Data retention test method and system for solid state drive

Abstract

The application relates to the technical field of solid state disk testing, and discloses a data retention force testing method and system for a solid state disk. The testing method comprises the following steps: selecting a solid state disk to be tested, initializing the testing environment of the solid state disk; writing testing data into the solid state disk and performing full-disk data checking and bad block scanning to obtain a first checking result and first bad block information; performing high-temperature treatment on the solid state disk and then cooling the solid state disk; performing secondary full-disk data checking and bad block scanning on the solid state disk to obtain a second checking result and second bad block information; evaluating the data retention force according to the first checking result, the second checking result, the first bad block information and the second bad block information; accelerating the data degradation process through a high-temperature environment, simulating the data retention force of the solid state disk under long-term high-temperature storage conditions, and quantifying the data error and the bad block growth through full-disk data checking and bad block scanning, so that the data retention force can be comprehensively evaluated.

Description

Technical Field

[0001] This invention relates to the field of solid-state drive (SSD) testing technology, and in particular to a method and system for testing the data retention capacity of SSDs. Background Technology

[0002] With the rapid development of the internet, people's demand for data storage is constantly increasing. Solid-state drives (SSDs), as a new type of storage device, are widely used in automotive, industrial control, video surveillance, and network monitoring fields due to their advantages such as fast storage speed, low power consumption, no noise, vibration resistance, low heat generation, small size, and wide operating temperature range. However, their reliability and data retention capabilities directly affect system stability and data security. During the research and development and production process, rigorous testing is required to verify the performance of SSDs under conditions such as long-term storage and extreme temperatures, especially their data retention capability (i.e., whether data can still be read correctly after long-term storage).

[0003] However, existing SSD data retention tests only test a single function (such as read and write performance), which cannot fully simulate the impact of high temperature and long-term storage on data reliability in actual use, making it difficult to accurately assess data retention and reliability.

[0004] Therefore, there is an urgent need for a newer method and system for testing the data retention capacity of solid-state drives (SSDs) in order to comprehensively evaluate their data retention capabilities. Summary of the Invention

[0005] This invention provides a method and system for testing the data retention capacity of solid-state drives (SSDs), which can efficiently and accurately evaluate the data retention capacity of SSDs.

[0006] To solve the above-mentioned technical problems, one technical solution adopted by the present invention is: to provide a method for testing the data retention capacity of a solid-state drive, comprising:

[0007] Select the solid-state drive to be tested and initialize the test environment for the solid-state drive;

[0008] Test data is written to the solid-state drive, and a full disk data verification and bad block scan are performed to obtain the first verification result and the first bad block information.

[0009] The solid-state drive is subjected to high-temperature treatment, and then cooled to room temperature.

[0010] A second full disk data verification and bad block scan are performed on the solid-state drive to obtain a second verification result and a second bad block information.

[0011] The data retention capability is evaluated based on the first verification result, the second verification result, the first bad block information, and the second bad block information.

[0012] According to an embodiment of the present invention, selecting the solid-state drive to be tested and initializing the solid-state drive test environment includes:

[0013] The solid-state drive is connected to the test device via a SATA or NVMe interface;

[0014] Initialize the solid-state drive as a data disk in the operating system;

[0015] Use the H2 tool to format the solid-state drive and write preset test parameters.

[0016] According to one embodiment of the present invention, the step of writing test data to the solid-state drive and performing full-disk data verification and bad block scanning to obtain a first verification result and first bad block information includes:

[0017] Obtain the preset test requirements;

[0018] Select the write mode and generate test data according to the preset test requirements;

[0019] The H2 tool was used to perform a full disk write operation on the solid-state drive and write the test data.

[0020] A verification mechanism is used to perform a full-disk data verification on the solid-state drive to obtain a first verification result;

[0021] A bad block scanning tool was used to perform a full scan of the solid-state drive to obtain information on the first bad block.

[0022] According to one embodiment of the present invention, the step of subjecting the solid-state drive to high-temperature treatment and then cooling the solid-state drive to room temperature includes:

[0023] The solid-state drive was placed in a high and low temperature test chamber or a constant temperature oven and kept at 110°C for 16 hours.

[0024] Remove the solid-state drive and allow it to cool naturally to room temperature in a normal environment.

[0025] According to an embodiment of the present invention, the step of performing a second full-disk data verification and bad block scanning on the solid-state drive to obtain a second verification result and second bad block information includes:

[0026] A verification mechanism is used to perform a full disk data verification on the solid-state drive to obtain a second verification result;

[0027] A bad block scanning tool was used to perform a full scan of the solid-state drive to obtain information on the second bad block.

[0028] According to one embodiment of the present invention, both the first bad block information and the second bad block information include the total number of bad blocks and the number of remapped blocks, wherein the total number of bad blocks includes the number of logical bad blocks and the number of physical bad blocks.

[0029] According to one embodiment of the present invention, both the first verification result and the second verification result include error type, error quantity and specific error location.

[0030] According to an embodiment of the present invention, the evaluation of data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes:

[0031] Multiple scoring factors are determined based on the first verification result, the second verification result, the first bad block information, and the second bad block information;

[0032] Each of the scoring factors is matched with a preset scoring table to obtain a score for each of the scoring factors;

[0033] The scores of each of the scoring factors are weighted and summed to obtain the comprehensive score;

[0034] The level of data retention is assessed based on the comprehensive score.

[0035] According to one embodiment of the present invention, the scoring factors include data error rate, ECC error rate, number of newly added physical bad blocks, bad block growth rate, and remapping efficiency; determining multiple scoring factors based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes:

[0036] The data error rate and ECC error rate are determined based on the first verification result and the second verification result.

[0037] The number of newly added physical bad blocks, the bad block growth rate, and the remapping efficiency are determined based on the first bad block information and the second bad block information.

[0038] To solve the above-mentioned technical problems, another technical solution adopted by the present invention is: to provide a data retention force testing system for solid-state drives (SSDs), used in the aforementioned SSD data retention force testing method, wherein the data retention force testing system includes:

[0039] The initialization module is used to select the solid-state drive to be tested and initialize the test environment of the solid-state drive.

[0040] The first verification and scanning module is used to write test data to the solid-state drive and perform full disk data verification and bad block scanning to obtain the first verification result and the first bad block information.

[0041] The processing module is used to process the solid-state drive at high temperature and then cool it to room temperature.

[0042] The second verification and scanning module is used to perform a second full disk data verification and bad block scan on the solid-state drive to obtain the second verification result and the second bad block information.

[0043] The evaluation module is used to evaluate data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information.

[0044] The beneficial effects of this invention are as follows: A method for testing the data retention capability of a solid-state drive (SSD) includes: selecting a SSD to be tested and initializing the test environment for the SSD; writing test data to the SSD and performing full-disk data verification and bad block scanning to obtain a first verification result and first bad block information; subjecting the SSD to high-temperature treatment and then cooling it to room temperature; performing a second full-disk data verification and bad block scanning on the SSD to obtain a second verification result and second bad block information; evaluating the data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information; accelerating the data degradation process through a high-temperature environment to simulate the data retention capability of the SSD under long-term high-temperature storage conditions, thereby improving the reliability of the test results; and quantifying data errors and bad block growth through full-disk data verification and bad block scanning to comprehensively evaluate data retention capability and reliability. Attached Figure Description

[0045] Figure 1 This is a flowchart illustrating a method for testing the data retention capacity of a solid-state drive according to an embodiment of the present invention.

[0046] Figure 2 This is a flowchart illustrating step S50 of the solid-state drive data retention capability test method according to an embodiment of the present invention.

[0047] Figure 3 This is a schematic diagram of the data retention force testing system for solid-state drives according to an embodiment of the present invention. Detailed Implementation

[0048] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0049] The terms "first," "second," and "third" used in this invention are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first," "second," or "third" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified. All directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of this invention are only used to explain the relative positional relationships and movements between components in a specific orientation (as shown in the figures). If the specific orientation changes, the directional indications also change accordingly. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices.

[0050] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0051] Figure 1 This is a flowchart illustrating a method for testing the data retention capability of a solid-state drive according to an embodiment of the present invention. It should be noted that if substantially the same results are obtained, the method of the present invention is not necessarily identical. Figure 1 The illustrated process sequence is limited. For example... Figure 1 As shown, the method includes the following steps:

[0052] Step S10: Select the solid-state drive to be tested and initialize the test environment for the solid-state drive.

[0053] In step S10, the solid-state drive (SSD) is connected to the test device via a SATA or NVMe interface; the SSD is initialized as a data disk in the operating system (such as Windows or Linux) and ensured that the SSD can be recognized by the H2 tool; the H2 tool is used to format the SSD and write preset test parameters. The test device includes, but is not limited to, a test host or test board. The preset test parameters include, but are not limited to, block size, erase type, and cache type.

[0054] Step S20: Write test data to the solid-state drive and perform full disk data verification and bad block scanning to obtain the first verification result and the first bad block information.

[0055] In step S20, the preset test requirements are obtained; the write mode is selected according to the preset test requirements and test data is generated; the H2 tool is used to perform a full disk write operation on the solid-state drive and write the test data; a verification mechanism is used to perform a full disk data verification on the solid-state drive and obtain the first verification result; a bad block scanning tool is used to perform a full disk scan on the solid-state drive and obtain the first bad block information.

[0056] Optionally, the bad block scanning tool can be the Diskinfo Check Tool. The first bad block information includes the total number of bad blocks and the number of remapped blocks. The total number of bad blocks includes logical bad blocks and physical bad blocks. Logical bad blocks refer to the number of blocks where data writing or reading errors occurred, but the physical media was not damaged; physical bad blocks refer to the number of blocks in the SSD that have actually suffered physical damage and cannot be repaired. The number of remapped blocks is the number of damaged blocks replaced by spare blocks by the SSD's controller chip, reflecting the SSD's self-repair or fault tolerance capabilities. The purpose of bad block detection in this embodiment is to identify unreliable or unusable storage units on the SSD, reflecting the SSD's reliability and health status.

[0057] Optionally, the first verification result includes the error type, the number of errors, and the specific error location. The error type includes whether there is a read error, a block with inconsistent verification, and an ECC error.

[0058] Data verification refers to reading the test data from the SSD after it has been written to the SSD, and comparing the read test data with the original written test data to verify whether the data has been correctly stored and retrieved. Optionally, verification mechanisms include, but are not limited to, block-by-block comparison, hash verification, meta-verification, or H2 tool verification. Block-by-block comparison involves reading each block of written test data and comparing it byte-by-byte with the original written test data to verify consistency. Hash verification involves calculating a hash value for both the written and read test data and comparing their values. Meta-verification / H2 tool verification uses the H2 tool to perform metadata or checksum comparison on the data blocks to verify data consistency. In this embodiment, block-by-block comparison, hash verification, meta-verification, or H2 tool verification are existing verification mechanisms.

[0059] As one example, a random data stream is selected as the test data to simulate random writes in a real-world scenario. Specifically, the H2 tool is used to perform a full disk write operation, writing the generated random data block by block to all available storage space of the solid-state drive, ensuring that all physical blocks are covered. After the write is complete, the H2 tool is used to perform a full disk data verification to verify the consistency between the written test data and the read test data, and the first verification result is recorded; the Diskinfo Check Tool is used to scan for bad blocks, and the information of the first bad block is recorded.

[0060] Step S30: Perform high-temperature treatment on the solid-state drive, and then cool the solid-state drive to room temperature.

[0061] In step S30, the solid-state drive (SSD) is placed in a high-low temperature test chamber or a constant-temperature oven and kept at 110°C for 16 hours. The SSD is then removed and allowed to cool naturally to room temperature. The 110°C temperature is higher than the typical operating temperature of the SSD, accelerating the physical aging of the flash memory media and simulating a long-term high-temperature storage application scenario. Maintaining the temperature at 110°C for 16 hours effectively triggers reliability degradation in the SSD, such as decreased data retention and an increase in bad blocks. Removing the SSD and allowing it to cool naturally to room temperature (e.g., 25°C) prevents residual high temperatures from affecting the accuracy of subsequent data retrieval.

[0062] Step S40: Perform a second full disk data verification and bad block scan on the solid-state drive to obtain the second verification result and the second bad block information.

[0063] In step S40, a verification mechanism is used to perform a full disk data verification on the solid-state drive to obtain a second verification result; a bad block scanning tool is used to perform a full disk scan on the solid-state drive to obtain second bad block information.

[0064] Optionally, the second bad block information includes the total number of bad blocks and the number of remapped blocks. The total number of bad blocks includes both logical and physical bad blocks. The number of remapped blocks represents the number of damaged blocks replaced by the SSD's controller chip using spare blocks, reflecting the SSD's self-repair or fault-tolerance capabilities.

[0065] Optionally, the second verification result includes the error type, the number of errors, and the specific error location. The error type includes whether there is a read error, a block with inconsistent verification, and an ECC error.

[0066] Both steps S40 and S20 involve full-disk data verification and bad block scanning, but the two steps are performed at different stages: step S20 is performed before high-temperature processing, and step S40 is performed after high-temperature processing. The data recorded in step S20 serves as a benchmark for subsequent comparisons to evaluate the data retention and reliability of the solid-state drive after high-temperature processing.

[0067] Step S50: Evaluate the data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information.

[0068] In step S50, by comparing the first and second verification results, the number of newly added read errors, verification inconsistencies, and ECC error blocks is counted. This reflects whether logical errors or bit flips occur in the data under high-temperature and long-term storage conditions, thereby assessing the logical reliability of data retention. Furthermore, by comparing the first and second bad block information, the number of newly added physical bad blocks, the bad block growth rate, and remapping efficiency are calculated. This reflects whether the physical reliability of the solid-state drive has decreased, and whether there are newly added unreadable and unwritable physical damaged blocks. This allows for a comprehensive assessment of the solid-state drive's data retention capability under high-temperature and long-term storage conditions from both logical and physical reliability perspectives.

[0069] An embodiment of the present invention provides a data retention capability testing method for solid-state drives (SSDs) that accelerates the data degradation process in a high-temperature environment, simulating the data retention capability of SSDs under long-term high-temperature storage conditions, thereby improving the reliability of test results. Furthermore, it quantifies data errors and bad block growth through full-disk data verification and bad block scanning, thus comprehensively evaluating data retention capability and reliability.

[0070] As one example, please refer to Figure 2 Step S50 further includes the following steps:

[0071] Step S501: Determine multiple scoring factors based on the first verification result, the second verification result, the first bad block information, and the second bad block information.

[0072] In this step, the scoring factors include data error rate, ECC error rate, number of newly added physical bad blocks, bad block growth rate, and remapping efficiency. Optionally, the data error rate and ECC error rate are determined based on the first and second verification results; the number of newly added physical bad blocks, bad block growth rate, and remapping efficiency are determined based on the first and second bad block information.

[0073] Among them, the data error rate is the proportion of data blocks with inconsistencies or read errors found in the second verification result out of the total number of data blocks; the ECC error rate is the proportion of error blocks that ECC cannot repair out of the total number of read data blocks; the number of newly added physical bad blocks is the difference between the number of physical bad blocks in the second bad block information and the number of physical bad blocks in the first bad block information; the bad block growth rate is the ratio between the number of newly added bad blocks and the total number of bad blocks, and the number of newly added bad blocks is the difference between the total number of bad blocks in the second bad block information and the total number of bad blocks in the first bad block information; the remapping efficiency is the ratio between the number of bad blocks that were successfully remapped and the number of newly added bad blocks.

[0074] Step S502: Match each rating factor with a preset rating table to obtain the score for each rating factor.

[0075] In this step, the preset scoring table is set by the user according to actual needs. For example, if the data error rate is less than or equal to 0.01%, the corresponding score in the preset scoring table is 10 points; if the data error rate is greater than 1%, the corresponding score in the preset scoring table is 0 points.

[0076] Step S503: Calculate the weighted sum of the scores of each scoring factor to obtain the comprehensive score.

[0077] In this step, a weighted summation method is used to multiply the scores of each scoring factor by a preset weight and then sum them to obtain a comprehensive score.

[0078] Step S504: Evaluate the level of data retention based on the comprehensive score.

[0079] In this step, the grades can be divided into excellent, good, medium, and poor, which are used to intuitively judge the data retention level of the solid-state drive.

[0080] This embodiment integrates the differences between the first and second verification results (data error changes) and the changes between the first and second bad block information (physical damage changes) to achieve multi-dimensional joint analysis. Through comparative analysis, it can distinguish whether data errors are caused by logical problems (such as ECC failure) or physical problems (such as bad block generation), and can locate hotspots of error occurrence, improving the accuracy of assessment. Furthermore, through data comparison, data quantification, comprehensive scoring, or grading, it objectively and accurately reflects the data retention capacity of the solid-state drive under conditions such as high temperature and long-term storage.

[0081] Figure 3 This is a schematic diagram of the solid-state drive data retention force testing system according to an embodiment of the present invention. Figure 3 As shown, the test system 30 includes an initialization module 31, a first verification and scanning module 32, a processing module 33, a second verification and scanning module 34, and an evaluation module 35.

[0082] The initialization module 31 is used to select the solid-state drive to be tested and initialize the test environment of the solid-state drive;

[0083] The first verification and scanning module 32 is used to write test data to the solid-state drive and perform full disk data verification and bad block scanning to obtain the first verification result and the first bad block information.

[0084] Processing module 33 is used to perform high-temperature processing on the solid-state drive and then cool the solid-state drive to room temperature.

[0085] The second verification and scanning module 34 is used to perform a second full disk data verification and bad block scan on the solid-state drive to obtain the second verification result and the second bad block information.

[0086] The evaluation module 35 is used to evaluate the data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information.

[0087] The solid-state drive (SSD) data retention capability testing system in this embodiment accelerates the data degradation process in a high-temperature environment, simulating the data retention capability of SSDs under long-term high-temperature storage conditions, thereby improving the reliability of test results. It quantifies data errors and bad block growth through full-disk data verification and bad block scanning, thus comprehensively evaluating data retention capability and reliability.

[0088] Optionally, both the first bad block information and the second bad block information include the total number of bad blocks and the number of remapped blocks, wherein the total number of bad blocks includes the number of logical bad blocks and the number of physical bad blocks.

[0089] Optionally, both the first verification result and the second verification result include the error type, the number of errors, and the specific error location.

[0090] Optionally, the evaluation module 35 may also include a determination unit, a matching unit, a calculation unit, and an evaluation unit;

[0091] The determining unit is used to determine multiple scoring factors based on the first verification result, the second verification result, the first bad block information, and the second bad block information;

[0092] The matching unit is used to match each of the rating factors with a preset rating table to obtain the score of each of the rating factors;

[0093] The calculation unit is used to perform a weighted summation of the scores of each of the scoring factors to obtain a comprehensive score;

[0094] The assessment unit is used to evaluate the level of data retention based on the comprehensive score.

[0095] The sub-factors include data error rate, ECC error rate, number of newly added physical bad blocks, bad block growth rate, and remapping efficiency.

[0096] When determining multiple rating factors, the following steps are performed:

[0097] The data error rate and ECC error rate are determined based on the first verification result and the second verification result.

[0098] The number of newly added physical bad blocks, the bad block growth rate, and the remapping efficiency are determined based on the first bad block information and the second bad block information.

[0099] The above are merely embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A method for testing the data retention capacity of a solid-state drive, characterized in that, include: Select the solid-state drive to be tested and initialize the test environment for the solid-state drive; Test data is written to the solid-state drive, and a full disk data verification and bad block scan are performed to obtain the first verification result and the first bad block information. The solid-state drive (SSD) is subjected to high-temperature treatment, followed by cooling treatment to room temperature; this includes: placing the SSD in a high-low temperature test chamber or constant temperature oven at 110°C for 16 hours, removing the SSD, and allowing it to cool naturally to room temperature in a normal environment. A second full disk data verification and bad block scan are performed on the solid-state drive to obtain a second verification result and a second bad block information. The data retention capability is evaluated based on the first verification result, the second verification result, the first bad block information, and the second bad block information. The evaluation of data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes: Multiple scoring factors are determined based on the first verification result, the second verification result, the first bad block information, and the second bad block information; Each of the scoring factors is matched with a preset scoring table to obtain a score for each of the scoring factors; The scores of each of the scoring factors are weighted and summed to obtain the comprehensive score; The level of data retention is assessed based on the comprehensive score. The scoring factors include data error rate, ECC error rate, number of newly added physical bad blocks, bad block growth rate, and remapping efficiency; determining multiple scoring factors based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes: The data error rate and the ECC error rate are determined based on the first verification result and the second verification result. The number of newly added physical bad blocks, the bad block growth rate, and the remapping efficiency are determined based on the first bad block information and the second bad block information. The assessment of the data retention level based on the comprehensive score also includes: By combining the differences between the first and second verification results and the changes between the first and second bad block information, a multi-dimensional joint analysis is conducted to distinguish the types of data errors and locate the hot spots where errors occur. The solid-state drive's data retention capability under conditions such as high temperature and long-term storage is evaluated through data comparison, data quantification, comprehensive scoring, or grading. The process of selecting the solid-state drive to be tested and initializing the solid-state drive test environment includes: The solid-state drive is connected to the test device via a SATA or NVMe interface; Initialize the solid-state drive as a data disk in the operating system; Use the H2 tool to format the solid-state drive and write preset test parameters.

2. The data retention force testing method for solid-state drives according to claim 1, characterized in that, The step of writing test data to the solid-state drive and performing full-disk data verification and bad block scanning to obtain the first verification result and the first bad block information includes: Obtain the preset test requirements; Select the write mode and generate test data according to the preset test requirements; The H2 tool was used to perform a full disk write operation on the solid-state drive and write the test data. A verification mechanism is used to perform a full-disk data verification on the solid-state drive to obtain a first verification result; A bad block scanning tool was used to perform a full scan of the solid-state drive to obtain information on the first bad block.

3. The data retention force testing method for solid-state drives according to claim 1, characterized in that, The step of performing a second full disk data verification and bad block scan on the solid-state drive to obtain a second verification result and second bad block information includes: A verification mechanism is used to perform a full disk data verification on the solid-state drive to obtain a second verification result; A bad block scanning tool was used to perform a full scan of the solid-state drive to obtain information on the second bad block.

4. The data retention force testing method for solid-state drives according to claim 1, characterized in that, Both the first bad block information and the second bad block information include the total number of bad blocks and the number of remapped blocks. The total number of bad blocks includes the number of logical bad blocks and the number of physical bad blocks.

5. The data retention force testing method for solid-state drives according to claim 4, characterized in that, Both the first verification result and the second verification result include the error type, the number of errors, and the specific error location.

6. A data retention force testing system for solid-state drives, characterized in that, A method for testing the data retention force of a solid-state drive as described in any one of claims 1-5, wherein the data retention force testing system comprises: The initialization module is used to select the solid-state drive to be tested and initialize the test environment of the solid-state drive. The first verification and scanning module is used to write test data to the solid-state drive and perform full disk data verification and bad block scanning to obtain the first verification result and the first bad block information. The processing module is used to perform high-temperature processing on the solid-state drive and then cool the solid-state drive to room temperature; including: placing the solid-state drive in a high and low temperature test chamber or constant temperature oven and maintaining it at 110°C for 16 hours, then removing the solid-state drive and allowing it to cool naturally to room temperature in a normal environment. The second verification and scanning module is used to perform a second full disk data verification and bad block scan on the solid-state drive to obtain the second verification result and the second bad block information. The evaluation module is used to evaluate data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information; The evaluation of data retention capability based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes: Multiple scoring factors are determined based on the first verification result, the second verification result, the first bad block information, and the second bad block information; Each of the scoring factors is matched with a preset scoring table to obtain a score for each of the scoring factors; The scores of each of the scoring factors are weighted and summed to obtain the comprehensive score; The level of data retention is assessed based on the comprehensive score. The scoring factors include data error rate, ECC error rate, number of newly added physical bad blocks, bad block growth rate, and remapping efficiency; determining multiple scoring factors based on the first verification result, the second verification result, the first bad block information, and the second bad block information includes: The data error rate and the ECC error rate are determined based on the first verification result and the second verification result. The number of newly added physical bad blocks, the bad block growth rate, and the remapping efficiency are determined based on the first bad block information and the second bad block information.

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