Measuring equipment, automatic replacing system and contact type measuring component thereof

Abstract

The invention discloses a measuring device, an automatic replacement system and a contact type measuring component thereof, the contact type measuring component comprises an installation assembly and a detection assembly, the detection assembly comprises a probe, a first trigger piece and a second trigger piece, and the second trigger piece is matched with the first trigger piece to form an electronic switch. The detection assembly is configured to output a path signal when the first trigger piece is in contact with the second trigger piece, and output a trigger signal used for representing that the probe is in contact with the surface of the object to be detected when the first trigger piece is not in contact with the second trigger piece; the mounting assembly comprises a magnetic control part which is connected with the electronic switch in parallel and has a switching effect, the mounting assembly is configured to output a path signal when the magnetic control part is switched on in response to the change of the magnetic field, and the detection assembly is configured to be detachable from the mounting assembly when the magnetic control part is switched on. Under the condition, the problem of replacement failure of the measuring part caused by structural limitation of a self-triggering part can be solved through a hardware control mode, so that the intelligent degree of the measuring equipment can be improved.

Description

[0001] This application is a divisional application of the patent application filed on March 27, 2023, with application number 2023103585745, entitled "Measuring Component and Automatic Replacement System Thereof". Technical Field

[0002] This disclosure generally relates to the field of intelligent measuring equipment, and specifically to a measuring device, an automatic replacement system, and its contact measuring components. Background Technology

[0003] In industrial production, to manufacture products that meet design requirements, various parameters such as the size, shape, and position of each component or product (object under test) need to be measured by measuring equipment. With technological advancements, measuring equipment has become increasingly intelligent, capable not only of accurately obtaining multiple parameters such as the size, shape, and position of the object under test, but also of adjusting itself to adapt to product requirements. For example, a coordinate measuring machine (CMM) can measure the size and shape of the object under test by adjusting its probe, and its measuring components (such as the measuring probe) can be replaced depending on the object being measured.

[0004] In contact-type (i.e., measurement methods triggered by electronic switches) measuring devices, such as coordinate measuring machines (CMMs), the measuring probe is moved from the origin to the surface of the object being measured. A trigger signal is sent when the probe contacts the surface, allowing the measuring device to obtain the probe's coordinates relative to the origin. By repeating this process multiple times on the object's surface, multiple coordinate values ​​are obtained, from which the object's dimensions are calculated or its shape is modeled. Therefore, contact-type measuring probes mostly use normally closed electronic switches as triggering components. Currently, more intelligent measuring devices typically incorporate automatic probe replacement devices or systems to improve probe installation accuracy and maintain original measurement precision. However, because the working mechanism of the measuring probe is similar to a normally closed electronic switch, disconnection of the probe from its mounting point during replacement can be mistakenly interpreted by the measuring system as probe detection, potentially leading to measurement errors or system crashes. In existing technologies, software control is typically used, which involves adding optimization algorithms to the measurement system and automatic replacement system to solve this problem. For example, patent application CN109313019A discloses a CMM (coordinate measuring machine) device for identifying and verifying probes. When changing the measuring probe, certain instructions or criteria are executed (e.g., the measuring probe is powered off or is considered to be in a power-off state) to ensure that the verification of the installation of the appropriate measuring probe is built into the automated part of the CMM measurement process, thereby ensuring that the verification step is performed and the result is correct.

[0005] However, software control methods have a lower fault tolerance rate compared to hardware control methods. In, for example, in a coordinate measuring machine, the measurement system and the automatic replacement system often interfere with each other, which may lead to an increase in system errors, resulting in the failure of measurement probe replacement and affecting subsequent measurement equipment. Summary of the Invention

[0006] This disclosure was made in view of the above-mentioned state of the prior art, and its purpose is to provide a measuring component and its automatic replacement system, which can solve the problem of replacement failure caused by the structural limitations of the measuring component's own triggering component through hardware control, thereby improving the intelligence level of the measuring equipment.

[0007] Therefore, the first aspect of this disclosure first describes a measuring component based on an electronic switch-triggered measurement method, comprising a mounting assembly and a detection component detachably mounted on the mounting assembly and used to contact the surface of an object under test while outputting a trigger signal. The detection component includes a probe for contacting the surface of the object under test, a first trigger connected to the probe, and a second trigger cooperating with the first trigger to form the electronic switch. The detection component is configured to output a path signal when the first trigger and the second trigger are in contact, and to output the trigger signal when the probe contacts the surface of the object under test and the first trigger and the second trigger are not in contact. The mounting assembly includes a magnetic control connected in parallel with the electronic switch and having a switching function. The mounting assembly is configured to turn on the magnetic control and output the path signal when the magnetic control responds to a change in magnetic field.

[0008] In the first aspect of this disclosure, the detection component is detachably mounted on the mounting component, facilitating the replacement of the detection component by the measuring component according to different objects to be measured. The detection component forms an electronic switch through the cooperation of a first trigger and a second trigger, with the first trigger connected to a probe. When the probe is not in contact with the surface of the object to be measured, the first and second triggers are in contact with each other, i.e., the electronic switch is in a closed state, and the detection component can output a path signal. When the probe contacts the surface of the object to be measured, the first and second triggers are out of contact, i.e., the electronic switch is opened through the probe connected to the first trigger, and the detection component can output a trigger signal. This allows the measuring device to use the detection component to detect and obtain information such as the size, shape, or position of the object to be measured using a contact measurement method. The magnetic control in the mounting component has a switching function and is connected in parallel with the electronic switch circuit in the detection component. In response to changes in the magnetic field, the mounting component can replace the electronic switch to output a path signal. This allows the measuring system to consider the detection component to be in a non-triggered measurement state when the detection component is replaced, thereby reducing the error rate of the measuring system. In other words, the problem of inaccurate replacement of the measuring component due to the structural limitations of its own trigger component can be solved by hardware control, thereby improving the accuracy of the device.

[0009] Additionally, according to the measuring component involved in this disclosure, optionally, the second trigger includes a first trigger portion and a second trigger portion, and the detection component is further configured to output the path signal when the first trigger portion contacts the first trigger and the second trigger portion contacts the first trigger, and to output the trigger signal when the first trigger portion disconnects from the first trigger or the second trigger portion disconnects from the first trigger. In this case, the first trigger and the second trigger portion can cooperate with the first trigger to form an electronic switch, which can be turned on by the first trigger connected to the probe when the probe contacts the surface of the object to be measured, i.e., the first trigger portion disconnects from the first trigger or the second trigger disconnects from the first trigger, thereby enabling the detection component to output a trigger signal so that the measuring component can complete the measurement; in addition, by using the first trigger and the second trigger portion to cooperate with the first trigger to form an electronic switch, the inconvenience of setting wires on the first trigger can also be reduced.

[0010] Additionally, according to the measuring component disclosed herein, optionally, the magnetic control unit includes a first switch portion and a second switch portion. The mounting assembly is further configured such that when the first switch portion is near a preset magnetic field, it contacts the second switch portion and outputs the path signal, and when the first switch portion is away from the preset magnetic field, it does not contact the second switch portion. In this case, through the first switch portion and the second switch portion, the magnetic control unit can function as a switch. Furthermore, by being connected in parallel with the electronic switch circuit formed by the first trigger and the second trigger, it can replace the electronic switch when the detection component of the measuring component is replaced and output the path signal under the action of the magnetic field. That is, when the detection component is replaced, the magnetic field control circuit path can be used to make the measuring system believe that the detection component is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0011] Furthermore, according to the measuring component disclosed herein, optionally, a plurality of the first trigger elements and a plurality of the second trigger elements cooperate to form a plurality of electronic switches, and the plurality of electronic switches are connected in series or in parallel. In this case, triggering by a plurality of electronic switches can improve the sensitivity of the detection component of the measuring component in contacting the surface of the object under test during detection, thereby improving the measurement accuracy.

[0012] Additionally, according to the measuring component disclosed herein, optionally, the resistance value of the magnetic control is equal to the equivalent resistance value of the multiple electronic switches connected in series or parallel. In this case, the multiple electronic switches are connected in series or parallel and then in parallel with the magnetic control circuit, and the resistance value of the magnetic control is equal to the equivalent resistance value of the multiple electronic switches connected in series or parallel. When the detection component of the measuring component is replaced, the path signal output by the magnetic control under the action of the magnetic field is the same as the path signal after the multiple electronic switches are connected in series or parallel, improving the consistency of the output path signal. This allows multiple electronic switches to be replaced, and when the detection component is replaced, the magnetic field control circuit path makes the measuring system believe that the detection component is not in a triggered measurement state, thereby reducing the error rate of the measuring system.

[0013] Additionally, according to the measuring components disclosed herein, optionally, the detection component and the mounting component can be installed and removed by at least one of the following methods: threaded connection, magnetic attraction, or snap-fit. In this case, the detection component can be easily detachably installed on the mounting component, and the installation accuracy can be improved by adjusting the thread accuracy, magnetic attraction accuracy, or snap-fit ​​accuracy, thereby improving the measurement accuracy of the measuring component.

[0014] A second aspect of this disclosure describes an automatic replacement system for a measuring component, comprising: a measuring component based on an electronic switch-triggered measurement method, a driving device for moving the measuring component, and a placement device forming a preset magnetic field. The measuring component includes a mounting assembly and a detection assembly detachably mounted on the mounting assembly and used to contact the surface of a test object while outputting a trigger signal. The detection assembly includes a probe for contacting the surface of the test object, a first trigger connected to the probe, and a second trigger cooperating with the first trigger to form the electronic switch. The detection assembly is configured to output a path signal when the first trigger and the second trigger are in contact, and to output the trigger signal when the probe contacts the surface of the test object and the first trigger and the second trigger are not in contact. The mounting assembly includes a magnetic control connected in parallel with the electronic switch and having a switching function. The mounting assembly is configured to turn on the magnetic control and output the path signal when the magnetic control responds to the preset magnetic field. The driving device is configured to drive the measuring component to move to the placement device and be located in the preset magnetic field. The placement device is configured to place and replace the detection component.

[0015] In a second aspect of this disclosure, a measuring component is moved to a placement device with a preset magnetic field by a driving device. Within the placement device, a detection component detachably mounted to a mounting assembly can be replaced. The detection component forms an electronic switch through a first trigger and a second trigger. The first trigger is connected to a probe. When the probe is not in contact with the surface of the object under test, the first and second triggers are in contact, i.e., the electronic switch is closed, and the detection component outputs a pass signal. When the probe contacts the surface of the object under test, the first and second triggers disconnect, i.e., the electronic switch is opened by the probe connected to the first trigger, and the detection component outputs a trigger signal. This allows measuring equipment to easily obtain information such as the size, shape, or position of the object being measured by using contact measurement through the detection component. The magnetic control in the mounting component acts as a switch and is connected in parallel with the electronic switch circuit in the detection component. When responding to the preset magnetic field of the placement device, the mounting component can replace the electronic switch to output a path signal. This allows the measuring system to recognize that the detection component is not in a triggered measurement state when the detection component is replaced, i.e., moved to the placement device. This reduces the error rate of the measuring system's identification, and solves the problem of inaccurate replacement of measuring components due to the structural limitations of their own triggering components through hardware control, thereby improving the accuracy of the equipment.

[0016] Furthermore, according to the automatic replacement system disclosed herein, optionally, the magnetic control unit includes a first switch portion and a second switch portion. The mounting assembly is further configured such that when it approaches a preset magnetic field, the first switch portion contacts the second switch portion and outputs the path signal, and when it moves away from the preset magnetic field, the first switch portion does not contact the second switch portion. In this case, through the first switch portion and the second switch portion, the magnetic control unit can function as a switch. Furthermore, by being connected in parallel with the electronic switch circuit formed by the first trigger and the second trigger, it can replace the electronic switch when replacing the detection component of the measuring component and output a path signal under the action of the magnetic field. That is, when the detection component is replaced, the magnetic field control circuit path can be used to make the measuring system believe that the detection component is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0017] Furthermore, according to the automatic replacement system disclosed herein, optionally, a plurality of the first trigger elements and a plurality of the second trigger elements cooperate to form a plurality of electronic switches, and the plurality of electronic switches are connected in series or in parallel. In this case, triggering by a plurality of electronic switches can improve the sensitivity of the detection component of the measuring element in contacting the surface of the object under test during detection, thereby improving measurement accuracy.

[0018] Furthermore, according to the automatic replacement system disclosed herein, optionally, the resistance value of the magnetic control is equal to the equivalent resistance value of multiple electronic switches connected in series or parallel. In this case, multiple electronic switches are connected in series or parallel and then in parallel with the magnetic control circuit, and the resistance value of the magnetic control is equal to the equivalent resistance value of multiple electronic switches connected in series or parallel. When replacing the detection component of the measuring element, the path signal output by the magnetic control under the action of the magnetic field is the same as the path signal of multiple electronic switches connected in series or parallel, improving the consistency of the output path signal. This can replace multiple electronic switches, and when the detection component is replaced, the magnetic field controls the circuit path to make the measuring system believe that the detection component is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0019] According to this disclosure, a measuring component and its automatic replacement system can be provided, which can solve the problem of replacement failure caused by the structural limitations of the measuring component's own triggering component through hardware control, thereby improving the intelligence level of the measuring equipment. Attached Figure Description

[0020] This disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings, in which:

[0021] Figure 1 This is a schematic diagram illustrating the structure of the measuring component involved in the example of this disclosure.

[0022] Figure 2This is a schematic diagram illustrating the detachable installation of the probe assembly and mounting assembly in the measuring component involved in the example of this disclosure.

[0023] Figure 3 This is a simplified schematic diagram of the detection component involved in the example of this disclosure.

[0024] Figure 4 This disclosure demonstrates Figure 1 or Figure 2 A top view of the internal structure of the probe component involved in the example.

[0025] Figure 5 This is a schematic diagram illustrating the working principle of the electronic switch involved in the example of this disclosure.

[0026] Figure 6 This disclosure demonstrates Figure 5 A schematic diagram of the first open state of the electronic switch involved in the example.

[0027] Figure 7 This disclosure demonstrates Figure 5 A schematic diagram of the second opening state of the electronic switch involved in the example.

[0028] Figure 8 This disclosure demonstrates Figure 5 A schematic diagram of the third opening state of the electronic switch involved in the example.

[0029] Figure 9 This is a schematic diagram illustrating the structure of the installation components involved in the example of this disclosure.

[0030] Figure 10 This is a schematic diagram illustrating the structure and working principle of the magnetic control in the installation component involved in this disclosure example.

[0031] Figure 11 This is a schematic diagram illustrating the working state of the magnetic control in the installation component involved in the example of this disclosure under the action of a preset magnetic field.

[0032] Figure 12 This is a circuit diagram showing the electronic switch in the detection component and the magnetic control circuit in the mounting component connected in parallel, as described in the example of this disclosure.

[0033] Figure 13 This is a structural block diagram illustrating the automatic replacement system for the measuring components involved in this disclosure.

[0034] Explanation of reference numerals in the attached figures:

[0035] 1…Automatic replacement system, 11…Measuring component, 12…Driver, 13…Placement device, 20…Electronic switch, 30…Magnetic control, 111…Mounting assembly, 112…Detection assembly, 1121…First trigger, 1122…Second trigger, 1122a…First trigger section, 1122b…Second trigger section, 1123…Probe, 301…First switch section, 302…Second switch section, A…Split point, B…Preset magnetic field. Detailed Implementation

[0036] The technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments filled in by those of ordinary skill in the art without creative effort are within the scope of protection of this disclosure.

[0037] It should be noted that the terms "first," "second," "third," and "fourth," etc., in the specification, claims, and accompanying drawings of this disclosure are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses. In the following description, the same reference numerals are used for the same components, and repeated descriptions are omitted. Additionally, the accompanying drawings are merely schematic diagrams, and the scale of the dimensions of the components or the shape of the components may differ from the actual figures.

[0038] This disclosure describes a measuring component and its automatic replacement system. The measuring component involved in this disclosure can be a mechanism used for measurement in a measuring device, such as a probe module or probe head module. In some examples, the measuring device can be a coordinate measuring machine (CMM), and the measuring component can be a probe module or probe head module of the CMM. Specifically, in some examples, the measuring component can be a measuring component based on an electronic switch-triggered measurement method. In some examples, the electronic switch-triggered measurement method can refer to a measurement method in which a contact trigger signal is sent when a specific component or mechanism contacts the surface of the object to be measured, and the coordinates of the specific component or mechanism relative to the origin are obtained based on the trigger signal, and then the size, shape, and other parameters of the object to be measured are calculated.

[0039] As mentioned in the background section, because the working mechanism of the measuring probe (i.e., the measuring component) is similar to a normally closed electronic switch, when the measuring probe is replaced, the disconnection between the measuring probe and its mounting point can be mistakenly interpreted by the measurement system as the probe still probing, potentially leading to measurement errors or system crashes. Existing technologies typically employ software control, adding optimization algorithms to the measurement system and automatic replacement system to address this issue. However, software control has a lower fault tolerance compared to hardware control. In systems such as coordinate measuring machines (CMMs), the measurement system and automatic replacement system frequently interfere with each other, potentially increasing system errors, leading to inaccurate measuring probe replacement, and affecting the measurement accuracy of subsequent measuring equipment.

[0040] Therefore, this disclosure provides the following two aspects: specifically, this disclosure provides a measuring component and its automatic replacement system, which can solve the problem of replacement failure caused by the structural limitations of the measuring component's own triggering mechanism through hardware control, thereby improving the intelligence level of the measuring equipment. In some examples, the measuring component and its automatic replacement system involved in this disclosure may also be referred to as a "contact measuring component and its automatic replacement system," a "contact probe and its replacement system," a "probe based on electronic switch triggering measurement and its replacement system," or a "contact probe of a coordinate measuring machine and its automatic replacement system," etc.

[0041] The first aspect of this disclosure will now be described in detail with reference to the accompanying drawings. Figure 1 This is a schematic diagram showing the structure of the measuring component 11 involved in the example of this disclosure. Figure 2 This is a schematic diagram showing the detachable installation of the probe assembly 112 and the mounting assembly 111 in the measuring component 11 involved in the example of this disclosure.

[0042] The first aspect of this disclosure describes a measuring component 11, such as... Figure 1 As shown, the measuring component 11 may include a mounting assembly 111 and a probe assembly 112. In some examples, the probe assembly 112 may be used to contact the surface of the object to be measured while outputting a trigger signal, and the mounting assembly 111 may be used to mount the probe assembly 112 and enable the probe assembly 112 to be electrically connected to the host of the measuring device. In this case, the measuring component 11 can be formed by the probe assembly 112 and the mounting assembly 111 to perform contact measurement on the object to be measured.

[0043] In some examples, the trigger signal may refer to a detection signal in which there is no current or voltage outside a preset range when the detection device detects the detection component 112. Additionally, the pathway signal involved in this disclosure may refer to a detection signal in which there is a predetermined current or voltage when the detection device detects the detection component 112 or the mounting component 111.

[0044] In some examples, such as Figure 2 As shown, the detection component 112 can be detachably mounted to the mounting component 111. In this case, the detachable mounting of the detection component 112 to the mounting component 111 facilitates the replacement of the detection component 112 by the measuring component 11 according to different objects to be measured.

[0045] Figure 3 This is a simplified structural diagram of the detection component 112 involved in the example of this disclosure. Figure 4 This disclosure demonstrates Figure 1 or Figure 2 A top view of the internal structure of the probe component 112 involved in the example. Figure 5 This is a schematic diagram illustrating the working principle of the electronic switch 20 involved in the example of this disclosure. Figure 6 This disclosure demonstrates Figure 5 A schematic diagram of the first open state of the electronic switch 20 involved in the example. Figure 7 This disclosure demonstrates Figure 5 A schematic diagram of the second open state of the electronic switch 20 involved in the example. Figure 8 This disclosure demonstrates Figure 5 A schematic diagram illustrating the third opening state of the electronic switch 20 involved in the example. Wherein, Figure 4 Identical parts are identified by only one set of markings, which means that there can be multiple identical parts, such as 2, 3, 4 or more.

[0046] In some examples, such as Figure 3 As shown, the detection component 112 may include a probe 1123, a first trigger 1121, and a second trigger 1122. In some examples, the probe 1123 may be used to contact the surface of the object to be tested, the first trigger 1121 may be connected to the probe 1123, and the second trigger 1122 may cooperate with the first trigger 1121 to form an electronic switch 20.

[0047] In this disclosure, the detection component 112 can be configured to output a path signal when the first trigger 1121 contacts the second trigger 1122, and output a trigger signal when the probe 1123 contacts the surface of the object to be tested, without contact between the first trigger 1121 and the second trigger 1122. In this configuration, the detection component 112 forms an electronic switch 20 through the cooperation of the first trigger 1121 and the second trigger 1122. The first trigger 1121 is connected to the probe 1123. When the probe 1123 is not in contact with the surface of the object to be measured, the first trigger 1121 and the second trigger 1122 are in contact with each other, i.e., the electronic switch 20 is in a closed state, and the detection component 112 can output a path signal. When the probe 1123 contacts the surface of the object to be measured, the first trigger 1121 and the second trigger 1122 are out of contact, i.e., the electronic switch 20 is opened through the probe 1123 connected to the first trigger 1121, and the detection component 112 can output a trigger signal. This allows the measuring device to use the detection component 112 to detect the object to be measured using a contact measurement method to obtain information such as the size, shape, or position of the object.

[0048] In some examples, such as Figure 4 As shown, the second trigger 1122 may include a first trigger part 1122a and a second trigger part 1122b.

[0049] In some examples, the detection component 112 may also be configured to output a path signal when the first trigger 1122a contacts the first trigger 1121 and the second trigger 1122b contacts the first trigger 1121 (see [link]). Figure 5 When the first triggering part 1122a disconnects from the first triggering member 1121 or the second triggering part 1122b disconnects from the first triggering member 1121, a trigger signal is output (see [link]). Figure 6 , Figure 7 or Figure 8 In this case, an electronic switch 20 can be formed by the first trigger part 1122a and the second trigger part 1122b in conjunction with the first trigger member 1121. When the probe 1123 contacts the surface of the object to be measured, the electronic switch 20 can be turned on by the first trigger member 1121 connected to the probe 1123. That is, the first trigger part 1122a disconnects from the first trigger member 1121 or the second trigger member 1122 disconnects from the first trigger member 1121. This allows the detection component 112 to output a trigger signal so that the measurement component 11 can complete the measurement. In addition, by forming the electronic switch 20 by the first trigger part 1122a and the second trigger part 1122b in conjunction with the first trigger member 1121, the inconvenience of setting wires on the first trigger member 1121 can also be reduced.

[0050] In some examples, the detection component 112 can output a path signal when the first trigger 1122a contacts the first trigger 1121 and the second trigger 1122b contacts the first trigger 1121, i.e., see [reference needed]. Figure 5 As shown, a closed electronic switch 20 can only be formed when the first trigger part 1122a is in contact with the first trigger member 1121 and the second trigger part 1122b is in contact with the first trigger member 1121, so that current can flow from the first trigger part 1122a through the first trigger member 1121 to the second trigger part 1122b.

[0051] In some examples, the detection component 112 can output a trigger signal when the first trigger portion 1122a disconnects from the first trigger member 1121 or when the second trigger portion 1122b disconnects from the first trigger member 1121, i.e., see [reference needed] Figure 6 , Figure 7 or Figure 8 The scenarios shown include: the first trigger 1121 is in contact with the first trigger part 1122a and disconnected from the second trigger part 1122b; the first trigger 1121 is disconnected from the first trigger part 1122a and in contact with the second trigger part 1122b; and the first trigger 1121 is disconnected from both the first trigger part 1122a and the second trigger part 1122b.

[0052] In some examples, the first trigger 1121 and the second trigger 1122 can be conductors, and the materials can include, but are not limited to, metals, graphite or composite conductive materials.

[0053] In some examples, a plurality of first triggers 1121 and a plurality of second triggers 1122 can be coupled to form a plurality of electronic switches 20 (see Figure 4 In some examples, multiple first triggers 1121 and multiple second triggers 1122 can be configured as multiple electronic switches 20, and the multiple electronic switches 20 can be connected in series or in parallel. In this case, triggering by multiple electronic switches 20 can improve the sensitivity of the detection component 112 of the measuring component 11 when it contacts the surface of the object to be measured during detection, thereby improving the measurement accuracy.

[0054] Figure 9 This is a schematic diagram illustrating the structure of the installation component 111 involved in the example of this disclosure. Figure 10 This is a schematic diagram illustrating the structure and working principle of the magnetic control 30 in the installation component 111 involved in the example of this disclosure. Figure 11 This is a schematic diagram showing the working state of the magnetic control 30 in the installation component 111 involved in the example of this disclosure under the action of a preset magnetic field B. Figure 12This is a circuit diagram showing the electronic switch 20 in the detection assembly 112 and the magnetic control 30 in the mounting assembly 111 connected in parallel, according to an example of this disclosure. Figure 12 Both the electronic switch 20 and the magnetic control 30 have been simplified and equivalent. For example, the electronic switch 20 can be simplified and equivalent to a switch and a resistor, and the magnetic control 30 can also be simplified and equivalent to a switch and a resistor. In addition, A in the figure represents the separation point A between the mounting component 111 and the detection component 112, that is, the mounting component 111 and the detection component 112 can be separated.

[0055] In some examples, such as Figure 9 As shown, the mounting component 111 may include a magnetic control 30. Specifically, the mounting component 111 may include a magnetic control 30 connected in parallel with the electronic switch 20 circuit and having a switching function. For example, as... Figure 12 As shown, the magnetic control 30 can be connected in parallel with the electronic switch 20 formed by the first trigger 1121 and the second trigger 1122 at the two poles of the power supply.

[0056] In this disclosure, the mounting component 111 can be configured to turn on and output a pass signal when the magnetic control 30 responds to a change in the magnetic field. In this case, the magnetic control 30 in the mounting component 111 acts as a switch and is connected in parallel with the electronic switch 20 circuit in the detection component 112. When responding to a change in the magnetic field, the mounting component 111 can replace the electronic switch 20 to output a pass signal, thereby enabling the measurement system to consider that the detection component 112 is not in a triggered measurement state when the detection component 112 is replaced (i.e., when the detection component 112 is replaced). Figure 12 (As shown in the diagram, the split point A is disconnected), thereby reducing the error rate of the measurement system. In other words, the problem of replacement failure caused by the structural limitations of the triggering component of the measurement component 11 can be solved through hardware control, thereby improving the intelligence level of the measurement equipment.

[0057] In some examples, such as Figure 10 As shown, the magnetic control unit 30 may include a first switch portion 301 and a second switch portion 302. In some examples, the first switch portion 301 and the second switch portion 302 may be connected to a power source and may close and conduct in response to changes in the magnetic field.

[0058] In some examples, the mounting component 111 can also be configured such that when it is near the preset magnetic field B, the first switch 301 contacts the second switch 302 and outputs a pass signal, and when it is far from the preset magnetic field B, the first switch 301 does not contact the second switch 302. For example, as Figure 10 and 11 As shown, when the mounting component 111 is far away from the preset magnetic field B, that is, as Figure 10The situation shown refers to the case where the first switch 301 and the second switch 302 are disconnected or not in contact when the magnetic control 30 is not affected by or does not exist in the preset magnetic field B; when the mounting component 111 is close to the preset magnetic field B, that is, as shown in the figure. Figure 11 The scenario shown illustrates the contact or closure of the first switch section 301 and the second switch section 302 when the magnetic control unit 30 is affected by or exists within the preset magnetic field B. In this case, the magnetic control unit 30 can function as a switch via the first switch section 301 and the second switch section 302. Furthermore, by connecting in parallel with the electronic switch 20 circuit formed by the first trigger member 1121 and the second trigger member 1122, it can replace the electronic switch 20 when the detection component 112 of the measuring component 11 is replaced and output a path signal under the action of the magnetic field. That is, when the detection component 112 is replaced, the magnetic field control circuit path can be used to make the measuring system believe that the detection component 112 is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0059] In some examples, the magnetic control 30 can be a magnetically controlled switch made of a reed switch. In this case, the switching action of the reed switch can be used to control its closure under a preset magnetic field B to replace the electronic switch 20 formed by the first trigger 1121 and the second trigger 1122 when the measuring component 11 is replaced. This solves the problem of replacement failure of the measuring component 11 due to the structural limitations of its own trigger component through hardware control, thereby improving the intelligence level of the measuring device.

[0060] In some examples, the resistance value of the magnetic control 30 can be equal to the equivalent resistance value of multiple electronic switches 20 connected in series or parallel, for example, as... Figure 12 As shown, when multiple electronic switches 20 can be equivalent to a single switch and resistor, and the magnetic control 30 can also be equivalent to a single switch and resistor, the equivalent resistance value of the multiple electronic switches 20 can be the same as the equivalent resistance value of the magnetic control 30. In this case, the multiple electronic switches 20 are connected in series or parallel and then connected in parallel with the magnetic control 30 circuit. The resistance value of the magnetic control 30 is equal to the equivalent resistance value of the multiple electronic switches 20 connected in series or parallel. When the detection component 112 of the measuring component 11 is replaced, the path signal output by the magnetic control 30 under the action of the magnetic field is the same as the path signal after the multiple electronic switches 20 are connected in series or parallel, improving the consistency of the output path signal. This allows the multiple electronic switches 20 to be replaced. When the detection component 112 is replaced, the magnetic field control circuit makes the measuring system think that the detection component 112 is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0061] In some examples, the probe component 112 and the mounting component 111 can be installed and removed by at least one of the following methods: threaded connection, magnetic attraction, or snap-fit. In this case, the probe component 112 can be easily detachably installed on the mounting component 111, and the installation accuracy can be improved by adjusting the thread accuracy, magnetic attraction accuracy, or snap-fit ​​accuracy, thereby improving the measurement accuracy of the measuring component 11.

[0062] The second aspect of this disclosure will now be described in detail with reference to the accompanying drawings. Figure 13 This is a block diagram showing the structure of the automatic replacement system 1 for the measuring component 11 involved in this disclosure.

[0063] The second aspect of this disclosure describes an automatic replacement system 1 for a measuring component 11. In some examples, such as Figure 13 As shown, the automatic replacement system 1 may include a measuring component 11, a driving device 12, and a placement device 13. In particular, the measuring component 11 involved in the second aspect of this disclosure may refer to the measuring component 11 involved in any embodiment of the first aspect of this disclosure.

[0064] In some examples, the drive unit 12 can be used to drive the measuring component 11 to move. Specifically, the drive unit 12 can be used to drive the measuring component 11 to the placement device 13, and can allow the measuring component 11 to be placed and replaced in the placement device 13.

[0065] In some examples, the drive unit 12 can be the drive mechanism of a measuring device, such as the drive mechanism of the spindle and sub-spindle of a coordinate measuring machine. In other examples, the drive unit 12 can also be the robotic arm of other automated measuring devices, such as a multi-axis measuring device.

[0066] In some examples, the drive unit 12 may be configured to drive the measuring component 11 to the placement device 13 and to be located in a preset magnetic field B.

[0067] In some examples, the placement device 13 may have a preset magnetic field B. In some examples, the preset magnetic field B may be generated by a permanent magnet or a current device in the placement device 13.

[0068] In some examples, the placement device 13 can be configured to place and replace the probe component 112. In some examples, the placement device 13 can hold multiple probe components 112. In some examples, the placement device 13 can automatically identify multiple probe components 112. In this case, the appropriate probe component 112 can be selected and replaced with the measuring component 11 according to the measurement requirements, thereby improving the intelligence level of the measuring device.

[0069] In some examples, the placement device 13 may be a replacement mechanism for the probe assembly 112 of the measuring component 11, which is disposed on the measuring equipment for replacing the measuring component 11. For example, the placement device 13 may be an automatic probe replacement mechanism of a coordinate measuring machine. In other examples, the placement device 13 may also be a replacement device for the probe assembly 112 of the measuring component 11, which is independent of the measuring equipment.

[0070] In some examples, the measuring component 11 may be a component based on a measurement method triggered by an electronic switch 20. In some examples, the measuring component 11 may include a mounting assembly 111 and a detection assembly 112. Specifically, the measuring component 11 may include a mounting assembly 111 and a detection assembly 112 that is detachably mounted to the mounting assembly 111 and is used to contact the surface of the object to be measured while outputting a trigger signal.

[0071] In some examples, the detection component 112 may include a probe 1123, a first trigger 1121, and a second trigger 1122. Specifically, the detection component 112 may include a probe 1123 for contacting the surface of the object to be tested, a first trigger 1121 connected to the probe 1123, and a second trigger 1122 that cooperates with the first trigger 1121 to form an electronic switch 20.

[0072] In some examples, the detection component 112 can be configured to output a path signal when the first trigger 1121 contacts the second trigger 1122, and output a trigger signal when the probe 1123 contacts the surface of the object to be tested, without contact between the first trigger 1121 and the second trigger 1122. In this configuration, the detection component 112 forms an electronic switch 20 through the cooperation of the first trigger 1121 and the second trigger 1122. The first trigger 1121 is connected to the probe 1123. When the probe 1123 is not in contact with the surface of the object to be measured, the first trigger 1121 and the second trigger 1122 are in contact with each other, i.e., the electronic switch 20 is in a closed state, and the detection component 112 can output a path signal. When the probe 1123 contacts the surface of the object to be measured, the first trigger 1121 and the second trigger 1122 are out of contact, i.e., the electronic switch 20 is opened through the probe 1123 connected to the first trigger 1121, and the detection component 112 can output a trigger signal. This allows the measuring device to use the detection component 112 to detect the object to be measured using a contact measurement method to obtain information such as the size, shape, or position of the object.

[0073] In some examples, mounting component 111 may include a magnetic control 30 that is connected in parallel with the circuit of electronic switch 20 and has a switching function.

[0074] In some examples, mounting component 111 can be configured to turn on and output a pass signal when magnetic control 30 responds to a preset magnetic field B. In this case, magnetic control 30 in mounting component 111 acts as a switch and is connected in parallel with the electronic switch 20 circuit in probe component 112. When responding to the preset magnetic field B of placement device 13, mounting component 111 can replace electronic switch 20 to output a pass signal. This allows the measurement system to consider probe component 112 as not being in a triggered measurement state when probe component 112 is replaced, i.e., moved to placement device 13, thereby reducing the error rate of measurement system identification.

[0075] In the second aspect of this disclosure, the measuring component 11 is moved to the placement device 13 with a preset magnetic field B by the driving device 12. The detection component 112, which is detachably mounted on the mounting assembly 111 of the measuring component 11, can be replaced in the placement device 13. Since the magnetic control 30 in the mounting assembly 111 has a switching function and is connected in parallel with the electronic switch 20 in the detection component 112, the mounting assembly 111 can replace the electronic switch 20 to output a path signal in response to the preset magnetic field B of the placement device 13. Thus, when the detection component 112 is replaced, that is, moved to the placement device 13, the measurement system can consider that the detection component 112 is not in a triggered measurement state. This reduces the error rate of the measurement system identification. In other words, the problem of replacement failure caused by the structural limitations of the measuring component 11's own triggering component can be solved by hardware control, thereby improving the intelligence level of the measuring device.

[0076] In some examples, the magnetic control 30 may include a first switch portion 301 and a second switch portion 302.

[0077] In some examples, the mounting component 111 can also be configured such that when it is near the preset magnetic field B, the first switch 301 contacts the second switch 302 and outputs a pass signal, and when it is away from the preset magnetic field B, the first switch 301 does not contact the second switch 302. In this case, the magnetic control 30 can function as a switch through the first switch 301 and the second switch 302, and by being connected in parallel with the electronic switch 20 circuit formed by the first trigger 1121 and the second trigger 1122, it can replace the electronic switch 20 when the detection component 112 of the measuring component 11 is replaced and output a pass signal under the action of the magnetic field. That is, when the detection component 112 is replaced, the magnetic field control circuit can make the measuring system think that the detection component 112 is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0078] In some examples, multiple first triggers 1121 and multiple second triggers 1122 can be configured as multiple electronic switches 20, and the multiple electronic switches 20 can be connected in series or in parallel. In this case, triggering by multiple electronic switches 20 can improve the sensitivity of the detection component 112 of the measuring component 11 when it contacts the surface of the object to be measured during detection, thereby improving the measurement accuracy.

[0079] In some examples, the resistance value of the magnetic control 30 can be equal to the equivalent resistance value of multiple electronic switches 20 connected in series or parallel. In this case, multiple electronic switches 20 are connected in series or parallel and then in parallel with the magnetic control 30 circuit, and the resistance value of the magnetic control 30 is equal to the equivalent resistance value of multiple electronic switches 20 connected in series or parallel. When the detection component 112 of the measuring component 11 is replaced, the path signal output by the magnetic control 30 under the action of the magnetic field is the same as the path signal of multiple electronic switches 20 connected in series or parallel, improving the consistency of the output path signal. This allows it to replace multiple electronic switches 20. When the detection component 112 is replaced, the magnetic field control circuit path makes the measuring system think that the detection component 112 is not in a triggered measuring state, thereby reducing the error rate of the measuring system.

[0080] According to this disclosure, a measuring component 11 and its automatic replacement system 1 can be provided, which can solve the problem of replacement failure of the measuring component 11 due to the structural limitations of its own triggering component through hardware control, thereby improving the intelligence level of the measuring equipment.

[0081] While the present disclosure has been specifically described above in conjunction with the accompanying drawings and examples, it is to be understood that the foregoing description does not limit the present disclosure in any way. Those skilled in the art can make modifications and alterations to the present disclosure as needed without departing from its essential spirit and scope, and all such modifications and alterations shall fall within the scope of the present disclosure.

Claims

1. A contact-type measuring component, characterized in that, The device includes a mounting assembly and a detection assembly detachably mounted on the mounting assembly. The detection assembly includes a probe for contacting the surface of an object under test, a first trigger connected to the probe, and a second trigger cooperating with the first trigger to form an electronic switch. The detection assembly is configured to output a path signal when the first trigger and the second trigger are in contact, and to output a trigger signal characterizing that the probe is in contact with the surface of the object under test when the first trigger and the second trigger are not in contact. The mounting assembly includes a magnetic control unit connected in parallel with the electronic switch and having a switching function. The mounting assembly is configured to output the path signal when the magnetic control unit conducts in response to a change in magnetic field. The detection assembly is configured to be detachable from the mounting assembly when the magnetic control unit is conducting.

2. The contact measuring component according to claim 1, characterized in that, The second trigger includes a first trigger portion and a second trigger portion. The detection component is further configured to output the path signal when the first trigger portion contacts the first trigger and the second trigger portion contacts the first trigger, and to output the trigger signal when the first trigger portion disconnects from the first trigger and / or when the second trigger portion disconnects from the first trigger.

3. The contact measuring component according to claim 1, characterized in that, The plurality of first triggers and the plurality of second triggers cooperate to form a plurality of electronic switches, and the plurality of electronic switches are connected in series or in parallel.

4. The contact measuring component according to claim 3, characterized in that, The resistance value of the magnetic control is equal to the equivalent resistance value of multiple electronic switches connected in series or in parallel.

5. The contact measuring component according to claim 1, characterized in that, The magnetic control unit includes a first switch part and a second switch part. The mounting component is further configured such that when it is close to a preset magnetic field, the first switch part contacts the second switch part and outputs the path signal, and when it is far away from the preset magnetic field, the first switch part does not contact the second switch part.

6. The contact measuring component according to claim 1, characterized in that, The magnetic control unit is a magnetic switch composed of a reed switch.

7. The contact measuring component according to claim 1, characterized in that, The detection component and the mounting component are installed and removed by at least one of the following methods: threaded, magnetic, and snap-fit.

8. A measuring device, characterized in that, It includes a contact measuring component as described in any one of claims 1 to 7, a drive mechanism for driving the contact measuring component to move in order to measure the object under test, and a host for receiving the signal output by the contact measuring component.

9. An automatic replacement system, characterized in that, The device includes a contact measuring component as described in any one of claims 1 to 7, a driving device for driving the contact measuring component to move, and a placement device having a preset magnetic field. The driving device is configured to drive the contact measuring component to move to the placement device and be located in the preset magnetic field. The mounting assembly of the contact measuring component is configured to turn on and output a path signal when the magnetic control of the mounting assembly responds to the preset magnetic field.

10. The automatic replacement system according to claim 9, characterized in that, The placement device is configured for placing and replacing the detection components of the contact measuring component, and the placement device stores a plurality of the detection components.

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