Microswitch service life detection method and test system

Abstract

The invention discloses a service life detection method and test system of a microswitch, and belongs to the technical field of electronic component test. The microswitch service life detection method is applied to a test system, the test system comprises a microswitch test device and a power supply system, and the method comprises the following steps: under the condition that a plurality of microswitches to be tested are connected to the test system, adjusting the power supply system to output rated voltage and preset current, the preset current is determined based on a pre-acquired acceleration current coefficient; triggering each to-be-tested microswitch to meet a first preset ending condition through a microswitch testing device, and obtaining test data in each cyclic on-off period; and determining a detection result based on the test data. According to the service life detection method of the microswitch, the service life of the product can be tested in a short time, product screening is assisted, the detection speed of the service life of the product is increased, and the product screening efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of electronic component testing, and particularly relates to a service life detection method and a test system of a micro switch. BACKGROUND

[0002] The micro switch is widely used in the fields of household appliances, automotive electronics and industrial control, and its electrical life is a key indicator for evaluating reliability and safety, mainly depending on the contact material and arc extinguishing ability, and is usually evaluated by testing the number of on-off times until failure such as burning, sticking or poor conduction. In the related art, manual operation or semi-automatic equipment is relied on to realize on-off action by repeatedly pressing the switch by hand, and the failure condition is recorded in the process, which has the defects of low test efficiency and high labor cost, and manual operation has uneven force and frequency, resulting in poor consistency of test conditions, insufficient accuracy of test results, and difficulty in simulating the load current, voltage and action frequency in the application environment, so that the test results deviate from the actual service life. SUMMARY

[0003] The present application aims to at least solve one of the technical problems in the related art. To this end, the present application provides a service life detection method and a test system of a micro switch, which improves the detection speed of product life and improves the efficiency of product screening.

[0004] In a first aspect, the present application provides a service life detection method of a micro switch, applied to a test system, the test system comprising a micro switch test device and a power supply system, the micro switch test device being used to trigger multiple micro switches at the same time; the method comprising: Adjusting the power supply system to output a rated voltage and a preset current under the condition that multiple micro switches to be tested are connected to the micro switch test device and electrically connected to the power supply system, the preset current being determined based on a pre-acquired acceleration current coefficient; Triggering each micro switch to be tested to meet a first preset end condition by the micro switch test device, and obtaining test data in each cycle of on-off period; Determining a detection result based on the test data.

[0005] According to the service life detection method of the micro switch, the test conditions such as current and voltage are set in the test system, the micro switch test device is controlled to trigger multiple micro switches to be tested in multiple cycles of on-off period, test data is obtained, and a detection result is determined, which can test the product life in a short time and assist product screening, thereby improving the detection speed of product life and improving the efficiency of product screening.

[0006] According to one embodiment of the present application, the test data in each cycle-on-off period is obtained by triggering each micro switch to be tested to meet the first preset ending condition through the micro switch test device, including: In the cycle-on-off period, each micro switch to be tested is triggered to the first number of times through the micro switch test device, and the functional state of each micro switch to be tested is obtained; In the case where it is determined based on the functional state that each micro switch to be tested is normal, the next cycle-on-off period is entered, and each micro switch to be tested is triggered to the first number of times through the micro switch test device.

[0007] According to one embodiment of the present application, the test data in each cycle-on-off period is obtained by triggering each micro switch to be tested to meet the first preset ending condition through the micro switch test device, including: In the cycle-on-off period, each micro switch to be tested is triggered to the first number of times through the micro switch test device, and the functional state of each micro switch to be tested is obtained; In the case where it is determined based on the functional state that at least one micro switch to be tested is invalid, the proportion of the invalid micro switch to be tested in the total number of micro switches to be tested is obtained; In the case where the proportion is less than the target proportion, the invalid micro switch to be tested is deleted, and the next cycle-on-off period is entered, and each remaining micro switch to be tested is triggered to the first number of times through the micro switch test device.

[0008] According to one embodiment of the present application, the test data in each cycle-on-off period is obtained by triggering each micro switch to be tested to meet the first preset ending condition through the micro switch test device, including: In the cycle-on-off period, each micro switch to be tested is triggered to the first number of times through the micro switch test device, and the functional state of each micro switch to be tested is obtained; In the case where it is determined based on the functional state that at least one micro switch to be tested is invalid, the proportion of the invalid micro switch to be tested in the total number of micro switches to be tested is obtained; In the case where the proportion is greater than or equal to the target proportion, it is determined that the first preset ending condition is met.

[0009] According to one embodiment of the present application, in the cycle-on-off period, each micro switch to be tested is triggered to the first number of times through the micro switch test device, and the functional state of each micro switch to be tested is obtained, including: The on-resistance of each micro switch to be tested is obtained; In the case where the on-resistance is greater than the target threshold value, or the contacts of the micro switch to be tested are stuck, it is determined that the micro switch to be tested is invalid.

[0010] According to one embodiment of this application, when multiple microswitches to be tested are connected to the test system, before adjusting the power supply system to the output rated voltage and preset current, the method further includes: When multiple microswitches under test are connected to the microswitch test device and electrically connected to the power supply system, adjust the power supply system to output rated voltage and initial current; the initial current is the product of the conduction current and the initial value of the acceleration current coefficient. Each microswitch under test is triggered by a microswitch testing device until the second preset termination condition is met, and the acceleration current coefficient is obtained.

[0011] According to one embodiment of this application, triggering each microswitch under test to meet a second preset termination condition using a microswitch testing device to obtain the accelerating current coefficient includes: During the on / off test cycle, each microswitch under test is triggered to the second count using the microswitch testing device, and the functional status of each microswitch under test is obtained. Adjust the accelerating current coefficient based on the functional state of each microswitch under test.

[0012] According to one embodiment of this application, adjusting the accelerating current coefficient based on the functional state of each microswitch under test includes: If all microswitches under test are confirmed to be normal based on their functional status, the accelerating current coefficient is increased within a preset range, multiple new pre-test samples are connected to the test system, the initial current is adjusted based on the increased accelerating current coefficient, and the next test on / off cycle is entered.

[0013] According to one embodiment of this application, adjusting the accelerating current coefficient based on the functional state of each microswitch under test includes: If, based on the functional state, it is determined that at least one microswitch under test has failed, the current accelerating current coefficient is determined as the accelerating current coefficient.

[0014] Secondly, this application provides a testing system, including: A microswitch testing device for simultaneously triggering multiple microswitches under test; Power system; The testing system is based on the life testing method for microswitches as described in the first aspect.

[0015] Thirdly, this application provides a non-transitory computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the life detection method for a microswitch as described in the first aspect above.

[0016] Fourthly, this application provides a computer program product, including a computer program that, when executed by a processor, implements the life detection method for a microswitch as described in the first aspect above.

[0017] The above-described one or more technical solutions in the embodiments of this application have at least one of the following technical effects: By setting test conditions such as current and voltage in the test system, the microswitch test device is controlled to trigger multiple microswitches under test in multiple on-off cycles, acquire test data, and determine the test results. This enables the product life to be tested in a short time, assisting in product screening and thus improving the speed of product life testing and the efficiency of product screening.

[0018] Furthermore, by controlling the microswitch testing device through the testing system to trigger multiple microswitches under test within multiple on / off cycles, the accelerating current coefficient is obtained, and the input current is set accordingly. This provides reliable data for subsequent lifespan limit testing, reduces the time required for lifespan limit testing, thereby improving the detection speed of product lifespan and increasing the efficiency of product screening.

[0019] Furthermore, by determining the input current in the accelerated life test through the accelerating current coefficient, and combining it with the accelerated life model, the life of the micro switch under test is estimated under rated operating conditions. This reduces the time required for traditional life testing, thereby improving the detection speed of product life and increasing the efficiency of product screening.

[0020] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0021] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is one of the flowcharts illustrating the life detection method for microswitches provided in this application embodiment; Figure 2 This is a second schematic flowchart of the life detection method for microswitches provided in the embodiments of this application; Figure 3 This is the third flowchart illustrating the lifespan detection method for microswitches provided in this application embodiment; Figure 4 This is the fourth flowchart illustrating the lifespan detection method for microswitches provided in this application embodiment; Figure 5 This is the fifth flowchart illustrating the lifespan detection method for microswitches provided in this application embodiment; Figure 6This is a schematic diagram of the microswitch life detection device provided in the embodiments of this application; Figure 7 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application; Figure 8 This is a schematic diagram of the microswitch testing device provided in the embodiments of this application.

[0022] Figure label: Microswitch testing device 1 Base 11, Microswitch under test 12, Triggering component 121, Rotating body 13, Triggering protrusion 131, Drive unit 14 First support part 111, second support part 112 Bearing 15, fixed bracket 16, base plate 161, support plate 162. Detailed Implementation

[0023] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0024] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0025] The following description, in conjunction with the accompanying drawings, details the microswitch life testing method, microswitch life testing device, testing system, and readable storage medium provided in this application, through specific embodiments and application scenarios.

[0026] Among them, the life detection method of micro switches can be applied to the terminal, and can be executed by the hardware or software in the terminal.

[0027] The microswitch life detection method provided in this application embodiment can be executed by a test system or a functional module or entity in the test system that can implement the test system method. The following description uses a test system as the execution subject to illustrate the microswitch life detection method provided in this application embodiment.

[0028] This application provides a method for testing the lifespan of a micro switch, which is applied to a testing system.

[0029] The testing system includes a microswitch testing device and a power supply system.

[0030] The microswitch testing device is used to trigger multiple microswitches to be tested simultaneously.

[0031] The testing system is based on the aforementioned lifespan testing method for microswitches.

[0032] like Figure 8 As shown, the micro switch testing device 1 includes: a base 11, a micro switch to be tested 12, a rotating body 13, and a driving unit 14.

[0033] The micro switch 12 to be tested is mounted on the base 11. A triggering component 121 is mounted on the micro switch 12. The rotating body 13 is rotatably mounted on the base 11. A triggering protrusion 131 for cooperating with the triggering component 121 is provided on the outer periphery of the rotating body 13. The driving unit 14 is connected to the rotating body 13 and is used to control the rotation of the rotating body 13.

[0034] The micro switch 12 to be tested is configured as a plurality of micro switches spaced apart along the first direction of extension, and the trigger protrusions 131 are configured as a plurality of micro switches 12 to be tested. The micro switch 12 to be tested has a triggered state and a non-triggered state. During the rotation of the body, when the trigger protrusions 131 come into contact with the triggering component 121, the micro switch 12 to be tested is triggered to the triggered state. When the trigger protrusions 131 separate from the triggering component 121, the micro switch 12 to be tested remains in the non-triggered state.

[0035] The rotating body 13 includes a shaft extending in a first direction, and a trigger protrusion 131 is provided on the outer peripheral wall of the shaft. The trigger protrusion 131 is used to trigger the trigger component 121 of the micro switch 12 to be tested.

[0036] It should be noted that the micro switch 12 under test has a triggered state and a non-triggered state. The triggering component 121 of the micro switch 12 under test is constructed as a triggering arm, and at least one protrusion is set corresponding to the triggering component 121 of the micro switch under test.

[0037] During the rotation of the rotating body 13, the following are included: When the trigger protrusion 131 contacts the trigger arm, it will trigger the micro switch 12 under test to sense and enter the trigger state; When the trigger protrusion 131 is not in contact with the trigger arm, the micro switch 12 under test remains in a non-triggering state.

[0038] A receiver can be provided on the base 11 for connecting to the micro switch 12 under test. The receiver is used to receive the signal emitted by the micro switch 12 under test when it is in the triggered state.

[0039] In this application, the base 11 serves as the mounting foundation for the entire micro switch testing device 1, providing a stable mounting reference for the rotating body 13, the drive unit 14, and the multiple micro switches 12 to be tested. This ensures that all components maintain a fixed relative position during the test, eliminating test errors caused by inconsistent references.

[0040] like Figure 1 As shown, the life test method for the micro switch includes steps 110, 120 and 130.

[0041] Step 110: With multiple microswitches to be tested connected to the microswitch testing device and electrically connected to the power supply system, adjust the power supply system to output rated voltage and preset current. In this step, the preset current is a current value determined based on a pre-acquired acceleration current coefficient.

[0042] Rated voltage refers to the standard voltage value that the power supply system used in the test system should output under normal operating conditions of the microswitch.

[0043] In some embodiments, the preset current is determined based on a pre-acquired accelerating current coefficient, including: The preset current is determined based on the product of the rated current and the acceleration current coefficient.

[0044] In this embodiment, the accelerating current coefficient can be 1, in which case the preset current is the rated current.

[0045] In some embodiments, the accelerating current coefficient may be a value greater than 1.

[0046] In this embodiment, the preset current is a current higher than the rated current. In actual operation, the micro switch under test is tested based on the preset current, which can shorten the test time, accelerate aging or life verification, and thus obtain the life or other reliability data of the micro switch under test, assisting in product screening.

[0047] Based on the accelerating current coefficient used in the test, the micro switch to be tested can be initially screened. The test is carried out within the range of accelerating current coefficient. If the micro switch to be tested does not show a failure state, the larger the accelerating current coefficient used for testing, the better the performance of the micro switch to be tested.

[0048] The specific method for obtaining the accelerating current coefficient will be described in the following embodiments, and will not be repeated here.

[0049] Step 120: Trigger each micro switch to be tested using the micro switch testing device until the first preset end condition is met, and obtain the test data within each cycle of on / off switching; In this step, the first preset termination condition is used to determine whether to stop the test or pause the on / off cycle. Test data may include data from the microswitch under test or data from the accelerating current coefficient, etc.

[0050] In some embodiments, the first preset termination condition may be set based on the failure state of the micro switch under test or the accelerating current coefficient.

[0051] The on / off cycle refers to the number of times that the micro switch under test is triggered by the micro switch testing device, which is determined to be one on / off cycle.

[0052] In some embodiments, step 120 may include: During the on / off cycle, each microswitch under test is triggered to the first count by the microswitch testing device, and the functional status of each microswitch under test is obtained. If, based on the functional status, it is determined that at least one microswitch under test has failed, obtain the percentage of the failed microswitch under test out of the total number of microswitches under test. If the percentage is less than the target percentage, delete the failed microswitches under test, enter the next cycle of switching on and off, and trigger each of the remaining microswitches under test to the first count through the microswitch testing device.

[0053] In this embodiment, the functional status includes failure or normal; the initial count can be based on user-defined parameters or historical experience.

[0054] In actual implementation, refer to Figure 5 Multiple microswitches to be tested are selected as samples. The number of samples can be greater than or equal to 10, and the number of cycles of switching on and off is i. Wherein, i can be user-defined, such as set to 5000 times or 10000 times, etc., which is not limited in this application.

[0055] Continue to refer to Figure 5 Based on the accelerating current coefficient x, the acceleration test conditions are determined; In some embodiments, accelerated testing conditions include current and voltage.

[0056] The current can be determined based on the product of the rated current and the accelerating current coefficient, expressed as: I=Ie*x; where I represents the current and Ie represents the rated current; the voltage can be equal to the rated voltage.

[0057] Continue to refer to Figure 5 The initial count is set to 10,000. In each test on / off cycle, the micro switch to be tested is triggered up to 10,000 times by the micro switch test device, and the functional status of each micro switch to be tested is obtained. Continue to refer to Figure 5 Failure determination is performed, and if it is determined that none of the microswitches under test have failed (i.e., have not failed) based on their functional status, the next on / off test cycle is initiated.

[0058] In some embodiments, step 120 may include: During the on / off cycle, each microswitch under test is triggered to the first count by the microswitch testing device, and the functional status of each microswitch under test is obtained. If, based on the functional status, it is determined that at least one microswitch under test has failed, obtain the percentage of the failed microswitch under test out of the total number of microswitches under test. If the percentage is less than the target percentage, delete the failed microswitches under test, enter the next cycle of switching on and off, and trigger each of the remaining microswitches under test to the first count through the microswitch testing device.

[0059] The target percentage can be customized by the user, such as setting it to 20% or 15%.

[0060] In actual implementation, refer to Figure 5 Multiple microswitches to be tested are selected as samples, and the number of samples can be greater than or equal to 10. The number of cycles of switching on and off is i. Among them, i can be user-defined, such as set to 5000 times or 10000 times, etc., which is not limited in this application.

[0061] Continue to refer to Figure 5 Based on the accelerating current coefficient x, the acceleration test conditions are determined; In some embodiments, accelerated testing conditions include current and voltage.

[0062] The current can be determined based on the product of the rated current and the accelerating current coefficient, expressed as: I=Ie*x; where I represents the current and Ie represents the rated current; the voltage can be equal to the rated voltage.

[0063] Continue to refer to Figure 5In each test on / off cycle, the micro switch to be tested is triggered up to 10,000 times by the micro switch test device, and the functional status of each micro switch to be tested is obtained. Continue to refer to Figure 5 Failure determination is performed. If it is determined from the functional status that at least one microswitch under test has failed, the proportion of the failed microswitch under test to the total number of microswitches under test is obtained. Continue to refer to Figure 5 If the proportion of failed microswitches to be tested to the total number of microswitches to be tested is less than 20%, the failed microswitches to be tested are deleted, and the next on / off cycle begins. The remaining microswitches to be tested are triggered to the first count by the microswitch testing device.

[0064] In some embodiments, step 120 may include: During the on / off cycle, each microswitch under test is triggered to the first count by the microswitch testing device, and the functional status of each microswitch under test is obtained. If, based on the functional status, it is determined that at least one microswitch under test has failed, obtain the percentage of the failed microswitch under test out of the total number of microswitches under test. If the percentage is greater than or equal to the target percentage, the first preset termination condition is determined to be met.

[0065] The target percentage can be customized by the user, such as setting it to 15% or 20%.

[0066] In actual implementation, refer to Figure 5 Multiple microswitches to be tested are selected as samples, and the number of samples can be greater than or equal to 10. The number of cycles of switching on and off is i. Among them, i can be user-defined, such as set to 5000 times or 10000 times, etc., which is not limited in this application.

[0067] Continue to refer to Figure 5 Based on the accelerating current coefficient x obtained in step 120, determine the acceleration test conditions; In some embodiments, accelerated testing conditions include current and voltage.

[0068] The current can be determined based on the product of the rated current and the accelerating current coefficient, expressed as: I=Ie*x; where I represents the current and Ie represents the rated current; the voltage can be equal to the rated voltage.

[0069] Continue to refer to Figure 5 In each test on / off cycle, the micro switch to be tested is triggered up to 10,000 times by the micro switch test device, and the functional status of each micro switch to be tested is obtained. Continue to refer toFigure 5 Failure determination is performed. If it is determined from the functional status that at least one microswitch under test has failed, the proportion of the failed microswitch under test to the total number of microswitches under test is obtained. Continue to refer to Figure 8 The test is stopped when the proportion of failed microswitches to the total number of microswitches to be tested is greater than or equal to 20%, and the failure functional status of the failed microswitches is analyzed after the test is stopped.

[0070] In this embodiment, analyzing the failed functional state may include: dissecting the failed microswitch under test, observing contact ablation, material transfer, oxidation, etc. under a microscope, and confirming the failure mode, etc.

[0071] In some embodiments, during a cyclic on / off cycle, the microswitch under test is triggered to the first count by the microswitch testing device, and the functional state of each microswitch under test is acquired, including: Obtain the on-resistance of each micro switch to be tested; If the on-resistance is greater than the target threshold, or if the contacts of the microswitch under test are stuck together, the microswitch under test is determined to be faulty.

[0072] In this embodiment, the on-resistance is the resistance value obtained when the micro switch under test is triggered into the trigger state by the micro switch testing device and the current passes through the contact of the micro switch under test, when the power system is connected.

[0073] The target threshold is used to determine whether the conduction performance of the microswitch is within the normal range. When the conduction resistance exceeds this threshold, it indicates that the contact performance of the microswitch contacts has deteriorated, the device performance has degraded, and it no longer meets the requirements for normal use, and should be judged as a failure. The target threshold can be user-defined, such as set to 100mΩ.

[0074] The following section describes the process of obtaining the on-resistance of each microswitch under test, using a microswitch testing device.

[0075] refer to Figure 4 The micro switch testing device 1 includes: a base 11, a micro switch 12 to be tested, a rotating body 13, and a driving unit 14. The micro switch 12 to be tested is provided with a triggering component 121, and the outer periphery of the rotating body 13 is provided with a triggering protrusion 131 for cooperating with the triggering component 121. The driving unit 14 is connected to the rotating body 13 and is used to control the rotation of the rotating body 13.

[0076] In actual operation, the drive unit 14 controls the rotating body 13 to rotate. When the trigger protrusion 131 contacts the trigger component 121, the micro switch 12 under test is triggered to sense and enter the trigger state. The rated current and rated voltage are input to the micro switch 12 under test through the power system to obtain the resistance value generated when the current passes through the contact of the micro switch 12 under test, that is, the conduction resistance.

[0077] Based on the obtained on-resistance, if the on-resistance is greater than the target threshold, the micro switch under test is determined to be faulty.

[0078] The following section describes the contact adhesion of the microswitch under test, using a microswitch testing device.

[0079] In actual execution, when the trigger protrusion 131 contacts the trigger component 121, the micro switch 12 under test senses and enters the trigger state; The drive unit 14 controls the rotating body 13 to continue rotating, and the trigger protrusion 131 will disengage from the trigger component 121. Under normal circumstances, the micro switch 12 under test will enter the non-triggering state from the triggered state. If the micro switch 12 under test remains in the triggered state even after the trigger protrusion 131 and the trigger component 121 have lost contact, it is determined that the micro switch under test has contact adhesion and is therefore confirmed to be faulty.

[0080] Step 130: Determine the detection results based on the test data.

[0081] In this step, the test data includes: failed microswitches under test, unfailed microswitches under test, and may also include: the number of cycles of switching on and off the microswitch, the number of failure samples, the change in on-resistance, and information on failure mechanisms such as contact erosion, material transfer, and oxidation.

[0082] In some embodiments, the test results may also include the electrical life of the microswitch under test, statistical values ​​of the upper limit of its lifespan, product screening conclusions, and major failure modes.

[0083] According to the microswitch life testing method provided in the embodiments of this application, by setting test conditions such as current and voltage in the test system, the microswitch test device is controlled to trigger multiple microswitches to be tested in multiple on-off cycles, acquire test data, and determine the test results. This method can test the product life in a short time, assist in product screening, thereby improving the product life testing speed and the efficiency of product screening.

[0084] In some embodiments, step 130 may include: Based on the test results, the failed micro switch to be tested is obtained; Based on the micro switch under test, determine the failure mode of the failed micro switch.

[0085] In this step, the test results may include the electrical life of the microswitch under test, statistical values ​​of its upper lifespan, product screening conclusions, and major failure modes. Failure modes refer to the main causes of microswitch failure, such as contact erosion or adhesion. Based on the test results, microswitches can be compared and screened; for example, the more tests conducted, the better the lifespan of the microswitch under test. Combining the test results with Weibull analysis can also determine the reliability of the microswitch.

[0086] In some embodiments, the failure mode of a failed microswitch can be determined based on the data of the microswitch under test or the failed microswitch under test, which can be used to guide product structure optimization, material selection, etc., and to update the failure mode in the life test method of microswitches.

[0087] The method for obtaining the accelerating current coefficient is explained below.

[0088] In some embodiments, prior to step 110, the method further includes: With multiple pre-test samples connected to the test system, adjust the power supply system to output rated voltage and initial current; the initial current is the product of the conduction current and the initial value of the acceleration current coefficient. Each microswitch under test is triggered by a microswitch testing device until the second preset termination condition is met, and the acceleration current coefficient is obtained.

[0089] In this embodiment, the second preset termination condition may include: whether the number of times the microswitch under test is triggered by the microswitch testing device reaches the second count, and whether each microswitch under test meets the failure criteria. The failure criteria may include: the obtained on-resistance of the microswitch under test being greater than the initial resistance, contact adhesion, or the switch failing to connect the circuit.

[0090] The second number refers to the number of times the micro switch testing device triggers each micro switch under test within one on / off cycle. When the number of times the micro switch testing device triggers each micro switch under test reaches the second number, it can be determined that the cycle has ended, and based on whether the functional status of each micro switch under test is normal, it can be determined whether to enter the next on / off cycle.

[0091] In some embodiments, the second number can be 5000 times.

[0092] In some embodiments, the initial current can be determined by the product of the conduction current and the initial value of the acceleration current coefficient, expressed as: I=Ie*x.

[0093] Where I represents the initial current, Ie represents the rated on-state current, and x represents the accelerating current coefficient. According to the microswitch life testing method of this application, the input current in the accelerated life test is determined by the accelerating current coefficient. Combined with the accelerated life model, the lifespan of the microswitch under test is calculated under rated operating conditions, reducing the time required for traditional life testing, thereby improving the speed of product life testing and increasing the efficiency of product screening.

[0094] In some embodiments, triggering each microswitch under test to meet a second preset termination condition using a microswitch testing device to obtain the accelerating current coefficient includes: During the on / off test cycle, each microswitch under test is triggered to the second count using the microswitch testing device, and the functional status of each microswitch under test is obtained. Adjust the accelerating current coefficient based on the functional state of each microswitch under test.

[0095] In some embodiments, the second number can be user-defined, such as set to 5000 times.

[0096] In this embodiment, the failure state may include: the on-resistance of the micro switch under test is greater than the initial resistance value, or the contacts are stuck together, etc.; wherein, the initial resistance value is a preset value, such as 100mΩ.

[0097] In some embodiments, the accelerating current coefficient is adjusted based on the functional state of each microswitch under test, including: If all microswitches under test are confirmed to be normal based on their functional status, the accelerating current coefficient is increased within a preset range, multiple new pre-test samples are connected to the test system, the initial current is adjusted based on the increased accelerating current coefficient, and the next test on / off cycle is entered.

[0098] In this embodiment, the preset range is a pre-defined range of variation for the accelerating current coefficient, which can be user-defined and used to limit the adjustment amplitude of the accelerating current coefficient. Setting a preset range is to avoid the accelerating current coefficient being adjusted too large, causing premature sample failure, or too small, resulting in low testing efficiency (i.e., the pre-tested sample never fails). In some embodiments, the preset range can be set to 1~1.5.

[0099] In some embodiments, increasing the accelerating current coefficient within a preset range includes: Determine the initial value of the accelerating current coefficient; Based on the initial value of the accelerating current coefficient, the accelerating current coefficient is increased in target step sizes within a preset range.

[0100] In this embodiment, the initial value of the accelerating current coefficient can be 1, or other values ​​greater than 1; the target step size is the increase of the accelerating current coefficient within a preset range.

[0101] In actual implementation, refer to Figure 4 Select multiple microswitches to be tested, with a quantity of n; Continue to refer to Figure 4 Select an initial value x for the accelerating current coefficient; Continue to refer to Figure 4 Determine the rated current and rated voltage; In this embodiment, the rated current can be expressed as: I = Ie * x; where I represents the actual current provided during the test, Ie represents the rated current, and x represents the acceleration current coefficient.

[0102] Rated voltage can be expressed as U=Ue; where U represents the actual voltage supplied during the test, and Ue represents the rated current.

[0103] Continue to refer to Figure 4 Within one test on / off cycle, each microswitch under test is triggered up to 5000 times by the microswitch test device, and the functional status of each microswitch under test is obtained. Continue to refer to Figure 4 Failure determination is performed. If it is determined that no failure has occurred in each microswitch under test based on the functional status (i.e., no failure), the accelerating current coefficient x is increased and updated within the preset range. New test samples are taken, with the same number n, and connected to the test system to enter the next test on / off cycle.

[0104] In some embodiments, the accelerating current coefficient is adjusted based on the functional state of each microswitch under test, including: If, based on the functional state, it is determined that at least one microswitch under test has failed, the current accelerating current coefficient is determined as the accelerating current coefficient.

[0105] In actual implementation, refer to Figure 4 Select multiple microswitches to be tested, with a quantity of n; Continue to refer to Figure 4 Select an initial value x for the accelerating current coefficient; Continue to refer to Figure 4 Determine the rated current and rated voltage; In some embodiments, the rated current can be expressed as: I = Ie * x; where I represents the actual current provided during the test, Ie represents the rated current, and x represents the accelerating current coefficient.

[0106] Rated voltage can be expressed as U = Ue. Where U represents the actual voltage supplied during the test, and Ue represents the rated current.

[0107] Continue to refer to Figure 4 During the on / off test cycle, each microswitch under test is triggered up to 5000 times by the microswitch test device, and the functional status of each microswitch under test is obtained. Continue to refer to Figure 2 Failure determination is performed. If it is determined that at least one microswitch under test has failed (i.e., failure has occurred) based on the functional status, the test is stopped. The failure functional status of the failed microswitch under test is analyzed to obtain the accelerating current coefficient x.

[0108] In some embodiments, analyzing the failure state may include: dissecting each failure sample, observing contact ablation, material transfer, oxidation, etc. under a microscope, and confirming the failure mode, etc.

[0109] According to the microswitch life testing device provided in the embodiments of this application, the test system controls the microswitch test device to trigger multiple microswitches under test in multiple on-off cycles to obtain the accelerating current coefficient, and sets the input current accordingly, providing reliable data for subsequent life limit testing, reducing the time required for life limit testing, thereby improving the product life testing speed and increasing the efficiency of product screening.

[0110] In some embodiments, reference Figure 3 Before step 110, the process may also include steps such as initial sample testing, test system setup, circuit verification, and test fixture debugging.

[0111] In some embodiments, initial sample detection includes: With multiple microswitches under test connected to their rated conduction current, press the microswitch under test to close it, and measure and record the initial contact resistance of the microswitch.

[0112] In some embodiments, initial sample testing further includes measuring and recording initial data such as the actuation force and appearance of multiple microswitches under test. Specifically, pressing the microswitch within the specified actuation force range allows the microswitch to turn on and off, and the appearance of the microswitch under test is verified to be consistent with the specification description.

[0113] In actual implementation, refer to Figure 6 The test system setup includes connecting multiple microswitches to be tested (i.e., the samples under test) to the microswitch test device and the power supply system via power lines; connecting the monitoring system to the microswitch test device; connecting the power supply system to the actual load and the monitoring system via power lines; and connecting the actual load to the multiple microswitches to be tested.

[0114] In this embodiment, circuit verification is performed by manually closing a switch to verify whether the circuit current is stable. The actual load refers to the load set according to the actual test conditions, such as a resistive load R. The monitoring system can be used to record the start and end times of the test, supply power to the microswitch test device during this period, control and record the number of triggers; the monitoring system can also be used to input the load value, such as the resistive load R, and continuously record the voltage U and current I fed back by the power supply during the test, and calculate the current on-resistance.

[0115] In some embodiments, the current on-resistance can be expressed as: R 微 =U / IR Among them, R 微 U is the current on-resistance of the microswitch under test, U is the current voltage, and I is the current current.

[0116] In some embodiments, the test fixture can be debugged by selecting multiple microswitches to be tested, such as two microswitches to be tested, running them with rated voltage and rated current connected, and confirming whether the monitoring system is in normal working condition.

[0117] In this embodiment, the normal working state refers to the ability of the controllable micro switch testing device to perform a uniform and stable triggering action on the micro switch under test, determine whether the micro switch under test has changed from a non-triggering state to a triggering state, and then determine the error between the current on-resistance and the initial contact resistance within a first error range based on the current voltage and current values ​​output by the power supply system. The first error range can be set to 5%.

[0118] The microswitch life detection method provided in this application can be executed by a microswitch life detection device. This application uses a microswitch life detection device executing the microswitch life detection method as an example to illustrate the microswitch life detection device provided in this application.

[0119] This application also provides a microswitch life detection device.

[0120] like Figures 1 to 5 As shown, the life detection device for the micro switch includes: a first processing module 610, a second processing module 620, and a third processing module 630.

[0121] The first processing module 610 is used to adjust the power supply system to output rated voltage and preset current when multiple microswitches under test are connected to the test system. The preset current is determined based on a pre-acquired acceleration current coefficient. The second processing module 620 is used to trigger each micro switch under test to meet the first preset end condition through the micro switch testing device, and to obtain test data in each cycle of on / off. The third processing module 630 is used to determine the detection results based on the test data.

[0122] According to the microswitch life testing device provided in the embodiments of this application, by setting test conditions such as current and voltage in the test system, the microswitch test device is controlled to trigger multiple microswitches to be tested in multiple cycles of on and off, acquire test data, and determine the test results. It can test the product life in a short time, assist in product screening, thereby improving the detection speed of product life and improving the efficiency of product screening.

[0123] In some embodiments, the second processing module 620 may also be used for: During the on / off cycle, each microswitch under test is triggered to the first count using a microswitch testing device, and the functional status of each microswitch under test is acquired; the functional status includes failure or normal operation. If all the microswitches under test are found to be normal based on their functional status, the next on / off cycle begins, and the microswitch under test is triggered to the first count by the microswitch testing device.

[0124] In some embodiments, the second processing module 620 may also be used for: During the on / off cycle, each microswitch under test is triggered to the first count by the microswitch testing device, and the functional status of each microswitch under test is obtained. If, based on the functional status, it is determined that at least one microswitch under test has failed, obtain the percentage of the failed microswitch under test out of the total number of microswitches under test. If the percentage is less than the target percentage, the failed microswitches to be tested are deleted, and the next on / off cycle begins. The remaining microswitches to be tested are triggered to the first count by the microswitch testing device.

[0125] In some embodiments, the second processing module 620 may also be used for: During the on / off cycle, each microswitch under test is triggered to the first count by the microswitch testing device, and the functional status of each microswitch under test is obtained. If, based on the functional status, it is determined that at least one microswitch under test has failed, obtain the percentage of the failed microswitch under test out of the total number of microswitches under test. If the percentage is greater than or equal to the target percentage, the first preset termination condition is determined to be met.

[0126] In some embodiments, the second processing module 620 may also be used for: Obtain the on-resistance of each micro switch to be tested; If the on-resistance is greater than the target threshold, or if the contacts of the microswitch under test are stuck together, the microswitch under test is determined to be faulty.

[0127] In some embodiments, the third processing module 630 can also be used for: Based on the test results, the failed micro switch to be tested is obtained; Based on the micro switch under test, determine the failure mode of the failed micro switch.

[0128] In some embodiments, a fourth processing module may be included before the first processing module 610, for: When multiple microswitches under test are connected to the microswitch test device and electrically connected to the power supply system, adjust the power supply system to output rated voltage and initial current; the initial current is the product of the conduction current and the initial value of the acceleration current coefficient. Each microswitch under test is triggered by a microswitch testing device until the second preset termination condition is met, and the acceleration current coefficient is obtained.

[0129] In some embodiments, the fourth processing module may also be used for: During the on / off test cycle, each microswitch under test is triggered to the second count using the microswitch testing device, and the functional status of each microswitch under test is obtained. Adjust the accelerating current coefficient based on the functional state of each microswitch under test.

[0130] In some embodiments, the fourth processing module may also be used for: If all microswitches under test are confirmed to be normal based on their functional status, the accelerating current coefficient is increased within a preset range, multiple new pre-test samples are connected to the test system, the initial current is adjusted based on the increased accelerating current coefficient, and the next test on / off cycle is entered.

[0131] In some embodiments, the fourth processing module may also be used for: If, based on the functional state, it is determined that at least one microswitch under test has failed, the current accelerating current coefficient is determined as the accelerating current coefficient.

[0132] The lifespan detection device for the microswitch in this application embodiment can be an electronic device or a component within an electronic device, such as an integrated circuit or a chip. The electronic device can be a terminal or other devices besides a terminal. For example, the electronic device can be a mobile phone, tablet computer, laptop computer, PDA, in-vehicle electronic device, mobile internet device (MID), augmented reality (AR) / virtual reality (VR) device, robot, wearable device, ultra-mobile personal computer (UMPC), netbook, or personal digital assistant (PDA), etc. It can also be a server, network attached storage (NAS), personal computer (PC), television (TV), ATM, or self-service machine, etc. This application embodiment does not specifically limit the specific type of device.

[0133] The microswitch life detection device in this application embodiment can be a device with an operating system. This operating system can be Android, iOS, or other possible operating systems; this application embodiment does not specifically limit it.

[0134] The microswitch life detection device provided in this application embodiment can achieve... Figure 7 The various processes implemented in the method implementation examples will not be described again here to avoid repetition.

[0135] This application also provides a testing system, which includes a microswitch testing device and a power supply system. The microswitch testing device is used to simultaneously trigger multiple microswitches to be tested.

[0136] The testing system performs the test based on the life testing method for microswitches provided in any of the above embodiments.

[0137] In some embodiments, such as ​ As shown, this application embodiment also provides an electronic device 700, including a processor 701, a memory 702, and a computer program stored in the memory 702 and executable on the processor 701. When the program is executed by the processor 701, it implements the various processes of the above-described microswitch life detection method embodiment and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0138] It should be noted that the electronic devices in the embodiments of this application include the aforementioned mobile electronic devices and non-mobile electronic devices.

[0139] This application also provides a non-transitory computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it implements the various processes of the above-described microswitch life detection method embodiment and achieves the same technical effect. To avoid repetition, it will not be described again here.

[0140] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0141] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the above-described microswitch life detection method.

[0142] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0143] This application embodiment also provides a chip, which includes a processor and a communication interface. The communication interface and the processor are coupled. The processor is used to run programs or instructions to implement the various processes of the above-described microswitch life detection method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0144] It should be understood that the chip mentioned in the embodiments of this application may also be referred to as a system-on-a-chip, system chip, chip system, or system-on-a-chip, etc.

[0145] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0146] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the related technology, can be embodied in the form of a computer software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0147] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

[0148] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0149] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

Claims

1. A method of detecting the life of a micro switch, characterized by, The method is applied to a test system, and the test system comprises a micro switch test device and a power supply system, the micro switch test device is used for triggering a plurality of micro switches simultaneously; the method comprises the following steps: In a case that a plurality of micro switches to be tested are connected to the micro switch test device and are electrically connected to the power supply system, the power supply system is adjusted to output a rated voltage and a preset current, and the preset current is determined based on a previously obtained acceleration current coefficient; Each of the micro switches to be tested is triggered by the micro switch test device to meet a first preset ending condition, and test data in each cycle of on-off period is obtained; A detection result is determined based on the test data.

2. The life detection method of a micro switch according to claim 1, characterized by, The step of triggering each of the micro switches to be tested by the micro switch test device to meet the first preset ending condition and obtaining the test data in each cycle of on-off period comprises the following steps: In the cycle of on-off period, each of the micro switches to be tested is triggered by the micro switch test device to a first number of times, and a function state of each of the micro switches to be tested is obtained; the function state comprises failure or normality; In a case that each of the micro switches to be tested is determined to be normal based on the function state, a next cycle of on-off period is entered, and each of the micro switches to be tested is triggered by the micro switch test device to the first number of times.

3. The life detection method of a micro switch according to claim 1, characterized by, The step of triggering each of the micro switches to be tested by the micro switch test device to meet the first preset ending condition and obtaining the test data in each cycle of on-off period comprises the following steps: In the cycle of on-off period, each of the micro switches to be tested is triggered by the micro switch test device to a first number of times, and a function state of each of the micro switches to be tested is obtained; In a case that at least one of the micro switches to be tested is determined to be failed based on the function state, a proportion of the failed micro switches to be tested in a total number of the micro switches to be tested is obtained; In a case that the proportion is less than a target proportion, the failed micro switches to be tested are deleted, a next cycle of on-off period is entered, and each of the remaining micro switches to be tested is triggered by the micro switch test device to the first number of times.

4. The life detection method of a micro switch according to claim 1, characterized by, The step of triggering each of the micro switches to be tested by the micro switch test device to meet the first preset ending condition and obtaining the test data in each cycle of on-off period comprises the following steps: In the cycle of on-off period, each of the micro switches to be tested is triggered by the micro switch test device to a first number of times, and a function state of each of the micro switches to be tested is obtained; In a case that at least one of the micro switches to be tested is determined to be failed based on the function state, a proportion of the failed micro switches to be tested in a total number of the micro switches to be tested is obtained; In a case that the proportion is greater than or equal to a target proportion, the first preset ending condition is met.

5. The life detection method of the micro switch according to claim 2, characterized by, The step of triggering each of the micro switches to be tested by the micro switch test device to meet the first preset ending condition and obtaining the test data in each cycle of on-off period comprises the following steps: A conduction resistance of each of the micro switches to be tested is obtained; In the case that the on-resistance is greater than the target threshold value or the contact of the micro switch to be tested is stuck, it is determined that the micro switch to be tested is invalid.

6. The life detection method of a micro switch according to any one of claims 1 to 5, characterized by, In the case that multiple micro switches to be tested are connected to the test system, before the power supply system is adjusted to output the rated voltage and the preset current, the method further comprises: In the case that multiple micro switches to be tested are connected to the micro switch test device and are electrically connected to the power supply system, the power supply system is adjusted to output the rated voltage and an initial current; the initial current is the product of the on-resistance and an initial value of the acceleration current coefficient. The acceleration current coefficient is obtained by triggering each micro switch to be tested to meet a second preset ending condition through the micro switch test device.

7. The life detection method of the micro switch according to claim 6, wherein The acceleration current coefficient is obtained by triggering each micro switch to be tested to meet a second preset ending condition through the micro switch test device, comprising: In a test on-off period, each micro switch to be tested is triggered to a second number of times through the micro switch test device, and the functional state of each micro switch to be tested is obtained; Based on the functional state of each micro switch to be tested, the acceleration current coefficient is adjusted.

8. The life detection method of the micro switch according to claim 7, wherein The acceleration current coefficient is adjusted based on the functional state of each micro switch to be tested, comprising: In the case that it is determined that each micro switch to be tested is normal based on the functional state, the acceleration current coefficient is increased within a preset range, a new plurality of pre-test samples are connected to the test system, the initial current is adjusted based on the increased acceleration current coefficient, and the next test on-off period is entered.

9. The life detection method of the micro switch according to claim 7, wherein The acceleration current coefficient is adjusted based on the functional state of each micro switch to be tested, comprising: In the case that it is determined that at least one micro switch to be tested is invalid based on the functional state, the current acceleration current coefficient is determined as the acceleration current coefficient.

10. A test system, characterized by Comprising: A micro switch test device for triggering multiple micro switches to be tested at the same time; A power supply system; The test system is detected based on the service life detection method of the micro switch according to any one of claims 1-9.

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