Amplitude-phase regulator debugging method and device, host computer and storage medium

Abstract

The application provides an amplitude-phase regulator debugging method and device, an upper computer and a storage medium, and belongs to the technical field of automatic control. The method comprises the following steps: issuing a zero calibration instruction to the amplitude-phase regulator; sequentially issuing a plurality of first set attenuation values to the amplitude-phase regulator, and drawing a first curve fluctuation graph of an attenuator in a to-be-tested frequency band based on a plurality of first actually-measured attenuation values returned by a test instrument; sequentially issuing a plurality of first set phase shift values to the amplitude-phase regulator, and drawing a second curve fluctuation graph of a phase shifter in the to-be-tested frequency band based on a plurality of first actually-measured phase shift values returned by the test instrument; selecting a curve fluctuation graph with a larger fluctuation degree value as a target curve graph, performing frequency band division based on the target curve graph, and obtaining a plurality of to-be-tested sub-frequency bands; and debugging the attenuator and the phase shifter in each to-be-tested sub-frequency band. The amplitude-phase regulator debugging method and device, the upper computer and the storage medium provided by the application can improve the debugging efficiency of the amplitude-phase regulator and reduce the debugging difficulty.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of automatic control, and more particularly relates to an amplitude-phase regulator debugging method and device, an upper computer, and a storage medium. BACKGROUND

[0002] An amplitude-phase regulator is an electronic or optical device for adjusting the amplitude (amplitude) and phase (time delay) of a signal, which is widely used in communication, radar, acoustics, optics and radio frequency systems. The core function of the amplitude-phase regulator is to accurately control the amplitude attenuation, amplitude amplification and phase delay of the input signal to meet the specific needs of the system for signal characteristics.

[0003] The amplitude-phase regulator needs to be debugged before leaving the factory, so that the actual amplitude curve and phase curve of the amplitude-phase regulator are consistent with the expected amplitude curve and phase curve. The amplitude-phase curve is different for different amplitude-phase regulators and frequencies. Currently, each amplitude-phase regulator needs to be manually debugged by a person during the debugging process, which is low in efficiency. In addition, the debugging process is long and tedious, and the debugger needs to have a certain foundation in electronics and mathematics and pay high attention, so the difficulty of debugging is also high.

[0004] Therefore, it is urgent to improve the existing phase regulator debugging method to improve the debugging efficiency and reduce the debugging difficulty. SUMMARY

[0005] The application aims to provide an amplitude-phase regulator debugging method and device, an upper computer and a storage medium to improve the debugging efficiency and reduce the debugging difficulty of the amplitude-phase regulator.

[0006] In a first aspect, an amplitude-phase regulator debugging method is provided. The amplitude-phase regulator includes an attenuator and a phase shifter, and is applied to an amplitude-phase regulator debugging system. The amplitude-phase regulator debugging system includes an upper computer and a test instrument. The upper computer is in communication connection with the amplitude-phase regulator, and is also in communication connection with the test instrument. The test instrument is used to detect the attenuation value of the attenuator and the phase shift value of the phase shifter. The method is executed by the upper computer, and includes the following steps.

[0007] A zero calibration instruction is issued to the amplitude-phase regulator, so that the attenuation value of the attenuator and the phase shift value of the phase shifter, and the output value of the test instrument are all zero. A frequency band to be tested is issued to the amplitude-phase regulator.

[0008] The amplitude-phase adjuster is sequentially issued with a plurality of first set attenuation values, and a first curve fluctuation graph of the attenuator in the to-be-tested frequency band is drawn based on a plurality of first measured attenuation values returned by the test instrument; the amplitude-phase adjuster is sequentially issued with a plurality of first set phase shift values, and a second curve fluctuation graph of the phase shifter in the to-be-tested frequency band is drawn based on a plurality of first measured phase shift values returned by the test instrument; the first measured attenuation value is a measured value of the attenuation value of the attenuator under the condition of the corresponding first set attenuation value, and the first measured phase shift value is a measured value of the phase shift value of the phase shifter under the condition of the corresponding first set phase shift value;

[0009] If the fluctuation degree value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation degree value of the second curve fluctuation graph is less than the first fluctuation threshold, a curve fluctuation graph with a larger fluctuation degree value is selected from the first curve fluctuation graph and the second curve fluctuation graph as a target curve graph, and the to-be-tested frequency band is divided into a plurality of to-be-tested sub-frequency bands based on the target curve graph;

[0010] In each to-be-tested sub-frequency band, the attenuator and the phase shifter are adjusted respectively.

[0011] In a second aspect, an amplitude-phase adjuster adjusting device is provided. The amplitude-phase adjuster includes an attenuator and a phase shifter. The device is arranged in an upper computer. The upper computer is arranged in an amplitude-phase adjuster adjusting system. The amplitude-phase adjuster adjusting system further includes a test instrument. The upper computer is in communication connection with the amplitude-phase adjuster. The upper computer is further in communication connection with the test instrument. The test instrument is used to detect an attenuation value of the attenuator and a phase shift value of the phase shifter. The device includes:

[0012] A to-be-tested frequency band issuing module is configured to issue a zero calibration instruction to the amplitude-phase adjuster, so that the attenuation value of the attenuator and the phase shift value of the phase shifter, and the output value of the test instrument are all zero, and issue a to-be-tested frequency band to the amplitude-phase adjuster.

[0013] A curve drawing module is configured to sequentially issue a plurality of first set attenuation values to the amplitude-phase adjuster, and draw a first curve fluctuation graph of the attenuator in the to-be-tested frequency band based on a plurality of first measured attenuation values returned by the test instrument; sequentially issue a plurality of first set phase shift values to the amplitude-phase adjuster, and draw a second curve fluctuation graph of the phase shifter in the to-be-tested frequency band based on a plurality of first measured phase shift values returned by the test instrument; the first measured attenuation value is a measured value of the attenuation value of the attenuator under the condition of the corresponding first set attenuation value, and the first measured phase shift value is a measured value of the phase shift value of the phase shifter under the condition of the corresponding first set phase shift value.

[0014] The frequency band division module is used to select the curve with a larger fluctuation value from the first curve fluctuation graph and the second curve fluctuation graph as the target curve graph if the fluctuation value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation value of the second curve fluctuation graph is less than the first fluctuation threshold. Based on the target curve graph, the frequency band to be tested is divided into multiple sub-frequency bands to be tested.

[0015] The segmented debugging module is used to debug the attenuator and phase shifter separately in each sub-band under test.

[0016] A third aspect of this application provides a host computer, including a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor executes the computer program to implement the steps of the amplitude-phase regulator debugging method described above.

[0017] A fourth aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the amplitude-phase regulator debugging method described above.

[0018] The beneficial effects of the amplitude and phase adjuster debugging method and device, host computer, and storage medium provided in this application embodiment are as follows:

[0019] This application embodiment automatically adjusts the amplitude and phase modulator based on a host computer and testing instruments, which reduces the difficulty of adjustment. Simultaneously, the host computer and testing instruments automatically plot the first fluctuation curve of the attenuator and the second fluctuation curve of the phase shifter in the test frequency band. The curve with the larger fluctuation value is selected from the first and second fluctuation curves, and based on this curve, the test frequency band is divided into multiple sub-frequency bands. The amplitude and phase characteristics within each sub-frequency band are relatively stable. Therefore, adjusting the attenuator and phase shifter separately within each sub-frequency band reduces the adjustment complexity, thereby improving adjustment accuracy and efficiency. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 A schematic diagram of an amplitude and phase adjuster debugging system provided in an embodiment of this application;

[0022] Figure 2 A schematic flowchart illustrating an embodiment of the amplitude and phase adjuster debugging method provided in this application;

[0023] Figure 3 A first curve fluctuation diagram of an attenuator provided in an embodiment of this application in the frequency band under test;

[0024] Figure 4 This is a second curve fluctuation diagram of a phase shifter in the frequency band under test provided in an embodiment of this application;

[0025] Figure 5 A schematic flowchart illustrating a method for adjusting an amplitude and phase modulator according to another embodiment of this application;

[0026] Figure 6 This is a functional test diagram of the attenuation value provided in an embodiment of this application;

[0027] Figure 7 This is a phase shift value function test diagram provided in an embodiment of this application;

[0028] Figure 8 This is a schematic diagram of the overall process of an amplitude and phase adjuster debugging system provided in an embodiment of this application;

[0029] Figure 9 This is a structural block diagram of an amplitude and phase adjuster debugging device provided in an embodiment of this application;

[0030] Figure 10 This is a schematic block diagram of a host computer provided in an embodiment of this application. Detailed Implementation

[0031] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0032] It is understood that in the embodiments of this application, data such as user information are involved. When the embodiments of this application are applied to specific products or technologies, user permission or consent is required, and the collection, use and processing of related data must comply with relevant laws, regulations and standards.

[0033] It should be noted that the terms "first," "second," etc., used in the specification, claims, and drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in sequences other than those illustrated or described herein.

[0034] Before providing a further detailed description of the embodiments of this application, the nouns and terms involved in the embodiments of this application will be explained, and the nouns and terms involved in the embodiments of this application shall be interpreted as follows.

[0035] To make the objectives, technical solutions, and advantages of this application clearer, the following description will be provided in conjunction with the accompanying drawings and specific embodiments.

[0036] Please refer to Figure 1 The amplitude and phase adjuster debugging system provided in this application embodiment includes a host computer 2 and a vector network analyzer 1 (test instrument). The host computer 2 includes a first visualization interface 7, a network port communication driver 8, a data storage device 9, and a serial port communication driver 10. The vector network analyzer 1 includes a second visualization interface 4, a data return driver 5, and a standard syntax and command set (hereinafter referred to as SCPI command) receiving and parsing driver 6 for programmable measuring instruments.

[0037] The amplitude-phase modulator 3 includes a serial communication driver 11, an attenuator 12, a phase shifter 13, and an attenuator 14. Attenuators 12 and 14 are two independent sets of attenuators using the same chip model. During debugging, the amplitude-phase modulator 3 is connected to the vector network analyzer 1, and the host computer 2 is connected to the vector network analyzer 1 via a network port. The host computer 2 is also connected to the amplitude-phase modulator 3 via serial communication.

[0038] Please refer to Figure 2 , Figure 2 This is a flowchart illustrating an embodiment of the amplitude and phase adjuster debugging method provided in this application. The amplitude and phase adjuster debugging method provided in this application embodiment can be executed by a host computer, and the method may include:

[0039] S101: Send a zeroing command to the amplitude and phase adjuster so that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero, and send the frequency band to be tested to the amplitude and phase adjuster.

[0040] In this embodiment, the testing instrument can be a vector network analyzer. Before debugging the amplitude and phase adjuster, a zeroing command can be issued to the amplitude and phase adjuster to set the attenuation value and phase shift value of the amplitude and phase adjuster to zero, and the zeroing process can be performed on the vector network analyzer.

[0041] Then, the host computer sends the frequency band to be measured to the amplitude and phase modulator, setting the operating frequency band of the amplitude and phase modulator to the frequency band to be measured.

[0042] S102: Sequentially send multiple first set attenuation values ​​to the amplitude-phase modulator, and plot the first curve fluctuation diagram of the attenuator in the frequency band to be tested based on the multiple first measured attenuation values ​​returned by the test instrument; sequentially send multiple first set phase shift values ​​to the amplitude-phase modulator, and plot the second curve fluctuation diagram of the phase shifter in the frequency band to be tested based on the multiple first measured phase shift values ​​returned by the test instrument; the first measured attenuation value is the measured value of the attenuation value of the attenuator under the corresponding first set attenuation value condition, and the first measured phase shift value is the measured value of the phase shift value of the phase shifter under the corresponding first set phase shift value condition.

[0043] In this embodiment, in order to improve the debugging accuracy and efficiency of the amplitude and phase modulator, frequency band testing can be performed on the amplitude and phase modulator.

[0044] Specifically, the attenuation value can be tested sequentially on the host computer. That is, the host computer sequentially sends multiple first set attenuation values ​​to the amplitude-phase modulator. Based on the multiple first measured attenuation values ​​returned by the testing instrument, a first curve fluctuation graph of the attenuator in the test frequency band is plotted. The horizontal axis of the first curve fluctuation graph is frequency, and the vertical axis is the first measured attenuation value. Figure 3 As shown; similarly, by sequentially testing the phase values ​​on the host computer, the second curve fluctuation graph of the phase shifter across the entire measured frequency band can be obtained. The horizontal axis of the second curve fluctuation graph is frequency, and the vertical axis is the first measured phase shift value, as shown. Figure 4 As shown.

[0045] S103: If the fluctuation value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation value of the second curve fluctuation graph is less than the first fluctuation threshold, select the curve fluctuation graph with the larger fluctuation value from the first curve fluctuation graph and the second curve fluctuation graph as the target curve graph, and divide the frequency band to be tested based on the target curve graph to obtain multiple sub-frequency bands to be tested.

[0046] In this embodiment, the standard deviation of the first curve fluctuation graph can be calculated as the fluctuation level value of the first curve fluctuation graph; similarly, the standard deviation of the second curve fluctuation graph can be calculated as the fluctuation level value of the second curve fluctuation graph.

[0047] If the fluctuation values ​​of the first and second curves are both greater than the first fluctuation threshold, it is determined that the factory commissioning of the amplitude and phase regulator has failed, and the factory commissioning of the amplitude and phase regulator is stopped.

[0048] If at least one of the first and second curve fluctuation graphs has a fluctuation value less than the first fluctuation threshold, then the curve fluctuation graph with the larger fluctuation value is selected as the target curve graph. Based on the target curve graph, the frequency band to be tested is divided into multiple sub-frequency bands to be tested.

[0049] For example, by comparison Figure 3 and Figure 4 It is known that the fluctuation value of the first curve is greater than that of the second curve. Therefore, the first curve is selected as the target curve, and the target is that "the fluctuation value of the curve within the tested sub-band is less than the second fluctuation threshold". The tested frequency band is then divided into multiple sub-bands to make the amplitude and phase within each sub-band more stable. Figure 3 and Figure 4 The frequency bands are 1, 2, ..., 6. The first fluctuation threshold and the second fluctuation threshold are both preset constants, and the first fluctuation threshold is greater than the second fluctuation threshold. Those skilled in the art can select specific values ​​for the first and second fluctuation thresholds according to actual needs.

[0050] In this embodiment, selecting a curve with a larger fluctuation value as the target curve ensures that after frequency band division based on the target curve, the amplitude and phase fluctuations within each sub-band to be tested are relatively small.

[0051] S104: Within each sub-band under test, adjust the attenuator and phase shifter respectively.

[0052] In this embodiment, the amplitude and phase of each sub-band under test are relatively stable. The attenuator and phase shifter are adjusted separately in each sub-band under test, which can reduce the adjustment complexity and thus improve the adjustment accuracy and efficiency.

[0053] As can be seen from the above, this embodiment, based on a host computer and testing instruments, automatically adjusts the amplitude and phase modulator, reducing the difficulty of adjustment. Simultaneously, the host computer and testing instruments automatically plot the first curve fluctuation diagram of the attenuator and the second curve fluctuation diagram of the phase shifter in the test frequency band. The curve with the larger fluctuation value is selected from the first and second curve fluctuation diagrams, and based on this curve fluctuation diagram, the test frequency band is divided into multiple sub-frequency bands. The amplitude and phase characteristics within each sub-frequency band are relatively stable; therefore, adjusting the attenuator and phase shifter separately within each sub-frequency band reduces the adjustment complexity, thereby improving adjustment accuracy and efficiency.

[0054] In one embodiment of this application, the attenuator and phase shifter are adjusted separately, including:

[0055] The errors of the attenuator itself and the phase shifter itself are calibrated separately.

[0056] The data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator were corrected respectively.

[0057] In this embodiment, because both the attenuator and phase shifter in the amplitude and phase modulator have their own errors, and they are integrated in the same RF circuit, RF signal leakage causes the two chips to affect each other, resulting in a geometric increase in the error. Additionally, manufacturing issues lead to errors in different modules. Therefore, this embodiment performs individual and joint calibrations on the amplitude and phase modulator sequentially within each sub-frequency band under test to improve the calibration accuracy of the amplitude and phase modulator.

[0058] In one embodiment of this application, the errors of the attenuator itself and the phase shifter itself are corrected, including:

[0059] Perform individual calibrations at multiple stages to calibrate the errors of the attenuator itself and the phase shifter itself; the individual calibrations at multiple stages include: individual calibration of the first stage, individual calibration of the second stage, individual calibration of the third stage and individual calibration of the fourth stage.

[0060] In the first stage of separate calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured attenuation values ​​are received from the test instrument; the first difference between each first set attenuation value and the corresponding first measured attenuation value is calculated to obtain the first difference corresponding to each of the multiple first set attenuation values; and the multiple first differences are sent to the amplitude-phase adjuster.

[0061] In the second stage of separate calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured phase shift values ​​are received from the testing instrument; a second difference between each first set phase shift value and the corresponding first measured phase shift value is calculated to obtain the second difference corresponding to each of the multiple first set phase shift values; and the multiple second differences are sent to the amplitude-phase adjuster.

[0062] In the third stage of individual calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured attenuation values ​​are received from the test instrument, each second measured attenuation value is obtained after calibrating the attenuator based on the corresponding first difference; a third difference between each first set attenuation value and the corresponding second measured attenuation value is calculated; if multiple third differences are all within the preset first error range, it is determined that the error calibration of the attenuator itself is completed.

[0063] In the fourth stage of individual calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured phase shift values ​​are received from the testing instrument, each second measured phase shift value is obtained after calibrating the phase shifter based on the corresponding second difference; a fourth difference between each first set phase shift value and the corresponding second measured phase shift value is calculated; if multiple fourth differences are all within the preset second error range, it is determined that the error calibration of the phase shifter itself is complete.

[0064] Before each individual calibration step, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0065] In this embodiment, in the first stage of separate calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing processing on the vector network analyzer.

[0066] Then, the host computer sends multiple first-set attenuation values ​​to the amplitude-phase modulator. Attenuator testing is performed on the host computer, which has a test button on its first visual interface. After the user clicks the test button, the host computer sequentially sends the multiple first-set attenuation values ​​to the attenuator of the amplitude-phase modulator, reads the Log Mag value from the vector network analyzer (corresponding to the multiple first-measured attenuation values), and stores it in the host computer's data memory. Through the above process, an uncalibrated attenuator actual test table can be obtained, as shown in Table 1 below. In Table 1, the set values ​​are the aforementioned first-set attenuation values, and the actual values ​​are the aforementioned first-measured attenuation values.

[0067] Table 1 - Actual Test Table of Uncalibrated Attenuators

[0068]

[0069] In this embodiment, the error table of the attenuator can be calculated using the formula error_data = expected_data - real_data, as shown in Table 2 below. Here, expected_data is the control setting data (specifically, the first set attenuation value), real_data is the actual measured data (specifically, the first measured attenuation value), and error_data is the calculated error (specifically, the first difference). The error values ​​in the error table are then embedded into the control circuit of the amplitude-phase modulator for subsequent data calibration.

[0070] Table 2 - Error Table of Attenuators

[0071]

[0072] Similarly, in the second stage of separate calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0073] Then, the host computer sends multiple first preset phase shift values ​​to the amplitude and phase adjuster. Phase shifter tests are performed on the host computer, which has a test button on its first visual interface. After the user clicks the test button, the host computer sequentially sends the multiple first preset phase shift values ​​to the phase shifter of the amplitude and phase adjuster, reads the Phase values ​​from the vector network analyzer (corresponding to multiple first measured phase shift values), and stores them in the host computer's data memory. Through the above process, an uncalibrated actual test table of the phase shifter can be obtained, as shown in Table 3 below. In Table 3, the preset values ​​are the aforementioned first preset phase shift values, and the actual values ​​are the aforementioned first measured phase shift values.

[0074] Table 3 - Actual Test Table for Uncalibrated Phase Shifters

[0075]

[0076] Furthermore, the error table of the phase shifter can be calculated using the formula error_data = expected_data - real_data, as shown in Table 4 below. Here, expected_data is the control setting data (specifically, the first set phase shift value), real_data is the actual measured data (specifically, the first measured phase shift value), and error_data is the calculated error (specifically, the second difference). The error values ​​in the error table are then embedded into the control circuit of the amplitude-phase regulator for subsequent data calibration.

[0077] Table 4 - Error Table of Phase Shifter

[0078]

[0079] In the third stage of separate calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0080] Then, the host computer sequentially sends multiple first-set attenuation values ​​to the amplitude-phase modulator; it receives multiple second-measured attenuation values ​​returned by the testing instrument. Each second-measured attenuation value is obtained after calibrating the attenuator based on the corresponding first difference; a third difference is calculated between each first-set attenuation value and the corresponding second-measured attenuation value. Multiple third differences form an error table after the attenuator's self-calibration, as shown in Table 5 below. If multiple third differences are all within the preset first error range, it is determined that the attenuator's own error calibration is complete. Otherwise, it is necessary to adjust the first error fixed in the control circuit of the amplitude-phase modulator and re-execute the individual calibration of the third step. If multiple calibrations (e.g., 5 times) fail, it is determined that the amplitude-phase modulator's factory debugging has failed, and the factory debugging of the amplitude-phase modulator is stopped.

[0081] In the fourth stage of separate calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0082] Then, the host computer sequentially sends multiple first preset phase shift values ​​to the amplitude-phase modulator; it receives multiple second measured phase shift values ​​returned by the testing instrument, each second measured phase shift value being obtained after calibrating the phase shifter based on the corresponding second difference; it calculates a fourth difference between each first preset phase shift value and the corresponding second measured phase shift value, and multiple fourth differences form an error table after the phase shifter's self-calibration, as shown in Table 6 below. If multiple fourth differences are all within the preset second error range, it is determined that the phase shifter's own error calibration is complete. Otherwise, it is necessary to adjust the second error fixed in the control circuit of the amplitude-phase modulator and re-execute the individual calibration of the fourth step. If multiple calibrations fail, it is determined that the amplitude-phase modulator's factory debugging has failed, and the factory debugging of the amplitude-phase modulator is stopped. The first and second error ranges are both preset constants, and those skilled in the art can determine the specific values ​​of the first and second error ranges based on the model of the amplitude-phase modulator. For example, the first error range can be ±2dB, and the second error range can be ±22°.

[0083] Table 5 - Corrected Attenuator Error Table

[0084]

[0085] Table 6 - Corrected Phase Shifter Error Table

[0086]

[0087] In one embodiment of this application, the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator are corrected, including:

[0088] Perform joint calibration of multiple stages to calibrate the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator, respectively; the joint calibration of multiple stages includes: joint calibration of the first stage, joint calibration of the second stage, joint calibration of the third stage and joint calibration of the fourth stage.

[0089] In the first stage of joint calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured phase shift values ​​are received from the test instrument; the multiple third measured phase shift values ​​are used as first initial influence data; the third measured phase shift value is the measured value of the phase shifter under the corresponding first set attenuation value; and the first initial influence data is sent to the amplitude-phase adjuster.

[0090] In the second stage of joint calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured attenuation values ​​are received from the test instrument; the multiple third measured attenuation values ​​are used as second initial influence data; the third measured attenuation value is the measured value of the attenuation value of the attenuator under the corresponding first set phase shift value; and the second initial influence data is sent to the amplitude-phase adjuster.

[0091] In the third stage of joint calibration, multiple second set attenuation values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set attenuation value condition, the data calibration of the phase shifter is performed. If the data calibration of the phase shifter passes multiple times, it is determined that the data calibration of the attenuator's influence on the phase shifter is completed. The multiple second set attenuation values ​​are subsets of the multiple first set attenuation values.

[0092] The data calibration process of the phase shifter includes: sequentially sending multiple first set phase shift values ​​to the amplitude and phase adjuster; receiving multiple fourth measured phase shift values ​​returned by the testing instrument, each fourth measured phase shift value being obtained after calibrating the phase shifter based on the corresponding second difference and first influence data; calculating a fifth difference between each first set phase shift value and the corresponding fourth measured phase shift value; and determining that the data calibration of the phase shifter is successful if multiple fifth differences are all within a preset third error range.

[0093] In the fourth stage of joint calibration, multiple second set phase shift values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set phase shift value condition, the attenuator data calibration is performed. If the attenuator data calibration passes multiple times, it is determined that the data calibration of the effect of the phase shifter on the attenuator is completed. The multiple second set phase shift values ​​are subsets of the multiple first set phase shift values.

[0094] The attenuator data calibration process includes: sequentially sending multiple first set attenuation values ​​to the amplitude-phase modulator; receiving multiple fourth measured attenuation values ​​returned by the test instrument, each fourth measured attenuation value being obtained after calibrating the attenuator based on the corresponding first difference and second influence data; calculating the sixth difference between each first set attenuation value and the corresponding fourth measured attenuation value; if multiple sixth differences are all within the preset fourth error range, then the attenuator data calibration is deemed successful.

[0095] Before the joint calibration of each stage, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0096] In this embodiment, in the first stage of joint calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing processing on the vector network analyzer.

[0097] Then, the host computer sends out multiple first set attenuation values, reads back the value of the phase shifter from the test instrument (corresponding to the third measured phase shift value), and stores it in the host computer's data memory to obtain a data table of the attenuator's influence on the phase shifter. This data table is then fixed into the control circuit of the amplitude and phase adjuster for subsequent data calibration.

[0098] Similarly, in the second stage of joint calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0099] Then, the host computer sends out multiple first set phase shift values, reads back the value of the attenuator (corresponding to the third measured attenuation value) from the test instrument, and stores it in the data memory of the host computer to obtain a data table of the effect of the phase shifter on the attenuator. This data table is then fixed into the control circuit of the amplitude and phase adjuster for subsequent data correction.

[0100] In the third stage of joint calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0101] In this embodiment, considering the large range of values ​​set for the attenuator and phase shifter, in order to shorten the verification time, the attenuator can be divided into four levels: 10dBm, 20dBm, 30dBm, and 40dBm. Then, the error of the phase shifter is verified in each of the four levels.

[0102] Specifically, the host computer sequentially sends multiple second-set attenuation values ​​(attenuation values ​​at four levels: 10dBm, 20dBm, 30dBm, and 40dBm) to the amplitude-phase modulator. Under each second-set attenuation value condition, the phase shifter's data is calibrated. If the phase shifter's data calibration passes multiple times, the calibration of the attenuator's influence on the phase shifter is considered complete. Otherwise, the second error or first influence data embedded in the amplitude-phase modulator's control circuit needs to be adjusted, and the third-stage joint calibration is re-executed. If multiple calibrations (e.g., 5 times) fail, the amplitude-phase modulator's factory commissioning is considered to have failed, and the factory commissioning of the amplitude-phase modulator is stopped.

[0103] In the fourth stage of joint calibration, the host computer first sends a zeroing command to the amplitude and phase adjuster, setting both the attenuation value and the phase shift value of the amplitude and phase adjuster to zero, and then performs zeroing on the vector network analyzer.

[0104] Then, the host computer sequentially sends multiple second-set phase shift values ​​(e.g., four levels of phase shift values: 45°, 90°, 135°, and 180°) to the amplitude-phase modulator. Under each second-set phase shift value, the attenuator data is calibrated. If the attenuator data calibration passes multiple times, the calibration of the phase shifter's influence on the attenuator is considered complete. Otherwise, the first error or second influence data embedded in the control circuit of the amplitude-phase modulator needs to be adjusted, and the joint calibration of the fourth step needs to be re-executed. If multiple calibrations (e.g., 5 times) fail, the factory calibration of the amplitude-phase modulator is considered to have failed, and the factory calibration of the amplitude-phase modulator is stopped.

[0105] In one embodiment of this application, the target curve is used to characterize the mapping relationship between frequency and curve value, where the curve value is an attenuation value or a phase shift value;

[0106] Based on the target curve, the frequency band to be tested is divided into multiple sub-bands to be tested, including:

[0107] The frequency band to be tested is divided into multiple frequency segments of equal length;

[0108] Calculate the average curve value of the target curve within each frequency segment;

[0109] The frequency segmentation and combination operation is performed multiple times until all frequency segments are traversed, resulting in multiple sub-frequency bands to be tested.

[0110] The i-th frequency segmentation combination operation includes:

[0111] Calculate the change between the average curve value within the (i+1)th frequency segment and the average curve value within the ith frequency segment; where i is a natural number.

[0112] If the change is less than or equal to the preset change threshold, the (i+1)th frequency segment and the sub-frequency segment to be tested containing the ith frequency segment are combined into the same sub-frequency segment to be tested. The sub-frequency segment to be tested containing the ith frequency segment is either the ith frequency segment or the sub-frequency segment to be tested obtained by combining the ith frequency segment with other frequency segments.

[0113] If the change is greater than the preset change threshold, the (i+1)th frequency segment will be assigned to a new sub-frequency band to be tested.

[0114] In this embodiment, when dividing the frequency band to be tested based on the target curve, the frequency band to be tested can be divided into multiple frequency segments of equal length first, and then the average value of the curve value in each frequency segment can be calculated to obtain the average curve value of the target curve in each frequency segment.

[0115] Based on this, the change between the average curve value in the first frequency segment and the average curve value in the second frequency segment is calculated. If the change is less than or equal to a preset change threshold, the first and second frequency segments are combined into the same sub-frequency band to be tested; if the change is greater than the preset change threshold, the first and second frequency segments are treated as two separate sub-frequency bands to be tested. The change threshold is a preset constant; for example, when the curve value is an attenuation value, the change threshold can be ±4dB, and when the curve value is a phase shift value, the change threshold can be ±45°.

[0116] Next, the change between the average curve value in the second frequency segment and the average curve value in the third frequency segment is calculated. If the change is less than or equal to the preset change threshold, the third frequency segment is merged into the sub-frequency band to be tested where the second frequency segment is located. If the change is greater than the preset change threshold, the third frequency segment is taken as a new sub-frequency band to be tested.

[0117] Specifically, when the first and second frequency segments are the same sub-band under test, the sub-band under test containing the second frequency segment is the sub-band under test obtained by combining the first and second frequency segments. In this case, merging the third frequency segment into the sub-band under test containing the second frequency segment can be understood as merging the third frequency segment into the sub-band under test obtained by combining the first and second frequency segments. When the first and second frequency segments are not the same sub-band under test, the sub-band under test containing the second frequency segment is a single second frequency segment. In this case, merging the third frequency segment into the sub-band under test containing the second frequency segment can be understood as combining the third frequency segment and the second frequency segment to form the sub-band under test containing the third frequency segment.

[0118] By traversing all frequency segments in the same way, the frequency band to be tested can be divided into multiple sub-frequency bands to be tested.

[0119] As can be seen from the above, this embodiment divides the frequency band to be tested into multiple frequency segments of equal length and calculates the change in the average curve value of the target curve between adjacent frequency segments. Frequency segments with a change value less than the change value threshold are merged into the same sub-frequency band to be tested. This can ensure that the curve value (attenuation value or phase shift value) in each sub-frequency band to be tested is more stable, thereby improving the debugging accuracy and debugging efficiency in each sub-frequency band to be tested.

[0120] In one embodiment of this application, the order of joint calibration of the third and fourth stages is determined based on the model of the amplitude and phase adjuster.

[0121] In this embodiment, different models of amplitude and phase modulators have different connection sequences and layouts of their internal attenuators and phase shifters in the circuit. Therefore, the degree of influence of the attenuator on the phase shifter and the degree of influence of the phase shifter on the attenuator vary. If, in a certain model of amplitude and phase modulator, the influence of the attenuator on the phase shifter is greater than the influence of the phase shifter on the attenuator, the joint calibration of the third stage can be performed first, followed by the joint calibration of the fourth stage. Conversely, if the influence of the phase shifter on the attenuator is greater than the influence of the attenuator on the phase shifter, the joint calibration of the fourth stage can be performed first, followed by the joint calibration of the third stage.

[0122] As can be seen from the above, this embodiment prioritizes processing the stronger coupling relationships, which can reduce coupling interference and thus improve the debugging accuracy of the amplitude and phase modulator.

[0123] In one embodiment of this application, before issuing a zeroing command to the amplitude-phase adjuster, the amplitude-phase adjuster debugging method further includes: performing a first functional test and a second functional test.

[0124] In the first stage of functional testing, multiple first set attenuation values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured attenuation values ​​are received from the test instrument; the seventh difference between each first set attenuation value and the corresponding fifth measured attenuation value is calculated.

[0125] In the second stage of functional testing, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured phase shift values ​​are received from the testing instrument; the eighth difference between each first set phase shift value and the corresponding fifth measured phase shift value is calculated.

[0126] If multiple seventh differences are all within the preset fifth error range, and multiple eighth differences are all within the preset sixth error range, then the functional test of the amplitude-phase adjuster is considered complete.

[0127] Before each functional test, a zeroing command is sent to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0128] Please refer to Figure 5 In this embodiment, the amplitude and phase modulator has two debugging modes (corresponding to two control modes). The first control mode is normal data setting, and the second control mode directly controls the attenuator and phase shifter by controlling the designated pins of the chip through the switching positions. Before performing frequency band debugging of the amplitude and phase modulator, the switching position function of the amplitude and phase modulator needs to be tested first.

[0129] Specifically, the first set attenuation value or the first set phase shift value can be set according to the level of the switch position. For example, if the step value of a certain switch position of the attenuator is 1dB, the first set attenuation value can be set to 1dB, 2dB, 3dB, etc.

[0130] During the functional test of the switching position, the attenuation and phase values ​​are first set to zero, and the testing instrument is calibrated to zero. Then, multiple first-set attenuation values ​​are sequentially sent to the amplitude-phase modulator, and multiple fifth-measured attenuation values ​​are received from the testing instrument. The seventh difference between each first-set attenuation value and the corresponding fifth-measured attenuation value is calculated. The variation curves of the multiple first-set attenuation values ​​and the variation curves of the multiple fifth-measured attenuation values ​​are shown below. Figure 6 As shown.

[0131] Similarly, a zeroing command is sent to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the testing instrument are all zero. Then, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured phase shift values ​​are received from the testing instrument. The eighth difference between each first set phase shift value and the corresponding fifth measured phase shift value is calculated. The variation curves of the multiple first set phase shift values ​​and the variation curves of the multiple fifth measured phase shift values ​​are shown below. Figure 7 As shown.

[0132] If all the aforementioned seventh differences are within the preset fifth error range, and all the aforementioned eighth differences are within the preset sixth error range, then the functional test of the amplitude-phase modulator is considered complete. Otherwise, it indicates that the corresponding gear is connected in series with other gears, and the functional test has failed. The fifth and sixth error ranges are preset constants. Those skilled in the art can determine the specific value of the fifth error range based on the specific model of the amplitude-phase modulator. For example, if the step value of a certain switching gear of the attenuator is 1dB, the corresponding fifth error range is twice the step value, i.e., within ±2dB.

[0133] In addition, before determining whether multiple seventh differences are within the preset fifth error range, it is also necessary to determine whether the fifth measured attenuation value and the fifth measured phase shift value fall into the following situations:

[0134] As multiple first-set attenuation values ​​were successively issued, the fifth measured attenuation value did not change accordingly; similarly, as multiple first-set phase shift values ​​were successively issued, the fifth measured phase shift value did not change accordingly. In other words, after the set values ​​changed, the actual measured values ​​remained unchanged, indicating that the corresponding gear could not be set.

[0135] If none of the above conditions apply, continue with the functional testing of the amplitude and phase adjuster.

[0136] Please refer to Figure 8 , Figure 8 This is a schematic diagram of the overall process of the amplitude and phase adjuster debugging system provided in an embodiment of this application. In this embodiment, the debugging instructions are issued and the debugging results are read back and stored by the host computer controlled by the human operator, which replaces the human operator to operate the instrument and read back and record the test results, thereby improving the debugging efficiency. At the same time, considering the influence relationship between the attenuator and the phase shifter in the amplitude and phase adjuster, this embodiment designs a debugging method and a data correction method, which can reduce the debugging time, improve the debugging efficiency and improve the debugging accuracy.

[0137] Based on the same inventive concept, this application also provides an amplitude and phase adjuster debugging device for implementing the amplitude and phase adjuster debugging method described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more amplitude and phase adjuster debugging device embodiments provided below can be found in the limitations of the amplitude and phase adjuster debugging method above, and will not be repeated here.

[0138] This application provides an amplitude and phase adjuster debugging device, which is installed in a host computer, which is also installed in an amplitude and phase adjuster debugging system. The amplitude and phase adjuster debugging system further includes a testing instrument. The host computer is communicatively connected to the amplitude and phase adjuster and also to the testing instrument. The testing instrument is used to detect the attenuation value of the attenuator and the phase shift value of the phase shifter. Figure 9 As shown, the amplitude and phase adjuster debugging device 20 includes: a frequency band distribution module 21, a curve drawing module 22, a frequency band division module 23, and a segmented debugging module 24.

[0139] Among them, the frequency band to be tested transmission module 21 is used to send a zeroing command to the amplitude and phase adjuster so that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero, and to send the frequency band to be tested to the amplitude and phase adjuster.

[0140] The curve plotting module 22 is used to sequentially send multiple first set attenuation values ​​to the amplitude-phase modulator, and plot a first curve fluctuation diagram of the attenuator in the frequency band to be tested based on multiple first measured attenuation values ​​returned by the test instrument; and sequentially send multiple first set phase shift values ​​to the amplitude-phase modulator, and plot a second curve fluctuation diagram of the phase shifter in the frequency band to be tested based on multiple first measured phase shift values ​​returned by the test instrument; the first measured attenuation value is the measured value of the attenuator under the corresponding first set attenuation value condition, and the first measured phase shift value is the measured value of the phase shifter under the corresponding first set phase shift value condition;

[0141] The frequency band division module 23 is used to select the curve with a larger fluctuation value from the first curve fluctuation graph and the second curve fluctuation graph as the target curve graph if the fluctuation value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation value of the second curve fluctuation graph is less than the first threshold. Based on the target curve graph, the frequency band to be tested is divided into multiple sub-frequency bands to be tested.

[0142] The segmented debugging module 24 is used to debug the attenuator and phase shifter separately in each sub-band under test.

[0143] In one embodiment of this application, the segmented debugging module 24 is specifically used for:

[0144] The errors of the attenuator itself and the phase shifter itself are calibrated separately.

[0145] The data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator were corrected respectively.

[0146] In one embodiment of this application, the segmented debugging module 24 is further configured to:

[0147] Perform individual calibrations at multiple stages to calibrate the errors of the attenuator itself and the phase shifter itself; the individual calibrations at multiple stages include: individual calibration of the first stage, individual calibration of the second stage, individual calibration of the third stage and individual calibration of the fourth stage.

[0148] In the first stage of separate calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured attenuation values ​​are received from the test instrument; the first difference between each first set attenuation value and the corresponding first measured attenuation value is calculated to obtain the first difference corresponding to each of the multiple first set attenuation values; and the multiple first differences are sent to the amplitude-phase adjuster.

[0149] In the second stage of separate calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured phase shift values ​​are received from the testing instrument; a second difference between each first set phase shift value and the corresponding first measured phase shift value is calculated to obtain the second difference corresponding to each of the multiple first set phase shift values; and the multiple second differences are sent to the amplitude-phase adjuster.

[0150] In the third stage of individual calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured attenuation values ​​are received from the test instrument, each second measured attenuation value is obtained after calibrating the attenuator based on the corresponding first difference; a third difference between each first set attenuation value and the corresponding second measured attenuation value is calculated; if multiple third differences are all within the preset first error range, it is determined that the error calibration of the attenuator itself is completed.

[0151] In the fourth stage of individual calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured phase shift values ​​are received from the testing instrument, each second measured phase shift value is obtained after calibrating the phase shifter based on the corresponding second difference; a fourth difference between each first set phase shift value and the corresponding second measured phase shift value is calculated; if multiple fourth differences are all within the preset second error range, it is determined that the error calibration of the phase shifter itself is complete.

[0152] Before each individual calibration step, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0153] In one embodiment of this application, the segmented debugging module 24 is further configured to:

[0154] Perform joint calibration of multiple stages to calibrate the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator, respectively; the joint calibration of multiple stages includes: joint calibration of the first stage, joint calibration of the second stage, joint calibration of the third stage and joint calibration of the fourth stage.

[0155] In the first stage of joint calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured phase shift values ​​are received from the test instrument; the multiple third measured phase shift values ​​are used as first initial influence data; the third measured phase shift value is the measured value of the phase shifter under the corresponding first set attenuation value; and the first initial influence data is sent to the amplitude-phase adjuster.

[0156] In the second stage of joint calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured attenuation values ​​are received from the test instrument; the multiple third measured attenuation values ​​are used as second initial influence data; the third measured attenuation value is the measured value of the attenuation value of the attenuator under the corresponding first set phase shift value; the first initial influence data is sent to the amplitude-phase adjuster.

[0157] In the third stage of joint calibration, multiple second set attenuation values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set attenuation value, the fourth stage of individual calibration is performed. If the results of multiple fourth stage individual calibrations all indicate that the error calibration of the phase shifter itself is completed, then it is determined that the data calibration of the attenuator's influence on the phase shifter is completed. Among them, the multiple second set attenuation values ​​are subsets of multiple first set attenuation values.

[0158] In the fourth stage of joint calibration, multiple second set phase shift values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set phase shift value, the third stage of individual calibration is performed. If the results of multiple third stage individual calibrations all indicate that the error calibration of the attenuator itself is completed, then it is determined that the data calibration of the effect of the phase shifter on the attenuator is completed. Among them, the multiple second set phase shift values ​​are subsets of the multiple first set phase shift values.

[0159] Before the joint calibration of each step, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0160] In one embodiment of this application, the segmented debugging module 24 is further configured to:

[0161] Based on the model of the amplitude and phase adjuster, determine the order of joint calibration in the third and fourth stages.

[0162] In one embodiment of this application, the target curve is used to characterize the mapping relationship between frequency and curve value, where the curve value is an attenuation value or a phase shift value; the frequency band division module 23 is specifically used for:

[0163] The frequency band to be tested is divided into multiple frequency segments of equal length;

[0164] Calculate the average curve value of the target curve within each frequency segment;

[0165] The frequency segmentation and combination operation is performed multiple times until all frequency segments are traversed, resulting in multiple sub-frequency bands to be tested.

[0166] The i-th frequency segmentation combination operation includes:

[0167] Calculate the change between the average curve value in the i-th frequency segment and the average curve value in the (i+1)-th frequency segment; i is a natural number.

[0168] If the change is less than or equal to the preset change threshold, the (i+1)th frequency segment and the sub-frequency segment to be tested containing the ith frequency segment are combined into the same sub-frequency segment to be tested. The sub-frequency segment to be tested containing the ith frequency segment is either the ith frequency segment or the sub-frequency segment to be tested obtained by combining the ith frequency segment with other frequency segments.

[0169] If the change is greater than the preset change threshold, the (i+1)th frequency segment will be assigned to a new sub-frequency band to be tested.

[0170] In one embodiment of this application, before issuing a zeroing command to the amplitude and phase adjuster, the frequency band to be measured transmission module 21 is specifically used for:

[0171] Perform the first and second phases of functional testing;

[0172] In the first stage of functional testing, multiple first set attenuation values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured attenuation values ​​are received from the test instrument; the seventh difference between each first set attenuation value and the corresponding fifth measured attenuation value is calculated.

[0173] In the second stage of functional testing, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured phase shift values ​​are received from the testing instrument; the eighth difference between each first set phase shift value and the corresponding fifth measured phase shift value is calculated.

[0174] If multiple seventh differences are all within the preset fifth error range, and multiple eighth differences are all within the preset sixth error range, then the functional test of the amplitude-phase adjuster is considered complete.

[0175] Before each functional test, a zeroing command is sent to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

[0176] See Figure 10 , Figure 10 This is a schematic block diagram of a host computer provided in one embodiment of this application. Figure 10The host computer 300 in this embodiment may include one or more processors 301, one or more input devices 302, one or more output devices 303, and one or more memories 304. The processors 301, input devices 302, output devices 303, and memories 304 communicate with each other via a communication bus 305. The memories 304 store computer programs, including program instructions. The processors 301 execute the program instructions stored in the memories 304. Specifically, the processors 301 are configured to invoke the program instructions to perform the functions of each module / unit in the above-described device embodiments, for example... Figure 9 The functions of the frequency band distribution module 21, curve plotting module 22, frequency band division module 23, and segmented debugging module 23 are shown.

[0177] It should be understood that, in the embodiments of this application, the processor 301 may be a central processing unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor.

[0178] Input device 302 may include a touchpad, a fingerprint sensor (for collecting the user's fingerprint information and fingerprint orientation information), a microphone, etc., and output device 303 may include a display (LCD, etc.), a speaker, etc.

[0179] The memory 304 may include read-only memory and random access memory, and provides instructions and data to the processor 301. A portion of the memory 304 may also include non-volatile random access memory. For example, the memory 304 may also store preset constants such as a first fluctuation threshold, a second fluctuation threshold, and a change threshold.

[0180] In specific implementations, the processor 301, input device 302, and output device 303 described in the embodiments of this application can execute the implementation method described in the amplitude and phase adjuster debugging method provided in the embodiments of this application, or they can execute the implementation method of the host computer described in the embodiments of this application, which will not be repeated here.

[0181] In another embodiment of this application, a computer-readable storage medium is provided. This computer-readable storage medium stores a computer program, which includes program instructions. When executed by a processor, the program instructions implement all or part of the processes in the methods described above. Alternatively, the computer program can instruct related hardware to complete the process. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include any entity or device capable of carrying computer program code, a recording medium, a USB flash drive, a portable hard drive, a magnetic disk, an optical disk, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium, etc.

[0182] The computer-readable storage medium can be an internal storage unit of the host computer in any of the foregoing embodiments, such as the host computer's hard disk or memory. The computer-readable storage medium can also be an external storage device of the host computer, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the host computer. Furthermore, the computer-readable storage medium can include both internal storage units and external storage devices of the host computer. The computer-readable storage medium is used to store computer programs and other programs and data required by the host computer. The computer-readable storage medium can also be used to temporarily store data that has been output or will be output.

[0183] Those skilled in the art will recognize that the modules / units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this application.

[0184] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the host computer and unit described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0185] In the several embodiments provided in this application, it should be understood that the disclosed host computer and method can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For instance, the division of modules / units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules, units, or components may be combined or integrated into another system, or some features may be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be indirect coupling or communication connection through some interfaces or modules / units, or it may be an electrical, mechanical, or other form of connection.

[0186] The modules / units described as separate components may or may not be physically separate. Similarly, the components shown as modules / units may or may not be physical modules / units; they may be located in one place or distributed across multiple network modules / units. Some or all of the modules / units can be selected to achieve the purpose of the embodiments of this application, depending on actual needs.

[0187] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated modules / units described above can be implemented in hardware or in the form of software functional modules / units.

[0188] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for adjusting an amplitude-phase modulator, wherein the amplitude-phase modulator includes an attenuator and a phase shifter, characterized in that, An amplitude and phase adjuster debugging system is applied, the amplitude and phase adjuster debugging system includes a host computer and a testing instrument, the host computer is communicatively connected to the amplitude and phase adjuster, the host computer is also communicatively connected to the testing instrument, and the testing instrument is used to detect the attenuation value of the attenuator and the phase shift value of the phase shifter; The method is executed by the host computer, and the method includes: A zeroing command is sent to the amplitude-phase modulator to make the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument all zero, and the frequency band to be measured is sent to the amplitude-phase modulator. Multiple first preset attenuation values ​​are sequentially sent to the amplitude-phase modulator, and a first curve fluctuation diagram of the attenuator in the frequency band under test is plotted based on multiple first measured attenuation values ​​returned by the testing instrument; multiple first preset phase shift values ​​are sequentially sent to the amplitude-phase modulator, and a second curve fluctuation diagram of the phase shifter in the frequency band under test is plotted based on multiple first measured phase shift values ​​returned by the testing instrument; the first measured attenuation value is the measured value of the attenuator's attenuation value under the corresponding first preset attenuation value condition, and the first measured phase shift value is the measured value of the phase shifter's phase shift value under the corresponding first preset phase shift value condition; If the fluctuation value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation value of the second curve fluctuation graph is less than the first fluctuation threshold, the curve fluctuation graph with the larger fluctuation value is selected from the first curve fluctuation graph and the second curve fluctuation graph as the target curve graph. Based on the target curve graph, the frequency band to be tested is divided into multiple sub-frequency bands to be tested. Within each sub-frequency band under test, the errors of the attenuator itself and the phase shifter itself are corrected; the data on the influence of the attenuator on the phase shifter and the data on the influence of the phase shifter on the attenuator are also corrected.

2. The amplitude and phase adjuster debugging method as described in claim 1, characterized in that, The errors of the attenuator itself and the phase shifter itself are corrected respectively, including: Perform individual calibrations of multiple stages to calibrate the errors of the attenuator itself and the phase shifter itself; the individual calibrations of multiple stages include: individual calibration of the first stage, individual calibration of the second stage, individual calibration of the third stage and individual calibration of the fourth stage. In the first stage of separate calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured attenuation values ​​are received from the testing instrument; a first difference between each first set attenuation value and the corresponding first measured attenuation value is calculated to obtain the first difference corresponding to each of the multiple first set attenuation values; and the multiple first differences are sent to the amplitude-phase adjuster. In the second stage of separate calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple first measured phase shift values ​​are received from the testing instrument; a second difference between each first set phase shift value and the corresponding first measured phase shift value is calculated to obtain the second difference corresponding to each of the multiple first set phase shift values; and the multiple second differences are sent to the amplitude-phase adjuster. In the third stage of individual calibration, multiple first preset attenuation values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured attenuation values ​​are received from the testing instrument, each second measured attenuation value being obtained after calibrating the attenuator based on the corresponding first difference; a third difference between each first preset attenuation value and the corresponding second measured attenuation value is calculated; if multiple third differences are all within a preset first error range, it is determined that the error calibration of the attenuator itself is complete. In the fourth stage of individual calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster; multiple second measured phase shift values ​​returned by the testing instrument are received, each second measured phase shift value is obtained after calibrating the phase shifter based on the corresponding second difference; a fourth difference between each first set phase shift value and the corresponding second measured phase shift value is calculated; if multiple fourth differences are all within a preset second error range, it is determined that the error calibration of the phase shifter itself is complete. Before each individual calibration step, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

3. The amplitude and phase adjuster debugging method as described in claim 2, characterized in that, The correction of the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator includes: A joint calibration of multiple stages is performed to calibrate the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator, respectively; the joint calibration of multiple stages includes: joint calibration of the first stage, joint calibration of the second stage, joint calibration of the third stage and joint calibration of the fourth stage. In the first stage of joint calibration, multiple first set attenuation values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured phase shift values ​​are received from the testing instrument; the multiple third measured phase shift values ​​are used as first initial influence data; the third measured phase shift value is the measured value of the phase shifter under the corresponding first set attenuation value; and the first initial influence data is sent to the amplitude-phase adjuster. In the second stage of joint calibration, multiple first set phase shift values ​​are sequentially sent to the amplitude-phase adjuster; multiple third measured attenuation values ​​are received from the testing instrument; the multiple third measured attenuation values ​​are used as second initial influence data; the third measured attenuation value is the measured value of the attenuation value of the attenuator under the corresponding first set phase shift value; the second initial influence data is sent to the amplitude-phase adjuster. In the third stage of joint calibration, multiple second set attenuation values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set attenuation value condition, the data calibration of the phase shifter is performed. If the data calibration of the phase shifter passes multiple times, it is determined that the data calibration of the attenuator's influence on the phase shifter is completed. The multiple second set attenuation values ​​are subsets of the multiple first set attenuation values. The data calibration process of the phase shifter includes: sequentially sending multiple first set phase shift values ​​to the amplitude and phase adjuster; receiving multiple fourth measured phase shift values ​​returned by the testing instrument, each fourth measured phase shift value being obtained after calibrating the phase shifter based on the corresponding second difference and first influence data; calculating a fifth difference between each first set phase shift value and the corresponding fourth measured phase shift value; and determining that the data calibration of the phase shifter is successful if multiple fifth differences are all within a preset third error range. In the fourth stage of joint calibration, multiple second set phase shift values ​​are sequentially sent to the amplitude and phase adjuster. Under each second set phase shift value condition, the attenuator data calibration is performed. If the attenuator data calibration passes multiple times, it is determined that the data calibration of the effect of the phase shifter on the attenuator is completed. The multiple second set phase shift values ​​are subsets of the multiple first set phase shift values. The attenuator data calibration process includes: sequentially sending multiple first preset attenuation values ​​to the amplitude-phase adjuster; receiving multiple fourth measured attenuation values ​​returned by the testing instrument, each fourth measured attenuation value being obtained after calibrating the attenuator based on the corresponding first difference and second influence data; calculating a sixth difference between each first preset attenuation value and the corresponding fourth measured attenuation value; and determining that the attenuator data calibration is successful if multiple sixth differences are all within a preset fourth error range. Before the joint calibration of each stage, a zeroing command is issued to the amplitude and phase adjuster to make the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument all zero.

4. The amplitude and phase adjuster debugging method as described in claim 3, characterized in that, Also includes: Based on the model of the amplitude and phase adjuster, the order of the joint calibration of the third stage and the joint calibration of the fourth stage is determined.

5. The amplitude and phase adjuster debugging method as described in claim 1, characterized in that, The target curve is used to characterize the mapping relationship between frequency and curve value, where the curve value is an attenuation value or a phase shift value. The frequency band to be tested is divided based on the target curve to obtain multiple sub-frequency bands to be tested, including: The frequency band to be tested is divided into multiple frequency segments of equal length; Calculate the average curve value of the target curve within each frequency segment; The frequency segmentation and combination operation is performed multiple times until all frequency segments are traversed, resulting in multiple sub-frequency bands to be tested. The i-th frequency segmentation combination operation includes: Calculate the change between the average curve value in the i-th frequency segment and the average curve value in the (i+1)-th frequency segment; i is a natural number. If the change is less than or equal to a preset change threshold, the (i+1)th frequency segment and the sub-frequency band to be tested where the i-th frequency segment is located are combined into the same sub-frequency band to be tested. The sub-frequency band to be tested where the i-th frequency segment is located is the i-th frequency segment or the sub-frequency band to be tested obtained by combining the i-th frequency segment with other frequency segments. If the change is greater than a preset change threshold, the (i+1)th frequency segment is divided into a new sub-frequency band to be tested.

6. The amplitude and phase adjuster debugging method as described in claim 1, characterized in that, Before issuing a zeroing command to the amplitude and phase adjuster, the amplitude and phase adjuster debugging method further includes: performing a first functional test and a second functional test. In the first stage of functional testing, multiple first set attenuation values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured attenuation values ​​are received from the testing instrument; the seventh difference between each first set attenuation value and the corresponding fifth measured attenuation value is calculated. In the second stage of functional testing, multiple first set phase shift values ​​are sequentially sent to the amplitude and phase adjuster, and multiple fifth measured phase shift values ​​are received from the testing instrument; the eighth difference between each first set phase shift value and the corresponding fifth measured phase shift value is calculated. If multiple seventh differences are all within the preset fifth error range, and multiple eighth differences are all within the preset sixth error range, then the functional test of the amplitude-phase adjuster is considered complete. Before each functional test, a zeroing command is issued to the amplitude and phase adjuster to ensure that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero.

7. An amplitude-phase modulator adjustment device, wherein the amplitude-phase modulator includes an attenuator and a phase shifter, characterized in that, The device is installed in a host computer, which is also installed in an amplitude-phase adjuster debugging system. The amplitude-phase adjuster debugging system further includes a testing instrument. The host computer is communicatively connected to the amplitude-phase adjuster and also communicatively connected to the testing instrument. The testing instrument is used to detect the attenuation value of the attenuator and the phase shift value of the phase shifter. The device includes: The test frequency band sending module is used to send a zeroing command to the amplitude and phase adjuster so that the attenuation value of the attenuator, the phase shift value of the phase shifter, and the output value of the test instrument are all zero, and to send the test frequency band to the amplitude and phase adjuster. The curve plotting module is used to sequentially send multiple first set attenuation values ​​to the amplitude-phase modulator, and plot a first curve fluctuation diagram of the attenuator in the frequency band under test based on multiple first measured attenuation values ​​returned by the testing instrument; and to sequentially send multiple first set phase shift values ​​to the amplitude-phase modulator, and plot a second curve fluctuation diagram of the phase shifter in the frequency band under test based on multiple first measured phase shift values ​​returned by the testing instrument; the first measured attenuation value is the measured value of the attenuator under the corresponding first set attenuation value condition, and the first measured phase shift value is the measured value of the phase shifter under the corresponding first set phase shift value condition; The frequency band division module is used to select the curve with a larger fluctuation value from the first curve fluctuation graph and the second curve fluctuation graph as the target curve graph if the fluctuation value of the first curve fluctuation graph is less than the first fluctuation threshold and / or the fluctuation value of the second curve fluctuation graph is less than the first fluctuation threshold. Based on the target curve graph, the frequency band to be tested is divided into multiple sub-frequency bands to be tested. The segmented debugging module is used to correct the errors of the attenuator and the phase shifter in each sub-band under test; and to correct the data on the impact of the attenuator on the phase shifter and the data on the impact of the phase shifter on the attenuator.

8. A host computer, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method as described in any one of claims 1 to 6.

9. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method as described in any one of claims 1 to 6.

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