A mass spectrometer ion source control method, system, terminal and storage medium

Abstract

This application relates to a method, system, terminal, and storage medium for controlling an ion source of a mass spectrometer, belonging to the technical field of automated control. The method includes acquiring a first fault signal from a first ion source; controlling the first ion source to ionize a standard substance to obtain a first standard ion based on the first fault signal, and controlling an ion analysis device to detect the first standard ion to generate first test data; determining whether the first test data meets the requirements of standard test data; if it does, controlling the first ion source to ionize the actual substance to be tested to obtain the ion to be detected, and detecting the ion to be detected to generate test data; if it does not meet the requirements, controlling a second ion source to ionize the standard substance to obtain a second standard ion, and detecting the second standard ion to generate second test data; and controlling an ion source adjustment device to adjust the first and second ion sources based on the second test data and the standard test data. This application improves the emergency response capability of the mass spectrometer.

Description

Technical Field

[0001] This application relates to the field of automated control technology, and in particular to a method, system, terminal and storage medium for controlling the ion source of a mass spectrometer. Background Technology

[0002] A mass spectrometer is an analytical instrument that converts substances into charged ions, then separates, detects, and analyzes them based on the differences in the ions' mass-to-charge ratio, ultimately determining the molecular structure, chemical composition, and relative molecular mass of the substances. The ion source is the component in a mass spectrometer used to convert neutral samples into ions with different mass and charge ratios.

[0003] In related technologies, when an ion source malfunctions, the machine is first shut down and the power is cut off, and safety precautions are taken. Then, the cause of the malfunction is located by checking the instrument error messages and components. Subsequently, the relevant components of the ion source are manually cleaned or replaced according to the cause of the malfunction.

[0004] Regarding the aforementioned technologies, when there are faulty components in the ion source, maintenance personnel are required to remove the faulty components and determine the cause of the fault. Then, the components are replaced or cleaned according to the cause of the fault. This leads to a longer mass spectrometer analysis time, a decrease in detection efficiency, and sample waste due to analysis interruption. Consequently, the mass spectrometer has poor emergency response capabilities and there is room for improvement. Summary of the Invention

[0005] To improve the emergency response capability of mass spectrometers, this application provides a method, system, terminal, and storage medium for controlling the ion source of a mass spectrometer.

[0006] Firstly, this application provides a method for controlling the ion source of a mass spectrometer, employing the following technical solution:

[0007] A method for controlling an ion source in a mass spectrometer, comprising:

[0008] Obtain the first fault signal of the preset first ion source;

[0009] The first fault signal controls the first ion source to ionize the preset standard substance to obtain the first standard ion, and controls the preset ion analysis device to detect the first standard ion to generate the first test data.

[0010] Determine whether the first test data meets the requirements of the preset standard test data;

[0011] If the conditions are met, the first ion source is controlled to ionize the preset actual substance to be tested to obtain the ions to be detected, and the ion analysis device is controlled to detect the ions to be detected and generate the test data.

[0012] If the conditions are not met, the preset second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data.

[0013] The first and second ion sources are adjusted by controlling the preset ion source adjustment device based on the second test data and the standard test data.

[0014] By adopting the above technical solution, the first ion source is controlled to ionize the standard substance according to the first fault signal to obtain the first standard ion, and the ion analysis device is controlled to detect the first standard ion to generate the first test data. Then, it is determined whether the first test data meets the requirements of the standard test data. If the requirements are met, the first ion source is controlled to ionize the preset actual test substance to obtain the ion to be detected, and the ion analysis device is controlled to detect the ion to be detected to generate the test data. If the requirements are not met, the second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data. Thus, the ion source adjustment device is controlled to adjust the first ion source and the second ion source according to the second test data and the standard test data, thereby improving the emergency response capability of the mass spectrometer.

[0015] Optionally, the ion source adjustment device includes an ion source module merging component and an ion source switching component. The step of controlling the preset ion source adjustment device to adjust the first ion source and the second ion source according to the second test data and standard test data includes:

[0016] Determine whether the second test data meets the requirements of the standard test data;

[0017] If the conditions are met, the ion source switching component will switch the first ion source to the second ion source and determine the second ion source as the actual ion source.

[0018] If the conditions are not met, then obtain the first ion source state data and the second ion source state data;

[0019] Based on the state data of the first ion source and the state data of the second ion source, the ion source module merging component is controlled to merge the first ion source and the second ion source to obtain a merged receiving ion source, and the merged receiving ion source is determined as the actual ion source.

[0020] The preset feed capillary is controlled to allow the actual substance to be tested to flow into the actual ion source, and the actual ion source is controlled to ionize the actual substance to be tested.

[0021] By adopting the above technical solution, it is determined whether the second test data meets the requirements of the standard test data. If it does, the ion source switching component is controlled to switch the first ion source to the second ion source, and the second ion source is determined as the actual ion source. If it does not meet the requirements of the standard test data, the first ion source status data and the second ion source status data are acquired. Based on the first ion source status data and the second ion source status data, the ion source module merging component is controlled to merge the first ion source and the second ion source to obtain a merged receiving ion source. The merged receiving ion source is determined as the actual ion source, and the feed capillary is controlled to allow the actual substance to be tested to flow into the actual ion source. This allows the actual ion source to ionize the actual detection location, thereby enabling the mass spectrometer to normally separate, detect, and analyze the actual substance to be tested.

[0022] Optionally, the step of controlling the ion source switching component to switch the first ion source to the second ion source includes:

[0023] Obtain the position of the feed capillary;

[0024] The ion source switching component controls the position of the feed capillary to disconnect the feed capillary from the preset first ion source inlet.

[0025] Obtain the position of the first inlet of the first ion source and the position of the second inlet of the second ion source;

[0026] The positions of the first and second feed inlets are analyzed to determine the capillary movement distance;

[0027] The capillary travel distance and the preset capillary travel speed are analyzed to determine the capillary travel time.

[0028] The ion source switching component controls the ion source to move the feed capillary to the preset second ion source inlet based on the capillary movement time, and obtains the trajectory offset.

[0029] The ion source switching component controls the connection of the feed capillary to the feed port of the second ion source based on the trajectory offset.

[0030] By adopting the above technical solution, the ion source switching component is controlled to detach the feed capillary from the first ion source inlet based on the position of the feed capillary. The capillary movement distance is obtained by analyzing the positions of the first and second inlets. The capillary movement time is obtained by analyzing the capillary movement distance and speed. Based on the capillary movement time, the ion source switching component is controlled to move the feed capillary to the second ion source inlet and obtain the trajectory offset. Based on the trajectory offset, the ion source switching component is controlled to connect the feed capillary to the second ion source inlet, thereby enabling the switching to the second ion source when the first ion source fails, thus improving the emergency response capability of the mass spectrometer.

[0031] Optionally, the step of controlling the ion source switching component to connect the feed capillary to the feed port of the second ion source based on the trajectory offset includes:

[0032] Determine whether the trajectory offset meets the preset requirements for normal trajectory offset;

[0033] If the conditions are met, the ion source switching component will connect the feed capillary to the feed port of the second ion source.

[0034] If the conditions are not met, the trajectory offset and capillary movement speed are analyzed to determine the error correction time.

[0035] The trajectory offset is analyzed to determine the direction of capillary movement;

[0036] The ion source switching component controls the position of the feed capillary based on the error correction time and the capillary movement orientation, and connects the feed capillary to the feed port of the second ion source.

[0037] By adopting the above technical solution, it is determined whether the trajectory offset meets the requirements of normal trajectory offset. If it meets the requirements, the ion source switching component is controlled to connect the feed capillary to the feed port of the second ion source. If it does not meet the requirements, the trajectory offset and the capillary moving speed are analyzed to obtain the error correction time, and the trajectory offset is analyzed to obtain the capillary moving orientation. Based on the error correction time and the capillary moving orientation, the ion source switching component is controlled to correct the position of the feed capillary and connect the feed capillary to the feed port of the second ion source. This corrects the positional offset of the feed capillary caused by deformation, thereby improving the connection accuracy of the feed capillary.

[0038] Optionally, the step of controlling the ion source module merging component to merge the first ion source and the second ion source based on the first ion source state data and the second ion source state data to obtain a merged receiving ion source, and determining the merged receiving ion source as the actual ion source, includes:

[0039] The status data of the first ion source is analyzed to determine the location of the first fault module and the number of fault modules in the first ion source.

[0040] The status data of the second ion source is analyzed to determine the location of the second fault module and the number of fault modules in the second ion source.

[0041] Determine whether the locations of the first faulty module and the second faulty module are the same;

[0042] If they match, the first ion source to be repaired is determined based on the number of faulty modules in the first ion source and the number of faulty modules in the second ion source, and the first ion source to be repaired is then repaired.

[0043] If there is a discrepancy, the merged receiving ion source is determined based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules. The ion source module merging component is then controlled to ensure that the merged receiving ion source performs ionization normally.

[0044] By adopting the above technical solution, the location and number of the first fault module are obtained by analyzing the state data of the first ion source, and the location and number of the second fault module are obtained by analyzing the state data of the second ion source. It is then determined whether the locations of the first and second fault modules are consistent. If they are consistent, the first maintenance ion source is determined based on the number of the first and second fault modules, and maintenance is performed on the first maintenance ion source. If they are inconsistent, the merged receiving ion source is determined based on the location and number of the first and second fault modules, and the location and number of the second fault module. The merged receiving ion source is then determined as the actual ion source, thereby enabling the actual ion source to perform ionization work normally.

[0045] Optionally, the steps of determining the merged receiving ion source based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules, and controlling the ion source module merging component to enable the merged receiving ion source to perform normal ionization operation include:

[0046] Determine whether the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source.

[0047] If the value is greater than the value, the second ion source will be identified as the merged receiving ion source, and the location of the second faulty module will be identified as the location of the module to be replaced.

[0048] If it is less than, then the first ion source is determined as the merged receiving ion source, and the location of the first faulty module is determined as the location of the module to be replaced;

[0049] The ion source module merging component controls the ion source module to merge the first ion source and the second ion source according to the position of the module to be replaced, so as to obtain a merged receiving ion source.

[0050] By adopting the above technical solution, it is determined whether the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source. If it is greater, the second ion source is identified as the merged receiving ion source, and the location of the second faulty module is identified as the location of the module to be replaced. If it is less, the first ion source is identified as the merged receiving ion source, and the location of the first faulty module is identified as the location of the module to be replaced. Based on the location of the module to be replaced, the ion source module merging component is controlled to merge the first ion source and the second ion source to obtain a merged receiving ion source, thereby enabling the merged receiving ion source to ionize the actual substance to be tested.

[0051] Optionally, the step of controlling the ion source module merging component to merge the first ion source and the second ion source to obtain a merged receiving ion source, based on the location of the module to be replaced, includes:

[0052] The module to be replaced is determined based on the location of the module to be replaced and the preset module position relationship, and the ion source module merging component is controlled to move the module to be replaced out.

[0053] The combined receiving ion source is analyzed to determine the ion source supplied by the module;

[0054] The location of the supply module is determined based on the location of the module to be replaced and the ion source supplied to the module.

[0055] Analyze the locations of the modules to be replaced and the supply modules to determine the module movement distance;

[0056] The module movement distance and preset module movement speed are analyzed to determine the module movement time;

[0057] The supply module is determined based on its location and the relationship between the modules. The ion source module merging component is then controlled to move the supply module to the location of the module to be replaced based on the module movement time, so as to obtain the merged receiving ion source.

[0058] By adopting the above technical solution, the module to be replaced is determined according to the location of the module to be replaced and the relationship between the modules, and the ion source module merging component is controlled to move the module to be replaced out. The merged receiving ion source is analyzed to obtain the module supply ion source. The supply module location is determined according to the location of the module to be replaced and the module supply ion source. The module movement distance is obtained by analyzing the location of the module to be replaced and the supply module location. The module movement time is obtained by analyzing the module movement distance and the preset module movement speed. The supply module is determined according to the location of the supply module and the relationship between the modules, and the ion source module merging component is controlled to move the supply module to the location of the module to be replaced according to the module movement time, so as to obtain the merged receiving ion source.

[0059] Secondly, this application provides a mass spectrometer ion source control system, which adopts the following technical solution:

[0060] A mass spectrometer ion source control system, comprising:

[0061] The acquisition module is used to acquire the first fault signal;

[0062] A memory for storing a program for a mass spectrometer ion source control method as described in any of the preceding claims;

[0063] The processor and the program in the memory can be loaded and executed by the processor to implement a mass spectrometer ion source control method as described in any of the above.

[0064] By adopting the above technical solution, the processor loads and executes a program for a mass spectrometer ion source control method stored in the memory. The control acquisition module acquires a series of data related to the implementation of the mass spectrometer ion source control. Based on the first fault signal, the first ion source is controlled to ionize the standard substance to obtain the first standard ion, and the ion analysis device is controlled to detect the first standard ion to generate the first test data. Then, it is determined whether the first test data meets the requirements of the standard test data. If the requirements are met, the first ion source is controlled to ionize the preset actual test substance to obtain the ion to be detected, and the ion analysis device is controlled to detect the ion to be detected to generate the test data. If the requirements are not met, the second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data. Based on the second test data and the standard test data, the ion source adjustment device is controlled to adjust the first and second ion sources, thereby improving the emergency response capability of the mass spectrometer.

[0065] Thirdly, this application provides a smart terminal, which adopts the following technical solution:

[0066] A smart terminal includes a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executed as described in any of the preceding claims, a method for controlling a mass spectrometer ion source.

[0067] By adopting the above technical solution, and through the operation of a smart terminal, the processor loads and executes a computer program stored in the memory for a mass spectrometer ion source control method. Based on a first fault signal, the system controls the first ion source to ionize a standard substance to obtain a first standard ion, and controls the ion analysis device to detect the first standard ion to generate first test data. It then determines whether the first test data meets the requirements of the standard test data. If it does, the system controls the first ion source to ionize the preset actual test substance to obtain the ion to be detected, and controls the ion analysis device to detect the ion to be detected to generate the test data. If the requirements are not met, the system controls the second ion source to ionize the standard substance to obtain a second standard ion, and controls the ion analysis device to detect the second standard ion to generate second test data. Based on the second test data and the standard test data, the system controls the ion source adjustment device to adjust the first and second ion sources, thereby improving the emergency response capability of the mass spectrometer.

[0068] Fourthly, this application provides a computer storage medium capable of storing corresponding programs, which facilitates the improvement of the emergency response capabilities of the mass spectrometer, and adopts the following technical solution:

[0069] A computer-readable storage medium storing a computer program that can be loaded by a processor and executed any of the above-described mass spectrometer ion source control methods.

[0070] By employing the above technical solution, a computer program for controlling the ion source of a mass spectrometer is stored in a computer-readable storage medium. The processor loads and executes the computer program stored in the storage medium. Based on a first fault signal, the program controls the first ion source to ionize a standard substance to obtain first standard ions, and controls the ion analysis device to detect the first standard ions to generate first test data. It then determines whether the first test data meets the requirements of the standard test data. If the requirements are met, the program controls the first ion source to ionize a preset actual test substance to obtain the ion to be detected, and controls the ion analysis device to detect the ion to be detected to generate the test data. If the requirements are not met, the program controls the second ion source to ionize the standard substance to obtain second standard ions, and controls the ion analysis device to detect the second standard ions to generate second test data. Based on the second test data and the standard test data, the program controls the ion source adjustment device to adjust the first and second ion sources, thereby improving the emergency response capability of the mass spectrometer.

[0071] In summary, this application includes at least one of the following beneficial technical effects:

[0072] 1. By controlling the first ion source to ionize the standard substance according to the first fault signal to obtain the first standard ion, and controlling the ion analysis device to detect the first standard ion to generate the first test data, it is then determined whether the first test data meets the requirements of the standard test data. If the requirements are met, the first ion source is controlled to ionize the preset actual test substance to obtain the ion to be detected, and the ion analysis device is controlled to detect the ion to be detected to generate the test data. If the requirements are not met, the second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data. Thus, based on the second test data and the standard test data, the ion source adjustment device is controlled to adjust the first ion source and the second ion source, thereby improving the emergency response capability of the mass spectrometer.

[0073] 2. By determining whether the second test data meets the requirements of the standard test data, if it does, the ion source switching component is controlled to switch the first ion source to the second ion source, and the second ion source is determined as the actual ion source; if it does not meet the requirements of the standard test data, the first ion source status data and the second ion source status data are acquired, and the ion source module merging component is controlled to merge the first ion source and the second ion source to obtain a merged receiving ion source, which is determined as the actual ion source. The feed capillary is then controlled to allow the actual substance to be tested to flow into the actual ion source, so that the actual ion source can ionize the actual detection location, thereby enabling the mass spectrometer to normally separate, detect, and analyze the actual substance to be tested.

[0074] 3. By analyzing the state data of the first ion source, the location and number of the first faulty module are obtained. By analyzing the state data of the second ion source, the location and number of the second faulty module are obtained. It is determined whether the locations of the first and second faulty modules are consistent. If they are consistent, the first maintenance ion source is determined based on the number of the first and second faulty modules, and maintenance is performed on the first maintenance ion source. If they are inconsistent, the merged receiving ion source is determined based on the location and number of the first and second faulty modules, and the location and number of the second faulty module. The merged receiving ion source is then determined as the actual ion source, enabling the actual ion source to perform ionization operations normally. Attached Figure Description

[0075] Figure 1 This is a flowchart of a mass spectrometer ion source control method according to an embodiment of this application.

[0076] Figure 2This is a flowchart illustrating the steps in this application embodiment of controlling a preset ion source adjustment device to adjust the first ion source and the second ion source based on the second test data and standard test data.

[0077] Figure 3 This is a flowchart of the steps in the embodiment of this application for controlling the ion source switching component to switch the first ion source to the second ion source.

[0078] Figure 4 This is a flowchart of the steps in this application embodiment whereby the ion source switching component controls the feed capillary to connect to the feed port of the second ion source based on the trajectory offset.

[0079] Figure 5 This is a flowchart illustrating the steps in this application embodiment of controlling the ion source module merging component to merge the first ion source and the second ion source based on the first ion source state data and the second ion source state data to obtain a merged receiving ion source, and determining the merged receiving ion source as the actual ion source.

[0080] Figure 6 This is a flowchart of the steps in this application embodiment to determine the merged receiving ion source based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules, and to control the ion source module merging component to enable the merged receiving ion source to perform normal ionization operation.

[0081] Figure 7 This is a flowchart illustrating the steps in this application embodiment of controlling the ion source module merging component to merge the first ion source and the second ion source according to the position of the module to be replaced, so as to obtain a merged receiving ion source. Detailed Implementation

[0082] To make the purpose, technical solution, and advantages of this application clearer, the following description is provided in conjunction with the appendix. Figures 1 to 7 The present application will be further described in detail below with reference to embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the application.

[0083] This application discloses a method for controlling the ion source of a mass spectrometer. This method primarily addresses the problem of ion source malfunction in mass spectrometers. Specifically, it discloses a mass spectrometer, a first ion source, a second ion source, a data acquisition and monitoring device, a processing terminal, and an ion source adjustment device. The processing terminal is connected to the first ion source, the second ion source, the data acquisition and monitoring device, and the ion source adjustment device to achieve data interaction and control. After the data acquisition and monitoring device sends the first substance detection data to the processing terminal, the processing terminal compares the first substance detection data with normal substance detection data. When the first substance detection data and the normal substance detection data are inconsistent, the data acquisition and monitoring device controls the second ion source. The quality detection data is sent to the processing terminal, which compares the second substance detection data with the normal substance detection data. When the second substance detection data matches the normal substance detection data, the processing terminal controls the ion source adjustment device to switch the first ion source to the second ion source. When the second substance detection data does not match the normal substance detection data, the processing terminal controls the ion source adjustment device to merge the normal modules in the first and second ion sources to obtain a merged ion source that can work normally. The aim is to quickly and reasonably control the ion source adjustment device to adjust the first and second ion sources so that the ion source can still ionize substances normally in emergency situations.

[0084] Reference Figure 1 This application discloses a method for controlling the ion source of a mass spectrometer, comprising the following steps:

[0085] Step S100: Obtain the first fault signal of the preset first ion source.

[0086] The first ion source refers to the main component in a mass spectrometer that converts neutral samples into ions with different mass and charge ratios.

[0087] The first fault signal refers to the alarm command sent by the processing terminal when the data of the first ion source is abnormal. The first ion source operating parameters are obtained by the data acquisition and monitoring equipment and transmitted to the processing terminal. The processing terminal compares the first ion source operating parameters with the normal first ion source operating parameters. If the processing terminal determines that the first ion source operating parameters are inconsistent with the normal first ion source operating parameters, it sends an alarm command, which is the first fault signal.

[0088] Normal operating parameters of the first ion source refer to the data set when the ion source is working normally. In one embodiment, the normal operating parameters of the first ion source can be obtained by the operator by consulting the technical manual according to the model of the first ion source.

[0089] A mass spectrometer is an analytical instrument that converts substances into charged ions, then separates, detects, and analyzes them based on the difference in the mass-to-charge ratio of the ions, ultimately determining the molecular structure, chemical composition, and relative molecular mass of the substances. It includes a first ion source, a second ion source, and an ion analysis device.

[0090] Data acquisition and monitoring equipment refers to a device consisting of a miniature industrial camera, a high-pressure sensor, a current sensing resistor, a temperature sensor, a mass flow meter, a pressure sensor, a circuit self-test module, and a communication module, used to monitor the working status of an ion source and acquire ion source status data in real time.

[0091] The second ion source refers to a backup component in a mass spectrometer that converts neutral samples into ions with different mass and charge ratios.

[0092] An ion analysis device is a device used to separate and quantitatively count formed ions according to their mass-to-charge ratio, including a mass analyzer and a detector. A mass analyzer is a device that uses an electric or magnetic field to separate ions according to their mass-to-charge ratio and sequentially feeds them into a detector. A detector is a sensing element used to receive the ions separated by the mass analyzer and convert them into measurable electrical pulses.

[0093] Step S101: Control the first ion source to ionize the preset standard substance according to the first fault signal to obtain the first standard ion, and control the preset ion analysis device to detect the first standard ion to generate the first test data.

[0094] Among them, standard substances refer to samples for which all data are known to confirm whether the ion source is malfunctioning.

[0095] The first standard ion refers to the ion generated after the standard substance is ionized by the first ion source. In one embodiment, the standard substance is introduced into the first ion source, and then the molecules lose or gain charge to form charged ions by electron bombardment. After being focused and accelerated by the ion lens system, a standard ion beam with a known mass-to-charge ratio that can be used for mass spectrometry calibration is finally generated, which is the first standard ion.

[0096] The first detection data refers to the set of peak height and peak area values ​​at a specific mass-to-charge ratio in the mass spectrometry analysis of standard substances using the first ion source. The first standard ions are introduced into the mass analyzer, which separates and counts the first standard ions according to their mass-to-charge ratio. The detector then bombards the ions separated by the mass analyzer, converting them into electrical pulse signals. After amplification, integration, and digitization, the signals form the peak height and peak area corresponding to the mass-to-charge ratio. The peak height and peak area are transmitted to the processing terminal and summarized to obtain the first detection data.

[0097] The ion analysis device in this step is the same as the ion analysis device in step S100 above, and will not be described again here.

[0098] Step S102: Determine whether the first test data meets the requirements of the preset standard test data.

[0099] Standard test data refers to the set of correct peak height and peak area values ​​at a specific mass-to-charge ratio during mass spectrometry analysis of standard substances. In one embodiment, the operator queries the peak height and peak area values ​​at a specific mass-to-charge ratio in historical mass spectra, transmits the values ​​to the processing terminal, and summarizes them to obtain the standard test data. The requirement for standard test data is that when the difference between the test data and the standard test data is less than the specified error value, the test data is considered normal; when the difference between the test data and the standard test data is greater than the specified error value, the test data is considered abnormal.

[0100] The processing terminal determines whether the first test data meets the requirements of the standard test data, thereby determining whether the first test data is normal.

[0101] Step S1021: If satisfied, control the first ion source to ionize the preset actual substance to be tested to obtain the ions to be detected, and control the ion analysis device to detect the ions to be detected to generate the test data.

[0102] If the processing terminal determines that the first test data meets the requirements of the standard test data, it means that the first test data is normal data. Therefore, the first ion source is controlled to ionize the actual substance to be tested to obtain the ions to be tested, and the ion analysis device is controlled to detect the ions to be tested to generate the test data.

[0103] The actual substance to be tested refers to the specific substance that needs to be quantitatively or qualitatively analyzed by a mass spectrometer.

[0104] The ion to be tested refers to the ion generated after the actual substance to be tested is ionized by the first ion source. In one embodiment, the actual substance to be tested is introduced into the first ion source, and then charged ions are formed by the molecules losing or gaining charge through electrospraying. After being focused and accelerated by the ion lens system, a standard ion beam with a known mass-to-charge ratio that can be used for mass spectrometry calibration is finally generated, which is the ion to be tested.

[0105] The data to be tested refers to the set of peak height and peak area values ​​at a specific mass-to-charge ratio in the mass spectrometry analysis of the actual substance to be tested using the first ion source. The ions to be tested are introduced into the mass analyzer, which separates and counts them according to their mass-to-charge ratio. The detector then bombards the ions separated by the mass analyzer, converting them into electrical pulse signals. After amplification, integration, and digitization, the signals form the peak height and peak area corresponding to the mass-to-charge ratio. The peak height and peak area are transmitted to the processing terminal and summarized to obtain the data to be tested.

[0106] Step S1022: If the condition is not met, control the preset second ion source to ionize the standard substance to obtain the second standard ion, and control the ion analysis device to detect the second standard ion to generate the second test data.

[0107] If the processing terminal determines that the first test data does not meet the requirements of the standard test data, it indicates that the first test data is abnormal data. Therefore, the second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data.

[0108] The second ion source in this step is the same as the second ion source in step S100 above, and will not be described again here.

[0109] The second standard ion refers to the ion generated after the standard substance is ionized by the second ion source. In one embodiment, the standard substance is introduced into the second ion source, and then the molecules lose or gain charge to form charged ions through chemical ionization. After being focused and accelerated by the ion lens system, a standard ion beam with a known mass-to-charge ratio that can be used for mass spectrometry calibration is finally generated, which is the second standard ion.

[0110] The second test data refers to the set of peak height and peak area values ​​at a specific mass-to-charge ratio in the mass spectrometry analysis of the standard substance using the second ion source. The specific determination method is the same as the method for obtaining the second test data in step S101 above, and will not be repeated here.

[0111] Step S10221: Adjust the first ion source and the second ion source by controlling the preset ion source adjustment device according to the second test data and the standard test data.

[0112] After the processing terminal determines the second test data, it controls the ion source adjustment device to adjust the first and second ion sources based on the second test data and the standard test data. The specific method is described in [reference needed]. Figure 2 This process ensures that even if the first ion source malfunctions, it can still ionize the actual substance to be detected.

[0113] An ion source adjustment device refers to a device that adjusts the first and second ion sources according to the fault situation after the processing terminal determines that the first or second ion source is faulty, so as to continue to ionize the actual substance to be tested. It includes an ion source module merging component and an ion source switching component. The ion source module merging component refers to the component that physically and electrically reassembles the functional modules of the first and second ion sources and integrates them into a complete ion source that can operate independently. It consists of a modular quick-change connector and an adjustable support platform. When a merging signal is received, the modular quick-change connector automatically removes the faulty module, and then the adjustable support platform accurately positions and installs the usable module from the other ion source into the original module position, realizing the reconstruction and restoration of the ion source.

[0114] An ion source switching component is a component used to automatically switch the sample introduction path between multiple ion sources. It consists of a capillary holder and a stepper motor. When a switching signal is received, the capillary holder is controlled to pull the feed capillary out of the first ion source interface. Then, the stepper motor is controlled to move the feed capillary to the second ion source interface according to the required distance and the stepper motor's moving speed. Finally, the capillary holder is controlled to insert the feed capillary into the second ion source interface.

[0115] The feed capillary is a channel component in the ion source of a mass spectrometer used to transport samples from the outside to the ionization region.

[0116] Reference Figure 2 The steps for adjusting the first and second ion sources using a preset ion source adjustment device based on the second test data and standard test data include:

[0117] Step S200: Determine whether the second test data meets the requirements of the standard test data.

[0118] Specifically, the processing terminal determines whether the first test data meets the requirements of the standard test data, thereby determining whether the second test data is normal and whether the first ion source is faulty.

[0119] Step S2001: If satisfied, control the ion source switching component to switch the first ion source to the second ion source and determine the second ion source as the actual ion source.

[0120] If the processing terminal determines that the second test data meets the requirements of the standard test data, it indicates that the second test data is normal and the first ion source is faulty. Therefore, the ion source switching component is controlled to switch the first ion source to the second ion source. The specific control method is as follows: Figure 3 This process allows for the ionization of the actual substance to be tested in the event of a failure of the first ion source.

[0121] Step S2002: If not satisfied, then obtain the first ion source state data and the second ion source state data.

[0122] If the processing terminal determines that the second test data meets the requirements of the standard test data, it indicates that the second test data is abnormal data and both the first ion source and the second ion source are malfunctioning. Therefore, the status data of the first ion source and the status data of the second ion source are obtained through the data acquisition and monitoring equipment.

[0123] The first ion source status data refers to the collection of data reflecting the operating status of each module in the first ion source. The operating status data of each module in the first ion source is acquired by the data acquisition and monitoring equipment, and the working status data of each module is transmitted to the processing terminal. The processing terminal maps the operating status data to the working module positions one by one to form a mapping table, which is the first ion source status data.

[0124] The second ion source status data refers to the collection of data reflecting the operating status of each module in the second ion source. The operating status data of each module in the second ion source is acquired by the data acquisition and monitoring equipment, and the working status data of each module is transmitted to the processing terminal. The processing terminal maps the operating status data to the working module positions one by one to form a mapping table, which is the second ion source status data.

[0125] The working module position refers to the coordinates of each module inside the ion source. By mapping the coordinate system onto the ion source through the processing terminal, the specific coordinates of the center of each module in the coordinate system can be identified, and thus the working module position can be obtained.

[0126] Step S20021: Based on the first ion source state data and the second ion source state data, control the ion source module merging component to merge the first ion source and the second ion source to obtain a merged receiving ion source, and determine the merged receiving ion source as the actual ion source.

[0127] Among them, the combined receiving ion source refers to an ion source that can normally ionize the actual substance to be tested after combining the normal working modules of the first ion source and the second ion source.

[0128] After receiving the first ion source status data and the second ion source status data, the processing terminal controls the ion source module merging component to merge the first and second ion sources to obtain a merged received ion source, and determines the merged received ion source as the actual ion source. The specific merging method is described in [reference needed]. Figure 5 The steps are to control the ionization of the actual substance to be tested by the actual ion source.

[0129] Step S201: Control the preset feed capillary to allow the actual substance to be tested to flow into the actual ion source, and control the actual ion source to ionize the actual substance to be tested.

[0130] In this process, after the processing terminal determines the actual ion source, the processing terminal controls the feed capillary to allow the actual substance to be tested to flow into the actual ion source, and controls the actual ion source to ionize the actual substance to be tested.

[0131] The feed capillary in this step is the same as the feed capillary in step S10221 above, and will not be described again here.

[0132] Reference Figure 3 The steps of controlling the ion source switching component to switch the first ion source to the second ion source include:

[0133] Step S300: Obtain the position of the feed capillary.

[0134] The feed capillary position refers to the spatial coordinates of the feed capillary in the mass spectrometer. The original images of the feed capillary end and the ion source inlet are acquired in real time by a miniature industrial camera in the data acquisition and monitoring equipment. The original images are then processed to highlight the contours, thereby identifying the feed inlet number connected to the feed capillary. The feed inlet number is then transmitted to the processing terminal. The processing terminal finds the feed inlet position in the mapping table corresponding to the number coordinates based on the feed inlet number. Finally, the processing terminal determines the feed capillary position based on the feed inlet position.

[0135] The feed port number refers to the corresponding number of the first ion source feed port and the second ion source feed port. For example, the feed port number of the first ion source feed port is 1 and the feed port number of the second ion source feed port is 2.

[0136] The feed port position refers to the spatial coordinates of the first ion source feed port and the second ion source feed port in the mass spectrometer. It includes the positions of the first feed port and the second feed port. By mapping the coordinate system onto the mass spectrometer through the processing terminal, the specific coordinates of the ion source feed port on the coordinate system can be identified, and thus the feed port position can be determined.

[0137] The sequence number coordinate correspondence refers to the correspondence between the feed port sequence number and the feed port position. The operator forms a mapping table by matching the feed port sequence number with the feed port position one by one. For example, if the feed port sequence number is 1, and the feed port position corresponding to sequence number 1 is (1,1,1), then number 1 corresponds to (1,1,1).

[0138] The first ion source inlet refers to the physical interface in the first ion source used to connect with the feed capillary to receive the sample and guide it into the ionization region.

[0139] The second ion source inlet refers to the physical interface in the second ion source used to connect with the feed capillary to receive the sample and guide it into the ionization region.

[0140] Step S301: Control the ion source switching component to disconnect the feed capillary from the preset first ion source inlet according to the position of the feed capillary.

[0141] In this step, the first ion source inlet is the same as the first ion source inlet in step S300 above. After the processing terminal determines the position of the feed capillary, the processing terminal controls the ion source switching component to disconnect the feed capillary from the first ion source inlet according to the position of the feed capillary, thereby providing support for subsequent control of the movement of the feed capillary.

[0142] Step S302: Obtain the position of the first feed port of the first ion source and the position of the second feed port of the second ion source.

[0143] The positions of the first and second feed inlets in this step are the same as those in step S300 above, and will not be described again here.

[0144] Step S303: Analyze the positions of the first and second feed inlets to determine the capillary movement distance.

[0145] The capillary movement distance refers to the displacement length of the feed capillary to the feed port of the second ion source. The capillary movement distance is calculated by the processing terminal based on the spatial coordinate length calculation formula for the positions of the first and second feed ports.

[0146] Step S304: Analyze the capillary movement distance and the preset capillary movement speed to determine the capillary movement time.

[0147] The capillary travel time refers to the time required for the feed capillary to travel to the feed inlet of the second ion source. The capillary travel time can be obtained by dividing the capillary travel distance by the capillary travel speed through the processing terminal.

[0148] The capillary moving speed refers to the distance that the stepper motor controlling the movement of the feed capillary in the ion source switching assembly can move per unit time, taking a capillary moving speed of 10-100 μm / s as an example.

[0149] Step S305: Based on the capillary movement time, control the ion source switching component to move the feed capillary to the preset second ion source inlet and obtain the trajectory offset.

[0150] In this step, the second ion source inlet is the same as the second ion source inlet in step S300 above. After the processing terminal determines the capillary movement time, the processing terminal controls the ion source switching component to move the feed capillary to the second ion source inlet according to the capillary movement time, so that the feed capillary is connected to the second ion source inlet.

[0151] The trajectory offset refers to the displacement value between the end position of the feed capillary and the position of the second feed inlet after the feed capillary stops moving. The original image of the feed capillary end is acquired in real time by a miniature industrial camera in the data acquisition and monitoring equipment. The processing terminal maps the coordinate system onto the original image to identify the specific coordinates of the center of the feed capillary end in the coordinate system. Then, the processing terminal calculates the trajectory offset distance based on the spatial coordinate length calculation formula for the center position of the feed capillary end and the position of the second feed inlet. The processing terminal then identifies whether the feed capillary is to the right of the second ion source feed inlet. If the processing terminal determines that the feed capillary is to the right of the second ion source feed inlet, the trajectory offset distance is determined as the trajectory offset amount. If the processing terminal determines that the feed capillary is to the left of the second ion source feed inlet, the negative of the trajectory offset distance is determined as the trajectory offset amount.

[0152] Step S306: Control the ion source switching component to connect the feed capillary to the feed port of the second ion source according to the trajectory offset.

[0153] In this process, after the processing terminal determines the trajectory offset, the processing terminal controls the ion source switching component to connect the feed capillary to the feed port of the second ion source based on the trajectory offset, so that the mass spectrometer can perform mass spectrometry analysis on the actual substance to be tested.

[0154] Reference Figure 4 The steps of controlling the ion source switching component to connect the feed capillary to the feed port of the second ion source based on the trajectory offset include:

[0155] Step S400: Determine whether the trajectory offset meets the preset requirements for normal trajectory offset.

[0156] The normal trajectory offset refers to the displacement value between the final position of the feed capillary that connects to the feed port of the second ion source and the position of the second feed port. The requirement for the normal trajectory offset is that the trajectory offset cannot exceed the normal trajectory offset in order to connect the feed capillary to the feed port of the second ion source.

[0157] The processing terminal determines whether the trajectory offset meets the requirements of normal trajectory offset, thereby determining whether the feed capillary can be connected to the feed port of the second ion source.

[0158] Step S4001: If satisfied, control the ion source switching component to connect the feed capillary to the second ion source feed port.

[0159] If the processing terminal determines that the trajectory offset meets the requirements of the normal trajectory offset, it means that the feed capillary can be connected to the feed port of the second ion source. Therefore, the ion source switching component is controlled to connect the feed capillary to the feed port of the second ion source.

[0160] Step S4002: If not satisfied, analyze the trajectory offset and capillary movement speed to determine the error correction time.

[0161] If the processing terminal determines that the trajectory offset does not meet the requirements of the normal trajectory offset, it means that the feed capillary cannot be connected to the feed port of the second ion source, and therefore the position of the feed capillary needs to be further corrected.

[0162] Error correction time refers to the time required for the feed capillary to correct its position. The error correction time can be obtained by dividing the trajectory offset by the capillary's moving speed through the processing terminal.

[0163] Step S40021: Analyze the trajectory offset to determine the capillary movement orientation.

[0164] The capillary movement orientation refers to the direction of movement of the feed capillary during position correction. The processing terminal determines whether the trajectory offset is positive. If the processing terminal determines that the trajectory offset is positive, the capillary movement orientation is to the right. If the processing terminal determines that the trajectory offset is negative, the capillary movement orientation is to the left.

[0165] Step S40022: Based on the error correction time and capillary movement orientation, control the ion source switching component to correct the position of the feed capillary and connect the feed capillary to the feed port of the second ion source.

[0166] In this process, after the processing terminal determines the error correction time and the capillary movement position, the processing terminal controls the ion source switching component to make the feed capillary continue to move according to the error correction time and the capillary movement position, thereby correcting the position of the feed capillary. After the correction is completed, the processing terminal controls the ion source switching component to connect the feed capillary to the second ion source inlet.

[0167] Reference Figure 5 The steps of controlling the ion source module merging component to merge the first and second ion sources based on the first and second ion source state data to obtain a merged receiving ion source, and determining the merged receiving ion source as the actual ion source, include:

[0168] Step S500: Analyze the state data of the first ion source to determine the location of the first fault module and the number of fault modules in the first ion source.

[0169] The location of the first fault module refers to the coordinates of the module in the first ion source that has malfunctioned. The first ion source status data is queried by the processing terminal to identify abnormal data in the first ion source status data. The location of the first fault module can then be determined by querying the first ion source status data based on the abnormal data by the processing terminal.

[0170] The number of faulty modules in the first ion source refers to the number of faulty modules in the first ion source. By querying the status data of the first ion source through the processing terminal, abnormal data in the status data of the first ion source can be identified, and the abnormal data can be counted to determine the number of faulty modules in the first ion source.

[0171] Step S501: Analyze the state data of the second ion source to determine the location of the second fault module and the number of second ion source fault modules.

[0172] The location of the second fault module refers to the coordinates of the module in the second ion source that has malfunctioned. The location of the second fault module can be obtained by querying the status data of the second ion source through the processing terminal to identify abnormal data in the status data of the second ion source, and then querying the second ion source status data based on the abnormal data through the processing terminal.

[0173] The number of faulty modules in the second ion source refers to the number of faulty modules in the second ion source. By querying the status data of the second ion source through the processing terminal, abnormal data in the status data of the second ion source can be identified, and the number of faulty modules in the second ion source can be determined by counting the abnormal data.

[0174] Step S502: Determine whether the location of the first fault module and the location of the second fault module are the same.

[0175] Specifically, after the processing terminal determines the location of the first fault module and the location of the second fault module, it determines whether the locations of the first fault module and the second fault module are consistent, thereby determining whether there are modules that fail simultaneously in the first ion source and the second ion source.

[0176] Step S5021: If they match, determine the first ion source to be repaired based on the number of faulty modules in the first ion source and the number of faulty modules in the second ion source, and repair the first ion source to be repaired.

[0177] If the processing terminal determines that the location of the first faulty module is the same as the location of the second faulty module, it means that there are modules that are simultaneously faulty in the first ion source and the second ion source. Therefore, the processing terminal sends a fault repair signal to the operator based on the first maintenance ion source. The operator receives the signal and prioritizes the repair of the first maintenance ion source.

[0178] The first maintenance ion source refers to the ion source that is prioritized for maintenance among the two ion sources. The number of faulty modules in the first ion source and the number of faulty modules in the second ion source are compared by the processing terminal to determine the ion source with fewer faulty modules, and this ion source is identified as the first maintenance ion source.

[0179] Step S5022: If there is a discrepancy, determine the merged receiving ion source based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules, and control the ion source module merging component to enable the merged receiving ion source to perform ionization work normally.

[0180] If the processing terminal determines that the locations of the first faulty module and the second faulty module are inconsistent, it indicates that there are no modules in the first and second ion sources that are simultaneously faulty. Therefore, the merged receiving ion sources are determined based on the location of the first faulty module, the number of faulty modules in the first ion source, the location of the second faulty module, and the number of faulty modules in the second ion source. The specific control method is as follows: Figure 6 The steps are to control the ion source module merging component so that the merging receiving ion source can perform ionization normally.

[0181] Reference Figure 6 The steps for determining the merged receiving ion source based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules, and controlling the ion source module merging assembly to ensure the merged receiving ion source performs normal ionization operation, include:

[0182] Step S600: Determine whether the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source.

[0183] Specifically, the processing terminal determines whether the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source, thereby determining whether the first ion source can be used as a merged receiving ion source.

[0184] Step S6001: If it is greater than, then the second ion source is determined as the merged receiving ion source, and the location of the second fault module is determined as the location of the module to be replaced.

[0185] If the processing terminal determines that the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source, it means that the first ion source cannot be used as a merged receiving ion source. Therefore, the processing terminal determines the second ion source as the merged receiving ion source, thereby controlling the ion source module merging component to replace the faulty modules in the second ion source with the normal modules in the first ion source.

[0186] The location of the module to be replaced refers to the coordinates of the faulty module in the merged receiving ion source. After the processing terminal determines that the second ion source is the merged receiving ion source, the location of the second faulty module is determined as the location of the module to be replaced.

[0187] Step S6002: If it is less than, then the first ion source is determined as the merged receiving ion source, and the location of the first faulty module is determined as the location of the module to be replaced.

[0188] If the processing terminal determines that the number of faulty modules in the first ion source is less than the number of faulty modules in the second ion source, it means that the first ion source can be used as a merged receiving ion source. Therefore, the processing terminal determines the first ion source as a merged receiving ion source, thereby controlling the ion source module merging component to replace the faulty modules in the first ion source with normal modules in the second ion source, and the processing terminal determines the location of the first faulty module as the location of the module to be replaced.

[0189] The location of the module to be replaced in this step is the same as that in step S6001 above, and will not be repeated here.

[0190] Step S601: According to the position of the module to be replaced, control the ion source module merging component to merge the first ion source and the second ion source to obtain a merged receiving ion source.

[0191] In this process, after the processing terminal determines the location of the module to be replaced, the processing terminal controls the ion source module merging component to merge the first ion source and the second ion source to obtain a merged receiving ion source, according to the location of the module to be replaced. The specific method is described in [reference needed]. Figure 7 This process enables the combined receiving ion source to perform ionization operations normally.

[0192] Reference Figure 7 The steps for controlling the ion source module merging component to merge the first and second ion sources to obtain a merged receiving ion source, based on the location of the module to be replaced, include:

[0193] Step S700: Determine the module to be replaced based on the location of the module to be replaced and the preset module position relationship, and control the ion source module merging component to move the module to be replaced out.

[0194] Among them, the module position relationship refers to the correspondence between the module position and the module type in the ion source. The operator determines the position coordinates of different modules in the ion source according to the actual situation and forms a mapping table to correspond the module position and module type one by one.

[0195] The module to be replaced refers to the faulty module in the merged receiving ion source that needs to be replaced. The processing terminal finds the module to be replaced by looking up the corresponding mapping table in the module position relationship according to the location of the module.

[0196] After the processing terminal determines the location and the module to be replaced, it controls the ion source module merging component to remove the module to be replaced from the merging receiving ion source, thereby allowing the normal module to be moved into the merging receiving ion source.

[0197] Step S701: Analyze the merged receiving ion source to determine the ion source supplied by the module.

[0198] The module supply ion source refers to the ion source that provides the module with normal operation information for the merging and receiving ion source. The processing terminal determines whether the merging and receiving ion source is the first ion source or the second ion source. If the processing terminal determines that the merging and receiving ion source is the first ion source, then the second ion source is determined as the module supply ion source; if the processing terminal determines that the merging and receiving ion source is the second ion source, then the first ion source is determined as the module supply ion source.

[0199] Step S702: Determine the location of the supply module based on the location of the module to be replaced and the ion source supplied by the module.

[0200] The supply module position refers to the position coordinates of the module in the supply ion source that needs to be moved to the merging receiving ion source to replace the module position. The processing terminal compares the position of the module to be replaced with the module position in the module supply ion source, and finds the position coordinates in the module supply ion source that are consistent with the position of the module to be replaced, which is the supply module position.

[0201] Step S703: Analyze the location of the module to be replaced and the location of the supply module to determine the module movement distance.

[0202] The module movement distance refers to the length that the module in the supply ion source needs to move to the position of the module to be replaced. The module movement distance can be obtained by the processing terminal by calculating the position of the module to be replaced and the position of the supply module according to the spatial coordinate length calculation formula.

[0203] Step S704: Analyze the module movement distance and the preset module movement speed to determine the module movement time.

[0204] The module moving speed refers to the distance that the adjustable support platform controlling the movement of the module in the ion source module merging assembly can move per unit time, taking a module moving speed of 50-1000μm / s as an example.

[0205] Module movement time refers to the time required for a module in the supply ion source to move from the supply ion source to the merging receiving ion source, which needs to be moved to the position of the module to be replaced. The module movement speed can be obtained by dividing the module movement distance by the module movement speed through the processing terminal.

[0206] Step S705: Determine the supply module based on the supply module location and module position relationship, and control the ion source module merging component to move the supply module to the position of the module to be replaced according to the module movement time, so as to obtain the merged receiving ion source.

[0207] Among them, the supply module refers to the module in the supply ion source that needs to be moved to the position of the module to be replaced. It is found by the processing terminal in the mapping table corresponding to the module position relationship according to the position of the supply module.

[0208] After the processing terminal determines the supply module and the module movement time, the processing terminal controls the ion source module merging component to move the supply module to the position of the module to be replaced according to the module movement time, so as to obtain the merged receiving ion source.

[0209] Based on the same inventive concept, embodiments of this application provide a method for controlling an ion source of a mass spectrometer, including:

[0210] The acquisition module is used to acquire the first fault signal, the first ion source status data, the second ion source status data, the feed capillary position, the first feed inlet position, the second feed inlet position, and the trajectory offset.

[0211] A memory for storing a program for controlling a mass spectrometer ion source;

[0212] The processor can load and execute programs in memory to implement a method for controlling the ion source of a mass spectrometer.

[0213] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional modules is used as an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device, and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0214] This application provides a computer-readable storage medium storing a computer program that can be loaded by a processor and executed as a method for controlling a mass spectrometer ion source.

[0215] Computer storage media include, for example, USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media that can store program code.

[0216] Based on the same inventive concept, embodiments of this application provide a smart terminal, including a memory and a processor, wherein the memory stores a computer program that can be loaded and executed by the processor to control a mass spectrometer ion source.

[0217] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional modules is used as an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device, and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0218] The above are all preferred embodiments of this application and are not intended to limit the scope of protection of this application. Any feature disclosed in this specification (including the abstract and drawings) may be replaced by other equivalent or similar features unless specifically stated otherwise. That is, unless specifically stated otherwise, each feature is only one example of a series of equivalent or similar features.

Claims

1. A method for controlling the ion source of a mass spectrometer, characterized in that, include: Obtain the first fault signal of the preset first ion source; The first fault signal controls the first ion source to ionize the preset standard substance to obtain the first standard ion, and controls the preset ion analysis device to detect the first standard ion to generate the first test data. Determine whether the first test data meets the requirements of the preset standard test data; If the conditions are met, the first ion source is controlled to ionize the preset actual substance to be tested to obtain the ions to be detected, and the ion analysis device is controlled to detect the ions to be detected and generate the test data. If the conditions are not met, the preset second ion source is controlled to ionize the standard substance to obtain the second standard ion, and the ion analysis device is controlled to detect the second standard ion to generate the second test data. The first and second ion sources are adjusted by controlling the preset ion source adjustment device based on the second test data and the standard test data. The ion source adjustment device includes an ion source module merging component and an ion source switching component. The steps of controlling the preset ion source adjustment device to adjust the first ion source and the second ion source according to the second test data and standard test data include: Determine whether the second test data meets the requirements of the standard test data; If the conditions are met, the ion source switching component will switch the first ion source to the second ion source and determine the second ion source as the actual ion source. If the conditions are not met, then obtain the first ion source state data and the second ion source state data; Based on the state data of the first ion source and the state data of the second ion source, the ion source module merging component is controlled to merge the first ion source and the second ion source to obtain a merged receiving ion source, and the merged receiving ion source is determined as the actual ion source. The preset feed capillary is controlled to allow the actual substance to be tested to flow into the actual ion source, and the actual ion source is controlled to ionize the actual substance to be tested.

2. The method for controlling the ion source of a mass spectrometer according to claim 1, characterized in that, The steps for the ion source switching component to switch the first ion source to the second ion source include: Obtain the position of the feed capillary; The ion source switching component controls the position of the feed capillary to disconnect the feed capillary from the preset first ion source inlet. Obtain the position of the first inlet of the first ion source and the position of the second inlet of the second ion source; The positions of the first and second feed inlets are analyzed to determine the capillary movement distance; The capillary travel distance and the preset capillary travel speed are analyzed to determine the capillary travel time. The ion source switching component controls the ion source to move the feed capillary to the preset second ion source inlet based on the capillary movement time, and obtains the trajectory offset. The ion source switching component controls the connection of the feed capillary to the feed port of the second ion source based on the trajectory offset.

3. The method for controlling the ion source of a mass spectrometer according to claim 2, characterized in that, The steps of controlling the ion source switching component to connect the feed capillary to the feed port of the second ion source based on the trajectory offset include: Determine whether the trajectory offset meets the preset requirements for normal trajectory offset; If the conditions are met, the ion source switching component will connect the feed capillary to the feed port of the second ion source. If the conditions are not met, the trajectory offset and capillary movement speed are analyzed to determine the error correction time. The trajectory offset is analyzed to determine the direction of capillary movement; The ion source switching component controls the position of the feed capillary based on the error correction time and the capillary movement orientation, and connects the feed capillary to the feed port of the second ion source.

4. The method for controlling the ion source of a mass spectrometer according to claim 1, characterized in that, The steps of controlling the ion source module merging component to merge the first and second ion sources based on the first and second ion source state data to obtain a merged receiving ion source, and determining the merged receiving ion source as the actual ion source, include: The status data of the first ion source is analyzed to determine the location of the first fault module and the number of fault modules in the first ion source. The status data of the second ion source is analyzed to determine the location of the second fault module and the number of fault modules in the second ion source. Determine whether the locations of the first faulty module and the second faulty module are the same; If they match, the first ion source to be repaired is determined based on the number of faulty modules in the first ion source and the number of faulty modules in the second ion source, and the first ion source to be repaired is then repaired. If there is a discrepancy, the merged receiving ion source is determined based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules. The ion source module merging component is then controlled to ensure that the merged receiving ion source performs ionization normally.

5. The method for controlling the ion source of a mass spectrometer according to claim 4, characterized in that, The steps for determining the merged receiving ion source based on the location of the first fault module, the number of first ion source fault modules, the location of the second fault module, and the number of second ion source fault modules, and controlling the ion source module merging assembly to ensure the merged receiving ion source performs normal ionization operation, include: Determine whether the number of faulty modules in the first ion source is greater than the number of faulty modules in the second ion source. If the value is greater than the value, the second ion source will be identified as the merged receiving ion source, and the location of the second faulty module will be identified as the location of the module to be replaced. If it is less than, then the first ion source is determined as the merged receiving ion source, and the location of the first faulty module is determined as the location of the module to be replaced; The ion source module merging component controls the ion source module to merge the first ion source and the second ion source according to the position of the module to be replaced, so as to obtain a merged receiving ion source.

6. The method for controlling the ion source of a mass spectrometer according to claim 5, characterized in that, The steps for controlling the ion source module merging component to merge the first and second ion sources to obtain a merged receiving ion source, based on the location of the module to be replaced, include: The module to be replaced is determined based on its location and the preset module location relationship, and the ion source module merging component is controlled to move the module to be replaced out. The combined receiving ion source is analyzed to determine the ion source supplied by the module; The location of the supply module is determined based on the location of the module to be replaced and the ion source supplied to the module. Analyze the locations of the modules to be replaced and the supply modules to determine the module movement distance; The module movement distance and preset module movement speed are analyzed to determine the module movement time; The supply module is determined based on its location and the relationship between the modules. The ion source module merging component is then controlled to move the supply module to the location of the module to be replaced based on the module movement time, so as to obtain the merged receiving ion source.

7. A mass spectrometer ion source control system, characterized in that, include: The acquisition module is used to acquire the first fault signal; A memory for storing a program for a mass spectrometer ion source control method as described in any one of claims 1 to 6; The processor and the program in the memory can be loaded and executed by the processor to implement the mass spectrometer ion source control method as described in any one of claims 1 to 6.

8. A smart terminal, characterized in that, It includes a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and executed as described in any one of claims 1 to 6 for controlling a mass spectrometer ion source.

9. A computer-readable storage medium, characterized in that, The device stores a computer program capable of being loaded by a processor and executed as described in any one of claims 1 to 6 for controlling a mass spectrometer ion source.

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