the test project editing software, which runs on the host computer of the equipment manufacturer. In the test project editing software, the variables are mapped to the database tables involved in the databases of different controllers in the automated hardware-in-the-loop test program; wherein, different controllers define different database tables for the battery management system.

4. The method according to claim 3, characterized in that, The step of enabling the automated hardware-in-the-loop test program to execute the corresponding test cases by controlling the system variables includes: The system variables are used to operate on the corresponding database tables to assign and read parameters in the database tables, wherein the database tables are matched with the test cases involved in the automated hardware-in-the-loop test program. When a test item to be executed is detected in the configuration window of the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program runs the corresponding test cases based on the parameters in the database table, and confirms whether the controller device detection is correct through the mapped system variables, so as to realize the hardware-in-the-loop test of the corresponding controller device.

5. The method according to claim 1, characterized in that, Also includes: After mapping the system variables to the databases of different controllers in the automated hardware-in-the-loop test program, the automated hardware-in-the-loop test program controls the system variables to control the hardware output test data required for the test items; wherein, the test data includes at least voltage and temperature.

6. The method according to claim 1, characterized in that, After the automated hardware-in-the-loop test program executes the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables, the method further includes: Obtain the test data after the test cases are executed; The test data is analyzed to obtain a corresponding test report; wherein the test report includes at least the set values ​​of system variables and the feedback values ​​of the controller device.

7. A hardware-in-the-loop testing device for a battery management system controller, characterized in that, include: Variable creation unit, variable mapping unit, and control execution unit; The variable creation unit is used to create system variables for the battery management system; The variable mapping unit is used to import the system variables into the test project editing software and map the system variables with the databases of different controllers in the automated hardware-in-the-loop test program. The control execution unit is used to enable the automated hardware-in-the-loop test program to execute the test cases corresponding to the automated hardware-in-the-loop test program by controlling the system variables.

8. The apparatus according to claim 7, characterized in that, The variable creation unit includes: a variable creation subunit; The variable creation subunit is used to create system variables for the battery management system in the test control execution software, wherein the test control execution software runs on the host computer of the equipment manufacturer.

9. A computer-readable storage medium having a program stored thereon, characterized in that, When the program is executed by the processor, it implements the hardware-in-the-loop testing method for the battery management system controller as described in any one of claims 1 to 6.

10. An electronic device, characterized in that, The electronic device includes at least one processor, at least one memory connected to the processor, and a bus; wherein the processor and the memory communicate with each other through the bus; the processor is used to call program instructions in the memory to execute the hardware-in-the-loop test method of the battery management system controller as described in any one of claims 1 to 6.