An automated chip testing device

Abstract

This invention discloses an automated chip testing device, belonging to the technical field of testing devices. It includes a chip testing stand, comprising: a base with an inverted bottom having a test slot for accommodating a chip; a transport mechanism horizontally mounted on and below the base; and a connecting frame vertically mounted on the transport mechanism, on which two platforms are mounted. The transport mechanism moves horizontally to alternately align the two platforms with the test slot, and then the connecting frame moves upward, causing the platform aligned with the test slot to engage the chip into the test slot. This invention allows for the simultaneous testing of a chip on one platform and removal of a chip already tested from the other platform, while the next chip to be tested is placed on the idle platform and its position calibrated. This enables parallel execution of chip testing and chip replacement operations, increasing the number of test batches per unit time, improving chip testing efficiency, and meeting the high-efficiency testing requirements of large-scale mass production scenarios.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, specifically to an automated chip testing device. Background Technology

[0002] In the chip manufacturing process, performance testing is a crucial step in ensuring product yield. Dedicated chip testing equipment is needed to achieve precise docking between the chip and the testing system, completing the detection of functionalities, parameters, and other indicators. Among these, the chip test socket, as the core execution component of the testing equipment, directly affects testing efficiency and stability through its structural design and mating method. Traditional test sockets typically have test slots that match the chip package. During testing, the chip to be tested must be precisely placed in the test slot, and an electrical connection between the chip and the test circuit is established through probes or contacts inside the test socket to perform the testing operation.

[0003] For example, patent CN220455365U discloses a chip test socket, including a top cover and a base that can be detachably installed. A limiting float plate is detachably inserted into the base. A row of slots is formed through the upper surface of the limiting float plate in a rectangular shape, and a chip test slot is formed in the slot. Four limiting protrusions are provided in a rectangular shape at the four corners of the chip test slot. The inner walls of the four limiting protrusions are all provided with an inclined angle. Two hand buckles are rotatably provided between the top cover and the base. One end of the two hand buckles is attached to the upper part of the limiting float plate. Several terminal slots are formed around the base in a rectangular shape. An SL-type terminal is inserted into each terminal slot. A hole is opened at the center of the base axis and a machined spring pin is inserted into the hole.

[0004] Patent CN218180924U discloses a chip test socket, including a base, a chip test socket body, a cover assembly, and a motor assembly; the chip test socket body is mounted on the base; the motor assembly is mounted on the base, and the cover assembly is disposed above the base and connected to the motor assembly; when the motor assembly drives the cover assembly to press down in a direction perpendicular to the chip, the solder balls of the target chip under test come into contact with the test probes of the chip test socket body.

[0005] In existing technologies such as those described in the aforementioned patents, the chip is first placed into the chip test slot for calibration using an automated robotic arm or manually. Then, a cover is pressed to secure the chip. After testing, the tested chip is removed from the slot, and the next chip to be tested is placed in the slot for the next round of testing. The drawback is that, with manual or single-robotic arm operation, the next chip cannot be placed immediately after the tested chip is removed. The robotic arm must first place the tested chip down before it can pick up the next one. Furthermore, chip positioning needs to be calibrated during placement. During chip testing, the robotic arm is completely idle and cannot prepare for the next round of testing, resulting in a reduced number of test batches per unit time, which is insufficient to meet the high-efficiency testing requirements of large-scale mass production scenarios. Summary of the Invention

[0006] The purpose of this invention is to provide an automated chip testing device to solve the problem of insufficient chip testing efficiency in the prior art.

[0007] To achieve the above objectives, the present invention provides the following technical solution: an automated chip testing device, comprising a chip testing socket, the chip testing socket comprising: a base body having a test slot for accommodating a chip inverted at its bottom; a transport mechanism horizontally disposed on the base body and located below the base body; and a connecting frame vertically disposed on the transport mechanism, having two platforms for placing chips on it; the two platforms are alternately aligned with the test slot by the translation of the transport mechanism, and then the connecting frame moves upward, so that the platform aligned with the test slot snaps the chip into the test slot.

[0008] Furthermore, the conveying mechanism includes a movable component connected to the seat, a slide connected to the connecting frame, and two pressing parts disposed on the movable component; the slide and the movable component are slidably connected, and elastic telescopic rods that can abut against the two ends of the movable component are respectively disposed at both ends of the slide; a limiting component that restricts the movement stroke of the slide is disposed on the seat; a double wedge block is horizontally slidably connected to the connecting frame, and the double wedge block is also vertically slidably connected to the seat; the two pressing parts abut against the two wedge surfaces and the bottom surface of the double wedge block respectively.

[0009] Furthermore, the moving component includes a first slide rail, a second slide rail, and a rack that are fixedly connected to each other and arranged in parallel. The first slide rail is slidably connected to a first sliding sleeve on the base, and the second slide rail is slidably connected to a second sliding sleeve on the slide block. A drive motor is mounted on the base, and a gear is coaxially fixedly connected to the shaft of the drive motor. The gear meshes with the rack.

[0010] Furthermore, the limiting component includes two limiting blocks fixedly connected to the base body, and a stop block fixedly connected to the middle of the slide block. The stop block is located between the two limiting blocks. When one of the platforms is aligned with the test slot, the limiting block near the platform abuts against the stop block.

[0011] Furthermore, the extrusion section has rollers that roll and engage with the double wedge blocks.

[0012] Furthermore, the elastic telescopic rod includes two rod sections that slide together and a compression spring sleeved on the two rod sections. One end of the two rod sections is fixedly connected to the slide block, and the other end is provided with an end cap. The two ends of the compression spring abut against the slide block and the end cap, respectively.

[0013] Furthermore, the connecting frame is provided with a track, and the double wedge block is slidably connected to the track.

[0014] Furthermore, a sliding rod is fixedly connected to one side of the double wedge block, and a sleeve is fixedly connected to the base. The double wedge block slides with the base through the sliding rod and the sleeve to achieve a sliding connection.

[0015] Furthermore, it also includes a housing, with windows on opposite sides for the platform and transport mechanism to pass through.

[0016] Compared with existing technologies, the automated chip testing device provided by this invention innovatively places the test slot upside down at the bottom of the base, and equips two platforms below it. The two platforms are transported by a conveying mechanism and alternately aligned with the test slot. Then, the connecting frame moves upward, so that the platform aligned with the test slot snaps the chip into the test slot for testing. Thus, while the chip on one platform is being tested, a person or a robot can remove the chip that has been tested from the other platform and place the next chip to be tested on the idle platform in advance and calibrate its position. This allows chip testing and chip replacement to be performed in parallel, thereby increasing the number of test batches per unit time, improving chip testing efficiency, and meeting the high-efficiency testing requirements of large-scale mass production scenarios. Attached Figure Description

[0017] To provide a clearer description of the technical solutions in the embodiments of this application or the prior art, the accompanying drawings used in the embodiments will be briefly introduced below.

[0018] Figure 1 Schematic diagram of the overall structure provided for the embodiment Figure I ;

[0019] Figure 2 Schematic diagram of the overall structure provided for the embodiment Figure II ;

[0020] Figure 3 A schematic diagram of the internal structure of the housing provided in the embodiment;

[0021] Figure 4 A schematic diagram of the structure of the base and test slot provided in the embodiment;

[0022] Figure 5 A schematic diagram of the connecting frame and two platforms provided in the embodiment. Figure I ;

[0023] Figure 6 A schematic diagram of the connecting frame and two platforms provided in the embodiment. Figure II ;

[0024] Figure 7 A schematic diagram of the structure of the moving component provided in the embodiment;

[0025] Figure 8 A schematic diagram of the structural slide and two elastic telescopic rods provided for an embodiment;

[0026] Figure 9 A cross-sectional view of the elastic telescopic rod provided in the embodiment;

[0027] Figure 10 This is a schematic diagram of the connection structure between the connecting frame and the slide provided in the embodiment;

[0028] Figure 11 Schematic diagram of the connection structure between the slide and the moving component provided in the embodiment Figure I ;

[0029] Figure 12 Schematic diagram of the connection structure between the slide and the moving component provided in the embodiment Figure II ;

[0030] Figure 13 A schematic diagram of the mounting structure of the double wedge block provided in the embodiment;

[0031] Figure 14 A schematic diagram of the structure in which a chip on a first carrier is fastened into a test slot, as provided in the embodiment;

[0032] Figure 15 This is a schematic diagram of the structure of the first stage aligned with the test slot provided in the embodiment;

[0033] Figure 16 This is a schematic diagram of the structure of the second stage aligned with the test slot provided in the embodiment;

[0034] Figure 17 This is a schematic diagram of the structure in which the chip on the second stage is fastened into the test slot, as provided in the embodiment.

[0035] Explanation of reference numerals in the attached figures:

[0036] 1. Housing; 2. Base; 21. Test slot; 22. Bracket; 23. Sleeve; 24. First sliding sleeve; 3. Moving assembly; 31. End plate; 32. First slide rail; 33. Second slide rail; 34. First connecting rod; 35. Second connecting rod; 36. First extrusion section; 37. Second extrusion section; 38. Rack; 4. Slide seat; 41. Guide hole; 42. Second sliding sleeve; 5. Connecting frame; 51. Guide post; 61. First platform; 6 2. Second platform; 71. First elastic telescopic rod; 72. Second elastic telescopic rod; 73. First rod body; 74. Second rod body; 75. End cap; 76. Compression spring; 8. Double wedge block; 81. First wedge surface; 82. Second wedge surface; 83. Bottom surface; 84. Slide rod; 9. Limiting assembly; 91. First limiting block; 92. Second limiting block; 93. Connecting rod; 94. Stop block; 10. Track; 11. Drive motor; 12. Gear. Detailed Implementation

[0037] To enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0038] Please see Figures 1-17 This invention provides an automated chip testing device, including a chip testing socket and a sorting robot. The chip testing socket includes a housing 1, a base 2, a transport mechanism, a connecting frame 5, and two platforms. The bottom of the base 2 is inverted and has a test slot 21 for accommodating the chip. The test slot 21 has probes that are electrically connected to the chip. The transport mechanism is horizontally mounted on the base 2 and located below the base 2. The connecting frame 5 is vertically mounted on the transport mechanism. Both platforms are fixedly mounted on the connecting frame 5. The chip is placed in a chip positioning slot in the center of the platform. The housing 1 covers the outside of the base 2, and windows are provided on opposite sides of the housing 1 for the platforms and the transport mechanism to pass through. The sorting robot uses existing technology to place the chip to be tested onto the platform and to remove the tested chips from the platform and classify and store them according to the test results.

[0039] The translation of the conveying mechanism and the vertical movement of the connecting frame 5 can both be powered by drive elements. The conveying mechanism translates and transports two platforms to alternately align with the test slot 21. Then the connecting frame 5 moves upward, so that the platform aligned with the test slot 21 snaps the chip into the test slot 21 for testing. Thus, while the chip on one platform (called the first platform 61) is being tested, the sorting robot can remove the tested chip from the other platform (called the second platform 62) and place the next chip to be tested in advance on the idle first platform 61 and calibrate its position. This allows the chip testing operation and the chip replacement operation to be performed in parallel, thereby increasing the number of test batches per unit time, improving chip testing efficiency, and meeting the high-efficiency testing requirements in large-scale mass production scenarios.

[0040] In a preferred embodiment of the present invention, the conveying mechanism includes a moving component 3 and a slide 4. The conveying mechanism is horizontally slidably connected to the slide 4 via the moving component 3, and vertically slidably connected to the connecting frame 5 via the slide 4. The moving component 3 and the slide 4 are slidably connected to each other, thereby achieving the effect that the moving component 3 can slide horizontally on the slide 4, and the slide 4 can carry the connecting frame 5 and the platform to slide relative to the moving component 3. Specifically, the movable component 3 includes two end plates 31, and a first slide rail 32 and a second slide rail 33 are fixedly connected between the two end plates 31. A first sliding sleeve 24 is fixedly connected to the base 2 via a bracket 22. The movable component 3 achieves a horizontal sliding connection with the base 2 through the engagement of the first slide rail 32 and the first sliding sleeve 24. A second sliding sleeve 42 is fixedly connected to the slide block 4. The slide block 4 achieves a horizontal sliding connection with the movable component 3 through the engagement of the second sliding sleeve 42 and the second sliding rod 84. A guide post 51 is provided on the connecting frame 5. A guide hole 41 is also provided on the slide block 4. The slide block 4 achieves a vertical sliding connection with the connecting frame 5 through the engagement of the guide hole 41 and the guide post 51.

[0041] The slide block 4 has two elastic telescopic rods with the same structure fixedly installed at both ends along the translation direction, one of which is a first elastic telescopic rod 71 and the other is a second elastic telescopic rod 72; the moving component 3 has a first connecting rod 34 fixedly connected at one end along the translation direction and a second connecting rod 35 fixedly connected at the other end; the first elastic telescopic rod 71 can abut against the first connecting rod 34 and the second elastic telescopic rod 72 can abut against the second connecting rod 35. The elastic telescopic rod specifically includes two rod sections that slide together and a compression spring 76 sleeved on the two rod sections (or built into the two hollow rod sections). One of the two rod sections is the first rod 73, and the other is the second rod 74. One end of the first rod 73 is fixedly connected to the slide block 4, and one end of the second rod 74 is provided with an end cap 75. The two ends of the compression spring 76 abut against the slide block 4 and the end cap 75, respectively. The release of the elastic force of the compression spring 76 causes the two rod sections to extend. When the connecting rods extend to their limit length, the compression spring 76 has a compression deformation and elastic force.

[0042] The base 2 is provided with a limiting component 9 to restrict the movement of the slide 4. The limiting component 9 includes two limiting blocks, one of which is a first limiting block 91 and the other is a second limiting block 92. The two are connected by a connecting rod 93, and the connecting rod 93 is fixedly installed on the bracket 22, thereby fixing the position of the two limiting blocks relative to the base 2. A stop block 94 is fixedly connected to the middle part of the slide 4 (relative to the translation direction of the slide 4), and the stop block 94 is located between the two limiting blocks. When one of the platforms is aligned with the test slot 21, the limiting block near the platform abuts against the stop block 94, thereby restricting the movement of the slide 4.

[0043] A double wedge block 8 is vertically slidably connected to the base 2. A rail 10 is fixedly installed on the connecting frame 5 along a direction parallel to the first slide rail 32. The double wedge block 8 is slidably connected to the rail 10. Specifically, a slide rod 84 is fixedly connected to one side of the double wedge block 8, and a sleeve 23 is fixedly connected to the bracket 22. The double wedge block 8 achieves a sliding connection with the base 2 through the sliding engagement of the slide rod 84 and the sleeve 23. The double wedge block 8 is trapezoidal and has two opposing wedge surfaces, namely the first wedge surface 81 and the second wedge surface 82. The distance between the tops of the two wedge surfaces is large, and the distance between the bottoms is small. They are connected by a horizontal bottom surface 83.

[0044] Two extrusion parts are fixedly connected to both ends of the moving component 3. The one closer to the first connecting rod 34 is the first extrusion part 36, and the one closer to the second connecting rod 35 is the second extrusion part 37. The first extrusion part 36 presses against the first wedge surface 81, causing the connecting frame 5 and the platform to rise, and snapping the chip on the first platform 61 into the test slot 21. The second extrusion part 37 presses against the second wedge surface 82, causing the connecting frame 5 and the platform to rise, and snapping the chip on the first platform 61 into the test slot 21. To reduce the frictional resistance and wear between the extrusion part and the wedge surface, the extrusion part is equipped with rollers, which roll and abut against the double wedge surface block 8.

[0045] A rack 38 is fixedly connected to the first connecting rod 34 and the second connecting rod 35 on the moving component 3. The tooth grooves of the rack 38 are arranged in the same direction as the length direction of the first slide rail 32. A drive motor 11 is fixedly installed on the base 2. A gear 12 is coaxially fixedly connected to the shaft of the drive motor 11. The gear 12 meshes with the rack 38. The drive motor 11 has a self-locking function. The drive motor 11 drives the gear 12 to rotate, and the gear 12 drives the rack 38 to move, thereby driving the moving component 3 to translate.

[0046] In the above implementation scheme, the process of switching chip testing on the first stage 61 to chip testing on the second stage 62 is as follows: First, refer to... Figure 14 When the chip on the first stage 61 is engaged in the test slot 21 for testing, the first pressing part 36 abuts against the bottom surface 83 of the double wedge block 8, the first elastic telescopic rod 71 is in a retracted state abutting against the first connecting rod 34, the first limiting block 91 remains in abutting against the stop block 94, and the second stage 62 is outside the housing 1. The sorting robot places the next chip to be tested onto the second stage 62 during the chip testing on the first stage 61. After the chip testing on the first stage 61 is completed, the moving component 3 moves to the left, and the first pressing part 36 gradually disengages from supporting the double wedge block 8. The double wedge block 8, the connecting frame 5, and the two stages gradually descend due to gravity until the first stage 61 disengages from the test slot 21, and the first elastic telescopic rod 71 gradually returns to its maximum extension state. Figure 15As shown; the moving component 3 continues to move to the left. The moving component 3, through the second connecting rod 35, abuts against the end cap 75 of the second elastic telescopic rod 72, driving the slide 4, connecting frame 5, and two platforms to move to the left together, until the first platform 61 moves out of the housing 1 and the second platform 62 moves horizontally to align with the test slot 21. At this time, the stop 94 on the slide 4 just abuts against the second limiting block 92, as shown. Figure 16 As shown; then the moving component 3 continues to move to the left. Because the stop 94 is blocked by the second limit block 92, the slide 4 cannot continue to move to the left with the moving component 3. Therefore, the second elastic telescopic rod 72 is squeezed and contracted by the second connecting rod 35. At the same time, the second squeezing part 37 rolls along the second wedge surface 82 on the right side of the double wedge surface 8 to the bottom surface 83 of the double wedge surface 8, lifting the double wedge surface 8, connecting frame 5, and two platforms upward together, so that the chip on the second platform 62 is engaged in the test slot 21 for testing, as shown. Figure 17 As shown, during chip testing on the second stage 62, the sorting robot removes and sorts the chips that have been tested on the first stage 61, and places the next chip to be tested on the first stage 61.

[0047] The process of switching from chip testing on the second stage 62 back to chip testing on the first stage 61 follows the same principle as described above, but with the operational stroke reversed: after chip testing on the second stage 62 is completed, the moving component 3 moves to the right, and the second pressing part 37 gradually disengages from the support of the double wedge block 8. The double wedge block 8, connecting frame 5, and two stages gradually descend due to gravity until the second stage 62 disengages from the test slot 21. The second elastic telescopic rod 72 also gradually returns to its maximum extension state. Figure 16 As shown; the moving component 3 continues to move to the right. The moving component 3, through the first connecting rod 34, abuts against the end cap 75 of the first elastic telescopic rod 71, driving the slide 4, connecting frame 5, and two platforms to move to the right together, until the second platform 62 moves out of the housing 1, and the first platform 61 moves horizontally to align with the test slot 21. At this time, the stop 94 on the slide 4 just abuts against the first limiting block 91, as shown. Figure 15 As shown; then the moving component 3 continues to move to the right. Because the stop 94 is blocked by the first limiting block 91, the slide 4 cannot continue to move to the right with the moving component 3. Therefore, the first elastic telescopic rod 71 is squeezed and contracted by the first connecting rod 34. At the same time, the first squeezing part 36 rolls along the first wedge surface 81 on the left side of the double wedge surface 8 to the bottom surface 83 of the double wedge surface 8, lifting the double wedge surface 8, the connecting frame 5, and the two platforms upward together, so that the chip on the first platform 61 is engaged in the test slot 21 for testing, as shown. Figure 14 As shown, during chip testing on the first stage 61, the sorting robot removes and sorts the tested chips from the second stage 62 and places the next chip to be tested onto the second stage 62.

[0048] The foregoing description of certain exemplary embodiments of the present invention should not be construed as limiting the scope of protection of the claims. Those skilled in the art will recognize that the described embodiments can be modified in other ways without departing from the spirit and scope of the invention.

Claims

1. An automated chip testing device, comprising a chip testing socket, characterized in that, The chip test socket includes: The base has an inverted test slot at the bottom to accommodate the chip; The transport mechanism is horizontally mounted on and below the seat. The connecting frame is vertically movable on the conveying mechanism and has two platforms for placing chips. The two platforms are alternately aligned with the test slot by the translation of the transport mechanism, and then the connecting frame moves up so that the platform aligned with the test slot will snap the chip into the test slot; The conveying mechanism includes a movable component connected to the seat, a slide connected to the connecting frame, and two pressing parts disposed on the movable component; The slide is slidably connected to the moving component. Each end of the slide is provided with an elastic telescopic rod that can abut against each end of the moving component. The seat is provided with a limiting component that restricts the movement of the slide. A double wedge block is horizontally slidably connected to the connecting frame. The double wedge block is also vertically slidably connected to the base. The two extrusion parts respectively abut against the two wedge surfaces and the bottom surface of the double wedge block.

2. The automated chip testing device according to claim 1, characterized in that, The moving component includes a first slide rail, a second slide rail, and a rack that are fixedly connected to each other and arranged in parallel. The first slide rail is slidably connected to a first sliding sleeve on the base, and the second slide rail is slidably connected to a second sliding sleeve on the slide block. A drive motor is mounted on the base, and a gear is coaxially fixedly connected to the shaft of the drive motor. The gear meshes with the rack.

3. The automated chip testing device according to claim 1, characterized in that, The limiting component includes two limiting blocks fixedly connected to the base body. A stop block is fixedly connected to the middle of the slide block. The stop block is located between the two limiting blocks. When one of the platforms is aligned with the test slot, the limiting block near the platform abuts against the stop block.

4. The automated chip testing device according to claim 1, characterized in that, The extrusion section has rollers that roll and abut against the double wedge blocks.

5. The automated chip testing device according to claim 1, characterized in that, The elastic telescopic rod includes two rod sections that slide together and a compression spring sleeved on the two rod sections. One end of the two rod sections is fixedly connected to a slide block, and the other end is provided with an end cap. The two ends of the compression spring abut against the slide block and the end cap, respectively.

6. The automated chip testing apparatus according to claim 1, characterized in that, The connecting frame is equipped with a track, and the double wedge block is slidably connected to the track.

7. The automated chip testing device according to claim 1, characterized in that, A sliding rod is fixedly connected to one side of the double wedge block, and a sleeve is fixedly connected to the base. The double wedge block slides with the base through the sliding rod and the sleeve.

8. The automated chip testing device according to claim 1, characterized in that, It also includes a housing, with windows on opposite sides for the platform and transport mechanism to pass through.

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